BCD AH920Z3-G1 High sensitivity cmos hall-effect latch Datasheet

Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
General Description
Features
The AH920 is a Hall-effect latch designed in mixed
signal CMOS technology. It is quite suitable for use
in automotive, industrial and consumer applications.
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Superior high-temperature performance is made
possible through dynamic offset cancellation, which
reduces the residual offset voltage normally caused
by device over-molding, temperature dependencies,
and thermal stress. The device integrates a voltage
regulator, Hall-voltage generator, small-signal
amplifier, chopper stabilization, schmitt trigger, and
open-drain output.
AH920
Wide Operating Voltage Range from 3.5 to 20V
Symmetrical Switch Points
Chopper-stabilized Amplifier Stage
Superior Temperature Stability
Open-drain Output
Compact Size
ESD Rating: 6000V (Human Body Model)
Applications
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An on-board regulator permits operation with supply
voltage from 3.5V to 20V.
The AH920 is available in TO-92S-3 and SOT-23-3
packages, which are optimized for most applications.
TO-92S-3
Brushless DC Motor Commutation
Brushless DC Fan
Solid-state Switch
Revolution Counting
Speed Detection
High Sensitivity and Unconnected Switch
SOT-23-3
Figure 1. Package Types of AH920
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
1
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Pin Configuration
Z3 Package
(TO-92S-3)
N Package
(SOT-23-3)
3
3
2
1
2
1
(Front View)
(Top View)
Figure 2. Pin Configuration of AH920
Pin Description
Pin Number
TO-92S-3 SOT-23-3
Pin Name
Function
1
1
VCC
Supply voltage
2
3
GND
Ground pin
3
2
OUT
Output Pin
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
2
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Functional Block Diagram
Figure 3. Functional Block Diagram of AH920
Ordering Information
AH920W5 23
-
Circuit Type
G1: Green
Package
Z3: TO-92S-3 5
N: SOT-23-3
TR: Tape & Reel
Blank: Bulk
Package
Temperature
Range
TO-92S-3
-40 to 125°C
AH920Z3-G1
920
Bulk
SOT-23-3
-40 to 125°C
AH920NTR-G1
GS7
Tape & Reel
Part Number
Marking ID
Packing Type
BCD Semiconductor's Pb-free products, as designated with "G1" suffix in the part number, are RoHS
compliant and green.
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
3
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Absolute Maximum Ratings (Note 1)
Parameter
Symbol
Value
Unit
Supply Voltage
VCC
20
V
Supply Current (Fault)
ICC
5
mA
Output current (Continuous)
IOUT
25
mA
Power Dissipation
Operation Temperature
Storage Temperature
Maximum Junction Temperature
ESD (Human Body Model)
PD
TO-92S-3
400
SOT-23-3
230
mW
TA
-50 to 150
ºC
TSTG
-65 to 150
ºC
TJ (Max)
165
ºC
ESD
6000
V
Note 1: Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to
the device. These are stress ratings only, and functional operation of the device at these or any other conditions
beyond those indicated under “Recommended Operating Conditions” is not implied. Exposure to “Absolute
Maximum Ratings” for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter
Symbol
Min
Max
Unit
Supply Voltage
VCC
3.5
20
V
Operating Ambient Temperature
TA
-40
125
ºC
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
4
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Electrical Characteristics
VCC =12V, TA=25°C, unless otherwise specified.
Parameter
Symbol
Min
Typ
Max
Unit
3.5
12
20
V
VCC=12V, B<BRP
3.0
5.0
mA
VCC=12V, B>BOP
3.0
5.0
mA
VSAT
IOUT=20mA, B>BOP
185
500
mV
ILEAKAGE
VOUT=20V, B<BRP
0.1
10
µA
Output Rising Time
tRISING
RL=1kΩ,CL=20pF
0.4
2
µs
Output Falling Time
tFALLING
RL=1kΩ,CL=20pF
0.4
2
µs
Supply Voltage
VCC
Supply Current
ICC
Saturation Voltage
Output Leakage Current
Conditions
Operating
Magnetic Characteristics
VCC =12V, TA=25°C, unless otherwise specified.
Parameter
Operating Point
Releasing Point
Hysteresis
Symbol
Min
Typ
Max
Unit
BOP
BRP
BHYS
5
-40
22
-22
45
40
-5
Gauss
Gauss
Gauss
Figure 4. Magnetic Flux Density of AH920
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
5
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Magnetic Characteristics (Continued)
South Pole
North Pole
Output=Low (For TO-92S-3)
Output=High (For TO-92S-3)
Figure 5. Output Status vs. Magnetic Pole
Package Type
TO-92S-3
SOT-23-3
Parameter
Test condition
Output
South Pole
North Pole
South Pole
North Pole
B>BOP
B<BRP
B>BOP
B<BRP
Low
High
High
Low
Table 1. Output Status vs. Magnetic Pole
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
6
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Magnetic Characteristics (Continued)
Figure 6. Magnetic Thresholds
Note 2: BOP is determined by putting the device under magnetic field swept from BRP (Min) to BOP (Max) until
the output is switched on.
Note 3: BRP is determined by putting the device under magnetic field swept from BOP (Max) to BRP (Min) until
the output is switched off.
Test Circuit and Test Conditions
Figure 7. Test Circuit of AH920
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
7
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Test Circuit and Test Conditions (Continued)
Figure 8. Test Condition of AH920 (Supply Current)
Note 4: Output initial status is low when powering on.
Note 5: The supply current ICC represents the average supply current. The output is open during measurement.
Note 6: The device is put under the magnetic field: B<BRP.
Figure 9. Test Condition of AH920 (Output Saturation Voltage)
Note 7: The output saturation voltage VSAT is measured at VCC=3.5V and VCC=20V.
Note 8: The device is put under the magnetic field: B>BOP.
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
8
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Test Circuit and Test Conditions (Continued)
Figure 10. Test Condition of AH920 (Output Leakage Current)
Note 9: The device is put under the magnetic field: B<BRP.
Typical Performance Characteristics
4.0
4.0
VCC=5V
3.5
VCC=12V
3.5
3.0
ICC (mA)
ICC (mA)
3.0
2.5
2.0
2.0
1.5
1.5
O
1.0
TA=25 C
4
6
8
10
12
14
16
18
-25
20
0
25
50
75
100
125
O
VCC (V)
TA ( C)
Figure 11. ICC vs. VCC
Nov. 2010
2.5
Figure 12. ICC vs. TA
Rev. 1.3
BCD Semiconductor Manufacturing Limited
9
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Typical Performance Characteristics (Continued)
50
40
40
30
BOP/BRP/BHYS (Gauss)
BOP/BRP/BHYS (Gauss)
30
20
BOP
10
BRP
0
BHYS
O
TA=25 C
-10
20
10
BOP
0
BRP
BHYS
-10
VCC=12V
-20
-20
5
10
15
20
-25
0
25
VCC (V)
50
75
100
125
O
TA ( C)
Figure 13. BOP/BRP/BHYS vs. VCC
Figure 14. BOP/BRP/BHYS vs. TA
180
240
160
220
140
200
180
100
VSAT (mV)
VSAT (mV)
120
80
60
160
140
40
O
120
TA=25 C
20
VCC=12V
VCC=5V
VCC=12V
100
0
0
5
10
15
20
25
-25
IOUT (mA)
25
50
75
100
125
O
TA ( C)
Figure 15. VSAT vs. IOUT
Nov. 2010
0
Figure 16. VSAT vs. TA
Rev. 1.3
BCD Semiconductor Manufacturing Limited
10
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Typical Performance Characteristics (Continued)
450
SOT-23-3
TO-92S-3
400
350
PD (mW)
300
250
200
150
100
50
0
0
25
50
75
100
125
150
O
TA ( C)
Figure 17. PD vs. TA
Typical Application
Output
RL
VCC
CL
0.1 F
Figure 18. Typical Application Circuit of AH920
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
11
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Mechanical Dimensions
TO-92S-3
Unit: mm(inch)
°
°
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
12
Data Sheet
HIGH SENSITIVITY CMOS HALL-EFFECT LATCH
AH920
Mechanical Dimensions
SOT-23-3
Unit: mm(inch)
2.820(0.111)
3.020(0.119)
0.100(0.004)
0.200(0.008)
0.300(0.012)
0.600(0.024)
2.650(0.104)
2.950(0.116)
1.500(0.059)
1.700(0.067)
1.230(0.048)
1.530(0.060)
0.200(0.008)
0.770(0.030)
1.070(0.042)
1.800(0.071)
2.000(0.079)
0
8
0.300(0.012)
0.500(0.020)
1.450(0.057)
MAX.
0.950(0.037)
TYP
°
°
0.000(0.000)
0.150(0.006)
0.900(0.035)
1.300(0.051)
Nov. 2010
Rev. 1.3
BCD Semiconductor Manufacturing Limited
13
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