IRF AUIRF1324S-7P Hexfet power mosfet Datasheet

PD - 96296
AUTOMOTIVE GRADE
AUIRF1324S-7P
HEXFET® Power MOSFET
Features
l
l
l
l
l
l
l
Advanced Process Technology
Ultra Low On-Resistance
175°C Operating Temperature
Fast Switching
Repetitive Avalanche Allowed up to Tjmax
Lead-Free, RoHS Compliant
Automotive Qualified *
V(BR)DSS
D
24V
RDS(on) typ.
G
0.8mΩ
max.
S
S (Pin 2, 3, 5, 6, 7)
G (Pin 1)
1.0mΩ
ID (Silicon Limited)
429A c
ID (Package Limited)
240A
Description
Specifically designed for Automotive applications, this
HEXFET® Power MOSFET utilizes the latest processing
techniques to achieve extremely low on-resistance per
silicon area. Additional features of this design are a
175°C junction operating temperature, fast switching
speed and improved repetitive avalanche rating . These
features combine to make this design an extremely
efficient and reliable device for use in Automotive
applications and a wide variety of other applications.
Absolute Maximum Ratings
D
S
G
S
S
S
S
D 2Pak 7 Pin
G
D
S
Gate
Drain
Source
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only; and functional operation of the device at these or any other condition beyond those
indicated in the specifications is not implied.Exposure to absolute-maximum-rated conditions for extended
periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under
board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified.
Parameter
ID @ TC = 25°C
ID @ TC = 100°C
ID @ TC = 25°C
IDM
PD @TC = 25°C
VGS
EAS (Thermally limited)
IAR
EAR
dv/dt
TJ
TSTG
Max.
Continuous Drain Current, VGS @ 10V (Silicon Limited)
Continuous Drain Current, VGS @ 10V (Silicon Limited)
Continuous Drain Current, VGS @ 10V (Package Limited)
d
Pulsed Drain Current
Maximum Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
d
f
e
d
Units
c
c
429
303
240
1640
300
2.0
± 20
230
See Fig. 14, 15, 22a, 22b,
1.6
-55 to + 175
Peak Diode Recovery
Operating Junction and
Storage Temperature Range
Soldering Temperature, for 10 seconds
A
W
W/°C
V
mJ
A
mJ
V/ns
°C
300 (1.6mm from case)
Thermal Resistance
Parameter
RθJC
RθJA
Junction-to-Case
k
Junction-to-Ambient (PCB Mount) , D2Pak
j
Typ.
Max.
Units
–––
–––
0.50
40
°C/W
HEXFET® is a registered trademark of International Rectifier.
*Qualification standards can be found at http://www.irf.com/
www.irf.com
1
03/25/10
AUIRF1324S-7P
Static Characteristics @ TJ = 25°C (unless otherwise stated)
Parameter
V(BR)DSS
∆V(BR)DSS/∆TJ
RDS(on)
VGS(th)
gfs
RG
IDSS
Drain-to-Source Breakdown Voltage
Breakdown Voltage Temp. Coefficient
Static Drain-to-Source On-Resistance
Gate Threshold Voltage
Forward Transconductance
Internal Gate Resistance
Drain-to-Source Leakage Current
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Min. Typ. Max. Units
24
–––
–––
2.0
270
–––
–––
–––
–––
–––
––– –––
0.023 –––
0.80 1.0
–––
4.0
––– –––
3.0
–––
–––
20
––– 250
––– 200
––– -200
Conditions
V VGS = 0V, ID = 250µA
V/°C Reference to 25°C, ID = 5mA
mΩ VGS = 10V, ID = 160A
V VDS = VGS, ID = 250µA
S VDS = 50V, ID = 160A
Ω
VDS = 24V, VGS = 0V
µA
VDS = 19V, VGS = 0V, TJ = 125°C
VGS = 20V
nA
VGS = -20V
g
g
Dynamic Characteristics @ TJ = 25°C (unless otherwise stated)
Parameter
Qg
Qgs
Qgd
Qsync
td(on)
tr
td(off)
tf
Ciss
Coss
Crss
Coss eff. (ER)
Coss eff. (TR)
Min. Typ. Max. Units
Total Gate Charge
Gate-to-Source Charge
Gate-to-Drain ("Miller") Charge
Total Gate Charge Sync. (Qg - Qgd)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
Effective Output Capacitance (Energy Related) –––
–––
Effective Output Capacitance (Time Related)
180
47
58
122
19
240
86
93
7700
3380
1930
4780
4970
252
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
–––
nC
ns
Conditions
ID = 75A
VDS =12V
VGS = 10V
ID = 75A, VDS =0V, VGS = 10V
VDD = 16V
ID = 160A
RG =2.7Ω
VGS = 10V
VGS = 0V
VDS = 19V
ƒ = 1.0MHz, See Fig.5
VGS = 0V, VDS = 0V to 19V , See Fig.11
VGS = 0V, VDS = 0V to 19V
g
g
g
pF
i
h
Diode Characteristics
Parameter
IS
VSD
trr
Continuous Source Current
(Body Diode)
Pulsed Source Current
(Body Diode)
Diode Forward Voltage
Reverse Recovery Time
Qrr
Reverse Recovery Charge
IRRM
ton
Reverse Recovery Current
Forward Turn-On Time
ISM
d
Min. Typ. Max. Units
–––
––– 429
–––
–––
c
1636
A
Conditions
MOSFET symbol
showing the
integral reverse
D
G
p-n junction diode.
––– –––
1.3
V TJ = 25°C, IS = 160A, VGS = 0V
VR = 20V,
TJ = 25°C
–––
71
107
ns
IF = 160A
TJ = 125°C
–––
74
110
di/dt = 100A/µs
TJ = 25°C
–––
83
120
nC
TJ = 125°C
–––
92
140
–––
2.0
–––
A TJ = 25°C
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
g
S
g
Notes:
 Calculated continuous current based on maximum allowable junction „ ISD ≤ 160A, di/dt ≤ 600A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C.
temperature. Package limitation current is 240A. Note that current
Pulse width ≤ 400µs; duty cycle ≤ 2%.
limitations arising from heating of the device leads may occur with
† Coss eff. (TR) is a fixed capacitance that gives the same charging time
some lead mounting arrangements.(Refer to AN-1140
as Coss while VDS is rising from 0 to 80% VDSS .
‡ Coss eff. (ER) is a fixed capacitance that gives the same energy as
http://www.irf.com/technical-info/appnotes/an-1140.pdf
Coss while VDS is rising from 0 to 80% VDSS.
‚ Repetitive rating; pulse width limited by max. junction
ˆ When mounted on 1" square PCB (FR-4 or G-10 Material). For recom
temperature.
mended footprint and soldering techniques refer to application note #AN-994.
ƒ Limited by TJmax, starting TJ = 25°C, L = 0.018mH
‰
Rθ is measured at T J approximately 90°C
RG = 25Ω, IAS = 160A, VGS =10V. Part not recommended for use
above this value.
2
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AUIRF1324S-7P
Qualification Information†
Automotive
(per AEC-Q101)
Qualification Level
Moisture Sensitivity Level
Machine Model
††
Comments: This part number(s) passed Automotive
qualification. IR’s Industrial and Consumer qualification
level is granted by extension of the higher Automotive
level.
D2 PAK 7 Pin
MSL1
Class M4
AEC-Q101-002
ESD
Human Body Model
Class H3A
AEC-Q101-001
Charged Device Model
Class C5
AEC-Q101-005
RoHS Compliant
†
Yes
Qualification standards can be found at International Rectifier’s web site: http//www.irf.com/
†† Exceptions to AEC-Q101 requirements are noted in the qualification report.
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3
AUIRF1324S-7P
1000
1000
VGS
15V
10V
8.0V
6.0V
5.5V
5.0V
4.8V
4.5V
BOTTOM
TOP
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
TOP
100
BOTTOM
100
4.5V
10
0.1
≤60µs PULSE WIDTH
Tj = 175°C
≤60µs PULSE WIDTH
Tj = 25°C
1
10
4.5V
10
100
0.1
V DS, Drain-to-Source Voltage (V)
100
1.8
100
RDS(on) , Drain-to-Source On Resistance
(Normalized)
ID, Drain-to-Source Current (A)
10
Fig 2. Typical Output Characteristics
1000
T J = 175°C
10
TJ = 25°C
1
VDS = 15V
≤60µs PULSE WIDTH
0.1
ID = 160A
VGS = 10V
1.6
1.4
1.2
1.0
0.8
0.6
2
3
4
5
6
7
8
9
-60 -40 -20 0 20 40 60 80 100120140160180
T J , Junction Temperature (°C)
VGS, Gate-to-Source Voltage (V)
Fig 4. Normalized On-Resistance vs. Temperature
Fig 3. Typical Transfer Characteristics
100000
12.0
VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
C rss = C gd
VGS, Gate-to-Source Voltage (V)
ID= 75A
C oss = C ds + C gd
C, Capacitance (pF)
1
V DS, Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Ciss
Coss
10000
Crss
1000
10.0
VDS= 19V
VDS= 12V
8.0
6.0
4.0
2.0
0.0
1
10
100
VDS, Drain-to-Source Voltage (V)
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage
4
VGS
15V
10V
8.0V
6.0V
5.5V
5.0V
4.8V
4.5V
0
50
100
150
200
QG, Total Gate Charge (nC)
Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage
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AUIRF1324S-7P
10000
ID, Drain-to-Source Current (A)
ISD, Reverse Drain Current (A)
1000
T J = 175°C
OPERATION IN THIS AREA
LIMITED BY R DS(on)
1000
100
1msec
100
T J = 25°C
10
10msec
10
Tc = 25°C
Tj = 175°C
Single Pulse
VGS = 0V
1.0
0.5
1.0
1.5
2.0
2.5
0
VSD, Source-to-Drain Voltage (V)
300
250
200
150
100
50
0
50
75
100
125
150
175
V(BR)DSS , Drain-to-Source Breakdown Voltage (V)
Limited By Package
350
25
10
100
Fig 8. Maximum Safe Operating Area
450
400
1
VDS, Drain-to-Source Voltage (V)
Fig 7. Typical Source-Drain Diode
Forward Voltage
ID, Drain Current (A)
DC
1
0.0
32
Id = 5mA
31
30
29
28
27
26
25
24
-60 -40 -20 0 20 40 60 80 100120140160180
T J , Temperature ( °C )
T C , Case Temperature (°C)
Fig 10. Drain-to-Source Breakdown Voltage
Fig 9. Maximum Drain Current vs.
Case Temperature
1000
EAS , Single Pulse Avalanche Energy (mJ)
1.4
1.2
1.0
Energy (µJ)
100µsec
0.8
0.6
0.4
0.2
ID
TOP
45A
80A
BOTTOM 160A
900
800
700
600
500
400
300
200
100
0
0.0
-5
0
5
10
15
20
VDS, Drain-to-Source Voltage (V)
Fig 11. Typical COSS Stored Energy
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25
25
50
75
100
125
150
175
Starting T J , Junction Temperature (°C)
Fig 12. Maximum Avalanche Energy vs. DrainCurrent
5
AUIRF1324S-7P
Thermal Response ( Z thJC ) °C/W
1
D = 0.50
0.1
0.20
0.10
0.05
τJ
0.02
0.01
0.01
R1
R1
τJ
τ1
R2
R2
R3
R3
τC
τ
τ2
τ1
τ2
τ3
τ3
τ4
τ4
Ci= τi/Ri
Ci i/Ri
1E-005
τi (sec)
0.02070
0.000010
0.08624
0.000070
0.24491
0.001406
0.15005
0.009080
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
SINGLE PULSE
( THERMAL RESPONSE )
0.001
1E-006
Ri (°C/W)
R4
R4
0.0001
0.001
0.01
0.1
t1 , Rectangular Pulse Duration (sec)
Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case
1000
Avalanche Current (A)
Duty Cycle = Single Pulse
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆ Tj = 150°C and
Tstart =25°C (Single Pulse)
0.01
100
0.05
0.10
10
Allowed avalanche Current vs avalanche
pulsewidth, tav, assuming ∆Τ j = 25°C and
Tstart = 150°C.
1
1.0E-06
1.0E-05
1.0E-04
1.0E-03
1.0E-02
1.0E-01
tav (sec)
Fig 14. Typical Avalanche Current vs.Pulsewidth
6
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AUIRF1324S-7P
EAR , Avalanche Energy (mJ)
250
Notes on Repetitive Avalanche Curves , Figures 14, 15:
(For further info, see AN-1005 at www.irf.com)
1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at a temperature far in
excess of Tjmax. This is validated for every part type.
2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.
3. Equation below based on circuit and waveforms shown in Figure 22a, 22b.
4. PD (ave) = Average power dissipation per single avalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase
during avalanche).
6. Iav = Allowable avalanche current.
7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as
25°C in Figure 14, 15).
tav = Average time in avalanche.
D = Duty cycle in avalanche = tav ·f
ZthJC(D, tav ) = Transient thermal resistance, see Figures 13)
TOP
Single Pulse
BOTTOM 1.0% Duty Cycle
ID = 160A
200
150
100
50
0
25
50
75
100
125
150
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC
Iav = 2DT/ [1.3·BV·Zth]
EAS (AR) = PD (ave)·tav
175
Starting T J , Junction Temperature (°C)
Fig 15. Maximum Avalanche Energy vs. Temperature
VGS(th) , Gate threshold Voltage (V)
4.5
4.0
3.5
3.0
2.5
ID = 250µA
ID = 1.0mA
ID = 1.0A
2.0
1.5
1.0
-75 -50 -25 0
25 50 75 100 125 150 175 200
T J , Temperature ( °C )
Fig 16. Threshold Voltage Vs. Temperature
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7
AUIRF1324S-7P
Driver Gate Drive
D.U.T
ƒ
-
‚
-
-
„
*
D.U.T. ISD Waveform
Reverse
Recovery
Current
+

RG
•
•
•
•
dv/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
VDD
P.W.
Period
VGS=10V
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
+
D=
Period
P.W.
+
+
-
Body Diode Forward
Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
Re-Applied
Voltage
Body Diode
VDD
Forward Drop
Inductor
Current
Inductor Curent
ISD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
V(BR)DSS
tp
15V
DRIVER
L
VDS
D.U.T
RG
+
V
- DD
IAS
20V
A
0.01Ω
tp
I AS
Fig 22a. Unclamped Inductive Test Circuit
LD
Fig 22b. Unclamped Inductive Waveforms
VGS
VDS
90%
+
VDD D.U.T
10%
VGS
VDS
Second Pulse Width < 1µs
Duty Factor < 0.1%
td(off)
Fig 23a. Switching Time Test Circuit
tf
td(on)
tr
Fig 23b. Switching Time Waveforms
Id
Vds
Vgs
L
DUT
0
1K
20K
VCC
Vgs(th)
S
Qgodr
8
Fig 24a. Gate Charge Test Circuit
Qgd
Qgs2 Qgs1
Fig 24b. Gate Charge Waveform
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AUIRF1324S-7P
D2Pak - 7 Pin Package Outline
Dimensions are shown in millimeters (inches)
D2Pak - 7 Pin Part Marking Information
Part Number
AUIRF1324S-7
YWWA
IR Logo
XX
or
Date Code
Y= Year
WW= Work Week
A= Automotive, Lead Free
XX
Lot Code
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
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9
AUIRF1324S-7P
D2Pak - 7 Pin Tape and Reel
10
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AUIRF1324S-7P
Ordering Information
Base part number
AUIRF1324S-7P
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Package Type
D2Pak
Standard Pack
Form
Tube
Tape and Reel Left
Tape and Reel Right
Complete Part Number
Quantity
50
800
800
AUIRF1324S-7P
AUIRF1324S-7PTRL
AUIRF1324S-7PTRR
11
AUIRF1324S-7P
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corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any
product or services without notice. Part numbers designated with the “AU” prefix follow automotive industry and / or customer specific
requirements with regards to product discontinuance and process change notification. All products are sold subject to IR’s terms and conditions
of sale supplied at the time of order acknowledgment.
IR warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with IR’s standard warranty.
Testing and other quality control techniques are used to the extent IR deems necessary to support this warranty. Except where mandated by
government requirements, testing of all parameters of each product is not necessarily performed.
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