TI1 BQ78PL116RGZR Powerlanâ ¢ master gateway battery management controller Datasheet

bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
PowerLAN™ Master Gateway Battery Management Controller
With PowerPump™ Cell Balancing Technology
Check for Samples: bq78PL116
FEATURES
1
•
23
•
•
•
•
•
•
•
•
•
bq78PL116 Designed for Managing 3- to
16-Series-Cell Battery Systems
– Support for LCD and Electronic Paper
Displays or EPDs
– Configurable for 11-A, 26-A, or 110-A
Operating Currents
Systems With More Than Four Series Cells
Require External bq76PL102 Dual-Cell
Monitors
SmartSafety Features:
– Prevention: Optimal Cell Management
– Diagnosis: Improved Sensing of Cell
Problems
– Fail Safe: Detection of Event Precursors
Rate-of-Change Detection of All Important Cell
Characteristics:
– Impedance
– Cell Temperature
PowerPump Technology Transfers Charge
Efficiently From Cell to Cell During All
Operating Conditions, Resulting in Longer
Run Time and Cell Life
– Includes User-Configurable PowerPump
Cell-Balancing Modes
High-Resolution 18-Bit Integrating Delta-Sigma
Coulomb Counter for Precise Charge-Flow
Measurements and Gas Gauging
Multiple Independent Δ-Σ ADCs: One-per-Cell
Voltage, Plus Separate Temperature, Current,
and Safety
Simultaneous, Synchronous Measurement of
Pack Current and Individual Cell Voltages
Very Low Power Consumption
– < 400 μA Active, < 185 μA Standby, < 85 μA
Ship, and < 1 μA Undervoltage Shutdown
Accurate, Advanced Temperature Monitoring
•
•
•
•
of Cells and MOSFETs With up to 4 Sensors
Fail-Safe Operation of Pack Protection
Circuits: Up to Three Power MOSFETs and
One Secondary Safety Output (Fuse)
Fully Programmable Voltage, Current, Balance,
and Temperature-Protection Features
External Inputs for Auxiliary MOSFET Control
Smart Battery System 1.1 Compliant via
SMBus
APPLICATIONS
•
•
•
Portable Medical Instruments and Test
Equipment
Mobility Devices (E-Bike)
Uninterruptible Power Supplies and Hand-Held
Tools
DESCRIPTION
The bq78PL116 master gateway battery controller is
part of a complete Li-Ion control, monitoring, and
safety solution designed for large series cell strings.
The bq78PL116 along with bq76PL102 PowerLAN™
dual-cell monitors provide complete battery-system
control, communications, and safety functions for a
structure of three up to 16 series cells. This
PowerLAN
system
provides
simultaneous,
synchronized voltage and current measurements
using one A/D per-cell technology. This eliminates
system-induced noise from measurements and allows
the precise, continuous, real-time calculation of cell
impedance under all operating conditions, even
during widely fluctuating load conditions.
PowerPump technology transfers charge between
cells to balance their voltage and capacity. Balancing
is possible during all battery modes: charge,
discharge, and rest. Highly efficient charge-transfer
circuitry nearly eliminates energy loss while providing
true real-time balance between cells, resulting in
longer run-time and improved cycle life.
1
2
3
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerLAN, PowerPump, bqWizard are trademarks of Texas Instruments.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
© 2010–2011, Texas Instruments Incorporated
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION (CONTINUED)
Temperature is sensed by up to 4 external sensors and one on-chip sensor. This permits accurate temperature
monitoring of each cell individually. Firmware is then able to compensate for the temperature-induced effects on
capacity, impedance, and OCV on a cell-by-cell basis, resulting in superior charge/ discharge and balancing
control.
External MOSFET control inputs provide user- definable direct hardware control over MOSFET states. Smart
control prevents excessive current through MOSFET body diodes. Auxiliary inputs can be used for enhanced
safety and control in large multicell arrays.
The bq78PL116 is completely user-configurable, with parametric tables in flash memory to suit a variety of cell
chemistries, operating conditions, safety controls, and data reporting needs. It is easily configured using the
supplied bqWizard™ graphical user interface (GUI). The device is fully programmed and requires no algorithm or
firmware development.
The bq78PL116 pin functions of LED1/SEG1–LED5/SEG5, PSH/BP/TP, and FIELD support LED, LCD, and
electronic paper displays (EPDs). The user can configure the bq78PL116 for the desired display type.
P-LAN
V1
P1N
P1S
XT1
FLASH
CELL 4
DSG
EFCID
Balance
Temp
CELL 3
EFCIC
Voltage
SPROT
RISC
CPU
Voltage
Balance
Temp
Second-Level
Safety
CSBAT
Coulomb Counter
CCBAT
CSPACK
Current A/D
Voltage
Balance
Temp
PowerLAN
Communication
Link
Reset
Logic
RSTN
VLDO1
CHG
First-Level Safety
and
FET Control
SRAM
V2
P2N
P2S
XT2
Balance
Temp
PRE
CELL 2
V3
P3N
P3S
XT3
Voltage
CELL 1
V4
P4N
P4S
XT4
Watchdog
2.5 V LDO
Core / CPU
Measure
7
GPIO
Internal
Oscillator
CCPACK
SMBus
LED1–5/SEG1–5,
PSH/BP/TP,
FIELD
SMBCLK
SMBDAT
Internal
Temperature
I/O
Safety
B0320-03
Figure 1. BQ78PL116 Internal Block Diagram
2
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
B0332-03
Pack
Positive
www.ti.com
Pack
Negative
V2 T2
V1 T1
V2 T2
V1 T1
9
V2 T2
8
V1 T1
7
V2 T2
6
V1 T1
5
V4 XT4
10
4
V3 XT3
11
3
V2 XT2
12
2
V1 XT1
SMBus
PowerLAN
Master Gateway Battery Controller
bq78PL116
PowerLAN
Communication
Link
bq76PL102
Dual-Cell Monitor
Bq76PL102
Dual-Cell Monitor
Example 12-cell configuration shown
bq76PL102
Dual-Cell Monitor
Bq76PL102
Dual-Cell Monitor
Pack Protection
Circuits and Fuse
1
RSENSE
Figure 2. Example bq78PL116 System Implementation (12 Cells)
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
3
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 1. ORDERING INFORMATION
Product
bq78PL116
(1)
Cell
Configuration (1)
Package
Package
Designator
3 to 16 series cells
QFN-48, 7-mm ×
7-mm
Temperature
Range
–40°C to 85°C
RGZ
Ordering
Number
Quantity, Transport
Media
bq78PL116RGZ
T
250, tape and reel
bq78PL116RGZ
R
2500, tape and reel
For configurations consisting of more than four series cells, additional bq76PL102 parts must be used.
AVAILABLE OPTIONS
V1
XT1
XT2
V2
VLDO2
V3
XT3
XT4
V4
SMBDAT
SMBCLK
46
45
44
43
42
41
40
39
38
37
DSG
47
1
VSS
CHG
48
bq78PL116
RGZ Package
(Top View)
36
LED5/SEG5
2
35
LED4/SEG4
PRE
3
34
LED3/SEG3
EFCIC
4
33
LED2/SEG2
EFCID
5
32
LED1/SEG1
CCBAT
6
31
PSH/BP/TP
Thermal Pad
24
RSTN
P-LAN
25
23
12
P4N
OSCO
22
NC
P4S
26
21
11
P3N
OSCI
20
NC
P3S
27
19
10
SDI3
CSPACK
18
NC
SDO2
28
17
9
P2N
CSBAT
16
FIELD
P2S
29
15
8
P1N
VLDO1
14
SPROT
SDI1
30
13
7
SDO0
CCPACK
P0023-25
Figure 3. bq78PL116 Pinout
bq78PL116 TERMINAL FUNCTIONS
NAME
NO.
TYPE
(1)
DESCRIPTION
CCBAT
6
IA
Coulomb counter input (sense resistor), connect to battery negative
CCPACK
7
IA
Coulomb counter input (sense resistor), connect to pack negative
CHG
1
O
Charge MOSFET control (active-high, low opens MOSFET)
CSBAT
9
IA
Current sense input (safety), connect to battery negative
CSPACK
10
IA
Current sense input (safety), connect to pack negative
DSG
2
O
Discharge MOSFET control (active-high, low opens MOSFET)
EFCIC
4
I
External charge MOSFET control input
EFCID
5
I
External discharge MOSFET control input
(1)
4
Types: I = Input, IA = Analog input, IO = Input/Output, O = Output, P = Power
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
bq78PL116 TERMINAL FUNCTIONS (continued)
NAME
NO.
TYPE
(1)
DESCRIPTION
FIELD
29
O
EPD field segment
LED1/SEG1
32
O
LED1 – open-drain, active-low, LCD and EPD segment 1
LED2/SEG2
33
O
LED2 – open-drain, active-low, LCD and EPD segment 2
LED3/SEG3
34
O
LED3 – open-drain, active-low, LCD and EPD segment 3
LED4/SEG4
35
O
LED4 – open-drain, active-low, LCD and EPD segment 4
LED5/SEG5
36
O
LED5 – open-drain, active-low, LCD and EPD segment 5
N/C
26, 27
IO
Connect 1-MΩ resistor to VSS
N/C
28
O
No connect
OSCI
11
I
External oscillator input (no connect, internal oscillator used)
OSCO
12
O
External oscillator output (no connect, internal oscillator used)
P1N
15
O
Charge-balance gate drive, cell 1 north
P2N
17
O
Charge-balance gate drive, cell 2 north
P2S
16
O
Charge-balance gate drive, cell 2 south
P3N
21
O
Charge-balance gate drive, cell 3 north
P3S
20
O
Charge-balance gate drive, cell 3 south
P4N
23
O
Charge-balance gate drive, cell 4 north
P4S
22
O
Charge-balance gate drive, cell 4 south
P-LAN
24
IO
PowerLAN I/O to external bq76PL102 nodes
PRE
3
O
Precharge MOSFET control (active-high)
PSH/BP/TP
31
IO
Pushbutton detect for LED display, LCD backplane, EPD top plane and charge pump
RSTN
25
I
Device reset, active-low
SDI1
14
I
Connect to SDO0 via a capacitor
SDI3
19
I
Internal PowerLAN connection – connect to SDO2 through a 0.01-μF capacitor
SDO0
13
O
Requires 100-kΩ pullup resistor to VLDO1
SDO2
18
O
Internal PowerLAN connection – connect to SDI3 through a 0.01-μF capacitor
SMBCLK
37
IO
SMBus clock signal
SMBDAT
38
IO
SMBus data signal
SPROT
30
O
Secondary protection output, active-high (FUSE)
V1
47
IA
Cell-1 positive input
V2
44
IA
Cell-2 positive input
V3
42
IA
Cell-3 positive input
V4
39
IA
Cell-4 positive input
VLDO1
8
P
Internal LDO-1 output, bypass with 10-μF capacitor to VSS
VLDO2
43
P
Internal LDO-2 output, bypass with 10-μF capacitor to V2
VSS
48
IA
Cell-1 negative input
XT1
46
IA
External temperature-sensor-1 input
XT2
45
IA
External temperature-sensor-2 input
XT3
41
IA
External temperature-sensor-3 input
XT4
40
IA
External temperature-sensor-4 input
–
–
P
Thermal pad. Connect to VSS
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
5
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
RANGE
UNITS
TA
Operating free-air temperature (ambient)
–40 to 85
°C
Tstg
Storage temperature
–65 to 150
°C
V4
Voltage range with respect to V3
–0.5 to 5.0
V
V3
Voltage range with respect to V2
–0.5 to 5.0
V
V2
Voltage range with respect to V1
–0.5 to 5.0
V
V1
Voltage range with respect to VSS
–0.5 to 5.0
V
EFCIC, EFCID
Voltage range with respect to VSS
–0.5 to 5.0
V
LED1/SEG1—LED5/SEG5
Voltage on I/O pin with respect to VSS
–0.5 to 5.0
V
SMBCLK, SMBDAT
Voltage range with respect to VSS
–0.5 to 6.0
V
VLDO1
Voltage with respect to VSS
3.0
V
VLDO2
Voltage range with respect to V2
3.0
V
RSTN
Voltage range with respect to VSS
–0.5 to VLDO1 + 0.5
V
FIELD, SPROT, PSH/BP/TP
Voltage range with respect to VSS
–0.5 to VLDO1 + 0.5
V
CCBAT, CCPACK, CSBAT, CSPACK
Voltage range with respect to VSS
–0.5 to VLDO1 + 0.5
V
CHG, DSG, PRE
Voltage range with respect to VSS
–0.5 to VLDO1 + 0.5
V
OSCI, OSCO
Voltage with respect to VSS
–0.5 to VLDO1 + 0.5
V
XT1, XT2
Voltage with respect to VSS
–0.5 to VLDO1 + 0.5
V
SDO0
Voltage range with respect to VSS
–0.5 to VLDO1 + 0.5
V
XT3, XT4
Voltage range with respect to V2
–0.5 to VLDO2 + 0.5
V
SDO2, SDI3, P-LAN
Voltage range with respect to V2
–0.5 to VLDO2 + 0.5
V
SDO0, SDI1
Voltage range with respect to VSS
–0.5 to V1 + 0.5
V
P1N, P2S, P2N
Voltage range with respect to VSS
–0.5 to V1 + 0.5
V
P3S, P3N, P4S, P4N
Voltage range with respect to V2
–0.5 to V3 + 0.5
V
PRE, CHG, DSG, SPROT, FIELD,
PSH/BP/TP
Current source/sink
20
mA
LED1/SEG1–LED5/SEG5
Current source/sink
20
mA
VLDO1, VLDO2
Current source/sink
20
mA
ESD tolerance
JEDEC, JESD22-A114 human-body model, R = 1500 Ω, C =
100 pF
2
kV
Lead temperature, sodlering
Total time < 3 seconds
300
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
VSUP
Supply voltage—V1, V2, V3, V4
MIN
NOM
All cell voltages equal,
four-cell operation
2.5
3.6
All cell voltages equal,
three-cell operation (V3 =
V4)
2.8
3.6
Minimum startup voltage—V1, V2, V3, V4 All cell voltages equal
VIN
Input cell voltage range—V(n+1) – V(n), n
= 1, 2, 3, 4
CVLDO1
VLDO 1 capacitor—VLDO1
2.2
CVLDO2
VLDO 2 capacitor—VLDO2
2.2
CVn
Cell-voltage capacitor—Vn
4.5
4.5
2.9
V
0
1
Submit Documentation Feedback
UNIT
V
VStartup
6
MAX
4.5
V
10
47
μF
10
47
μF
μF
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
ELECTRICAL CHARACTERISTICS
TA = –40°C to 85°C (unless otherwise noted)
DC Characteristics
PARAMETER
TEST CONDITIONS
IDD
Operating-mode current (at
V2)
ISTBY
Standby-mode current (at V2) SMBCLK = SMBDAT = VSS, IBAT = 0,
cells = 3.6 V
ISHIP
Ship-mode current (at V2)
SMBCLK = SMBDAT = VSS, IBAT = 0,
cells = 3.6 V
IECUV
Extreme cell undervoltage
shutdown current
All cells < 2.7 V and any cell < ECUV set
point
SPROT, LEDEN,
PSH/BP/TP(bq78PL116),
FIELD(bq78PL116)
IOL < 4 mA
SPROT, LEDEN,
PSH/BP/TP(bq78PL116),
FIELD(bq78PL116)
IOH < –4 mA
VOL
VOH
(1)
VIL
SPROT, LEDEN,
PSH/BP/TP(bq78PL116),
FIELD(bq78PL116)
VIH
SPROT, LEDEN,
PSH/BP/TP(bq78PL116),
FIELD(bq78PL116)
(1)
MIN
Acrtive mode, cells = 3.6 V
TYP
MAX
UNIT
400
μA
185
μA
85
μA
0
1
μA
0.5
V
VLDO1 – 0.1
V
0.25 VLDO1
V
0.75 VLDO1
V
Does not apply to SMBus pins.
Voltage-Measurement Characteristics
TA = –40°C to 85°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
Measurement range
2.75
MAX
UNIT
4.5
V
<1
Resolution
±3
25°C
Accuracy (1)
mV
±7
mV
±10
0°C to 60°C
Measurement temperature coefficient
(1)
TYP
160
180
200
µV/°C
TYP
MAX
UNIT
Voltage measurement calibrated at factory
Current-Sense Characteristics
PARAMETER
Measurement range
TEST CONDITIONS
MIN
–0.112
Hardware gain = 9
(1)
0.1
V
Measurement range (SENSE1)
10-mΩ sense resistor
–11.2
10
A
Measurement range (SENSE2)
3-mΩ sense resistor (hardware gain = 13)
–25.8
25.8
A
Measurement range (SENSE3)
1-mΩ sense resistor (2)
–112
100
A
Input offset
TA = 25°C
±50
μV
Offset drift
TA = 0°C to 60°C
0.5
μV/°C
Hardware gain = 9
10
μV
Resolution
Full-scale error
(3)
Full-scale error drift
(1)
(2)
(3)
TA = 25°C
TA = 0°C to 60°C
±0.1%
50
PPM/°C
Default setting
Measurement range beyond ±32,768 mA requires the use of an SBData IPScale Factor.
After calibration. Accuracy is dependent on system calibration and temperature coefficient of sense resistor.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
7
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
Coulomb-Count Characteristics (1)
www.ti.com
(2)
PARAMETER
TEST CONDITIONS
MIN
Resolution
TYP
Intergral nonlinearity
0.008%
Snap-to-zero (deadband)
±100 (3)
(1)
(2)
(3)
MAX
5
UNIT
nVh
μV
Shares common input with current-sense section (CCBAT, CCPACK)
After calibration. Accuracy is dependent on system calibration and temperature.
Corresponds to ±10 mA with 10-mΩ sense resistor
Current-Sense (Safety) Characteristics (1)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
Minimum threshold setting
Accuracy (1)
Short-circuit detection
V
mV
–20
20
mV
–4
4
10
Overcurrent detection, charge and discharge
Duration
UNIT
42
Short-circuit detection
Resolution
MAX
0.312
25
Overcurrent detection, charge and discharge
(1)
TYP
–0.312
Measurement range
mV
1.25
Short-circuit detection
0.1
3.2
Overcurrent detection, charge and discharge
0.9
106
ms
After calibration. Accuracy is dependent on system calibration and temperature coefficient of sense resistor.
Internal Temperature-Sensor Characteristics (1)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
Resolution
Accuracy (1)
(1)
TYP
–30
Measurement range
0° to 85°
MAX
85
UNIT
°C
0.1
°C
±2
°C
After calibration. Accuracy is dependent on system calibration.
LDO Voltage Characteristics (1)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Load = –200 μA
VLDO1
LDO1 operating voltage, referenced to
VSS
VLDO2
LDO2 operating voltage, referenced to V2 Load = –2 mA
(1)
MIN
TYP
MAX
UNIT
2.425
2.5
2.575
V
2.425
2.5
2.575
V
MIN
TYP
MAX
UNIT
After calibration. Accuracy is dependent on system calibration.
External Temperature-Sensor Characteristics
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
–40
Measurement range
Resolution
Accuracy (1)
25°
±2
0° to 85°
±2
8
30
50
°C
°C
0.2
Source current
(1)
90
°C
70
µA
After calibration. Accuracy is dependent on system calibration.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
SMBus Characteristics (1)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VIL
Input low voltage
VIH
Input high voltage
VOL
Output low voltage
CL
Capacitance, each I/O pin
fSCL
SCLK nominal clock
frequency
RPU (2)
Pullup resistors for SCLK,
SDATA
(1)
(2)
MIN
350-µA sink current
TA = 25°C
TYP
MAX
UNIT
0
0.8
V
2.1
5.5
V
0
0.4
V
10
pF
100
kHz
10
100
VBUS 5 V nominal
13.3
45.3
VBUS 3 V nominal
2.4
6.8
kΩ
SMBus timing and signals meet the SMBus 2.0 specification requirements under normal operating conditions. All signals are measured
with respect to PACK-negative.
Pullups are typically implemented external to the battery pack and are selected to meet SMBus requirements.
PowerLAN Characteristics (1) (2) (3)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
UNIT
100
pF
Load capacitance
VIH
Input logic high
VOH
Output logic high
VIL
Input logic low
VOL
Output logic low
tr(I)
Input rise time
SDI1, SDI3
500
ns
tf(I)
Input fall time
SDI1, SDI3
500
ns
tr(O)
Output rise time
SDO0, SDO2, P-LAN
30
50
ns
tf(O)
Output fall time
SDO0, SDO2, P-LAN
30
50
ns
(1)
(2)
(3)
SDI1, SDI3, SDO0, SDO2, P-LAN
MAX
CL
SDI1
0.8 VLDO1
SDI3
0.8 VLDO2
SDO0, SDO2
0.9 VLDO1
P-LAN
0.9 VLDO2
V
V
SDI1
0.2 VLDO1
SDI3
0.2 VLDO2
SDO0, SDO2
0.1 VLDO1
P-LAN
0.1 VLDO2
V
V
Values specified by design and are over the full input voltage range and the maximum load capacitance.
The SDI and SDO pins are ac-coupled from the cell circuits downstream and upstream, respectively. The limits specified here are the
voltage transitions which must occur within the SDI and SDO rise-and fall-time specifications.
Coupling capacitor between PowerLAN pins is 1000 pF. This value is specified by design.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
9
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
PowerPump Characteristics (1)
over free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VOH
High drive, P2S
IOUT = –10 µA
VOL
Low drive, P2S
IOUT = 200 µA
VOH
High drive, P1N, P2N
IOUT = –200 µA
VOL
Low drive, P1N, P2N
IOUT = 10 µA
VOH
High drive, P3S, P4S
IOUT = –10 µA
VOL
Low drive, P3S, P4S
IOUT = 200 µA
VOH
High drive, P3N, P4N
IOUT = –200 µA
VOL
Low drive, P1N, P2N
IOUT = 10 µA
IOH
Source current, P2S, P3S,
P4S
VOH = V1 – 0.8 V
250
µA
IOL
Sink current, P1N, P2N,
P3N, P4N
VOH = V1 + 0.2 V
–250
µA
tr
Signal rise time
CLoad = 300 pF
100
ns
tf
Signal FET fall time
CLoad = 300 pF
100
ns
fP
Frequency
D
PWM duty cycle
10
V
0.1 V1
0.9 V1
V
V
0.1 V1
0.9 V1
V
V
0.1 V1
0.9 V1
V
V
0.1 V1
204.8
P1N, P2N, P3N, P4N
P2S, P3S, P4S
(1)
(2)
0.9 V1
V
kHz
33%
67% (2)
All parameters representative of a typical cell voltage of 3.6 V.
Effective duty cycle is 33%. PxS pins are P-channel drives and MOSFET on-time is (1 – D).
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
RPRE
+
PACK+
PRE
CHG
DSG
Level-Shift Circuits
SDI1
SDO2
SDO0
Cell Balancing
Circuits
CELL 6
V2
V1
bq76PL102
SDI3
VLDO1
RSTN
P-LAN
CELL 5
SPROT
V4
bq78PL116
PowerLAN
Gateway Battery LED1–LED5
Management
Controller
Aux FET
Control
VLDO2
EFCIC
V2
EFCID
V1
SMBCLK
CELL 1
XT1–XT4
SMBus
CELL 2
V3
5
ESD Protection
CELL 3
Cell Balancing Circuits
CELL 4
SMBDAT
CSPACK
CCPACK
CCBAT
CSBAT
TAB
CRFI
VSS
Temperature
Sensor (typ.)
One of 4 external
sensors shown
–
Typical six-cell configuration shown.
Additional cells added via PowerLAN connection.
Some components omitted for clarity.
PACK–
RSENSE
S0342-04
Figure 4. bq78PL116 Simplified Example Circuit Diagram
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
11
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
FEATURE SET
Primary (First-Level) Safety Features
The bq78PL116 implements a breadth of system protection features which are easily configured by the
customer. First-level protections work by controlling the MOSFET switches. These include:
• Battery cell over/undervoltage protection
• Pack over/undervoltage protection
• Charge and discharge overcurrent protection
• Short-circuit protection
• External MOSFET control inputs (EFCIx) with programmable polarity
• Up to four external temperature inputs for accurate cell and MOSFET monitoring
• Watchdog timer protection
• Brownout detection and protection against extreme pack undervoltage
Secondary (Second-Level) Safety Features
The bq78PL116 can detect more serious system faults and activate the SPROT pin, which can be used to open
an in-line chemical fuse to permanently disable the pack. Secondary optional features include
• Fully independent of first-level protections
• SmartSafety algorithms for early detection of potential faults
– Temperature abnormalities (extremes, rate of change)
– Cell imbalance exceeds safety limits
– Impedance rise due to cell or weld strap fault
• MOSFET failure or loss of MOSFET control
• Safety overvoltage, pack and cell
• Safety overtemperature, limits for both charge and discharge
• Safety overcurrent, charge and discharge
• Failed current measurement, voltage measurement, or temperature measurement
Charge Control Features
• Meets SMBus 1.1 and Smart Battery System (SBS) Specification 1.1 requirements
• Active cell balancing using patented PowerPump technology, which eliminates unrecoverable capacity loss
due to normal cell imbalance
• Simultaneous, synchronous measurement of all cell voltages in a pack
• Simultaneous, synchronous measurement of pack current with cell voltages
• Reports target charging current and/or voltage to an SBS Smart Charger
• Reports the chemical state-of-charge for each cell and pack
• Supports precharging and zero-volt charging with separate MOSFET control
• Programmable, Chemistry-specific parameters
• Fault reporting
Gas Gauging
• The bq78PL116 accurately reports battery cell and pack state-of-charge (SOC). No full charge/discharge
cycle is required for accurate reporting.
• State-of-charge is reported via SMBus and optional display.
• 18-bit integrating delta-sigma ADC coulomb counter
12
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Display Types
• The bq78PL116 drives a three- to five-segment LED display in response to a pushbutton (LEDEN) input
signal. Each LED pin can sink up to 10 mA.
• The bq78PL116 drives a three- to five-segment static liquid-crystal display.
• The bq78PL116 drives a three- to five-segment electronic paper display. An external 15-V voltage source is
required. E Ink Corporation supplies this type of display.
The display type is selected via the parameter set.
Lifetime Logging (Readable via SMBus)
• Lifetime delivered ampere-hours
• Last discharge average
• Lifetime maximum power
• Maximum/minimum temperature
• Maximum/minimum pack voltage
• Maximum/minimum cell voltage in a pack
• Maximum charge and discharge currents
Power Modes
• Normal Mode: The bq78PL116 performs measurements and calculations, makes decisions, and updates
internal data approximately once per second. All safety circuitry is fully functional in this mode.
• Standby Mode: The bq78PL116 performs as in normal mode, but at a dramatically reduced rate to lower
power consumption at times when the host computer is inactive or the battery system is not being used. All
safety circuitry remains fully functional in this mode.
• Ship Mode: The bq78PL116 disables (opens) all the protection MOSFETs, and continues to monitor
temperature and voltage, but at a reduced measurement rate to dramatically lower power consumption.
Environmental data is saved in flash as a part of the historical record. Safety circuitry is disabled in this mode.
The device does not enter this power state as a part of normal operation; it is intended for use after factory
programming and test. Entry occurs only after a unique SMBus command is issued. Exit occurs when the
SMBus lines return to an active state.
• Extreme Cell Undervoltage (ECUV) Shutdown Mode: In this mode, the bq78PL116 draws minimal current
and the charge and discharge protection MOSFETs are disabled (opened). The precharge MOSFET remains
enabled when a charge voltage is present. Safety circuitry is disabled in this mode. The device does not enter
this mode as a part of normal operation; it enters this state during extreme cell undervoltage conditions
(ECUV). The ECUV threshold is programmable between 2.5 V and 2.8 V for even series cell applications and
2.7 V to 2.8 V for odd series cell applications.
STATE
OVERCURRENT
PROTECTION
ENTRY CONDITION
Normal operation as determined by firmware
EXIT CONDITION
Firmware directed to the following operating
modes
Active
Fully active
Standby
Fully active
No load current flowing for predetermined
time
Load activity
Ship
Not active
Protected SMBus command
SMBus becomes active
Extreme cell
undervoltage
Not active (precharge
enabled)
Enabled when Vcell < ECUV
Vcell charge above ECUV recovery threshold
(2.9 V/cell typical)
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
13
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
OPERATION
The bq78PL116 battery-management controller serves as a master controller for a Li-Ion battery system
consisting of up to 16 cells in series. Any number of cells may be connected in parallel; other system or safety
issues limit the number of parallel cells. The bq78PL116 provides extraordinarily precise state-of-charge gas
gauging along with first- and second-level pack safety functions. Voltage and current measurements are
performed synchronously and simultaneously for all cells in the system, allowing a level of precision not
previously possible in battery management. Temperature is measured by up to four additional external
temperature sensors. Coulomb counting is captured continuously by a dedicated 18-bit integrating delta-sigma
ADC in the bq78PL116. The CPU in the bq78PL116 is also responsible for system data calculations and
communicating parameters via the SMBus interface.
PowerLAN Communication Link
PowerLAN technology is Texas Instruments’ patented serial network and protocol designed specifically for
battery management in a multicell system environment. The PowerLAN link is used to initiate and report
measurements of cell voltage and temperature, and control cell balancing. The bq78PL116 serves as the master
controller of the PowerLAN link and can interface to multiple bq76PL102 dual-cell battery monitors, which
measure and balance additional cells. The bq78PL116 monitors the first three or four cells, and bq76PL102s can
be added to monitor more series cells.
The PowerLAN link isolates voltages from adjacent bq76PL102 devices to permit high-voltage stack assembly
without compromising precision and accuracy. The PowerLAN link is expandable to support up to 16 cells in
series. Each bq76PL102 handles voltage and temperature measurements, as well as balancing for two cells. The
PowerLAN link provides high ESD tolerance and high immunity to noise generated by nearby digital circuitry or
switching currents. Each bq76PL102 has both a PowerLAN input and PowerLAN output: Received data is
buffered and retransmitted, permitting high numbers of nodes without loss of signal fidelity. Signals are
capacitor-coupled between nodes, providing dc isolation.
Safety
Unique in the battery-management controller market, the bq78PL116 simultaneously measures voltage and
current using independent and highly accurate delta-sigma ADCs. This technique removes virtually all systemic
noise from measurements, which are made during all modes of battery operation: charge, discharge, and rest.
The bq78PL116 also directs all connected bq76PL102 dual-cell battery monitors to measure each cell voltage
simultaneously with the bq78PL116 measurements. Battery impedance and self-discharge characteristics are
thus measured with an unprecedented level of accuracy in real time. The bq78PL116 applies this precise
information to SmartSafety algorithms to detect certain anomalies and conditions which may be indicative of
internal cell faults, before they become serious problems.
The bq78PL116 uses its enhanced measurement system to detect system faults including cell under- and
overvoltage, cell under- and overtemperature, system overvoltage, and system overcurrent. First-level safety
algorithms first attempt to open the MOSFET safety switches. If this fails, second-level safety algorithms activate
the SPROT output, normally used to open a fuse and provide permanent, hard protection for the systems.
External MOSFET control inputs with programmable polarity can also be used to operate the safety MOSFETs
under control of user supplied circuitry. The bq78PL116 continuously monitors these inputs. If any MOSFET fails
to open when commanded; the 2nd level safety algorithms also activate the SPROT output. All first- and
second-level safety algorithms have fully programmable time delays to prevent false triggering.
Cell Balancing
Patented PowerPump cell balancing technology drastically increases the useful life of battery packs by
eliminating the cycle life fade of multi-cell packs due to cell imbalance. PowerPump technology efficiently
transfers charge from cell to cell, rather than simply bleeding off charging energy as heat as is typically done with
resistive-bleed balancing circuits. Balancing is configurable and may be performed during any battery operational
modes: charge, discharge, or rest. Compared to resistive bleed balancing, virtually no energy is lost as heat. The
actual balance current is externally scalable and can range from 10 mA to 1 A (100 mA typical) depending on
component selection and system or cell requirements.
14
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
A variety of techniques, such as simple terminal voltage, terminal voltage corrected for impedance and
temperature effects, or state-of-charge balancing, is easily implemented by the bq78PL116. By tracking the
balancing required by individual cells, overall battery safety is enhanced, often allowing early detection of soft
shorts or other cell failures. Balancing is achieved between all cells within the pack as dynamically determined by
the bq78PL116.
The bq78PL116 supports the following configurable cell-balancing features:
• Turbo-pump mode. When enabled, this allows 60%–70% pump availability when there are no active safety
events and current is not flowing. While in turbo-pump mode, temperature rate-of-rise features are not
available.
• Option to disable cell balancing during discharge
• Option to disable cell balancing during charge
• Test mode operation that allows for convenient production-line testing of PowerPump circuitry
Outputs
Charge Control
The CHG and PRE outputs are ordinarily used to drive MOSFET transistors controlling charge to the cell stack.
Charge or precharge mode is selected based on the present cell voltage compared to the user-definable cell
precharge, undervoltage, and temperature thresholds. When below these limits, the PRE signal is active and the
CHG signal is inactive. This turns on the precharge MOSFET and is used to charge a depleted system through a
current-limiting series resistor. When all cell voltages are above the limit and the temperature is above the charge
temperature minimum, then the CHG output also becomes active and enables the charge MOSFET to turn on,
providing a high-current path between charger and battery cells.
The CHG and PRE MOSFET control outputs are both disabled (low) when any cell reaches the safety cutoff limit
or temperature threshold. During active charging modes (and above cell voltage thresholds), the discharge
MOSFET is also enabled to avoid excessive heating of the body diode. Similarly, the charge MOSFET is active
during discharge, provided current flow is in the correct direction and no safety violations are present.
The CHG and PRE outputs are intended to drive buffer transistors acting as inverting level shifters.
Discharge Control
The DSG output operates similarly to control-system discharging. It is enabled (high) by default. If a cell voltage
falls below a programmable threshold, or excessive current or other safety related fault is sensed, the DSG
output is disabled (low) to prevent damage to the cells.
All facets of safely charging and discharging the cell stack are controlled by user-definable parameters which
provide precise control over MOSFET states. Both system and cell over- and undervoltage limits are provided, as
well as programmable hysteresis to prevent oscillation. Temperature and current thresholds are also provided,
each with independent timers to prevent nuisance activations.
The DSG output is intended to drive a buffer transistor acting as an inverting level-shifter.
Display
The bq78PL116 shows state-of-charge indication on LED, static liquid crystal, and electronic paper displays or
EPDs in a bar-graph-type format. The parameter set allows selection of display type and configuration.
PSH/BP/TP is a multifunction pin. In LED display mode, PSH serves as an input that monitors for closure of a
state-of-charge indicator (SOCi) push-button switch. In LCD mode, this pin is used to drive the LCD backplane.
In EPD mode, this pin drives the top plane common signal of the display.
In LED display mode, the signals LED1/SEG1–LED5/SEG5 are current-sinking outputs designed to drive
low-current LEDs.
In LCD and EPD modes, the LED1/SEG1–LED5/SEG5 pins drive the active segments through external buffer
transistors. In EPD mode, the FIELD pin drives the display background field.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
15
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Electronic paper displays require an external power supply, typically 15 V, to power the display. In EPD, mode
the bq78PL116 strobes the display outputs for a user- programmable period of milliseconds to drive an external
voltage multiplier or charge pump to the required display supply voltage. The display segments are then updated
in a manner that ensures the required 0-Vdc segment voltage offset is maintained and keeps the external power
supply at its nominal voltage.
Inputs
Current Measurement
Current is monitored by four separate ADCs. All use the same very low-value sense resistor, typically 10, 3, or 1
milliohms in series with the pack negative connection. CCBAT and CCPACK connections to the sense resistor
use an R/C filter for noise reduction. (CSBAT and CSPACK are direct connections used for secondary safety).
When configured to use a 1-milliohm sense resistor, the maximum available pack capacity increases to 327 Ah
from 32.7 Ah.
A 14-bit delta-sigma ADC is used to measure current flow accurately in both directions. The measurements are
taken simultaneously and synchronously with all the cell voltage measurements, even those cells measured by
bq76PL102 dual-cell battery monitors.
Coulomb Counting
A dedicated coulomb counter is used to measure charge flow with 18-bit precision in both directions by a
calibrated, integrating delta-sigma ADC. This allows the bq78PL116 to keep very accurate state-of-charge (SOC)
information and battery statistics. A small deadband is applied to further reduce noise effects. The coulomb
counter is unique in that it continues to accumulate (integrate) current flow in either direction even as the rest of
the internal microcontroller is placed in a very low power state, further lowering power consumption without
compromising system accuracy.
Safety Current
Two additional ADCs are used to directly monitor for overcurrent or short-circuit current conditions, independently
of the internal function. This provides a direct and rapid response to insure pack integrity and safe operation by
opening the appropriate MOSFETs. These functions are implemented in hardware, and do not require firmware
for functionality.
Voltage Measurement
Voltage measurement is performed by four independent delta-sigma ADCs which operate simultaneously and
are triggered synchronously so that all voltages are read at precisely the same moment. The bq78PL116
coordinates the attached bq76PL102 dual-cell battery monitors so they also perform their cell voltage
measurements in sync with the bq78PL116 voltage and current measurements. Voltage measurements are
converted with better than 1 mV of resolution, providing superior accuracy. One-ADC-per-cell technology means
that voltage is also measured simultaneously with current, permitting accurate, real-time cell impedance
calculation during all operating conditions. This technique also provides greatly enhanced noise immunity and
filtering of the input signal without signal loss.
Temperature Measurement
XT1–XT4 are dedicated temperature-sensor inputs. Each external sensor consists of a low-cost silicon diode
(dual diode in one package is recommended) and capacitor combination. The bq78PL116 can report all four of
these temperatures individually. The bq78PL116 firmware uses the internal temperature sensor of the device for
board temperature measurements.
EFCIx
The external MOSFET control inputs are for user control of MOSFETs based on external circuitry and conditions.
The polarity of the input signal is user-programmable. These pins can be used to force the protection MOSFETs
to an OFF state.
16
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
COMMUNICATIONS
SMBus
The bq78PL116 uses the industry-standard Smart Battery System’s two-wire System Management Bus (SMBus)
communications protocol for all external communication. SMBus version 1.1 is supported by the bq78PL116, and
includes clock stretching, bus fault time-out detection, and optional packet error checking (PEC). For additional
information, see the www.smbus.org and www.sbs-forum.org Web sites.
Smart Battery Data (SBData)
The bq78PL116 supports Smart Battery System's (SBS) Smart Battery Data Specification 1.1. See the
SBS/SMBus site at www.sbs-forum.org for further information regarding these specifications.
This SBS Data (SBData) specification defines read/write commands for accessing data commonly required in
laptop computer applications. The commands are generic enough to be useful in most applications.
The bq78PL116 provides a wealth of data beyond the standard set of SBData (0x00 - 0x23) through Extended
SBData Commands. See the following table for a listing of the SBData commands and the default set of
Extended SBData (0x3C - 0x58). SBData command locations 0x80 and 0x81 are used to implement some of the
features unique to the bq78PL116. Refer to the bq78PL116 Technical Reference Manual Document for additional
details on compliance to SBData and how to take advantage of the data and controls specific to bq78PL116.
THERMAL PAD
The large pad on the bottom of the package is square, located in the center, and is 5.3 ±0.05 mm per side.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
17
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
SBS Standard Data Parameter List (Abridged) (1)
Command
Data Type
Description
00
R/W word (unsigned)
Manufacturer Access
01
R/W word (unsigned)
Remaining Capacity Alarm Level
02
R/W word (unsigned)
Remaining Time Alarm Level
03
R/W word (unsigned)
Battery Mode
04
R/W word (unsigned)
At Rate value used in AtRate calculations – NOT SUPPORTED
05
Read word (unsigned)
At Rate Time to Full – NOT SUPPORTED
06
Read word (unsigned)
At Rate Time to Empty – NOT SUPPORTED
07
Read word (Boolean)
At Rate OK – NOT SUPPORTED
08
Read word (unsigned)
Pack Temperature (maximum of all individual cells)
09
Read word (unsigned)
Pack Voltage (sum of individual cell readings)
0A
Read word (unsigned)
Pack Current
0B
Read word (unsigned)
Average Pack Current
0C
Read word (unsigned)
Max Error
0D
Read word (unsigned)
Relative State of Charge
0E
Read word (unsigned)
Absolute State of Charge
0F
Read word (unsigned)
Remaining Pack Capacity
10
Read word (unsigned)
Full Charge Capacity
11
Read word (unsigned)
Run Time to Empty
12
Read word (unsigned)
Average Time to Empty
13
Read word (unsigned)
Average Time to Full
14
Read word (unsigned)
Charging Current
15
Read word (unsigned)
Charging Voltage
16
Read word (unsigned)
Battery Status
17
Read word (unsigned)
Cycle Count
18
Read word (unsigned)
Design Capacity
19
Read word (unsigned)
Design Voltage
1A
Read word (unsigned)
Specification Information
1B
Read word (unsigned)
Manufacture Date
1C
Read word (unsigned)
Serial Number
1D–1F
Reserved
20
Read block (string)
Pack Manufacturer Name (31 characters maximum)
21
Read block (string)
Pack Device Name (31 characters maximum)
22
Read block (string)
Pack Chemistry
23
Read block (string)
Manufacturer Data
24–2E
Reserved
2F
R/W Block
30–3B
Reserved
3C
R/W word (unsigned)
Optional Manufacturer Option 4 (Vcell 1)
3D
R/W word (unsigned)
Optional Manufacturer Option 3 (Vcell 2)
3E
R/W word (unsigned)
Optional Manufacturer Option 2 (Vcell 3)
3F
R/W word (unsigned)
Optional Manufacturer Option 1 (Vcell 4)
40
R/W word (unsigned)
Extended Data (Vcell 5)
41
R/W word (unsigned)
Extended Data (Vcell 6)
42
R/W word (unsigned)
Extended Data (Vcell 7)
43
R/W word (unsigned)
Extended Data (Vcell 8)
44
R/W word (unsigned)
Extended Data (Vcell 9)
(1)
18
Optional Manufacturer Function 5
Parameters 0x00–0x3F are compatible with the SBDATA specification.
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Command
Data Type
Description
45
R/W word (unsigned)
Extended Data (Vcell 10)
46
R/W word (unsigned)
Extended Data (Vcell 11)
47
R/W word (unsigned)
Extended Data (Vcell 12)
48
R/W word (unsigned)
Extended Data (Vcell 13)
49
R/W word (unsigned)
Extended Data (Vcell 14)
4A
R/W word (unsigned)
Extended Data (Vcell 15)
4B
R/W word (unsigned)
Extended Data (Vcell 16)
4C
R/W word (unsigned)
Extended Data (Temp 0 – Intenal)
4D
R/W word (unsigned)
Extended Data (Temp 1 – Extenal)
4E
R/W word (unsigned)
Extended Data (Temp 2 – Extenal)
4F
R/W word (unsigned)
Extended Data (Temp 3 – Extenal)
50
R/W word (unsigned)
Extended Data (Temp 4 – Extenal)
51
R/W word (unsigned)
Extended Data (Safety Status)
52
R/W word (unsigned)
Extended Data (Permanent Fail Status)
53
R/W word (unsigned)
Extended Data (Charge Status)
54
R/W word (unsigned)
Extended Data (Lifetime Maximum Pack Voltage)
55
R/W word (unsigned)
Extended Data (Lifetime Maximum Cell Voltage)
56
R/W word (unsigned)
Extended Data (Lifetime Maximum Charge Current)
57
R/W word (unsigned)
Extended Data (Lifetime Maximum Discharge Current)
58
R/W word (unsigned)
Extended Data (Lifetime Maximum Temperature)
80
R/W word (unsigned)
Extended Command (Device Status)
81
R/W word (unsigned)
Extended Command (Device Command)
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
19
V3
D3
Q10-A
Q10-B
R5
R10
R21
C7
C21
C19
C17
R36
Q3
R18
R16
C24
C18
C11
C23
Q4
C20
1
48
12
11
47
8
15
16
17
20
21
22
23
44
43
42
39
VSS
OSCO
OSCI
V1
VLDO1
P1N
P2S
P2N
P3S
P3N
P4S
P4N
V2
VLDO2
V3
V4
U1
Z4
BATTERY-
VSS
R37
Q6
POWERPUMP CIRCUIT COMPONENT VALUES/TYPE WILL VARY BY APPLICATION. TYPICAL SHOWN.
C1
D4
Q9-A
R24
R17
R2
R7
3
L1
D1
C2
Q9-B
R8
PRE-CHARGE RESISTOR (R9) VALUE WILL VARY BY APPLICATION.
R6
R12
L2
D2
Q5
Q11
FOR 3 CELL APPLICATIONS (3SxP) XT4, P3N, P4S, P-LAN AND P4N ARE 'NO-CONNECT.'
C4
C5
C6
VSS
R35
R34
Z3
Q12
1
CELLS
3
Q1
F1
R38
R15
R25
CSD17307Q5A
R29
R1
RSENSE
C3
R27
bq78PL116
Q2
Z5
26
N/C
27
N/C
28
49 N/C
tab
XT1
XT2
XT3
XT4
RSTN
24
19
18
14
13
38
37
29
5
4
36
35
34
33
32
31
46
45
41
40
25
C12
C13
GND
P-LAN
SDI3
SDO2
SDI1
SDO0
SMBDAT
SMBCLK
FIELD
EFCID
EFCIC
LED5/SEG5
LED4/SEG4
LED3/SEG3
LED2/SEG2
LED1/SEG1
PSH/BP/TP
2
R9
C25
R31
LED1
C8
R33
R22
R26
R28
PACK-
LED5
LED3
LED2
LED4
SOCI
R14
1
R3
PACK+
R19
R23
C14
C16
R4
R11
VSS
T1
C9
Z2
Z1
R20
R13
R32
C15
T3
R30
T2
HOST
EFCIC
GND
S001
SMBDAT
SMBCLK
EFCID
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
2
V0
V1
V2
BATTERY+
2
DSG
3
PRE
1
CHG
30
SPROT
Q7
CCPACK
C22
CSBAT
9
CCBAT
6
Product Folder Link(s): bq78PL116
CSPACK
Submit Documentation Feedback
7
20
10
C10
bq78PL116
www.ti.com
REFERENCE SCHEMATICS
Figure 5. Typical 3S Application Schematic
© 2010–2011, Texas Instruments Incorporated
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 2. Bill of Materials for 3S Application
Qty
Reference
Value
Description
Size
Manufacturer
Mfg Part No.
5
C10 C12-13 C16 C22 0.1uF
Capacitor SMT
Ceramic X7R +/-10%
50V
5
C11 C18 C20 C23-24 10uF
Capacitor SMT
Ceramic X5R +/-10%
6.3V
603
Standard
Standard
3
C1-3
0.01uF
Capacitor SMT
Ceramic X7R +/-10%
25V
603
Standard
Standard
3
C4-6
22uF
Capacitor SMT
Ceramic Y5V +/-20%
10V
805
Standard
Standard
4
C7 C17 C19 C21
3300pF
Capacitor SMT
Ceramic X7R +/-10%
50V
603
Standard
Standard
5
C8-9 C14-15 C25
1000pF
Capacitor SMT
Ceramic X7R +/-10%
50V
603
Standard
Standard
12
R1 R7-8 R11 R15
R19 R23 R25 R28
R36-38
1.0M
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R17-18
30K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R2 R16
200K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R26 R35
100K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R27 R29
4.7K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
11
R3 R6 R12-14 R20
R22 R30-33
100
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R4 R34
10K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
4
R5 R10 R21 R24
20K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
1
R9
100
Resistor SMT +/-5%
1W
603
Standard
Standard
1
RSENSE
0.01
Resistor SMT +/-1%
1W +/-100ppm/°C
2512
Standard
Standard
4
D1-4
Vf=385mV
Schottky Rectifier
Diode 20V IFSM>2A
SOD-123
Standard
Standard
2
L1-2
4.7uH
Inductor SMT
Shielded Isat=2.0A
4.9mm x 4.9mm x
2.0mm
Taiyo Yuden
NRS5020T4R7MMG
J
5
LED1-5
Green LED
603
Standard
Standard
1
SOCI
Momentary
Pushbutton
Standard
Standard
3
T1-3
Dual Diode (Series
Arrangement)
SOT-23
Fairchild
MMBD4148SE
4
Q1-4
N-Channel MOSFET
2.5Vgs rated,
Vds>30V
SOT-23
Infineon
BSS138N
2
Q5-6
Vdg =
-40V
N-Channel JFET
Idss>0.2mA,
Vgs<-1.5V
SOT-23
Fairchild
MMBFJ201
1
Q7
9.7 mOhm MOSFET N-Channel
RDSon
SMT 30Vds
SON 5mm x 6mm
Texas Instruments
CSD17307Q5A
2
Q9-10
6-TSOP
Alpha & Omega
AO6604
50mA
MOSFET N/P
Complementary Pair
603
Standard
Standard
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
21
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 2. Bill of Materials for 3S Application (continued)
Qty
22
Reference
Value
Description
Size
Manufacturer
Mfg Part No.
2
Q11-12
MOSFET P-Channel
SMT -30VDS
1
U1
PowerLAN Master
Gateway Battery
Management
Controller
QFN48
Texas Instruments
bq78PL116RGZR
3
Z1-2 Z5
5.6V
Common Anode
Zener Diode Pair
300mW
SOT-23
Standard
Standard
2
Z3-4
12V
Zener Diode 500mW
SOD-123
Diodes, Inc
BZT52C12-13-F
12 Amp
Chemical Fuse For
2-3 Cells In Series
Sony
SFH-1212A
SOIC-8
Fairchild
FDS6673
1
F1
4
BATTERY+
BATTERY- PACK+
PACK-
2 Pin Connector
Standard
Standard
1
CELLS
4 Pin Connector
Standard
Standard
1
HOST
5 Pin Connector
Standard
Standard
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
V0
V1
V2
V3
V4
J1
V4
V5
C4
C5
C6
C33
R6
R12
L2
R39
L3
R42
L4
L1
C1
D1
C2
D3
D4
D2
D5
C30
D6
D7
C32
D8
Z3
Q10-A
Q10-B
Q9-A
Q9-B
Q8-A
Q8-B
Q13-A
Q13-B
R5
R10
R21
R24
R40
R41
R43
R44
R8
Q5
C7
C21
C19
C17
C28
C27
C31
C29
R17
R2
Q12
P5S
VSS
R36
Q3
R18
R16
C24
C18
C11
C26
R7
Submit Documentation Feedback
C20
48
12
11
47
8
15
16
17
20
21
22
23
44
43
42
39
VSS
OSCO
OSCI
V1
VLDO1
P1N
P2S
P2N
P3S
P3N
P4S
P4N
V2
VLDO2
V3
V4
U1
Z4
BATTERY-
VSS
R37
Q6
C23
Q4
Q11
R38
Q7
R15
R25
R29
R1
RSENSE
C3
R27
bq78PL116
Q2
Z5
30
SPROT
3
PRE
1
CHG
2
DSG
26
N/C
27
N/C
28
49 N/C
tab
BATTERY+
C22
CSBAT
9
CCBAT
6
Product Folder Link(s): bq78PL116
XT1
XT2
XT3
XT4
RSTN
24
19
18
14
13
38
37
29
5
4
36
35
34
33
32
31
46
45
41
40
25
R3
C12
C13
GND
P-LAN
SDI3
SDO2
SDI1
SDO0
SMBDAT
SMBCLK
FIELD
EFCID
EFCIC
LED5/SEG5
LED4/SEG4
LED3/SEG3
LED2/SEG2
LED1/SEG1
PSH/BP/TP
R9
CSPACK
© 2010–2011, Texas Instruments Incorporated
CCPACK
7
C25
R31
R14
LED1
Q1
R28
PACK-
PLAN
C8
R33
R22
LED5
LED3
LED2
LED4
SOCI
R26
R4
R35
R34
R19
C16
R23
C14
C96
PACK+
R11
VSS
T1
Z2
Z1
R20
R13
R32
C15
T4 C9
R30
T2
T3
HOST
S002a
GND
SMBDAT
SMBCLK
EFCID
EFCIC
FUSE
www.ti.com
10
C10
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
Figure 6. Typical 16S Application Circuit – bq78PL116 and FETs (Sheet 1 of 4)
23
Product Folder Link(s): bq78PL116
V5
V6
V7
V8
J2
Cells 5 to 8
V4
V5
V8
C37
C45
C66
C38
R72
L5
R65
L6
R61
L7
R53
L8
C35
C39
C64
C63
D17
D18
D19
D20
D9
D10
D11
D12
R73
Q14-A
Q14-B
R66
Q16-A
Q16-B
R62
Q18-A
Q18-B
R54
Q19-A
Q19-B
R71
R63
R55
R52
C36
C34
C44
C43
C65
C52
C71
C70
P9S
P5S
C49
C50
C75
C76
U3
V2
V1
V2
15
V1
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
12
BQ76PL102
U2
15
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
12
BQ76PL102
14
XT1
13
XT2
VLDO
VPP
C74
VLDO
VPP
2
C48
16
9
SDO
4
SDI
14
XT1
13
XT2
2
16
9
SDO
4
SDI
VSS
TAB
N/C
N/C
N/C
1
17
11
10
3
VSS
TAB
N/C
N/C
N/C
Submit Documentation Feedback
1
17
11
10
3
24
SDO5
C46
C73
S002b
PLAN
V9
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Figure 7. Typical 16S Application Circuit – bq76PL102 for Cells 5–8 (Sheet 2 of 4)
© 2010–2011, Texas Instruments Incorporated
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
V9
V10
V11
V12
J3
Cells 9 to 12
V8
V9
V12
C42
C54
C61
C47
R45
L9
R48
L10
R51
L11
R58
L12
C78
C79
C80
C81
D13
D14
D15
D16
D21
D22
D23
R46
Q15-A
Q15-B
R49
Q17-A
Q17-B
R56
Q20-A
Q20-B
R59
Q21-A
Q21-B
R47
R50
R57
R60
C41
C40
C53
C51
C60
C59
C67
C62
P13S
P9S
C57
C58
C72
C77
U5
V2
V1
V2
15
V1
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
12
BQ76PL102
U4
15
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
12
BQ76PL102
14
XT1
13
XT2
VLDO
VPP
C69
VLDO
VPP
2
C56
16
9
SDO
4
SDI
14
XT1
13
XT2
2
16
9
SDO
4
SDI
SDO7
C55
C68
S002c
SDO5
D24
VSS
TAB
N/C
N/C
N/C
1
17
11
10
3
VSS
TAB
N/C
N/C
N/C
www.ti.com
1
17
11
10
3
V13
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
Figure 8. Typical 16S Application Circuit – bq76PL102 for Cells 9–12 (Sheet 3 of 4)
Submit Documentation Feedback
25
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
C90
2
16
VPP
VLDO
9
SDO
4
SDI
14
XT1
13
XT2
V1
C91
15
V2
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
U6
12
C83
C82
R67
D25
C102
V13
V15
V14
V16
J4
Cells 13 to 16
V13
V12
C84
C88
C95
C85
R64
L13
R69
L14
Q22-A
D26
D27
Q22-B
R70
Q23-A
C103
D28
Q23-B
R76
D29
L15
R75
C104
D30
Q24-A
Q24-B
R74
R68
C87
C86
C94
R77
C93
P13S
C92
C101
C100
BQ76PL102
2
16
VPP
9
SDO
4
SDI
VLDO
V1
15
V2
VSS
TAB
N/C
N/C
N/C
8
PUMP2N
7
PUMP2S
6
PUMP1N
5
PUMP1S
1
17
11
10
3
U7
VSS
TAB
N/C
N/C
N/C
12
1
17
11
10
3
14
XT1
13
XT2
C99
SDO7
BQ76PL102
S002d
C89
C98
www.ti.com
Figure 9. Typical 16S Application Circuit – bq76PL102 for Cells 13–16 (Sheet 4 of 4)
Table 3. Bill of Materials for 16S Application
Qty
26
Reference
Value
Description
Size
Manufacturer
Mfg Part No.
6
U2-7
QFN-16
PowerLAN Dual Cell
Monitor
1
U1
QFN-48
PowerLAN Master
Gateway Battery
Management
Controller
QFN48
Texas Instruments
bq78PL116RGZR
24
C11 C18 C20 C23-24
C26 C48-50 C56-58
10uF
C69 C72 C74-77
C90-92 C99-101
Capacitor SMT
Ceramic X5R +/-10%
6.3V
603
Standard
Standard
16
C1-3 C30 C32 C35
C39 C63-64 C78-81
C102-104
0.01uF
Capacitor SMT
Ceramic X7R +/-10%
25V
603
Standard
Standard
12
C8-9 C14-15 C25
C46 C55 C68 C73
C89 C96 C98
1000pF
Capacitor SMT
Ceramic X7R +/-10%
50V
603
Standard
Standard
5
C10 C12-13 C16 C22 0.1uF
Capacitor SMT
Ceramic X7R +/-10%
50V
603
Standard
Standard
QFN16
Texas Instruments
bq76PL102RGTT
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 3. Bill of Materials for 16S Application (continued)
Qty
Reference
Value
Description
Size
Manufacturer
Mfg Part No.
30
C7 C17 C19 C21
C27-29 C31 C34 C36
C40-41 C43-44
C51-53 C59-60 C62
3300pF
C65 C67 C70-71
C82-83 C86-87
C93-94
Capacitor SMT
Ceramic X7R +/-10%
50V
603
Standard
Standard
16
C4-6 C33 C37-38
C42 C45 C47 C54
22uF
C61 C66 C84-85 C88
C95
Capacitor Ceramic
SMT Y5V +/-20%
10V
805
Standard
Standard
24
R3 R6 R12-14 R20
R22 R30-33 R39 R42
R45 R48 R51 R53
100
R58 R61 R64-65 R69
R72 R75
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R4 R34
10K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R26 R35
100K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
12
R1 R7-8 R11 R15
R19 R23 R25 R28
R36- 38
1.0M
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
30
R5 R10 R21 R24
R40-41 R43-44
R46-47 R49-50 R52
R54-57 R59-60
R62-63 R66- 68
R70-71 R73-74
R76-77
20K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R2 R16
200K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
2
R17-18
30K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
1
R9
3K
Resistor SMT +/-5%
1W
603
Standard
Standard
2
R27 R29
4.7K
Resistor SMT 1/10W
+/-5%
603
Standard
Standard
1
RSENSE
0.01
Resistor SMT +/-1%
1W +/-100ppm/°C
2512
Standard
Standard
15
L1-15
4.7uH
Inductor SMD
Shielded Isat=2.0A
4.9mm x 4.9mm x
2.0mm
Taiyo Yuden
NRS5020T4R7MMG
J
4
Q1-4
Vds > 80V
N-Channel MOSFET,
2.5Vgs Rated
SOT-23
Standard
Standard
2
Q5-6
Idss=0.2
to 1.0mA
General Purpose
N-Channel JFET
Amplifier
SOT-23
Fairchild
MMBFJ201
1
Q7
100 Vds
MOSFET N-Channel
20Vgs
D2PAK
Standard
Standard
15
Q8-10 Q13-24
+/-8Vgs
MOSFET N/P
Complementary Pair
6-TSOP
Alpha & Omega
AO6604
2
Q11-12
-100 Vds
MOSFET P-Channel
20Vgs
D2PAK
Standard
Standard
30
D1-30
500mA
Schottky Rectifier
Diode 20V
SOD-123
Fairchild
MBR0520L
4
T1-4
Dual Diode
SOT-23
Fairchild
MMBD4148SE
Standard
Standard
5
LED1-5
Green/25
mA
Green Diffused LED
603
1.6mm x 0.8mm SMT
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
27
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
Table 3. Bill of Materials for 16S Application (continued)
Qty
28
Reference
Value
Description
SOT-23
Standard
Standard
SOD-123
Standard
Standard
Standard
Standard
2
Z1 Z2
5.6VDC
Common Anode
Zener Diode Pair
300mW
3
Z3-5
500mW
Zener Diode 500mW
12V
1
SOCI
50mA
Tactile Momentary
Pushbutton Thru-Hole
1
HOST
1
J1
3
J2-4
4
BATTERY+
BATTERY- PACK+
PACK-
Size
Manufacturer
Mfg Part No.
Header
6 Position
Standard
Standard
1.0 Amp
Header
5 Position
Standard
Standard
3.0A
Header
4 Position
Standard
Standard
30 Amps
Header
2 Position
Standard
Standard
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
100Ω
1µF 25V
1µF 25V
1
1µF 25V
1
2 3
3
BAT54STA
1
2 3
BAT54STA
1µF 25V
2
BAT54STA
1µF 25V
4.7µF 25V
1MΩ 1MΩ 1MΩ 1MΩ 1MΩ 1MΩ 1MΩ
TPC
FIELD
SEG1
SEG2
SEG3
SEG4
SEG5
NTS4001NT1G
bq78PL116
39
V4
PSH/BP/TP
FIELD
LED1/SEG1
31
1MΩ
NTS4001NT1G
1MΩ
NTS4001NT1G
29
LED2/SEG2
VLDO1
TAB
Vss
49
48
NTS4001NT1G
NTS4001NT1G
35
1MΩ
LED5/SEG5
NTS4001NT1G
34
1MΩ
LED4/SEG4
E-Ink SDC3
PET 5-Bar,
Part Number:
520-1285
33
1MΩ
LED3/SEG3
XF2L-0735-1/
OMRON/ZIFF
32
1MΩ
1
2
3
4
5
6
7
NTS4001NT1G
36
8
S003
NOTE: For reference only. Actual display used may require different operating voltage. Consult with display vendor.
Figure 10. Reference Schematic (Electronic-Paper Display Connections)
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
29
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
1MΩ 1MΩ 1MΩ 1MΩ 1MΩ 1MΩ
44
V2
PSH/BP/TP
LED1/SEG1
LED2/SEG2
31
1MΩ
NTS4001NT1G
1MΩ
NTS4001NT1G
VLDO1
TAB
Vss
49
48
BP
S1
S2
S3
S4
S5
S8
NTS4001NT1G
34
NTS4001NT1G
35
1MΩ
LED5/SEG5
S7
33
1MΩ
LED4/SEG5
S6
9
32
1MΩ
LED3/SEG3
8
EXCEL 8-Segment
Display 0408
To +ve
of Cell 2
1
2
3
4
5
6
NTS4001NT1G
bq78PL116
7
NTS4001NT1G
36
8
S004
NOTE: For reference only. Actual display used may require different operating voltage. Consult with display vendor.
Figure 11. Reference Schematic (LCD Connections)
30
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
bq78PL116
SLUSAB8B – OCTOBER 2010 – REVISED FEBRUARY 2011
www.ti.com
REVISION HISTORY
Changes from Revision A (October 2010) to Revision B
Page
•
Revised PowerLAN Characteristics table ............................................................................................................................. 9
•
Changed Ah values in Current Measurement paragraph ................................................................................................... 16
Submit Documentation Feedback
© 2010–2011, Texas Instruments Incorporated
Product Folder Link(s): bq78PL116
31
PACKAGE OPTION ADDENDUM
www.ti.com
11-Apr-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Top-Side Markings
(3)
(4)
BQ78PL116RGZR
NRND
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
78PL116
BQ
BQ78PL116RGZT
NRND
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
78PL116
BQ
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Multiple Top-Side Markings will be inside parentheses. Only one Top-Side Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a
continuation of the previous line and the two combined represent the entire Top-Side Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
Samples
PACKAGE MATERIALS INFORMATION
www.ti.com
12-Jan-2015
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
BQ78PL116RGZR
VQFN
RGZ
48
2500
330.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
BQ78PL116RGZT
VQFN
RGZ
48
250
180.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
12-Jan-2015
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
BQ78PL116RGZR
VQFN
RGZ
48
2500
367.0
367.0
38.0
BQ78PL116RGZT
VQFN
RGZ
48
250
210.0
185.0
35.0
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale
supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of
non-designated products, TI will not be responsible for any failure to meet ISO/TS16949.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation
www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom
www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2015, Texas Instruments Incorporated
Similar pages