12-Bit, 170/210 MSPS 3.3 V A/D Converter AD9430 FUNCTIONAL BLOCK DIAGRAM FEATURES SENSE VREF AGND DRGND DRVDD AVDD AD9430 SCALABLE REFERENCE VIN+ TRACKAND-HOLD VIN– ADC 12-BIT PIPELINE CORE LVDS OUTPUTS 12 CMOS OUTPUTS DS+ DS– CLK+ SELECT CMOS OR LVDS CLOCK MANAGEMENT DCO– S1 S2 S4 S5 Figure 1. APPLICATIONS The AD9430 is a 12-bit, monolithic, sampling analog-to-digital converter (ADC) optimized for high performance, low power, and ease of use. The product operates up to a 210 MSPS conversion rate and is optimized for outstanding dynamic performance in wideband carrier and broadband systems. All necessary functions, including a track-and-hold (T/H) and reference, are included on the chip to provide a complete conversion solution. Wireless and wired broadband communications Cable reverse path Communications test equipment Radar and satellite subsystems Power amplifier linearization Two output buses support demultiplexed data up to 105 MSPS rates in CMOS mode. A data sync input is supported for proper output data port alignment in CMOS mode, and a data clock output is available for proper output data timing. In LVDS mode, the chip provides data at the ENCODE clock rate. Fabricated on an advanced BiCMOS process, the AD9430 is available in a 100-lead, surface-mount plastic package (100 e-PAD TQFP) specified over the industrial temperature range (–40°C to +85°C). DCO+ CLK– GENERAL DESCRIPTION The ADC requires a 3.3 V power supply and a differential ENCODE clock for full performance operation. The digital outputs are TTL/CMOS or LVDS compatible and support either twos complement or offset binary format. Separate output power supply pins support interfacing with 3.3 V CMOS logic. DATA, OVERRANGE IN LVDS OR 2-PORT CMOS 02607-001 SNR = 65 dB @ fIN = 70 MHz @ 210 MSPS ENOB of 10.6 @ fIN = 70 MHz @ 210 MSPS (–0.5 dBFS) SFDR = 80 dBc @ fIN = 70 MHz @ 210 MSPS (–0.5 dBFS) Excellent linearity: DNL = ±0.3 LSB (typical) INL = ±0.5 LSB (typical) 2 output data options: Demultiplexed 3.3 V CMOS outputs each @ 105 MSPS Interleaved or parallel data output option LVDS at 210 MSPS 700 MHz full-power analog bandwidth On-chip reference and track-and-hold Power dissipation = 1.3 W typical @ 210 MSPS 1.5 V input voltage range 3.3 V supply operation Output data format option Data sync input and data clock output provided Clock duty cycle stabilizer PRODUCT HIGHLIGHTS 1. 2. 3. 4. 5. High performance. Maintains 65 dB SNR @ 210 MSPS with a 65 MHz input. Low power. Consumes only 1.3 W @ 210 MSPS. Ease of use. LVDS output data and output clock signal allow interface to current FPGA technology. The on-chip reference and sample-and-hold provide flexibility in system design. Use of a single 3.3 V supply simplifies system power supply design. Out of range (OR) feature. The OR output bit indicates when the input signal is beyond the selected input range. Pin compatible with 10-bit AD9411 (LVDS only). . Rev. E Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2005–2010 Analog Devices, Inc. All rights reserved. AD9430* PRODUCT PAGE QUICK LINKS Last Content Update: 02/23/2017 COMPARABLE PARTS TOOLS AND SIMULATIONS View a parametric search of comparable parts. • Visual Analog • AD9430 IBIS Models DOCUMENTATION Application Notes REFERENCE MATERIALS • AN-1142: Techniques for High Speed ADC PCB Layout Technical Articles • AN-282: Fundamentals of Sampled Data Systems • AN-302: Exploit Digital Advantages in an SSB Receiver • Correlating High-Speed ADC Performance to Multicarrier 3G Requirements • AN-345: Grounding for Low-and-High-Frequency Circuits • Design A Clock-Distribution Strategy With Confidence • AN-501: Aperture Uncertainty and ADC System Performance • DNL and Some of its Effects on Converter Performance • AN-586: LVDS Outputs for High Speed A/D Converters • MS-2210: Designing Power Supplies for High Speed ADC • AN-616: AD9430 Evaluation Board Modifications for XTAL Oscillator Clocking DESIGN RESOURCES • AN-715: A First Approach to IBIS Models: What They Are and How They Are Generated • AN-737: How ADIsimADC Models an ADC • AN-741: Little Known Characteristics of Phase Noise • AN-756: Sampled Systems and the Effects of Clock Phase Noise and Jitter • AN-807: Multicarrier WCDMA Feasibility • AN-808: Multicarrier CDMA2000 Feasibility • AN-835: Understanding High Speed ADC Testing and Evaluation • AN-905: Visual Analog Converter Evaluation Tool Version 1.0 User Manual • AN-935: Designing an ADC Transformer-Coupled Front End • LVDS Ups A/D Converter Data Rates • AD9430 Material Declaration • PCN-PDN Information • Quality And Reliability • Symbols and Footprints DISCUSSIONS View all AD9430 EngineerZone Discussions. SAMPLE AND BUY Visit the product page to see pricing options. TECHNICAL SUPPORT Data Sheet Submit a technical question or find your regional support number. • AD9430: 12-Bit, 170/210 MSPS 3.3 V A/D Converter Data Sheet DOCUMENT FEEDBACK User Guides Submit feedback for this data sheet. • UG-173: High Speed ADC USB FIFO Evaluation Kit (HSCADC-EVALB-DCZ) This page is dynamically generated by Analog Devices, Inc., and inserted into this data sheet. A dynamic change to the content on this page will not trigger a change to either the revision number or the content of the product data sheet. This dynamic page may be frequently modified. AD9430 TABLE OF CONTENTS DC Specifications ............................................................................. 4 Analog Inputs ............................................................................. 28 AC Specifications.............................................................................. 6 Gain.............................................................................................. 28 Digital Specifications........................................................................ 7 ENCODE..................................................................................... 28 Switching Specifications .................................................................. 8 Voltage Reference ....................................................................... 28 Timing Diagrams.............................................................................. 9 Data Format Select ..................................................................... 28 Absolute Maximum Ratings.......................................................... 10 I/P Timing Select........................................................................ 28 Explanation of Test Levels ......................................................... 10 Timing Controls ......................................................................... 28 ESD Caution................................................................................ 10 CMOS Data Outputs.................................................................. 29 Pin Configurations and Function Descriptions ......................... 11 Crystal Oscillator........................................................................ 29 Equivalent Circuits ......................................................................... 15 Optional Amplifier..................................................................... 29 Typical Performance Characteristics ........................................... 16 Troubleshooting.......................................................................... 30 Terminology .................................................................................... 23 Evaluation Board, LVDS Mode .................................................... 36 Application Notes ........................................................................... 25 Power Connector........................................................................ 36 Theory of Operation .................................................................. 25 Analog Inputs ............................................................................. 36 Encode Input............................................................................... 25 Gain.............................................................................................. 36 Analog Input ............................................................................... 26 Clock ............................................................................................ 36 DS Inputs (DS+, DS–)................................................................ 26 Voltage Reference ....................................................................... 36 CMOS Outputs ........................................................................... 26 Data Format Select ..................................................................... 36 LVDS Outputs............................................................................. 27 Data Outputs............................................................................... 36 Voltage Reference ....................................................................... 27 Crystal Oscillator........................................................................ 36 Noise Power Ratio Testing (NPR) ............................................ 27 Outline Dimensions ....................................................................... 42 Evaluation Board, CMOS Mode................................................... 28 Ordering Guide .......................................................................... 42 Power Connector........................................................................ 28 Rev. E | Page 2 of 44 AD9430 REVISION HISTORY 9/10—Rev. D to Rev. E Change to General Description Section.........................................1 Change to Operating Temperature Range Parameter, Table 5..10 Change to Figure 4 ..........................................................................11 Change to Figure 5 ..........................................................................13 Added Exposed Pad Notation to Outline Dimensions ..............42 8/05—Rev. C to Rev. D Change to IVREF Spec Units ...............................................................4 Changes to Minimum ENOB Specification...................................6 Added Footnote for Pin 33 in LVDS Mode ...................................7 Change to LVDS Output Section ..................................................27 Added New Evaluation Board, CMOS Mode Section................32 Updated Outline Dimensions........................................................42 11/04—Rev. B to Rev. C Changes to Specifications ................................................................4 Changes to Figure 60 .................................................................... 31 Changes to LVDS PCB BOM ....................................................... 35 Changes to Figure 68 (Evaluation Board—LVDS Mode) ......... 36 Updated Outline Dimensions ...................................................... 40 7/03—Rev. A to Rev. B Changed order of Figure 1 and Figure 2 ...................................... 5 Updated TPC 13 .............................................................................14 Changes to LVDS OUTPUTS section..........................................20 Add New AD9430 EVALUATION BOARD, LVDS MODE Section ......................................................................................... 27 Updated OUTLINE DIMENSIONS ........................................... 32 3/03—Rev. 0 to Rev. A Upgraded for AD9430-210 .............................................. Universal Changes to FEATURES ................................................................. 1 Changes to PRODUCT HIGHLIGHTS ...................................... 1 Changes to SPECIFICATIONS ..................................................... 2 Changes to Figure 2 ........................................................................ 5 Changes to ORDERING GUIDE .................................................. 6 Change to PIN FUNCTION DESCRIPTIONS .......................... 7 Edits to Output Propagation Delay section. .............................. 10 Added TPCs 5–8, 10–12, 14, 16, 18, 20, 22, 27, 31–32, 34 ...... 12 Changes to TPCs............................................. 17, 19, 26, 35–36, 38 Added text to ENCODE INPUT section ................................... 18 Added DS INPUTS section ..........................................................19 Change to Table I ..........................................................................19 Changes to LVDS Outputs section.............................................. 20 Changes to Voltage Reference section .........................................20 Replaced Figure 12......................................................................... 20 Change to Troubleshooting section .............................................22 Updated OUTLINE DIMENSIONS.............................................27 5/02—Revision 0: Initial Version Rev. E | Page 3 of 44 AD9430 DC SPECIFICATIONS AVDD = 3.3 V, DRVDD = 3.3 V, TMIN = –40°C, TMAX = +85°C, fIN = –0.5 dBFS, internal reference, full scale = 1.536 V, LVDS output mode, unless otherwise noted. Table 1. AD9430-170 Parameter RESOLUTION ACCURACY No Missing Codes Offset Error Gain Error Differential Nonlinearity (DNL) Integral Nonlinearity (INL) TEMPERATURE DRIFT Offset Error Gain Error Reference Out (VREF) REFERENCE Reference Out (VREF) Output Current 1 IVREF Input Current 2 ISENSE Input Current2 ANALOG INPUTS (VIN+, VIN–) 3 Differential Input Voltage Range (S5 = GND) Differential Input Voltage Range (S5 = AVDD) Input Common-Mode Voltage Input Resistance Input Capacitance POWER SUPPLY (LVDS Mode) AVDD DRVDD Supply Currents IANALOG (AVDD = 3.3 V) 4 IDIGITAL (DRVDD = 3.3 V)4 Power Dissipation4 Power Supply Rejection AD9430-210 Temp Test Level Min Full 25°C 25°C 25°C Full 25°C Full VI I I I VI I VI –3 –5 –1 –1 –1.5 –2.25 Full Full Full V V V 25°C 25°C 25°C 25°C I IV I I Full V 1.536 1.536 V Full V 0.766 0.766 V Full Full 25°C VI VI V 2.65 2.2 2.8 3 5 2.9 3.8 2.65 2.2 2.8 3 5 2.9 3.8 V kΩ pF Full Full IV IV 3.1 3.0 3.3 3.3 3.6 3.6 3.2 3.0 3.3 3.3 3.6 3.6 V V Full Full Full 25°C VI VI VI V 335 55 1.29 –7.5 372 62 1.43 390 55 1.5 –7.5 450 62 1.7 mA mA W mV/V Typ 12 Max Min +3 +5 +1 +1.5 +1.5 +2.25 –3 –5 –1 –1 –1.75 –2.5 Guaranteed ± 0.3 ± 0.3 ± 0.5 ± 0.5 1.235 1.6 Rev. E | Page 4 of 44 Max Unit Bits +3 +5 +1 +1.5 +1.75 +2.5 mV % FS LSB LSB LSB LSB Guaranteed 58 0.02 +0.12/–0.24 1.15 Typ ± 0.3 ± 0.3 ± 0.3 ± 0.3 58 0.02 +0.12/–0.24 1.3 3.0 20 5.0 1.15 1.235 1.6 μV/°C %/°C mV/°C 1.3 3.0 20 5.0 V mA μA mA AD9430 AD9430-170 Parameter POWER SUPPLY (CMOS Mode) AVDD DRVDD Supply Currents IAVDD (AVDD = 3.3 V) 5 IDRVDD (DRVDD = 3.3 V)5 Power Dissipation5 Power Supply Rejection AD9430-210 Temp Test Level Min Typ Max Min Typ Max Unit Full Full IV IV 3.1 3.0 3.3 3.3 3.6 3.6 3.2 3.0 3.3 3.3 3.6 3.6 V V Full Full Full 25°C IV IV IV V 335 24 1.1 –7.5 372 30 390 30 1.3 –7.5 450 30 mA mA W mV/V 1 Internal reference mode; SENSE = Floats. External reference mode; SENSE = DRVDD, VREF driven by external 1.23 V reference. S5 (Pin 1) = GND. See the Analog Input section. S5 = GND in all dc and ac tests, unless otherwise noted. 4 IAVDD and IDRVDD are measured with an analog input of 10.3 MHz, –0.5 dBFS, sine wave, rated ENCODE rate, and in LVDS output mode. See Typical Performance Characteristics and Application Notes sections for IDRVDD. Power consumption is measured with a dc input at rated ENCODE rate in LVDS output mode. 5 IAVDD and IDRVDD are measured with an analog input of 10.3 MHz, –0.5 dBFS, sine wave, rated ENCODE rate, and in CMOS output mode. See Typical Performance Characteristics and Application Notes sections for IDRVDD. Power consumption is measured with a dc input at rated ENCODE rate in CMOS output mode. 2 3 Rev. E | Page 5 of 44 AD9430 AC SPECIFICATIONS AVDD = 3.3 V, DRVDD = 3.3 V, TMIN = –40°C, TMAX = +85°C, fIN = –0.5 dBFS, internal reference, full scale = 1.536 V, LVDS output mode, unless otherwise noted. 1 Table 2. Parameter SNR Analog Input @ –0.5 dBFS SINAD Analog Input @ –0.5 dBFS AD9430-170 Typ Max Min AD9430-210 Typ Max Temp Test Level Min Unit 10 MHz 70 MHz 100 MHz 240 MHz 25°C 25°C 25°C 25°C I I V V 63.5 63 65 65 65 61 62.5 62.5 64.5 64.5 64.5 61 dB dB dB dB 10 MHz 70 MHz 100 MHz 240 MHz 25°C 25°C 25°C 25°C I I V V 63.5 63 65 65 65 60 62.5 62.5 64.5 64.5 64.5 60 dB dB dB dB 10 MHz 70 MHz 100 MHz 240 MHz 25°C 25°C 25°C 25°C I I V V 10.3 10.3 10.6 10.6 10.6 9.8 10.2 10.2 10.5 10.5 10.5 9.8 Bits Bits Bits Bits 10 MHz 70 MHz 100 MHz 240 MHz 25°C 25°C 25°C 25°C I I V V –85 –85 –77 –63 –75 –75 –84 –84 –77 –63 –74 –74 dBc dBc dBc dBc 10 MHz 70 MHz 100 MHz 240 MHz 25°C 25°C 25°C 25°C I I V V –87 –87 –77 –63 –78 –78 –87 –87 –77 –63 –77 –77 dBc dBc dBc dBc 25°C 25°C V V –75 700 EFFECTIVE NUMBER OF BITS (ENOB) WORST HARMONIC (2nd or 3rd) Analog Input @ –0.5 dBFS, 10 MHz WORST HARMONIC (4th or Higher) Analog Input @ –0.5 dBFS, 10 MHz TWO-TONE IMD 2 F1, F2 @ −7 dBFS ANALOG INPUT BANDWIDTH D 1 2 All ac specifications tested by differentially driving CLK+ and CLK−. F1 = 28.3 MHz, F2 = 29.3 MHz. Rev. E | Page 6 of 44 –75 700 dBc MHz AD9430 DIGITAL SPECIFICATIONS AVDD = 3.3 V, DRVDD = 3.3 V, TMIN = –40°C, TMAX = +85°C, unless otherwise noted. Table 3. Parameter ENCODE AND DS INPUTS (CLK+, CLK–, DS+, DS–) 1 Differential Input Voltage 2 Common-Mode Voltage 3 Input Resistance Input Capacitance LOGIC INPUTS (S1, S2, S4, S5) Logic 1 Voltage Logic 0 Voltage Logic 1 Input Current Logic 0 Input Current Input Resistance Input Capacitance LOGIC OUTPUTS (CMOS Mode) Logic 1 Voltage 4 Temp Test Level Full Full Full 25°C IV VI VI V 0.2 1.375 3.2 Full Full Full Full 25°C 25°C IV IV VI VI V V 2.0 Full IV DRVDD –0.05 Logic 0 Voltage4 LOGIC OUTPUTS (LVDS Mode)4, 5 VOD Differential Output Voltage VOS Output Offset Voltage Output Coding Full IV Full Full VI VI Min AD9430-170 Typ Max 1.5 5.5 4 1.575 6.5 Min 0.2 1.375 3.2 AD9430-210 Typ Max 1.5 5.5 4 1.575 6.5 2.0 0.8 190 10 0.8 190 10 30 4 30 4 DRVDD –0.05 0.05 247 454 1.125 1.375 Twos complement or binary 1 ENCODE (Clock) and DS inputs identical on the chip. See the Equivalent Circuits section. All ac specifications tested by driving CLK+ and CLK– differentially, |(CLK+) – (CLK–)| > 200 mV. 3 ENCODE (Clock) inputs’ common-mode can be externally set, such that 0.9 V < (CLK+ or CLK−) < 2.6 V. 4 Digital output logic levels: DRVDD = 3.3 V, CLOAD = 5 pF. 5 LVDS RTERM = 100 Ω, LVDS output current set resistor (RSET) = 3.74 kΩ (1% tolerance). 2 Rev. E | Page 7 of 44 Unit V V kΩ pF V V μA μA kΩ pF V 0.05 247 454 1.125 1.375 Twos complement or binary V mV V AD9430 SWITCHING SPECIFICATIONS AVDD = 3.3 V, DRVDD = 3.3 V, TMIN = –40°C, TMAX = +85°C, unless otherwise noted. Table 4. Parameter (Conditions) Maximum Conversion Rate 1 Minimum Conversion Rate1 CLK+ Pulse Width High (tEH)1 CLK+ Pulse Width Low (tEL)1 DS Input Setup Time (tSDS) 2 DS Input Hold Time (tHDS)2 OUTPUT (CMOS Mode) Valid Time (tV) Propagation Delay (tPD) Rise Time (tR) (20% to 80%) Fall Time (tF) (20% to 80%) DCO Propagation Delay (tCPD) Data to DCO Skew (tPD to tCPD) Interleaved Mode (A, B Latency) Parallel Mode (A, B Latency) OUTPUT (LVDS Mode) Valid Time (tV) Propagation Delay (tPD) Rise Time (tR) (20% to 80%) Fall Time (tF) (20% to 80%) DCO Propagation Delay (tCPD) Data to DCO Skew (tPD – tCPD) Latency APERTURE DELAY (tA) APERTURE UNCERTAINTY (Jitter, tJ) OUT OF RANGE RECOVERY TIME (CMOS and LVDS) 1 2 Temp Full Full Full Full Full Full Test Level VI V IV IV IV IV Full Full 25°C 25°C Full Full Full Full IV IV V V IV IV IV IV Full Full 25°C 25°C Full Full Full 25°C 25°C 25°C VI VI V V VI IV IV V V V Min 170 AD9430-170 Typ Max 40 12.5 12.5 2 2 –0.5 1.75 2 –0.5 All ac specifications tested by differentially driving CLK+ and CLK−. DS inputs used in CMOS mode only. Rev. E | Page 8 of 44 AD9430-210 Typ Max 40 12.5 12.5 2 2 –0.5 1.75 2 3.8 1 1 3.8 0 14, 14 15, 14 5 5 +0.5 2.0 1.8 0.2 Min 210 –0.5 3.8 1 1 3.8 0 14, 14 15, 14 5 3.2 0.5 0.5 2.7 0.5 14 1.2 0.25 4.3 5 +0.5 2.0 3.2 0.5 0.5 2.7 0.5 14 1.2 0.25 4.3 3.8 0.8 1 1.8 0.2 3.8 0.8 1 Unit MSPS MSPS ns ns ns ns ns ns ns ns ns ns Cycles Cycles ns ns ns ns ns ns Cycles ns ps rms Cycles AD9430 TIMING DIAGRAMS CLK+ CLK– DS+ DS– tSDS tHDS PORT A DA11–DA0 STATIC PORT B DB11–DB0 STATIC tPD 14 CYCLES INTERLEAVED DATA OUT INVALID tV N N+2 INVALID INVALID N+1 N+3 PARALLEL DATA OUT PORT A DA11–DA0 STATIC INVALID INVALID N N+2 PORT B DB11–DB0 STATIC INVALID INVALID N+1 N+3 tCPD 02607-002 DCO– STATIC DCO+ Figure 2. CMOS Timing Diagram N–1 N N+1 AIN tEL tEH 1/fS CLK+ CLK– tPD N–14 DATA OUT N–13 N N+1 14 CYCLES 02607-003 DCO+ DCO– tCPD Figure 3. LVDS Timing Diagram Rev. E | Page 9 of 44 AD9430 ABSOLUTE MAXIMUM RATINGS Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 5. Parameter AVDD, DRVDD Analog Inputs Digital Inputs REFIN Inputs Digital Output Current Operating Temperature Range Storage Temperature Range Maximum Junction Temperature Maximum Case Temperature θJA 1 1 Rating 4V −0.5 V to AVDD + 0.5 V −0.5 V to DRVDD + 0.5 V –0.5 V to AVDD + 0.5 V 20 mA −40°C to +85°C −65°C to +150°C 150°C 150°C 25°C/W, 32°C/W EXPLANATION OF TEST LEVELS Table 6. Level I II Typical θJA = 32°C/W (heat slug not soldered); typical θJA = 25°C/W (heat slug soldered) for multilayer board in still air with solid ground plane. III IV V VI Description 100% production tested. 100% production tested at 25°C and sample tested at specified temperatures. Sample tested only. Parameter is guaranteed by design and characterization testing. Parameter is a typical value only. 100% production tested at 25°C; guaranteed by design and characterization testing for industrial temperature range; 100% production tested at temperature extremes for military devices. ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. Rev. E | Page 10 of 44 AD9430 DA5 DA6 DA7 DA8 DA9 DA10 DRGND DRVDD DA11 OR_A AGND AGND AVDD AVDD AVDD AGND AGND AGND AVDD AVDD AGND AGND AVDD AVDD AGND PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 DRVDD 74 DRGND 3 73 DA4 AGND 4 72 DA3 S2 5 71 DA2 S1 6 70 DA1 DNC 7 69 DA0 AVDD 8 68 DNC 67 DRGND 66 DNC 65 DNC 64 DCO+ AGND 13 63 DCO– AVDD 14 62 DRVDD AVDD 15 61 DRGND AGND 16 60 OR_B AGND 17 59 DB11 AVDD 18 58 DB10 AVDD 19 57 DB9 AGND 20 56 DB8 VIN+ 21 55 DB7 VIN– 22 54 DRVDD AGND 23 53 DRGND AVDD 24 52 DB6 AGND 25 51 DB5 S5 1 DNC 2 S4 PIN 1 AD9430 AGND 9 SENSE 10 CMOS PINOUT TOP VIEW (Not to Scale) VREF 11 AGND 12 NOTES 1. THE AD9430 HAS A CONDUCTIVE HEAT SLUG TO HELP DISSIPATE HEAT AND ENSURE RELIABLE OPERATION OF THE DEVICE OVER THE FULL INDUSTRIAL TEMPERATURE RANGE. THE SLUG IS EXPOSED ON THE BOTTOM OF THE PACKAGE AND ELECTRICALLY CONNECTED TO CHIP GROUND. IT IS RECOMMENDED THAT NO PCB SIGNAL TRACES OR VIAS BE LOCATED UNDER THE PACKAGE THAT COULD COME IN CONTACT WITH THE CONDUCTIVE SLUG. ATTACHING THE SLUG TO A GROUND PLANE WILL REDUCE THE JUNCTION TEMPERATURE OF THE DEVICE WHICH MAY BE BENEFICIAL IN HIGH TEMPERATURE ENVIRONMENTS. 02607-004 DB4 DB3 DRGND DRVDD DB2 DB1 DB0 DNC DNC AGND AVDD AVDD AGND CLK– CLK+ AGND AVDD DS– DS+ AGND AGND AVDD AVDD AVDD AGND 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 Figure 4. CMOS Dual-Mode Pin Configuration Table 7. CMOS Mode Pin Function Descriptions Pin Number 1 Mnemonic S5 2, 7, 42, 43, 65, 66, 68 3 4, 9, 12, 13, 16, 17, 20, 23, 25, 26, 30, 31, 35, 38, 41, 86, 87, 91, 92, 93, 96, 97, 100 5 6 DNC S4 AGND1 8, 14, 15, 18, 19, 24, 27, 28, 29, 34, 39, 40, 88, 89, 90, 94, 95, 98, 99 10 11 21 22 32 33 AVDD Output Mode Select. Low = dual-port CMOS, high = LVDS. Data Format Select. Low = binary, high = twos complement for both CMOS and LVDS modes. 3.3 V Analog Supply. SENSE VREF VIN+ VIN– DS+ DS–2 Reference Mode Select Pin. Float for internal reference operation. 1.235 V Reference I/O—Function Dependent on SENSE. Analog Input—True. Analog Input—Complement. Data Sync (Input)—True. Tie low if not used. Data Sync (Input)—Complement. Tie high if not used. S2 S1 Description Full-Scale Adjust Pin. AVDD sets fS = 0.768 V p-p differential, GND sets fS = 1.536 V p-p differential. Do Not Connect. Interleaved, Parallel Select Pin. High = interleaved. Analog Ground. Rev. E | Page 11 of 44 AD9430 Pin Number 36 37 44 45 46 47, 54, 62, 75, 83 48, 53, 61, 67, 74, 82 49 50 51 52 55 56 57 58 59 60 63 64 69 70 71 72 73 76 77 78 79 80 81 84 85 1 2 Mnemonic CLK+ CLK– DB0 DB1 DB2 DRVDD DRGND1 DB3 DB4 DB5 DB6 DB7 DB8 DB9 DB10 DB11 OR_B DCO– DCO+ DA0 DA1 DA2 DA3 DA4 DA5 DA6 DA7 DA8 DA9 DA10 DA11 OR_A Description Clock Input—True. Clock Input—Complement. B Port Output Data Bit (LSB). B Port Output Data Bit. B Port Output Data Bit. 3.3 V Digital Output Supply (3.0 V to 3.6 V). Digital Output Ground. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit. B Port Output Data Bit (MSB). B Port Overrange. Data Clock Output—Complement. Data Clock Output—True. A Port Output Data Bit (LSB). A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit. A Port Output Data Bit (MSB). A Port Overrange. AGND and DRGND should be tied together to a common ground plane. DS Complement (DS−); can be tied to AVDD (as recommended) or left floating with no ill effects. Rev. E | Page 12 of 44 D9– D9+ D10– D10+ D11– D11+ DRGND DRVDD OR– OR+ AGND AGND AVDD AVDD AVDD AGND AGND AGND AVDD AVDD AGND AGND AVDD AVDD AGND AD9430 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 DRVDD 74 DRGND 3 73 D8+ AGND 4 72 D8– S2 5 71 D7+ S1 6 70 D7– LVDSBIAS 7 69 D6+ AVDD 8 68 D6– 67 DRGND 66 D5+ 65 D5– 64 DCO+ AGND 13 63 DCO– AVDD 14 62 DRVDD AVDD 15 61 DRGND AGND 16 60 D4+ AGND 17 59 D4– AVDD 18 58 D3+ AVDD 19 57 D3– AGND 20 56 D2+ VIN+ 21 55 D2Ð VIN– 22 54 DRVDD AGND 23 53 DRGND AVDD 24 52 D1+ AGND 25 51 D1– S5 1 DNC 2 S4 PIN 1 AD9430 AGND 9 SENSE 10 LVDS PINOUT TOP VIEW (Not to Scale) VREF 11 AGND 12 NOTES 1. THE AD9430 HAS A CONDUCTIVE HEAT SLUG TO HELP DISSIPATE HEAT AND ENSURE RELIABLE OPERATION OF THE DEVICE OVER THE FULL INDUSTRIAL TEMPERATURE RANGE. THE SLUG IS EXPOSED ON THE BOTTOM OF THE PACKAGE AND ELECTRICALLY CONNECTED TO CHIP GROUND. IT IS RECOMMENDED THAT NO PCB SIGNAL TRACES OR VIAS BE LOCATED UNDER THE PACKAGE THAT COULD COME IN CONTACT WITH THE CONDUCTIVE SLUG. ATTACHING THE SLUG TO A GROUND PLANE WILL REDUCE THE JUNCTION TEMPERATURE OF THE DEVICE WHICH MAY BE BENEFICIAL IN HIGH TEMPERATURE ENVIRONMENTS. 02607-005 D0+ D0– DRGND DRVDD DNC DNC DNC DNC DNC AGND AVDD AVDD AGND CLK– CLK+ AGND AVDD AVDD GND AGND AGND AVDD AVDD AVDD AGND 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 Figure 5. LVDS Mode Pin Configuration Table 8. LVDS Mode Pin Function Descriptions Pin Number 1 Mnemonic S5 2, 42 to 46 3 DNC S4 4, 9, 12, 13, 16, 17, 20, 23, 25, 26, 30, 31, 35, 38, 41, 86, 87, 91, 92, 93, 96, 97, 100 5 6 7 AGND1 8, 14, 15, 18, 19, 24, 27, 28, 29, 33, 34, 39, 40, 88, 89, 90, 94, 95, 98, 99 10 AVDD2 11 21 VREF VIN+ S2 S1 LVDSBIAS SENSE Description Full-Scale Adjust Pin. AVDD sets fS = 0.768 V p-p differential, GND sets fS = 1.536 V p-p differential. Do Not Connect. Control Pin for CMOS Mode. Tie low when operating in LVDS mode. Analog Ground. Output Mode Select. GND = dual-port CMOS; AVDD = LVDS. Data Format Select. GND = binary, AVDD = twos complement. Set Pin for LVDS Output Current. Place 3.74 kW resistor terminated to ground. 3.3 V Analog Supply. Reference Mode Select Pin. Float for internal reference operation. 1.235 V Reference I/O—Function Dependent on SENSE. Analog Input—True. Rev. E | Page 13 of 44 AD9430 Pin Number 22 32 36 37 47, 54, 62, 75, 83 48, 53, 61, 67, 74, 82 49 50 51 52 55 56 57 58 59 60 63 64 65 66 68 69 70 71 72 73 76 77 78 79 80 81 84 85 1 2 Mnemonic VIN– GND CLK+ CLK– DRVDD DRGND1 D0– D0+ D1– D1+ D2– D2+ D3– D3+ D4– D4+ DCO– DCO+ D5– D5+ D6– D6+ D7– D7+ D8– D8+ D9– D9+ D10– D10+ D11– D11+ OR– OR+ Description Analog Input—Complement. Data Sync (Input)—Not Used in LVDS Mode. Tie to GND. Clock Input—True (LVPECL Levels). Clock Input—Complement (LVPECL Levels). 3.3 V Digital Output Supply (3.0 V to 3.6 V). Digital Output Ground. D0 Complement Output Bit (LSB). D0 True Output Bit (LSB). D1 Complement Output Bit. D1 True Output Bit. D2 Complement Output Bit. D2 True Output Bit. D3 Complement Output Bit. D3 True Output Bit. D4 Complement Output Bit. D4 True Output Bit. Data Clock Output—Complement. Data Clock Output—True. D5 Complement Output Bit. D5 True Output Bit. D6 Complement Output Bit. D6 True Output Bit. D7 Complement Output Bit. D7 True Output Bit. D8 Complement Output Bit. D8 True Output Bit. D9 Complement Output Bit. D9 True Output Bit. D10 Complement Output Bit. D10 True Output Bit. D11 Complement Output Bit. D11 True Output Bit. Overrange Complement Output Bit. Overrange True Output Bit. AGND and DRGND should be tied together to a common ground plane. Pin 33 can be tied to AVDD (as recommended) or left floating with no ill effects Rev. E | Page 14 of 44 AD9430 EQUIVALENT CIRCUITS FULL SCALE K AVDD S5 = 0 —> K = 1.24 S5 = 1 —> K = 0.62 12kΩ CLK+ OR DS+ 150Ω 0.1μF VREF 12kΩ – + CLK– OR DS– 150Ω A1 1V 200Ω 10kΩ SENSE 1kΩ DISABLE A1 VDD 02607-009 02607-080 10kΩ Figure 6. ENCODE and DS Input Figure 9. VREF, SENSE I/O AVDD DRVDD 3.5kΩ 3.5kΩ DX VIN– VIN+ 02607-007 20kΩ Figure 7. Analog Inputs 02607-010 20kΩ Figure 10. Data Outputs (CMOS Mode) DRVDD VDD S1, S2, S4, S5 V V DX– DX+ V V 02607-008 02607-011 30kΩ Figure 8. S1 to S5 Inputs Figure 11. Data Outputs (LVDS Mode) Rev. E | Page 15 of 44 AD9430 TYPICAL PERFORMANCE CHARACTERISTICS Charts at 170 MSPS, 210 MSPS for –170, –210 grades, respectively. AVDD, DRVDD = 3.3 V, T = 25°C, AIN differential drive, full scale = 1.536 V, internal reference unless otherwise noted. 0 0 SNR = 65.2dB SINAD = 65.1dB H2 = –88.8dBc H3 = –88.1dBc SFDR = 87dBc –20 –30 –20 –30 dB –40 –50 –50 –60 –60 –70 –70 –80 –80 –90 –100 –100 10 20 30 40 MHz 50 60 70 80 85 02607-012 –90 0 Figure 12. FFT: fs = 170 MSPS, AIN = 10.3 MHz @ −0.5 dBFS, LVDS Mode 30 40 MHz 50 60 80 85 70 0 SNR = 65.1dB SINAD = 64.9dB FUND = –0.50dBFS H2 = –88.6dBc H3 = –94.6dBc SFDR = 85.9dBc –10 –20 –30 SNR = 63.6dB SINAD = 62.9dB H2 = –82.5dBc H3 = –78.6dBc SFDR = 77.7dBc –10 –20 –30 –40 –50 –50 –60 –60 –70 –70 –80 –80 –90 –90 0 10 20 30 40 MHz 50 60 70 80 85 –100 02607-013 –100 Figure 13. FFT: fs = 170 MSPS, AIN = 65 MHz @ –0.5 dBFS, LVDS Mode 0 15 30 45 60 75 90 105 MHz 02607-016 dB –40 dB 20 Figure 15. FFT: fs = 170 MSPS, AIN = 10.3 MHz @ –0.5 dBFS, Single-Ended Input, Full Scale = 0.76 V, LVDS Mode 0 Figure 16. FFT: fs = 210 MSPS, AIN = 10.3 MHZ @ –0.5 dBFS, LVDS Mode 0 0 SNR = 64.93dB SINAD = 64.85dB FUND = –0.44dBFS H2 = –92.1dBc H3 = –90.1dBc SFDR = 75.6dBc –10 –20 –30 SNR = 63.1dB SINAD = 62.8dB H2 = –81.1dBc H3 = –76dBc SFDR = –76dBc –10 –20 –30 –40 dB –40 –50 –50 –60 –60 –70 –70 –80 –80 –90 –90 –100 0 10 20 30 40 MHz 50 60 70 80 85 –100 02607-015 dB 10 Figure 14. FFT: fs = 170 MSPS, AIN = 65 MHz @ –0.5 dBFS, CMOS Mode 0 15 30 45 60 MHz 75 90 105 02607-017 dB –40 0 SNR = 62.99dBFS SINAD = 61.45dBFS H2 = –66.8dBc H3 = –82.5dBc SFDR = 66.1dBc –10 02607-015 –10 Figure 17. FFT: fs = 210 MSPS, AIN = 65 MHz @ –0.5 dBFS, CMOS Mode Rev. E | Page 16 of 44 AD9430 0 0 SNR = 63.5dB SINAD = 62.6dB H2 = –79dBc H3 = –76.1dBc SFDR = 75.2dBc –20 –30 –30 –40 –40 dB dB –20 –50 –50 –60 –60 –70 –70 –80 –80 –90 –100 15 30 45 60 75 90 105 MHz 02607-018 –90 –100 0 SNR = 63.3dB SINAD = 63.1dB H2 = –80.38dBc H3 = –81.8dBc SFDR = 80.8dBc –10 Figure 18. FFT: fs = 210 MSPS, AIN = 65 MHz @ –0.5 dBFS, LVDS Mode 0 15 30 45 60 75 90 105 MHz 02607-021 –10 Figure 21. FFT: fs = 213 MSP, AIN = 100 MHz @ –0.5 dBFS, LVDS Mode 85 85 80 80 SFDR 75 75 70 70 65 65 dB dB SNR SNR 60 60 55 55 SINAD SINAD FULL SCALE = 0.75 50 45 45 0 50 100 150 200 250 300 350 400 AIN (MHz) 40 02607-019 40 0 50 100 150 200 250 300 350 400 AIN (MHz) Figure 19. SNR, SINAD, and SFDR vs. AIN Frequency, fS = 210 MSPS, AIN @ –0.5 dBFS, LVDS Mode 02607-022 FULL SCALE = 1.5 50 Figure 22. SNR and SINAD vs. AIN Frequency, fs = 210 MSPS, AIN @ –0.5 dBFS, LVDS Mode, Full Scale = 0.76 V 100 100 THIRD 90 90 80 80 THIRD 70 60 60 50 50 40 50 100 150 200 250 AIN (MHz) 300 350 400 40 0 50 100 150 200 250 AIN (MHz) 300 350 Figure 23. Harmonic Distortion (2nd and 3rd) and SFDR vs. AIN Frequency, fs = 170 MSPS, CMOS Mode Figure 20. Harmonic Distortion (2nd and 3rd) and SFDR vs. AIN Frequency Rev. E | Page 17 of 44 400 02607-023 dB SFDR 70 0 SECOND SECOND 02607-020 dB SFDR AD9430 70 0 68 66 –170 SNR –30 64 62 dB dB –210 SNR 60 –60 SFDR = 63dBc 58 –210 SINAD 56 –90 –170 SINAD 54 02607-024 52 0 50 100 150 200 250 AIN (MHz) 300 350 400 Figure 24. SNR and SINAD vs. AIN Frequency, fs = 170 MSPS/210 MSPS, AIN @ –0.5 dBFS, LVDS Mode –120 0 10 20 30 40 50 60 MHz 70 80 90 100 02607-027 50 Figure 27. Two-Tone Intermodulation Distortion (59 MHz and 60 MHz), LVDS Mode, fs = 210 MSPS 85 95 80 90 75 85 SFDR 70 SFDR 80 65 75 dB dB SNR 60 70 55 65 SINAD SINAD 50 60 45 0 50 100 150 200 250 300 350 400 AIN (MHz) 50 02607-025 40 0 50 100 150 200 250 MHz 02607-028 55 Figure 28. SINAD and SFDR vs. Clock Rate (AIN = 10.3 MHz @ –0.5 dBFS, LVDS Mode), –170 Grade Figure 25. SNR and SINAD, SFDR vs. AIN Frequency, fs = 210 MSPS, AIN @ –0.5 dBFS, CMOS Mode 85 0 SFDR = 75dBc –10 80 –20 75 70 –40 SNR 65 dB dB –30 SFDR –50 SINAD 60 –60 55 –70 50 –80 0 10 20 30 40 50 MHz 60 70 80 85 02607-026 –100 40 0 50 100 150 200 MHz Figure 26. Two-Tone Intermodulation Distortion (28.3 MHz and 29.3 MHz, LVDS Mode, fs = 170 MSPS) Figure 29. SNR and SINAD, SFDR vs. Clock Rate (AIN = 10.3 MHz, @ –0.5 dBFS), LVDS Mode, –210 Grade Rev. E | Page 18 of 44 250 02607-029 45 –90 AD9430 80 OUTPUT SUPPLY CURRENT LVDS MODE 200 40 150 100 20 OUTPUT SUPPLY CURRENT CMOS MODE 50 0 100 120 140 160 180 ENCODE (MSPS) 0 220 200 70 SINAD 55 50 20 60 250 50 OUTPUT SUPPLY CURRENT LVDS MODE 200 40 150 30 OUTPUT SUPPLY CURRENT CMOS MODE 100 20 50 10 0 100 0 120 140 160 180 200 220 60 70 80 1.2 RO = 13Ω TYP 1.0 VREFOUT (V) 300 70 50 1.4 IDRVDD (OUTPUT SUPPLY CURRENT) (mA) ANALOG SUPPLY CURRENT CMOS MODE 40 Figure 33. SNR, SINAD, and SFDR vs. ENCODE Pulse Width High, (AIN = 10.3 MHz @ –0.5 dBFS, 210 MSPS, LVDS) 240 0.8 0.6 0.4 0.2 02607-031 80 350 0 0 1 2 ENCODE (MSPS) 3 5 4 6 7 8 ILOAD (mA) Figure 34. VREFOUT vs. ILOAD Figure 31. IAVDD and IDRVDD vs. Clock Rate (AIN = 10.3 MHz @ –0.5 dBFS), 210 MSPS Grade, CLOAD = 5 pF 85 2.0 1.5 80 SFDR 1.0 GAIN ERROR (%) 75 70 dB SNR 65 SINAD 60 0.5 % GAIN ERROR USING EXT REF 0 –0.5 –1.0 55 50 10 20 30 40 50 60 70 ENCODE POSITIVE DUTY CYCLE (%) 80 90 –2.0 –50 –30 –10 10 30 50 TEMPERATURE (°C) 70 90 95 Figure 35. Full-Scale Gain Error vs. Temperature (AIN = 10.3 MHz @ –0.5 dBFS, 170 MSPS/210 MSPS, LVDS) Figure 32. SINAD and SFDR vs. Clock Pulse Width High (AIN = 10.3 MHz @ –0.5 dBFS, 170 MSPS, LVDS) Rev. E | Page 19 of 44 02607-035 –1.5 02607-032 IAVDD (ANALOG SUPPLY CURRENT) (mA) 400 30 ENCODE POSITIVE DUTY CYCLE (%) 90 ANALOG SUPPLY CURRENT LVDS MODE SNR 60 Figure 30. IAVDD and IDRVDD vs. Clock Rate (AIN = 10.3 MHz @ –0.5 dBFS) 170 MSPS Grade, CLOAD = 5 pF 450 65 02607-033 ANALOG SUPPLY CURRENT LVDS MODE 250 02607-034 60 300 SFDR 75 dB 350 IDRVDD (OUTPUT SUPPLY CURRENT) (mA) 80 ANALOG SUPPLY CURRENT CMOS MODE 02607-030 IAVDD (ANALOG SUPPLY CURRENT) (mA) 400 AD9430 1.250 1.00 0.75 1.245 0.25 1.240 LSB VREF (V) 0.50 1.235 0 –0.25 –0.50 1.230 2.7 2.9 3.1 3.3 AVDD (V) 3.5 3.7 –1.00 02607-036 1.225 2.5 3.9 Figure 36. VREF Output Voltage vs. AVDD 0 500 1000 1500 2000 CODE 2500 3000 3500 4000 02607-039 –0.75 Figure 39. Typical INL Plot (AIN = 10.3 MHz @ –0.5 dBFS, 170 MSPS, LVDS) 95 1.00 THIRD 0.75 90 SECOND 0.50 85 SFDR 0.25 dB LSB 80 0 75 –0.25 70 –0.50 SNR 60 –50 –30 –10 10 30 50 TEMPERATURE (°C) 70 90 –1.00 0 1000 1500 2000 CODE 2500 3000 3500 4000 Figure 40. Typical DNL Plot (AIN = 10.3 MHz @ –0.5 dBFS) Figure 37. SNR, SINAD, and SFDR vs. Temperature (AIN = 10.3 MHz @ –0.5 dBFS, 170 MSPS) 100 65 64 90 AVDD = 3.6 SFDR –dBFS 80 63 AVDD = 3.3 70 61 60 dB 62 60 50 AVDD = 3.135 40 58 30 SFDR –dBc 80dB REFERENCE LINE AVDD = 3.0 57 20 56 10 55 –45 –25 –5 15 35 55 TEMPERATURE (°C) 75 0 –100 –90 –80 –70 –60 –50 –40 –30 –20 ANALOG INPUT LEVEL (dBFS) Figure 41. SFDR vs. AIN Input Level , AIN @ 10.3 MHz, 170 MSPS, LVDS Mode Figure 38. SINAD vs. Temperature, AVDD (AIN = 70 MHz @ –0.5 dB, 210 MSPS, LVDS Mode) Rev. E | Page 20 of 44 –10 0 02607-041 59 02607-038 dB 500 02607-040 –0.75 SINAD 02607-037 65 AD9430 90 0 80 –20 70 SFDR dBc LVDS MODE FULL SCALE = 1.5 60 –40 dB dB 50 SFDR dBc CMOS MODE FULL SCALE = 1.5 40 19.2 –60 30 –80 20 80dB REFERENCE LINE 10 –70 –60 –50 –40 –30 –20 0 –10 19.2 38.4 47.6 MHz Figure 42. SFDR vs. AIN Input Level, AIN @ 10.3 MHz, 210 MSPS, LVDS/CMOS Modes 02607-045 –80 –100 02607-042 0 –90 Figure 45. W-CDMA Four Channels Centered at 38.4 MHz, fs = 153.6 MHz, LVDS Mode 90 90 80 80 SFDR SNR 70 70 SFDR dBc LVDS MODE FULL SCALE = 1.5 60 60 SINAD 50 dB dB 50 40 40 SFDR dBc LVDS MODE FULL SCALE = 0.75 30 30 20 20 80dB REFERENCE LINE 10 –70 –60 –50 –40 –30 –20 –10 0 0 0 0.5 1.0 1.5 2.0 2.5 FULL-SCALE RANGE (V) Figure 46. SNR, SINAD, and SFDR vs. Full-Scale Range, S5 = 0, Full-Scale Range Varied by Adjusting VREF, 170 MSPS Figure 43. SFDR vs. AIN Input Level, AIN @ 10.3 MHz, 210 MSPS, LVDS Mode, Full Scale = 0.76 V/1.536 V 4.5 0 NPR = 56.95dB ENCODE = 170MSPS NOTCH @ 19MHz 4.0 –40 ns –60 3.5 –80 TPD –100 3.0 –140 2.65 21.25 MHz 42.5 2.5 –40 –20 0 20 40 TEMPERATURE (°C) 60 80 100 Figure 47. Propagation Delay vs. Temperature, LVDS Mode, 170 MSPS/210 MSPS Figure 44. Noise Power Ratio Plot Rev. E | Page 21 of 44 02607-047 TCPD –120 02607-044 NOISE INPUT LEVEL (dB) –20 02607-046 –80 02607-043 10 0 –90 AD9430 4.5 900 1.4 800 1.3 TPDR (DATA RISING) 3.0 2.5 –40 –20 0 20 40 60 80 TEMPERATURE (°C) 100 Figure 48. Propagation Delay vs. Temperature, CMOS Mode, 170 MSPS/210 MSPS 700 1.2 600 1.1 500 1.0 400 0.9 VOD 300 0.8 200 0.7 100 0.6 0 0 2 4 6 8 10 12 0.5 14 RSET (kΩ) Figure 49. LVDS Output Swing, Common-Mode Voltage vs. RSET, Placed at LVDSBIAS, 170 MSPS/210 MSPS Rev. E | Page 22 of 44 02607-049 VDIF (mV) TPDF (DATA FALLING) 3.5 02607-048 ns 4.0 VOS (V) VOS TCPD (CLOCKOUT RISING) AD9430 TERMINOLOGY Analog Bandwidth The analog input frequency at which the spectral power of the fundamental frequency (as determined by the FFT analysis) is reduced by 3 dB. Aperture Delay The delay between the 50% point of the rising edge of the ENCODE command and the instant at which the analog input is sampled. Aperture Uncertainty (Jitter) The sample-to-sample variation in aperture delay. Full-Scale Input Power Expressed in dBm. Computed using the following equation: PowerFULL SCALE ⎞ ⎟ ⎟ ⎟ ⎟ ⎠ Gain Error The difference between the measured and ideal full-scale input voltage range of the ADC. Harmonic Distortion, Second The ratio of the rms signal amplitude to the rms value of the second harmonic component, reported in dBc. Crosstalk Coupling onto one channel being driven by a low level (–40 dBFS) signal when the adjacent interfering channel is driven by a full-scale signal. Differential Analog Input Resistance, Differential Analog Input Capacitance, and Differential Analog Input Impedance The real and complex impedances measured at each analog input port. The resistance is measured statically and the capacitance and differential input impedances are measured with a network analyzer. Differential Analog Input Voltage Range The peak-to-peak differential voltage that must be applied to the converter to generate a full-scale response. Peak differential voltage is computed by observing the voltage on a single pin and subtracting the voltage from the other pin, which is 180° out of phase. Peak-to-peak differential is computed by rotating the input phase 180° and again taking the peak measurement. The difference is then computed between both peak measurements. Differential Nonlinearity The deviation of any code width from an ideal 1 LSB step. Harmonic Distortion, Third The ratio of the rms signal amplitude to the rms value of the third harmonic component, reported in dBc. Integral Nonlinearity The deviation of the transfer function from a reference line measured in fractions of 1 LSB using a best straight line determined by a least square curve fit. Minimum Conversion Rate The ENCODE rate at which the SNR of the lowest analog signal frequency drops by no more than 3 dB below the guaranteed limit. Maximum Conversion Rate The ENCODE rate at which parametric testing is performed. Output Propagation Delay The delay between a differential crossing of CLK+ and CLK– and the time when all output data bits are within valid logic levels. Noise (for Any Range Within the ADC) Calculated as follows: Effective Number of Bits (ENOB) Calculated from the measured SNR based on the equation ENOB = ⎛ 2 ⎜ V FULL SCALE rms = 10 log ⎜ Z INPUT ⎜ ⎜ 0.001 ⎝ − SNRdBc − SignaldBFS ⎞ ⎛ FS VNOISE = Z × 0.001 × 10⎜ dBM ⎟ 10 ⎝ ⎠ SNRMEASURED − 1.76 dB 6.02 where: ENCODE Pulse Width/Duty Cycle Pulse width high is the minimum amount of time the ENCODE pulse (clock pulse) should be left in a Logic 1 state to achieve rated performance; pulse width low is the minimum time the ENCODE pulse should be left in a low state. See the timing implications of changing tEH in the Encode Input section. At a given clock rate, these specifications define an acceptable ENCODE duty cycle. Z is the input impedance. FS is the full scale of the device for the frequency in question. SNR is the value of the particular input level. Signal is the signal level within the ADC, reported in dB below full scale. This value includes input levels both thermal and quantization noise. Rev. E | Page 23 of 44 AD9430 Power Supply Rejection Ratio The ratio of a change in input offset voltage to a change in power supply voltage. Signal-to-Noise and Distortion (SINAD) The ratio of the rms signal amplitude (set 1 dB below full scale) to the rms value of the sum of all other spectral components, including harmonics but excluding dc. Signal-to-Noise Ratio (Without Harmonics) The ratio of the rms signal amplitude (set at 1 dB below full scale) to the rms value of the sum of all other spectral components, excluding the first five harmonics and dc. Spurious-Free Dynamic Range (SFDR) The ratio of the rms signal amplitude to the rms value of the peak spurious spectral component. The peak spurious component may or may not be a harmonic. Reported in dBc (degrades as signal level is lowered) or dBFS (always related back to converter full scale). Two-Tone Intermodulation Distortion Rejection The ratio of the rms value of either input tone to the rms value of the worst third-order intermodulation product; reported in dBc. Two-Tone SFDR The ratio of the rms value of either input tone to the rms value of the peak spurious component. The peak spurious component may or may not be an IMD product. Reported in dBc (degrades as signal level is lowered) or in dBFS (always related back to converter full scale). Worst Other Spur The ratio of the rms signal amplitude to the rms value of the worst spurious component (excluding the second and third harmonic) reported in dBc. Transient Response Time The time it takes for the ADC to reacquire the analog input after a transient from 10% above negative full scale to 10% below positive full scale. Out-of-Range Recovery Time The time it takes for the ADC to reacquire the analog input after a transient from 10% above positive full scale to 10% above negative full scale, or from 10% below negative full scale to 10% below positive full scale. Rev. E | Page 24 of 44 AD9430 APPLICATION NOTES THEORY OF OPERATION The AD9430 architecture is optimized for high speed and ease of use. The analog inputs drive an integrated high bandwidth track-and-hold circuit that samples the signal prior to quantization by the 12-bit core. For ease of use, the part includes an on-board reference and input logic that accepts TTL, CMOS, or LVPECL levels. The digital output logic levels are user selectable as standard 3 V CMOS or LVDS (ANSI-644 compatible) via Pin S2. with it that needs to be considered in applications where the clock rate can change dynamically, requiring a wait time of 1.5 μs to 5 μs after a dynamic clock frequency increase before valid data is available. This circuit is always on and cannot be disabled by the user. The clock inputs are internally biased to 1.5 V (nominal) and support either differential or single-ended signals. For best dynamic performance, a differential signal is recommended. An MC100LVEL16 performs well in the circuit to drive the clock inputs, as illustrated in Figure 50. (For trace lengths >2 inches, a standard LVPECL termination is recommended rather than the simple pull-down as shown.) Note that for this low voltage PECL device, the ac coupling is optional. ENCODE INPUT Any high speed ADC is extremely sensitive to the quality of the sampling clock provided by the user. A track-and-hold circuit is essentially a mixer, and any noise, distortion, or timing jitter on the clock is combined with the desired signal at the A/D output. For that reason, considerable care has been taken in the design of the clock inputs of the AD9430, and the user is advised to give careful thought to the clock source. 0.1μF PECL GATE CLK– The AD9430 has an internal clock duty cycle stabilization circuit that locks to the rising edge of CLK+ and optimizes timing internally. This allows for a wide range of input duty cycles at the input without degrading performance. Jitter in the rising edge of the input is still of paramount concern and is not reduced by the internal stabilization circuit. The duty cycle control loop does not function for clock rates less than 30 MHz nominally. The loop has a time constant associated 0.1μF 510Ω 02607-050 510Ω Figure 50. Driving Clock Inputs with LVEL16 In interleaved mode, output data on Port A is offset from output data changes on Port B by one-half output clock cycle, as shown in Figure 51. PARALLEL MODE 02607-051 INTERLEAVED MODE AD9430 CLK+ Figure 51. Table 9. Output Select Coding S1 1 (Data Format Select) 1 0 X X X X X 1 2 3 S21 (LVDS/CMOS Mode Select) 2 X X 0 0 1 X X S41 (I/P Select) X X 1 0 X X X X = don’t care. S4 used in CMOS mode only (S2 = 0). S1 to S5 all have 30 kΩ resistive pull-downs on chip. S5 full-scale adjust (see the Analog Input section). Rev. E | Page 25 of 44 S51 (Full-Scale Select) 3 X X X X X 1 0 Mode Twos complement Offset binary Dual-mode CMOS interleaved Dual-mode CMOS parallel LVDS mode Full scale = 0.768 V Full scale = 1.536 V AD9430 ANALOG INPUT DS INPUTS (DS+, DS–) The analog input to the AD9430 is a differential buffer. For best dynamic performance, impedances at VIN+ and VIN– should match. The analog input is optimized to provide superior wideband performance and requires that the analog inputs be driven differentially. SNR and SINAD performance degrades significantly if the analog input is driven with a singleended signal. In CMOS output mode, the data sync inputs (DS+, DS–) can be used in applications that require a given sample to appear at a specific output port (A or B) relative to a given external timing signal. The DS inputs can also be used to synchronize two or more ADCs in a system to maintain phasing between Port A and Port B on separate ADCs (in effect, synchronizing multiple DCO outputs). When DS+ is held high (DS– low), the ADC data outputs and clock do not switch and are held static. Synchronization is accomplished by the assertion (falling edge) of DS+ within the timing constraints tSDS and tHDS, relative to a clock rising edge. (On initial synchronization, tHDS is not relevant.) If DS+ falls within the required setup time (tSDS) before a given clock rising edge, N, the analog value at that point in time is digitized and available at Port A, 14 cycles later in interleaved mode. A wideband transformer such as the Mini-Circuit® ADT1-1WT can provide the differential analog inputs for applications that require a single-ended-to-differential conversion. Both analog inputs are self-biased by an on-chip resistor divider to a nominal 2.8 V. (See the Equivalent Circuits section.) Special care was taken in the design of the analog input section of the AD9430 to prevent damage and corruption of data when the input is overdriven. The nominal differential input range is approximately 1.5 V p-p ~ (768 mV × 2). Note that the best SNR performance is achieved with S5 = 0 (full scale = 1.5). S5 = GND VIN+ 768mV 2.8V 2.8V VIN– The very next sample, N + 1, is sampled by the next rising clock edge and available at Port B, 14 cycles after that clock edge. In dual-parallel mode, Port A has a 15-cycle latency and Port B has a 14-cycle latency, but data is available at the same time. Driving the DS inputs of each ADC by the same sync signal accomplishes this. An easy way to accomplish synchronization is by a one-time sync at power-on reset. Note that when running the AD9430 in LVDS mode, set DS+ to ground and DS– to 3.3 V, as the DS inputs are relevant only in CMOS output mode, simplifying the design for some applications as well as affording superior SNR/SINAD performance at higher encode/analog frequencies. CMOS OUTPUTS DIGITALOUT = ALL 0s 02607-052 DIGITALOUT = ALL 1s Figure 52. Differential Analog Input Range S5 = AVDD VIN+ 2.8V 768mV 2.8V 02607-053 VIN– = 2.8V The off-chip drivers on the chip can be configured to provide CMOS-compatible output levels via Pin S2. The CMOS digital outputs (S2 = 0) are TTL/CMOS compatible for lower power consumption. The outputs are biased from a separate supply (DRVDD), allowing easy interface to external logic. The outputs are CMOS devices that swing from ground to DRVDD (with no dc load). It is recommended to minimize the capacitive load the ADC drives by keeping the output traces short (<1 inch, for a total CLOAD < 5 pF). When operating in CMOS mode, it is also recommended to place low value (20 Ω) series damping resistors on the data lines to reduce switching transient effects on performance. Figure 53. Single-Ended Analog Input Range Rev. E | Page 26 of 44 AD9430 LVDS OUTPUTS CLOCK OUTPUTS (DCO+, DCO–) The input ENCODE is divided by two (in CMOS mode) and available off chip at DCO+ and DCO–. These clocks can facilitate latching off chip, providing a low skew clocking solution (see Figure 2). The on-chip clock buffers should not drive more than 5 pF of capacitance to limit switching transient effects on performance. Note that the output clocks are CMOS levels when CMOS mode is selected (S2 = 0) and are LVDS levels when in LVDS mode (S2 = VDD), requiring a 100 Ω differential termination at receiver in LVDS mode. The output clock in LVDS mode switches at the ENCODE rate. K FULL SCALE S5 = 0 —> K = 1.24 S5 = 1 —> K = 0.62 0.1μF VREF + 1V A1 EXTERNAL 1.23V + REFERENCE 200Ω 1kΩ DISABLE A1 SENSE + 3.3V VDD 02607-054 The off-chip drivers on the chip can be configured to provide LVDS-compatible output levels via Pin S2. LVDS outputs are available when S2 = VDD and a 3.74 kΩ RSET resistor is placed at Pin 7 (LVDSBIAS) to ground. The RSET resistor current is ratioed on-chip, setting the output current at each output equal to a nominal 3.5 mA (11 × IRSET). A 100 Ω differential termination resistor placed at the LVDS receiver inputs results in a nominal 350 mV swing at the receiver. LVDS mode facilitates interfacing with LVDS receivers in custom ASICs and FPGAs that have LVDS capability for superior switching performance in noisy environments. Single point-to-point net topologies are recommended with a 100 Ω termination resistor as close to the receiver as possible. It is recommended to keep the trace length three to four inches maximum and to keep differential output trace lengths as equal as possible. Figure 54. Using an External Reference NOISE POWER RATIO TESTING (NPR) NPR is a test that is commonly used to characterize the return path of cable systems where the signals are typically QAM signals with a noise-like frequency spectrum. NPR performance of the AD9430 was characterized in the lab yielding an effective NPR = 56.9 dB at an analog input of 19 MHz. This agrees with a theoretical maximum NPR of 57.1 dB for an 11-bit ADC at 13.6 dB backoff. The rms noise power of the signal inside the notch is compared with the rms noise level outside the notch using an FFT. Sufficiently long record lengths to guarantee a sufficient number of samples inside the notch are a requirement, as well as a high order band-stop filter that provides the required notch depth for testing. VOLTAGE REFERENCE A stable and accurate 1.23 V voltage reference is built into the AD9430 (VREF). The analog input full-scale range is linearly proportional to the voltage at VREF. Note that an external reference can be used by connecting the SENSE pin to VDD (disabling internal reference) and driving VREF with the external reference source. No appreciable degradation in performance occurs when VREF is adjusted ±5%. A 0.1 μF capacitor to ground is recommended at the VREF pin in internal and external reference applications. Float the SENSE pin for internal reference operation. Rev. E | Page 27 of 44 AD9430 EVALUATION BOARD, CMOS MODE The AD9430 evaluation board offers an easy way to test the AD9430 in CMOS mode. It requires a clock source, an analog input signal, and a 3.3 V power supply. The clock source is buffered on the board to provide the clocks for the ADC, latches, and data ready signals. The digital outputs and output clocks are available at two 40-pin connectors, P3 and P23. The PCB interfaces directly with ADI standard dual-channel data capture board (HSC-ADC-EVAL-DC) which, together with ADI ADC Analyzer software, allows for quick ADC evaluation. The board has several different modes of operation and is shipped in the following configurations: • • • • Offset binary Internal voltage reference CMOS parallel timing Full-scale adjust = low Full scale is set at E17, E18, and E19. Connecting E17 to E18 sets S5 low, full scale = 1.5 V differential; connecting E17 to E19 sets S5 high, full scale = 0.75 V differential. ENCODE The ENCODE clock is terminated to ground through 50 Ω at SMB Connector J5. The input is ac coupled to a high speed differential receiver (LVEL16) that provides the required low jitter, fast edge rates needed for optimum performance. J5 input should be >0.5 V p-p. Power to the EL16 is set at Jumper E47. Connecting E47 to E45 powers the buffer from AVDD; connecting E47 to E46 powers the buffer from VCLK/V_XTAL. VOLTAGE REFERENCE POWER CONNECTOR Power is supplied to the board via a detachable 12-lead power strip (three 4-pin blocks). AVDD, DRVDD, and VDL are the minimum required power connections. Table 10. Power Connector, CMOS Mode AVDD 3.3 V DRVDD 3.3 V VDL 3.3 V EXT_VREF VCLK/V_XTAL VAMP GAIN Analog supply for ADC (350 mA) Output supply for ADC (28 mA) Supply for support logic and DAC (350 mA) Optional external reference input Supply for clock buffer/optional CRYSTAL Supply for optional amp The AD9430 has an internal 1.23 V voltage reference. The ADC uses the internal reference as the default when jumpers E24 to E27 and E25 to E26 are left open. The full scale can be increased by placing optional Resistor R3. The required value varies with the process and needs to be tuned for the specific application. Full scale can similarly be reduced by placing R4; tuning is required here as well. An external reference can be used by shorting the SENSE pin to 3.3 V (place Jumper E26 to E25). The E27 to E24 jumper connects the ADC VREF pin to the EXT_VREF pin at the power connector. DATA FORMAT SELECT Data format select sets the output data format of the ADC. Setting DFS (E1 to E2) low sets the output format to be offset binary; setting DFS high (E1 to E3) sets the output to twos complement. ANALOG INPUTS The evaluation board accepts a 1.3 V p-p analog input signal centered at ground at SMB connector J4. This signal is terminated to ground through 50 Ω by R16. The input can be alternatively terminated at the transformer T1 secondary by R13 and R14. T1 is a wideband RF transformer providing the single-ended-to-differential conversion, allowing the ADC to be driven differentially and minimizing even-order harmonics. An optional second transformer, T2, can be placed following T1 if desired. This provides some performance advantage (~1 dB to 2 dB) for high analog input frequencies (>100 MHz). If T2 is placed, two shorting traces at the pads need to be cut. The analog signal is low-pass filtered by R41, C12 and R42, and C13 at the ADC input. I/P TIMING SELECT Output timing is set at E11, E12 and E13. E12 to E11 sets S4 low for parallel output timing mode. E11 to E13 sets S4 high for interleaved timing mode. TIMING CONTROLS Flexibility in latch clocking and output timing is accomplished by allowing for clock inversion at the timing controls section of the PCB. Each buffered clock is buffered by an XOR and can be inverted by moving the appropriate jumper for that clock. Rev. E | Page 28 of 44 AD9430 CMOS DATA OUTPUTS OPTIONAL AMPLIFIER The ADC CMOS digital outputs are latched on the board by four LVT574s; the latch outputs are available at the two 40-pin connectors at Pin 11 through Pin 33 on P23 (Channel A) and Pin 11 through Pin 33 on P3 (Channel B). The latch output clocks (data ready) are available at Pin 37 on P23 (Channel A) and Pin 37 on P3 (Channel B). The data-ready clocks can be inverted at the timing controls section if needed. The evaluation board as shipped uses a wideband RF transformer in its analog path. A user can modify the board to use the AD8351 op amp for ac- or dc-coupled applications (see Figure 59 and Figure 60). Figure 60 shows the AD8351 in an ac-coupled topology, while Figure 57 shows the AD8351 in a dc-coupled application. Optimum performance is obtained with the AD8351 ac coupled. RF INHI SINGLEENDED 50 SOURCE R1 50 100nF OPHI 25 AIN+ 5pF RG INLO 25 100nF AD9430 AD8351 OPLO 25 VOCM AIN– 2.8V 100nF 1 Figure 57. Using the AD8351 on the AD9430 PCB CH1 2.00V CH2 2.00V M 5.00ns CH2 02607-055 2 Figure 55. Data Output and Clock @ 80-Pin Connector CRYSTAL OSCILLATOR An optional crystal oscillator can be placed on the board to serve as a clock source for the PCB. Power to the oscillator is through the VCLK pin at the power connector (also called VCLK/V_XTAL). If an oscillator is used, ensure proper termination for best results. The board has been tested with a Valpey Fisher VF561 and a Vectron JN00158-163.84. Test results for the VF561 are shown in Figure 56. 0 ENCODE 163.84MHz ANALOG 65.02MHz SNR 63.93dB SINAD 63.87dB FUND –0.45dBFS 2ND –85.62dBc 3RD –91.31dBc 4TH –90.54dBc 5TH –90.56dBc 6TH –91.12dBc THD –82.21dBc SFDR 83.93dBc SAMPLES 8k NOISEFLR –100.44dBFS WORSTSP –83.93dBc –10 –20 –30 –50 –60 –70 –80 –90 –100 0 20 40 MHz 60 80 02607-057 dB –40 Figure 56. FFT—Using VF561 Crystal as Clock Source Rev. E | Page 29 of 44 DIGITAL OUT 02607-078 ∆: 4.6ns C1 FREQ 84.65608MHz AD9430 TROUBLESHOOTING • • • • The AD9430 evaluation board is provided as a design example for customers of Analog Devices, Inc. ADI makes no warranties, express, statutory, or implied, regarding merchantability or fitness for a particular purpose. Verify power at IC pins. Check that all jumpers are in the correct position for the desired mode of operation. Verify that VREF is at 1.23 V. Run the clock and analog inputs at low speeds (10 MSPS/ 1 MHz) and monitor latch and ADC for toggling. 3.3V + SIGNAL GENERATOR REFIN BAND-PASS FILTER 3.3V – AVDD GND ANALOG J4 + 3.3V – DRVDD GND + VDL GND AD9430 EVALUATION BOARD 10MHz REFOUT SIGNAL GENERATOR CLOCK J5 Figure 58. Evaluation Board Connections Rev. E | Page 30 of 44 – DATA CAPTURE AND PROCESSING 02607-059 If the board does not seem to be working correctly, try the following: AD9430 Table 11. CMOS PCB Evaluation Board Bill of Material No. 1 Quantity 47 Reference Designator C1, C3–C11, C15–C44, C47, C48, C58–C62 Device Capacitor Package 0402 Value 0.1 μF 2 3 4 1 1 29 Capacitor Capacitor Capacitor 0402 0402 0402 10 pF 20 pF 0.01 μF 5 6 6 8 Capacitor 3-pin header/jumper CAPL 10 μF 7 1 C2 C12 C13, C14, C45, C46, C50–C57, C68-C84 C49, C63–C67 (E3, E1, E2),( E19, E17, E18), (E13, E11, E12),( E46, E47, E45), (E35, E33, E34),( E32, E30, E31), (E29, E23, E28),( E22, E16, E21) E26, E25, E27, E24 8 9 10 4 2 3 J1, J2, J4, J5 P3, P23 1 P4, P21, P22 11 3 P4, P21, P22 12 13 14 15 16 4 3 8 2 17 R1, R5, R16, R27 R2, R3, R4 R6–R8, R10, R33–R36 R9, R11 R12, R15, R21–R26, R28–R31, R37, R38, R43, R46, R47 17 6 R13, R14, R41, R42, R44, R45 18 2 19 20 4-pin header/jumper SMA Connector 4-pin power connector 4-pin power connector Resistor Resistor Resistor Resistor Resistor SMA Comments C11, C18, C30, C33, C34, C39, C40, C48 Not placed Not placed Not placed All .01uF caps not placed J2 not placed Post Z5.531.3425.0 Wieland Detachable connector 0402 0402 0603 0402 0402 25.602.5453.0 Wieland 50 Ω 3.8K Ω 100 Ω 0Ω User selected R1 not placed R3, R4 not placed R34 not placed Resistor 0402 25 Ω R17, R18 Resistor 0402 510 Ω 2 2 R19, R20 R39, R40 Resistor Resistor 0402 0402 150 Ω 1 kΩ 21 8 RZ1, RZ2, RZ3, RZ4, RZ5, RZ6, RZ7, RZ8 Resistor pack 220 Ω SO16RES 742C163221JTR CTS 22 23 1 2 L1 T1,T4 Inductor Transformer 0603 CD542 Not placed T4 not placed 24 2 T2,T3 SM-22 25 26 1 1 U1 U2 Optional Macom Transformer AD9430BSV (−210) MC100LVEL16D User selected Mini-Circuits ADT1–1WT ETC1–1–13 TQFP100 SO8NB ADC Clock buffer 27 28 29 1 4 1 U3 U4, U5, U6, U7 U8 VCX86 LVT574 JN00158 SO14NB SO20 XOR 30 1 U9 AD8351 1 P3 and P23 are implemented as one physical 80-pin connector, the SAMTEC TSW-140-08-L-D-RA. Rev. E | Page 31 of 44 Optional XTAL Amp All 17 not placed R13, R14, R44, R45 not placed Not placed Not placed P4 P21 PTMICA04 Figure 59. Evaluation Board Schematic—CMOS 02607-060 OPTIN R16 50Ω GND GND GND C6 0.1μF C7 0.1μF GND E15 COUT E7 E20 5 4 INX 2 3 T1 ENCODE C33 0.1μF GND J5 GND R27 50Ω R45 25Ω C5 0.1μF 4 3 T4 5 6 R4 3.8KΩ R3 3.8KΩ GND R11 0Ω R9 0Ω 2 1 SEE NOTE 1 FOR SINGLE ENDED INPUT 6 C34 0.1μF 1 R39 1kΩ R40 1kΩ H1 MTHOLES H2 COUTB MTHOLES H3 MTHOLES H4 MTHOLES DRVDD VDL R44 25Ω SEE NOTE 1 FOR SINGLE ENDED INPUT GND E2 E3 E1 VCC GND E5 E6 E4 GND VCC E10 E12 E13 E18 E19 E9 E8 E11 E14 E17 GND VCC GND VCC GND VCC GND DRVDD GND VCC 1 P1 2 P2 3 P3 4 P4 GND VCLK VREF GND VDL 1 P1 2 P2 3 P3 4 P4 NOTES 1. TO USE SINGLE ENDED ANALOG INPUT, REMOVE C6, C43, AND C47 PLACE C33, C34, R44 AND R45 GND J4 ANALOG GND P22 PTMICA04 PTMICA04 R17 510Ω MC100L VCLK VDL R18 510Ω 10EL16 E46 GND 5 VEE VBB DN 8 VCC DQ C8 0.1μF 4 3 2 U2 QN Q 10 9 5 4 13 12 GND J1 GND VCC GND GND GND VCC VCC GND GND VCC VCC GND VCC GND 6 EL OUTB 7 EL OUT C36 0.1μF R42 25Ω R6 100Ω COUTAB R7 100Ω R2 3.8kΩ C12 20pF R41 25Ω GND AMPINB E45 C47 0.1μF C2 10pF C3 AMPIN 0.1μF GND R8 100Ω COUTA R10 100Ω COUTAB C13 0.01μF E21 E22 E28 E29 E31 E32 E34 GND E16 E23 E30 C1 0.1μF C43 0.1μF E24 E26 GND VDL GND VDL GND E47 OPINB R13 25Ω R14 25Ω OPIN E25 E27 VCC VREF VCC COUTAB COUTA GND 2 1 11 8 6 3 R36 100Ω R35 100Ω R34 100Ω R33 100Ω DRB CLKLATB DRA CLKLATA GND GROUND PAD UNDER PART P16 J2 GND GND R20 150Ω C10 0.1μF GND GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 U3 74AVC86 U3 74AVC86 U3 74AVC86 U3 74AVC86 R19 150Ω C9 0.1μF GND R1 50Ω R5 50Ω GND VCC VCC VCC GND GND COUTA VCC GND E35 U1 AD9430 –ENC E33 GND VCC VCC GND GND VCC VCC GND GND GND VCC VCC VCC GND GND GND VCC VDL C4 0.1μF GND GNDAMP VAMP DRVDD GND 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 GND 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 VCC Rev. E | Page 32 of 44 DR VDD GND 1 P1 2 P2 3 P3 4 P4 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 DRVDD GND COUT COUTB DRVDD GND GND DR VDD GND R8 R7 R6 R5 R4 R3 R2 R8 R7 R6 R5 R4 R3 R2 R1 9 10 11 12 13 14 15 16 R8 R7 R6 R5 R4 R3 R2 R1 8 7 6 5 4 3 2 1 R8 R7 R6 R5 R4 R3 R2 R1 9 10 11 12 13 14 15 16 9 10 11 12 13 14 15 16 RZ4 220 RSO16ISO 8 7 6 5 4 3 2 1 RZ3 220 RSO16ISO 8 7 6 5 4 3 2 1 9 10 11 12 13 14 15 16 RZ2 220 RSO16ISO 8 7 6 5 4 3 2 1 R1 RZ1 220 RSO16ISO GND GND GND GND GND GND GND GND 10 9 8 7 6 5 4 3 2 1 10 9 8 7 6 5 4 3 2 1 10 9 8 7 6 5 4 3 2 1 10 9 8 7 6 5 4 3 2 1 74AC574M GND D7 D6 D5 D4 D3 D2 D1 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 VCC CLOCK U7 OUT_EN D0 CLOCK Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 VCC 74AC574M GND D7 D6 D5 D4 D3 D2 D1 D0 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 CLOCK U6 OUT_EN Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 VCC 74AC574M GND D7 D6 D5 D4 D3 D2 D1 D0 OUT_EN U5 74AC574M GND D7 D6 D5 D4 D3 D2 D1 D0 VCC CLOCK U4 OUT_EN VDL 11 12 13 14 15 16 17 18 19 20 11 12 13 14 15 16 17 18 19 20 11 12 13 14 15 16 17 18 19 20 11 8 7 6 5 4 3 2 1 8 7 6 5 4 3 2 1 8 7 6 5 4 3 2 1 9 10 11 12 13 14 15 16 8 7 6 5 4 3 2 1 R8 R7 R6 R5 R4 R3 R2 R1 9 10 11 12 13 14 15 16 RZ5 220 RSO16ISO R8 R7 R6 R5 R4 R3 R2 R1 CLKLATB VDL 9 10 11 12 13 14 15 16 RZ6 220 RSO16ISO CLKLATA VDL R8 R7 R6 R5 R4 R3 R2 R1 9 10 11 12 13 14 15 16 RZ7 220 RSO16ISO CLKLATA VDL R8 R7 R6 R5 R4 R3 R2 R1 RZ8 220 RSO 16ISO CLKLATA 12 DM5 13 DM6 14 DM7 15 DM8 16 17 18 19 20 DYB DYA DY0 DY1 DY2 DY3 DY4 DY5 DY6 DY7 DY8 DY9 DY10 DY11 ORY DXB DXA DX0 DX1 DX2 DX3 DX4 DX5 DX6 DX7 DX8 DX9 DX10 DX11 ORX GND GND P39 P37 P35 P33 P31 P29 P27 P25 P23 P21 P19 P17 P15 P13 P11 P9 P7 P5 P3 P1 P39 P37 P35 P33 P31 P29 P27 P25 P23 P21 P19 P17 P15 P13 P11 P9 P7 P5 P3 P1 C4OMS P3 P40 P38 P36 P34 P32 P30 P28 P26 P24 P22 P20 P18 P16 P14 P12 P10 P8 P6 P4 P2 C4OMS P23 P40 P38 P36 P34 P32 P30 P28 P26 P24 P22 P20 P18 P16 P14 P12 P10 P8 P6 P4 P2 GND GND DRB GND DY11 DY10 DY9 DY8 DY7 DY6 DY5 DY4 DY3 DY2 DY1 DY0 DYA DYB ORY GND GND DRA GND DX11 DX10 DX9 DX8 DX7 DX6 DX5 DX4 DX3 DX2 DX1 DX0 DXA DXB ORX AD9430 AD9430 VCC C64 + 10μF C16 0.1μF C17 0.1μF C19 0.1μF C21 0.1μF C20 0.1μF C23 0.1μF C22 0.1μF C25 0.1μF C24 0.1μF C27 0.1μF C26 0.1μF C29 0.1μF C28 0.1μF C31 0.1μF C32 0.1μF C38 0.1μF C35 0.1μF GND VCC C68 0.01μF C69 0.01μF C70 0.01μF C71 0.01μF C72 0.01μF C73 0.01μF C74 0.01μF C75 0.01μF C76 0.01μF C77 0.01μF C78 0.01μF C46 0.01μF C50 0.01μF C51 0.01μF C52 0.01μF C45 0.01μF C44 0.1μF C42 0.1μF C41 0.1μF C15 0.1μF C37 0.1μF C79 0.01μF C80 0.01μF C81 0.01μF C82 0.01μF C83 0.01μF C84 0.01μF GND VCLK VDL C67 + 10μF C49 + 10μF C63 + 10μF C14 0.01μF GND GND VAMP VREF C66 + 10μF C48 0.1μF GND GND DRVDD C65 + 10μF C62 0.1μF C61 0.1μF C60 0.1μF C59 0.1μF C58 0.1μF C53 0.01μF C54 0.01μF C55 0.01μF C56 0.01μF C57 0.01μF GND TO USE VF561C CRYSTAL GND GND L IS OPTIONAL VCLK JN00158 1 2 R38 100Ω GND 3 E/D NC VCC OUTPUTB GND OUTPUT 6 VCLK R21 100Ω R37 25Ω 5 4 RGP1 GND R29 C11 0Ω 0.1μF U8 GND R30 1kΩ PWDN 1 RGP1 2 P1 R22 100Ω GND C18 0.1μF VAMP R31 1kΩ R43 25Ω R28 1kΩ VAMP 10 VOCM 9 VPOS INHI 3 8 OPHI INLO 4 7 OPLO RGP2 5 AD8351 6 COMM C39 R46 0.1μF 25Ω VAMP AMPINB AMPIN GND R47 25Ω C40 0.1μF U9 GND RGP1 VCLK R12 25Ω R25 1.2kΩ R23 100Ω P2 GND R24 100Ω T2 ETC1-1-13 15 T3 ETC1-1-13 15 2 PR SEC INX Figure 60. Evaluation Board Schematic—CMOS (continued) Rev. E | Page 33 of 44 GND 2 34 GND OPIN 34 GND PR SEC OPINB 02607-077 R15 100Ω L1 X C30 0.1μF R26 1kΩ PLACE R30 OR R31 (POWER DOWN) OPTIN Figure 63. PCB Ground Layer Figure 62. PCB Top-Side Copper 02607-084 02607-082 Figure 61. PCB Top-Side Silkscreen 02607-083 02607-081 AD9430 Figure 64. PCB Split Power Plane Rev. E | Page 34 of 44 02607-085 02607-086 AD9430 Figure 65. PCB Bottom-Side Copper Figure 66. PCB Bottom-Side Silkscreen Rev. E | Page 35 of 44 AD9430 EVALUATION BOARD, LVDS MODE The AD9430 evaluation board offers an easy way to test the AD9430 in LVDS mode. (The board is also compatible with the AD9411.) It requires a clock source, an analog input signal, and a 3.3 V power supply. The clock source is buffered on the board to provide the clocks for the ADC, latches, and a data-ready signal. The digital outputs and output clocks are available at a 40-pin connector, P23. The board has several different modes of operation and is shipped in the following configurations: • • • Offset binary Internal voltage reference Full-scale adjust = low Note that the AD9430 LVDS evaluation board does not interface directly with the standard Analog Devices dualchannel data capture board (HSC-ADC-EVAL-DC). An LVDSto-CMOS translation board is required and is available from Analog Devices. (No translation board is required for the AD9430 CMOS evaluation board.) GAIN Full scale is set at E17 to E19, E17 to E18 sets S5 low, full scale = 1.5 V differential; E17 to E19 sets S5 high, full scale = 0.75 V differential. Best performance is obtained at 1.5 V full scale. CLOCK The CLOCK input is terminated to ground through a 50 Ω resistor at SMB connector J5. The input is ac coupled to a high speed differential receiver (LVEL16) that provides the required low jitter, fast edge rates needed for optimum performance. J5 input should be >0.5 V p-p. Power to the LVEL16 is set at Jumper E47. E47 to E45 powers the buffer from AVDD; E47 to E46 powers the buffer from VCLK/V_XTAL (not in Table 11). VOLTAGE REFERENCE Power is supplied to the board via a detachable 8-lead power strip (two 4-pin blocks). In Table 12, VCC, DRVDD, and VDL are the minimum required power connections, and the LVEL16 clock buffer can be powered from VCC or VDL at the E47 jumper. The AD9430 has an internal 1.23 V voltage reference. The ADC uses the internal reference as the default when jumpers E24 to E27 and E25 to E26 are left open. The full scale can be increased by placing optional resistor R3. The required value varies with the process and needs to be tuned for the specific application. Full scale can similarly be reduced by placing R4; tuning is required here as well. An external reference can be used by shorting the SENSE pin to 3.3 V (place jumper E26 to E25). Jumper E27 to E24 connects the ADC VREF pin to the EXT_VREF pin at the power connector. Table 12. Power Connector, LVDS Mode DATA FORMAT SELECT VCC 3.3 V DRVDD 3.3 V VDL 3.3 V EXT_VREF Data format select (DFS) sets the output data format of the ADC. Setting DFS low (E1 to E2) sets the output format to be offset binary; setting DFS high (E1 to E3) sets the output to twos complement. POWER CONNECTOR Analog supply for ADC (350 mA) Output supply for ADC (50 mA) Supply for support logic Optional external reference input ANALOG INPUTS DATA OUTPUTS The evaluation board accepts a 1.3 V p-p analog input signal centered at ground at SMB Connector J4. This signal is terminated to ground through 50 Ω by R16. The input can be alternatively terminated at the T1 transformer secondary by R13 and R14. T1 is a wideband RF transformer providing the single-ended-to-differential conversion, allowing the ADC to be driven differentially and minimizing even-order harmonics. An optional second transformer, T2, can be placed following T1 if desired. This provides some performance advantage (~1 to 2 dB) for high analog input frequencies (>100 MHz). If T2 is placed, two shorting traces at the pads need to be cut. The analog signal can be low-pass filtered by R41, C12 and R42, and C13 at the ADC input. A wideband differential amplifier (AD8351) can be configured on the PCB for dc-coupled applications. Remove C6, C15, and C30 to prevent transformer loading of the amp. See Figure 67, Figure 68, and Figure 69 for more information. The ADC LVDS digital outputs are routed directly to the connector at the card edge. Resistor pads have been placed at the output connector to allow for termination if the connector receiving logic does not have the required differential termination for the data bits and DCO. Each output trace pair should be terminated differentially at the far end of the line with a single 100 Ω resistor. CRYSTAL OSCILLATOR An optional crystal oscillator can be placed on the board to serve as a clock source for the PCB. Power to the oscillator is through the VDL pin at the power connector. If an oscillator is used, ensure proper termination for best results. The board has been tested with a Valpey Fisher VF561 and a Vectron JN00158163.84. Rev. E | Page 36 of 44 AD9430 Table 13. LVDS PCB Evaluation Board Bill of Material No. 1 Quantity 33 2 4 Reference Designator C1, C4–C11, C15–C17, C19–C32, C35, C36, C58–C62 C3, C18, C39, C40 C33, C34, C37, C38 Device Capacitors Package 0603 Value 0.1 μF Comment C3, C18, C39, C40 not placed Capacitor 0402 0.1 μF C33, C34, C37, C38 not placed 3 4 5 6 7 4 1 2 2 2 C63–C66 C2 C12, C13 J4, J5 P21, P22 Capacitor Capacitor Capacitor Jacks Power connectors Top Power connectors Posts 40-pin right-angle connector 10 uF 10 pF 20 pF Resistor TAJD CAPL 0603 0603 SMB 25.602.5453.0 Wieland Z5.531.3425.0 Wieland Digi-Key S2131-20-ND 0402 8 2 P21, P22 9 1 P23 10 16 R1, R6–R12, R15, R31–R37 11 12 13 14 15 16 17 18 19 1 3 2 2 2 2 2 2 6 R2 R5, R16, R27 R17, R18 R19, R20 R29, R30 R41, R42 R3, R4 R13, R14 R22, R23, R24, R25, R26, R28 Resistor Resistor Resistor Resistor Resistor Resistor Resistor Resistor Resistor 0603 0603 0603 0603 0603 0603 0603 0603 0603 3.8 kΩ 50 Ω 510 Ω 150 Ω 1 kΩ 25 Ω 3.8 kΩ 25 Ω 100 Ω 20 4 R39, R40, R45, R47 Resistor 0402 25 Ω 21 22 23 24 25 2 1 3 2 1 R43, R44 R46 R38, R48, R49 R50, R51 T1 T2 Resistor Resistor Resistor Resistor RF transformer 10 kΩ 1.2 kΩ 25 Ω 1 kΩ 26 27 1 1 U2 U9 28 29 1 1 U1 U3 RF amp Optional crystal oscillator AD9430 MC100LVEL16 0402 0402 0402 0402 Mini-Circuits ADT1-1WT AD8351 JN00158 or VF561 TQFP-100 SO8NB Rev. E | Page 37 of 44 100 Ω C2 not placed C12, C13 not placed R1, R6–R12, R15, R31–37 Not placed R13, R14 not placed R22, R23, R24, R25, R26, R28 not placed R39, R40, R45, R47 not placed R43, R44 not placed R46 not placed R38, R48, R49 not placed R50, R51 not placed T2 not placed 02607-068 GND NC NC R27 50Ω R17 510Ω C5 0.1μF C30 0.1μF AMPIN 14 15 16 17 18 19 20 VCC VCC GND GND VCC VCC GND R18 510Ω VDL 25 24 23 22 2 3 4 U3 VEE 5 Q QN GND C8 0.1μF D DN VBB GND GND R5 50Ω R19 150Ω ELOUTB ELOUT R20 150Ω 6 7 GND C36 0.1μF VCC 8 E45 E46 GND 10EL16 E47 C13 20pF GND VCC GND 13 GND 21 12 GND 11 10 9 7 6 5 4 3 GND R30 1kΩ 2 1 8 VCC R42 GND 25Ω C2 10pF C3 0.1μF GND C1 0.1μF E24 E26 E19 E18 VCC VCC E17 GND MTHOLE6 H1 MTHOLE6 H2 MTHOLE6 H3 MTHOLE6 H4 R29 GND 1kΩ AMPINB C15 R41 0.1μF 25Ω R14 25Ω GND GND J5 R13 25Ω 6 C11 0.1μF 3 PRI SEC 4 2 1 5 ENCODE 4 GND 2 6 C7 0.1μF PRI SEC 1 5 3 E27 VREF VCC E25 E2 C12 20pF GND GND T2 T2 OPTIONAL R4 3.8kΩ GND VCC E3 GND E1 R3 GND 3.8kΩ GND VCC GND VCC GND DRVDD VDL GND GND VREF ADT1-1WT C6 0.1μF AMP GND ANALOG R16 J4 50Ω 4 R2 3.8kΩ 3 1 P1 P4 4 P4 2 3 P3 P3 2 P2 P2 1 P1 T1 P21 P22 ADT1-1WT PTM1CRO4 PTM1CRO4 GND C9 0.1μF C10 0.1μF U1 GND P16 C4 0.1μF DRVDD GROUND PAD UNDER PART VCC 100 26 GND VCC 99 27 VCC GND 98 28 VCC GND 97 29 VCC VCC 96 30 GND VCC 95 31 GND GND 94 32 GND 93 33 GND 92 34 VCC VCC 91 35 VCC 90 36 VCC 37 89 40 GND GND 84 42 GND 83 43 82 44 88 ~ENC DORB DOR 81 R7 100Ω D11 R6 100Ω D11B R8 100Ω D10B D10 GND 55 56 57 58 59 60 DRVDD 61 GND DRVDD GND 62 63 64 65 66 67 68 69 70 71 72 73 74 75 D9B D9 DR R37 100Ω DRB D6 R10 100Ω D6B P19 19 D4 P17 17 D3 P15 15 D2 P13 13 D1 P11 11 D0 18 P18 16 P16 14 P14 12 P12 P1 1 2 P2 GND P3 3 4 P4 6 P6 P7 7 D1F D2F P5 5 DOR 8 P8 10 P10 P9 9 P21 21 D5 P27 27 D8 20 P20 P29 29 D9 28 P28 P23 23 D6 P31 31 D10 30 P30 22 P22 P33 33 D11 32 P32 P25 25 D7 P35 35 GND 34 P34 24 P24 P37 37 DR 36 P36 26 P26 P39 39 GND D4B D4 D8B D8 38 P38 R33 100Ω R12 100Ω 40 P40 D3 R32 100Ω D3B D5 R9 100Ω D5B D7 R11 100Ω D7B D2 R31 100Ω GND DRVDD 54 DRB D2B GND 53 GND 52 D1 D11B R15 51 100Ω D10B D1B D9B D8B D7B D6B D0 D5B R36 D4B 100Ω D3B D0B D1F D2B R35 D1B 100Ω D1FB D0B D2F D1FB R34 100Ω D2FB D2FB DORB GND CONNECTOR GND 45 GND 38 80 46 87 GND 77 49 86 39 VCC 79 47 DRVDD 85 41 GND 78 48 Rev. E | Page 38 of 44 GND Figure 67. Evaluation Board Schematic—LVDS VCC 76 50 R1 100Ω AD9430 AD9430 VCC + C64 10μF C16 0.1μF C17 0.1μF C19 0.1μF C21 0.1μF C23 0.1μF C20 0.1μF C22 0.1μF C25 0.1μF C24 0.1μF C27 0.1μF C26 0.1μF C29 0.1μF C28 0.1μF C31 0.1μF C32 0.1μF C35 0.1μF GND DRVDD VDL + C65 10μF C61 0.1μF C62 0.1μF C60 0.1μF C59 0.1μF C58 0.1μF + C66 10μF VREF C18 0.1μF GND GND + C63 10μF GND TO USE VF561 CRYSTAL GND VDL R28 100Ω E/D VCC 6 2 NC OUTPUTB 5 3 GND OUTPUT 4 R23 100Ω VDL P4 R25 100Ω U9 GND VDL R24 100Ω P5 R26 100Ω 02607-069 GND 1 GND Figure 68. Evaluation Board Schematic—LVDS (continued) R51 1kΩ R50 1kΩ VDL GND VDL POWER DOWN USE R43 OR R44 VDL GND R38 0Ω R43 10kΩ C33 0.1μF C38 0.1μF GND R44 10kΩ R39 25Ω AMP R40 25Ω PWUP VOCM 10 2 RGP1 INHI VPOS 9 OPHI INLO OPLO 5 R45 25Ω R47 25Ω 1 4 C34 0.1μF GND U2 AD8351 3 AMP IN C37 0.1μF GND R49 25Ω C39 0.1μF 8 RPG2 AMPINB 7 COMM 6 GND R48 25Ω C40 0.1μF AMPIN R46 1.2kΩ Figure 69. Evaluation Board Schematic—LVDS (continued) Rev. E | Page 39 of 44 02607-079 R22 100Ω JN00158 AD9430 02607-073 02607-071 F Figure 72. PCB Ground Layer—LVDS 02607-074 02607-072 Figure 70. PCB Top-Side Silkscreen—LVDS Figure 71. PCB Top-Side Copper—LVDS Figure 73. PCB Split Power Plane—LVDS Rev. E | Page 40 of 44 02607-075 02607-076 AD9430 Figure 74. PCB Bottom-Side Copper—LVDS Figure 75. PCB Bottom-Side Silkscreen—LVDS Rev. E | Page 41 of 44 AD9430 OUTLINE DIMENSIONS 0.75 0.60 0.45 16.00 BSC SQ 1.20 MAX 14.00 BSC SQ 100 1 SEATING PLANE 76 76 75 100 1 75 PIN 1 BOTTOM VIEW (PINS UP) TOP VIEW (PINS DOWN) CONDUCTIVE HEAT SINK 51 50 25 50 1.05 1.00 0.95 7° 3.5° 0° 0.50 BSC 0.27 0.22 0.17 0.15 0.05 26 6.50 NOM COPLANARITY 0.08 FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. COMPLIANT TO JEDEC STANDARDS MS-026-AED-HD 021809-A 51 25 26 0.20 0.09 Figure 76.100-Lead Thin Quad Flat Package, Exposed Pad [TQFP_EP] (SV-100-1) Dimensions shown in millimeters ORDERING GUIDE Model 1 AD9430BSV-170 AD9430BSVZ-170 AD9430BSV-210 AD9430BSVZ-210 1 Temperature Range −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C Package Description 100-Lead Thin Quad Flat Package, Exposed Pad (TQFP_EP) 100-Lead Thin Quad Flat Package, Exposed Pad (TQFP_EP) 100-Lead Thin Quad Flat Package, Exposed Pad (TQFP_EP) 100-Lead Thin Quad Flat Package, Exposed Pad (TQFP_EP) Z = RoHS Compliant Part. Rev. E | Page 42 of 44 Package Option SV-100-1 SV-100-1 SV-100-1 SV-100-1 AD9430 NOTES Rev. E | Page 43 of 44 AD9430 NOTES ©2005–2010 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D02607-0-9/10(E) Rev. E | Page 44 of 44