Sample & Buy Product Folder Support & Community Tools & Software Technical Documents CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 CSD87588N Synchronous Buck NexFET™ Power Block II 1 Features 3 Description • • • • • • • • • • • • The CSD87588N NexFET™ power block II is a highly-optimized design for synchronous buck applications offering high current and high efficiency capability in a small 5 mm × 2.5 mm outline. Optimized for 5 V gate drive applications, this product offers an efficient and flexible solution capable of providing a high density power supply when paired with any 5 V gate driver from an external controller/driver. 1 Half-Bridge Power Block 90% System Efficiency at 20 A Up to 25 A Operation High Density – 5 mm x 2.5 mm LGA Footprint Double Side Cooling Capability Ultra-Low Profile – 0.48 mm Max Optimized for 5 V Gate Drive Low Switching Losses Low Inductance Package RoHS Compliant Halogen Free Pb Free TEXT ADDED FOR SPACING Ordering Information(1) • • Media Qty 13-Inch Reel 2500 CSD87588NT 7-Inch Reel 250 Synchronous Buck Converters – High-Current, Low Duty Cycle Applications Multiphase Synchronous Buck Converters POL DC-DC Converters 5 x 2.5 LGA Tape and Reel Typical Power Block Efficiency and Power Loss VIN VDD Ship TEXT ADDED FOR SPACING Typical Circuit VDD Package (1) For all available packages, see the orderable addendum at the end of the data sheet. 2 Applications • Device CSD87588N 100 7 90 6 BOOT VIN DRVH VSW ENABLE PWM ENABLE PWM VOUT LL BG DRVL PGND Driver IC VGS = 5V VIN = 12V VOUT = 1.3V LOUT = 0.29µH fSW = 500kHz TA = 25ºC 80 Efficiency (%) GND 70 60 5 4 3 50 2 40 1 Power Loss (W) TG CSD87588N 30 0 5 10 15 Output Current (A) 20 25 0 G001 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Specifications......................................................... 1 1 1 2 3 5.1 5.2 5.3 5.4 5.5 5.6 5.7 3 3 3 4 4 5 7 Absolute Maximum Ratings ...................................... Recommended Operating Conditions....................... Thermal Information .................................................. Power Block Performance ........................................ Electrical Characteristics........................................... Typical Power Block Device Characteristics............. Typical Power Block MOSFET Characteristics......... Application and Implementation ........................ 10 6.1 Application Information............................................ 10 7 Layout ................................................................... 13 7.1 Layout Guidelines ................................................... 13 7.2 Layout Example ...................................................... 13 8 Device and Documentation Support.................. 14 8.1 Trademarks ............................................................. 14 8.2 Electrostatic Discharge Caution .............................. 14 8.3 Glossary .................................................................. 14 9 Mechanical, Packaging, and Orderable Information ........................................................... 15 9.1 9.2 9.3 9.4 9.5 9.6 CSD87588N Package Dimensions ......................... 15 Land Pattern Recommendation .............................. 16 Stencil Recommendation (100 µm)......................... 16 Stencil Recommendation (125 µm)......................... 17 Pin Drawing............................................................. 17 CSD87588N Embossed Carrier Tape Dimensions. 18 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision C (June 2014) to Revision D Page • Changed capacitance units to read pF in Figure 15 ............................................................................................................. 8 • Changed capacitance units to read pF in Figure 16 ............................................................................................................. 8 Changes from Revision B (January 2014) to Revision C • Page Changed "Pb-Free Terminal Plating" feature to state "Pb Free" ........................................................................................... 1 Changes from Revision A (May 2013) to Revision B Page • Added small reel info .............................................................................................................................................................. 1 • Updated Figure 5.................................................................................................................................................................... 5 • Updated Figure 6.................................................................................................................................................................... 5 • Updated Figure 7.................................................................................................................................................................... 5 • Updated Figure 8.................................................................................................................................................................... 5 • Changed figure reference to Figure 29 in electrical performance ........................................................................................ 13 Changes from Original (March 2013) to Revision A • 2 Page Changed RθJC-PCBTo: RθJC in the Thermal Information table................................................................................................... 3 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 5 Specifications 5.1 Absolute Maximum Ratings TA = 25°C (unless otherwise noted) (1) VIN to PGND MIN MAX –0.8 30 VSW to PGND Voltage UNIT 30 VSW to PGND (10 ns) 32 TG to VSW –20 20 BG to PGND –20 20 V IDM Pulsed Current Rating (2) PD Power Dissipation (3) EAS Avalanche Energy TJ Operating Junction –55 150 °C Tstg Storage Temperature Range –55 150 °C (1) (2) (3) Sync FET, ID = 45, L = 0.1 mH 50 A 6 W 101 Control FET, ID = 26, L = 0.1 mH 34 mJ Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Pulse Duration ≤50 µs, duty cycle ≤0.01 Device mounted on FR4 material with 1 inch2 (6.45 cm2) Cu 5.2 Recommended Operating Conditions TA = 25°C (unless otherwise noted) VGS Gate Drive Voltage VIN Input Supply Voltage ƒSW Switching Frequency Operating Current TJ MIN MAX 4.5 16 24 CBST = 0.1 μF (min) 200 1500 UNIT V V kHz No Airflow 25 A With Airflow (200 LFM) 30 A With Airflow + Heat Sink 35 A 125 °C Operating Temperature 5.3 Thermal Information TA = 25°C (unless otherwise stated) THERMAL METRIC RθJA RθJC (1) (2) Junction-to-ambient thermal resistance (Min Cu) Junction-to-ambient thermal resistance (Max Cu) (1) TYP MAX UNIT 170 (2) (1) Junction-to-case thermal resistance (Top of package) Junction-to-case thermal resistance (PGND Pin) MIN (1) (1) 70 3.7 °C/W 1.25 RθJC is determined with the device mounted on a 1 inch2 (6.45 cm2), 2 oz. (0.071 mm thick) Cu pad on a 1.5 inches × 1.5 inches (3.81 cm × 3.81 cm), 0.06 inch (1.52 mm) thick FR4 board. RθJC is specified by design while RθJA is determined by the user’s board design. Device mounted on FR4 material with 1 inch2 (6.45 cm2) Cu. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 3 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com 5.4 Power Block Performance TA = 25°C (unless otherwise noted) PARAMETER CONDITIONS MIN TYP MAX UNIT PLOSS Power Loss (1) VIN = 12 V, VGS = 5 V VOUT = 1.3 V, IOUT = 15 A ƒSW = 500 kHz LOUT = 0.29 µH, TJ = 25ºC 2.1 W IQVIN VIN Quiescent Current TG to TGR = 0 V BG to PGND = 0 V 10 µA (1) Measurement made with six 10 µF (TDK C3216X5R1C106KT or equivalent) ceramic capacitors placed across VIN to PGND pins and using a high current 5 V driver IC. 5.5 Electrical Characteristics TA = 25°C (unless otherwise stated) PARAMETER TEST CONDITIONS Q1 FET MIN TYP Q2 FET MAX MIN TYP MAX UNIT STATIC CHARACTERISTICS BVDSS Drain-to-Source Voltage VGS = 0 V, IDS = 250 μA IDSS Drain-to-Source Leakage Current VGS = 0 V, VDS = 24 V IGSS Gate-to-Source Leakage Current VDS = 0 V, VGS = 20 VGS(th) Gate-to-Source Threshold Voltage VDS = VGS, IDS = 250 μA RDS(on) Drain-to-Source On Resistance gƒs Transconductance 30 30 1.1 V 1 1 μA 100 100 nA 1.9 V 1.9 1.1 VGS = 4.5 V, IDS = 15 A 10.4 12.5 3.5 4.2 VGS = 10 V, IDS = 15 A 8 9.6 2.9 3.5 VDS = 10 V, IDS = 15 A 43 93 mΩ S DYNAMIC CHARACTERISTICS (1) CISS Input Capacitance COSS Output Capacitance (1) CRSS Reverse Transfer Capacitance RG Series Gate Resistance Qg Gate Charge Total (4.5 V) Qgd Gate Charge - Gate-to-Drain Qgs Gate Charge - Gate-to-Source Qg(th) Gate Charge at Vth QOSS Output Charge td(on) Turn On Delay Time tr Rise Time td(off) Turn Off Delay Time tƒ Fall Time (1) VGS = 0 V, VDS = 15 V, ƒ = 1 MHz (1) (1) VDS = 15 V, IDS = 15 A VDD = 12 V, VGS = 0 V VDS = 15 V, VGS = 4.5 V, IDS = 15 A, RG = 2 Ω 566 736 2310 3000 pF 341 444 682 887 pF 10.3 13.4 62 80.4 pF 1.2 2.4 1.1 2.2 Ω 3.2 4.1 13.7 17.9 nC 0.7 4.3 nC 1.4 4.3 nC 0.8 2.8 nC 7 18.6 nC 7.3 12.1 ns 31.6 36.7 ns 10.2 20.1 ns 5.0 6.3 ns DIODE CHARACTERISTICS VSD Diode Forward Voltage IDS = 15 A, VGS = 0 V 0.85 0.78 V Qrr Reverse Recovery Charge 26.7 nC Reverse Recovery Time Vdd = 15 V, IF = 15 A, di/dt = 300 A/μs 12.5 trr 16 23 ns (1) 4 Specified by design Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 Max RθJA = 70°C/W when mounted on 1 inch2 (6.45 cm2) of 2 oz. (0.071 mm thick) Cu. Max RθJA = 170°C/W when mounted on minimum pad area of 2 oz. (0.071 mm thick) Cu. 5.6 Typical Power Block Device Characteristics TJ = 125°C, unless stated otherwise.The Typical Power Block System Characteristic curves Figure 3 and Figure 4 are based on measurements made on a PCB design with dimensions of 4.0 inches (W) × 3.5 inches (L) × 0.062 inch (H) and 6 copper layers of 1 oz. copper thickness. See Application and Implementation for detailed explanation. 8 1.1 VIN = 12V VGS = 5V VOUT = 1.3V fSW = 500kHz LOUT = 0.29µH Power Loss (W) 6 5 4 3 2 1 3 5 7 9 11 13 15 17 Output Current (A) 19 21 23 0.8 0.7 0.5 −50 25 25 25 Output Current (A) 30 20 15 10 0 400LFM 200LFM 100LFM Nat Conv 0 10 20 30 40 50 60 70 Ambient Temperature (ºC) 25 50 75 100 Junction Temperature (ºC) 80 125 150 G001 20 15 VIN = 12V VGS = 5V VOUT = 1.3V fSW = 500kHz LOUT = 0.29µH 10 5 90 G001 Figure 3. Safe Operating Area – PCB Horizontal Mount Copyright © 2013–2015, Texas Instruments Incorporated 0 Figure 2. Normalized Power Loss vs Temperature 30 5 −25 G001 Figure 1. Power Loss vs Output Current Output Current (A) 0.9 0.6 1 0 VIN = 12V VGS = 5V VOUT = 1.3V fSW = 500kHz LOUT = 0.29µH 1 Power Loss, Normalized 7 0 0 20 40 60 80 100 Board Temperature (ºC) 120 140 G001 Figure 4. Typical Safe Operating Area Submit Documentation Feedback 5 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com Typical Power Block Device Characteristics (continued) 1.4 2.6 1.35 1.25 2.2 1.2 1.7 1.15 1.3 1.3 1.1 0.9 1.05 0.4 −0.4 1 0.0 −0.9 400 600 800 1000 1200 1400 1600 1800 Switching Frequency (kHz) 0.95 0.95 0.4 0.0 0 G001 Figure 5. Normalized Power Loss vs Switching Frequency 5.1 3.4 1.4 VIN = 12V VGS = 5V fSW = 500kHz LOUT = 0.29µH IOUT = 25A 1.2 1 0.8 1.3 1.8 2.3 2.8 3.3 3.8 Output Voltage (V) 4.3 4.8 1.7 0 −1.7 5.3 Figure 7. Normalized Power Loss vs Output Voltage 6 Submit Documentation Feedback Power Loss, Normalized 1.6 SOA Temperature Adj (ºC) Power Loss, Normalized 6.9 6 8 10 12 14 16 Input Voltage (V) 18 20 22 24 1.04 VIN = 12V VGS = 5V VOUT = 1.3V fSW = 500kHz IOUT = 25A 1.08 1.06 0.87 0.69 0.52 1.04 0.35 1.02 0.17 0 1 0.98 −0.17 0.96 −0.35 0.94 G001 −0.4 G001 1.12 1.1 1.8 4 Figure 6. Normalized Power Loss vs Input Voltage 8.6 2 2 0 −0.52 100 200 300 400 500 600 700 800 900 1000 1100 Output Inductance (nH) SOA Temperature Adj (ºC) 1 0.8 0.3 2.2 1.15 0.9 VIN = 12V VGS = 5V VOUT = 1.3V LOUT = 0.29µH IOUT = 25A 200 2.6 1.7 1.1 0 1.3 1.25 3.0 1.2 1.05 0.9 3.5 VGS = 5V VOUT = 1.3V LOUT = 0.29µH fSW = 500kHz IOUT = 25A SOA Temperature Adj (ºC) 3.0 1.3 Power Loss, Normalized 1.35 SOA Temperature Adj (ºC) Power Loss, Normalized TJ = 125°C, unless stated otherwise.The Typical Power Block System Characteristic curves Figure 3 and Figure 4 are based on measurements made on a PCB design with dimensions of 4.0 inches (W) × 3.5 inches (L) × 0.062 inch (H) and 6 copper layers of 1 oz. copper thickness. See Application and Implementation for detailed explanation. G001 Figure 8. Normalized Power Loss vs Output Inductance Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 5.7 Typical Power Block MOSFET Characteristics 50 200 45 180 IDS - Drain-to-Source Current (A) IDS - Drain-to-Source Current (A) TA = 25°C, unless stated otherwise. 40 35 30 25 20 15 VGS = 8.0V VGS = 4.5V VGS = 4.0V 10 5 0 0 0.2 0.4 0.6 0.8 VDS - Drain-to-Source Voltage (V) 160 140 120 100 80 60 20 0 1 VGS = 8.0V VGS = 4.5V VGS = 4.0V 40 0 Figure 9. Control MOSFET Saturation IDS - Drain-to-Source Current (A) IDS - Drain-to-Source Current (A) VDS = 5V 1 0.1 0.01 0.001 TC = 125°C TC = 25°C TC = −55°C 0.0001 1.2 G001 0 0.5 1 1.5 2 2.5 VGS - Gate-to-Source Voltage (V) 3 VDS = 5V 100 10 1 0.1 0.01 TC = 125°C TC = 25°C TC = −55°C 0.001 0.0001 0.5 1 G001 Figure 11. Control MOSFET Transfer 1.5 2 2.5 VGS - Gate-to-Source Voltage (V) 3 G001 Figure 12. Sync MOSFET Transfer 10 10 ID = 15A VDS = 15V 9 VGS - Gate-to-Source Voltage (V) VGS - Gate-to-Source Voltage (V) 1 1000 10 8 7 6 5 4 3 2 1 0 0.4 0.6 0.8 VDS - Drain-to-Source Voltage (V) Figure 10. Sync MOSFET Saturation 100 0.00001 0.2 G001 0 1 2 3 4 5 Qg - Gate Charge (nC) 6 7 Figure 13. Control MOSFET Gate Charge Copyright © 2013–2015, Texas Instruments Incorporated 8 G001 ID = 15A VDS = 15V 9 8 7 6 5 4 3 2 1 0 0 5 10 15 20 Qg - Gate Charge (nC) 25 30 G001 Figure 14. Sync MOSFET Gate Charge Submit Documentation Feedback 7 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com Typical Power Block MOSFET Characteristics (continued) TA = 25°C, unless stated otherwise. 10000 10000 1000 C − Capacitance (pF) C − Capacitance (pF) Ciss = Cgd + Cgs Coss = Cds + Cgd Crss = Cgd 100 10 1 0 5 10 15 20 25 VDS - Drain-to-Source Voltage (V) 1000 100 10 1 30 Ciss = Cgd + Cgs Coss = Cds + Cgd Crss = Cgd 0 ID = 250µA 0.9 0.8 −75 −25 25 75 125 TC - Case Temperature (ºC) 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 1 0.9 0.8 175 −25 G001 Figure 17. Control MOSFET VGS(th) 25 75 125 TC - Case Temperature (ºC) 175 G001 Figure 18. Sync MOSFET VGS(th) ID = 15A 27 RDS(on) - On-State Resistance (mΩ) RDS(on) - On-State Resistance (mΩ) G001 10 24 21 18 15 12 9 6 TC = 25°C TC = 125ºC 3 0 1 2 3 4 5 6 7 8 VGS - Gate-to- Source Voltage (V) 9 Figure 19. Control MOSFET RDS(on) vs VGS 8 30 ID = 250µA 0.7 0.6 −75 30 0 10 15 20 25 VDS - Drain-to-Source Voltage (V) Figure 16. Sync MOSFET Capacitance VGS(th) - Threshold Voltage (V) VGS(th) - Threshold Voltage (V) Figure 15. Control MOSFET Capacitance 2 1.9 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 1 5 G001 Submit Documentation Feedback 10 G001 ID = 15A 9 8 7 6 5 4 3 2 TC = 25°C TC = 125ºC 1 0 0 1 2 3 4 5 6 7 8 VGS - Gate-to- Source Voltage (V) 9 10 G001 Figure 20. Sync MOSFET RDS(on) vs VGS Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 Typical Power Block MOSFET Characteristics (continued) TA = 25°C, unless stated otherwise. ID = 15A VGS = 8V 1 0.9 0.8 0.7 0.6 −75 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 Normalized On-State Resistance Normalized On-State Resistance 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 −25 25 75 125 TC - Case Temperature (ºC) ID = 15A VGS = 8V 1 0.9 0.8 0.7 0.6 −75 175 G001 Figure 21. Control MOSFET Normalized RDS(on) ISD − Source-to-Drain Current (A) ISD − Source-to-Drain Current (A) 175 G001 100 10 1 0.1 0.01 0.001 TC = 25°C TC = 125°C 0 0.2 0.4 0.6 0.8 VSD − Source-to-Drain Voltage (V) 1 10 1 0.1 0.01 0.001 0.0001 TC = 25°C TC = 125°C 0 G001 Figure 23. Control MOSFET Body Diode 1 G001 I(AV) - Peak Avalanche Current (A) 100 10 TC = 25°C TC = 125°C 1 0.01 0.2 0.4 0.6 0.8 VSD − Source-to-Drain Voltage (V) Figure 24. Sync MOSFET Body Diode 100 I(AV) - Peak Avalanche Current (A) 25 75 125 TC - Case Temperature (ºC) Figure 22. Sync MOSFET Normalized RDS(on) 100 0.0001 −25 0.1 t(AV) - Time in Avalanche (ms) 1 G001 Figure 25. Control MOSFET Unclamped Inductive Switching Copyright © 2013–2015, Texas Instruments Incorporated 10 TC = 25°C TC = 125°C 1 0.01 0.1 t(AV) - Time in Avalanche (ms) 1 G001 Figure 26. Sync MOSFET Unclamped Inductive Switching Submit Documentation Feedback 9 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com 6 Application and Implementation 6.1 Application Information The CSD87588N NexFET power block is an optimized design for synchronous buck applications using 5 V gate drive. The Control FET and Sync FET silicon are parametrically tuned to yield the lowest power loss and highest system efficiency. As a result, a new rating method is needed which is tailored toward a more systems-centric environment. System-level performance curves such as Power Loss, Safe Operating Area, and normalized graphs allow engineers to predict the product performance in the actual application. 6.1.1 Power Loss Curves MOSFET-centric parameters such as RDS(ON) and Qgd are needed to estimate the loss generated by the devices. To simplify the design process for engineers, TI has provided measured power loss performance curves. Figure 1 plots the power loss of the CSD87588N as a function of load current. This curve is measured by configuring and running the CSD87588N as it would be in the final application (see Figure 27). The measured power loss is the CSD87588N loss and consists of both input conversion loss and gate drive loss. Equation 1 is used to generate the power loss curve. (VIN × IIN) + (VDD × IDD) – (VSW_AVG × IOUT) = Power Loss (1) The power loss curve in Figure 1 is measured at the maximum recommended junction temperatures of 125°C under isothermal test conditions. 6.1.2 Safe Operating Curves (SOA) The SOA curves in the CSD87588N data sheet provide guidance on the temperature boundaries within an operating system by incorporating the thermal resistance and system power loss. Figure 3 to Figure 4 outline the temperature and airflow conditions required for a given load current. The area under the curve dictates the safe operating area. All the curves are based on measurements made on a PCB design with dimensions of 4 inches (W) × 3.5 inches (L) × 0.062 inch (T) and 6 copper layers of 1 oz. copper thickness. 6.1.3 Normalized Curves The normalized curves in the CSD87588N data sheet provides guidance on the Power Loss and SOA adjustments based on their application-specific needs. These curves show how the power loss and SOA boundaries adjust for a given set of systems conditions. The primary y-axis is the normalized change in power loss and the secondary y-axis is the change in system temperature required in order to comply with the SOA curve. The change in power loss is a multiplier for the Power Loss curve and the change in temperature is subtracted from the SOA curve. Input Current (IIN) A VDD A BOOT VDD V VIN Gate Drive V Voltage (VDD) VIN DRVH ENABLE Input Voltage (VIN) TG Output Current (IOUT) VSW LL PWM PWM DRVL GND Driver IC A VOUT BG PGND CSD873588N Averaging Circuit Averaged Switch V Node Voltage (VSW_AVG) Figure 27. Typical Application 10 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 Application Information (continued) 6.1.4 Calculating Power Loss and SOA The user can estimate product loss and SOA boundaries by arithmetic means (see Design Example). Though the Power Loss and SOA curves in this data sheet are taken for a specific set of test conditions, the following procedure outlines the steps the user should take to predict product performance for any set of system conditions. 6.1.4.1 Design Example Operating Conditions: • Output Current = 15 A • Input Voltage = 7 V • Output Voltage = 1 V • Switching Frequency = 800 kHz • Inductor = 0.2 µH 6.1.4.2 Calculating Power Loss • • • • • • Power Loss at 15 A = 2.75 W (Figure 1) Normalized Power Loss for input voltage ≈ 1.03 (Figure 6) Normalized Power Loss for output voltage ≈ 0.94 (Figure 7) Normalized Power Loss for switching frequency ≈ 1.08 (Figure 5) Normalized Power Loss for output inductor ≈ 1.03 (Figure 8) Final calculated Power Loss = 2.75 W × 1.05 × 0.95 × 1.05 × 1.05 ≈ 3.02 W 6.1.4.3 Calculating SOA Adjustments • • • • • SOA adjustment for input voltage ≈ 0.3ºC (Figure 6) SOA adjustment for output voltage ≈ –0.5ºC (Figure 7) SOA adjustment for switching frequency ≈ 0.7ºC (Figure 5) SOA adjustment for output inductor ≈ 0.3ºC (Figure 8) Final calculated SOA adjustment = 0.3 + (–0.5) + 0.7 + 0.3 ≈ 0.8ºC In the previous design example, the estimated power loss of the CSD87588N would increase to 3.02 W. In addition, the maximum allowable board and/or ambient temperature would have to decrease by 0.8ºC. Figure 28 graphically shows how the SOA curve would be adjusted accordingly. 1. Start by drawing a horizontal line from the application current to the SOA curve. 2. Draw a vertical line from the SOA curve intercept down to the board/ambient temperature. 3. Adjust the SOA board/ambient temperature by subtracting the temperature adjustment value. Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 11 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com Application Information (continued) In the design example, the SOA temperature adjustment yields a reduction in allowable board/ambient temperature of 0.8ºC. In the event the adjustment value is a negative number, subtracting the negative number would yield an increase in allowable board/ambient temperature. Figure 28. Power Block SOA 12 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 7 Layout 7.1 Layout Guidelines There are two key system-level parameters that can be addressed with a proper PCB design: electrical and thermal performance. Properly optimizing the PCB layout yields maximum performance in both areas. The following sections provide a brief description on how to address each parameter. 7.1.1 Electrical Performance The CSD87588N has the ability to switch voltages at rates greater than 10 kV/µs. Take special care with the PCB layout design and placement of the input capacitors, inductor, and output capacitors. • The placement of the input capacitors relative to VIN and PGND pins of CSD87588N device should have the highest priority during the component placement routine. It is critical to minimize these node lengths. As such, ceramic input capacitors need to be placed as close as possible to the VIN and PGND pins (see Figure 29). The example in Figure 29 uses 1 x 10 nF 0402 25 V and 4 x 10 μF 1206 25 V ceramic capacitors (TDK part number C3216X5R1C106KT or equivalent). Notice there are ceramic capacitors on both sides of the board with an appropriate amount of vias interconnecting both layers. In terms of priority of placement next to the Power Stage C21, C5, C8, C19, and C18 should follow in order. • The switching node of the output inductor should be placed relatively close to the Power Block II CSD87588N VSW pins. Minimizing the VSW node length between these two components will reduce the PCB conduction losses and actually reduce the switching noise level. See Figure 29. (1) 7.1.2 Thermal Performance The CSD87588N has the ability to utilize the PGND planes as the primary thermal path. As such, the use of thermal vias is an effective way to pull away heat from the device and into the system board. Concerns of solder voids and manufacturability problems can be addressed by the use of three basic tactics to minimize the amount of solder attach that wicks down the via barrel: • Intentionally space out the vias from each other to avoid a cluster of holes in a given area. • Use the smallest drill size allowed in your design. The example in Figure 29 uses vias with a 10 mil drill hole and a 16 mil capture pad. • Tent the opposite side of the via with solder-mask. The number and drill size of the thermal vias should align with the end user’s PCB design rules and manufacturing capabilities. 7.2 Layout Example Figure 29. Recommended PCB Layout (Top Down View) (1) Keong W. Kam, David Pommerenke, “EMI Analysis Methods for Synchronous Buck Converter EMI Root Cause Analysis”, University of Missouri – Rolla Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 13 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com 8 Device and Documentation Support 8.1 Trademarks NexFET is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 8.2 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 8.3 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 14 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 9 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 9.1 CSD87588N Package Dimensions Pin Configuration Position Copyright © 2013–2015, Texas Instruments Incorporated Designation Pin 1 TG Pin 2 VIN Pin 3 PGND Pin 4 BG Pin 5 VSW Submit Documentation Feedback 15 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com 2.500 REF PKG 1.238 2.108 2.500 REF PKG 9.2 Land Pattern Recommendation 1.250 REF PKG 0.858 2 0.000 0.238 0.538 0.858 3 5 0.238 0.538 1 4 2.000 0.500 0.800 1.120 0.000 0.758 PACKAGE OUTLINE 1.960 1.640 1.492 1.250 REF PKG 9.3 Stencil Recommendation (100 µm) Text For Spacing 16 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated CSD87588N www.ti.com SLPS384D – MARCH 2013 – REVISED APRIL 2015 9.4 Stencil Recommendation (125 µm) Text For Spacing For recommended circuit layout for PCB designs, see application note SLPA005 – Reducing Ringing Through PCB Layout Techniques. 9.5 Pin Drawing 87588N TI YMS LLLL E Text For Spacing Copyright © 2013–2015, Texas Instruments Incorporated Submit Documentation Feedback 17 CSD87588N SLPS384D – MARCH 2013 – REVISED APRIL 2015 www.ti.com 9.6 CSD87588N Embossed Carrier Tape Dimensions (1) Pin 1 is oriented in the top-left quadrant of the tape enclosure (closest to the carrier tape sprocket holes). spacer 18 Submit Documentation Feedback Copyright © 2013–2015, Texas Instruments Incorporated PACKAGE OPTION ADDENDUM www.ti.com 25-Feb-2015 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) CSD87588N ACTIVE PTAB MPA 5 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM CSD87588NT ACTIVE PTAB MPA 5 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM Op Temp (°C) Device Marking (4/5) -55 to 150 87588N 87588N (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 25-Feb-2015 In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 24-Feb-2015 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant CSD87588N PTAB MPA 5 2500 330.0 12.4 2.8 5.3 0.55 8.0 12.0 Q1 CSD87588NT PTAB MPA 5 250 180.0 12.4 2.8 5.3 0.55 8.0 12.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 24-Feb-2015 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) CSD87588N PTAB MPA 5 2500 367.0 367.0 35.0 CSD87588NT PTAB MPA 5 250 210.0 185.0 35.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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