Fairchild FAN3121 Single 9a high-speed, low-side gate driver Datasheet

FAN3121 / FAN3122_F085
Single 9A High-Speed, Low-Side Gate Driver
Features
Description
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Qualified to AEC Q-100
The FAN3121 and FAN3122 MOSFET drivers are
designed to drive N-channel enhancement MOSFETs in
low-side switching applications by providing high peak
current pulses. The drivers are available with either TTL
(FAN312xT) or CMOS (FAN312xC) input thresholds.
Internal circuitry provides an under-voltage lockout
function by holding the output low until the supply
voltage is within the operating range.
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Internal Resistors Turn Driver Off If No Inputs
4.5 to 18V Operating Range
11.4A Peak Sink at VDD = 12V
9.7A Sink / 7.1A Source at VOUT = 6V
Inverting Configuration (FAN3121) and
Non-Inverting Configuration (FAN3122)
23ns/19ns Typical Rise/Fall Times with 10nF Load
20ns Typical Propagation Delay Time
Choice of TTL or CMOS Input Thresholds
MillerDrive™ Technology
FAN312x drivers incorporate the MillerDrive™
architecture for the final output stage. This bipolar /
MOSFET combination provides the highest peak current
during the Miller plateau stage of the MOSFET turn-on /
turn-off process.
The FAN3121 and FAN3122 drivers implement an
enable function on pin 3 (EN), previously unused in the
industry-standard pin-out. The pin is internally pulled up
to VDD for active HIGH logic and can be left open for
standard operation.
8-Lead SOIC Package
Rated from –40°C to +125°C
Applications
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Synchronous Rectifier Circuits
High-Efficiency MOSFET Switching
Switch-Mode Power Supplies
DC-to-DC Converters
Motor Control
VDD 1
8
VDD
VDD 1
8 VDD
IN
2
7
OUT
IN
2
7 OUT
EN
3
6
OUT
EN
3
6 OUT
GND 4
5
GND
GND 4
5 GND
Figure 1.
FAN3121 Pin Configuration
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
Figure 2.
FAN3122 Pin Configuration
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
February 2012
Part Number
Logic
Input
Threshold
Package
Eco
Status
Packing
Method
Quantity
per Reel
FAN3121CMX_F085 Inverting Channels +
FAN3121TMX_F085 Enable
CMOS
SOIC-8
RoHS
Tape & Reel
2,500
TTL
SOIC-8
RoHS
Tape & Reel
2,500
FAN3122CMX_F085 Non-Inverting Channels +
FAN3122TMX_F085 Enable
CMOS
SOIC-8
RoHS
Tape & Reel
2,500
TTL
SOIC-8
RoHS
Tape & Reel
2,500
For Fairchild’s definition of “green” Eco Status, please visit: http://www.fairchildsemi.com/company/green/rohs_green.html.
Package Outline
Figure 3.
SOIC-8 (Top View)
Thermal Characteristics(1)
Package
JL(2)
JT(3)
JA(4)
JB(5)
JT(6)
Units
38
29
87
41
2.3
°C/W
8-Pin Small Outline Integrated Circuit (SOIC)
Notes:
1. Estimates derived from thermal simulation; actual values depend on the application.
2. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads
(including any thermal pad) that are typically soldered to a PCB.
3. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package,
assuming it is held at a uniform temperature by a top-side heatsink.
4.
5.
6.
Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking,
and airflow. The value given is for natural convection with no heatsink, as specified in JEDEC standards
JESD51-2, JESD51-5, and JESD51-7, as appropriate.
Psi_JB (JB): Thermal characterization parameter providing correlation between semiconductor junction
temperature and an application circuit board reference point for the thermal environment defined in Note 4. For
the SOIC-8 package, the board reference is defined as the PCB copper adjacent to pin 6.
Psi_JT (JT): Thermal characterization parameter providing correlation between the semiconductor junction
temperature and the center of the top of the package for the thermal environment defined in Note 4.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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2
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Ordering Information
Figure 4.
8
VDD
VDD 1
8 VDD
IN
2
7
OUT
IN
2
7 OUT
EN
3
6
OUT
EN
3
6 OUT
GND 4
5
GND
GND 4
5 GND
FAN3121 Pin Assignments (Repeated)
Figure 5.
FAN3122 Pin Assignments (Repeated)
Pin Definitions
FAN3121
FAN3122
Name
Description
3
3
EN
Enable Input. Pull pin LOW to inhibit driver. EN has logic thresholds for both
TTL and CMOS IN thresholds.
4, 5
4, 5
GND
2
2
IN
6, 7
OUT
Gate Drive Output. Held LOW unless required input is present and VDD is
above the UVLO threshold.
OUT
Gate Drive Output (inverted from the input). Held LOW unless required
input is present and VDD is above the UVLO threshold.
VDD
Supply Voltage. Provides power to the IC.
6, 7
1, 8
1, 8
Ground. Common ground reference for input and output circuits.
Input.
Output Logic
FAN3121
FAN3122
EN
IN
0
0
0
0
0
(7)
0
0
1
1
1(7)
0
1(7)
(7)
1
1(7)
1
OUT
EN
IN
OUT
(7)
0
0
1
0
(7)
(7)
0
1
1
0
0
Note:
7. Default input signal if no external connection is made.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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3
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
VDD 1
VDD
1
8
100k
Inverting
(FAN3121)
UVLO
VDD_OK
IN
VDD
OUT (FAN3121)
7 OUT (FAN3122)
2
100k
6
Non-Inverting
100k (FAN3122)
OUT (FAN3121)
OUT (FAN3122)
VDD
100k
EN
3
5
GND
GND 4
Figure 6.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
Block Diagram
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4
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Block Diagram
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Min.
Max.
Unit
-0.3
20.0
V
VDD
VDD to GND
VEN
EN to GND
GND - 0.3 VDD + 0.3
V
VIN
IN to GND
GND - 0.3 VDD + 0.3
V
OUT to GND
GND - 0.3 VDD + 0.3
V
VOUT
TL
Lead Soldering Temperature (10 Seconds)
TJ
Junction Temperature
TSTG
Storage Temperature
ESD
Human Body Model, JEDEC JESD22-A114
+260
ºC
-55
+150
ºC
-65
+150
ºC
2
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
Min.
Max.
Unit
4.5
18.0
V
VDD
Supply Voltage Range
VEN
Enable Voltage EN
0
VDD
V
VIN
Input Voltage IN
0
VDD
V
TA
Operating Ambient Temperature
-40
+125
ºC
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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5
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Absolute Maximum Ratings
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device and
negative out of the device.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
18.0
V
0.65
0.90
0.58
0.85
Supply
VDD
Operating Range
4.5
TTL
IDD
Supply Current, Inputs / EN Not Connected
VON
Turn-On Voltage
3.5
4.0
4.3
V
VOFF
Turn-Off Voltage
3.25
3.75
4.15
V
0.8
1.0
(8)
CMOS
mA
(9)
Inputs (FAN312xT)
VIL_T
INx Logic Low Threshold
VIH_T
INx Logic High Threshold
IINx_T
Non-inverting Input Current
IN = 0V
-1.5
IINx_T
Non-inverting Input Current
IN = VDD
90
IINx_T
Inverting Input Current
IN = 0V
-175.0
IINx_T
Inverting Input Current
IN = VDD
-1.5
VHYS_T
TTL Logic Hysteresis Voltage
Inputs (FAN312xC)
VIL_C
1.7
2.0
V
1.5
µA
120
175.0
µA
-120
-90
µA
1.5
µA
0.85
V
0.40
0.70
30
38
(9)
INx Logic Low Threshold
VIH_C
INx Logic High Threshold
IINx_C
Non-Inverting Input Current
IN = 0V
-1.5
IINx_C
Non-Inverting Input Current
IN = VDD
90
IINx_C
Inverting Input Current
IN = 0V
-175
IINx_C
Inverting Input Current
IN = VDD
-1.5
VHYS_C
V
55
CMOS Logic Hysteresis Voltage
%VDD
70
%VDD
1.5
µA
120
175
µA
-120
-90
µA
1.5
µA
12
17
24
%VDD
1.2
1.6
2.0
V
ENABLE (FAN3121, FAN3122)
VENL
Enable Logic Low Threshold
EN from 5V to 0V
VENH
Enable Logic High Threshold
EN from 0V to 5V
VHYS_T
TTL Logic Hysteresis Voltage
RPU
tD1, tD2
tD1, tD2
Enable Pull-up Resistance
1.8
2.2
2.6
V
0.2
0.6
0.8
V
68
100
134
kΩ
(10)
8
17
27
ns
(10)
14
21
33
ns
Propagation Delay, EN Rising
Propagation Delay, EN Falling
Notes:
8. Lower supply current due to inactive TTL circuitry.
9. EN inputs have modified TTL thresholds; refer to the ENABLE section.
10. See Timing Diagrams of Figure 7 and Figure 8.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Electrical Characteristics
Unless otherwise noted, VDD=12V and TJ=-40°C to +125°C. Currents are defined as positive into the device and
negative out of the device.
OUTPUT
ISINK
OUT Current, Mid-Voltage,
Sinking(11)
OUT at VDD/2, CLOAD=1.0µF,
f=1kHz
9.7
A
ISOURCE
OUT Current, Mid-Voltage,
(11)
Sourcing
OUT at VDD/2, CLOAD=1.0µF,
f=1kHz
7.1
A
IPK_SINK
OUT Current, Peak, Sinking
CLOAD=1.0µF, f=1kHz
11.4
A
CLOAD=1.0µF, f=1kHz
10.6
A
(11)
(11)
IPK_SOURCE OUT Current, Peak, Sourcing
VOH
High Level Output Voltage
VOH = VDD – VOUT, IOUT = –1mA
15
35
mV
VOL
Low Level Output Voltage
IOUT = 1mA
10
25
mV
tRISE
tFALL
(12)
Output Rise Time
(12)
CLOAD=10nF
18
23
29
ns
Output Fall Time
CLOAD=10nF
11
19
27
ns
tD1, tD2
Output Propagation Delay, CMOS
(12)
Inputs
0 – 12VIN, 1V/ns Slew Rate
9
18
28
ns
tD1, tD2
Output Propagation Delay, TTL
(12)
Inputs
0 – 5VIN, 1V/ns Slew Rate
9
23
35
ns
Notes:
11. Not tested in production.
12. See Timing Diagrams of Figure 7 and Figure 8.
Timing Diagrams
Figure 7.
Non-Inverting
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
Figure 8.
Inverting
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Electrical Characteristics (Continued)
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 9.
IDD (Static) vs. Supply Voltage(13)
Figure 10. IDD (Static) vs. Supply Voltage(13)
Figure 11. IDD (No-Load) vs. Frequency
Figure 12. IDD (No-Load) vs. Frequency
Figure 13. IDD (10nF Load) vs. Frequency
Figure 14. IDD (10nF Load) vs. Frequency
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
(13)
(13)
Figure 15. IDD (Static) vs. Temperature
Figure 16. IDD (Static) vs. Temperature
Figure 17. Input Thresholds vs. Supply Voltage
Figure 18. Input Thresholds vs. Supply Voltage
Figure 19. Input Thresholds % vs. Supply Voltage
Figure 20. Enable Thresholds vs. Supply Voltage
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 21. CMOS Input Thresholds vs. Temperature
Figure 22. TTL Input Thresholds vs. Temperature
Figure 23. Enable Thresholds vs. Temperature
Figure 24. UVLO Thresholds vs. Temperature
Figure 25. UVLO Hysteresis vs. Temperature
Figure 26. Propagation Delay vs. Supply Voltage
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 27. Propagation Delay vs. Supply Voltage
Figure 28. Propagation Delay vs. Supply Voltage
Figure 29. Propagation Delay vs. Supply Voltage
Figure 30. Propagation Delay vs. Supply Voltage
Figure 31. Propagation Delays vs. Temperature
Figure 32. Propagation Delays vs. Temperature
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 33. Propagation Delays vs. Temperature
Figure 34. Propagation Delays vs. Temperature
Figure 35. Propagation Delays vs. Temperature
Figure 36. Fall Time vs. Supply Voltage
Figure 37. Rise Time vs. Supply Voltage
Figure 38. Rise and Fall Time vs. Temperature
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
Typical characteristics are provided at 25°C and VDD=12V unless otherwise noted.
Figure 39. Rise / Fall Waveforms with 10nF Load
(14)
Figure 41. Quasi-Static Sink Current with VDD=12V
(14)
Figure 40. Quasi-Static Source Current with VDD=12V
Figure 42. Quasi-Static Source Current with VDD=8V
(14)
V DD
(2) x 4.7µF
ceramic
Current Probe
LECROY AP015
FAN3121/22
IN
1kHz
(14)
Figure 43. Quasi-Static Sink Current with VDD=8V
470µF
Al. El.
IOUT
1µF
ceramic
VOUT
C LOAD
1µF
Figure 44. Quasi-Static IOUT / VOUT Test Circuit
Notes:
13. For any inverting inputs pulled LOW, non-inverting inputs pulled HIGH, or outputs driven HIGH; static IDD
increases by the current flowing through the corresponding pull-up/down resistor, shown in Figure 6.
14. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of
the current-measurement loop.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Performance Characteristics
The FAN3121 and FAN3122 family offers versions in
either TTL or CMOS input configuration. In the
FAN3121T and FAN3122T, the input thresholds meet
industry-standard TTL-logic thresholds independent of
the VDD voltage, and there is a hysteresis voltage of
approximately 0.7V. These levels permit the inputs to be
driven from a range of input logic signal levels for which
a voltage over 2V is considered logic HIGH. The driving
signal for the TTL inputs should have fast rising and
falling edges with a slew rate of 6V/µs or faster, so the
rise time from 0 to 3.3V should be 550ns or less.
The FAN3121 and FAN3122 output can be enabled or
disabled using the EN pin with a very rapid response
time. If EN is not externally connected, an internal pullup resistor enables the driver by default. The EN pin has
logic thresholds for parts with either TTL or CMOS IN
thresholds.
In the FAN3121C and FAN3122C, the logic input
thresholds are dependent on the VDD level and, with VDD
of 12V, the logic rising edge threshold is approximately
55% of VDD and the input falling edge threshold is
approximately 38% of VDD. The CMOS input
configuration
offers
a
hysteresis
voltage
of
approximately 17% of VDD. The CMOS inputs can be
used with relatively slow edges (approaching DC) if
good decoupling and bypass techniques are
incorporated in the system design to prevent noise from
violating the input voltage hysteresis window. This
allows setting precise timing intervals by fitting an R-C
circuit between the controlling signal and the IN pin of
the driver. The slow rising edge at the IN pin of the
driver introduces a delay between the controlling signal
and the OUT pin of the driver.
Static Supply Current
In the IDD (static) Typical Performance Characteristics,
the curves are produced with all inputs / enables floating
(OUT is LOW) and indicates the lowest static IDD current
for the tested configuration. For other states, additional
current flows through the 100k resistors on the inputs
and outputs, as shown in the block diagram (see Figure
6). In these cases, the actual static IDD current is the
value obtained from the curves, plus this additional
current.
MillerDrive™ Gate-Drive Technology
FAN312x gate drivers incorporate the MillerDrive™
architecture shown in Figure 45. For the output stage, a
combination of bipolar and MOS devices provide large
currents over a wide range of supply voltage and
temperature variations. The bipolar devices carry the
bulk of the current as OUT swings between 1/3 to 2/3
VDD and the MOS devices pull the output to the HIGH or
LOW rail.
The purpose of the Miller Drive™ architecture is to
speed up switching by providing high current during the
Miller plateau region when the gate-drain capacitance of
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
the MOSFET is being charged or discharged as part of
the turn-on / turn-off process.
For applications with zero voltage switching during the
MOSFET turn-on or turn-off interval, the driver supplies
high peak current for fast switching, even though the
Miller plateau is not present. This situation often occurs
in synchronous rectifier applications because the body
diode is generally conducting before the MOSFET is
switched on.
The output pin slew rate is determined by VDD voltage
and the load on the output. It is not user adjustable, but
a series resistor can be added if a slower rise or fall time
at the MOSFET gate is needed.
Figure 45. Miller Drive™ Output Architecture
Under-Voltage Lockout (UVLO)
The FAN312x startup logic is optimized to drive groundreferenced N-channel MOSFETs with an under-voltage
lockout (UVLO) function to ensure that the IC starts in
an orderly fashion. When VDD is rising, yet below the
4.0V operational level, this circuit holds the output low,
regardless of the status of the input pins. After the part
is active, the supply voltage must drop 0.25V before the
part shuts down. This hysteresis helps prevent chatter
when low VDD supply voltages have noise from the
power switching. This configuration is not suitable for
driving high-side P-channel MOSFETs because the low
output voltage of the driver would turn the P-channel
MOSFET on with VDD below 4.0V.
VDD Bypassing and Layout Considerations
The FAN3121 and FAN3122 are available in either
8-lead SOIC or MLP packages. In either package, the
VDD pins 1 and 8 and the GND pins 4 and 5 should be
connected together on the PCB.
In typical FAN312x gate-driver applications, high-current
pulses are needed to charge and discharge the gate of
a power MOSFET in time intervals of 50ns or less. A
bypass capacitor with low ESR and ESL should be
connected directly between the VDD and GND pins to
provide these large current pulses without causing
unacceptable ripple on the VDD supply. To meet these
requirements in a small size, a ceramic capacitor of 1µF
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FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Applications Information
Figure 46 shows the pulsed gate drive current path
when the gate driver is supplying gate charge to turn the
MOSFET on. The current is supplied from the local
bypass capacitor CBYP and flows through the driver to
the MOSFET gate and to ground. To reach the high
peak currents possible with the FAN312x family, the
resistance and inductance in the path should be
minimized. The localized CBYP acts to contain the high
peak current pulses within this driver-MOSFET circuit,
preventing them from disturbing the sensitive analog
circuitry in the PWM controller.
VDD
VDS
The OUT pulses’ magnitude follows VDD magnitude with
the output polarity inverted from the input until steadystate VDD is reached.
VDD
Turn-on threshold
IN-
IN+
(VDD)
CBYP
FAN3121/2
OUT
PWM
Figure 49. Inverting Startup Waveforms
Figure 46. Current Path for MOSFET Turn-On
Figure 477 shows the path the current takes when the
gate driver turns the MOSFET off. Ideally, the driver
shunts the current directly to the source of the MOSFET in
a small circuit loop. For fast turn-off times, the resistance
and inductance in this path should be minimized.
VDD
At power up, the FAN3122 non-inverting driver, shown
in Figure 50, holds the output LOW until the VDD voltage
reaches the UVLO turn-on threshold, as indicated in
Figure 511. The OUT pulses magnitude follow VDD
magnitude until steady-state VDD is reached.
VDD
VDS
IN
CBYP
OUT
FAN3121/2
Figure 50. Non-Inverting Driver
PWM
VDD
Turn-on threshold
Figure 47. Current Path for MOSFET Turn-Off
Operational Waveforms
At power up, the FAN3121 inverting driver shown in
Figure 48 holds the output LOW until the VDD voltage
reaches the UVLO turn-on threshold, as indicated in
Figure 49. This facilitates proper startup control of lowside N-channel MOSFETs.
IN-
IN+
VDD
IN
OUT
OUT
Figure 48. Inverting Configuration
Figure 51. Non-Inverting Startup Waveforms
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FAN3121 / FAN3122_F085 • Rev. 1.0.0
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15
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
or larger is typically used, with a dielectric material such
as X7R, to limit the change in capacitance over the
temperature and / or voltage application ranges.
Gate drivers used to switch MOSFETs and IGBTs at
high frequencies can dissipate significant amounts of
power. It is important to determine the driver power
dissipation and the resulting junction temperature in the
application to ensure that the part is operating within
acceptable temperature limits.
In a full-bridge synchronous rectifier application, shown
in Figure 522, each FAN3122 drives a parallel
combination of two high-current MOSFETs, (such as
FDMS8660S). The typical gate charge for each SR
MOSFET is 70nC with VGS = VDD = 9V. At a switching
frequency of 300kHz, the total power dissipation is:
The total power dissipation in a gate driver is the sum of
two components, PGATE and PDYNAMIC:
PTOTAL = PGATE + PDYNAMIC
(1)
Gate Driving Loss: The most significant power loss
results from supplying gate current (charge per unit
time) to switch the load MOSFET on and off at the
switching frequency. The power dissipation that
results from driving a MOSFET at a specified gatesource voltage, VGS, with gate charge, QG, at
switching frequency, fSW, is determined by:
PGATE = QG • VGS • fSW
(2)
Dynamic Pre-drive / Shoot-through Current: A
power loss resulting from internal current
consumption under dynamic operating conditions,
including pin pull-up / pull-down resistors, can be
obtained using the “IDD (No-Load) vs. Frequency”
graphs in Typical Performance Characteristics to
determine the current IDYNAMIC drawn from VDD
under actual operating conditions:
PDYNAMIC = IDYNAMIC • VDD
PGATE = 2 • 70nC • 9V • 300kHz = 0.378W
(5)
PDYNAMIC = 2mA • 9V = 18mW
(6)
PTOTAL = 0.396W
(7)
The SOIC-8 has a junction-to-board thermal
characterization parameter of JB = 42°C/W. In a system
application, the localized temperature around the device
is a function of the layout and construction of the PCB
along with airflow across the surfaces. To ensure
reliable operation, the maximum junction temperature of
the device must be prevented from exceeding the
maximum rating of 150°C; with 80% derating, TJ would
be limited to 120°C. Rearranging Equation 4 determines
the board temperature required to maintain the junction
temperature below 120°C:
TB,MAX = TJ - PTOTAL • JB
(8)
TB,MAX = 120°C – 0.396W • 42°C/W = 104°C
(9)
.
(3)
Once the power dissipated in the driver is determined,
the driver junction rise with respect to circuit board can
be evaluated using the following thermal equation,
assuming JB was determined for a similar thermal
design (heat sinking and air flow):
TJ
= PTOTAL • JB + TB
(4)
where:
TJ = driver junction temperature;
JB = (psi) thermal characterization parameter relating
temperature rise to total power dissipation; and
TB = board temperature in location as defined in
the Thermal Characteristics table.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
www.fairchildsemi.com
16
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Thermal Guidelines
V IN
V OUT
B2
A2
B1
A1
BIAS
FAN3122
FAN3122
From A2
SR EN
VDD 1
8
2
7
3
6
4
5
IN
EN
From A1
VDD
OUT
OUT
8
2
7
IN
3
SR EN
EN
6
4
5
PGND
AGND
VDD 1
AGND
VDD
OUT
OUT
PGND
Figure 52. Full-Bridge Synchronous Rectification
VOUT
VIN
PWM
FAN3121
VDD
SR Enable
Active HIGH
IN
EN
AGND
VBIAS
1
2
3
8
P1
(AGND)
4
7
6
5
VDD
OUT
OUT
PGND
Figure 53. Hybrid Synchronous Rectification in a Forward Converter
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
www.fairchildsemi.com
17
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Typical Application Diagrams
Gate
Input
Drive(15)
Threshold
(Sink/Src)
Part
Number
Type
FAN3100C
Single 2A
+2.5A / -1.8A
CMOS
Single Channel of Two-Input/One-Output
SOT23-5
FAN3100T
Single 2A
+2.5A / -1.8A
TTL
Single Channel of Two-Input/One-Output
SOT23-5
FAN3226C
Dual 2A
+2.4A / -1.6A
CMOS
Dual Inverting Channels + Dual Enable
SOIC8
FAN3226T
Dual 2A
+2.4A / -1.6A
TTL
Dual Inverting Channels + Dual Enable
SOIC8
FAN3227C
Dual 2A
+2.4A / -1.6A
CMOS
Dual Non-Inverting Channels + Dual Enable
SOIC8
FAN3227T
Dual 2A
+2.4A / -1.6A
TTL
Dual Non-Inverting Channels + Dual Enable
SOIC8
FAN3228C
Dual 2A
+2.4A / -1.6A
CMOS
Dual Channels of Two-Input/One-Output, Pin Config.1
SOIC8
FAN3228T
Dual 2A
+2.4A / -1.6A
TTL
Dual Channels of Two-Input/One-Output, Pin Config.1
SOIC8
FAN3229C
Dual 2A
+2.4A / -1.6A
CMOS
Dual Channels of Two-Input/One-Output, Pin Config.2
SOIC8
FAN3229T
Dual 2A
+2.4A / -1.6A
TTL
Dual Channels of Two-Input/One-Output, Pin Config.2
SOIC8
FAN3223C
Dual 4A
+4.3A / -2.8A
CMOS
Dual Inverting Channels + Dual Enable
SOIC8
FAN3223T
Dual 4A
+4.3A / -2.8A
TTL
Dual Inverting Channels + Dual Enable
SOIC8
FAN3224C
Dual 4A
+4.3A / -2.8A
CMOS
Dual Non-Inverting Channels + Dual Enable
SOIC8
FAN3224T
Dual 4A
+4.3A / -2.8A
TTL
Dual Non-Inverting Channels + Dual Enable
SOIC8
FAN3225C
Dual 4A
+4.3A / -2.8A
CMOS
Dual Channels of Two-Input/One-Output
SOIC8
FAN3225T
Dual 4A
+4.3A / -2.8A
TTL
Dual Channels of Two-Input/One-Output
SOIC8
FAN3121C
Single 9A
+9.7A / -7.1A
CMOS
Single Inverting Channels + Enable
SOIC8
FAN3121T
Single 9A
+9.7A / -7.1A
TTL
Single Inverting Channels + Enable
SOIC8
FAN3122C
Single 9A
+9.7A / -7.1A
CMOS
Single Non-Inverting Channels + Enable
SOIC8
FAN3122T
Single 9A
+9.7A / -7.1A
TTL
Single Non-Inverting Channels + Enable
SOIC8
Logic
Package
Note:
15. Typical currents with OUT at 6V and VDD = 12V.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
www.fairchildsemi.com
18
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Table 1. Related Products
5.00
4.80
A
0.65
3.81
8
5
B
6.20
5.80
PIN ONE
INDICATOR
1.75
4.00
3.80
1
5.60
4
1.27
(0.33)
0.25
M
1.27
C B A
LAND PATTERN RECOMMENDATION
0.25
0.10
SEE DETAIL A
1.75 MAX
0.25
0.19
C
0.51
0.33
0.50 x 45
0.25
R0.10
0.10 C
OPTION A - BEVEL EDGE
GAGE PLANE
R0.10
OPTION B - NO BEVEL EDGE
0.36
NOTES: UNLESS OTHERWISE SPECIFIED
8ٛ
0ٛ
0.90
0.406
SEATING PLANE
(1.04)
DETAIL A
SCALE: 2:1
A) THIS PACKAGE CONFORMS TO JEDEC
MS-012, VARIATION AA, ISSUE C,
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE MOLD
FLASH OR BURRS.
D) LANDPATTERN STANDARD: SOIC127P600X175-8M.
E) DRAWING FILENAME: M08AREV13
Figure 54. 8-Lead SOIC
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/.
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
www.fairchildsemi.com
19
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
Physical Dimensions (Continued)
FAN3121 / FAN3122_F085 — Single 9A High-Speed, Low-Side Gate Driver
© 2012 Fairchild Semiconductor Corporation
FAN3121 / FAN3122_F085 • Rev. 1.0.0
www.fairchildsemi.com
20
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