TI1 ADS1222IPWR 24-bit analog-to-digital converter Datasheet

www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
FEATURES
D 240SPS Data Rate with 4MHz Clock
D 20-Bit Effective Resolution
D Input Multiplexer with Two Differential
D
D
D
D
D
D
D
D
D
DESCRIPTION
Channels
Pin-Selectable, High-Impedance Input Buffer
±5V Differential Input Range
0.0003% INL (typ), 0.0015% INL (max)
Self-Calibrating
Simple 2-Wire Serial Interface
On-Chip Temperature Sensor
Single Conversions with Standby Mode
Low Current Consumption: 300µA
Analog Supply: 2.7V to 5.5V
APPLICATIONS
D Hand-Held Instrumentation
D Portable Medical Equipment
D Industrial Process Control
D Weigh Scales
The ADS1222 is a 2-channel, 24-bit, delta-sigma analog-to-digital (A/D) converter. It offers excellent performance and low power in a TSSOP-14 package. The
ADS1222 is well-suited for demanding, high-resolution
measurements, especially in portable systems and other space-saving and power-constrained applications.
A delta-sigma (∆Σ) modulator and digital filter form the
basis of the A/D converter. The analog modulator has
a ±5V differential input range. An input multiplexer
(MUX) is used to select between two separate
differential input channels. A buffer can be selected to
increase the input impedance of the measurement.
A simple, 2-wire serial interface provides all the
necessary control. Data retrieval, self-calibration, and
Standby mode are handled with a few simple
waveforms. When only single conversions are needed,
the ADS1222 can be quickly shut down (Standby mode)
while idle between measurements to dramatically
reduce the overall power consumption. Multiple
ADS1222s can be connected together to create a
synchronously sampling multichannel measurement
system. The ADS1222 is designed to easily connect to
microcontrollers, such as the MSP430.
The ADS1222 supports 2.7V to 5.5V supplies. Power
is typically less than 1mW in 3V operation and less than
1µW during Standby mode.
TEMPEN
VDD
VREFP VREFN
CLK
AINP1
AINN1
Mux
Buffer
AINP2
∆Σ
Modulator
Digital Filter
and
Serial Interface
SCLK
DRDY/DOUT
AINN2
MUX
BUFEN
GND
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
Copyright  2004−2008, Texas Instruments Incorporated
!"# " $ % & % ' & ( ) (&%
& $ %&& % $% " % %$ % % ( ( *)
(& &%% ( % &%% * & ( %
$%)
www.ti.com
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
ORDERING INFORMATION(1)
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR
PACKAGE
MARKING
ADS1222
TSSOP-14
PW
ADS1222
ORDERING NUMBER
TRANSPORT MEDIA,
QUANTITY
ADS1222IPWT
Tape and Reel, 250
ADS1222IPWR
Tape and Reel, 2000
(1) For the most current specification and package information, refer to our web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
VDD to GND
Input current
ADS1222
UNIT
−0.3 to +6
V
100, momentary
mA
10, continuous
mA
Analog input voltage to GND
−0.3 to VDD + 0.3
V
Digital input voltage to GND
−0.3 to VDD + 0.3
V
+150
°C
Operating Temperature Range
−55 to +125
°C
Storage Temperature Range
−60 to +150
°C
Maximum Junction Temperature
Lead Temperature (soldering, 10s)
+300
°C
(1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not implied.
2
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
ELECTRICAL CHARACTERISTICS
All specifications at TA = −40°C to +85°C, VDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analog Input
Full-scale input voltage
Absolute input voltage
Differential input impedance
Common-mode input impedance
±2VREF
AINP − AINN
V
Buffer off; AINP, AINN with respect to GND
GND − 0.1
VDD + 0.1
Buffer on; AINP, AINN with respect to GND
GND + 0.05
VDD − 1.5
V
V
Buffer off; fCLK = 2MHz
2.7
MΩ
Buffer on; fCLK = 2MHz
1.2
GΩ
Buffer off; fCLK = 2MHz
5.4
MΩ
120 (fCLK/2MHz)
Bits
SPS(1)
% of FSR(2)
System Performance
Resolution
No missing codes
24
Data rate
Integral nonlinearity (INL)
Offset error
Offset error drift
Offset error match
Gain error
Gain error drift
Gain error match
Common-mode rejection
Power-supply rejection
Buffer off; Differential input signal, end point fit
0.0003
Buffer on; Differential input signal, end point fit
0.0006
0.0015
% of FSR
150
µV
Buffer off
50
Buffer on
50
µV
Buffer off
0.2
µV/°C
Buffer on
0.2
µV/°C
20
100
µV
Buffer off
0.004
0.025
%
Buffer on
0.008
%
Buffer off
0.00003
% of FSR/°C
Buffer on
0.00006
% of FSR/°C
Between channels
0.0005
%
95
dB
100
dB
Buffer off; at DC, VDD = 2.7V to 5.5V
90
dB
Buffer on; at DC, VDD = 2.7V to 5.5V
90
dB
0.8
ppm of FSR, rms
Between channels
Buffer off; at DC
Buffer on; at DC
90
Noise
Temperature Sensor
Temperature sensor voltage
TA = 25°C
Temperature sensor coefficient
106
mV
360
µV/°C
Voltage Reference Input
Reference input voltage
VDD(3)
V
GND − 0.1
VREFP − 0.5
V
Negative reference input
VREF = VREFP − VREFN
Buffer off
0.5
2.5
Positive reference input
Buffer off
VREFN + 0.5
VDD + 0.1
V
Negative reference input
Buffer on
GND + 0.05
VREFP − 0.5
V
Positive reference input
Buffer on
VREFN + 0.5
VDD − 1.5
Voltage reference impedance
fCLK = 2MHz
500
V
kΩ
(1) SPS = samples per second.
(2) FSR = full-scale range = 4VREF.
(3) It will not be possible to reach the digital output full-scale code when VREF > VDD/2.
3
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
ELECTRICAL CHARACTERISTICS (continued)
All specifications at TA = −40°C to +85°C, VDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
0.8 VDD
VDD + 0.1
V
GND − 0.1
0.2 VDD
V
Digital Input/Output
Logic
levels
VIH
VIL
VOH
VOL
IOH = 1mA
IOL = 1mA
0.8 VDD
V
Input leakage
CLK frequency (fCLK)
CLK duty cycle
30
0.2 VDD
V
±10
µA
8
MHz
70
%
Power Supply
VDD
VDD current
Total power dissipation
2.7
5.5
V
Standby mode
<1
µA
VDD = 5V, normal mode, buffer off
300
µA
VDD = 5V, normal mode, buffer on
425
µA
VDD = 3V, normal mode, buffer off
275
µA
VDD = 3V, normal mode, buffer on
395
VDD = 5V, buffer off
1.5
VDD = 3V, buffer off
0.8
µA
2.25
mW
mW
Temperature Range
Specified
−40
+85
°C
Operating
−55
+125
°C
Storage
−60
+150
°C
(1) SPS = samples per second.
(2) FSR = full-scale range = 4VREF.
(3) It will not be possible to reach the digital output full-scale code when VREF > VDD/2.
4
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
PIN ASSIGNMENTS
PW PACKAGE
TSSOP-14
(TOP VIEW)
VDD
1
14
VREFP
SCLK
2
13
VREFN
CLK
3
12
GND
DRDY/DOUT
4
11
AINN1
MUX
5
10
AINP1
TEMPEN
6
9
AINN2
BUFEN
7
8
AINP2
ADS1222
Terminal Functions
TERMINAL
NAME
NO.
I/O
VDD
1
Analog/Digital
DESCRIPTION
SCLK
2
Digital input
Serial clock input
CLK
3
Digital input
System clock input
DRDY/DOUT
4
Digital Output
MUX
5
Digital input
Selects analog input of mux
TEMPEN
6
Digital input
Selects temperature sensor input from mux
BUFEN
7
Digital input
Enables input buffer
AINP2
8
Analog input
Analog channel 2 positive input
AINN2
9
Analog input
Analog channel 2 negative input
AINP1
10
Analog input
Analog channel 1 positive input
AINN1
11
Analog input
Analog channel 1 negative input
GND
12
Analog/Digital
Analog and digital ground
VREFN
13
Analog input
Negative reference input
VREFP
14
Analog input
Positive reference input
Analog and digital power supply
Dual-purpose output:
Data ready: indicates valid data by going low.
Data output: outputs data, MSB first, on the rising edge of SCLK.
5
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
TYPICAL CHARACTERISTICS
At TA = −40°C to +85°C, VDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
ANALOG CURRENT vs TEMPERATURE
ANALOG CURRENT vs TEMPERATURE
400
550
Buffer Off
fCLK = 4MHz, VDD = 5V
500
350
fCLK = 2MHz, VDD = 5V
325
300
f CLK = 4MHz, VDD = 3V
275
250
f CLK = 2MHz, VDD = 5V
Current (µA)
Current (µA)
Buffer On
fCLK = 4MHz, VDD = 5V
375
450
400
fCLK = 2MHz, VDD = 3V
fCLK = 4MHz, VDD = 3V
350
fCLK = 2MHz, VDD = 3V
225
200
−50
−25
300
0
25
50
100
75
125
−50
−25
0
25
Figure 1
ANALOG CURRENT vs SUPPLY VOLTAGE
125
TEMPERATURE SENSOR VOLTAGE vs TEMPERATURE
Temperature Sensor Voltage (mV)
Buffer On
fCLK = 4MHz
Current (µA)
100
150
450
400
f CLK = 2MHz
350
f CLK = 4MHz
Buffer Off
300
fCLK = 2MHz
140
130
120
110
100
90
80
250
70
2.5
3.0
3.5
4.0
4.5
5.0
−55
5.5
−25
5
Supply Voltage (V)
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
6
IN L (pp m o f F SR )
2
+25_C
−2
−4
+85_C
−6
2
−2
−4
−6
−8
−10
−3
−2
−1
0
1
Input Voltage, VIN (V)
Figure 5
2
3
4
5
+25_ C
0
−10
−4
−40_ C
4
−8
−5
125
fCLK = 2MHz
Buffer On
8
−40_C
0
95
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
10
fCLK = 2MHz
Buffer Off
8
4
65
Figure 4
10
6
35
Temperature (_C)
Figure 3
IN L (pp m o f F SR )
75
Figure 2
500
6
50
Temperature (_ C)
Temperature (_C)
+85_C
−3.5
−2.5
−1.5
−0.5
0.5
Input Voltage, VIN (V)
Figure 6
1.5
2.5
3.5
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
TYPICAL CHARACTERISTICS (continued)
At TA = −40°C to +85°C, VDD = +5V, fCLK = 2MHz, and VREF = +2.5V, unless otherwise noted.
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
INTEGRAL NONLINEARITY vs INPUT VOLTAGE
15
15
fCLK = 4MHz
Buffer Off
−40_C
IN L (pp m o f F SR )
IN L (p pm of FS R )
10
5
+25_C
0
fCLK = 4MHz
Buffer On
10
−5
+85_ C
−40_ C
5
+25_ C
0
+85_ C
−5
−10
−10
−15
−15
−5
−4
−3
−2
−1
0
1
2
3
4
−3.5
5
−2.5
−0.5
0.5
Input Voltage, VIN (V)
Figure 7
Figure 8
NOISE vs INPUT VOLTAGE
1.5
2.5
3.5
2.5
3.5
2.5
3.5
NOISE vs INPUT VOLTAGE
2.0
2.5
fCLK = 2MHz
Buffer Off
1.8
2.0
Noise (ppm of FSR, rms)
Noise (ppm of FSR, rms)
−1.5
Input Voltage, VIN (V)
1.5
1.0
0.5
fCLK = 2MHz
Buffer On
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
−3.5
0
−5
−3
−1
1
3
5
−2.5
−1.5
Input Voltage, VIN (V)
Figure 9
NOISE vs INPUT VOLTAGE
NOISE vs INPUT VOLTAGE
fCLK = 4MHz
Buffer On
2.0
Noise (ppm of FSR, rms)
Noise (ppm of FSR, rms)
1.5
2.5
fCLK = 4MHz
Buffer Off
1.5
1.0
0.5
0
−3
0.5
Figure 10
2.5
−5
−0.5
Input Voltage, VIN (V)
−1
1
Input Voltage, VIN (V)
Figure 11
3
5
2.0
1.5
1.0
0.5
−3.5
−2.5
−1.5
−0.5
0.5
1.5
Input Voltage, VIN (V)
Figure 12
7
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
generalized as AINN. The signal is selected though the
input mux, which is controlled by MUX, as shown in
Table 1. The ADS1222 accepts differential input
signals, but can also measure unipolar signals. When
measuring unipolar (or single-ended signals) with
respect to ground, connect the negative input (AINNx)
to ground and connect the input signal to the positive
input (AINPx). Note that when the ADS1222 is
configured this way, only half of the converter full-scale
range is used since only positive digital output codes
are produced. An input buffer can be selected to
increase the input impedance of the A/D converter with
the BUFEN pin.
OVERVIEW
The ADS1222 is an A/D converter comprised of a
delta-sigma modulator followed by a digital filter. A mux
allows for one of two input channels to be selected. A
buffer can also be selected to increase the input
impedance. The modulator measures the differential
input signal VIN = (AINP – AINN) against the differential
reference VREF = (VREFP – VREFN). Figure 13 shows
a conceptual diagram of the device. The differential
reference is scaled internally so that the full-scale input
range is ±2VREF. The digital filter receives the modulator
signal and provides a low-noise digital output. A 2-wire
serial interface indicates conversion completion and
provides the user with the output data.
Table 1. Input Channel Selection with MUX
ANALOG INPUTS (AINPx, AINNx)
DIGITAL PIN
The input signal to be measured is applied to the input
pins AINPx and AINNx. The positive internal input is
generalized as AINP, and the negative internal input is
TEMPEN
SELECTED ANALOG INPUTS
MUX
POSITIVE INPUT
NEGATIVE INPUT
0
AINP1
AINN1
1
AINP2
AINN2
VREFP VREFN
−
+
Σ
Temp
Sensor
CLK
VREF
2
2VREF
AINP1
AINN1
AINP
Mux
AINP2
AINN2
Buffer
AINN
MUX
Σ
VIN
∆Σ
Modulator
Digital
Filter
and
Serial
Interface
BUFEN
Figure 13. Conceptual Diagram of the ADS1222
8
SCLK
DRDY/DOUT
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
Analog Input Measurement without the Input Buffer
With the buffer disabled by setting the BUFEN pin low,
the ADS1222 measures the input signal using internal
capacitors that are continuously charged and
discharged. Figure 14 shows a simplified schematic of
the ADS1222 input circuitry, with Figure 15 showing the
on/off timings of the switches. The S1 switches close
during the input sampling phase. With S1 closed, CA1
charges to AINP, CA2 charges to AINN, and CB charges
to (AINP – AINN). For the discharge phase, S1 opens
first and then S2 closes. CA1 and CA2 discharge to
approximately VDD/2 and CB discharges to 0V. This
two-phase sample/discharge cycle repeats with a
frequency of fCLK/32 (62.5kHz for fCLK = 2MHz).
ESD Protection
VDD/2
VDD
CA1
3pF
AINP S1
AINPx
S2
AINN S1
AINNx
S2
CA2
3pF
VDD
VDD/2
Figure 14. Simplified Input Structure with the
Buffer Turned Off
tSAMPLE = 32/fCLK
ON
S1
ZeffA = tSAMPLE/CA1 = 6MΩ
(1)
AINPx
ZeffB = tSAMPLE/CB = 3MΩ
(1)
AINNx
ZeffA = tSAMPLE/CA2 = 6MΩ
(1)
VDD/2
NOTE: (1) fCLK = 2MHz.
Figure 16. Effective Analog Input Impedances
with the Buffer Off
ESD diodes protect the inputs. To keep these diodes
from turning on, make sure the voltages on the input
pins do not go below GND by more than 100mV, and
likewise do not exceed VDD by 100mV:
GND – 100mV < (AINP, AINN) < VDD + 100mV
CB
6pF
Mux
VDD/2
Analog Input Measurement with the Input Buffer
When the buffer is enabled by setting the BUFEN pin
high, a low-drift, chopper-stabilized input buffer is used
to achieve very high input impedance. The buffer
charges the input sampling capacitors, thus removing
the load from the measurement. Because the input
buffer is chopper-stabilized, the charging of parasitic
capacitances causes the charge to be carried away, as
if by resistance. The input impedance can be modeled
by a single resistor, as shown in Figure 17. The
impedance scales inversely with fCLK frequency, as in
the nonbuffered case. Note that during standby mode,
the buffer must be disabled to prevent loading of the
inputs.
OFF
ON
S2
AINP
OFF
1.2GΩ
(1)
AINN
Figure 15. S1 and S2 Switch Timing for Figure 14
The constant charging of the input capacitors presents
a load on the inputs that can be represented by effective
impedances. Figure 16 shows the input circuitry with
the capacitors and switches of Figure 14 replaced by
their effective impedances. These impedances scale
inversely with fCLK frequency. For example, if fCLK
frequency is reduced by a factor of 2, the impedances
will double.
NOTE: (1) fCLK = 2MHz.
Figure 17. Effective Analog Input Impedances
with the Buffer On
Note also that the analog inputs (listed in the Electrical
Characteristics table as Absolute Input Range) must
remain between GND + 0.05V to VDD − 1.5V.
Exceeding this range degrades linearity and results in
performance outside the specified limits.
9
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
TEMPERATURE SENSOR
On-chip diodes provide temperature-sensing capability. By setting the TEMPEN pin high, the selected analog
inputs are disconnected and the inputs to the A/D
converter are connected to the anodes of two diodes
scaled to 1x and 64x in current and size inside the mux,
as shown in Figure 18. By measuring the difference in
voltage of these diodes, temperature changes can be
inferred from a baseline temperature. Typically, the
difference in diode voltages is 106mV at 25°C, with a
temperature coefficient of 360µV/°C. A similar structure
is used in the MSC1210 for temperature measurement.
For more information, see TI application report
SBAA100, Using the MSC121x as a High-Precision
Intelligent Temperature Sensor, available for download
at www.ti.com.
VOLTAGE REFERENCE INPUTS
(VREFP, VREFN)
The voltage reference used by the modulator is
generated from the voltage difference between VREFP
and VREFN: VREF = VREFP – VREFN. The reference
inputs use a structure similar to that of the analog
inputs. A simplified diagram of the circuitry on the
reference inputs is shown in Figure 19. The switches
and capacitors can be modeled with an effective
impedance of:
ǒt 2 Ǔń16pF + 500kW
sample
where fCLK = 2MHz.
VREFP
TEMPEN
VREFN
VDD
VDD
ESD
Protection
VDD
Self Gain Cal
8I
16pF
1I
AINP
Zeff = 500kΩ (1)
AINP AINN
AINN
1X
8X
(1) fCLK = 2MHz
Figure 19. Simplified Reference Input Circuitry
AINP1
ESD diodes protect the reference inputs. To prevent
these diodes from turning on, make sure the voltages
on the reference pins do not go below GND by more
than 100mV, and likewise, do not exceed VDD by
100mV:
AINN1
AINP2
AINN2
MUX
Figure 18. Measurement of the Temperature
Sensor in the Input Multiplexer
10
GND – 100mV < (VREFP, VREFN) < VDD + 100mV
During self gain calibration, all the switches in the input
multiplexer are opened, VREFN is internally connected
to AINN, and VREFP is connected to AINP. The input
buffer may be disabled or enabled during calibration.
When the buffer is disabled, the reference pins will be
driving the circuitry shown in Figure 9 during self gain
calibration, resulting in increased loading. To prevent
this additional loading from introducing gain errors,
make sure the circuitry driving the reference pins has
adequate drive capability. When the buffer is enabled,
the loading on the reference pins will be much less, but
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
the buffer will limit the allowable voltage range on
VREFP and VREFN during self or self gain calibration
as the reference pins must remain within the specified
input range of the buffer in order to establish proper gain
calibration.
can be forced high with an additional SCLK. It will then
stay high until new data is ready. This is useful when
polling on the status of DRDY/DOUT to determine when
to begin data retrieval.
For best performance, VREF should be VDD/2, but it can
be raised as high as VDD. When VREF exceeds VDD/2,
it is not possible to reach the full-scale digital output
value corresponding to ±2VREF, since this requires the
analog inputs to exceed the power supplies. For
example, if VREF = VDD = 5V, the positive full-scale
signal is 10V. The maximum positive input signal that
can be supplied before the ESD diodes turn on is when
AINP = 5.1V and AINN = –0.1V, resulting in VIN = 5.2V.
Therefore, it is not possible to reach the positive (or
negative) full-scale readings in this configuration. The
digital output codes are limited to approximately one
half of the entire range. For best performance, bypass
the voltage reference inputs with a 0.1µF capacitor
between VREFP and VREFN. Place the capacitor as
close as possible to the pins.
SERIAL CLOCK INPUT (SCLK)
This digital input supplies the system clock to the
ADS1222. The CLK frequency can be increased to
speed up the data rate. CLK must be left running during
normal operation. It may be turned off during Standby
mode to save power, but this is not required. The CLK
input may be driven with 5V logic, regardless of the VDD
voltage.
Minimize the overshoot and undershoot on CLK for the
best analog performance. A small resistor in series with
CLK (10Ω to 100Ω) can often help. CLK can be
generated from a number of sources including
standalone crystal oscillators and microcontrollers.
DATA READY/DATA OUTPUT (DRDY/DOUT)
This digital output pin serves two purposes. First, it
indicates when new data is ready by going LOW.
Afterwards, on the first rising edge of SCLK, the
DRDY/DOUT pin changes function and begins to
output the conversion data, most significant bit (MSB)
first. Data is shifted out on each subsequent SCLK
rising edge. After all 24 bits have been retrieved, the pin
FREQUENCY RESPONSE
The ADS1222 frequency response for fCLK = 2MHz is
shown in Figure 20. The frequency response repeats at
multiples of the modulator sampling frequency of
62.5kHz. The overall response is that of a low-pass filter
with a −3db cutoff frequency of 31.5Hz. As shown, the
ADS1222 does a good job attenuating out to 60kHz. For
the best resolution, limit the input bandwidth to less than
this value to keep higher frequency noise from affecting
performance. Often, a simple RC filter on the ADS1222
analog inputs is all that is needed.
0
−20
Gain (dB)
CLOCK INPUT (CLK)
This digital input shifts serial data out with each rising
edge. As with CLK, this input may be driven with 5V
logic regardless of the VDD voltage. There is hysteresis
built into this input, but care should still be taken to
ensure a clean signal. Glitches or slow-rising signals
can cause unwanted additional shifting. For this reason,
it is best to make sure the rise-and-fall times of SCLK
are less than 50ns.
−40
−60
−80
−100
0
31250
62500
Input Frequency (Hz)
Figure 20. Frequency Response
11
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
To help see the response at lower frequencies,
Figure 21 illustrates the response out to 1kHz. Notice
that signals at multiples of 120Hz are rejected. The
ADS1222 data rate and frequency response scale
directly with CLK frequency. For example, if fCLK
increases from 2MHz to 4MHz, the data rate increases
from 120SPS to 240SPS, while the notches increase
from 120Hz to 240Hz.
0
Gain (dB)
−20
−40
−60
−80
0
−100
30
Gain (dB)
−20
40
50
60
70
−40
Figure 22. Frequency Response Near 50Hz and
60Hz with fCLK = 910kHz
−60
SETTLING TIME
−80
After changing the input multiplexer, selecting the input
buffer, or using temperature sensor, the first data is fully
settled. In the ADS1222, the digital filter is allowed to
settle after toggling any of the MUX, BUFEN, or
TEMPEN pins. Toggling of any of these digital pins will
cause the input to switch to the proper channel, start
conversions, and hold the DRDY/DOUT line high until
the digital filter is fully settled. For example, if MUX
changes from low to high, selecting a different input
channel, DRDY/DOUT immediately goes high and the
conversion process restarts. DRDY/DOUT goes low
when fully settled data is ready for retrieval. There is no
need to discard any data. Figure 23 shows the timing of
the DRDY/DOUT line as the input multiplexer changes.
−100
0
100
200 300 400
500 600 700 800 900
1k
Input Frequency (Hz)
Figure 21. Frequency Response to 1kHz
Rejecting 50Hz or 60Hz noise is as simple as choosing
the clock frequency. If simultaneous rejection of 50Hz
and 60Hz noise is desired, fCLK = 910kHz can be
chosen. The data rate becomes 54.7SPS and the
frequency response of the ADS1222 rejects the 50Hz
and 60Hz noise to below 60dB. The frequency
response of the ADS1222 near 50Hz and 60Hz with
fCLK = 910kHz is shown in Figure 22.
MUX0
Abrupt change in internal VIN due to status change (for example, switch channels, temp sensor, buffer enable)
VIN
t1
ADS1222 holds DRDY/DOUT
until digital filter settles
Fully settled
data ready
DRDY/DOUT
DRDY/DOUT suppressed after status change
SYMBOL
t1(1)
DESCRIPTION
MIN
MAX
UNITS
Settling time (DRDY/DOUT held high) after a change in any of the
MUX, BUFEN, or TEMPEN pins
25.9
26.4
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 23. Example of Settling Time After Changing the Input Multiplexer
12
80
Input Frequency (Hz)
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
The ADS1222 uses a Sinc3 digital filter to improve noise
performance. Therefore, in certain instances, large
changes in input will require settling time. For example,
an external multiplexer in front of the ADS1222 can put
large changes in input voltage by simply switching input
channels. Abrupt changes in the input will require three
data cycles to settle. When continuously converting,
four readings may be necessary to settle the data. If the
change in input occurs in the middle of the first conversion, three more full conversions of the fully settled input
will be required to get fully settled data. Discard the first
three readings because they will contain only partiallysettled data. Figure 24 illustrates the settling time for
the ADS1222 in Continuous Conversion mode.
If the input is known to change abruptly, the mux can be
quickly switched to an alternate channel and quickly
switched back to the original channel. By toggling the
mux, the ADS1222 resets the digital filter and initiates a
new conversion. During this time, the DRDY/DOUT line
is held high until fully-settled data is available.
DATA FORMAT
The ADS1222 outputs 24 bits of data in binary two’s
complement format. The least significant bit (LSB) has
a weight of (2VREF)/(223 – 1). The positive full-scale
input produces an output code of 7FFFFFh and the
negative full-scale input produces an output code of
800000h. The output clips at these codes for signals
exceeding full-scale. Table 2 summarizes the ideal
output codes for different input signals.
Table 2. Ideal Output Code vs Input Signal
INPUT SIGNAL VIN
(AINP − AINN)
IDEAL OUTPUT CODE(1)
w +2V REF
7FFFFFh
+2V REF
000001h
2 23 * 1
0
000000h
−2V REF
FFFFFFh
2 23 * 1
ǒ2 2 * 1 Ǔ
v −2VREF
23
800000h
23
(1) Excludes effects of noise, INL, offset, and gain errors.
DATA RETRIEVAL
The ADS1222 continuously converts the analog input
signal. To retrieve data, wait until DRDY/DOUT goes
low, as shown in Figure 25. After this occurs, begin
shifting out the data by applying SCLKs. Data is shifted
out MSB first. It is not required to shift out all 24 bits of
data, but the data must be retrieved before the new data
is updated (see t2) or else it will be overwritten. Avoid
data retrieval during the update period. DRDY/DOUT
remain at the state of the last bit shifted out until it is
taken high (see t6), indicating that new data is being
updated. To avoid having DRDY/DOUT remain in the
state of the last bit, shift a 25th SCLK to force
DRDY/DOUT high (see Figure 26). This technique is
useful when a host controlling the ADS1222 is polling
DRDY/DOUT to determine when data is ready.
Abrupt change in external VIN
VIN
Start of
conversion
DRDY/DOUT
First Conversion;
includes
unsettled VIN
Second Conversion;
VIN settled, but
digital filter
unsettled
Third Conversion;
VIN settled, but
digital filter
unsettled
Fourth Conversion;
VIN and digital filter
both settled
Conversion
time
Figure 24. Settling Time in Continuous Conversion Mode
13
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
Data
New Data Ready
Data Ready
MSB
DRDY/DOUT
23
LSB
22
21
0
t4
t5
t2
t3
t6
1
SCLK
24
t3
t7
SYMBOL DESCRIPTION
t2
t3
t4
t5
t6(1)
t7(1)
MIN
DRDY/DOUT low to first SCLK rising edge
SCLK positive or negative pulse width
SCLK rising edge to new data bit valid: propagation delay
SCLK rising edge to old data bit valid: hold time
Data updating; no readback allowed
Conversion time (1/data rate)
MAX
0
100
50
0
48
8.32
8.32
UNITS
ns
ns
ns
ns
µs
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 25. Data Retrieval Timing
Data
Data Ready
New Data Ready
DRDY/DOUT
SCLK
23
1
22
21
0
24
25
25th SCLK to Force DRDY/DOUT High
Figure 26. Data Retrieval with DRDY/DOUT Forced High Afterwards
14
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
SELF-CALIBRATION
STANDBY MODE
Self-calibration can be initiated at any time, although in
many applications the ADS1222 drift performance is so
good that the self-calibration performed automatically
at power-up is all that is needed. To initiate
self-calibration, apply at least two additional SCLKs
after retrieving 24 bits of data. Figure 27 shows the
timing pattern. The 25th SCLK will send DRDY/DOUT
high. The falling edge of the 26th SCLK will begin the
calibration cycle. Additional SCLK pulses may be sent
after the 26th SCLK; however, activity on SCLK should
be minimized during calibration for best results.
Standby
mode
dramatically
reduces
power
consumption (typically < 1µW with CLK stopped) by
shutting down all of the active circuitry. To enter Standby
mode, simply hold SCLK high after DRDY/DOUT goes
low, as shown in Figure 28. Standby mode can be
initiated at any time during readback; it is not necessary
to retrieve all 24 bits of data beforehand. Note that
during standby mode, the buffer must be disabled to
prevent loading of the inputs.
When t11 has passed with SCLK held high, Standby mode
will activate. DRDY/DOUT stays high when Standby
mode begins. SCLK must remain high to stay in Standby
mode. To exit Standby mode (wakeup), set SCLK low.
The first data after exiting Standby mode is valid. It is not
necessary to stop CLK during Standby mode, but doing
so will further reduce the digital supply current.
When the calibration is complete, DRDY/DOUT goes
low, indicating that new data is ready. There is no need
to alter the analog input signal applied to the ADS1222
during calibration; the input pins are disconnected
within the A/D converter and the appropriate signals are
applied internally and automatically. The first
conversion after a calibration is fully settled and valid for
use. The time required for a calibration depends on two
independent signals: the falling edge of SCLK and an
internal clock derived from CLK. Variations in the
internal calibration values will change the time required
for calibration (t8) within the range given by the min/max
specs. t11 and t12 described in the next section are
affected likewise.
Standby Mode With Self-Calibration
Self-calibration can be set to run immediately after
exiting Standby mode. This is useful when the
ADS1222 is put in Standby mode for long periods of
time and self-calibration is desired afterwards to
compensate for temperature or supply voltage
changes.
To force a self-calibration with Standby mode, shift 25
bits out before taking SCLK high to enter Standby
mode. Self-calibration then begins after wakeup.
Figure 29 shows the appropriate timing. Note the extra
time needed after wakeup for calibration before data is
ready. The first data after Standby mode with
self-calibration is fully settled and can be used.
Data Ready After Calibration
DRDY/DOUT
23
22
21
0
23
Calibration Begins
SCLK
1
24
25
26
t8
SYMBOL
t8(1)
DESCRIPTION
MIN
MAX
UNITS
First data ready after calibration
77.1
77.9
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 27. Self-Calibration Timing
15
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
Data Ready
Standby Mode
DRDY/DOUT
23
22
21
0
23
Start Conversion
SCLK
1
24
t9
t10
t11
SYMBOL DESCRIPTION
t9(1)
t10(1)
t11(1)
MIN
SCLK high after DRDY/DOUT goes low to activate Standby mode
MAX
UNITS
0
8.272
ms
Standby mode activation time
8.272
8.304
ms
Data ready after exiting Standby mode
27.7
28.1
ms
(2) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 28. Standby Mode Timing (can be used for single conversions)
Data Ready After Calibration
Standby Mode
DRDY/DOUT
SCLK
23
22
21
0
1
24
23
Begin Calibration
25
t 12
t10
SYMBOL DESCRIPTION
MIN
MAX
UNITS
t12(1)
Data ready after exiting Standby mode and calibration
78.8
79.7
ms
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 29. Standby Mode with Self-Calibration Timing (can be used for single conversions)
SINGLE CONVERSIONS
When only single conversions are needed, Standby
mode can be used to start and stop the ADS1222. To
make a single conversion, first enter the Standby mode
holding SCLK high. Now, when ready to start the
conversion, take SCLK low. The ADS1222 wakes up
and begins the conversion. Wait for DRDY/DOUT to go
low, and then retrieve the data. Afterwards, take SCLK
16
high to stop the ADS1222 from converting and re-enter
Standby mode. Continue to hold SCLK high until ready
to start the next conversion. Operating in this fashion
greatly reduces power consumption since the
ADS1222 is shut down while idle between conversions.
Self-calibrations can be performed prior to the start of
the single conversions by using the waveform shown in
Figure 29.
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
APPLICATIONS INFORMATION
GENERAL RECOMMENDATIONS
The ADS1222 is a high-resolution A/D converter.
Achieving optimal device performance requires careful
attention to the support circuitry and printed circuit
board (PCB) design. Figure 30 shows the basic
connections for the ADS1222. As with any precision
circuit, be sure to use good supply bypassing capacitor
techniques. A smaller value ceramic capacitor in
parallel with a larger value tantalum capacitor works
well. Place the capacitors, in particular the ceramic
ones, close to the supply pins. Use a ground plane and
tie the ADS1222 GND pin and bypass capacitors
directly to it. Avoid ringing on the digital inputs. Small
resistors (≈100Ω) in series with the digital pins can help
by controlling the trace impedance. Place these
resistors at the source end.
Pay special attention to the reference and analog
inputs. These are the most critical circuits. Bypass the
voltage reference using similar techniques to the supply
voltages. The quality of the reference directly affects
the overall accuracy of the device. Make sure to use a
low noise and low drift reference such as the REF1004.
Often, only a simple RC filter is needed on the inputs.
This circuit limits the higher frequency noise. Avoid
low-grade dielectrics for the capacitors and place them
as close as possible to the input pins. Keep the traces
to the input pins short, and carefully watch how they are
routed on the PCB.
After the power supplies and reference voltage have
stabilized, issue a self-calibration command to
minimize offset and gain errors.
+5V
10µF
0.1µF
VDD
100Ω
VREFP
+2.5V Reference
0.1µF
100Ω
SCLK
VREFN
220pF
ADS1222
CLK
100Ω
10µF
GND
301Ω
VINP
100Ω
100Ω
DRDY/DOUT
AINN1
MUX
AINP1
TEMPEN
AINN2
BUFEN
AINP2
100Ω
0.1µF
301Ω
VINN
220pF
Same as shown
for AINP1 and AINN1.
Figure 30. Basic Connections
17
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
MULTICHANNEL SYSTEMS
Multiple ADS1222s can be operated in parallel to
measure multiple input signals. Figure 31 shows an
example of a four-channel system. For simplicity, the
supplies and reference circuitry are not shown. The
same CLK signal should be applied to all devices. To
synchronize the ADS1222s, connect the same SCLK
signal to all devices. Then place all the devices in
Standby mode. Afterwards, starting a conversion will
synchronize all the ADS1222s; that is, they will sample
the input signals simultaneously. The DRDY/DOUT
outputs will go low at approximately the same time after
synchronization. When reading data from the devices,
the data appears in parallel on DRDY/DOUT as a result
of the common SCLK connection.
The falling edges of DRDY/DOUT, indicating that new
data is ready, will vary with respect to each other no
more than time t13. This variation is due to possible
differences in the ADS1222 internal calibration settings.
To account for this, when using multiple devices, either
wait for t13 to pass after seeing one DRDY/DOUT go
low, or wait until all DRDY/DOUTs have gone low before
retrieving data.
Note that changing channels (using the MUX pin), or
using the input buffer (BUFEN) or the temperature
sensor (TEMPEN), may require more care to settle the
digital filter. For example, if the MUX pin is toggled on
one device and not the other, the DRDY/DOUT line will
be held high until the conversion settles on the first
device. The latter device will continue conversions
through this time. See the Settling Time section of this
datasheet for further details.
ADS1222
AINP1
AINN1
CLK
…
Inputs
AINP4
SCLK
AINN4
DRDY/DOUT
MUX Select
OUT1
MUX
OUT1
ADS1222
t13
AINP1
AINN1
OUT2
CLK
…
Inputs
AINP4
SCLK
AINN4
DRDY/DOUT
MUX Select
OUT2
MUX
CLK and SCLK
Sources
SYMBOL
t13(1)
DESCRIPTION
MIN
Difference between DRDY/DOUTs going low in multichannel
systems
(1) Values given for fCLK = 2MHz. For different fCLK frequencies, scale proportional to CLK period.
Figure 31. Example of Using Multiple ADS1222s in Parallel
18
MAX
UNITS
±0.8
ms
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
SUMMARY OF SERIAL INTERFACE WAVEFORMS
DRDY/DOUT
23
22
21
0
MSB
SCLK
LSB
1
24
(a) Data Retrieval
DRDY/DOUT
23
SCLK
22
21
0
1
24
25
(b) Data Retrieval with DRDY/DOUT Forced High Afterwards
Data Ready
After Calibration
DRDY/DOUT
23
SCLK
22
21
0
1
24
Begin Calibration
25
26
(c) Self−Calibration
Data Ready
Standby Mode
23
DRDY/DOUT
22
21
0
Start
Conversion
SCLK
1
24
(d) Standby Mode/Single Conversions
Data Ready
After Calibration
Standby Mode
DRDY/DOUT
23
22
21
0
Begin Calibration
SCLK
1
24
25
(e) Standby Mode/Single Conversions with Self−Calibration
Figure 32. Summary of Serial Interface Waveforms
19
www.ti.com
SBAS314B − APRIL 2004 − REVISED JANUARY 2009
Revision History
DATE
12/2/08
REV
PAGE
SECTION
DESCRIPTION
9
Analog Input
Measurement with the
Input Buffer
Added last sentence to fist paragraph describing standby mode.
15
Standby Mode
Added last sentence to first paragraph describing standby mode.
B
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
20
PACKAGE OPTION ADDENDUM
www.ti.com
21-May-2010
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package
Drawing
Pins
Package Qty
Eco Plan
(2)
Lead/
Ball Finish
MSL Peak Temp
(3)
ADS1222IPWR
ACTIVE
TSSOP
PW
14
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
ADS1222IPWRG4
ACTIVE
TSSOP
PW
14
2000
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
ADS1222IPWT
ACTIVE
TSSOP
PW
14
250
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
ADS1222IPWTG4
ACTIVE
TSSOP
PW
14
250
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
Samples
(Requires Login)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
ADS1222IPWR
TSSOP
PW
14
2000
330.0
12.4
6.9
5.6
1.6
8.0
12.0
Q1
ADS1222IPWT
TSSOP
PW
14
250
180.0
12.4
6.9
5.6
1.6
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
14-Jul-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ADS1222IPWR
TSSOP
PW
14
2000
367.0
367.0
35.0
ADS1222IPWT
TSSOP
PW
14
250
210.0
185.0
35.0
Pack Materials-Page 2
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46C and to discontinue any product or service per JESD48B. Buyers should
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All
semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale supplied at the time
of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components which meet ISO/TS16949 requirements, mainly for automotive use. Components which
have not been so designated are neither designed nor intended for automotive use; and TI will not be responsible for any failure of such
components to meet such requirements.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Mobile Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2012, Texas Instruments Incorporated
Similar pages