UniFET FDPF12N35 350V N-Channel MOSFET Features Description • 7.5A, 350V, RDS(on) = 0.38Ω @VGS = 10 V These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. • Low gate charge ( typical 18 nC) • Low Crss ( typical 15 pF) This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies and active power factor correction. • Fast switching • 100% avalanche tested • Improved dv/dt capability D { z G { GD S z z TO-220F { S FDPF Series Absolute Maximum Ratings Symbol Parameter FDPF12N35 Unit 350 V 7.5 4.5 A A VDSS Drain-Source Voltage ID Drain Current - Continuous (TC = 25°C) - Continuous (TC = 100°C) IDM Drain Current - Pulsed VGSS Gate-Source voltage EAS Single Pulsed Avalanche Energy IAR Avalanche Current EAR Repetitive Avalanche Energy (Note 1) 5 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns PD Power Dissipation 50 0.35 W W/°C -55 to +150 °C 300 °C 30 A ±30 V (Note 2) 335 mJ (Note 1) 7.5 A (Note 1) (TC = 25°C) - Derate above 25°C TJ, TSTG Operating and Storage Temperature Range TL Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for 5 Seconds Thermal Characteristics Symbol Parameter Min. Max. Unit RθJC Thermal Resistance, Junction-to-Case -- 2.5 °C/W RθJA Thermal Resistance, Junction-to-Ambient -- 62.5 °C/W ©2006 Fairchild Semiconductor Corporation FDPF12N35 Rev. A 1 www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET February 2006 TM Device Marking Device Package Reel Size Tape Width Quantity FDPF12N35 FDPF12N35 TO-220F - - 50 Electrical Characteristics Symbol TC = 25°C unless otherwise noted Parameter Conditions Min. Typ. Max Units 350 -- -- V Off Characteristics BVDSS Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA ∆BVDSS / ∆TJ Breakdown Voltage Temperature Coefficient ID = 250µA, Referenced to 25°C -- 0.35 -- V/°C IDSS Zero Gate Voltage Drain Current VDS = 350V, VGS = 0V VDS = 280V, TC = 125°C --- --- 1 10 µA µA IGSSF Gate-Body Leakage Current, Forward VGS = 30V, VDS = 0V -- -- 100 nA IGSSR Gate-Body Leakage Current, Reverse VGS = -30V, VDS = 0V -- -- -100 nA On Characteristics VGS(th) Gate Threshold Voltage VDS = VGS, ID = 250µA 3.0 -- 5.0 V RDS(on) Static Drain-Source On-Resistance VGS = 10V, ID = 3.75A -- 0.32 0.38 Ω gFS Forward Transconductance VDS = 40V, ID = 3.75A -- 13 -- S -- 855 1110 pF (Note 4) Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VDS = 25V, VGS = 0V, f = 1.0MHz -- 135 175 pF -- 15 25 pF -- 30 70 ns -- 180 370 ns -- 35 80 ns -- 60 130 ns -- 18 25 nC Switching Characteristics td(on) Turn-On Delay Time tr Turn-On Rise Time td(off) Turn-Off Delay Time tf Turn-Off Fall Time Qg Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge VDD = 175V, ID = 12A RG = 25Ω (Note 4, 5) VDS = 280V, ID = 12A VGS = 10V (Note 4, 5) -- 5 -- nC -- 8 -- nC Drain-Source Diode Characteristics and Maximum Ratings IS Maximum Continuous Drain-Source Diode Forward Current -- -- 7.5 A ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- 30 A VSD Drain-Source Diode Forward Voltage VGS = 0V, IS = 7.5A -- -- 1.4 V trr Reverse Recovery Time -- 270 -- ns Qrr Reverse Recovery Charge VGS = 0V, IS = 12A dIF/dt =100A/µs -- 2.3 -- µC (Note 4) NOTES: 1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 10mH, IAS = 7.5A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C 3. ISD ≤ 7.5A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C 4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature Typical Characteristics FDPF12N35 Rev. A 2 www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET Package Marking and Ordering Information Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics 2 10 VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V Bottom : 5.5 V 1 ID, Drain Current [A] 10 ID, Drain Current [A] Top : 0 10 1 10 o 150 C o 25 C o -55 C ※ Notes : 1. 250µ s Pulse Test 2. TC = 25℃ ※ Notes : 1. VDS = 40V 2. 250µ s Pulse Test -1 10 0 -1 0 10 10 1 10 10 2 4 VDS, Drain-Source Voltage [V] 6 8 10 12 VGS, Gate-Source Voltage [V] Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue 2 10 IDR, Reverse Drain Current [A] RDS(ON) [Ω ], Drain-Source On-Resistance 1.2 1.0 0.8 VGS = 10V 0.6 VGS = 20V 0.4 1 10 150℃ 25℃ ※ Notes : 1. VGS = 0V 2. 250µ s Pulse Test ※ Note : TJ = 25℃ 0.2 0 0 5 10 15 20 25 30 10 35 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 VSD, Source-Drain voltage [V] ID, Drain Current [A] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics 12 1800 1600 Capacitances [pF] 1400 1200 VGS, Gate-Source Voltage [V] Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd Coss Ciss 1000 800 600 400 ※ Note ; 1. VGS = 0 V 2. f = 1 MHz Crss 200 0 -1 10 VDS = 175V VDS = 280V 8 6 4 2 ※ Note : ID = 12A 0 10 0 1 10 0 2 4 6 8 10 12 14 16 18 20 QG, Total Gate Charge [nC] VDS, Drain-Source Voltage [V] FDPF12N35 Rev. A VDS = 70V 10 3 www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET Typical Performance Characteristics FDPF12N35 350V N-Channel MOSFET Typical Performance Characteristics (Continued) Figure 7. Breakdown Voltage Variation vs. Temperature Figure 8. On-Resistance Variation vs. Temperature 3.0 RDS(ON), (Normalized) Drain-Source On-Resistance BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.2 1.1 1.0 ※ Notes : 1. VGS = 0 V 2. ID = 250 µ A 0.9 0.8 -100 -50 0 50 100 150 2.5 2.0 1.5 1.0 ※ Notes : 1. VGS = 10 V 2. ID = 3.75 A 0.5 0.0 -100 200 -50 0 50 100 o TJ, Junction Temperature [ C] 150 200 o TJ, Junction Temperature [ C] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case Temperature 2 10 8 100 µs 1 ms 6 ID, Drain Current [A] ID, Drain Current [A] 1 10 10 ms 100 ms Operation in This Area is Limited by R DS(on) 0 10 DC ※ Notes : -1 10 o 1. TC = 25 C 4 2 o 2. TJ = 150 C 3. Single Pulse -2 10 0 1 10 0 25 2 10 10 50 75 100 125 150 TC, Case Temperature [℃] VDS, Drain-Source Voltage [V] Zθ JC(t), Thermal Response Figure 11. Transient Thermal Response Curve 10 D = 0 .5 0 0 .2 0 .1 ※ N o te s : 1 . Z θ J C( t) = 2 .5 ℃ / W M a x . 2 . D u t y F a c to r , D = t 1 /t 2 3 . T J M - T C = P D M * Z θ J C( t) 0 .0 5 10 -1 0 .0 2 PDM 0 .0 1 t1 s in g le p u ls e 10 t2 -2 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 t 1 , S q u a r e W a v e P u ls e D u r a t io n [s e c ] FDPF12N35 Rev. A 4 www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET Gate Charge Test Circuit & Waveform V G S S a m eT y p e a sD U T 5 0 K Ω 2 0 0 n F 1 2 V Q g 1 0 V 3 0 0 n F V D S V G S Q g s Q g d D U T 3 m A C h a rg e Resistive Switching Test Circuit & Waveforms V D S R G R L V D S 9 0 % V D D V G S 1 0 % V G S D U T 1 0 V t d ( o n ) t r t d ( o f f ) to n t f to f f Unclamped Inductive Switching Test Circuit & Waveforms B V D S S 1 2-L E = IA A S S 2 -V B V D S S D D L V D S B V D S S IA S ID R G 1 0 V V D D V ( t) D S V D D D U T tp FDPF12N35 Rev. A ID ( t) tp 5 T im e www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + V DS _ I SD L D r iv e r R V V GS ( D r iv e r ) GS G S am e T ype as DUT V DD • d v / d t c o n t r o lle d b y R G • I S D c o n t r o lle d b y p u ls e p e r io d G a te P u ls e W id t h D = -------------------------G a t e P u ls e P e r io d 10V IF M , B o d y D io d e F o r w a r d C u r r e n t I SD ( DUT ) d i/d t IR M B o d y D io d e R e v e r s e C u r r e n t V DS ( DUT ) B o d y D io d e R e c o v e r y d v / d t V SD V DD B o d y D io d e F o r w a r d V o lta g e D r o p FDPF12N35 Rev. A 6 www.fairchildsemi.com 3.30 ±0.10 TO-220F 10.16 ±0.20 2.54 ±0.20 ø3.18 ±0.10 (7.00) (1.00x45°) 15.87 ±0.20 15.80 ±0.20 6.68 ±0.20 (0.70) 0.80 ±0.10 ) 0° (3 9.75 ±0.30 MAX1.47 #1 +0.10 0.50 –0.05 2.54TYP [2.54 ±0.20] 2.76 ±0.20 2.54TYP [2.54 ±0.20] 9.40 ±0.20 4.70 ±0.20 0.35 ±0.10 Dimensions in Millimeters FDPF12N35 Rev. 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PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. I18 8 FDPF12N35 Rev. A www.fairchildsemi.com FDPF12N35 350V N-Channel MOSFET TRADEMARKS