Semtech EVM737ATF Per-pin precision measurement unit Datasheet

E737
Per-Pin Precision
Measurement Unit
TEST AND MEASUREMENT PRODUCTS
Description
Features
The E737 is a precision measurement unit designed
for automatic test equipment and instrumentation.
Manufactured in a wide voltage CMOS process, it is a
monolithic solution for a per pin PMU.
•
•
•
FV / MI Capability
FI / MV Capability
4 Current Ranges (±40 mA, ±1 mA, ±100 µA, ±10 µA)
• -5V/+7V I / O Range
• Short Circuit Protection
• Clamps for limiting mode and range select
transients
The E737 supports two modes of operation: force current/measure voltage and force voltage/measure current. The E737 can force or measure voltage in the
range of -5V to +7V. In addition, the E737 can force
or measure a current of up to 40 mA over four distinct
ranges: ±40 mA, ±1 mA, ±100 µA and ±10 µA.
Applications
The E737 has an on board window comparator that
provides three bits of information: DUT too high, DUT
too low, and DUT fail. There is also a monitor function
which provides a real time analog voltage signal proportional to either the DUT voltage or current.
•
On board clamps prevent large transient spikes when
changing operating mode or current range. Also, the
PMU will survive a direct short over the legal voltage
range.
Automatic Test Equipment
- Memory Testers
- VLSI Testers
- Mixed Signal Tester
The E737 is designed to be a low power, low cost,
small footprint solution to allow high pin count testers
to support a PMU per pin.
Functional Block Diagram
HiZ
VINP
FORCE / SENSE
IVIN
MODE SEL
SENSE
DUT LTH
I/V MAX
Comparators
I/V MIN
Detector Logic
PASS/FAIL*
Voltage Monitor
DUT GTL
DISABLE
I/V MONITOR
Revision 6 / February 20, 2007
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E737
TEST AND MEASUREMENT PRODUCTS
Pin Description
Pin Name
Pin #
VINP
20
IVIN
21
Analog voltage input which forces the output current at FORCE (FI/MV
mode).
FORCE
3
Analog output pin which forces current or voltage.
SENSE
2
Analog input pin which senses voltage (typically connected to
FORCE).
MODE SEL
10
Digital input which determines whether the PMU is forcing voltage or
forcing current.
RS1, RS2
9, 11
I/V MIN
I/V MAX
24
31
Analog input voltages which establish the lower and upper threshold
level for the measurement comparator.
DUT LTH
DUT GTL
32
26
Digital comparator open drain outputs that indicate the DUT
measurement is less than the upper threshold and greater than the
lower threshold.
PASS/FAIL*
25
Digital output that indicates whether or not the monitored voltage is
between the comparator thresholds. Logic1 corresponds to a
measurement that is between comparator thresholds.
DISABLE
18
Digital input which places the digital comparator outputs a I/V
MONITOR in high impedance.
HiZ
8
Digital input which places the FORCE output into high impedance.
RA, RB
RC, RD
5,16
19,22
I/V MONITOR
12
Analog voltage output that provides a real time monitor of either the
measured voltage or measured current level.
COMP1
COMP2
15
14
External compensation pins that require an external capacitor
connected between the two pins.
VCC
27
Positive analog power supply.
VEE
13, 30
Negative analog power supply.
CA
CB
1
23
External compensation pins that require an external capacitor
connected between the two pins.
CAPI
7
External compensation pin that requires an external capacitor
connected to ground.
GND
4
Ground.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
Description
Analog voltage input which forces the output voltage at FORCE (FV/MI
mode).
Digital inputs which select one of the four current ranges.
External resistors corresponding to ranges A through D.
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E737
TEST AND MEASUREMENT PRODUCTS
Pin Description (continued)
32 Pin LQFP
(7 mm x 7 mm x 1.4 mm)
(Top View)
25
1
17
9
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Circuit Description
Circuit Overview
Comparator Outputs
The E737 is a parametric test and measurement unit
that can :
• Force Voltage / Measure Current
• Force Current / Measure Voltage.
The comparator outputs DUT GTL, DUT LTH, and
PASS/FAIL* are open drain outputs. When active (logical 0), they will pull to ground. When disabled (logical
1 or DISABLE = 1), they require an external pull up
resistor to a positive voltage to achieve a high state.
The E737 can force or measure voltage over a -5V to
+7V range, and force or measure current over four distinct ranges:
• ± 40 mA
• ± 1 mA
• ± 100 µA
• ± 10 µA.
An on board window comparator provides three-bit
measurement range classification. Also, a monitor
passes a real time analog signal which tracks either
the DUT’s current or voltage performance.
Control Inputs
MODE SEL is a digital input which determines whether
the PMU forces voltage or current, when it is not placed
in a high impedance state by the HIZ input (see Table
1).
HiZ
Mode SEL
PMU Operation
1
X
High Impedance
0
0
FV/MI
0
1
FI/MV
Table 1.
RS1 and RS2 are digital inputs to an analog MUX
which establishes the full scale current range of the
PMU. One of four current ranges can be selected by
using RS1 and RS2 as shown in Table 2.
Rext Nom
RS1
RS2
RA = 200KW
0
0
A: ±10μA
RB = 20KW
0
1
B: ±100μA
RC = 2KW
1
1
C: ±1mA
RD = 50W
1
0
D: ±40mA
Force / Sense
FORCE is an analog output which either forces a current or forces a voltage, depending on which operating
mode is selected.
The SENSE pin is a high impedance analog input
which measures the DUT voltage input in the FI / MV
operating mode.
FORCE and SENSE are brought out to separate pins
to allow for remote sensing.
I/V MONITOR
I/V MONITOR is a real time analog output which tracks
the sensed parameter. I/V MONITOR functionality is
described in Table 3.
Disable
Mode SEL
I/V Monitor
1
X
High Impedance
0
0
Measured Current
0
1
Measured Voltage
Table 3.
In the FI / MV mode, the output voltage is a 1:1 mapping of the DUT voltage. In the FV / MI mode, I/V
MONITOR follows the equation:
I(measured) = I/V MONITOR / (4.0 * REXT).
Current Range
Using nominal values for the external resistors, I/V
MONITOR of +8.0V corresponds to Imax and –8.0V
corresponds to Imin of the selected current range.
Table 2.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
HIZ
HIZ is a digital input which places the FORCE output
into a high impedance state, regardless of the operating mode (forcing current or voltage.) This function allows the PMU to be connected directly to the pin electronics without an isolation relay while NOT adding any
leakage current.
The voltage at I/V MONITOR follows the equation:
I(measured) = I/V MONITOR / (4.0 * REXT).
DISABLE
Force Current / Measure Voltage Mode
DISABLE is a digital input which places DUT LTH, DUT
GTL, I/V MONITOR, and PASS/FAIL* into high impedance states.
In the FI / MV mode, IVIN is a high input impedance,
analog voltage input that is converted into a current
(see Table 5) using the following relationship:
Nominally, the external resistors (RA, RB, RC, and RD)
should be chosen such that Imax * REXT = 2.0V.
Force Voltage / Measure Current Mode
In the FV / MI mode, VINP is a high input impedance,
analog voltage input that maps directly to the voltage
forced at the DUT (see Figure 1), where FORCE =
VINP.
A current monitor is connected in series with the Op
Amp driving the FORCE voltage. This monitor generates a voltage that is proportional to the current passing through it, and its output is brought out to I/V MONITOR. The monitor’s voltage may also be evaluated
using the Window Comparator whose operation is in
accordance with the FV/MI functional truth table (Table
6).
I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for
the window comparator (see Table 4). In the FV / MI
mode, a maximum voltage input corresponds to at least
a maximum current output. Positive current is defined
as current flowing out of the PMU.
I/V MAX
I/V MIN
Comparator Threshold
+8.0V
> Imax (full scale)
0V
0
-8.0V
< Imin (full scale)
FORCE = IVIN / (4.0 * REXT)
where positive current is defined as current flowing out
of the PMU.
IVIN
Forced Current
+8.0V
Imax (full scale)
0V
0
-8.0V
Imin (full scale)
Table 5.
The resulting DUT voltage is then tested via the SENSE
input by a window comparator, whose functional truth
table is shown in Table 7.
I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for
the window comparator. In the FI / MV mode, the reference inputs translate 1:1 to SENSE level thresholds.
Table 4.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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© 2007 Semtech Corp. / Rev. 6, 2/20/07
SENSE
IVIN
VINP
5KW
15KW
FV*
FV*
FV
–
CB
FV
FV*
A*
B*
C*
D*
D
A
B
C
D
D*
Cext
CAPI: Input noise filter capacitor (low pass)
Cext
CB, CA: Current sense resistor compensation
Cext
COMP1, COMP2: Force amplifier compensation
COMP1
DRIVER
+
HiZ
Cext
COMP2
CAPI
Cext
FV ⇒ FV/FI* = 1
FV* ⇒ FV/FI* = 0
FV* FV
40KW
40KW
FV
FV* FV
Cext
C
C*
B
B*
A
A*
RA
RB
RC
RD
CA
INST.
+
–
FV
Edge737 Functional Schematic
FV*
5 KW
15 KW
4X
–
+
IV_MIN
IV_MAX
FV*
FV
+
–
+
–
–
+
DISABLE
1
1
1
1
0
0
0
0
70 W typ.
DUT_GTL
PASS/FAIL*
DUT_LTH
I/V MONITOR
FORCE
E737
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Figure 1. E737 Functional Schematic
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E737
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
TEST CONDITION
DISABLE
DUT LTH
DUT GTL
I/V MONITOR
PASS/FAIL*
X
1
HiZ
HiZ
HiZ
I/V MONITOR > I/V MAX
I/V MONITOR < I/V MAX
0
0
0
1
N/A
N/A
I/V MONITOR = Iout * 4.0 * REXT
I/V MONITOR = Iout * 4.0 * REXT
0
N/A
I/V MONITOR > I/V MAX
I/V MONITOR < I/V MAX
0
0
N/A
N/A
1
0
I/V MONITOR = Iout * 4.0 * REXT
I/V MONITOR = Iout * 4.0 * REXT
N/A
0
I/V MONITOR < I/V MAX
and
I/V MONITOR > I/V MAX
0
1
1
I/V MONITOR = Iout * 4.0 * REXT
1
Table 6. FV / MI Truth Table
TEST CONDITION
DISABLE
DUT LTH
DUT GTL
I/V MONITOR
PASS/FAIL*
X
1
HiZ
HiZ
HiZ
SENSE > I/V MAX
SENSE < I/V MAX
0
0
0
1
N/A
N/A
I/V MONITOR = SENSE
I/V MONITOR = SENSE
0
N/A
SENSE > I/V MIN
SENSE < I/V MIN
0
0
N/A
N/A
1
0
I/V MONITOR = SENSE
I/V MONITOR = SENSE
N/A
0
DUT < I/V MAX
and
DUT > I/V MAX
0
1
1
I/V MONITOR = SENSE
1
Table 7. FI / MV Truth Table
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
REXT Selection
VOS@IVMON
The E737 is designed for the voltage drop across RA,
RB, RC, and RD to be ≤2V with the maximum current
passing through them. However, these resistor values
can be changed to support different applications.
Increasing the maximum current beyond the nominal
range is not recommended. However, decreasing the
maximum current is allowed.
CM Linearity
CM Error = Slope
VCM@FORCE
–5V
7V
Short Circuit Protection
The E737 is designed to survive a direct short circuit to
any voltage within the supply rails at the FORCE and
SENSE pins.
Transient Clamps
The E737 has on-board clamps to limit the voltage and
current spikes that might result from either changing
the current range or changing the operating mode.
Common Mode Error/Calibration
In order to attain a high degree of accuracy in a typical
ATE application, offset and gain errors are accounted
for through software calibration. When forcing or measuring a current with the E737, an additional source of
error, common mode error, should be accounted for.
Common mode error is a measure of how the common
mode voltage, VCM, at the input of the current sense
amplifier affects the forced or measured current values
(see Figure 2). Since this error is created by internal
resistors in the current sense amplifier, it is very linear
in nature.
Using the common mode error and common mode
linearity specifications, one can see that with a small
number of calibration steps (see Applications note
PMU-A1), the effect of this error can be significantly
reduced.
Figure 2. Graphical Representation of
Common Mode Error
Compensation Capacitors
COMP1 and COMP2 are internal op amp compensation pins that require a 120 pF capacitor connected between the two pins.
CAPI is an external noise compensation pin that can
be used as a low pass filter to eliminate noise from the
IVIN and VINP input pins through the connection of an
external capacitor from CAPI to GND. The relationship between the roll-off frequency of noise filtered (in
Hz) to the external capacitance (in farads) can be seen
below:
1
Filter Frequency =
80,000 π X CCAPI
CA and CB are internal compensation pins that require
a 120 pF capacitor connected between them.
Power Supply Sequencing
In order to help protect the E737 from a latch-up condition, it is important that VCC All Input Voltages ≥ VEE,
and VCC ≥ GND ≥ VEE at all times.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Application Information
FORCE Pin Output Voltage (Positive Headroom
Requirement)
The maximum positive voltage that can be forced at the
FORCE pin by the Edge 737 in the force voltage/measure current (FV/MI) mode and the maximum compliance voltage that can appear at the FORCE pin in the
force current/measure voltage mode (FI/MV) is a function of the positive power supply (VCC), device case
temperature (Tc), and selected current range. The plot
in Figure 3 depicts the typical positive voltage that can
appear at the FORCE pin for various power supply
combinations across the specified case temperature
range of the device. All plots represent the Edge 737
being used with a ± 2V full-scale swing across the external current sense resistors for each range.
E737 FORCE Voltage Positive Headroom
8.6
VCC = 13V, VEE = -9.5V, Ranges A, B, C
VCC = 13V, VEE = -9.5V, Range D
8.4
8.2
VFORCE (V)
8.0
7.8
VCC = 12V, VEE = 10V, Ranges A, B, C
7.6
VCC = 12V, VEE = 10V, Range D
7.4
VCC = 11.5V, VEE = -9.5V, Ranges A, B, C
7.2
7.0
VCC = 11.5V, VEE = -9.5V, Range D
6.8
6.6
25
30
35
40
45
50
55
60
65
70
75
TEMPERATURE (C)
Figure 3. Typical E737 FORCE Pin Voltage vs. Case Temperature
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Application Information (continued)
Required External Components
Choose Rext such that:
Iout (low) = V+ / RPU < 1mA, V+ < VCC
120pF
V+
120pF *
COMP1
RPU
RPU
COMP2
Typical Values
CAPI
200KW
RPU
RA
DUT LTH
20KW
RB
DUT GTL
2KW
RC
PASS/FAIL*
50W
RD
FORCE
CA
120pF
CB
VCC
VEE
.1µF
.1µF
VCC
VEE
* Optional (see Compensation Capacitors Section)
Actual decoupling capacitor values depend
on the actual system environment.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Package Information
32 Pin LQFP Package
7 mm x 7 mm x 1.4 mm
DIMENSIONS
INCHES
DIM.
D
MIN
NOM
MAX
MIN
NOM
MAX
A
.055
-
.063
1.40
-
1.60
A1
.002
-
.006
0.05
-
0.15
A2
.053
.055
.057
1.35
1.40
1.45
b
.012
-
.018
0.30
-
0.45
c
.004
-
.008
0.09
-
0.20
.280
6.90
D
.354 BSC
D1
D/2
.272
E
D
.272
e
A
E
B
N
aaa C A-B D
4X N/4 TIPS
1
e
9.00 BSC
.276
.018
.024
7.00
7.10
9.00 BSC
.280
6.90
.031 BSC
L
E1
.276
.354 BSC
E1
E/2
MILLIMETERS
7.00
7.10
0.80 BSC
.030
0.45
0.60
L1
(.039)
(1.00)
N
32
32
q
0-7°
0-7°
aaa
.008
0.20
bbb
.003
0.08
ccc
.003
0.08
0.75
e/2
SEE DETAIL A
D1
H
ccc C
A A2
SEATING
PLANE
A1
bbb
bxN
C A-B D
c
GAGE
PLANE
C
L
0.25
0
(L1)
DETAIL A
NOTES:
1. CONTROLLING DIMENSIONS ARE IN MILLIMETERS (ANGLES IN DEGREES).
2. DATUMS -A- , -B- AND -C- TO BE DETERMINED AT DATUM PLANE -H- .
3. DIMENSIONS "E1" AND "D1" DO NOT INCLUDE MOLD FLASH, PROTRUSIONS
OR GATE BURRS.
4. REFERENCE JEDEC MS-026, VARIATION BBA.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Absolute Maximum Ratings
Parameter
Symbol
Min
Positive Power Supply
VCC
Negative Power Supply
Total Power Supply
Max
Units
0
14
V
VEE
-13
0
V
VCC – VEE
0
23
V
-0.5
7
V
Digital Inputs
Typ
Storage Temperature
TS
-55
150
°C
Junction Temperature
TJ
-65
150
°C
260
°C
Soldering Temperature
Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at these or any other conditions above those listed
in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions
for an extended period may affect device reliability.
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Positive Analog Power Supply (Relative to GND)
VCC
11.5
12
13
V
Negative Analog Power Supply (Relative to GND)
VEE
-11
-10
-9.5
V
VCC – VEE
21
22
22.5
V
Case Temperature
TC
25
75
°C
Junction Temperature
TJ
125
°C
Total Analog Power Supply
θJC
Thermal Resistance of Package (Junction to Case)
14.1
°C/W
Production tested @ +12V, –10V for linearity and min/max parametric testing.
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
DC Characteristics
Description
Symbol
Min
Typ
Max
Units
ICC
IEE
ICCB
∆ICC
IEEB
∆IEE
3
-11
3
0
-55
-3
5
-5
11
-3
11
3
-42
0
mA
mA
mA
mA
mA
mA
Power Supplies
Power Supply Consumption
Positive Supply (no-load)
Negative Supply (no-load)
Positive Supply Breakdown (Note 1)
Positive Supply Rejection (Note 1)
Negative Supply Breakdown (Note 1)
Negative Supply Rejection (Note 1)
Power Supply Rejection Ratio (Note 2)
VCC/VEE to FORCE
0.1 kHz
1.0 kHz
10 kHz
100 kHz
PSRR
VCC/VEE to I/V MONITOR
0.1 kHz
1.0 kHz
10 kHz
100 kHz (MI Mode)
100 kHz (MV Mode)
65
60
50
20
dB
dB
dB
dB
65
60
50
1.5
15
dB
dB
dB
dB
dB
Force Voltage/Measure Current Mode
Input Voltage Range @ VINP
VINP
VEE + 4
VCC - 4
V
Input Bias Current @ VINP
IBIAS
-0.4
0.4
A
Capacitive Loading Range @ FORCE for Stability
CFORCE
0
12
nA
Output Forcing Voltage Range
VFORCE
VEE + 4.5
VCC - 5.0
V
VOS
FV INL
FV Gain
-100
-0.025
-0.985
100
0.025
1.015
mV
% FSVR
V/V
ILEAK
-20
20
nA
-10
-100
-1
-40
10
100
1
40
A
A
mA
mA
-400
-0.122
3.94
-10
-10.5
400
0.122
4.06
10
10.5
mV
% FSCR
V/V
mV/V
mV
150
nA
12
nF
Forcing Voltage Accuracy (@ FORCE)
Offset (VINP = 0V, no load)
Linearity
Gain
FORCE/SENSE Combined Leakage Current in
HiZ Mode
Compliance Current Measurement Range
Range A
Range B
Range C
Range D
Current Measurement Accuracy (@ I/V MONITOR)
Offset
Linearity (Note 3)
Gain (Note 4)
Common Mode Error
Common Mode Linearity
I/V MONITOR Output Leakage Current in
Disable Mode
Capacitive Loading Range @ I/V MONITOR
© 2007 Semtech Corp. / Rev. 6, 2/20/07
VOS
MI INL
MI Gain
CM Error
∆CM Error
ILEAK
CI/V MONITOR
13
-150
1
4
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E737
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Description
Symbol
Min
Input Voltage Range @ IVIN
Input Bias Current @ IVIN
Capacitive Loading Range @ FORCE for Stability
IVIN
IBIAS
CFORCE
Output Forcing Current
IFORCE
Typ
Max
Units
-9.0
-0.4
+9.0
0.4
12
V
A
nF
-10
-100
-1
-40
10
100
1
40
A
A
mA
mA
4
0.26
0.35
0.075
0.1
% FSCR
V/V
% FSCR
% FSCR/V
% FSCR
Force Current/Measure Voltage Mode
Range A
Range B
Range C
Range D
Forcing Current Accuracy (@ FORCE)
Offset
Gain (Note 5)
Linearity @ FORCE = -5V to 7V
Common Mode Error
Common Mode Linearity
IOS
FI Gain
FI INL
ICM Error
∆CM Error
-4
0.24
-0.35
-0.075
-0.1
ILEAK
-20
20
nA
VCOMPLIANCE
VEE + 4.5
VCC - 5.0
V
VOS
MV Gain
MV INL
-100
0.985
-0.025
100
1.015
0.025
mV
V/V
% FSVR
ILEAK
-150
150
nA
12
nF
FORCE/SENSE Combined Leakage Current in
HiZ Mode
Compliance Voltage Range
Voltage Measurement Accuracy (@ I/V MONITOR)
Offset
Gain
Linearity (Note 3)
I/V MONITOR Output Leakage Current in Disable Mode
Capacitive Loading Range @ I/V MONITOR
CI/V MONITOR
0.25
1
Comparator
Input Voltage Range (I/V MIN, I/V MAX)
VIN
VEE + 1
VCC - 3
V
Input Offset Voltage
VOS
-100
100
mV
IIN
-0.4
0.4
A
400
mV
Input Bias Current (I/V MIN, I/V MAX)
Output Low Level @ IOL = 1mA (DUT LTH, DUT GTL,
PASS/FAIL*)
VOL
Output Leakage in DISABLED Mode
IOH
-1
1
A
Output Leakage in DISABLED Mode
ILEAK
-0.2
0.2
A
IIN
-0.2
0.2
A
DISABLE Input Bias Current
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Description
Symbol
Min
Input High Level
VIH
2.4
Input Low Level
VIL
Input Bias Current
IIN
-0.2
Other Digital Inputs
Input High Level (MODE SEL, HiZ)
VIH
2.4
Input Low Level (MODE SEL, HiZ)
VIL
MODE SEL Input Bias Current
IIN
HiZ Input Bias Current
IIN
Typ
Max
Units
Analog MUX (RS1, RS2)
V
0.8
V
0.2
A
V
0.8
V
-0.2
0.2
A
-1
50
A
DC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF,
TA = 25°C unless otherwise noted.
Note 1:
Note 2:
Note 3:
Note 4:
Test Conditions are as follows: VCC = 12 to 13V, VEE = –10V, 40 mA is externally forced into
FORCE pin.
Guaranteed by design and characterization. Not production tested.
Characterized with a ±10 µA current load at I/V MONITOR.
V/V units derived as follows:
VIVMON
MI Gain = (I
x REXT)
MEASURED
Note 5:
V/V units derived as follows:
IFORCE x REXT
FI Gain =
VIVIN
Unit Definitions:
FSCR = Full Scale Current Range
Range A, FSCR = 20 µA
Range B, FSCR = 200 µA
Range C, FSCR = 2 mA
Range D, FSCR = 80 mA
FSVR = Full Scale Voltage Range = 12V nominal (–5V to 7V)
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Description
Symbol
Min
Typ
Max
Units
To 0.1% of 10V Step
Range A
Ranges B, C, D
150
120
s
s
To 0.025% of 10V Step
All Ranges
300
s
35
s
To 0.1% of FSCR
Range A
Ranges B, C, D
400
125
s
s
To 0.025% of FSCR
Range A
Ranges B, C, D
1.5
300
ms
s
Force Voltage/Measure Current Mode
FORCE Voltage Settling Time
(100pF load @ FORCE)
tsettle
FORCE Amp Saturation Recovery Time
Tsat
Measure Current Settling Time
(100pF load @ I/V MONITOR)
tsettle
Disable Time, HiZ Low to High
tZ
1
s
Enable Time, HiZ High to Low
toe
450
ns
700
250
s
s
2
300
ms
s
35
s
To 0.1% of 10V Step
Range A
Ranges B, C, D
700
250
s
s
To 0.025% of 10V Step
Range A
Ranges B, C, D
2
350
ms
s
Force Current/Measure Voltage Mode
FORCE Output Current Settling Time
(100pF load @ FORCE)
To 0.1% of FSCR
Range A
Ranges B, C, D
tsettle
To 0.025% of FSCR
Range A
Ranges B, C, D
FORCE Amp Saturation Recovery Time
Tsat
Measure Voltage Settling Time
(100pF load @ I/V MONITOR)
tsettle
Disable Time, HiZ Low to High
tZ
1
s
Enable Time, HiZ High to Low
toe
0.45
s
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
AC Characteristics
Description
Symbol
Min
Typ
Max
Units
tpd
30
s
Disable Time, DISABLE Low to High
tZ
300
ns
Enable Time, DISABLE High to Low
toe
5.5
s
Comparator
Propagation Delay
s
I/V MONITOR
Disable Time, DISABLE Low to High
tZ
350
ns
Enable Time, DISABLE High to Low
toe
40
s
MODE SEL Propagation Delay
tpd
10
s
RS0/RS1 Propagation Delay
tpd
1
s
I/V MONITOR
AC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF,
TA = 25°C unless otherwise noted.
Settling times guaranteed by design and characterization (not production tested).
© 2007 Semtech Corp. / Rev. 6, 2/20/07
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E737
TEST AND MEASUREMENT PRODUCTS
Ordering Information
Model Number
Package
E737ATF
32-Pin LQFP
7mm x 7mm
E737ATFT
32-Pin LQFP
7mm x 7mm
Lead Free
EVM737ATF
E737H Evaluation Module
This device is ESD sensitive. Care should be taken when handling
and installing this device to avoid damaging it.
Contact Information
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
© 2007 Semtech Corp. / Rev. 6, 2/20/07
18
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