High Resolution 6 GHz Fractional-N Frequency Synthesizer ADF4157 Data Sheet FEATURES GENERAL DESCRIPTION RF bandwidth to 6 GHz 25-bit fixed modulus allows subhertz frequency resolution 2.7 V to 3.3 V power supply Separate VP allows extended tuning voltage Programmable charge pump currents 3-wire serial interface Digital lock detect Power-down mode Pin compatible with the following frequency synthesizers: ADF4110/ADF4111/ADF4112/ADF4113/ ADF4106/ADF4153/ADF4154/ADF4156 Cycle slip reduction for faster lock times The ADF4157 is a 6 GHz fractional-N frequency synthesizer with a 25-bit fixed modulus, allowing subhertz frequency resolution at 6 GHz. It consists of a low noise digital phase frequency detector (PFD), a precision charge pump, and a programmable reference divider. There is a Σ-Δ based fractional interpolator to allow programmable fractional-N division. The INT and FRAC values define an overall N divider, N = INT + (FRAC/225). The ADF4157 features cycle slip reduction circuitry, which leads to faster lock times without the need for modifications to the loop filter. Control of all on-chip registers is via a simple 3-wire interface. The device operates with a power supply ranging from 2.7 V to 3.3 V and can be powered down when not in use. APPLICATIONS Satellite communications terminals, radar equipment Instrumentation equipment Personal mobile radio (PMR) Base stations for mobile radio Wireless handsets FUNCTIONAL BLOCK DIAGRAM AVDD DVDD VP RSET ADF4157 REFERENCE 5-BIT R COUNTER ×2 DOUBLER ÷2 DIVIDER VDD HIGH Z + PHASE FREQUENCY DETECTOR – CSR DGND LOCK DETECT MUXOUT OUTPUT MUX CURRENT SETTING SDOUT VDD RFCP4 RFCP3 RFCP2 RFCP1 RDIV N COUNTER NDIV CLK LE RFINA RFINB THIRD-ORDER FRACTIONAL INTERPOLATOR CE DATA CP CHARGE PUMP FRACTION REG 32-BIT DATA REGISTER AGND INTEGER REG MODULUS 225 DGND CPGND 05874-001 REFIN Figure 1. Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2007–2012 Analog Devices, Inc. All rights reserved. ADF4157 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Program Modes .......................................................................... 10 Applications ....................................................................................... 1 Register Maps .................................................................................. 11 General Description ......................................................................... 1 FRAC/INT Register (R0) Map.................................................. 12 Functional Block Diagram .............................................................. 1 LSB FRAC Register (R1) Map .................................................. 13 Revision History ............................................................................... 2 R Divider Register (R2) Map .................................................... 14 Specifications..................................................................................... 3 Function Register (R3) Map ..................................................... 16 Timing Specifications .................................................................. 4 Test Register (R4) Map .............................................................. 17 Absolute Maximum Ratings............................................................ 5 Applications Information .............................................................. 18 Thermal Resistance ...................................................................... 5 Initialization Sequence .............................................................. 18 ESD Caution .................................................................................. 5 RF Synthesizer: A Worked Example ........................................ 18 Pin Configurations and Function Descriptions ........................... 6 Reference Doubler and Reference Divider ............................. 18 Typical Performance Characteristics ............................................. 8 Cycle Slip Reduction for Faster Lock Times ........................... 18 Circuit Description ........................................................................... 9 Fastlock Timer and Register Sequences .................................. 19 Reference Input Section ............................................................... 9 Fastlock: An Example ................................................................ 19 RF Input Stage ............................................................................... 9 Fastlock: Loop Filter Topology ................................................. 19 RF INT Divider ............................................................................. 9 Spur Mechanisms ....................................................................... 19 25-Bit Fixed Modulus .................................................................. 9 Low Frequency Applications .................................................... 20 INT, FRAC, and R Relationship ................................................. 9 Filter Design—ADIsimPLL....................................................... 20 RF R Counter ................................................................................ 9 Operating with Wide Loop Filter Bandwidths ....................... 20 Phase Frequency Detector (PFD) and Charge Pump ............ 10 PCB Design Guidelines for the Chip Scale Package .............. 20 MUXOUT and Lock Detect ...................................................... 10 Outline Dimensions ....................................................................... 21 Input Shift Register..................................................................... 10 Ordering Guide .......................................................................... 21 REVISION HISTORY 8/12—Rev. C to Rev. D Changes to Figure 4 and Table 5 ...................................................... 6 Updated Outline Dimensions (Changed CP-20-1 to CP-20-6) .....22 Changes to Ordering Guide ...........................................................21 Criticizing 3/12—Rev. B to Rev. C Changes to Table 1 ............................................................................ 3 Changes to Ordering Guide .......................................................... 21 9/11—Rev. A to Rev. B Changes to Noise Characteristics Parameter ................................ 3 Changes to EPAD Note .................................................................... 6 1/09—Rev. 0 to Rev. A Changes to Figure 1 .......................................................................... 1 Changes to Reference Characteristics Parameter, Table 1 .......... 3 Changes to Table 3 ............................................................................ 5 Changes to Figure 4 and Table 5 ......................................................6 Changes to Figure 15...................................................................... 10 Changes to Figure 16...................................................................... 11 Changes to Figure 17...................................................................... 12 Changes to Figure 19...................................................................... 15 Added Negative Bleed Current Section, CLK Divider Mode Section, and 12-Bit Clock Divider Value Section....................... 17 Changes to Reserved Bits Section and Figure 21 ....................... 17 Deleted Interfacing Section ........................................................... 18 Added Fastlock Timer and Register Sequences Section, Fastlock: An Example Section, and Fastlock: Loop Filter Topology Section ............................................................................ 19 Added Figure 22 and Figure 23; Renumbered Sequentially ..... 19 Added Operating with Wide Loop Filter Bandwidths Section.............................................................................................. 20 Updated Outline Dimensions ....................................................... 21 7/07—Revision 0: Initial Version Rev. D | Page 2 of 24 Data Sheet ADF4157 SPECIFICATIONS AVDD = DVDD = 2.7 V to 3.3 V; VP = AVDD to 5.5 V; AGND = DGND = 0 V; TA = TMIN to TMAX, unless otherwise noted; dBm referred to 50 Ω. Table 1. Parameter RF CHARACTERISTICS (3 V) RF Input Frequency (RFIN) REFERENCE CHARACTERISTICS REFIN Input Frequency REFIN Input Sensitivity REFIN Input Capacitance REFIN Input Current PHASE DETECTOR Phase Detector Frequency 3 CHARGE PUMP ICP Sink/Source High Value Low Value Absolute Accuracy RSET Range ICP Three-State Leakage Current Matching ICP vs. VCP ICP vs. Temperature LOGIC INPUTS VINH, Input High Voltage VINL, Input Low Voltage IINH/IINL, Input Current CIN, Input Capacitance LOGIC OUTPUTS VOH, Output High Voltage VOH, Output High Voltage VOL, Output Low Voltage POWER SUPPLIES AVDD DVDD VP IDD Low Power Sleep Mode NOISE CHARACTERISTICS Normalized Phase Noise Floor (PNSYNTH) 4 Normalized 1/f Noise (PN1_f) 5 Phase Noise Floor 6 Phase Noise Performance 7 5800 MHz Output 8 B Version 1 Unit Test Conditions/Comments 0.5/6.0 GHz min/max −10 dBm/0 dBm min/max; for lower frequencies, ensure slew rate (SR) > 400 V/µs 10/300 0.4/AVDD 0.7/AVDD 10 ±100 MHz min/max V p-p min/max V p-p min/max pF max µA max For fREFIN < 10 MHz, ensure slew rate > 50 V/µs For 10 MHz < fREFIN < 250 MHz, biased at AVDD/2 2 For 250 MHz < fREFIN < 300 MHz, biased at AVDD/22 32 MHz max 5 312.5 2.5 2.7/10 1 2 2 2 mA typ µA typ % typ kΩ min/max nA typ % typ % typ % typ 1.4 0.6 ±1 10 V min V max µA max pF max 1.4 VDD – 0.4 0.4 V min V min V max 2.7/3.3 AVDD AVDD/5.5 29 10 V min/max V min/V max mA max µA typ −211 dBc/Hz typ −110 −137 −133 dBc/Hz typ dBc/Hz typ dBc/Hz typ −87 dBc/Hz typ Programmable With RSET = 5.1 kΩ With RSET = 5.1 kΩ Sink and source current 0.5 V < VCP < VP – 0.5 0.5 V < VCP < VP – 0.5 VCP = VP/2 Open-drain 1 kΩ pull-up to 1.8 V CMOS output chosen IOL = 500 µA 23 mA typical PLL loop B/W = 500 kHz; measured at 100 kHz 10 kHz offset; normalized to 1 GHz @ 10 MHz PFD frequency @ 25 MHz PFD frequency @ VCO output @ 2 kHz offset, 25 MHz PFD frequency 1 Operating temperature of B version is −40°C to +85°C. AC-coupling ensures AVDD/2 bias. Guaranteed by design. Sample tested to ensure compliance. 4 The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log(N) (where N is the N divider value) and 10 log(FPFD). PNSYNTH = PNTOT − 10 log(FPFD) − 20 log(N). 5 The PLL phase noise is composed of 1/f (flicker) noise plus the normalized PLL noise floor. The formula for calculating the 1/f noise contribution at an RF frequency, FRF, and at a frequency offset f is given by PN = PN1_f + 10 log(10 kHz/f) + 20 log(FRF/1 GHz). Both the normalized phase noise floor and flicker noise are modeled in ADIsimPLL. 6 The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20logN (where N is the N divider value). 7 The phase noise is measured with the EV-ADF4157SD1Z and the Agilent E5052A phase noise system. 8 fREFIN = 100 MHz; fPFD = 25 MHz; offset frequency = 2 kHz; RFOUT = 5800.25 MHz; N = 232; loop bandwidth = 20 kHz. 2 3 Rev. D | Page 3 of 24 ADF4157 Data Sheet TIMING SPECIFICATIONS AVDD = DVDD = 2.7 V to 3.3 V; VP = AVDD to 5.5 V; AGND = DGND = 0 V; TA = TMIN to TMAX, unless otherwise noted; dBm referred to 50 Ω. Table 2. Parameter t1 t2 t3 t4 t5 t6 t7 Limit at TMIN to TMAX (B Version) 20 10 10 25 25 10 20 Unit ns min ns min ns min ns min ns min ns min ns min t4 Test Conditions/Comments LE setup time Data to clock setup time Data to clock hold time Clock high duration Clock low duration Clock to LE setup time LE pulse width t5 CLK t2 DATA DB23 (MSB) t3 DB22 DB2 (CONTROL BIT C3) DB1 (CONTROL BIT C2) DB0 (LSB) (CONTROL BIT C1) t7 LE t1 05874-002 t6 LE Figure 2. Timing Diagram Rev. D | Page 4 of 24 Data Sheet ADF4157 ABSOLUTE MAXIMUM RATINGS TA = 25°C, GND = AGND = DGND = 0 V, VDD = AVDD = DVDD, unless otherwise noted. Table 3. Parameter AVDD/DVDD to AGND/DGND AVDD to DVDD VP to AGND/DGND VP to AVDD/DVDD Digital I/O Voltage to AGND/DGND Analog I/O Voltage to AGND/DGND REFIN, RFINx to AGND/DGND Operating Temperature Range Industrial (B Version) Storage Temperature Range Maximum Junction Temperature Reflow Soldering Peak Temperature Time at Peak Temperature THERMAL RESISTANCE Rating −0.3 V to +4 V −0.3 V to +0.3 V −0.3 V to +5.8 V −0.3 V to +5.8 V −0.3 V to VDD + 0.3 V −0.3 V to VDD + 0.3 V −0.3 V to VDD + 0.3 V θJA is specified for the worst-case conditions, that is, a device soldered in a circuit board for surface-mount packages. Table 4. Thermal Resistance Package Type TSSOP LFCSP (Paddle Soldered) ESD CAUTION −40°C to +85°C −65°C to +125°C 150°C 260°C 40 sec Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Rev. D | Page 5 of 24 θJA 112 30.4 Unit °C/W °C/W ADF4157 Data Sheet 16 DVDD 19 RSET 18 VP 17 DVDD 20 CP PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS 15 MUXOUT CPGND 1 AGND 2 ADF4157 TOP VIEW (Not to Scale) 2 15 DVDD RFINB 4 CPGND 3 ADF4157 14 MUXOUT RFINA 5 AGND 4 TOP VIEW (Not to Scale) 13 LE RFINB 5 12 DATA RFINA 6 11 CLK AVDD 7 10 CE REFIN 8 9 12 CLK 11 CE NOTES 1. IT IS RECOMMENDED THAT THE EXPOSED PAD BE THERMALLY CONNECTED TO A COPPER PLANE FOR ENHANCED THERMAL PERFORMANCE. THIS PAD SHOULD BE CONNECTED TO AGND. 05874-003 DGND 13 DATA 05874-004 CP 14 LE DGND 10 AGND 3 DGND 9 VP REFIN 8 16 AVDD 6 1 AVDD 7 RSET Figure 4. LFCSP Pin Configuration Figure 3. TSSOP Pin Configuration Table 5. Pin Function Descriptions TSSOP Pin No. 1 LFCSP Pin No. 19 Mnemonic RSET 2 20 CP 3 4 5 1 2, 3 4 CPGND AGND RFINB 6 7 5 6, 7 RFINA AVDD 8 8 REFIN 9 10 9, 10 11 DGND CE 11 12 CLK 12 13 DATA 13 14 LE 14 15 MUXOUT Description Connecting a resistor between this pin and ground sets the maximum charge pump output current. The relationship between ICP and RSET is 25.5 ICPMAX RSET where: RSET = 5.1 kΩ. ICPMAX = 5 mA. Charge Pump Output. When enabled, this pin provides ±ICP to the external loop filter, which, in turn, drives the external VCO. Charge Pump Ground. This is the ground return path for the charge pump. Analog Ground. This is the ground return path of the prescaler. Complementary Input to the RF Prescaler. This point should be decoupled to the ground plane with a small bypass capacitor, typically 100 pF. Input to the RF Prescaler. This small-signal input is normally ac-coupled from the VCO. Positive Power Supply for the RF Section. Decoupling capacitors to the digital ground plane should be placed as close as possible to this pin. AVDD has a value of 3 V ± 10%. AVDD must have the same voltage as DVDD. Reference Input. This is a CMOS input with a nominal threshold of VDD/2 and an equivalent input resistance of 100 kΩ. This input can be driven from a TTL or CMOS crystal oscillator, or it can be ac-coupled. Digital Ground. Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state mode. Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into the input shift register on the CLK rising edge. This input is a high impedance CMOS input. Serial Data Input. The serial data is loaded MSB first with the three LSBs being the control bits. This input is a high impedance CMOS input. Load Enable, CMOS Input. When LE is high, the data stored in the input shift register is loaded into one of the five latches, with the latch selected using the control bits. This multiplexer output allows the lock detect, the scaled RF, or the scaled reference frequency to be accessed externally. Rev. D | Page 6 of 24 Data Sheet ADF4157 TSSOP Pin No. 15 LFCSP Pin No. 16, 17 Mnemonic DVDD 16 18 VP N/A 21 (EPAD) Exposed Pad (EPAD) Description Positive Power Supply for the Digital Section. Decoupling capacitors to the digital ground plane should be placed as close as possible to this pin. DVDD has a value of 3 V ± 10%. DVDD must have the same voltage as AVDD. Charge Pump Power Supply. This should be greater than or equal to VDD. In systems where VDD is 3 V, it can be set to 5.5 V and used to drive a VCO with a tuning range of up to 5.5 V. It is recommended that the exposed pad be thermally connected to a copper plane for enhanced thermal performance. The pad should be connected to AGND. Rev. D | Page 7 of 24 ADF4157 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS PFD = 25 MHz, loop bandwidth = 20 kHz, reference = 100 MHz, ICP = 313 μA, phase noise measurements taken on the Agilent E5052A phase noise system. 6.00 10 5 5.95 0 CSR ON FREQUENCY (GHz) POWER (dBm) –5 –10 P = 4/5 P = 8/9 –15 –20 –25 5.90 5.85 CSR OFF 5.80 5.75 –30 –40 0 1 2 3 4 5 6 7 8 5.65 –100 9 05874-019 5.70 05874-016 –35 0 100 200 300 400 500 600 700 800 900 TIME (µs) FREQUENCY (GHz) Figure 5. RF Input Sensitivity Figure 8. Lock Time for 200 MHz Jump from 5705 MHz to 5905 MHz with CSR On and Off 5.95 0 VDD = 3V –5 5.90 FREQUENCY (GHz) –15 –20 –25 5.85 CSR OFF 5.80 5.75 5.70 –30 CSR ON 5.65 05874-017 –35 –40 0 100 200 300 400 5.60 –100 500 05874-020 POWER (dBm) –10 0 100 200 300 600 700 800 900 6 0 RF = 5800.25MHz, PFD = 25MHz, N = 232, FRAC = 335544, FREQUENCY RESOLUTION = 0.74Hz, 20kHz LOOP BW, ICP = 313µA, DSB INTEGRATED PHASE ERROR = 0.97° RMS, PHASE NOISE @ 2kHz = –87dBc/Hz. 4 –40 2 –60 ICP (mA) PHASE NOISE (dBc/Hz) 500 Figure 9. Lock Time for 200 MHz Jump from 5905 MHz to 5705 MHz with CSR On and Off Figure 6. Reference Input Sensitivity –20 400 TIME (µs) FREQUENCY (MHz) –80 –100 0 –2 –120 05874-018 –160 1k 10k 100k 1M –6 0 10M 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 VCP (V) FREQUENCY (Hz) Figure 7. Phase Noise and Spurs (Note that the 250 kHz spur is an integer boundary spur; see the Spur Mechanisms section for more information.) 05874-021 –4 –140 Figure 10. Charge Pump Output Characteristics, Pump Up and Pump Down Rev. D | Page 8 of 24 Data Sheet ADF4157 CIRCUIT DESCRIPTION REFERENCE INPUT SECTION INT, FRAC, AND R RELATIONSHIP The reference input stage is shown in Figure 11. SW1 and SW2 are normally closed switches. SW3 is normally open. When power-down is initiated, SW3 is closed and SW1 and SW2 are open. This ensures that there is no loading of the REFIN pin on power-down. The INT and FRAC values, in conjunction with the R counter, make it possible to generate output frequencies that are spaced by fractions of the phase frequency detector (PFD). See the RF Synthesizer: A Worked Example section for more information. The RF VCO frequency (RFOUT) equation is RFOUT = fPFD × (INT + (FRAC/225)) POWER-DOWN CONTROL where: RFOUT is the output frequency of the external voltage controlled oscillator (VCO). INT is the preset divide ratio of the binary 12-bit counter (23 to 4095). FRAC is the numerator of the fractional division (0 to 225 − 1). 100kΩ NC SW2 TO R COUNTER REFIN NC BUFFER 05874-005 SW1 SW3 NC Figure 11. Reference Input Stage fPFD = REFIN × [(1 + D)/(R × (1 + T))] RF INPUT STAGE 1.6V RF R COUNTER AVDD 2kΩ (2) where: REFIN is the reference input frequency. D is the REFIN doubler bit. R is the preset divide ratio of the binary 5-bit programmable reference counter (1 to 32). T is the REFIN divide-by-2 bit (0 or 1). The RF input stage is shown in Figure 12. It is followed by a two-stage limiting amplifier to generate the current mode logic (CML) clock levels needed for the prescaler. BIAS GENERATOR (1) 2kΩ The 5-bit RF R counter allows the input reference frequency (REFIN) to be divided down to produce the reference clock to the PFD. Division ratios from 1 to 32 are allowed. RFINA RF N DIVIDER N = INT + FRAC/MOD FROM RF INPUT STAGE RFINB TO PFD N-COUNTER INT REG Figure 12. RF Input Stage MOD REG RF INT DIVIDER The RF INT counter allows a division ratio in the PLL feedback counter. Division ratios from 23 to 4095 are allowed. 25-BIT FIXED MODULUS The ADF4157 has a 25-bit fixed modulus. This allows output frequencies to be spaced with a resolution of fRES = fPFD/225 where fPFD is the frequency of the phase frequency detector (PFD). For example, with a PFD frequency of 10 MHz, frequency steps of 0.298 Hz are possible. Rev. D | Page 9 of 24 FRAC VALUE 05874-007 AGND 05874-006 THIRD-ORDER FRACTIONAL INTERPOLATOR Figure 13. RF N Divider ADF4157 Data Sheet PHASE FREQUENCY DETECTOR (PFD) AND CHARGE PUMP INPUT SHIFT REGISTER The PFD takes inputs from the R counter and the N counter and produces an output proportional to the phase and frequency difference between them. Figure 14 is a simplified schematic of the phase frequency detector. The PFD includes a fixed delay element that sets the width of the antibacklash pulse, which is typically 3 ns. This pulse ensures that there is no dead zone in the PFD transfer function and gives a consistent reference spur level. HI D1 Q1 UP PROGRAM MODES U1 +IN CLR1 DELAY HI The ADF4157 digital section includes a 5-bit RF R counter, a 12-bit RF N counter, and a 25-bit FRAC counter. Data is clocked into the 32-bit input shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the input shift register to one of five latches on the rising edge of LE. The destination latch is determined by the state of the three control bits (C3, C2, and C1) in the input shift register. These are the three LSBs, DB2, DB1, and DB0, as shown in Figure 2. The truth table for these bits is shown in Table 6. Figure 16 shows a summary of how the latches are programmed. CHARGE PUMP U3 Table 6 and Figure 16 through Figure 21 show how to set up the program modes in the ADF4157. CP Several settings in the ADF4157 are double-buffered. These include the LSB FRAC value, R counter value, reference doubler, and current setting. This means that two events have to occur before the part uses a new value of any of the double-buffered settings. First, the new value is latched into the device by writing to the appropriate register. Second, a new write must be performed on Register 0, R0. CLR2 DOWN D2 Q2 05874-008 U2 –IN Figure 14. PFD Simplified Schematic MUXOUT AND LOCK DETECT The output multiplexer on the ADF4157 allows the user to access various internal points on the chip. The state of MUXOUT is controlled by M4, M3, M2, and M1 (see Figure 17). Figure 15 shows the MUXOUT section in block diagram form. THREE-STATE OUTPUT For example, updating the fractional value can involve a write to the 13 LSB bits in R1 and the 12 MSB bits in R0. R1 should be written to first, followed by the write to R0. The frequency change begins after the write to R0. Double buffering ensures that the bits written to in R1 do not take effect until after the write to R0. Table 6. C3, C2, and C1 Truth Table DVDD DVDD C3 0 0 0 0 1 DGND R DIVIDER OUTPUT N DIVIDER OUTPUT ANALOG LOCK DETECT MUX CONTROL MUXOUT DIGITAL LOCK DETECT SERIAL DATA OUTPUT CLK DIVIDER OUTPUT R DIVIDER/2 N DIVIDER/2 DGND 05874-009 FASTLOCK SWITCH Figure 15. MUXOUT Schematic Rev. D | Page 10 of 24 Control Bits C2 0 0 1 1 0 C1 0 1 0 1 0 Register Register 0 (R0) Register 1 (R1) Register 2 (R2) Register 3 (R3) Register 4 (R4) Data Sheet ADF4157 REGISTER MAPS RESERVED FRAC/INT REGISTER (R0) MUXOUT CONTROL 12-BIT MSB FRACTIONAL VALUE (FRAC) 12-BIT INTEGER VALUE (INT) CONTROL BITS DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 M4 M3 M2 M1 N12 N11 N10 N9 N8 N7 N6 N5 N4 N3 N2 N1 F25 F24 F23 F22 F21 F20 F19 F18 F17 F16 F15 F14 C3(0) C2(0) C1(0) LSB FRAC REGISTER (R1) 13-BIT LSB FRACTIONAL VALUE (FRAC) (DBB) RESERVED CONTROL BITS RESERVED DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 0 F13 F12 F11 F10 F9 F8 F7 F6 F5 F4 F3 F2 F1 0 0 0 0 0 0 0 0 0 0 0 0 C3(0) C2(0) C1(1) RDIV2 DBB DBB REFERENCE DOUBLER DBB RESERVED CSR EN RESERVED RESERVED CURRENT SETTING PRESCALER R DIVIDER REGISTER (R2) DBB 5-BIT R COUNTER CONTROL BITS RESERVED 0 0 C1 CPI4 CPI3 CPI2 CPI1 0 P1 U2 U1 R5 R4 R3 R2 R1 0 0 0 0 0 0 0 0 0 PD POLARITY 0 LDP DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 C3(0) C2(1) C1(0) RESERVED PD RESERVED CP THREE-STATE COUNTER RESET SD RESET FUNCTION REGISTER (R3) CONTROL BITS DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 U12 0 0 0 0 0 0 U11 U10 U9 U8 U7 C3(0) C2(1) C1(1) NEG BLEED CURRENT RESERVED TEST REGISTER (R4) RESERVED CLK DIV MODE 12-BIT CLOCK DIVIDER VALUE CONTROL BITS RESERVED DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 0 0 0 NB2 NB1 0 0 C2 C1 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 0 0 0 0 C3(1) C2(0) C1(0) 05874-010 0 NOTES 1. DBB = DOUBLE BUFFERED BIT(S). Figure 16. Register Summary Rev. D | Page 11 of 24 ADF4157 Data Sheet FRAC/INT REGISTER (R0) MAP in Equation 1. See the INT, FRAC, and R Relationship section for more information. With R0[2:0] set to 000, the on-chip FRAC/INT register is programmed as shown in Figure 17. 12-Bit MSB FRAC Value These 12 bits, along with Bits DB[27:15] in the LSB FRAC register (R1), control what is loaded as the FRAC value into the fractional interpolator. This is part of what determines the overall feedback division factor. It is also used in Equation 1. These 12 bits are the most significant bits (MSB) of the 25-bit FRAC value, and Bits DB[27:15] in the LSB FRAC register (R1) are the least significant bits (LSB). See the RF Synthesizer: A Worked Example section for more information. Reserved Bit The reserved bit should be set to 0 for normal operation. MUXOUT The on-chip multiplexer is controlled by Bits DB[30:27] on the ADF4157. See Figure 17 for the truth table. 12-Bit INT Value RESERVED These 12 bits control what is loaded as the INT value. This is used to determine the overall feedback division factor. It is used MUXOUT CONTROL 12-BIT MSB FRACTIONAL VALUE (FRAC) 12-BIT INTEGER VALUE (INT) CONTROL BITS DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 M4 M3 M2 M1 N12 N11 N10 N9 N8 N7 M4 M3 M2 M1 0 0 0 0 THREE-STATE OUTPUT 0 0 0 1 DVDD 0 0 1 0 DGND 0 0 1 1 R DIVIDER OUTPUT 0 1 0 0 N DIVIDER OUTPUT 0 1 0 1 ANALOG LOCK DETECT 0 1 1 0 DIGITAL LOCK DETECT N6 N5 N4 N3 N2 N1 F25 F24 F23 OUTPUT 0 1 1 1 SERIAL DATA OUTPUT 1 0 0 0 RESERVED 1 0 0 1 RESERVED 1 0 1 0 CLK DIVIDER OUTPUT 1 0 1 1 RESERVED 1 1 0 0 FASTLOCK SWITCH 1 1 0 1 R DIVIDER/2 1 1 1 0 N DIVIDER/2 1 1 1 1 RESERVED F22 F21 F20 F19 F18 F17 F16 F15 F14 C3(0) C2(0) C1(0) MSB FRACTIONAL VALUE (FRAC)* F12 F11 .......... F2 F1 0 0 .......... 0 0 0 0 0 .......... 0 1 1 0 0 .......... 1 0 2 0 0 .......... 1 1 3 . . .......... . . . . . .......... . . . . . .......... . . . 1 1 .......... 0 0 4092 1 1 .......... 0 1 4093 1 1 .......... 1 0 4094 1 1 .......... 1 1 4095 *THE FRAC VALUE IS MADE UP OF THE 12-BIT MSB STORED IN REGISTER 0, AND THE 13-BIT LSB REGISTER STORED IN REGISTER 1. FRAC VALUE = 13-BIT LSB + 12-BIT MSB × 213. INTEGER VALUE (INT) N12 N11 N10 N9 N8 N7 N6 N5 N4 N3 N2 N1 0 0 0 0 0 0 0 1 0 1 1 1 23 0 0 0 0 0 0 0 1 1 0 0 0 24 0 0 0 0 0 0 0 1 1 0 0 1 25 0 0 0 0 0 0 0 1 1 0 1 0 26 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1 1 1 1 1 1 1 1 1 0 1 4093 1 1 1 1 1 1 1 1 1 1 1 0 4094 1 1 1 1 1 1 1 1 1 1 1 1 4095 Figure 17. FRAC/INT Register (R0) Map Rev. D | Page 12 of 24 05874-011 0 Data Sheet ADF4157 LSB FRAC REGISTER (R1) MAP These 13 bits are the least significant bits of the 25-bit FRAC value, and Bits DB[14:3] in the INT/FRAC register are the most significant bits. See the RF Synthesizer: A Worked Example section for more information. With R1[2:0] set to 001, the on-chip LSB FRAC register is programmed as shown in Figure 18. 13-Bit LSB FRAC Value Reserved Bits These 13 bits, along with Bits DB[14:3] in the INT/FRAC register (R0), control what is loaded as the FRAC value into the fractional interpolator. This is part of what determines the overall feedback division factor. It is also used in Equation 1. All reserved bits should be set to 0 for normal operation. 13-BIT LSB FRACTIONAL VALUE (FRAC) (DBB) RESERVED CONTROL BITS RESERVED DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 F13 F25 F12 F11 F24 F10 .......... F9 F8 F14 F7 F13 F6 F5 F4 F3 F2 F1 0 0 0 0 0 0 0 0 0 0 0 0 C3(0) C2(0) C1(1) LSB FRACTIONAL VALUE (FRAC)* 0 0 .......... 0 0 0 0 0 .......... 0 1 1 0 0 .......... 1 0 2 0 0 .......... 1 1 3 . . .......... . . . . . .......... . . . . . . .......... . . 1 1 .......... 0 0 8188 1 1 .......... 0 1 8189 1 1 .......... 1 0 8190 1 1 .......... 1 1 8191 *THE FRAC VALUE IS MADE UP OF THE 12-BIT MSB STORED IN REGISTER 0, AND THE 13-BIT LSB REGISTER STORED IN REGISTER 1. FRAC VALUE = 13-BIT LSB + 12-BIT MSB × 213. Figure 18. LSB FRAC Register (R1) Map Rev. D | Page 13 of 24 05874-012 0 ADF4157 Data Sheet R DIVIDER REGISTER (R2) MAP RDIV2 With R2[2:0] set to 010, the on-chip R divider register is programmed as shown in Figure 19. Setting this bit to 1 inserts a divide-by-2 toggle flip-flop between the R counter and the PFD. This can be used to provide a 50% duty cycle signal at the PFD for use with cycle slip reduction. CSR Enable Setting this bit to 1 enables cycle slip reduction. This is a method for improving lock times. Note that the signal at the PFD must have a 50% duty cycle for cycle slip reduction to work. In addition, the charge pump current setting must be set to a minimum. See the Cycle Slip Reduction for Faster Lock Times section for more information. Note also that the cycle slip reduction feature can only be operated when the phase detector polarity setting is positive (DB6 in Register 3). It cannot be used if the phase detector polarity is set to negative. Reference Doubler Setting DB[20] to 0 feeds the REFIN signal directly to the 5-bit RF R counter, disabling the doubler. Setting this bit to 1 multiplies the REFIN frequency by a factor of 2 before feeding into the 5-bit R counter. When the doubler is disabled, the REFIN falling edge is the active edge at the PFD input to the fractional synthesizer. When the doubler is enabled, both the rising edge and falling edge of REFIN become active edges at the PFD input. The maximum allowed REFIN frequency when the doubler is enabled is 30 MHz. Charge Pump Current Setting Bits DB[27:24] set the charge pump current setting. This should be set to the charge pump current that the loop filter is designed with (see Figure 19). Prescaler (P/P + 1) The dual-modulus prescaler (P/P + 1), along with INT, FRAC, and MOD, determine the overall division ratio from RFINx to the PFD input. 5-Bit R Counter The 5-bit R counter allows the input reference frequency (REFIN) to be divided down to produce the reference clock to the phase frequency detector (PFD). Division ratios from 1 to 32 are allowed. Reserved Bits All reserved bits should be set to 0 for normal operation. Operating at CML levels, it takes the clock from the RF input stage and divides it down for the counters. It is based on a synchronous 4/5 core. When set to 4/5, the maximum RF frequency allowed is 3 GHz. Therefore, when operating the ADF4157 above 3 GHz, the prescaler must be set to 8/9. The prescaler limits the INT value. With P = 4/5, NMIN = 23. With P = 8/9, NMIN = 75. Rev. D | Page 14 of 24 DBB REFERENCE DOUBLER DBB RDIV2 DBB PRESCALER CSR EN CURRENT SETTING RESERVED ADF4157 DBB RESERVED RESERVED Data Sheet 5-BIT R COUNTER CONTROL BITS RESERVED DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 C1 0 C1 CPI4 CPI3 CPI2 CPI1 0 P1 U2 CYCLE SLIP REDUCTION U1 R5 R4 R3 U1 REFERENCE DOUBLER 0 DISABLED 0 DISABLED 1 ENABLED 1 ENABLED P1 U2 R DIVIDER 0 DISABLED 1 ENABLED R2 R1 0 0 4/5 1 8/9 R4 R3 R2 R1 0 0 0 0 1 1 0 0.31 0 0 0 1 0 2 0 1 0.63 0 0 0 1 1 3 0 1 0 0.94 0 0 1 0 0 4 0 0 1 1 1.25 . . . . . 0 1 0 0 1.57 . . . . . 0 1 0 1 1.88 . . . . . 0 1 1 0 2.19 1 1 1 0 1 29 0 1 1 1 2.5 1 1 1 1 . 30 1 0 0 0 2.81 1 1 1 1 1 31 1 0 0 1 3.13 0 0 0 0 0 32 1 0 1 0 3.44 1 0 1 1 3.75 1 1 0 0 4.06 1 1 0 1 4.38 1 1 1 0 4.69 1 1 1 1 5 CPI2 CPI1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 C3(0) C2(1) C1(0) R COUNTER DIVIDE RATIO 05874-013 R5 ICP (mA) CPI3 0 PRESCALER 0 5.1kΩ CPI4 0 Figure 19. R Divider Register (R2) Map Rev. D | Page 15 of 24 ADF4157 Data Sheet FUNCTION REGISTER (R3) MAP RF Power-Down With R3[2:0] set to 011, the on-chip function register is programmed as shown in Figure 20. All reserved bits should be set to 0 for normal operation. DB[5] provides the programmable power-down mode. Setting this bit to 1 performs a power-down. Setting this bit to 0 returns the synthesizer to normal operation. While in software powerdown mode, the part retains all information in its registers. Only when supplies are removed are the register contents lost. Σ-Δ Reset When a power-down is activated, the following events occur: Reserved Bits For most applications, DB14 should be set to 0. When DB14 is set to 0, the Σ-Δ modulator is reset on each write to Register 0. If it is not required that the Σ-Δ modulator be reset on each Register 0 write, this bit should be set to 1. • • • • • • Lock Detect Precision (LDP) When DB[7] is programmed to 0, 24 consecutive PFD cycles of 15 ns must occur before digital lock detect is set. When this bit is programmed to 1, 40 consecutive reference cycles of 15 ns must occur before digital lock detect is set. All active dc current paths are removed. The synthesizer counters are forced to their load state conditions. The charge pump is forced into three-state mode. The digital lock detect circuitry is reset. The RFINx input is debiased. The input shift register remains active and capable of loading and latching data. RF Charge Pump Three-State Phase Detector Polarity DB[4] puts the charge pump into three-state mode when programmed to 1. It should be set to 0 for normal operation. DB[6] sets the phase detector polarity. When the VCO characteristics are positive, this should be set to 1. When they are negative, it should be set to 0. RF Counter Reset PD CP THREE-STATE COUNTER RESET RESERVED PD POLARITY RESERVED LDP SD RESET DB[3] is the RF counter reset bit for the ADF4157. When this is 1, the RF synthesizer counters are held in reset. For normal operation, this bit should be 0. CONTROL BITS DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 U12 0 0 0 U11 U12 SD RESET 0 ENABLED 1 DISABLED 0 0 0 U11 U8 U7 U7 0 24 PFD CYCLES 1 40 PFD CYCLES PD POLARITY 0 NEGATIVE 1 POSITIVE U9 Rev. D | Page 16 of 24 U9 LDP U10 Figure 20. Function Register (R3) Map U10 U8 C3(0) C2(1) C1(1) COUNTER RESET 0 DISABLED 1 ENABLED CP THREE-STATE 0 DISABLED 1 ENABLED POWER-DOWN 0 DISABLED 1 ENABLED 05874-014 0 Data Sheet ADF4157 TEST REGISTER (R4) MAP CLK Divider Mode With R4[2:0] set to 100, the on-chip test register (R4) is programmed as shown in Figure 21. Setting Bits DB[20:19] to 01 enables switched R fastlock. Negative Bleed Current Bits DB[18:7] are used to program the clock divider, which determines for how long the loop remains in wideband mode while the switched R fastlock technique is used. 12-Bit Clock Divider Value RESERVED Setting Bits DB[24:23] to 11 turns on the constant negative bleed current. This ensures that the charge pump operates out of the dead zone. Thus the phase noise is not degraded and the level of spurs is lower. Enabling constant negative bleed current is particularly important on channels close to multiple PFD frequencies. NEG BLEED CURRENT RESERVED Reserved Bits All reserved bits should be set to 0 for normal operation. CLK DIV MODE 12-BIT CLOCK DIVIDER VALUE CONTROL BITS RESERVED DB31 DB30 DB29 DB28 DB27 DB26 DB25 DB24 DB23 DB22 DB21 DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0 0 0 0 0 NB2 0 1 0 NB1 0 1 0 NB2 NB1 0 0 C2 C1 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 0 0 0 0 NEGATIVE BLEED CURRENT D12 D11 .......... D2 D1 CLOCK DIVIDER VALUE OFF ON 0 0 0 0 . . . 1 1 1 1 0 0 0 0 . . . 1 1 1 1 .......... .......... .......... .......... .......... .......... .......... .......... .......... .......... .......... 0 1 0 1 . . . 0 1 0 1 0 1 2 3 . . . 4092 4093 4094 4095 C2 C1 0 0 0 1 CLOCK DIVIDER MODE CLOCK DIVIDER OFF SWITCHED R FASTLOCK ENABLE Figure 21. Test Register (R4) Map Rev. D | Page 17 of 24 0 0 1 1 . . . 0 0 1 1 C3(1) C2(0) C1(0) 05874-015 0 ADF4157 Data Sheet APPLICATIONS INFORMATION INITIALIZATION SEQUENCE After powering up the part, this programming sequence must be followed: 1. 2. 3. 4. 5. Test register (R4) Function register (R3) R divider register (R2) LSB FRAC register (R1) FRAC/INT register (R0) note that the PFD cannot be operated above 32 MHz due to a limitation in the speed of the Σ-Δ circuit of the N divider. CYCLE SLIP REDUCTION FOR FASTER LOCK TIMES In fastlocking applications, a wide loop filter bandwidth is required for fast frequency acquisition, resulting in increased integrated phase noise and reduced spur attenuation. Using cycle slip reduction, the loop bandwidth can be kept narrow to reduce integrated phase noise and attenuate spurs while still realizing fast lock times. RF SYNTHESIZER: A WORKED EXAMPLE The following equation governs how the synthesizer should be programmed: RFOUT = [N + (FRAC/225)] × [fPFD] (3) where: RFOUT is the RF frequency output. N is the integer division factor. FRAC is the fractionality. fPFD = REFIN × [(1 + D)/(R × (1 + T))] (4) where: REFIN is the reference frequency input. D is the RF REFIN doubler bit. R is the RF reference division factor. T is the reference divide-by-2 bit (0 or 1). For example, in a system where a 5.8002 GHz RF frequency output (RFOUT) is required and a 10 MHz reference frequency input (REFIN) is available, the frequency resolution is fRES = REFIN/225 fRES = 10 MHz/225 = 0.298 Hz From Equation 4, fPFD = [10 MHz × (1 + 0)/1] = 10 MHz 5.8002 GHz = 10 MHz × (N + FRAC/225) Cycle Slips Cycle slips occur in integer-N/fractional-N synthesizers when the loop bandwidth is narrow compared to the PFD frequency. The phase error at the PFD inputs accumulates too fast for the PLL to correct, and the charge pump temporarily pumps in the wrong direction, slowing down the lock time dramatically. The ADF4157 contains a cycle slip reduction circuit to extend the linear range of the PFD, allowing faster lock times without loop filter changes. When the ADF4157 detects that a cycle slip is about to occur, it turns on an extra charge pump current cell. This outputs a constant current to the loop filter or removes a constant current from the loop filter (depending on whether the VCO tuning voltage needs to increase or decrease to acquire the new frequency). The effect is that the linear range of the PFD is increased. Stability is maintained because the current is constant and is not a pulsed current. If the phase error increases again to a point where another cycle slip is likely, the ADF4157 turns on another charge pump cell. This continues until the ADF4157 detects that the VCO frequency has exceeded the desired frequency. It then begins to turn off the extra charge pump cells one by one until they are all turned off and the frequency is settled. Up to seven extra charge pump cells can be turned on. In most applications, it is enough to eliminate cycle slips altogether, giving much faster lock times. Calculating N and FRAC values, N = int(RFOUT/fPFD) = 580 FRAC = FMSB × 213 + FLSB FMSB = int(((RFOUT/fPFD) − N) × 212) = 81 FLSB = int(((((RFOUT/fPFD) − N) × 212) − FMSB) × 213) = 7537 where: FMSB is the 12-bit MSB FRAC value in Register R0. FLSB is the 13-bit LSB FRAC value in Register R1. int() makes an integer of the argument in brackets. REFERENCE DOUBLER AND REFERENCE DIVIDER The on-chip reference doubler allows the input reference signal to be doubled. This is useful for increasing the PFD comparison frequency. Making the PFD frequency higher improves the noise performance of the system. Doubling the PFD frequency usually improves noise performance by 3 dB. It is important to Setting Bit DB28 in the R Divider register (R2) to 1 enables cycle slip reduction. Note that a 45% to 55% duty cycle is needed on the signal at the PFD for CSR to operate correctly. The reference divide-by-2 flip-flop can help to provide a 50% duty cycle at the PFD. For example, if a 100 MHz reference frequency is available, and the user wants to run the PFD at 10 MHz, setting the R divide factor to 10 results in a 10 MHz PFD signal that is not 50% duty cycle. By setting the R divide factor to 5 and enabling the reference divide-by-2 bit, a 50% duty cycle 10 MHz signal can be achieved. Note that the cycle slip reduction feature can only be operated when the phase detector polarity setting is positive (DB6 in Register 3). It cannot be used if the phase detector polarity is set to negative. Rev. D | Page 18 of 24 Data Sheet ADF4157 FASTLOCK TIMER AND REGISTER SEQUENCES ADF4157 R2 CP VCO If the fastlock mode is used, a timer value needs to be loaded into the PLL to determine the time spent in wide bandwidth mode. When Bits DB[20:19] in Register 4 (R4) are set to 01 (switched R fastlock enable), the timer value is loaded via the 12-bit clock divider value. To use fastlock, the PLL must be written to in the following sequence: 1. 2. Use the initialization sequence (see the Initialization Sequence section) only once after powering up the part. Load Register 4 (R4) with Bits DB[20:19] set to 01 and the chosen fastlock timer value (DB18 to DB7). Note that the duration that the PLL remains in wide bandwidth is equal to the fastlock timer/fPFD. FASTLOCK: AN EXAMPLE If a PLL has fPFD = 13 MHz and a required lock time of 50 µs, the PLL is set to wide bandwidth for 40 µs. If the time period set for the wide bandwidth is 40 µs, then Fastlock Timer Value = Time in Wide Bandwidth × fPFD Fastlock Timer Value = 40 µs × 13 MHz = 520 Therefore, 520 must be loaded into the clock divider value in Register 4 (R4) in Step 2 of the sequence described in the Fastlock Timer and Register Sequences section. FASTLOCK: LOOP FILTER TOPOLOGY To use fast-lock mode, an extra connection from the PLL to the loop filter is needed. The damping resistor in the loop filter must be reduced to ¼ of its value while in wide bandwidth mode. This is required because the charge pump current is increased by 16 while in wide bandwidth mode, and stability must be ensured. During fastlock, the MUXOUT pin (after setting MUXOUT to fastlock switch by setting Bits DB[30:27] in Register 0 to 1100) is shorted to ground (this is accomplished by settings Bits DB[20:19] in Register 4 to 01—switched R fastlock enable). The following two topologies can be used: • Divide the damping resistor (R1) into two values (R1 and R1A) that have a ratio of 1:3 (see Figure 22). • Connect an extra resistor (R1A) directly from MUXOUT, as shown in Figure 23. The extra resistor must be chosen such that the parallel combination of an extra resistor and the damping resistor (R1) is reduced to ¼ of the original value of R1 (see Figure 23). ADF4157 R2 CP VCO C1 C2 C3 R1 MUXOUT 05874-022 R1A Figure 22. Fast-Lock Loop Filter Topology—Topology 1 C1 C2 R1A R1 C3 05874-023 MUXOUT Figure 23. Fastlock Loop Filter Topology—Topology 2 SPUR MECHANISMS The fractional interpolator in the ADF4157 is a third-order Σ-Δ modulator (SDM) with a 25-bit fixed modulus (MOD). The SDM is clocked at the PFD reference rate (fPFD) that allows PLL output frequencies to be synthesized at a channel step resolution of fPFD/MOD. The various spur mechanisms possible with fractionalN synthesizers, and how they affect the ADF4157, are discussed in this section. Fractional Spurs In most fractional synthesizers, fractional spurs can appear at the set channel spacing of the synthesizer. In the ADF4157, these spurs do not appear. The high value of the fixed modulus in the ADF4157 makes the Σ-Δ modulator quantization error spectrum look like broadband noise, effectively spreading the fractional spurs into noise. Integer Boundary Spurs Interactions between the RF VCO frequency and the PFD frequency can lead to spurs known as integer boundary spurs. When these frequencies are not integer related (which is the purpose of the fractional-N synthesizer), spur sidebands appear on the VCO output spectrum at an offset frequency that corresponds to the beat note or difference frequency between an integer multiple of the PFD and the VCO frequency. These spurs are named integer boundary spurs because they are more noticeable on channels close to integer multiples of the PFD where the difference frequency can be inside the loop bandwidth. These spurs are attenuated by the loop filter. Figure 7 shows an integer boundary spur. The RF frequency is 5800.25 MHz, and the PFD frequency is 25 MHz. The integer boundary spur is 250 kHz from the carrier at an integer times the PFD frequency (232 × 25 MHz = 5800 MHz). The spur also appears on the upper sideband. Reference Spurs Reference spurs are generally not a problem in fractional-N synthesizers because the reference offset is far outside the loop bandwidth. However, any reference feedthrough mechanism that bypasses the loop can cause a problem. One such mechanism is the feedthrough of low levels of on-chip reference switching noise out through the RFINx pin back to the VCO, resulting in reference spur levels as high as −90 dBc. Care should be taken in the PCB layout to ensure that the VCO is well separated from the input reference to avoid a possible feedthrough path on the board. Rev. D | Page 19 of 24 ADF4157 Data Sheet LOW FREQUENCY APPLICATIONS The specification on the RF input is 0.5 GHz minimum; however, RF frequencies lower than this can be used, providing the minimum slew rate specification of 400 V/µs is met. An appropriate LVDS driver can be used to square up the RF signal before it is fed back to the ADF4157 RF input. The FIN1001 from Fairchild Semiconductor is one such LVDS driver. FILTER DESIGN—ADIsimPLL A filter design and analysis program is available to help the user implement PLL design. Visit www.analog.com/pll for a free download of the ADIsimPLL™ software. The software designs, simulates, and analyzes the entire PLL frequency domain and time domain response. Various passive and active filter architectures are allowed. OPERATING WITH WIDE LOOP FILTER BANDWIDTHS If a wide loop filter bandwidth is used (>60 kHz), fluctuations in the phase noise profile may be noticed on channels that are close to integer multiples of the PFD frequency. This is due to operation of the charge pump close to the dead zone. To improve the phase noise, a bleed current can be enabled to bias the charge pump away from the dead zone. To enable this, set Bit DB[24:23] in Register 4. Using this mode has the added advantage of improving the integer boundary spurs by 4 dB to 5 dB. Note that it is also safe to use this mode if the loop filter bandwidth is <60 kHz. PCB DESIGN GUIDELINES FOR THE CHIP SCALE PACKAGE The lands on the chip scale package (CP-20) are rectangular. The printed circuit board pad for these should be 0.1 mm longer than the package land length and 0.05 mm wider than the package land width. The land should be centered on the pad. This ensures that the solder joint size is maximized. The bottom of the chip scale package has a central thermal pad. The thermal pad on the printed circuit board (PCB) should be at least as large as the exposed pad. On the printed circuit board, there should be a clearance of at least 0.25 mm between the thermal pad and the inner edges of the pad pattern. This ensures that shorting is avoided. Thermal vias can be used on the PCB thermal pad to improve thermal performance of the package. If vias are used, they should be incorporated into the thermal pad at 1.2 mm pitch grid. The via diameter should be between 0.3 mm and 0.33 mm, and the via barrel should be plated with 1 ounce of copper to plug the via. The user should connect the PCB thermal pad to AGND. Rev. D | Page 20 of 24 Data Sheet ADF4157 OUTLINE DIMENSIONS 5.10 5.00 4.90 16 9 4.50 4.40 4.30 6.40 BSC 1 8 PIN 1 1.20 MAX 0.15 0.05 0.20 0.09 0.30 0.19 0.65 BSC COPLANARITY 0.10 0.75 0.60 0.45 8° 0° SEATING PLANE COMPLIANT TO JEDEC STANDARDS MO-153-AB Figure 24. 16-Lead Thin Shrink Small Outline Package [TSSOP] (RU-16) Dimensions shown in millimeters 0.30 0.25 0.18 0.50 BSC PIN 1 INDICATOR 20 16 15 1 EXPOSED PAD 2.30 2.10 SQ 2.00 11 TOP VIEW 0.80 0.75 0.70 SEATING PLANE 0.65 0.60 0.55 5 10 6 0.20 MIN BOTTOM VIEW 0.05 MAX 0.02 NOM COPLANARITY 0.08 0.20 REF FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONFIGURATION AND FUNCTION DESCRIPTIONS SECTION OF THIS DATA SHEET. COMPLIANT TO JEDEC STANDARDS MO-220-WGGD-1. 08-16-2010-B PIN 1 INDICATOR 4.10 4.00 SQ 3.90 Figure 25. 20-Lead Lead Frame Chip Scale Package [LFCSP_WQ] 4mm × 4 mm Body, Very Very Thin Quad (CP-20-6) Dimensions shown in millimeters ORDERING GUIDE Model 1 ADF4157BRUZ ADF4157BRUZ-RL ADF4157BRUZ-RL7 ADF4157BCPZ ADF4157BCPZ-RL ADF4157BCPZ-RL7 EV-ADF4157SD1Z 1 Description 16-Lead Thin Shrink Small Outline Package [TSSOP] 16-Lead Thin Shrink Small Outline Package [TSSOP] 16-Lead Thin Shrink Small Outline Package [TSSOP] 20-Lead Lead Frame Chip Scale Package [LFCSP_WQ] 20-Lead Lead Frame Chip Scale Package [LFCSP_WQ] 20-Lead Lead Frame Chip Scale Package [LFCSP_WQ] Evaluation Board Z = RoHS Compliant Part. Rev. D | Page 21 of 24 Temperature Range −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C −40°C to +85°C Package Option RU-16 RU-16 RU-16 CP-20-6 CP-20-6 CP-20-6 ADF4157 Data Sheet NOTES Rev. D | Page 22 of 24 Data Sheet ADF4157 NOTES Rev. D | Page 23 of 24 ADF4157 Data Sheet NOTES ©2007–2012 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05874-0-8/12(D) Rev. D | Page 24 of 24