TOSHIBA TC74LCX02F_12

TC74LCX02F/FT/FK
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC74LCX02F,TC74LCX02FT,TC74LCX02FK
Low-Voltage Quad 2-Input NOR Gate with 5-V Tolerant Inputs and Outputs
The TC74LCX02 is a high-performance CMOS 2-input NOR gate.
Designed for use in 3.3-V systems, it achieves high-speed operation
while maintaining the CMOS low power dissipation.
The device is designed for low-voltage (3.3 V) VCC applications,
but it could be used to interface to 5-V supply environment for inputs.
All inputs are equipped with protection circuits against static
discharge.
TC74LCX02F
Features
•
Low-voltage operation: VCC = 1.65 to 3.6 V
•
High-speed operation: tpd = 5.2 ns (max) (VCC = 3.0 to 3.6 V)
•
Output current: |IOH|/IOL = 24 mA (min) (VCC = 3.0 V)
•
Latch-up performance: −500 mA
•
Available in JEITA SOP, TSSOP and VSSOP(US)
•
Power-down protection provided on all inputs and outputs
•
Pin and function compatible with the 74 series
(74AC/VHC/HC/F/ALS/LS etc.) 02 type
TC74LCX02FT
TC74LCX02FK
Weight
SOP14-P-300-1.27A
TSSOP14-P-0044-0.65A
VSSOP14-P-0030-0.50
: 0.18 g (typ.)
: 0.06 g (typ.)
: 0.02 g (typ.)
Note: The Electrical Characteristics of VCC=1.8±0.15V is only applicable for products which manufactured
from January 2009 onward.
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TC74LCX02F/FT/FK
Pin Assignment (top view)
IEC Logic Symbol
1Y
1
14
VCC
1A
2
13
4Y
3
1B
12
1A
1B
2A
2B
4B
2Y
4
11
4A
2A
5
10
3Y
2B
6
9
3B
GND
7
8
3A
3A
3B
4A
4B
2
> 1
3
5
6
8
9
11
12
1
1Y
4
2Y
10
3Y
13
4Y
Truth Table
Inputs
Outputs
A
B
Y
L
L
H
L
H
L
H
L
L
H
H
L
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Power supply voltage
VCC
−0.5 to 7.0
V
DC input voltage
VIN
−0.5 to 7.0
V
−0.5 to 7.0 (Note 2)
DC output voltage
VOUT
Input diode current
IIK
−50
Output diode current
IOK
±50
DC output current
IOUT
±50
mA
Power dissipation
PD
180
mW
ICC/IGND
±100
mA
Tstg
−65 to 150
°C
DC VCC/ground current
Storage temperature
−0.5 to VCC  0.5
(Note 3)
V
mA
(Note 4)
mA
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: VCC = 0 V
Note 3: High or low state. IOUT absolute maximum rating must be observed.
Note 4: VOUT < GND, VOUT > VCC
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Operating Ranges (Note 1)
Characteristics
Symbol
Power supply voltage
VCC
Input voltage
VIN
Output voltage
VOUT
Output current
IOH/IOL
Rating
Unit
1.65 to 3.6
1.5 to 3.6 (Note 2)
0 to 5.5
V
0 to 5.5 (Note 3)
0 to VCC (Note 4)
±24
(Note 5)
±12
(Note 6)
Operating temperature
Topr
−40 to 85
Input rise and fall time
dt/dv
0 to 10
V
V
mA
°C
(Note 7)
ns/V
Note 1: The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Note 2: Data retention only
Note 3: VCC = 0 V
Note 4: High or low state ( However, it can not exceed IOUT of absolute maximum ratings.)
Note 5: VCC = 3.0 to 3.6 V
Note 6: VCC = 2.7 to 3.0 V
Note 7: VIN = 0.8 to 2.0 V, VCC = 3.0 V
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Electrical Characteristics
DC Characteristics (Ta = −40 to 85°C)
Characteristics
H-level
Symbol
Min
Max
1.65 to 2.3
VCC×0.8
⎯
2.3 to 2.7
1.7
⎯
2.7 to 3.6
2.0
⎯
1.65 to 2.3
⎯
VCC×0.2
2.3 to 2.7
⎯
0.7
2.7 to 3.6
⎯
0.8
1.65 to 3.6
VCC−0.2
⎯
IOH = −4 mA
1.65
1.05
⎯
IOH = −8 mA
2.3
1.7
⎯
IOH = −12 mA
2.7
2.2
⎯
IOH = −18 mA
3.0
2.4
⎯
IOH = −24 mA
3.0
2.2
⎯
IOL = 100 μA
1.65 to 3.6
⎯
0.2
IOL = 4mA
1.65
⎯
0.45
IOL = 8 mA
2.3
⎯
0.7
IOL = 12 mA
2.7
⎯
0.4
IOL = 16 mA
3.0
⎯
0.4
IOL = 24 mA
3.0
⎯
0.55
1.65 to 3.6
⎯
±5.0
μA
μA
Test Condition
⎯
VIH
Input voltage
L-level
⎯
VIL
IOH = −100 μA
H-level
VOH
VIN = VIL
Output voltage
L-level
Input leakage current
Power-off leakage current
VOL
IIN
IOFF
Quiescent supply current
ICC
Increase in Icc per input
ΔICC
VIN = VIH or VIL
VIN = 0 to 5.5 V
VCC (V)
VIN/VOUT = 5.5 V
0
⎯
10.0
VIN = VCC or GND
1.65 to 3.6
⎯
10.0
VIN = 3.6 to 5.5 V
1.65 to 3.6
⎯
±10.0
VIH = VCC − 0.6V
2.7 to 3.6
⎯
500
4
Unit
V
V
μA
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TC74LCX02F/FT/FK
AC Characteristics (Ta = −40 to 85°C)
Characteristics
Propagation delay time
Output to output skew
Note:
Symbol
tpLH
tpHL
Test Condition
Figure 1, Figure 2
tosLH
(Note)
tosHL
Min
Max
1.8±0.15
⎯
20.0
2.5±0.2
⎯
7.0
2.7
⎯
6.0
3.3 ± 0.3
1.5
5.2
2.7
⎯
⎯
3.3 ± 0.3
⎯
1.0
VCC (V)
Unit
ns
ns
Parameter guaranteed by design.
(tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|)
Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.5 ns, CL = 50 pF, RL = 500 Ω)
Characteristics
Symbol
Test Condition
VCC (V)
Typ.
Unit
Quiet output maximum dynamic VOL
VOLP
VIH = 3.3 V, VIL = 0 V
3.3
0.8
V
Quiet output minimum dynamic VOL
|VOLV|
VIH = 3.3 V, VIL = 0 V
3.3
0.8
V
Typ.
Unit
Capacitive Characteristics (Ta = 25°C)
Characteristics
Input capacitance
Output capacitance
Power dissipation capacitance
Note:
Symbol
Test Condition
CIN
⎯
3.3
7
pF
COUT
⎯
0
8
pF
3.3
25
pF
CPD
fIN = 10 MHz
VCC (V)
(Note)
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD・VCC・fIN  ICC /4 (per gate)
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AC Test Circuit
Output
RL
CL
Measure
Figure 1
AC Waveform
tf
tr
Input
10%
VIH
90%
VIM
GND
VOH
VOM
Output
tpLH
Figure 2
tpHL
VOL
tpLH, tpHL
VCC
Input
Output
Load
Symbol
3.3±0.3V
2.7V
2.5±0.2V
1.8±0.15V
VIH
VIM
tr, tf
VOM
CL
RL
2.7V
1.5V
2.5ns
1.5V
50pF
500Ω
VCC
VCC/2
2.0ns
VOH/2
30pF
500Ω
VCC
VCC/2
2.0ns
VOH/2
30pF
1kΩ
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Package Dimensions
Weight: 0.18 g (typ.)
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Package Dimensions
Weight: 0.06 g (typ.)
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Package Dimensions
Weight: 0.02 g (typ.)
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RESTRICTIONS ON PRODUCT USE
• Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively "Product") without notice.
• This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission.
• Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product,
or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all
relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for
Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for
the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product
design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or
applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams,
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