NEW PRODUCT NEW PRODUCT NEW PRODUCT 1N746 THRU 1N759 ZENER DIODES FEATURES min. 1.083 (27.5) ♦ Silicon Planar Power Zener Diodes ♦ Standard Zener voltage tolerance is ±5% for “A” suffix. Other tolerances are available upon request. max. ∅.079 (2.0) Cathode Mark min. 1.083 (27.5) max. .150 (3.8) DO-35 MECHANICAL DATA max. ∅.020 (0.52) Case: DO-35 Glass Case Weight: approx. 0.13 g Dimensions are in inches and (millimeters) MAXIMUM RATINGS Ratings at 25°C ambient temperature unless otherwise specified. SYMBOL VALUE UNIT Power Dissipation at TL = 75°C Ptot 500(1) mW Maximum Junction Temperature Tj 175 °C Storage Temperature Range TS – 65 to +175 °C Zener Current (see Table “Characteristics”) NOTES: (1) TL is measured 3/8” from body. Thermal Resistance Junction to Ambient Air Forward Voltage at IF = 200 mA SYMBOL MIN. TYP. MAX. UNIT RthJA – – 300(1) °C/W VF – – 1.5 Volts NOTES: (1) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature. 1/6/98 1N746 THRU 1N759 ELECTRICAL CHARACTERISTICS Ratings at 25°C ambient temperature unless otherwise specified. Type Number Nominal Zener Voltage VZ @ IZT(3) (Volts) Test Current IZT (mA) Maximum Zener Impedance ZZT @ IZT(1) (Ω) Maximum Regulator Current IZM(2) (mA) 1N746A 3.3 20 28 1N747A 3.6 20 1N748A 3.9 1N749A 4.3 1N750A Maximum Reverse Leakage Current TA = 25°C IR @ VR = 1V (µA) TA = 150°C IR @ VR = 1V (µA) 110 10 30 24 100 10 30 20 23 95 10 30 20 22 85 2 30 4.7 20 19 75 2 30 1N751A 5.1 20 17 70 1 20 1N752A 5.6 20 11 65 1 20 1N753A 6.2 20 7 60 0.1 20 1N754A 6.8 20 5 55 0.1 20 1N755A 7.5 20 6 50 0.1 20 1N756A 8.2 20 8 45 0.1 20 1N757A 9.1 20 10 40 0.1 20 1N758A 10 20 17 35 0.1 20 1N759A 12 20 30 30 0.1 20 NOTES: (1) The Zener Impedance is derived from the 1 KHZ AC voltage which results when an AC current having an RMS value equal to 10% of the Zener current (IZT) is superimposed on IZT. Zener Impedance is measured at two points to insure a sharp knee on the breakdown curve and to eliminate unstable units. (2) Valid provided that leads at a distance of 3/8” from case are kept at ambient temperature. (3) Measured with device junction in thermal equilibrium.