ADC1213D series Dual 12-bit ADC; 65 Msps, 80 Msps, 105 Msps or 125 Msps Rev. 05 — 23 April 2010 Preliminary data sheet 1. General description The ADC1213D is a dual-channel 12-bit Analog-to-Digital Converter (ADC) optimized for high dynamic performances and low power at sample rates up to 125 Msps. Pipelined architecture and output error correction ensure the ADC1213D is accurate enough to guarantee zero missing codes over the entire operating range. Supplied from a 3 V source for analog and a 1.8 V source for the output driver, it embeds two serial outputs. Each lane is differential and complies with the JESD204A standard. An integrated Serial Peripheral Interface (SPI) allows the user to easily configure the ADC. A set of IC configurations is also available via the binary level control pins taken, which are used at power-up. The device also includes a SPI programmable full-scale to allow flexible input voltage range from 1 V to 2 V (peak-to-peak). Excellent dynamic performance is maintained from the baseband to input frequencies of 170 MHz or more, making the ADC1213D ideal for use in communications, imaging, and medical applications. 2. Features and benefits SNR, 70 dBFS; SFDR, 86 dBc Sample rate up to 125 Msps Clock input divider by 2 for less jitter contribution 3 V, 1.8 V single supplies Flexible input voltage range: 1 V to 2 V (peak-to-peak) Two configurable serial outputs INL ± 1 LSB; DNL ± 0.5 LSB Pin compatible with the ADC1213D series HVQFN56 package Input bandwidth, 600 MHz Power dissipation, 995 mW at 80 Msps SPI register programming Duty cycle stabilizer High IF capability Offset binary, two’s complement, gray code Power-down mode and Sleep mode Compliant with JESD204A serial transmission standard 3. Applications Wireless and wired broadband communications Spectral analysis Ultrasound equipment Portable instrumentation Imaging systems Software defined radio ADC1213D series NXP Semiconductors ADC1213D series 4. Ordering information Table 1. Ordering information Type number Sampling frequency (Msps) Package Name Description ADC1213D125HN/C1 125 HVQFN56 plastic thermal enhanced very thin quad flat package; SOT684-7 no leads; 56 terminals; body 8 × 8 × 0.85 mm ADC1213D105HN/C1 105 HVQFN56 plastic thermal enhanced very thin quad flat package; SOT684-7 no leads; 56 terminals; body 8 × 8 × 0.85 mm ADC1213D080HN/C1 80 HVQFN56 plastic thermal enhanced very thin quad flat package; SOT684-7 no leads; 56 terminals; body 8 × 8 × 0.85 mm ADC1213D065HN/C1 65 HVQFN56 plastic thermal enhanced very thin quad flat package; SOT684-7 no leads; 56 terminals; body 8 × 8 × 0.85 mm Version 5. Block diagram CFG (0 to 3) SDIO/DCS SCLK/DCS ERROR CORRECTION AND DIGITAL PROCESSING CS SPI SYNCP SYNCN INAP SWING_n ADCA CORE 12-BIT PIPELINED FRAME ASSEMBLY CLOCK INPUT STAGE & DUTY CYCLE CONTROL CLKP DLL PLL CLKM ERROR CORRECTION AND DIGITAL PROCESSING 8-bit OTR INBP T/H INPUT STAGE 8-bit ADCB CORE 12-BIT PIPELINED 8-bit ENCODER 8-bit/10-bit B 8-bit SCRAMBLER A OTR INAM ENCODER 8-bit/10-bit A D11 to D0 SCRAMBLER B T/H INPUT STAGE SERIALIZER A CMLPA OUTPUT BUFFER A CMLNA SERIALIZER B CMLPB OUTPUT BUFFER B CMLNB 10-bit 10-bit D11 to D0 SWING_n INBM CLOCK INPUT STAGE & DUTY CYCLE CONTROL SYSTEM REFERENCE AND POWER MANAGEMENT ADC1213D SCRAMBLER RESET REFBT REFAB REFBB REFAT VCMB VCMA SENSE VREF Fig 1. 005aaa120 Block diagram ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 2 of 41 ADC1213D series NXP Semiconductors ADC1213D series 6. Pinning information 43 SYNCP 44 SYNCN 45 DGND 46 VDDD 47 SWING-0 48 SWING_1 49 DNC 50 VDDA 51 AGND 52 AGND 53 VDDA 54 SENSE 55 VREF 56 VDDA 6.1 Pinning INAP 1 42 DGND INAM 2 41 DGND VCMA 3 40 VDDD REFAT 4 39 CMLPA REFAB 5 38 CMLNA AGND 6 37 VDDD CLKP 7 CLKN 8 35 DGND AGND 9 34 VDDD 36 DGND ADC1213D REFBB 10 33 CMLNB REFBT 11 32 CMLPB DGND 28 VDDD 27 CFG3 26 CFG2 25 CFG1 24 CFG0 23 SCRAMBLER 22 RESET 21 AGND 20 CS 19 SDIO/DCS 18 29 DGND SCLK/DFS 17 30 DGND INBP 14 VDDA 16 31 VDDD INBM 13 VDDA 15 VCMB 12 005aaa121 Transparent top view Fig 2. Pinning diagram 6.2 Pin description ADC1213D_SER_5 Preliminary data sheet Table 2. Pin description Symbol Pin Type [1] Description INAP 1 I channel A analog input INAM 2 I channel A complementary analog input VCMA 3 O channel A output common voltage REFAT 4 O channel A top reference REFAB 5 O channel A bottom reference AGND 6 G analog ground CLKP 7 I clock input CLKM 8 I complementary clock input AGND 9 G analog ground REFBB 10 O channel B bottom reference REFBT 11 O channel B top reference VCMB 12 O channel B output common voltage All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 3 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 2. Pin description …continued Symbol Pin Type [1] Description INBM 13 I channel B complementary analog input INBP 14 I channel B analog input VDDA 15 P analog power supply 3 V VDDA 16 P analog power supply 3 V SCLK/DCS 17 I SPI clock data format select SDIO/DCS 18 I/O SPI data input/output duty cycle stabilizer ADC1213D_SER_5 Preliminary data sheet CS 19 I chip select bar AGND 20 G analog ground RESET 21 I JEDEC digital IP reset SCRAMBLER 22 I scrambler enable and disable CFG0 23 I/O see Table 28 (input) or OTRA (output)[2] CFG1 24 I/O see Table 28 (input) or OTRB (output)[2] CFG2 25 I/O see Table 28 (input) CFG3 26 I/O see Table 28 (input) VDDD 27 P digital power supply 1.8 V DGND 28 G digital ground DGND 29 G digital ground DGND 30 G digital ground VDDD 31 P digital power supply 1.8 V CMLPB 32 O channel B output CMLNB 33 O channel B complementary output VDDD 34 P digital power supply 1.8 V DGND 35 G digital ground DGND 36 G digital ground VDDD 37 P digital power supply 1.8 V CMLNA 38 O channel A complementary output CMLPA 39 O channel A output VDDD 40 P digital power supply 1.8 V DGND 41 G digital ground DGND 42 G digital ground SYNCP 43 I synchronization from FPGA SYNCN 44 I synchronization from FPGA DGND 45 G digital ground VDDD 46 P digital power supply 1.8 V SWING_0 47 I JESD204 serial buffer programmable output swing SWING_1 48 I JESD204 serial buffer programmable output swing DNC 49 O do not connect VDDA 50 P analog power supply 3 V AGND 51 G analog ground All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 4 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 2. Pin description …continued Symbol Pin Type [1] Description AGND 52 G analog ground VDDA 53 P analog power supply 3 V SENSE 54 I reference programming pin VREF 55 I/O voltage reference input/output VDDA 56 P analog power supply 3 V [1] P: power supply; G: ground; I: input; O: output; I/O: input/output. [2] OTRA stands for “OuT of Range” A. OTRB stands for “OuT of Range” B 7. Limiting values Table 3. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Min Max Unit VDDA analog supply voltage Conditions [1] −0.4 +4.6 V VDDD digital supply voltage [2] −0.4 +2.5 V ΔVCC supply voltage difference <tbd> <tbd> V Tstg storage temperature −55 +125 °C Tamb ambient temperature −40 +85 °C Tj junction temperature - 125 °C VDDA − VDDD [1] The supply voltage VDDA may have any value between −0.5 V and +7.0 V provided that the supply voltage differences ΔVCC are respected. [2] The supply voltage VDDD may have any value between −0.5 V and +5.0 V provided that the supply voltage differences ΔVCC are respected. 8. Thermal characteristics Table 4. Thermal characteristics Symbol Rth(j-a) Rth(j-c) [1] Parameter Conditions Typ Unit thermal resistance from junction to ambient [1] 17.8 K/W thermal resistance from junction to case [1] 6.8 K/W Value for six layers board in still air with a minimum of 25 thermal vias. 9. Static characteristics Table 5. Characteristics[1] Symbol Parameter Conditions Min Typ Max Unit Supplies VDDA analog supply voltage 2.85 3.0 3.4 V VDDD digital supply voltage 1.65 1.8 1.95 V IDDA analog supply current - 343 - mA ADC1213D_SER_5 Preliminary data sheet fclk = 125 Msps; fi =70 MHz All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 5 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 5. Characteristics[1] …continued Symbol Parameter Conditions Min Typ Max Unit IDDD digital supply current fclk = 125 Msps; fi = 70 MHz - 150 - mA Ptot total power dissipation fclk = 125 Msps - 1270 - mW P power dissipation fclk = 105 Msps - 1150 - mW fclk = 80 Msps - 995 - mW fclk = 65 Msps - 885 - mW power-down mode - 30 - mW standby mode - 200 - mW Digital inputs Clock inputs: pins CLKP and CLKM, AC coupled LVPECL Vi(clk)dif differential clock input voltage peak-to-peak - ±0.8 - V differential clock input voltage peak-to-peak - ±0.4 - V differential clock input voltage peak-to-peak ±0.8 ±1.5 - V LVDS Vi(clk)dif SINE wave Vi(clk)dif LVCMOS mode VIL LOW-level input voltage - - 0.3VDDA V VIH HIGH-level input voltage 0.7VDDA - - V Logic inputs, Power-down: pins CFG0 to CFG3, SCRAMBLER, SWING_0, and SWING_1 VIL LOW-level input voltage - 0 - V VIH HIGH-level input voltage - 0.66VDDD - V IIL LOW-level input current −6 - +6 μA IIH HIGH-level input current −30 - +30 μA SPI: pins CS, SDIO/DCS, and SCLK/DCS VIL LOW-level input voltage 0 - 0.3VDDA V VIH HIGH-level input voltage 0.7VDDA - VDDA V IIL LOW-level input current −10 - +10 μA IIH HIGH-level input current −50 - +50 μA CI input capacitance - 4 - pF ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 6 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 5. Symbol Characteristics[1] …continued Parameter Conditions Min Typ Max Unit Analog inputs: pins INAP, INAM, INBP, and INBM II input current track mode −5 - +5 μA RI input resistance track mode - 15 - Ω CI input capacitance track mode - 5 - pF VI(cm) common-mode input voltage track mode 0.9 1.5 2 V Bi input bandwidth - 600 - MHz VI(dif) differential input voltage 1 - 2 V peak-to-peak Voltage controlled regulator output: pins VCMA and VCMB VO(cm) common-mode output voltage - 0.5VDDA - V IO(cm) common-mode output current - <tbd> - μA output 0.5 - 1 V input 0.5 - 1 V - pin AGND; VVREF; VDDA - V Reference voltage input/output: pin VREF VVREF voltage on pin VREF Reference mode selection: pin SENSE VSENSE voltage on pin SENSE Data outputs: CMLPA, CMLNA Output levels, VDDD = 1.8 V; SWING_SEL[2:0] = 000 VOL VOH LOW-level output voltage DC coupled; output - 1.5 - V AC coupled - 1.65 - V HIGH-level output voltage DC coupled; output - 1.8 - V AC coupled - 1.35 - V Output levels, VDDD = 1.8 V; SWING_SEL[2:0] = 001 VOL LOW-level output voltage DC coupled; output - 1.45 - V AC coupled - 1.625 - V VOH HIGH-level output voltage DC coupled; output - 1.8 - V AC coupled - 1.275 - V Output levels, VDDD = 1.8 V; SWING_SEL[2:0] = 010 VOL VOH LOW-level output voltage DC coupled; output - 1.4 - V AC coupled - 1.6 - V HIGH-level output voltage DC coupled; output - 1.8 - V AC coupled - 1.2 - V Output levels, VDDD = 1.8 V; SWING_SEL[2:0] = 011 VOL VOH LOW-level output voltage DC coupled; output - 1.35 - V AC coupled - 1.575 - V HIGH-level output voltage DC coupled; output - 1.8 - V AC coupled - 1.125 - V ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 7 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 5. Symbol Characteristics[1] …continued Parameter Conditions Min Typ Max Unit Output levels, VDDD = 1.8 V; SWING_SEL[2:0] = 100 VOL VOH LOW-level output voltage DC coupled; output - 1.3 - V AC coupled - 1.55 - V HIGH-level output voltage DC coupled; output - 1.8 - V AC coupled - 1.05 - V Serial configuration: SYNCCP, SYNCCN VIL LOW-level input voltage differential; input - 0.95 - V VIH High-level input voltage differential; input - 1.47 - V −5 ±1 +5 LSB −0.95 ±0.5 +0.95 LSB - ±2 - mV - ± 0.5 - % - <tbd> - % - 35 - dBc Accuracy INL integral non-linearity DNL differential non-linearity Eoffset offset error EG gain error MG(CTC) channel-to-channel gain matching no missing codes guaranteed full-scale Supply PSRR [1] power supply rejection ratio 100 mV (p-p) on VDDA Typical values measured at VDDA = 3 V, VDDD = 1.8 V, Tamb = 25 °C. Minimum and maximum values are across the full temperature range Tamb = −40 °C to +85 °C at VDDA = 3 V, VDDD = 1.8 V; VI (INAP, INBP) − VI (INAM, INBM) = −1 dBFS; internal reference mode; 100 Ω differential applied to serial outputs; unless otherwise specified. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 8 of 41 xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Table 6. Characteristics[1] Symbol Parameter Conditions ADC1213D065 ADC1213D080 ADC1213D105 ADC1213D125 NXP Semiconductors ADC1213D_SER_5 Preliminary data sheet 10. Dynamic characteristics Unit Min Typ Max Min Typ Max Min Typ Max Min Typ Max fi = 3 MHz - 87 - - 87 - - 86 - - 88 - dBc fi = 30 MHz - 86 - - 86 - - 86 - - 87 - dBc fi = 70 MHz - 85 - - 85 - - 84 - - 85 - dBc Analog signal processing α2H α3H Rev. 05 — 23 April 2010 All information provided in this document is subject to legal disclaimers. THD ENOB SFDR third harmonic level total harmonic distortion effective number of bits signal-to-noise ratio spurious-free dynamic range fi = 170 MHz - 82 - - 82 - - 81 - - 83 - dBc fi = 3 MHz - 86 - - 86 - - 85 - - 87 - dBc fi = 30 MHz - 85 - - 85 - - 85 - - 86 - dBc fi = 70 MHz - 84 - - 84 - - 83 - - 84 - dBc fi = 170 MHz - 81 - - 81 - - 80 - - 82 - dBc fi = 3 MHz - 85 - - 85 - - 84 - - 86 - dBc fi = 30 MHz - 84 - - 84 - - 84 - - 85 - dBc fi = 70 MHz - 83 - - 83 - - 82 - - 83 - dBc fi = 170 MHz - 80 - - 80 - - 79 - - 81 - dBc fi = 3 MHz - 11.3 - - 11.3 - - 11.3 - - 11.3 - bits fi = 30 MHz - 11.3 - - 11.3 - - 11.3 - - 11.2 - bits fi = 70 MHz - 11.2 - - 11.2 - - 11.2 - - 11.2 - bits fi = 170 MHz - 11.1 - - 11.1 - - 11.1 - - 11.1 - bits fi = 3 MHz - 70.0 - - 69.9 - - 69.8 - - 69.6 - dBFS fi = 30 MHz - 69.5 - - 69.5 - - 69.5 - - 69.4 - dBFS fi = 70 MHz - 69.2 - - 69.2 - - 69.1 - - 69.0 - dBFS - 68.8 - - 68.8 - - 68.7 - - 68.6 - dBFS fi = 3 MHz - 86 - - 86 - - 85 - - 87 - dBc fi = 30 MHz - 85 - - 85 - - 85 - - 86 - dBc fi = 70 MHz - 84 - - 84 - - 83 - - 84 - dBc fi = 170 MHz - 81 - - 81 - - 80 - - 82 - dBc ADC1213D series 9 of 41 © NXP B.V. 2010. All rights reserved. fi = 170 MHz ADC1213D series SNR second harmonic level xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Characteristics[1] …continued Symbol Parameter IMD αct(ch) [1] Conditions ADC1213D080 ADC1213D105 ADC1213D125 Unit Min Typ Max Min Typ Max Min Typ Max Min Typ Max - 89 - - 89 - - 88 - - 89 - dBc fi = 30 MHz - 88 - - 88 - - 88 - - 88 - dBc fi = 70 MHz - 87 - - 87 - - 86 - - 86 - dBc fi = 170 MHz - 84 - - 85 - - 83 - - 84 - dBc fi = 70 MHz - 100 - - 100 - - 100 - - 100 - dBc intermodulation distortion fi = 3 MHz crosstalk between channels ADC1213D065 NXP Semiconductors ADC1213D_SER_5 Preliminary data sheet Table 6. Typical values measured at VDDA = 3 V, VDDD = 1.8 V, Tamb = 25 °C. Minimum and maximum values are across the full temperature range Tamb = −40 °C to +85 °C at VDDA = 3 V, VDDD = 1.8 V; VI (INAP, INBP) − VI (INAM, INBM) = −1 dBFS; internal reference mode; 100 Ω differential applied to serial outputs; unless otherwise specified. Rev. 05 — 23 April 2010 All information provided in this document is subject to legal disclaimers. ADC1213D series ADC1213D series 10 of 41 © NXP B.V. 2010. All rights reserved. xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Table 7. NXP Semiconductors ADC1213D_SER_5 Preliminary data sheet 11. Clock and digital output timing Characteristics[1] Symbol Parameter Conditions ADC1213D065 ADC1213D080 ADC1213D105 ADC1213D125 Unit Min Typ Max Min Typ Max Min Typ Max Min Typ Max 20 - 65 60 - 80 75 - 105 100 - 125 Msps Clock timing input: pins CLKP and CLKM fclk clock frequency tlat(data) data latency time clock cycles 307 - 850 250 - 283 190 - 226 160 - 170 ns δclk clock duty cycle DCS_EN = 1: en 30 50 70 30 50 70 30 50 70 30 50 70 % DCS_EN = 0: dis 45 50 55 45 50 55 45 50 55 45 50 55 % Rev. 05 — 23 April 2010 All information provided in this document is subject to legal disclaimers. td(s) sampling delay time - 0.8 - - 0.8 - - 0.8 - - 0.8 - ns twake wake-up time - <tbd> - - <tbd> - - <tbd> - - <tbd> - ns [1] Typical values measured at VDDA = 3 V, VDDD = 1.8 V, Tamb = 25 °C. Minimum and maximum values are across the full temperature range Tamb = −40 °C to +85 °C at VDDA = 3 V, VDDD = 1.8 V; VI (INAP, INBP) − VI (INAM, INBM) = −1 dBFS; internal reference mode; 100 W differential applied to serial outputs; unless otherwise specified. ADC1213D series ADC1213D series 11 of 41 © NXP B.V. 2010. All rights reserved. ADC1213D series NXP Semiconductors ADC1213D series 12. Serial output timings The eye diagram of the serial output is shown in Figure 3 and Figure 4. Test conditions are: • 3.125 Gbps data rate • Tamb = 25 °C • DC coupling with two different receiver common-mode voltages 005aaa088 Fig 3. Eye diagram at 1 V receiver common-mode 005aaa089 Fig 4. ADC1213D_SER_5 Preliminary data sheet Eye diagram at 2 V receiver common-mode All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 12 of 41 ADC1213D series NXP Semiconductors ADC1213D series 13. SPI timing Table 8. Symbol Characteristics Parameter Conditions Min Typ Max Unit 40 - - ns Serial Peripheral Interface timings tw(SCLK) SCLK pulse width tw(SCLKH) SCLK HIGH pulse width 16 - - ns tw(SCLKL) SCLK LOW pulse width 16 - - ns tsu set-up time data to SCLKH 5 - - ns CS to SCLKH 5 - - ns hold time th fclk(max) [1] data to SCLKH 2 - - ns CS to SCLKH 2 - - ns - - 25 MHz maximum clock frequency Typical values measured at VDDA = 3 V, VDDD = 1.8 V, Tamb = 25 °C. Minimum and maximum values are across the full temperature range Tamb = −40 °C to +85 °C at VDDA = 3 V, VDDD = 1.8 V; VI (INAP, INBP) − VI (INAM,INBM) = −1 dBFS; internal reference mode; 100 Ω differential applied to serial outputs; unless otherwise specified. tsu tsu th CS tw(SCLKL) th tw(SCLKH) tw(SCLK) SCLK SDIO R/W W1 W0 A12 A11 D2 D1 D0 005aaa065 Fig 5. SPI timings 14. Application information 14.1 Analog inputs 14.1.1 Input stage description The analog input of the ADC1213D supports differential or single-ended input drive. Optimal performance is achieved using differential inputs with the common-mode input voltage (VI(cm)) on pins INxP and INxM set to 0.5VDDA. The full scale analog input voltage range is configurable between ± 1 V (p-p) and ± 2 V (p-p) via a programmable internal reference (see Section 14.2 and Table 21 for further details). Figure 6 shows the equivalent circuit of the sample and hold input stage, including ElectroStatic Discharge (ESD) protection and circuit and package parasitics. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 13 of 41 ADC1213D series NXP Semiconductors ADC1213D series Package ESD Parasitics Switch INAP INBP Ron = 15 Ω 1, 14 4 pF Cs Internal clock Switch INAM INBM Ron = 15 Ω 2, 13 4 pF Cs Internal clock 005aaa069 Fig 6. Input sampling circuit The sample phase occurs when the internal clock (derived from the clock signal on pin CLKP/CLKM) is HIGH. The voltage is then held on the sampling capacitors. When the clock signal goes LOW, the stage enters the hold phase and the voltage information is transmitted to the ADC core. 14.1.2 Anti-kickback circuitry Anti-kickback circuitry (RC filter in Figure 7) is needed to counteract the effects of a charge injection generated by the sampling capacitance. The RC filter is also used to filter noise from the signal before it reaches the sampling stage. The value of the capacitor should be chosen to maximize noise attenuation without degrading the settling time excessively. R INP C R INM 005aaa073 Fig 7. Anti-kickback circuit The component values are determined by the input frequency and should be selected so as not to affect the input bandwidth. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 14 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 9. RC coupling versus input frequency - typical values Input frequency R C 3 MHz 25 Ω 12 pF 70 MHz 12 Ω 8 pF 170 MHz 12 Ω 8 pF 14.1.3 Transformer The configuration of the transformer circuit is determined by the input frequency. The configuration shown in Figure 8 would be suitable for a baseband application. 100 nF Analog input 100 nF 25 Ω ADT1-1WT INAP INBP 25 Ω 12 pF 100 nF 100 nF 25 Ω 25 Ω INAM INBM VCM 100 nF 100 nF 005aaa070 Fig 8. Single transformer configuration ADT1-1WT Analog input 100 nF ADT1-1WT 12 Ω 50 Ω 50 Ω 50 Ω 50 Ω INAP INBP 8.2 pF 100 nF 12 Ω INAM INBM VCM 100 nF 100 nF 005aaa071 Fig 9. Dual transformer configuration The configuration shown in Figure 9 is recommended for high frequency applications. In both cases, the choice of transformer will be a compromise between cost and performance. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 15 of 41 ADC1213D series NXP Semiconductors ADC1213D series 14.2 System reference and power management 14.2.1 Internal/external reference The ADC1213D has a stable and accurate built-in internal reference voltage to adjust the ADC full-scale. This reference voltage can be set internally via SPI or with pin VREF an SENSE (see Figure 11, Figure 12, Figure 13 and Figure 14), in 1 dB steps between 0 dB and −6 dB, via SPI control bits INTREF[2:0] (when bit INTREF_EN = 1; see Table 21). The equivalent reference circuit is shown in Figure 10. External reference is also possible by providing a voltage on pin VREF as described in Figure 13. REFT REFERENCE AMP REFB VREF EXT_ref BUFFER EXT_ref BANDGAP REFERENCE ADC CORE SENSE SELECTION LOGIC 005aaa164 Fig 10. Reference equivalent schematic Table 10 shows how to choose between the different internal/external modes: Table 10. Reference modes Mode SPI bit, “Internal reference” SENSE pin VREF pin Full Scale, V (p-p) Internal (Figure 11) 0 GND 330 pF capacitor 2 to GND Internal (Figure 12) 0 VREF pin = SENSE pin and 330 pF capacitor to GND External (Figure 13) 0 VDDA Internal, SPI mode (Figure 14) 1 VREF pin = SENSE pin and 330 pF capacitor to GND 1 External voltage 1 to 2 from 0.5 V to 1 V 1 to 2 Figure 11 to Figure 14 indicate how to connect the SENSE and VREF pins. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 16 of 41 ADC1213D series NXP Semiconductors ADC1213D series VREF VREF 330 pF 330 pF REFERENCE EQUIVALENT SCHEMATIC REFERENCE EQUIVALENT SCHEMATIC SENSE SENSE 005aaa117 005aaa116 Fig 11. Internal reference, 2 V (p-p) full-scale Fig 12. Internal reference, 1 V (p-p) full-scale VREF VREF V 0.1 μF 330 pF REFERENCE EQUIVALENT SCHEMATIC REFERENCE EQUIVALENT SCHEMATIC SENSE SENSE VDDA 005aaa118 005aaa119 Fig 13. External reference, 1 V (p-p) to 2 V (p-p) full-scale Fig 14. Internal reference via SPI, 1 V (p-p) to 2 V (p-p) full-scale 14.2.2 Reference gain control The reference gain is programmable between 0 dB to −6 dB in steps of 1 dB via the SPI (see Table 21). The corresponding full scale input voltage range varies between 2 V (p-p) and 1 V (p-p), as shown in Table 11: Table 11. Reference SPI gain control INTREF[2:0] Level Full Scale, V (p-p) 000 0 dB 2 001 −1 dB 1.78 010 −2 dB 1.59 011 −3 dB 1.42 100 −4 dB 1.26 101 −5 dB 1.12 110 −6 dB 1 111 not used x 14.2.3 Common-mode output voltage (VI(cm)) An 0.1 μF filter capacitor should be connected between on the one hand the pins VCMA and VCMB and on the other hand ground to ensure a low-noise common-mode output voltage. When AC-coupled, these pins can be used to set the common-mode reference for the analog inputs, for instance via a transformer middle point. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 17 of 41 ADC1213D series NXP Semiconductors ADC1213D series PACKAGE ESD PARASITICS COMMON MODE REFERENCE 1.5 V VCMA VCMB 0.1 μF ADC CORE 005aaa077 Fig 15. Reference equivalent schematic 14.2.4 Biasing The common-mode output voltage, VO(cm), should be set externally to 1.5 V (typical). The common-mode input voltage, VI(cm), at the inputs to the sample and hold stage (pins INAM, INBM, INAP, and INBP) must be between 0.9 V and 2 V for optimal performance. 14.3 Clock input 14.3.1 Drive modes The ADC1213D can be driven differentially (SINE, LVPECL or LVDS) with little or no influence on dynamic performances. It can also be driven by a single-ended LVCMOS signal connected to pin CLKP (CLKM should be connected to ground via a capacitor). LVCMOS clock input CLKP CLKP CLKM LVCMOS clock input 005aaa174 a. Rising edge LVCMOS CLKM 005aaa053 b. Falling edge LVCMOS Fig 16. LVCMOS single-ended clock input ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 18 of 41 ADC1213D series NXP Semiconductors ADC1213D series Sine clock input CLKP Sine clock input CLKP CLKM CLKM 005aaa173 005aaa054 a. Sine clock input b. Sine clock input (with transformer) CLKP CLKP LVPECL clock input LVDS clock input CLKM CLKM 005aaa055 005aaa172 c. LVDS clock input d. LVPECL clock input Fig 17. Differential clock input 14.3.2 Equivalent input circuit The equivalent circuit of the input clock buffer is shown in Figure 18. The common-mode voltage of the differential input stage is set via internal resistors of 5 kΩ resistors. Package ESD Parasitics CLKP Vcm(clk) SE_SEL SE_SEL 5 kΩ 5 kΩ CLKM 005aaa081 Fig 18. Equivalent input circuit Single-ended or differential clock inputs can be selected via the SPI (see Table 20). If single-ended is selected, the input pin (CLKM or CLKP) is selected via control bit SE_SEL. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 19 of 41 ADC1213D series NXP Semiconductors ADC1213D series If single-ended is implemented without setting SE_SEL accordingly, the unused pin should be connected to ground via a capacitor. 14.3.3 Clock input divider The ADC1413D contains an input clock divider that divides the incoming clock by a factor of 2 (when bit CLKDIV = 1; see Table 20). This feature allows the user to deliver a higher clock frequency with better jitter performance, leading to a better SNR result once acquisition has been performed. 14.3.4 Duty cycle stabilizer The duty cycle stabilizer can improve the overall performances of the ADC by compensating the input clock signal duty cycle. When the duty cycle stabilizer is active (bit DCS_EN = 1; see Table 20), the circuit can handle signals with duty cycles of between 30 % and 70 % (typical). When the duty cycle stabilizer is disabled (DCS_EN = 0), the input clock signal should have a duty cycle of between 45 % and 55 %. Table 12. Duty cycle stabilizer DCS_enable SPI Description 0 duty cycle stabilizer disable 1 duty cycle stabilizer enable 14.4 Digital outputs 14.4.1 Serial output equivalent circuit The JESD204A standard specify that in case of connecting the receiver and the transmitter in DC coupling, both of them need to be provided by the same supply. VDDD 50 Ω CMLPA/CLMPB 100 Ω RECEIVER CMLNA/CLMNB + − 12 mA to 26 mA AGND 005aaa082 Fig 19. CML output connection to the receiver in DC coupling The output should be terminated when 100 Ω (typical) has been reached at the receiver side. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 20 of 41 ADC1213D series NXP Semiconductors ADC1213D series VDDD 50 Ω CMLPA/CMLPB 10 nF CMLNA/CMLNB − + 100 Ω RECEIVER 10 nF 12 mA to 26 mA 005aaa083 Fig 20. CML output connection to the receiver in AC coupling 14.5 JESD204A serializer 14.5.1 Digital JESD204A formatter The block placed after the ADC cores is used to implement all functionalities of the JESD204A standard. This ensures signal integrity and guarantees the clock and the data recovery at the receiver side. The block is highly parameterized and can be configured in various ways depending on the sampling frequency and the number of lanes used. M CONVERTERS N bits from Cr0 + CS bits for control L LANES F octets TX transport layer FRAME TO OCTETS SCRAMBLER ALIGNMENT CHARACTER GENERATOR 8-bit/ 10-bit SER LANE0 8-bit/ 10-bit SER LANE1 TX CONTROLLER SYNC~ samples stream to lane stream mapping N bits from CrM−1 + CS bits for control N' = N+CS S samples per frame cycle F octets FRAME TO OCTETS SCRAMBLER ALIGNMENT CHARACTER GENERATOR CF: position of controls bits HD: frame boundary break Padding with Tails bits (TT) Mx(N'xS) bits Lx(F) octets L octets 005aaa084 Fig 21. General overview of the JESD204A serializer ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 21 of 41 ADC1213D series NXP Semiconductors ADC1213D series ADC_MODE[1:0] PRBS DUMMY SCRAMB_IN_MODE[1:0] 11 12 + 1 10 12 + 1 N & CS LANE_MODE[1:0] 8 N + CS ADC_PD ADCA PLL AND DLL ADCB frame CLK ×F char CLK 12 + 1 01 10 00 '0' 01 '0/1' 10 PRBS 11 SWING_SEL[2:0] bit CLK PRBS 11 '0/1' 10 '0' 01 SER 00 PRBS PRBS SER FSM (f assy, char repl, ILA, test mode) FRAME ASSEMBLY ADC_D DUMMY LANE_POLARITY 00 ×1 × 10F 8-bit/ 10-bit SCR PRBS 12 + 1 00 12 + 1 10 12 + 1 N & CS LANE_POLARITY 01 8-bit/ 10-bit SCR N + CS 8 10 00 00 LANE_MODE[1:0] 11 SCAMB_IN_MODE[1:0] ADC_MODE[1:0] sync_request 005aaa175 Fig 22. Detailed view of the JESD204A serializer with debug functionality 14.5.2 ADC core output codes versus input voltage Table 13 shows the data output codes for a given analog input voltage. Table 13. ADC1213D_SER_5 Preliminary data sheet Output codes versus input voltage INP-INM (V) Offset binary Two’s complement OTR < −1 0000 0000 0000 1000 0000 0000 1 −1.0000000 0000 0000 0000 1000 0000 0000 0 −0.9995117 0000 0000 0001 1000 0000 0001 0 −0.9990234 0000 0000 0010 1000 0000 0010 0 −0.9985352 0000 0000 0011 1000 0000 0011 0 −0.9980469 0000 0000 0100 1000 0000 0100 0 .... .... .... 0 −0.0009766 0111 1111 1110 1111 1111 1110 0 −0.0004883 0111 1111 1111 1111 1111 1111 0 0.0000000 1000 0000 0000 0000 0000 0000 0 +0.0004883 1000 0000 0001 0000 0000 0001 0 +0.0009766 1000 0000 0010 0000 0000 0010 0 All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 22 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 13. Output codes versus input voltage …continued INP-INM (V) Offset binary Two’s complement OTR .... .... .... 0 +0.9980469 1111 1111 1011 0111 1111 1011 0 +0.9985352 1111 1111 1100 0111 1111 1100 0 +0.9990234 1111 1111 1101 0111 1111 1101 0 +0.9995117 1111 1111 1110 0111 1111 1110 0 +1.0000000 1111 1111 1111 0111 1111 1111 0 > +1 1111 1111 1111 0111 1111 1111 1 14.6 Serial Peripheral Interface (SPI) 14.6.1 Register description The ADC1213D serial interface is a synchronous serial communications port allowing for easy interfacing with many industry microprocessors. It provides access to the registers that control the operation of the chip in both read and write modes. This interface is configured as a 3-wire type (SDIO as bidirectional pin). SCLK acts as the serial clock, and CS acts as the serial chip select bar. Each read/write operation is sequenced by the CS signal and enabled by a LOW level to to drive the chip with 2 bytes to 5 bytes, depending on the content of the instruction byte (see Table 14). Table 14. Instruction bytes for the SPI MSB Bit 7 6 5 4 3 2 1 0 Description R/W[1] W1 W0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 [1] R/W indicates whether a read or write transfer occurs after the instruction byte Table 15. Description 0 Write mode operation 1 Read mode operation Bits W1 and W0 indicate the number of bytes transferred after the instruction byte. Table 16. Preliminary data sheet Read or Write mode access description R/W[1] [1] ADC1213D_SER_5 LSB Number of bytes to be transferred W1 W0 Number of bytes 0 0 1 byte transferred 0 1 2 bytes transferred 1 0 3 bytes transferred 1 1 4 or more bytes transferred All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 23 of 41 ADC1213D series NXP Semiconductors ADC1213D series Bits A12 to A0 indicate the address of the register being accessed. In the case of a multiple byte transfer, this address is the first register to be accessed. An address counter is incremented to access subsequent addresses. The steps involved in a data transfer are as follows: 1. The falling edge on CS in combination with a rising edge on SCLK determine the start of communications. 2. The first phase is the transfer of the 2-byte instruction. 3. The second phase is the transfer of the data which can be vary in length but will always be a multiple of 8 bits. The MSB is always sent first (for instruction and data bytes): CSB SCLK SDIO R/W W1 W0 A12 A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 Instruction bytes D7 D6 D5 D4 D3 D2 Register N (data) D1 D0 D7 D6 D5 D4 D3 D2 D1 D0 Register N + 1 (data) 005aaa086 Fig 23. Transfer diagram for two data bytes (3-wire type) 14.6.2 Channel control The two ADC channels can be configured at the same time or separately. By using the register “Channel index”, the user can choose which ADC channel will receive the next SPI-instruction. By default the channel A and B will receive the same instructions in write mode. In read mode only A is active. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 24 of 41 xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Addr Hex NXP Semiconductors ADC1213D_SER_5 Preliminary data sheet Table 17. Register allocation map Register name R/W[1] Bit definition Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Default[2] Bin Bit 0 ADC control register Rev. 05 — 23 April 2010 All information provided in this document is subject to legal disclaimers. 0003 Channel index R/W RESERVED[5:0] 0005 Reset and Operating modes R/W SW_ RST 0006 Clock R/W - - - 0008 Vref R/W - - - 0013 Offset R/W - - 0014 Test pattern 1 R/W - - 0015 Test pattern 2 R/W 0016 Test pattern 3 R/W ADCB RESERVED[2:0] - - SE_SEL DIFF_SE - - INTREF_ EN ADCA PD[1:0] CLKDIV2_ SEL 0000 0000 DCS_EN INTREF[2:0] - - 0000 0000 TESTPAT_1[2:0] 0000 0000 TESTPAT_2[13:6] TESTPAT_3[5:0] 0000 000X 0000 0000 DIG_OFFSET[5:0] - 1111 1111 0000 0000 - - - 0000 0000 0 0 POR_TST RESERVED 0000 0000 FSM_SW_ RST 0 0 0 0000 0000 JESD204A control Ser_Status R 0802 Ser_Reset R/W SW_ RST 0 0 0 0803 Ser_Cfg_Setup R/W 0 0 0 0 0805 Ser_Control1 R/W 0 TriState_ CFG_PAD SYNC_ POL SYNC_SING LEENDED 1 0806 Ser_Control2 R/W 0 0 0 0 0 0808 Ser_Analog_Ctrl R/W 0 0 0 0 0 0 Ser_ScramblerA R/W 080A Ser_ScramblerB R/W 080B Ser_PRBS_Ctrl R/W 0820 Cfg_0_DID R/W* RESERVED[2:0] CFG_SETUP[3:0] 0000 **** RESERVED[2:0] 0 SWAP_ LANE_1_2 0100 1001 SWAP_ ADC_0_1 SWING_SEL[2:0] 0000 00** LSB_INIT[6:0] 0000 0000 MSB_INIT[7:0] 0 0 0 0 0 1111 1111 0 PRBS_TYPE[1:0] DID[7:0] 0821 Cfg_1_BID R/W* 0 0 0 0 0822 Cfg_3_SCR_L R/W* SCR 0 0 0 0 0823 Cfg_4_F R/W* 0 0 0 0 0 0824 Cfg_5_K R/W* 0 0 0 0825 Cfg_6_M R/W* 0 0 0 BID[3:0] 0 0000 0000 1110 1101 0 0000 1010 0 L F[2:0] 0 *000 000* 0000 0*** K[4:0] 0 0000 00** 000* **** 0 M 0000 000* ADC1213D series 25 of 41 © NXP B.V. 2010. All rights reserved. 0809 RXSYNC_ ERROR ADC1213D series 0801 xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxx x x xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx Register allocation map …continued R/W[1] Bit definition Default[2] Bin Rev. 05 — 23 April 2010 All information provided in this document is subject to legal disclaimers. Addr Hex Register name 0826 Cfg_7_CS_N R/W* 0827 Cfg_8_Np R 0 0 0 0828 Cfg_9_S R/W* 0 0 0 0 0 0 0829 Cfg_10_HD_CF R/W* HD 0 0 0 0 0 082C Cfg_01_2_LID R/W* 0 0 0 082D Cfg_02_2_LID R/W* 0 0 0 084C Cfg01_13_FCHK R FCHK[7:0] **** **** 084D Cfg02_13_FCHK R FCHK[7:0] **** **** 0870 LaneA_0_Ctrl R/W 0 SCR_IN_ MODE LANE_MODE[1:0] 0 LANE_ POL LANE_CLK_ POS_EDGE LANE_PD 0000 000* 0871 LaneB_0_Ctrl R/W 0 SCR_IN_ MODE LANE_MODE[1:0] 0 LANE_ POL LANE_CLK_ POS_EDGE LANE_PD 0000 000* 0890 ADCA_0_Ctrl R/W 0 0 ADC_MODE[1:0] 0 0 0 ADC_PD 0000 000* 0891 ADCB_0_Ctrl R/W 0 0 ADC_MODE[1:0] 0 0 0 ADC_PD 0000 000* Bit 7 0 Bit 6 Bit 5 CS[0] 0 Bit 4 Bit 3 Bit 2 Bit 1 0 NXP Semiconductors ADC1213D_SER_5 Preliminary data sheet Table 17. Bit 0 N[3:0] 0100 0*** NP[4:0] 0000 1111 0 S CF[1:0] 0000 0000 *000 0000 LID[4:0] 0001 1011 LID[4:0] 0001 1100 [1] an "*" in the Access column means that this register is subject to control access conditions in Write mode. [2] an "*" in the Default column replaces a bit of which the value depends on the binary level of external pins (e.g. CFG[3:0], Swing[1:0], Scrambler). ADC1213D series ADC1213D series 26 of 41 © NXP B.V. 2010. All rights reserved. ADC1213D series NXP Semiconductors ADC1213D series 14.6.3 Register description 14.6.3.1 Table 18. ADC control register Register channel Index (address 0003h) Bit Symbol Access Value Description 7 to 2 RESERVED[5:0] - 111111 reserved 1 ADCB R/W ADCB will get the next SPI command: 0 ADCB not selected 1 0 ADCA Table 19. ADCB selected R/W ADCA will get the next SPI command: 0 ADCA not selected 1 ADCA selected Register reset and Power-down mode (address 0005h) Bit Symbol Access 7 SW_RST R/W Value Description reset digital part: 0 no reset 1 performs a reset of the digital part 6 to 4 RESERVED[2:0] - 000 reserved 3 to 2 - - 00 not used 1 to 0 PD[1-0] R/W Table 20. power-down mode: 00 normal (power-up) 01 full power-down 10 sleep 11 normal (power-up) Register clock (address 0006h) Bit Symbol Access Value Description 7 to 5 - - 000 not used 4 SE_SEL R/W 3 DIFF_SE select SE clock input pin: 0 Select CLKM input 1 Select CLKP input R/W differential/single ended clock input select: 0 1 2 - - 1 CLKDIV2_SEL R/W 0 1 DCS_EN ADC1213D_SER_5 Preliminary data sheet Single-ended not used select clock input divider by 2: 0 0 Fully differential R/W disable active duty cycle stabilizer enable: 0 disable 1 active All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 27 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 21. Register Vref (address 0008h) Bit Symbol Access Value Description 7 to 4 - - 0000 not used 3 INTREF_EN R/W 2 to 0 INTREF[2:0] Table 22. enable internal programmable VREF mode: 0 disable 1 active R/W programmable internal reference: 000 0 dB (FS=2 V) 001 −1 dB (FS=1.78 V) 010 −2 dB (FS=1.59 V) 011 −3 dB (FS=1.42 V) 100 −4 dB (FS=1.26 V) 101 −5 dB (FS=1.12 V) 110 −6 dB (FS=1 V) 111 not used Digital offset adjustment (address 0013h) Register offset: (address 0013h) Decimal DIG_OFFSET[5:0] +31 011111 +31 LSB ... ... ... 0 000000 0 ... ... ... −32 100000 −32 LSB Table 23. Register test pattern 1 (address 0014h) Bit Symbol Access Value Description 7 to 3 - - 00000 not used 2 to 0 TESTPAT_1[2:0] R/W Table 24. digital test pattern: 000 off 001 mid-scale 010 − FS 011 + FS 100 toggle ‘1111..1111’/’0000..0000’ 101 custom test pattern, to be written in register 0015h and 0016h 110 ‘010101...’ 111 ‘101010...’ Register test pattern 2 (address 0015h) Bit Symbol Access Value 7 to 0 TESTPAT_2[13:6] R/W 00000000 custom digital test pattern (bit 13 to 6) ADC1213D_SER_5 Preliminary data sheet Description All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 28 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 25. Register test pattern 3 (address 0016h) Bit Symbol Access Value Description 7 to 3 TESTPAT_3[5:0] R/W 00000 custom digital test pattern (bit 5 to 0) 2 to 0 - - 000 not used 14.6.4 JESD204A digital control registers Table 26. SER status (address 0801h) Bit Symbol Access Value Description 7 RXSYNC_ERROR R/W 0 set to 1 when a synchronization error occurs 6 to 4 RESERVED[2:0] - 010 reserved 3 to 2 - - 0 not used 1 POR_TST R 1 power-on-reset 0 RESERVED - - reserved Table 27. SER reset (address 0802h) Bit Symbol Access Value Description 7 SW_RST R/W 0 initiates a software reset of the JEDEC204A unit 6 to 4 - - 000 not used 3 FSM_SW_RST R/W 0 initiates a software reset of the internal state machine of JEDEC204A unit 2 to 0 - - 000 not used ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 29 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 28. SER cfg set-up (address 0803h)[1] Bit Symbol Access Value Description 7 to 4 - R 0000 not used 3 to 0 CFG_SETUP[3:0] R/W 0000 (reset) defines quick JESD204A configuration. These settings overrule the CFG_PAD configuration 0000 ADC0: ON; ADC1: ON; Lane0: ON; Lane1: ON; F = 2; HD = 0; K = 9; M = 2; L = 2[2] 0001 ADC0: ON; ADC1: ON; Lane0: ON; Lane1: OFF; F = 4; HD = 0; K = 5; M = 2; L = 1[2] 0010 ADC0: ON; ADC1: ON; Lane0: OFF[2] 0011 ADC0: ON; ADC1: OFF; Lane0: ON; Lane1: ON; F = 1; HD = 1; K = 17; M = 1; L = 2[2] 0100 ADC0: OFF; ADC1: ON; Lane0: ON; Lane1: ON; F = 1; HD = 1; K = 17; M = 1; L = 2; SWAP_ADC_0_1 = 1[2] 0101 ADC0: ON; ADC1: OFF; Lane0: ON; Lane1: OFF; F = 2; HD = 0; K = 9; M = 1; L = 1[2] 0110 ADC0: ON; ADC1: OFF; Lane0: OFF; Lane1: ON; F = 2; HD = 0; K = 9; M = 1; L = 1; SWAP_LANE_1_2 = 1[2] 0111 ADC0: OFF; ADC1: ON; Lane0: ON; Lane1: OFF; F = 2; HD = 0; K = 9; M = 1; L = 1; SWAP_ADC_0_1 = 1[2] 1000 ADC0: OFF; ADC1: ON; Lane0: OFF; Lane1: ON; F = 2; HD = 0; K = 9; M = 1; L = 1; SWAP_ADC_0_1[2] 1001 to 1101 reserved 1110 ADC0: OFF; ADC1: OFF; Lane0: ON; Lane1: ON; F = 2; HD = 0; K = 9; M = 2; L = 2; loop alignment = 1[2] 1111 ADC0: OFF; ADC1: OFF; Lane0: OFF; Lane1: OFF; F = 2; HD = 0; K = 9; M = 2; L = 2 → PD[2] [1] The default value for this register depends on the external pull-up/pull-down on CFG0, CFG1, CFG2 or CFG3. Writing to the register overwrites this value. [2] F: number of byte per frame; HD: High density; K: number of frames per multi frame; M: number of converters; L: number of lanes See the information about the JESD204A standard on the JEDEC web site. Table 29. SER control1 (address 0805h) Bit Symbol Access Value Description 7 - R 0 not used 6 TRISTATE_CFG_PAD R/W 1 5 SYNC_POL R/W 4 3 defines the sync signal polarity: 0 synchronization signal is active low 1 synchronization signal is active high SYNC_SINGLE_ENDED R/W - ADC1213D_SER_5 Preliminary data sheet R CFG pads (3 to 0) are set to high-impedance. Switch to 0 automatically after start-up or reset. defines the input mode of the sync signal: 0 synchronization input mode is set in Differential mode 1 synchronization input mode is set in Single-ended mode 1 not used All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 30 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 29. SER control1 (address 0805h) …continued Bit Symbol Access 2 REV_SCR - Value Description enables swapping bits at the scrambler input 0 1 1 REV_ENCODER LSB are swapped to MSB at the scrambler input - enables swapping bits at the 8b/10b encoder input: 0 1 0 REV_SERIAL LSB are swapped to MSB at the 8b/10b encoder input - enables swapping bits at the lane input (before serializer): 0 1 Table 30. LSB are swapped to MSB at the lane input SER control2 (address 0806h) Bit Symbol Access Value 7 to 2 1 - R 000000 SWAP_LANE_1_2 R/W Description not used controls the JESD204A output multiplexer: 0 1 0 SWAP_ADC_0_1 outputs of the JESD204A unit are swapped. (Output0 is connected to Lane1, Output1 is connected to Lane0) R/W controls the JESD204A input multiplexer: 0 1 Table 31. inputs of the JESD204A unit are swapped. (ADC0 output is connected to Input1, ADC1 is connected to Input0) SER analog ctrl (address 0808h) Bit Symbol Access Value Description 7 to 3 - R 00000 not used 2 to 0 SWING_SEL[2:0] R/W 0** defines the swing output for the lane pads Table 32. SER scramblerA (address 0809h) Bit Symbol Access Value Description 7 - R 0 not used 6 to 0 LSB_INIT[6:0] R/W 0000000 defines the initialization vector for the scrambler polynomial (lower) Table 33. SER scramblerB (address 080Ah) Bit Symbol Access Value Description 7 to 0 MSB_INIT[7:0] R/W 11111111 defines the initialization vector for the scrambler polynomial (upper) ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 31 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 34. SER PRBS Ctrl (address 080Bh) Bit Symbol Access Value Description 7 to 2 - R 000000 not used 1 to 0 PRBS_TYPE[1:0] R/W Table 35. defines the type of Pseudo-Random Binary Sequence (PRBS) generator to be used: 00 (reset) PRBS-7 01 PRBS-7 10 PRBS-23 11 PRBS-31 Cfg_0_DID (address 0820h) Bit Symbol Access Value 7 to 0 DID[7:0] R 11101101 defines the device (= link) identification number Table 36. Description Cfg_1_BID (address 0821h) Bit Symbol Access Value Description 7 to 4 - R 0000 not used 3 to 0 BID[3:0] R/W 1010 defines the bank ID – extension to DID Table 37. Cfg_3_SCR_L (address 0822h) Bit Symbol Access Value Description 7 SCR R/W * scrambling enabled 6 to 1 - R 000000 not used 0 L R/W * defines the number of lanes per converter device, minus 1 Description Table 38. Cfg_4_F (address 0823h) Bit Symbol Access Value 7 to 3 - R 00000 not used 2 to 0 F[2:0] R/W *** defines the number of octets per frame, minus 1 Value Description Table 39. Bit Cfg_5_K (address 0824h) Symbol Access 7 to 5 - R 000 not used 4 to 0 K[4:0] R/W ***** defines the number of frames per multiframe, minus 1 Description Table 40. Cfg_6_M (address 0825h) Bit Symbol Access Value 7 to 1 - R 0000000 not used 0 M R/W * defines the number of converters per device, minus 1 ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 32 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 41. Cfg_7_CS_N (address 0826h) Bit Symbol Access Value Description 7 - R 0 not used 6 CS[0] R/W * defines the number of control bits per sample, minus 1 5 to 4 - R 00 not used 3 to 0 N[3:0] R/W **** defines the converter resolution Table 42. Cfg_8_Np (address 0827h) Bit Symbol Access Value Description 7 to 5 - R 000 not used 4 to 0 NP[4:0] R/W ***** defines the total number of bits per sample, minus 1 Table 43. Cfg_9_S (address 0828h) Bit Symbol Access Value Description 7 to 1 - R 0000000 not used 0 S R/W 1 defines number of samples per converter per frame cycle Table 44. Cfg_10_HD_CF (address 0829h) Bit Symbol Access Value Description 7 HD R/W * defines high density format 6 to 2 - R 00000 not used 1 to 0 CF[1:0] R/W ** defines number of control words per frame clock cycle per link. Table 45. Cfg01_2_LID (address 082Ch) Bit Symbol Access Value Description 7 to 5 - R 000 not used 4 to 0 LID[4:0] R/W 11011 defines lane1 identification number Table 46. Cfg02_2_LID (address 082Dh) Bit Symbol Access Value Description 7 to 5 - R 000 not used 4 to 0 LID[4:0] R/W 11100 defines lane2 identification number Table 47. Cfg02_13_fchk (address 084Ch) Bit Symbol Access Value Description 7 to 0 FCHK[7:0] R ******** defines the checksum value for lane1 checksum corresponds to the sum of all the link configuration parameters modulo 256 (as defined in JEDEC Standard No.204A) ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 33 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 48. Cfg01_13_fchk (address 084Dh) Bit Symbol Access Value Description 7 to 0 FCHK[7:0] R ******** defines the checksum value for lane1 checksum corresponds to the sum of all the link configuration parameters module 256 (as defined in JEDEC Standard No.204A) Table 49. LaneA_0_ctrl (address 0870h) Bit Symbol Access Value Description 7 - R 0 not used 6 SCR_IN_MODE R/W 5 to 4 LANE_MODE[1:0] - R 2 LANE_POL R/W 0 0 (reset) (normal mode) = Input of the scrambler and 8-bit/10-bit units is the output of the frame assembly unit. 1 input of the scrambler and 8-bit/10-bit units is the PRSB generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) R/W 3 1 defines the input type for scrambler and 8-bit/10-bit units: defines output type of Lane output unit: 00 (reset) normal mode: Lane output is the 8-bit/10-bit output unit 01 constant mode: Lane output is set to a constant (0 × 0) 10 toggle mode: Lane output is toggling between 0 × 0 and 0 × 1 11 PRBS mode: Lane output is the PRBS generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) 0 not used defines lane polarity: 0 lane polarity is normal 1 lane polarity is inverted LANE_CLK_POS_EDGE R/W Lane_PD Table 50. defines lane clock polarity: 0 lane clock provided to the serializer is active on positive edge 1 lane clock provided to the serializer is active on negative edge R/W lane power-down control: 0 lane is operational 1 lane is in Power-down mode LaneB_0_ctrl (address 0871h) Bit Symbol Access Value Description 7 - R 0 not used 6 SCR_IN_MODE R/W ADC1213D_SER_5 Preliminary data sheet defines the input type for scrambler and 8b/10b units: 0 (reset) (normal mode) = Input of the scrambler and 8b/10b units is the output of the Frame Assembly unit. 1 input of the scrambler and 8b/10b units is the PRBS generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 34 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 50. LaneB_0_ctrl (address 0871h) …continued Bit Symbol Access 5 to 4 LANE_MODE[1:0] R/W 3 - R 2 LANE_POL R/W 1 0 Value defines output type of lane output unit: 00 (reset) normal mode: Lane output is the 8b/10b output unit 01 constant mode: Lane output is set to a constant (0x0) 10 toggle mode: Lane output is toggling between 0x0 and 0x1 11 PRBS mode: Lane output is the PRSB generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) 0 not used defines lane polarity: 0 lane polarity is normal 1 lane polarity is inverted LANE_CLK_POS_EDGE R/W Lane_PD Table 51. Description defines lane clock polarity: 0 lane clock provided to the serializer is active on positive edge 1 lane clock provided to the serializer is active on negative edge R/W lane power-down control: 0 lane is operational 1 lane is in Power-down mode ADCA_0_ctrl (address 0890h) Bit Symbol Access Value Description 7 to 6 - R 00 not used 5 to 4 ADC_MODE[1:0] R/W 3 to 1 - R 0 ADC_PD R/W Table 52. defines input type of JESD204A unit: 00 (reset) ADC output is connected to the JESD204A input 01 not used 10 JESD204A input is fed with a dummy constant, set to: OTR = 0 and ADC[11:0] = “100110111010” 11 JESD204A is fed with a PRBS generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) 000 not used ADC power-down control: 0 ADC is operational 1 ADC is in Power-down mode ADCB_0_ctrl (address 0891h) Bit Symbol Access Value Description 7 to 6 - R 00 not used 5 to 4 ADC_MODE[1:0] R/W defines input type of JESD204A unit 00 (reset) ADC output is connected to the JESD204A input 3 to 1 - ADC1213D_SER_5 Preliminary data sheet R 01 not used 10 JESD204A input is fed with a dummy constant, set to: OTR = 0 and ADC[11:0] = “100110111010” 11 JESD204A is fed with a PRBS generator (PRBS type is defined with “PRBS_TYPE” (Ser_PRBS_ctrl register) 000 not used All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 35 of 41 ADC1213D series NXP Semiconductors ADC1213D series Table 52. ADCB_0_ctrl (address 0891h) …continued Bit Symbol Access 0 ADC_PD R/W ADC1213D_SER_5 Preliminary data sheet Value Description ADC power-down control: 0 ADC is operational 1 ADC is in Power-down mode All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 36 of 41 ADC1213D series NXP Semiconductors ADC1213D series 15. Package outline HVQFN56: plastic thermal enhanced very thin quad flat package; no leads; 56 terminals; body 8 x 8 x 0.85 mm A B D SOT684-7 terminal 1 index area A E A1 c detail X e1 e 1/2 e L 15 28 14 C C A B C v w b y1 C y 29 e e2 Eh 1/2 e 1 42 terminal 1 index area 56 43 X Dh 0 2.5 scale Dimensions Unit mm 5 mm A(1) A1 b max 1.00 0.05 0.30 nom 0.85 0.02 0.21 min 0.80 0.00 0.18 c D(1) Dh E(1) Eh 0.2 8.1 8.0 7.9 5.95 5.80 5.65 8.1 8.0 7.9 6.55 6.40 6.25 e e1 0.5 6.5 e2 L v 6.5 0.5 0.4 0.3 0.1 w y 0.05 0.05 y1 0.1 Note 1. Plastic or metal protrusions of 0.075 mm maximum per side are not included. References Outline version IEC JEDEC JEITA SOT684-7 --- MO-220 --- sot684-7_po European projection Issue date 08-11-19 09-03-04 Fig 24. Package outline SOT684-7 (HVQFN56) ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 37 of 41 ADC1213D series NXP Semiconductors ADC1213D series 16. Revision history Table 53. Revision history Document ID Release date Data sheet status Change notice Supersedes ADC1213D_SER_5 20100423 Preliminary data sheet - ADC1213D_SER_4 Modifications: ADC1213D_SER_4 • Product status changed from Objective to Preliminary 20100412 Objective data sheet - ADC1213D065_080_105_125_3 ADC1213D065_080_105_125_3 20090617 Objective data sheet - ADC1213D065_080_105_125_2 ADC1213D065_080_105_125_2 20090604 Objective data sheet - ADC1213D065_080_105_125_1 ADC1213D065_080_105_125_1 20090528 Objective data sheet - - ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 38 of 41 ADC1213D series NXP Semiconductors ADC1213D series 17. Legal information 17.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 17.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Product specification — The information and data provided in a Product data sheet shall define the specification of the product as agreed between NXP Semiconductors and its customer, unless NXP Semiconductors and customer have explicitly agreed otherwise in writing. In no event however, shall an agreement be valid in which the NXP Semiconductors product is deemed to offer functions and qualities beyond those described in the Product data sheet. 17.3 Disclaimers Limited warranty and liability — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. In no event shall NXP Semiconductors be liable for any indirect, incidental, punitive, special or consequential damages (including - without limitation - lost profits, lost savings, business interruption, costs related to the removal or replacement of any products or rework charges) whether or not such damages are based on tort (including negligence), warranty, breach of contract or any other legal theory. Notwithstanding any damages that customer might incur for any reason whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards customer for the products described herein shall be limited in accordance with the Terms and conditions of commercial sale of NXP Semiconductors. malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Customers are responsible for the design and operation of their applications and products using NXP Semiconductors products, and NXP Semiconductors accepts no liability for any assistance with applications or customer product design. It is customer’s sole responsibility to determine whether the NXP Semiconductors product is suitable and fit for the customer’s applications and products planned, as well as for the planned application and use of customer’s third party customer(s). Customers should provide appropriate design and operating safeguards to minimize the risks associated with their applications and products. NXP Semiconductors does not accept any liability related to any default, damage, costs or problem which is based on any weakness or default in the customer’s applications or products, or the application or use by customer’s third party customer(s). Customer is responsible for doing all necessary testing for the customer’s applications and products using NXP Semiconductors products in order to avoid a default of the applications and the products or of the application or use by customer’s third party customer(s). NXP does not accept any liability in this respect. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) will cause permanent damage to the device. Limiting values are stress ratings only and (proper) operation of the device at these or any other conditions above those given in the Recommended operating conditions section (if present) or the Characteristics sections of this document is not warranted. Constant or repeated exposure to limiting values will permanently and irreversibly affect the quality and reliability of the device. Terms and conditions of commercial sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, unless otherwise agreed in a valid written individual agreement. In case an individual agreement is concluded only the terms and conditions of the respective agreement shall apply. NXP Semiconductors hereby expressly objects to applying the customer’s general terms and conditions with regard to the purchase of NXP Semiconductors products by customer. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in life support, life-critical or safety-critical systems or equipment, nor in applications where failure or Export control — This document as well as the item(s) described herein may be subject to export control regulations. Export might require a prior authorization from national authorities. ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 39 of 41 ADC1213D series NXP Semiconductors ADC1213D series Non-automotive qualified products — Unless this data sheet expressly states that this specific NXP Semiconductors product is automotive qualified, the product is not suitable for automotive use. It is neither qualified nor tested in accordance with automotive testing or application requirements. NXP Semiconductors accepts no liability for inclusion and/or use of non-automotive qualified products in automotive equipment or applications. NXP Semiconductors’ specifications such use shall be solely at customer’s own risk, and (c) customer fully indemnifies NXP Semiconductors for any liability, damages or failed product claims resulting from customer design and use of the product for automotive applications beyond NXP Semiconductors’ standard warranty and NXP Semiconductors’ product specifications. In the event that customer uses the product for design-in and use in automotive applications to automotive specifications and standards, customer (a) shall use the product without NXP Semiconductors’ warranty of the product for such automotive applications, use and specifications, and (b) whenever customer uses the product for automotive applications beyond 17.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 18. Contact information For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] ADC1213D_SER_5 Preliminary data sheet All information provided in this document is subject to legal disclaimers. Rev. 05 — 23 April 2010 © NXP B.V. 2010. All rights reserved. 40 of 41 ADC1213D series NXP Semiconductors ADC1213D series 19. Contents 1 General description . . . . . . . . . . . . . . . . . . . . . . 1 2 Features and benefits . . . . . . . . . . . . . . . . . . . . 1 3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 4 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 5 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 2 6 Pinning information . . . . . . . . . . . . . . . . . . . . . . 3 6.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 6.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3 7 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5 8 Thermal characteristics . . . . . . . . . . . . . . . . . . 5 9 Static characteristics. . . . . . . . . . . . . . . . . . . . . 5 10 Dynamic characteristics . . . . . . . . . . . . . . . . . . 9 11 Clock and digital output timing . . . . . . . . . . . 11 12 Serial output timings . . . . . . . . . . . . . . . . . . . 12 13 SPI timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 14 Application information. . . . . . . . . . . . . . . . . . 13 14.1 Analog inputs . . . . . . . . . . . . . . . . . . . . . . . . . 13 14.1.1 Input stage description . . . . . . . . . . . . . . . . . . 13 14.1.2 Anti-kickback circuitry . . . . . . . . . . . . . . . . . . . 14 14.1.3 Transformer . . . . . . . . . . . . . . . . . . . . . . . . . . 15 14.2 System reference and power management . . 16 14.2.1 Internal/external reference . . . . . . . . . . . . . . . 16 14.2.2 Reference gain control . . . . . . . . . . . . . . . . . . 17 14.2.3 Common-mode output voltage (VI(cm)) . . . . . . 17 14.2.4 Biasing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 14.3 Clock input . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 14.3.1 Drive modes . . . . . . . . . . . . . . . . . . . . . . . . . . 18 14.3.2 Equivalent input circuit . . . . . . . . . . . . . . . . . . 19 14.3.3 Clock input divider . . . . . . . . . . . . . . . . . . . . . 20 14.3.4 Duty cycle stabilizer . . . . . . . . . . . . . . . . . . . . 20 14.4 Digital outputs . . . . . . . . . . . . . . . . . . . . . . . . . 20 14.4.1 Serial output equivalent circuit . . . . . . . . . . . . 20 14.5 JESD204A serializer. . . . . . . . . . . . . . . . . . . . 21 14.5.1 Digital JESD204A formatter . . . . . . . . . . . . . . 21 14.5.2 ADC core output codes versus input voltage . 22 14.6 Serial Peripheral Interface (SPI) . . . . . . . . . . . 23 14.6.1 Register description . . . . . . . . . . . . . . . . . . . . 23 14.6.2 Channel control . . . . . . . . . . . . . . . . . . . . . . . 24 14.6.3 Register description . . . . . . . . . . . . . . . . . . . . 27 14.6.3.1 ADC control register . . . . . . . . . . . . . . . . . . . . 27 14.6.4 JESD204A digital control registers . . . . . . . . . 29 15 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 37 16 Revision history . . . . . . . . . . . . . . . . . . . . . . . . 38 17 Legal information. . . . . . . . . . . . . . . . . . . . . . . 39 17.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 39 17.2 17.3 17.4 18 19 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . Contact information . . . . . . . . . . . . . . . . . . . . Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 39 40 40 41 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2010. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 23 April 2010 Document identifier: ADC1213D_SER_5