Keysight E9901E Inâ circuit test system Datasheet

Keysight Medalist i3070 Series 5
In‑Circuit Test System
The Keysight Technologies, Inc. Medalist i3070 Series 5 In‑Circuit Test (ICT)
system introduces a new infrastructure with 3 new Capabilities:
1. The lexibility to incorporate external circuits to balance between ICT & functional
testers and reduce investment on functional testers
Data Sheet
2. Wider range of power handling capabilities for today’s high-powered products to
reduce investment on power supply hardware
3. Improved test throughput to increase production volumes, making more tester
resources available
The Series 5 – Saves Costs. No Compromise.
The Keysight Medalist i3070 Series 5 In‑Circuit Test System comes with industry‑leading limited
access test technology, including the multiple‑award‑winning Cover‑Extend Technology.
Latest Features on the Series 5 ICT System
New Analog Measurement Card
The new Analog Stimulus and
Response Unit (ASRU) includes
1. BT-Basic DLL Integration
This feature allows users to call any
external DLL function by passing
the parameters and receiving the
results within the BT-Basic environment. Examples of DLL functions
include flash programming, updating
of databases and functional tests.
2. Keysight Medalist i3070 LED Test*
Medalist i3070 LED Test is an industry-first digital LED test, integrated
into ICT, to inspect the color and
intensity of LEDs in the visible light
spectrum (400-660 nm). It provides
fast, reliable, and accurate inspection of LEDs for color (wavelength)
and luminosity (intensity).
6. 60 V zener testing capabilities
In today’s boards, because of
their higher voltage power supply
requirements, larger zener diodes
are required. With the new ASRU
card, a maximum of 60 V zeners can
be tested instead of up to 18 V.
7. Digitized Measurement Circuit
(DMC) with new frequency options
The purpose of this circuit is to
speed up the analog testing by
using multiple ports on a microcontroller to digitize, at one time,
the multiple readings taken during
a test. The microcontroller ports
can be assigned to the stimulus
and response busses as well as the
sense busses, so that all four readings on a 4-wire measurement can
be taken at one time. This Digitized
Measurement Circuit comes with
two new frequency options: fr100k
and fr200k. These frequencies are
added to the AC testing methods for
passive components like capacitors
and inductors for better isolation of
smaller components during test.
This new measurement circuit is
different and separate from the
analog measurement circuit using
Measurement Op-Amplifier (MOA).
Tests generated for the MOA will
have to be re-debugged if tested
with the DMC because the internal
circuit characteristics are different
from the MOA. The stability and
reliability of the measurement after
the test has been debugged remains
the same as when measured with
the MOA circuit.
* (Appropriate hardware is needed)
3. Two channels of high current capabilities of up to 10 A per channel
The DUT power supply channels 3
and 4 on the ASRU card have their
current capabilities increased from
4 A to 10 A per channel. This allows
the channels to carry 10 A currents
into the board for high current
application testing, such as power
supplies.
4. Power Monitoring Circuit
The Power Monitoring Circuit
(PMC) is a new safety feature. It not
only provides real time monitoring
but also helps users to distinguish
between a power supply failure or a
digital test failure in the event of a
failed digital test. This feature also
tries to prevent the back-drive current that can cause damage to ICs.
5. Fixture power supply
This powering capability is intended
for fixture electronics and other
external powering purposes. It
is controlled by the user with
BT-BASIC commands for enabling
and disabling.
Figure 1. The new analog stimulus and response unit card in the Medalist i3070 Series 5
offers users many new features and faster analog tests
2
Latest Features on the Series 5 ICT System
Incorporating External Electronics
This capability is enabled through both
hardware and software features added
to the i3070 Series 5 test system.
Connecting external instru‑
ments or equipment
Balanced multiplexed 1:4 75 Ω ports
Introduction of utility card
The new utility card is an optional pin
card that will fit in a card slot in any
of the modules on the testhead. It
has three cavities in the card to allow
users to plug in their own custom
electronics for added functional test or
functionality during ICT. The user can
now design his own card and make it
part of the tester. One utility card can
be installed on each module. Each
custom electronics unit should come
with the necessary software drivers
that can be installed on the testhead
controller.
Each cavity on the utility card has two
connectors; one is mainly for a signal
bus to the board under test and the
other for power and control to the
external electronics installed in the
cavity.
Two balanced 1:4 multiplexed 75 Ω
ports are available on the utility card to
allow users to add differential signals
to the board under test. These ports
can be used individually for single
sided signals.
Parameter
Rating
Number of ports
2
Multiplexing
1:4
Bandwidth
3 dB
(at 35 MHz ±3 MHz)
Crosstalk
< 1 MHz
(–55 dB ±2 dB)
Maximum current 2 A ±0.5 A
Impedance
General purpose relays
Eight general purpose relays are available on the utility card. The control of
these relays in software is the same
as for the general purpose relays on
the ASRU.
Flexible 1:6 multiplexed
power supply channels
The Utility Card allows 48 V at
10 A on each of two 1:6 port power
supply channels. Each power supply
channel can be user-configured to be
multiplexed to supply power to up to
six individual boards on a panel or the
individual relays can be configured to
switch together to enable testing of
a single board which requires 10 A
current power supplies.
75 Ω per pair
Please refer to the Keysight data sheet
5990-4411EN (Keysight Utility Card
Specifications) for more details on the
utility card.
Figure 2. The new utility card on the Medalist i3070 Series 5 allows for customizable
functional tests to be added at the in-circuit test process
3
Latest Features on the Series 5 ICT System
Software Enhancement
The Series 5 also includes software
and enhancements listed below, and
retains all the user-friendly features of
the original i3070 system, such as:
– DC test method for large capacitor testing
When testing large capacitors, it
is possible to specify the current
instead of using the standard
100 mV across the capacitor.
– Ease of use
Point-and-click interfaces remove the user’s need to type in
commands during the operation
of the tester
– Board Locator
The Board Locator allows the
user to search for any component on the board under test
as well as probes and testhead
resources.
– AutoOptimizer
Keysight Medalist i3070 tests
can be optimized with the click
of a button, reducing test time
by 10 to 50 percent per test.
– AutoDebug
With the click of a button, the
system can perform a complete
analog test debug in a matter
of hours. AutoDebug ine-tunes
tests so boards pass reliably in
production.
Please refer to the Keysight Medalist
i3070 In-Circuit Test System data sheet
5989-6292EN for detailed information
on the original features which users
can continue to enjoy on the Series 5.
Figure 3. The Series 5 retains all the easy-to-use interfaces that many users are now
accustomed to on the Medalist i3070 system
Related Keysight Literature
Publication title
Pub number
Keysight Medalist i3070 ICT Data Sheet
5989-6292EN
Keysight Utility Card Specifications
5990-4411EN
Medalist i3070 In Circuit Test – Utilizing the most
comprehensive Limited Access Solution on In Circuit
Test – A Case Study
5990-3741EN
Keysight Medalist VTEP v2.0 Powered! With Cover-Extend Technology Flyer
5989-8429EN
Overcoming Limited Access with Cover-Extend Technology at In-Circuit
Test Case Study
5990-4218EN
IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 In
Circuit Systems White Paper
5990-3232EN
Keysight Medalist Bead Probe Technology Product Overview
5989-5802EN
Comparing Contact Performance on PCBA using Conventional Testpads and
Bead Probes White Paper
5989-9918EN
Using Bead Probes to Increase Test Access Case Study
5989-8420EN
Related literature can be located on Keysight’s Medalist In-Circuit Test Solutions web site at:
www.keysight.com/find/ict under the “Library” tab.
4
Speciications
Keysight Medalist i3070 Series 5
Multiplexed
Keysight Medalist i3070 Series 5
Un-multiplexed
Maximum channels
1152
5184
Maximum nodes
5184
5184
Pin card
HybridPlus double density
Un-multiplexed hybrid 144 channel
Driver/receiver mux ratio
9:2 multiplexing
1:1 tester-per-pin
Vector application rate
6.25 MPs, 12.5 MPs, 20 MPs
6.25 MPs
Logic level
–3.5 V to 5 V
(per digital channel pin programmable)
0 to 4.75 V
(per-pin programmable)
Logic threshold
Dual threshold
Single threshold
Slew rate
25 V/µsec to 275 V/µsec
(per digital channel pin programmable)
300 V/µsec
(optimized fixed rise/fall time)
Digital driver/Receiver offset
–30 n to +100 n
(per digital channel pin programmable)
Not applicable
Operating system
Windows 7 Professional
Test generation toolset
Board Consultant
Fixture Consultant
Test Consultant
Time-to-money test development
Board/Fixture graphics display
Browser
Board Consultant
Fixture consultant
Browser
Circuit analysis
Keysight Medalist i3070 Application
Software
Automatic (IPG) with Monte Carlo simulation
Windows graphical user interface (supports localization)
Probe pin locator
Interactive probe/pin locator with guided probed
Runtime yield display
Real time FPY (First Pass Yield) display at runtime
Probe/fixture maintenance tools
Worst probe reporting (reports real time fixture probe number that fails frequently)
Yield enhancement tool
Analog unpowered debug interface
IYET (Intelligent Yield Enhancement Tool)
Graphical user interface in spread sheet format (supports localization)
Digital/Analog powered debug interface
AutoDebug
PushButton Debug
AutoDebug on analog unpowered tests, TestJet, VTEP v2.0 (VTEP, iVTEP and NPM) and
Cover-Extend Technology
Modular construction for
flexibility/scalability
(1 to 4) Standard
Dual-well construction for maximum
throughput
Standard
Throughput multiplier
Standard
Failure message printer
Standard (strip printer)
Vacuum solenoids
Built-in standard
5
Speciications
Keysight Medalist i3070 Series 5
Multiplexed
System power input connections
Keysight Medalist i3070 Series 5
Un-multiplexed
Included (power supply type will be specified based on regional requirements)
Shipping and installation assistance
Included (Keysight authorized representative)
Analog unpowered measurement
2 to 6 wire measurement
Backdriving current
750 mA
Backdriving test program setup
Automatic by logic family
Overvoltage protection
Yes
Capacitor discharge protection
Yes
Arbitrary waveform generator
Yes
Fixture types supported
Short wire, long wire
Repeatability
Excellent
Transportability
Excellent
Temperature compensation
AutoAdjust at every 5° C temperature drift/1000 hours of operation
Open/short testing
Yes (automatic IPG)
Analog testing
Yes (automatic IPG)
Vector programming
VCL and PCF
Vectorless testing
VTEP v2.0 and TestJet
NAND tree program generator
Language based
Disabling analysis
Yes (automatic IPG)
Digital test pattern generator
Frequency measurement
Yes
60 MHz (beyond 60 MHz measurement possible using fixture electronics solution)
Multilevel disable (digital isolation)
Yes
High-voltage testing capability
100 V
Low-voltage testing capability
No limit
Number of analog guarding points
Unlimited
Worst probe report
Yes
First pass yield report
Yes
Component-level coverage report
Yes
Intelligent yield enhancement test
Yes
Limited access tools
Yes
Flash 70 device programming
Yes
Polarity check software
Yes
ICT Boundary Scan
Yes
PanelTest for panelized PCBAs
Yes
Simplate express fixturing software
Yes
Standard i3070 operating system
Yes
Multiple board versions software
Yes
Dual-well sharing
Yes
Throughput multiplier
Relay-level diagnostics tool
Yes
Included
1-year license
SPC quality tool
Push-button Q-Stats
6
Speciications
Keysight Medalist i3070 Series 5
Multiplexed
Keysight Medalist i3070 Series 5
Un-multiplexed
Software products
Test development software bundle
(stand alone)
Includes:
Express fixturing
Drive thru
Flash programming
Multiple board versions
Dual-well sharing
Flash ISP
Advanced probe spacing
PLD ISP
VTEP v2.0 Powered
VTEP
iVTEP
NPM
Cover-Extend Technology
InterconnectPlus
Advanced Boundary Scan 1149.6
Throughput multiplier
Panel test
TestJet
Boundary Scan
Polarity check
Silicon nails
Flash70
InterconnectPlus Boundary Scan
Drive-Thru for VTEP v2.0
TestSight Developer
Advanced Boundary Scan tool suite
Test development software for Vectorless Test Extended Performance (VTEP) tool
CAD translation software for ICT test and fixture development
Flash ISP
In-system programming for flash memory devices
ISP suite
Combined flash and PLD in-system programming software suite
Silicon nails
Test development tools for limited access test coverage
Cover-Extend
A hybrid of Boundary Scan and VTEP testing for added test coverage on limited test
access boards
Connect Check
Analog testing in a limited access
environment
N/A
Analog capabilities
Shorts and Opens
2 Ω – 1000 Ω ± (0.25% + 2.2 Ω)
Resistors
0.1 Ω to 10 MΩ ± (0.25% to 5% + plus system residual ≤ 3.5 W)
Capacitors
10 pf to 10 mf ± (2% to 6% + *)
* Plus system residual: ± 1 pF with capacitor compensation,
0 to +40 pF typical without capacitor compensation
Inductors
5 μH to 100 H ± (2% to 5%) + plus system residual: 1 μH
Potentiometer
Same method as resistors
Diode
± 0 – 19 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA
Zener
± 0 – 18 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8
± 19 – 60 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8
Transistor
Depletion FET
Fuse, switch, jumper
Same method as Diode + DC Beta (10-1000 ± (15.0%))
5 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W
0.1 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W
7
Speciications
Keysight Medalist i3070 Series 5
Multiplexed
Keysight Medalist i3070 Series 5
Un-multiplexed
Hybrid plus double density
Analog plus double density
Access plus
Utility
Un-multiplexed hybrid 144-channel
Utility
Modules and pin cards
Pin card
Measurement card
ASRU (Analog Stimulus Response Unit) Revision N
Control card
Number of modules supported
Control XTP
1 to 4 modules (additional modules activation package to expand capabilities of systems
having unused empty modules. Required additional hybrid card, Control XTP, ASRU card
and associated cabling and hardware)
DUT power supplies
DUT power supplies type*
Keysight PS6751Quad Output (0-50 V/0-5 A)
Keysight 6624 Quad Output (0-20 V/0-2 A, 0-7 V/0-5 A, 0-50.5 V/0.0824 A, 0-20.2 V/0-2.06 A)
Keysight 6621A Dual Output (0-7 V/0-10 A, 0-20.2 V/0-4.12 A)
Keysight 6634 Single Output (0-100 V/0-1 A)
Keysight 6642 Single Output (0-20 V/ 0-10 A)
Number of supply channels
Up to 24 programmable supplies or up to 32 channel with utility card
Accessories
Bar code reader
For data entry of DUT board serial number
Pin verification fixture
Performance port
To add external signal capabilities to your i3070 system
Product support kits
Multiple optional kits to choose from
Consulting services
Multiple service options and products to choose from
User training
*
For system calibration and diagnostics
Multiple optional training programs to choose from
Refer to Keysight Medalist i3070 Series 5 Test Method and Specifications for more details
Additional information on Keysight’s Medalist In-Circuit Test Solutions can be found at www.keysight.com/find/ict
8
09 | Keysight | Medalist i3070 Series 5 In‑Circuit Test System ‑ Data Sheet
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Published in USA, August 2, 2014
5990‑4344EN
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