PD - 96296 AUTOMOTIVE GRADE AUIRF1324S-7P HEXFET® Power MOSFET Features l l l l l l l Advanced Process Technology Ultra Low On-Resistance 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * V(BR)DSS D 24V RDS(on) typ. G 0.8mΩ max. S S (Pin 2, 3, 5, 6, 7) G (Pin 1) 1.0mΩ ID (Silicon Limited) 429A c ID (Package Limited) 240A Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. Absolute Maximum Ratings D S G S S S S D 2Pak 7 Pin G D S Gate Drain Source Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied.Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless otherwise specified. Parameter ID @ TC = 25°C ID @ TC = 100°C ID @ TC = 25°C IDM PD @TC = 25°C VGS EAS (Thermally limited) IAR EAR dv/dt TJ TSTG Max. Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Silicon Limited) Continuous Drain Current, VGS @ 10V (Package Limited) d Pulsed Drain Current Maximum Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy d f e d Units c c 429 303 240 1640 300 2.0 ± 20 230 See Fig. 14, 15, 22a, 22b, 1.6 -55 to + 175 Peak Diode Recovery Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case) Thermal Resistance Parameter RθJC RθJA Junction-to-Case k Junction-to-Ambient (PCB Mount) , D2Pak j Typ. Max. Units ––– ––– 0.50 40 °C/W HEXFET® is a registered trademark of International Rectifier. *Qualification standards can be found at http://www.irf.com/ www.irf.com 1 03/25/10 AUIRF1324S-7P Static Characteristics @ TJ = 25°C (unless otherwise stated) Parameter V(BR)DSS ∆V(BR)DSS/∆TJ RDS(on) VGS(th) gfs RG IDSS Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Internal Gate Resistance Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Min. Typ. Max. Units 24 ––– ––– 2.0 270 ––– ––– ––– ––– ––– ––– ––– 0.023 ––– 0.80 1.0 ––– 4.0 ––– ––– 3.0 ––– ––– 20 ––– 250 ––– 200 ––– -200 Conditions V VGS = 0V, ID = 250µA V/°C Reference to 25°C, ID = 5mA mΩ VGS = 10V, ID = 160A V VDS = VGS, ID = 250µA S VDS = 50V, ID = 160A Ω VDS = 24V, VGS = 0V µA VDS = 19V, VGS = 0V, TJ = 125°C VGS = 20V nA VGS = -20V g g Dynamic Characteristics @ TJ = 25°C (unless otherwise stated) Parameter Qg Qgs Qgd Qsync td(on) tr td(off) tf Ciss Coss Crss Coss eff. (ER) Coss eff. (TR) Min. Typ. Max. Units Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Total Gate Charge Sync. (Qg - Qgd) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Effective Output Capacitance (Energy Related) ––– ––– Effective Output Capacitance (Time Related) 180 47 58 122 19 240 86 93 7700 3380 1930 4780 4970 252 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– nC ns Conditions ID = 75A VDS =12V VGS = 10V ID = 75A, VDS =0V, VGS = 10V VDD = 16V ID = 160A RG =2.7Ω VGS = 10V VGS = 0V VDS = 19V ƒ = 1.0MHz, See Fig.5 VGS = 0V, VDS = 0V to 19V , See Fig.11 VGS = 0V, VDS = 0V to 19V g g g pF i h Diode Characteristics Parameter IS VSD trr Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Qrr Reverse Recovery Charge IRRM ton Reverse Recovery Current Forward Turn-On Time ISM d Min. Typ. Max. Units ––– ––– 429 ––– ––– c 1636 A Conditions MOSFET symbol showing the integral reverse D G p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 160A, VGS = 0V VR = 20V, TJ = 25°C ––– 71 107 ns IF = 160A TJ = 125°C ––– 74 110 di/dt = 100A/µs TJ = 25°C ––– 83 120 nC TJ = 125°C ––– 92 140 ––– 2.0 ––– A TJ = 25°C Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) g S g Notes: Calculated continuous current based on maximum allowable junction ISD ≤ 160A, di/dt ≤ 600A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. temperature. Package limitation current is 240A. Note that current Pulse width ≤ 400µs; duty cycle ≤ 2%. limitations arising from heating of the device leads may occur with Coss eff. (TR) is a fixed capacitance that gives the same charging time some lead mounting arrangements.(Refer to AN-1140 as Coss while VDS is rising from 0 to 80% VDSS . Coss eff. (ER) is a fixed capacitance that gives the same energy as http://www.irf.com/technical-info/appnotes/an-1140.pdf Coss while VDS is rising from 0 to 80% VDSS. Repetitive rating; pulse width limited by max. junction When mounted on 1" square PCB (FR-4 or G-10 Material). For recom temperature. mended footprint and soldering techniques refer to application note #AN-994. Limited by TJmax, starting TJ = 25°C, L = 0.018mH Rθ is measured at T J approximately 90°C RG = 25Ω, IAS = 160A, VGS =10V. Part not recommended for use above this value. 2 www.irf.com AUIRF1324S-7P Qualification Information† Automotive (per AEC-Q101) Qualification Level Moisture Sensitivity Level Machine Model †† Comments: This part number(s) passed Automotive qualification. IR’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. D2 PAK 7 Pin MSL1 Class M4 AEC-Q101-002 ESD Human Body Model Class H3A AEC-Q101-001 Charged Device Model Class C5 AEC-Q101-005 RoHS Compliant Yes Qualification standards can be found at International Rectifiers web site: http//www.irf.com/ Exceptions to AEC-Q101 requirements are noted in the qualification report. www.irf.com 3 AUIRF1324S-7P 1000 1000 VGS 15V 10V 8.0V 6.0V 5.5V 5.0V 4.8V 4.5V BOTTOM TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 100 BOTTOM 100 4.5V 10 0.1 ≤60µs PULSE WIDTH Tj = 175°C ≤60µs PULSE WIDTH Tj = 25°C 1 10 4.5V 10 100 0.1 V DS, Drain-to-Source Voltage (V) 100 1.8 100 RDS(on) , Drain-to-Source On Resistance (Normalized) ID, Drain-to-Source Current (A) 10 Fig 2. Typical Output Characteristics 1000 T J = 175°C 10 TJ = 25°C 1 VDS = 15V ≤60µs PULSE WIDTH 0.1 ID = 160A VGS = 10V 1.6 1.4 1.2 1.0 0.8 0.6 2 3 4 5 6 7 8 9 -60 -40 -20 0 20 40 60 80 100120140160180 T J , Junction Temperature (°C) VGS, Gate-to-Source Voltage (V) Fig 4. Normalized On-Resistance vs. Temperature Fig 3. Typical Transfer Characteristics 100000 12.0 VGS = 0V, f = 1 MHZ C iss = C gs + C gd, C ds SHORTED C rss = C gd VGS, Gate-to-Source Voltage (V) ID= 75A C oss = C ds + C gd C, Capacitance (pF) 1 V DS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Ciss Coss 10000 Crss 1000 10.0 VDS= 19V VDS= 12V 8.0 6.0 4.0 2.0 0.0 1 10 100 VDS, Drain-to-Source Voltage (V) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 4 VGS 15V 10V 8.0V 6.0V 5.5V 5.0V 4.8V 4.5V 0 50 100 150 200 QG, Total Gate Charge (nC) Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage www.irf.com AUIRF1324S-7P 10000 ID, Drain-to-Source Current (A) ISD, Reverse Drain Current (A) 1000 T J = 175°C OPERATION IN THIS AREA LIMITED BY R DS(on) 1000 100 1msec 100 T J = 25°C 10 10msec 10 Tc = 25°C Tj = 175°C Single Pulse VGS = 0V 1.0 0.5 1.0 1.5 2.0 2.5 0 VSD, Source-to-Drain Voltage (V) 300 250 200 150 100 50 0 50 75 100 125 150 175 V(BR)DSS , Drain-to-Source Breakdown Voltage (V) Limited By Package 350 25 10 100 Fig 8. Maximum Safe Operating Area 450 400 1 VDS, Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage ID, Drain Current (A) DC 1 0.0 32 Id = 5mA 31 30 29 28 27 26 25 24 -60 -40 -20 0 20 40 60 80 100120140160180 T J , Temperature ( °C ) T C , Case Temperature (°C) Fig 10. Drain-to-Source Breakdown Voltage Fig 9. Maximum Drain Current vs. Case Temperature 1000 EAS , Single Pulse Avalanche Energy (mJ) 1.4 1.2 1.0 Energy (µJ) 100µsec 0.8 0.6 0.4 0.2 ID TOP 45A 80A BOTTOM 160A 900 800 700 600 500 400 300 200 100 0 0.0 -5 0 5 10 15 20 VDS, Drain-to-Source Voltage (V) Fig 11. Typical COSS Stored Energy www.irf.com 25 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) Fig 12. Maximum Avalanche Energy vs. DrainCurrent 5 AUIRF1324S-7P Thermal Response ( Z thJC ) °C/W 1 D = 0.50 0.1 0.20 0.10 0.05 τJ 0.02 0.01 0.01 R1 R1 τJ τ1 R2 R2 R3 R3 τC τ τ2 τ1 τ2 τ3 τ3 τ4 τ4 Ci= τi/Ri Ci i/Ri 1E-005 τi (sec) 0.02070 0.000010 0.08624 0.000070 0.24491 0.001406 0.15005 0.009080 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 Ri (°C/W) R4 R4 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 13. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1000 Avalanche Current (A) Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche pulsewidth, tav, assuming ∆ Tj = 150°C and Tstart =25°C (Single Pulse) 0.01 100 0.05 0.10 10 Allowed avalanche Current vs avalanche pulsewidth, tav, assuming ∆Τ j = 25°C and Tstart = 150°C. 1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 14. Typical Avalanche Current vs.Pulsewidth 6 www.irf.com AUIRF1324S-7P EAR , Avalanche Energy (mJ) 250 Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figure 22a, 22b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 14, 15). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav ) = Transient thermal resistance, see Figures 13) TOP Single Pulse BOTTOM 1.0% Duty Cycle ID = 160A 200 150 100 50 0 25 50 75 100 125 150 PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC Iav = 2DT/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav 175 Starting T J , Junction Temperature (°C) Fig 15. Maximum Avalanche Energy vs. Temperature VGS(th) , Gate threshold Voltage (V) 4.5 4.0 3.5 3.0 2.5 ID = 250µA ID = 1.0mA ID = 1.0A 2.0 1.5 1.0 -75 -50 -25 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) Fig 16. Threshold Voltage Vs. Temperature www.irf.com 7 AUIRF1324S-7P Driver Gate Drive D.U.T - - - * D.U.T. ISD Waveform Reverse Recovery Current + RG • • • • dv/dt controlled by RG Driver same type as D.U.T. I SD controlled by Duty Factor "D" D.U.T. - Device Under Test VDD P.W. Period VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + D= Period P.W. + + - Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Current Inductor Curent ISD Ripple ≤ 5% * VGS = 5V for Logic Level Devices Fig 21. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs V(BR)DSS tp 15V DRIVER L VDS D.U.T RG + V - DD IAS 20V A 0.01Ω tp I AS Fig 22a. Unclamped Inductive Test Circuit LD Fig 22b. Unclamped Inductive Waveforms VGS VDS 90% + VDD D.U.T 10% VGS VDS Second Pulse Width < 1µs Duty Factor < 0.1% td(off) Fig 23a. Switching Time Test Circuit tf td(on) tr Fig 23b. Switching Time Waveforms Id Vds Vgs L DUT 0 1K 20K VCC Vgs(th) S Qgodr 8 Fig 24a. Gate Charge Test Circuit Qgd Qgs2 Qgs1 Fig 24b. Gate Charge Waveform www.irf.com AUIRF1324S-7P D2Pak - 7 Pin Package Outline Dimensions are shown in millimeters (inches) D2Pak - 7 Pin Part Marking Information Part Number AUIRF1324S-7 YWWA IR Logo XX or Date Code Y= Year WW= Work Week A= Automotive, Lead Free XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ www.irf.com 9 AUIRF1324S-7P D2Pak - 7 Pin Tape and Reel 10 www.irf.com AUIRF1324S-7P Ordering Information Base part number AUIRF1324S-7P www.irf.com Package Type D2Pak Standard Pack Form Tube Tape and Reel Left Tape and Reel Right Complete Part Number Quantity 50 800 800 AUIRF1324S-7P AUIRF1324S-7PTRL AUIRF1324S-7PTRR 11 AUIRF1324S-7P IMPORTANT NOTICE Unless specifically designated for the automotive market, International Rectifier Corporation and its subsidiaries (IR) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or services without notice. 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