TS TSC2007 ® C2 007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 1.2V to 3.6V, 12-Bit, Nanopower, 4-Wire Micro TOUCH SCREEN CONTROLLER with I2C™ Interface FEATURES APPLICATIONS • • • • • • • • • 1 23 • • • • • • • • • • • 4-Wire Touch Screen Interface Single 1.2V to 3.6V Supply/Reference Ratiometric Conversion Effective Throughput Rate: – Up to 20kHz (8-Bit) or 10kHz (12-Bit) Preprocessing to Reduce Bus Activity I2C Interface Supports: – Standard, Fast, and High-Speed Modes Simple, Command-Based User Interface: – TSC2003 Compatible – 8- or 12-Bit Resolution On-Chip Temperature Measurement Touch Pressure Measurement Digital Buffered PENIRQ On-Chip, Programmable PENIRQ Pull-Up Auto Power-Down Control Low Power: – 32.24µA at 1.2V, Fast Mode, 8.2kHz Eq Rate – 39.31µA at 1.8V, Fast Mode, 8.2kHz Eq Rate – 53.32µA at 2.7V, Fast Mode, 8.2kHz Eq Rate Enhanced ESD Protection: – ±8kV HBM – ±1kV CDM – ±25kV Air Gap Discharge – ±15kV Contact Discharge 1.5 x 2 WCSP-12 and 5 x 6.4 TSSOP-16 Packages Cellular Phones PDA, GPS, and Media Players Portable Instruments Point-of-Sale Terminals Multiscreen Touch Control Systems DESCRIPTION The TSC2007 is a very low-power touch screen controller designed to work with power-sensitive, handheld applications that are based on an advanced low-voltage processor. It works with a supply voltage as low as 1.2V, which can be supplied by a single-cell battery. It contains a complete, ultra-low power, 12-bit, analog-to-digital (A/D) resistive touch screen converter, including drivers and the control logic to measure touch pressure. In addition to these standard features, the TSC2007 offers preprocessing of the touch screen measurements to reduce bus loading, thus reducing the consumption of host processor resources that can then be redirected to more critical functions. The TSC2007 supports an I2C serial bus and data transmission protocol in all three defined modes: standard, fast, and high-speed. It offers programmable resolution of 8 or 12 bits to accommodate different screen sizes and performance needs. The TSC2007 is available in a 12-lead, (1.555 ±0.055mm) x (2.055 ±0.055mm), 3 x 4 array, wafer chip-scale package (WCSP), and a 16-pin, TSSOP package. The TSC2007 is characterized for the –40°C to +85°C industrial temperature range. U.S. Patent NO. 6246394; other patents pending. VDD/REF X+ XY+ Y- Touch Screen Drivers Interface Mux SAR ADC TEMP AUX Internal Clock Preprocessing PENIRQ I2C Serial Interface and Control SCL SDA A[0:1] GND 1 2 3 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. I2C is a trademark of NXP Semiconductors. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2007–2009, Texas Instruments Incorporated TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION (1) PRODUCT TYPICAL INTEGRAL LINEARITY (LSB) TSC2007I (1) TYPICAL GAIN ERROR (LSB) ±1.5 NO MISSING CODES RESOLUTION (BITS) 0.1 11 PACKAGE TYPE PACKAGE DESIGNATOR SPECIFIED TEMPERATURE RANGE PACKAGE MARKING 16-Pin, 5 x 6.4 TSSOP PW –40°C to +85°C TSC2007 12-Pin, 3 x 4 Matrix, 1.5 x 2 WCSP YZG –40°C to +85°C TSC2007I ORDERING NUMBER TRANSPORT MEDIA, QUANTITY TSC2007IPW Tube, 90 TSC2007IPWR Tape and Reel, 2000 TSC2007IYZGT Small Tape and Reel, 250 TSC2007IYZGR Tape and Reel, 3000 For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see the TI website at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range (unless otherwise noted). PRAMETER TSC2007 UNIT Analog input X+, Y+, AUX to GND –0.4 to VDD + 0.1 V Analog input X–, Y– to GND –0.4 to VDD + 0.1 V –0.3 to +5 V Digital input voltage to GND –0.3 to VDD + 0.3 V Digital output voltage to GND –0.3 to VDD + 0.3 V Power dissipation (TJ Max - TA)/θJA Voltage Voltage range VDD/REF pin to GND TSSOP package Thermal impedance, θJA WCSP package 86 Low-K High-K 113 °C/W 62 Operating free-air temperature range, TA –40 to +85 °C Storage temperature range, TSTG –65 to +150 °C Junction temperature, TJ Max Lead temperature IEC contact discharge (2) IEC air discharge (2) (1) (2) 2 +150 °C Vapor phase (60 sec) +215 °C Infrared (15 sec) +220 °C X+, X–, Y+, Y– ±15 kV X+, X–, Y+, Y– ±25 kV Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-maximum rated conditions for extended periods may affect device reliability. Test method based on IEC standard 61000-4-2. Contact Texas Instruments for test details. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 ELECTRICAL CHARACTERISTICS At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, unless otherwise noted. TSC2007 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT AUXILIARY ANALOG INPUT Input voltage range 0 Input capacitance VDD 12 Input leakage current –1 V pF +1 µA 12 Bits A/D CONVERTER Resolution Programmable: 8 or 12 bits No missing codes 12-bit resolution 11 Bits ±1.5 LSB (1) VDD = 1.8V –1.2 LSB VDD = 3.0V –3.1 LSB VDD = 1.8V 0.7 LSB VDD = 3.0V 0.1 LSB TA = +25°C, VDD = 1.8V, command '1011' set '0000' 51 kΩ TA = +25°C, VDD = 1.8V, command '1011' set '0001' 90 kΩ Y+, X+ 6 Ω Y–, X– 5 Ω Integral linearity Offset error Gain error TOUCH SENSORS PENIRQ pull-up resistor, RIRQ Switch on-resistance Switch drivers drive current (2) 100ms duration 50 mA INTERNAL TEMPERATURE SENSOR Temperature range –40 +85 °C VDD = 3V 1.94 °C/LSB VDD = 1.6V 1.04 °C/LSB VDD = 3V 0.35 °C/LSB VDD = 1.6V 0.19 °C/LSB VDD = 3V ±2 °C/LSB VDD = 1.6V ±2 °C/LSB VDD = 3V ±3 °C/LSB VDD = 1.6V ±3 °C/LSB VDD = 1.2V 3.19 MHz VDD = 1.8V 3.66 MHz VDD = 2.7V 3.78 MHz VDD = 3.6V 3.82 MHz VDD = 1.2V 1.6 MHz VDD = 1.8V 1.83 MHz VDD = 2.7V 1.88 MHz VDD = 3.6V 1.91 MHz VDD = 1.6V 0.0056 %/°C VDD = 3.0V 0.012 %/°C Differential method (3) Resolution TEMP1 (4) Differential method (3) Accuracy TEMP1 (4) INTERNAL OSCILLATOR 8-Bit Internal clock frequency, fCCLK 12-Bit Frequency drift (1) (2) (3) (4) LSB means Least Significant Bit. With VDD/REF pin = +1.6V, one LSB is 391µV. Specified by design, but not tested. Exceeding 50mA source current may result in device degradation. Difference between TEMP1 and TEMP2 measurement; no calibration necessary. Temperature drift is –2.1mV/°C. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 3 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com ELECTRICAL CHARACTERISTICS (continued) At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, unless otherwise noted. TSC2007 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DIGITAL INPUT/OUTPUT Logic family CMOS VIH VIL Logic level 1.2V ≤ VDD < 1.6V 0.7 × VDD VDD + 0.3 V 1.6V ≤ VDD ≤ 3.6V 0.7 × VDD VDD + 0.3 V 1.2V ≤ VDD < 1.6V –0.3 0.2 × VDD V 1.6V ≤ VDD ≤ 3.6V –0.3 0.3 × VDD V –1 1 µA IIL SCL and SDA pins CIN SCL and SDA pins 10 pF VOH IOH = 2 TTL loads VDD – 0.2 VDD V VOL IOL = 2 TTL loads 0 0.2 V ILEAK Floating output –1 1 µA COUT Floating output 10 pF Data format Straight binary POWER-SUPPLY REQUIREMENTS Power-supply voltage, VDD Specified performance VDD = 1.2V Quiescent supply current (VDD with sensor off) 12-bit Fast mode (clock = 400kHz) PD[1:0] = 0,0 VDD = 1.8V VDD = 2.7V Power down supply current 1.2 32.56k eq rate 128 8.2k eq rate 3.6 V 190 µA µA 32.24 34.42k eq rate 165 8.2k eq rate 39.31 34.79k eq rate 226.2 8.2k eq rate 53.32 Not addressed, SCL = SDA = 1 0 240 µA µA 335 µA µA 0.8 µA POWER ON/OFF SLOPE REQUIREMENTS VDD off ramp VDD off time VDD on ramp 4 TA = –40°C to +85°C 2 kV/s TA = –40°C to +85°C, VDD = 0V 1.2 TA = –20°C to +85°C, VDD = 0V 0.3 s TA = –40°C to +85°C 12 kV/s Submit Documentation Feedback s Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 PIN CONFIGURATIONS PW PACKAGE TSSOP-16 (TOP VIEW) VDD/REF YZG PACKAGE WCSP-12 (TOP VIEW, SOLDER BUMPS ON BOTTOM SIDE) 16 AUX 1 X+ Y+ X- Y- VDD/REF A0 A1 GND AUX PENIRQ SDA SCL A B C D X+ 2 15 NC Y+ 3 14 A0 X- 4 Rows 3 13 A1 2 TSC2007 Y- 5 12 SCL GND 6 11 SDA NC 7 10 PENIRQ NC 8 9 1 Columns NC (FRONT VIEW) PIN ASSIGNMENTS PIN NO. TSSOP WCSP PIN NAME 1 A2 VDD/REF 2 A3 3 I/O A/D DESCRIPTION X+ I A X+ channel input B3 Y+ I A Y+ channel input 4 C3 X– I A X– channel input 5 D3 Y– I A Y– channel input 6 D2 GND 7 — NC No connection 8 — NC No connection 9 — NC 10 B1 PENIRQ O D Data available interrupt output. A delayed (process delay) pen touch detect. Pin polarity with active low. 11 C1 SDA I/O D Serial data I/O 12 D1 SCL I/O D Serial clock. This pin is normally an input, but acts as an output when the device stretches the clock to delay a bus transfer. 13 C2 A1 I D Address input bit 1 14 B2 A0 I D Address input bit 0 15 — NC 16 A1 AUX I A Supply voltage and external reference input Ground No connection No connection Auxiliary channel input Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 5 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com TIMING INFORMATION SDA tSU, STA tSU, DAT tBUF tHD, STA tHD, DAT tLOW SCL tSU, STO tHIGH tHD, STA tR tF START CONDITION REPEATED START CONDITION STOP CONDITION START CONDITION Figure 1. Detailed I/O Timing TIMING REQUIREMENTS: I2C Standard Mode (SCL = 100kHz) All specifications typical at –40°C to +85°C, VDD = 1.6V, unless otherwise noted. 2-WIRE STANDARD MODE PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT 100 kHz SCL clock frequency fSCL 0 Bus free time between a STOP and START condition tBUF 4.7 µs Hold time (repeated) START condition tHD, STA 4.0 µs Low period of SCL clock tLOW 4.7 µs High period of the SCL clock tHIGH 4.0 µs Setup time for a repeated START condition tSU, STA 4.7 Data hold time tHD, DAT 0 Data setup time tSU, DAT 250 Rise time for both SDA and SCL signals (receiving) tR Cb = total bus capacitance 1000 ns Fall time for both SDA and SCL signals (receiving) tF Cb = total bus capacitance 300 ns Fall time for both SDA and SCL signals (transmitting) tF Cb = total bus capacitance 250 ns Setup time for STOP condition tSU, STO Capacitive load for each bus line Cb 400 pF Cycle time Effective throughput Equivalent rate = effective throughput × 7 6 µs 3.45 µs ns µs 4.0 Cb = total capacitance of one bus line in pF µs 8 bits 40 SCL + 127 CCLK, VDD = 1.8V 434.7 12 bits 49 SCL + 148 CCLK, VDD = 1.8V 570.9 8 bits VDD = 1.8V 2.3 kSPS 12 bits VDD = 1.8V 1.75 kSPS 8 bits VDD = 1.8V 16.1 kHz 12 bits VDD = 1.8V 12.26 kHz Submit Documentation Feedback µs Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 TIMING REQUIREMENTS: I2C Fast Mode (SCL = 400kHz) All specifications typical at –40°C to +85°C, VDD = 1.6V, unless otherwise noted. 2-WIRE FAST MODE PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT 400 kHz SCL clock frequency fSCL 0 Bus free time between a STOP and START condition tBUF 1.3 µs Hold time (repeated) START condition tHD, STA 0.6 µs Low period of SCL clock tLOW 1.3 µs High period of the SCL clock tHIGH 0.6 µs Setup time for a repeated START condition tSU, STA 0.6 Data hold time tHD, DAT 0 Data setup time tSU, DAT 100 Rise time for both SDA and SCL signals (receiving) tR Cb = total bus capacitance 20+0.1×Cb 300 ns Fall time for both SDA and SCL signals (receiving) tF Cb = total bus capacitance 20+0.1×Cb 300 ns Fall time for both SDA and SCL signals (transmitting) tF Cb = total bus capacitance 20+0.1×Cb 250 Setup time for STOP condition tSU, STO Capacitive load for each bus line Cycle time Effective throughput Equivalent rate = effective throughput × 7 Cb µs 0.9 µs ns ns µs 0.6 Cb = total capacitance of one bus line in pF 400 pF µs 8 bits 40 SCL + 127 CCLK, VDD = 1.8V 134.7 12 bits 49 SCL + 148 CCLK, VDD = 1.8V 203.4 µs 8 bits VDD = 1.8V 7.42 kSPS 12 bits VDD = 1.8V 4.92 kSPS 8 bits VDD = 1.8V 51.97 kHz 12 bits VDD = 1.8V 34.42 kHz TIMING REQUIREMENTS: I2C High-Speed Mode (SCL = 1.7MHz) All specifications typical at –40°C to +85°C, VDD = 1.6V, unless otherwise noted. 2-WIRE HIGH-SPEED MODE PARAMETERS TEST CONDITIONS MIN TYP UNIT 1.7 MHz fSCL Hold time (repeated) START condition tHD, STA 160 ns Low period of SCL clock tLOW 320 ns High period of the SCL clock tHIGH 120 ns Setup time for a repeated START condition tSU, STA 160 Data hold time tHD, DAT 0 Data setup time tSU, DAT 10 Rise time for SCL signal (receiving) tR Cb = total bus capacitance 20 80 ns Rise time for SDA signal (receiving) tR Cb = total bus capacitance 20 160 ns Fall time for SCL signal (receiving) tF Cb = total bus capacitance 20 80 ns Fall time for SDA signal (receiving) tF Cb = total bus capacitance 20 160 ns Fall time for both SDA and SCL signals (transmitting) tF Cb = total bus capacitance 20 160 ns Setup time for STOP condition tSU, STO Capacitive load for each bus line Cb 400 pF Cycle time Effective throughput Equivalent rate = effective throughput × 7 0 MAX SCL clock frequency ns 150 ns ns 160 ns Cb = total capacitance of one bus line in pF µs 8 bits 40 SCL + 127 CCLK, VDD = 1.8V 58.2 12 bits 49 SCL + 148 CCLK, VDD = 1.8V 109.7 µs 8 bits VDD = 1.8V 17.17 kSPS 12 bits VDD = 1.8V 9.12 kSPS 8 bits VDD = 1.8V 120.22 kHz 12 bits VDD = 1.8V 63.81 kHz Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 7 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com TIMING REQUIREMENTS: I2C High-Speed Mode (SCL = 3.4MHz) All specifications typical at –40°C to +85°C, VDD = 1.6V, unless otherwise noted. 2-WIRE HIGH-SPEED MODE PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT 3.4 MHz SCL clock frequency fSCL 0 Hold time (repeated) START condition tHD, 160 ns Low period of SCL clock tLOW 160 ns High period of the SCL clock tHIGH 60 ns Setup time for a repeated START condition tSU, STA 160 Data hold time tHD, DAT 0 Data setup time tSU, DAT 10 Rise time for SCL signal (receiving) tR Cb = total bus capacitance 10 40 ns Rise time for SDA signal (receiving) tR Cb = total bus capacitance 10 80 ns Fall time for SCL signal (receiving) tF Cb = total bus capacitance 10 40 ns Fall time for SDA signal (receiving) tF Cb = total bus capacitance 10 80 ns Fall time for both SDA and SCL signals (transmitting) tF Cb = total bus capacitance 10 80 ns Setup time for STOP condition tSU, Capacitive load for each bus line Cb 100 pF Cycle time Effective throughput Equivalent rate = effective throughput × 7 8 STA ns 70 ns 160 STO ns ns Cb = total capacitance of one bus line in pF µs 8 bits 40 SCL + 127 CCLK, VDD = 1.8V 46.5 12 bits 49 SCL + 148 CCLK, VDD = 1.8V 95.3 µs 8 bits VDD = 1.8V 21.52 kSPS 12 bits VDD = 1.8V 10.49 kSPS 8 bits VDD = 1.8V 150.65 kHz 12 bits VDD = 1.8V 73.46 kHz Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 TYPICAL CHARACTERISTICS At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, PD1 = PD0 = 0, Fast mode, 12-bit mode, non-continuous AUX measurement, and MAV filter enabled (see MAV Filter section), unless otherwise noted. POWER-DOWN SUPPLY CURRENT vs TEMPERATURE SUPPLY CURRENT vs TEMPERATURE 350 High-Speed Mode = 3.4MHz 300 80 VDD = 3.0V VDD = 3.6V Supply Current (mA) Power-Down Supply Current (nA) 100 60 40 VDD = 1.6V 20 250 Fast Mode = 400kHz 200 150 100 Standard Mode = 100kHz 50 0 0 -40 -20 0 20 40 60 80 100 -40 0 20 40 60 Temperature (°C) Figure 2. Figure 3. SUPPLY CURRENT vs SUPPLY VOLTAGE (AUX Conversion) SUPPLY CURRENT vs SUPPLY VOLTAGE 600 80 100 300 High-Speed Mode = 3.4MHz 500 250 Supply Current (mA) Supply Current (mA) -20 Temperature (°C) 400 Fast Mode = 400kHz 300 200 Standard Mode = 100kHz TA = +25°C I2C Speed = 400kHz PD1 = PD0 = 0 X, Y, Z Conversion at 200SSPS 200 with MAV 150 MAV Bypassed 100 Touch Sensor Modeled By: 2kW for X-Plane 2kW for Y-Plane 1kW for Z (Touch Resistance) 50 100 0 0 1.2 1.6 2.0 2.4 2.8 3.2 3.6 1.2 1.6 2.0 2.4 2.8 3.2 VDD (V) VDD (V) Figure 4. Figure 5. SUPPLY CURRENT (Part Not Addressed) vs TEMPERATURE SUPPLY CURRENT (Part Not Addressed) vs SUPPLY VOLTAGE 3.6 250 70 200 High-Speed Mode = 3.4MHz 50 Supply Current (mA) Supply Current (mA) 60 40 30 20 Fast Mode = 400kHz 10 150 High-Speed Mode = 3.4MHz 100 Standard Mode = 100kHz 50 Fast Mode = 400kHz Standard Mode = 100kHz 0 0 -40 -20 0 20 40 Temperature (°C) 60 80 100 1.2 Figure 6. 1.6 2.0 2.4 VDD (V) 2.8 3.2 3.6 Figure 7. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 9 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com TYPICAL CHARACTERISTICS (continued) At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, PD1 = PD0 = 0, Fast mode, 12-bit mode, non-continuous AUX measurement, and MAV filter enabled (see MAV Filter section), unless otherwise noted. CHANGE IN GAIN vs TEMPERATURE CHANGE IN OFFSET vs TEMPERATURE 6 6 VDD = 1.8V VDD = 1.8V 4 Delta from +25°C (LSB) Delta from +25°C (LSB) 4 2 0 -2 2 0 -2 -4 -4 -6 -6 -40 -20 0 20 40 Temperature (°C) 60 80 100 -40 -20 0 20 40 Temperature (°C) 80 Figure 8. Figure 9. SWITCH ON-RESISTANCE vs SUPPLY VOLTAGE SWITCH ON-RESISTANCE vs TEMPERATURE 100 6 11 X+, Y+: VDD = 3.0V to Pin X-, Y-: Pin to GND 10 Y+ Y5 9 8 RON (W) RON (W) 60 7 Y- X+ 4 X- 6 Y+ 3 5 X- 4 X+ 2 3 1.2 1.6 2.0 2.4 2.8 3.6 3.2 -40 -20 0 VDD (V) 7 60 Figure 11. SWITCH ON-RESISTANCE vs TEMPERATURE TEMP DIODE VOLTAGE vs TEMPERATURE 850 X+, Y+: VDD = 1.8V to Pin X-, Y-: Pin to GND 6 RON (W) 40 Figure 10. Y+ 800 Y- TEMP Diode Voltage (mV) 8 20 80 100 Temperature (°C) X+ 5 X4 3 TEMP2 Measurement Includes A/D Converter Offset and Gain Errors TEMP1 137.5mV 94.2mV 750 700 650 600 550 500 450 2 VDD = 1.8V 400 -40 -20 0 20 40 60 80 100 -40 Temperature (°C) 0 20 40 60 80 100 Temperature (°C) Figure 12. 10 -20 Figure 13. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 TYPICAL CHARACTERISTICS (continued) At TA = –40°C to +85°C, VDD = +1.2V to +3.6V, PD1 = PD0 = 0, Fast mode, 12-bit mode, non-continuous AUX measurement, and MAV filter enabled (see MAV Filter section), unless otherwise noted. TEMP1 DIODE VOLTAGE vs SUPPLY VOLTAGE TEMP2 DIODE VOLTAGE vs SUPPLY VOLTAGE 704 586 584 582 580 578 576 VDD = VREF 574 1.2 Internal Oscillator Clock Frequency (MHz) TEMP2 Diode Voltage (mV) Measurement Includes A/D Converter Offset and Gain Errors Measurement Includes A/D Converter Offset and Gain Errors 702 700 698 696 694 692 VDD = VREF 690 1.6 2.0 2.4 VDD (V) 2.8 3.2 1.2 3.6 1.6 2.0 2.4 VDD (V) 2.8 3.2 3.6 Figure 14. Figure 15. INTERNAL OSCILLATOR CLOCK FREQUENCY vs TEMPERATURE INTERNAL OSCILLATOR CLOCK FREQUENCY vs TEMPERATURE 3.40 Internal Oscillator Clock Frequency (MHz) TEMP1 Diode Voltage (mV) 588 3.30 3.20 3.10 3.00 2.90 2.80 VDD = 1.2V 2.70 -40 -20 0 20 40 Temperature (°C) 60 80 3.70 3.65 VDD = 1.8V 3.60 100 -40 -20 0 Figure 16. 20 40 Temperature (°C) 60 80 100 Figure 17. Internal Oscillator Clock Frequency (MHz) INTERNAL OSCILLATOR CLOCK FREQUENCY vs TEMPERATURE 3.90 3.85 3.80 3.75 3.70 VDD = 3.0V -40 -20 0 20 40 Temperature (°C) 60 80 100 Figure 18. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 11 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com OVERVIEW The TSC2007 is an analog interface circuit for a human interface touch screen device. All peripheral functions are controlled through the command byte and onboard state machines. The TSC2007 features include: • Very low-power touch screen controller • Very small onboard footprint • Relieves host from tedious routine tasks by preprocessing, thus saving resources for more critical tasks • Ability to work on very low supply voltage • Minimal connection interface allows easiest isolation and reduces the number of dedicated I/O pins required • Miniature, yet complete; requires no external supporting component • Enhanced electrostatic discharge (ESD) protection The TSC2007 consists of the following blocks (refer to the block diagram on the front page): • Touch Screen Sensor Interface • Auxiliary Input (AUX) • Temperature Sensor • Acquisition Activity Preprocessing • Internal Conversion Clock • I2C Interface Communication with the TSC2007 is done via an I2C serial interface. The TSC2007 is an I2C slave device; therefore, data are shifted into or out of the TSC2007 under control of the host microprocessor, which also provides the serial data clock. Control of the TSC2007 and its functions is accomplished by writing to the command register of an internal state machine. A simple command protocol compatible with I2C is used to address this register. A typical application of the TSC2007 is shown in Figure 19. 1.8VDC 1m F 0.1mF 1.2kW X+ VDD/REF GND PENIRQ 1.2kW Host Processor GPIO Y+ A1 AUX Auxiliary Input GND Y- Touch Screen SDA SDA SCL SCL A0 TSC2007 X- GND Figure 19. Typical Circuit Configuration 12 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 TOUCH SCREEN OPERATION A resistive touch screen operates by applying a voltage across a resistor network and measuring the change in resistance at a given point on the matrix where the screen is touched by an input (stylus, pen, or finger). The change in the resistance ratio marks the location on the touch screen. The TSC2007 supports resistive 4-wire configurations, as shown in Figure 20. The circuit determines location in two coordinate pair dimensions, although a third dimension can be added for measuring pressure. 4-WIRE TOUCH SCREEN COORDINATE PAIR MEASUREMENT A 4-wire touch screen is typically constructed as shown in Figure 20. It consists of two transparent resistive layers separated by insulating spacers. Conductive Bar Transparent Conductor (ITO) Bottom Side Y+ X+ Silver Ink Transparent Conductor (ITO) Top Side XY- ITO = Indium Tin Oxide Insulating Material (Glass) Figure 20. 4-Wire Touch Screen Construction The 4-wire touch screen panel works by applying a voltage across the vertical or horizontal resistive network. The A/D converter converts the voltage measured at the point where the panel is touched. A measurement of the Y position of the pointing device is made by connecting the X+ input to a data converter chip, turning on the Y+ and Y– drivers, and digitizing the voltage seen at the X+ input. The voltage measured is determined by the voltage divider developed at the point of touch. For this measurement, the horizontal panel resistance in the X+ lead does not affect the conversion because of the high input impedance of the A/D converter. Voltage is then applied to the other axis, and the A/D converter converts the voltage representing the X position on the screen. This process provides the X and Y coordinates to the associated processor. Measuring touch pressure (Z) can also be done with the TSC2007. To determine pen or finger touch, the pressure of the touch must be determined. Generally, it is not necessary to have very high performance for this test; therefore, 8-bit resolution mode may be sufficient (however, data sheet calculations are shown using the 12-bit resolution mode). There are several different ways of performing this measurement. The TSC2007 supports two methods. The first method requires knowing the X-plate resistance, the measurement of the X-position, and two additional cross panel measurements (Z2 and Z1) of the touch screen (see Figure 21). Equation 1 calculates the touch resistance: R TOUCH + RX−plate @ ǒ Ǔ XPosition Z 2 *1 4096 Z 1 (1) Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 13 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com The second method requires knowing both the X-plate and Y-plate resistance, measurement of X-position and Y-position, and Z1. Equation 2 also calculates the touch resistance: RX−plate @ XPosition 4096 Y R TOUCH + *1 *R Y−plate @ 1* Position 4096 4096 Z1 ǒ Ǔ ǒ Ǔ (2) Measure X-Position X+ Y+ Touch X-Position Y- X- Measure Z1-Position Y+ X+ Touch Z1-Position Y- X- Y+ X+ Touch Z2-Position X- YMeasure Z2-Position Figure 21. Pressure Measurement When the touch panel is pressed or touched and the drivers to the panel are turned on, the voltage across the touch panel often overshoots and then slowly settles down (decays) to a stable dc value. This effect is a result of mechanical bouncing caused by vibration of the top layer sheet of the touch panel when the panel is pressed. This settling time must be accounted for, or else the converted value is incorrect. Therefore, a delay must be introduced between the time the driver for a particular measurement is turned on, and the time a measurement is made. In some applications, external capacitors may be required across the touch screen for filtering noise picked up by the touch screen (for example, noise generated by the LCD panel or back-light circuitry). The value of these capacitors provides a low-pass filter to reduce the noise, but creates an additional settling time requirement when the panel is touched. The settling time typically shows up as gain error. To solve this problem, the TSC2007 can be commanded to turn on the drivers only, without performing a conversion. Time can then be allowed to perform a conversion before the command is issued. The TSC2007 touch screen interface can measure position (X,Y) and pressure (Z). 14 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 INTERNAL TEMPERATURE SENSOR In some applications, such as battery recharging, an ambient temperature measurement is required. The temperature measurement technique used in the TSC2007 relies on the characteristics of a semiconductor junction operating at a fixed current level. The forward diode voltage (VBE) has a well-defined characteristic versus temperature. The ambient temperature can be predicted in applications by knowing the +25°C value of the VBE voltage and then monitoring the delta of that voltage as the temperature changes. The TSC2007 offers two modes of temperature measurement. The first mode requires calibration at a known temperature, but only requires a single reading to predict the ambient temperature. The TEMP1 diode, shown in Figure 22, is used during this measurement cycle. This voltage is typically 580mV at +25°C with a 10µA current. The absolute value of this diode voltage can vary by a few millivolts; the temperature coefficient (TC) of this voltage is very consistent at –2.1mV/°C. During the final test of the end product, the diode voltage would be stored at a known room temperature, in system memory, for calibration purposes by the user. The result is an equivalent temperature measurement resolution of 0.35°C/LSB (1LSB = 732µV with VREF = 3.0V). VDD TEMP2 TEMP1 +IN Converter -IN GND Figure 22. Functional Block Diagram of Temperature Measurement Mode The second mode does not require a test temperature calibration, but uses a two-measurement (differential) method to eliminate the need for absolute temperature calibration and for achieving 2°C/LSB accuracy. This mode requires a second conversion of the voltage across the TEMP2 diode with a resistance 91 times larger than the TEMP1 diode. The voltage difference between the first (TEMP1) and second (TEMP2) conversion is represented by: DV + kT q @ ln(N) (3) Where: N = the resistance ratio = 91. k = Boltzmann's constant = 1.3807 × 10–23 J/K (joules/kelvins). q = the electron charge = 1.6022 × 10–19 C (coulombs). T = the temperature in kelvins (K). This method can provide a much improved absolute temperature measurement, but a lower resolution of 1.6°C/LSB. The resulting equation to solve for T is: q @ DV T+ k @ ln(N) (4) Where: ΔV = VBE (TEMP2) – VBE(TEMP1) (in mV) ∴ T = 2.573 ⋅ ΔV (in K) or T = 2.573 ⋅ ΔV – 273 (in °C) Temperature 1 and temperature 2 measurements have the same timing as the other data acquisition cycles shown in Figure 33 and Figure 34. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 15 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com ANALOG-TO-DIGITAL CONVERTER Figure 23 shows the analog inputs of the TSC2007. The analog inputs (X, Y, and Z touch panel coordinates, chip temperature and auxiliary inputs) are provided via a multiplexer to the Successive Approximation Register (SAR) A/D converter. The A/D architecture is based on capacitive redistribution architecture, which inherently includes a sample-and-hold function. VDD/REF 50kW RIRQ PENIRQ 90kW Pen Touch X+ TEMP2 TEMP1 Control Logic MAV C3-C0 GND X- VDD Y+ +IN Y- +REF Converter -IN -REF GND AUX GND Figure 23. Analog Input Section (Simplified Diagram) A unique configuration of low on-resistance switches allows an unselected A/D converter input channel to provide power and an accompanying pin to provide ground for driving the touch panel. By maintaining a differential input to the converter and a differential reference input architecture, it is possible to negate errors caused by the driver switch on-resistance. 16 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 Reference The TSC2007 uses an external voltage reference that is applied to the VDD/REF pin. The upper reference voltage range is the same as the supply voltage range, which allows for simple, 1.2V to 3.6V, single-supply operation of the chip. Reference Mode There is a critical item regarding the reference when making measurements while the switch drivers are on. For this discussion, it is useful to consider the basic operation of the TSC2007 (see Figure 19). The application used in the following example shows the device being used to digitize a resistive touch screen. If the touch screen controller uses a single-ended reference mode, as shown in Figure 24, a measurement of the current Y position of the pointing device is made by connecting the X+ input to the A/D converter, turning on the Y+ and Y– drivers, and digitizing the voltage on X+. For this measurement, the resistance in the X+ lead does not affect the conversion; it does affect the settling time, but the resistance is usually small enough that this timing is not a concern. However, because the resistance between Y+ and Y– is fairly low, the on-resistance of the Y drivers does make a small difference. Under the situation outlined so far, it would not be possible to achieve a 0V input or a full-scale input regardless of where the pointing device is on the touch screen because some voltage is lost across the internal switches. In addition, the internal switch resistance is unlikely to track the resistance of the touch screen, providing an additional source of error. Therefore, the TSC2007 does not support single-ended reference mode. VDD/REF Y+ +IN X+ +REF Converter -IN -REF Y- GND Figure 24. Simplified Diagram of Single-Ended Reference This situation is resolved, as shown in Figure 25, by using the differential mode; the +REF and –REF inputs are connected directly to Y+ and Y–, respectively. This mode makes the A/D converter ratiometric. The result of the conversion is always a percentage of the external reference, regardless of how it changes in relation to the on-resistance of the internal switches. VDD/REF Y+ +IN X+ +REF Converter -IN -REF Y- GND Figure 25. Simplified Diagram of Differential Reference (Both Y Switches Enabled, X+ is Analog Input) Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 17 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com Touch Screen Settling In some applications, external capacitors may be required across the touch screen to filter noise picked up by the touch screen (that is, noise generated by the LCD panel or backlight circuitry). These capacitors provide a low-pass filter to reduce the noise, but they also cause a settling time requirement when the panel is touched. The settling time typically shows up as a gain error. The problem is that the input and/or reference has not settled to its final steady-state value before the A/D converter samples the input(s) and provides the digital output. Additionally, the reference voltage may continue to change during the measurement cycle. To resolve these settling-time problems, the TSC2007 can be commanded to turn on the drivers only without performing a conversion (see Table 3). Time can then be allowed, before the command is issued, to perform a conversion. Generally, the time it takes to communicate the conversion command over the I2C bus is adequate for the touch screen to settle. Variable Resolution The TSC2007 provides either 8-bit or 12-bit resolution for the A/D converter. Lower resolution is often practical for measuring slow changing signals such as touch pressure. Performing the conversions at lower resolution reduces the amount of time it takes for the A/D converter to complete its conversion process, which also lowers power consumption. 8-Bit Conversion The TSC2007 provides an 8-bit conversion mode (M = 1) that can be used when faster throughput is needed, and the digital result is not as critical (for example, measuring pressure). By switching to the 8-bit mode, a conversion result can be read by transferring only one data byte. The internal clock runs twice as fast at 4MHz. The faster clock shortens each conversion by four bits and reduces data transfer time, which results in fewer clock cycles and provides lower power consumption. Conversion Clock and Conversion Time The TSC2007 contains an internal clock, which drives the state machines inside the device that perform the many functions of the part. This clock is divided down to provide a clock that runs the A/D converter. The frequency of this clock is 4MHz clock for 8-bit mode, and 2MHz for the 12-bit mode. Data Format The TSC2007 output data are in straight binary format as shown in Figure 26. This figure shows the ideal output code for the given input voltage and does not include the effects of offset, gain, or noise. FS = Full-Scale Voltage = VREF(1) 1LSB = VREF(1)/4096 1LSB 11...111 Output Code 11...110 11...101 00...010 00...001 00...000 0V Input Voltage (2) FS - 1LSB (V) (1) Reference voltage at converter: +REF – (–REF). See Figure 23. (2) Input voltage at converter, after multiplexer: +IN – (–IN). See Figure 23. Figure 26. Ideal Input Voltages and Output Codes 18 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 Touch Detect The PENIRQ can be used as an interrupt to the host. RIRQ is an internal pull-up resistor with a programmable value of either 50kΩ (default) or 90kΩ. Write command '1011' (setup command) followed by data '0001' sets the pull-up to 90kΩ. NOTE: The first three bits must be '0's and the select bit is the last bit. To change the pull-up back to 50kΩ, issue write command '1011' followed by data '0000'. An example for the Y-position measurement is detailed in Figure 27. The PENIRQ output is pulled high by an internal pull-up. While in power-down mode with PD0 = 0, the Y– driver is on and connected to GND, and the PENIRQ output is connected to the X+ input. When the panel is touched, the X+ input is pulled to ground through the touch screen, and the PENIRQ output goes low because of the current path through the panel to GND, initiating an interrupt to the processor. During the measurement cycle for X-, Y-, and Z-position, the X+ input is disconnected from the PENIRQ pull-down transistor to eliminate any pull-up resistor leakage current from flowing through the touch screen, thus causing no errors. In addition to the measurement cycles for X-, Y-, and Z-position, commands that activate the X-drivers, Y-drivers, and Y+ and X-drivers without performing a measurement also disconnect the X+ input from the PENIRQ pull-down transistor, and disable the pen-interrupt output function, regardless of the value of the PD0 bit. Under these conditions, the PENIRQ output is forced low. Furthermore, if the last command byte written to the TSC2007 contains PD0 = 1, the pen-interrupt output function is disabled and cannot detect when the panel is touched. In order to re-enable the pen-interrupt output function under these circumstances, a command byte must be written to the TSC2007 with PD0 = 0. When the bus master sends the address byte with the R/W bit = 0, and the TSC2007 sends an acknowledge, the pen-interrupt function is disabled. If the command that follows the address byte contains PD0 = 0, then the pen-interrupt function is enabled at the end of a conversion. This action is approximately 100µs (12-bit mode) or 50µs (8-bit mode) after the TSC2007 receives a STOP/START condition, following the receipt of a command byte (see Figure 31 and Figure 30 for further details about when the conversion cycle begins). In both cases previously listed, it is recommended that whenever the host writes to the TSC2007, the master processor masks the interrupt associated to PENIRQ. This masking prevents false triggering of interrupts when the PENIRQ line is disabled in the cases previously listed. Connect to Analog Supply PENIRQ VDD/REF VDD RIRQ Pen Touch Control Logic TEMP1 High when the X+ or Y+ driver is on. X+ TEMP2 Y+ Sense GND Y- ON High when the X+ or Y+ driver is on, or when any sensor connection/shortcircuit tests are activated. GND Vias go to system analog ground plane. GND Figure 27. Example of a Pen-Touch Induced Interrupt via the PENIRQ Pin Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 19 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com Preprocessing The TSC2007 has a combined MAV filter (median value filter and averaging filter). MAV Filter If the acquired signal source is noisy because of the digital switching circuit, it may necessary to evaluate the data without noise. In this case, the median value filter operation helps remove the noise. The array of seven converted results is sorted first. The middle three values are then averaged to produce the output value of the MAV filter. The MAV filter is applied to all measurements for all analog inputs including the touch screen inputs, temperature measurements TEMP1 and TEMP2, and auxiliary input AUX. To shorten the conversion time, the MAV filter may be bypassed through the setup command; see Table 3 and Table 4. 7 measurements input into temporary array 7 7 Acquired Data Sort by descending order Averaging output from window of 3 7 3 Figure 28. MAV Filter Operation (Patent Pending) 20 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 I2C INTERFACE The TSC2007 supports the I2C serial bus and data transmission protocol in all three defined modes: standard, fast, and high-speed. A device that sends data onto the bus is defined as a transmitter, and a device receiving data as a receiver. The device that controls the message is called a master. The devices that are controlled by the master are slaves. The bus must be controlled by a master device that generates the serial clock (SCL), controls the bus access, and generates the START and STOP conditions. The TSC2007 operates as a slave on the I2C bus. Connections to the bus are made via the open-drain I/O lines, SDA and SCL. The following bus protocol has been defined (see Figure 29): • Data transfer may be initiated only when the bus is not busy. • During data transfer, the data line must remain stable whenever the clock line is HIGH. Changes in the data line while the clock line is HIGH will be interpreted as control signals. Accordingly, the following bus conditions have been defined: Bus Not Busy — Both data and clock lines remain HIGH. Start Data Transfer — A change in the state of the data line, from HIGH to LOW, while the clock is HIGH, defines a START condition. Stop Data Transfer — A change in the state of the data line, from LOW to HIGH, while the clock line is HIGH, defines the STOP condition. Data Valid — The state of the data line represents valid data, when, after a START condition, the data line is stable for the duration of the HIGH period of the clock signal. There is one clock pulse per bit of data. Each data transfer is initiated with a START condition and terminated with a STOP condition. The number of data bytes transferred between START and STOP conditions is not limited and is determined by the master device. The information is transferred byte-wise and each receiver acknowledges with a ninth-bit. Within the I2C bus specifications, a standard mode (100kHz clock rate), a fast mode (400kHz clock rate), and a high-speed mode (1.7MHz or 3.4MHz clock rate) are each defined. The TSC2007 works in all three modes. Acknowledge — Each receiving device, when addressed, is obliged to generate an acknowledge after the reception of each byte. The master device must generate an extra clock pulse that is associated with this acknowledge bit. A device that acknowledges must pull down the SDA line during the acknowledge clock pulse in such a way that the SDA line is stable LOW during the HIGH period of the acknowledge clock pulse. Of course, setup and hold times must be taken into account. A master must signal an end of data to the slave by not generating an acknowledge bit on the last byte that has been clocked out of the slave. In this case, the slave must leave the data line HIGH to enable the master to generate the STOP condition. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 21 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com Figure 29 details how data transfer is accomplished on the I2C bus. Depending upon the state of the R/W bit, two types of data transfer are possible: 1. Data transfer from a master transmitter to a slave receiver. The first byte transmitted by the master is the slave address. Next follows a number of data bytes. The slave returns an acknowledge bit after the slave address and each received byte. 2. Data transfer from a slave transmitter to a master receiver. The first byte, the slave address, is transmitted by the master. The slave then returns an acknowledge bit. Next, a number of data bytes are transmitted by the slave to the master. The master returns an acknowledge bit after all received bytes other than the last byte. At the end of the last received byte, a not-acknowledge is returned. The master device generates all of the serial clock pulses and the START and STOP conditions. A transfer ends with a STOP condition or a repeated START condition. Because a repeated START condition is also the beginning of the next serial transfer, the bus is not released. The TSC2007 may operate in the following two modes: 1. Slave Receiver Mode: Serial data and clock are received through SDA and SCL. After each byte is received, an acknowledge bit is transmitted. START and STOP conditions are recognized as the beginning and end of a serial transfer. Address recognition is performed by hardware after reception of the slave address and direction bit. 2. Slave Transmitter Mode: The first byte (the slave address) is received and handled as in the slave receiver mode. However, in this mode, the direction bit indicates that the transfer direction is reversed. Serial data are transmitted on SDA by the TSC2007 while the serial clock is input on SCL. START and STOP conditions are recognized as the beginning and end of a serial transfer. I2C Fast or Standard Mode (F/S Mode) In I2C Fast or Standard (F/S) mode, serial data transfer must meet the timing shown in the Timing Information section. In the serial transfer format of F/S mode, the master signals the beginning of a transmission to a slave with a START condition (S), which is a high-to-low transition on the SDA input while SCL is high. When the master has finished communicating with the slave, the master issues a STOP condition (P), which is a low-to-high transition on SDA while SCL is high, as shown in Figure 29. The bus is free for another transmission after a STOP condition has occurred. Figure 29 shows the complete F/S mode transfer on the I2C, 2-wire serial interface. The address byte, control byte, and data byte are transmitted between the START and STOP conditions. The SDA state is only allowed to change while SCL is low, except for the START and STOP conditions. Data are transmitted in 8-bit words. Nine clock cycles are required to transfer the data into or out of the device (8-bit word plus acknowledge bit). SDA MSB Slave Address R/W Direction Bit Acknowledgement Signal from Receiver Acknowledgement Signal from Receiver 1 SCL 2 6 7 8 9 1 2 3-8 8 ACK START Condition 9 ACK Repeated If More Bytes Are Transferred STOP Condition or Repeated START Condition Figure 29. Complete Fast- or Standard-Mode Transfer 22 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 I2C High-Speed Mode (Hs Mode) The TSC2007 can operate with high-speed I2C masters. To do so, the pull-up resistor on SCL must be changed to an active pull-up, as recommended in the I2C specification. Serial data transfer format in High-Speed (Hs) mode meets the Fast or Standard (F/S) mode I2C bus specification. Hs mode can only commence after the following conditions (all of which are in F/S mode) exist: 1. START condition (S) 2. 8-bit master code (00001xxx) 3. Not-acknowledge bit (N) Figure 30 shows this sequence in more detail. Hs-mode master codes are reserved 8-bit codes used only for triggering Hs mode, and are not to be used for slave addressing or any other purpose. The master code indicates to other devices that an Hs-mode transfer is about to begin and the connected devices must meet the Hs mode specification. Because no device is allowed to acknowledge the master code, the master code is followed by a not-acknowledge bit (N). After the not-acknowledge bit (N) and SCL have been pulled-up to a HIGH level, the master switches to Hs-mode and enables the current-source pull-up circuit for SCL (at time tH shown in Figure 30). Because other devices can delay the serial transfer before tH by stretching the LOW period of SCL, the master enables the current-source pull-up circuit when all devices have released SCL, and SCL has reached a HIGH level, thus speeding up the last part of the rise time of the SCL. The master then sends a repeated START condition (Sr) followed by a 7-bit slave address with a R/W bit address, and receives an acknowledge bit (A) from the selected slave. After a repeated START (Sr) condition and after each acknowledge bit (A) or not-acknowledge bit (N), the master disables its current-source pull-up circuit. This disabling enables other devices, such as the TSC2007, to delay the serial transfer (until the converted data are stored in the TSC internal shift register) by stretching the LOW period of SCL. The master re-enables its current-source pull-up circuit again when all devices have released SCL, and SCL reaches a HIGH level, which speeds up the last part of the SCL signal rise time. Data transfer continues in Hs mode after the next repeated START (Sr), and only switches back to F/S mode after a STOP condition (P). To reduce the overhead of the master code, it is possible for the master to link a number of Hs mode transfers, separated by repeated START conditions (Sr). 8-Bit Master Code 00001xxx S N tH SDA SCL 1 2 to 5 6 7 8 9 Fast or Standard Mode R/W 7-Bit Slave Address Sr A n x (8-Bit DATA + A/N) Sr P SDA SCL 1 2 to 5 6 7 8 9 1 2 to 5 6 7 8 9 If P then Fast or Standard Mode High-Speed Mode tH = Current Source Pull-Up = Resistor Pull-Up If Sr (dotted lines) then High-Speed Mode A = Acknowledge (SDA LOW) N = Not Acknowledge (SDA HIGH) S = START Condition P = STOP Condition Sr = Repeated START Condition tFS Figure 30. Complete High-Speed Mode Transfer Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 23 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com DIGITAL INTERFACE ADDRESS BYTE The TSC2007 has a 7-bit slave address word. The first five bits (MSBs) of the slave address are factory-preset to comply with the I2C standard for A/D converters and are always set at '10010'. The logic state of the address input pins (A1-A0) determines the two LSBs of the device address to activate communication. Therefore, a maximum of four devices with the same preset code can be connected on the same bus at one time. The A1-A0 address inputs are read whenever an address byte is received, and should be connected to the supply pin (VDD/REF) or the ground pin (GND). The slave address is latched into the TSC2007 on the falling edge of SCL after the read/write bit has been received by the slave. The last bit of the address byte (R/W) defines the operation to be performed. When set to a '1', a read operation is selected; when set to a ‘0’, a write operation is selected. Following the START condition, the TSC2007 monitors the SDA bus, checking the device type identifier being transmitted. Upon receiving the '10010' code, the appropriate device select bits, and the R/W bit, the slave device outputs an acknowledge signal on the SDA line. Table 1. I2C Slave Address Byte MSB D7 D6 D5 D4 D3 D2 D1 LSB D0 1 0 0 1 0 A1 A0 R/W Bit D0: R/W 1: I2C master read from TSC (I2C read addressing). 0: I2C master write to TSC (I2C write addressing). COMMAND BYTE Table 2. Command Byte Definition (Excluding the Setup Command) (1) (1) BIT NAME DESCRIPTION D7-D4 C3-C0 All Converter Function Select bits as detailed in Table 3, except for the setup command ('1011'). 00: 01: 10: 11: Power down between cycles. PENIRQ enabled. A/D converter on. PENIRQ disabled. A/D converter off. PENIRQ enabled. A/D converter on. PENIRQ disabled. D3-D2 PD1-PD0 D1 M 0: 12-bit (Lower speed referred to as the 2MHz clock). 1: 8-bit (Higher speed referred to as the 4MHz clock). D0 X Don't care. The command byte definition for the setup command is shown in Table 4. Bits D7-D4: C3-C0—Converter function select bits. These bits select the input to be converted and the converter function to be executed, activate the drivers, and configure the PENIRQ pull-up resistor (RIRQ). Table 3 lists the possible converter functions. Bits D3-D2: PD1-PD0—Power-down bits. These two bits select the power-down mode that the TSC2007 will be in after the current command completes, as shown in Table 2. It is recommended to set PD0 = 0 in each command byte to get the lowest power consumption possible. If multiple X-, Y-, and Z-position measurements will be done one right after another (such as when averaging), PD0 =1 will leave the touch screen drivers on at the end of each conversion cycle. Bit D1: M—Mode bit. If M = 0, the TSC2007 is in 12-bit mode. If M = 1, 8-bit mode is selected. Bit D0: X—Don’t care. 24 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 When the TSC2007 powers up, the power-down bits must be written to ensure that the device is placed into the mode that achieves the lowest power. Therefore, immediately after power-up, send a command byte that sets PD1 = PD0 = 0, so that the device will be in the lowest power mode, powering down between conversions. Table 3. Converter Function Select (1) FUNCTION INPUT TO A/D CONVERTER X-DRIVERS Y-DRIVERS ACK REFERENCE MODE TEMP0 OFF OFF Y Single-Ended C3 C2 C1 C0 0 0 0 0 Measure TEMP0 0 0 0 1 Reserved N/A OFF OFF N Single-Ended 0 0 1 0 Measure AUX AUX OFF OFF Y Single-Ended 0 0 1 1 Reserved N/A OFF OFF N Single-Ended 0 1 0 0 Measure TEMP1 TEMP1 OFF OFF Y Single-Ended 0 1 0 1 Reserved N/A OFF OFF N Single-Ended 0 1 1 0 Reserved N/A OFF OFF N Single-Ended 0 1 1 1 Reserved N/A OFF OFF N Single-Ended 1 0 0 0 Activate X-drivers N/A ON OFF Y Differential 1 0 0 1 Activate Y-drivers N/A OFF ON Y Differential 1 0 1 0 Activate Y+, X-drivers N/A X– ON Y+ ON Y Differential (1) 1 0 1 1 Setup command N/A OFF OFF N N/A 1 1 0 0 Measure X position Y+ ON OFF Y Differential 1 1 0 1 Measure Y position X+ OFF ON Y Differential 1 1 1 0 Measure Z1 position X+ X– ON Y+ ON Y Differential 1 1 1 1 Measure Z2 position Y– X– ON Y+ ON Y Differential The setup command has an additional four bits of data. These data are static; that is, they are not changed by other commands, except for the power-on reset. The default value for these bits after power-on reset is 0000. Table 4 shows the definition of these data bits. Table 4. Command Byte Definition for the Setup Command BIT NAME D7-D4 C3-C0 = '1011' DESCRIPTION Setup command; must write '1011'. D3-D2 PD1-PD0 = '00' Reserved; must write '00'. D1 Filter control D0 PENIRQ pull-up resistor (RIRQ) select 0: Use the onboard MAV filter (default). 1: Bypass the onboard MAV filter. 0: RIRQ = 50kΩ (default). 1: RIRQ = 90kΩ. Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 25 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com START A CONVERTER FUNCTION/WRITE CYCLE A conversion/write cycle begins when the master issues the address byte containing the slave address of the TSC2007, with the eighth bit equal to a 0 (R/W = 0), as shown in Table 1. Once the eighth bit has been received, and the address matches the A1-A0 address input pin setting, the TSC2007 issues an acknowledge. When the master receives the acknowledge bit from the TSC2007, the master writes the command byte to the slave (see Table 2). After the command byte is received by the slave, the slave issues another acknowledge bit. The master then ends the write cycle by issuing a repeated START or a STOP condition, as shown in Figure 31. SCL Address Byte 1 SDA 0 0 1 0 Command Byte A1 A0 R/W 0 0 C3 C2 C1 C0 PD1 PD0 TSC2007 ACK M X TSC2007 ACK Acquisition START 0 Conversion STOP or Repeated START Figure 31. Complete I2C Serial Write Transmission If the master sends additional command bytes after the initial byte, but before sending a STOP or repeated START condition, the TSC2007 does not acknowledge those bytes. The input multiplexer channel for the A/D converter is selected when bits C3 through C0 are clocked in. If the selected channel is an X-,Y-, or Z-position measurement, the appropriate drivers turn on once the acquisition period begins. When R/W = 0, the input sample acquisition period starts on the falling edge of SCL when the C0 bit of the command byte has been latched, and ends when a STOP or repeated START condition has been issued. A/D conversion starts immediately after the acquisition period. The multiplexer inputs to the A/D converter are disabled once the conversion period starts. However, if an X-, Y-, or Z-position is being measured, the respective touch screen drivers remain on during the conversion period. A complete write cycle is shown in Figure 31. 26 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 READ A CONVERSION/READ CYCLE For best performance, the I2C bus should remain in an idle state while an A/D conversion is taking place. This idling prevents digital clock noise from affecting the bit decisions being made by the TSC2007. The master should wait for at least 10µs before attempting to read data from the TSC2007 to realize this best performance. However, the master does not need to wait for a completed conversion before beginning a read from the slave, if full 12-bit performance is not necessary. Data access begins with the master issuing a START condition followed by the address byte (see Table 1) with R/W = 1. When the eighth bit has been received and the address matches, the slave issues an acknowledge. The first byte of serial data then follows (D11-D4, MSB first). After the first byte has been sent by the slave, it releases the SDA line for the master to issue an acknowledge. The slave responds with the second byte of serial data upon receiving the acknowledge from the master (D3-D0, followed by four 0 bits). The second byte is followed by a NOT acknowledge bit (ACK = 1) from the master to indicate that the last data byte has been received. If the master somehow acknowledges the second data byte, invalid data are returned (FFh). This condition applies to both 12-and 8-bit modes. See Figure 32 for a complete I2C read transmission. SCL Address Byte SDA START 1 0 0 1 0 Data Byte 2 Data Byte 1 A1 A0 R/W 1 0 D11 D10 TSC2007 ACK D9 D8 D7 D6 D5 D4 0 D3 D2 D1 D0 MASTER ACK 0 0 0 0 1 MASTER STOP or NACK Repeated START Figure 32. Complete I2C Serial Read Transmission Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 27 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com THROUGHPUT RATE AND I2C BUS TRAFFIC Although the internal A/D converter has a sample rate of up to 200kSPS, the throughput presented at the bus is much lower. The rate is reduced because preprocessing manages the redundant work of filtering out noise. The throughput is further limited by the I2C bus bandwidth. The effective throughput is approximately 20kSPS at 8-bit resolution, or 10kSPS at 12-bit resolution. This preprocessing saves a large portion of the I2C bandwidth for the system to use on other devices. Each sample and conversion takes 19 CCLK cycles (12-bit), or 16 CCLK cycles (8-bit). For a typical internal 4MHz OSC clock, the frequency actually ranges from 3.66MHz to 3.82MHz. For VDD = 1.2V, the frequency reduces to 3.19MHz, which gives a 3.19MHz/16 = 199kSPS raw A/D converter sample rate. 12-Bit Operation For 12-bit operation, sending the conversion result across the I2C bus takes 49 bus clocks (SCL clock). Each write cycle takes 20 I2C cycles (START, STOP, address byte, 2 ACKs, and command byte). Each read cycle takes 29 I2C cycles (START, STOP, address byte, 3 ACKs, and data bytes 1 and 2). Seven sample-and-conversions take 19 x 7 internal clocks to complete. The MAV filter loop requires 19 internal clocks. For VDD = 1.2V, the complete processed data cycle time calculations are shown in Table 5. Because the first acquisition cycle overlaps with the I/O cycle, four CCLKs should be deducted from the total CCLK cycles. For 12-bit mode, (19 × 7 + 19) – 4 = 148 CCLKs plus I/O are required. 8-Bit Operation For 8-bit operation, sending the conversion result across the I2C bus takes 40 bus clocks (SCL clock). Each write cycle takes 20 I2C cycles (START, STOP, address byte, 2 ACKs, and command byte). Each read cycle takes 20 I2C cycles (START, STOP, address byte, 2 ACKs, and data byte 1). Seven sample-and-conversions takes 16 x 7 internal clocks to complete. The MAV filter loop requires 19 internal clocks. For VDD = 1.2V, the complete processed data cycle time calculations are shown in Table 5. Because the first acquisition cycle overlaps with the I/O cycle, four CCLKs should be deducted from the total CCLK cycles. For 8-bit mode, (16 × 7 + 19) – 4 = 127 CCLKs plus I/O are required. Table 5. Measurement Cycle Time Calculations STANDARD MODE: 100kHz (Period = 10µs) 8-Bit 40 × 10µs + 127 × 313ns = 439.8µs (2.27kSPS through the I2C bus) 12-Bit 49 × 10µs + 148 × 625ns = 582.5µs (1.72kSPS through the I2C bus) FAST MODE: 400kHz (Period = 2.5µs) 8-Bit 40 × 2.5µs + 127 × 313ns = 139.8µs (7.15kSPS through the I2C bus) 12-Bit 49 × 2.5µs + 148 × 625ns = 215µs (4.65kSPS through the I2C bus) HIGH-SPEED MODE: 1.7MHz (Period = 588ns) 8-Bit 40 × 588ns + 127 × 313ns = 63.3µs (15.79kSPS through the I2C bus) 12-Bit 49 × 588ns + 148 × 625ns = 121.3µs (8.24kSPS through the I2C bus) HIGH-SPEED MODE: 3.4MHz (Period = 294ns) 8-Bit 40 × 294ns + 127 × 313ns = 51.6µs (19.39kSPS through the I2C bus) 12-Bit 49 × 294ns + 148 × 625ns = 106.9µs (9.35kSPS through the I2C bus) As an example, use VDD = 1.2V and 12-bit mode with the Fast-mode I2C clock (fSCL = 400kHz). The equivalent TSC throughput is at least seven times faster than the effective throughput across the bus (4.65k x 7 = 32.55kSPS). The supply current to the TSC for this rate and configuration is 128µA. To achieve an equivalent sample throughput of 8.2kSPS using the device without preprocessing, the TSC2007 consumes only (8.2/32.55) × 128µA = 32.24µA. 28 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 Table 6. Effective and Equivalent Throughput Rates SUPPLY VOLTAGE I C BUS SPEED (fSCL) RESOLUTION TSC CONVERSION CYCLE TIME (µs) 100kHz Standard 8-bit 433.6 2.31 16.14 40 127 3780 264.6 12-bit 568.7 1.76 12.31 49 148 1880 531.9 8-bit 133.6 7.49 52.40 40 127 3780 264.6 12-bit 201.2 4.97 34.79 49 148 1880 531.9 8-bit 57.1 17.50 122.53 40 127 3780 264.6 12-bit 107.5 9.30 65.09 49 148 1880 531.9 8-bit 45.4 22.04 154.31 40 127 3780 264.6 12-bit 93.1 10.74 75.16 49 148 1880 531.9 8-bit 434.7 2.30 16.10 40 127 3660 273.2 12-bit 570.9 1.75 12.26 49 148 1830 546.4 8-bit 134.7 7.42 51.97 40 127 3660 273.2 12-bit 203.4 4.92 34.42 49 148 1830 546.4 8-bit 58.2 17.17 120.22 40 127 3660 273.2 12-bit 109.7 9.12 63.81 49 148 1830 546.4 2 400kHz Fast 2.7V 1.7MHz High-Speed 3.4MHz High-Speed 100kHz Standard 400kHz Fast 1.8V 1.7MHz High-Speed EFFECTIVE THROUGHPUT (kSPS) EQUIVALENT THROUGHPUT (kSPS) NO. OF SCL NO. OF CCLK fCCLK (kHz) CCLK PERIODS (ns) 3.4MHz High-Speed 8-bit 46.5 21.52 150.65 40 127 3660 273.2 12-bit 95.3 10.49 73.46 49 148 1830 546.4 100kHz Standard 8-bit 439.8 2.27 15.92 40 127 3190 313.5 12-bit 582.5 1.72 12.02 49 148 1600 625.0 8-bit 139.8 7.15 50.07 40 127 3190 313.5 12-bit 215.0 4.65 32.56 49 148 1600 625.0 8-bit 63.3 15.79 110.51 40 127 3190 313.5 12-bit 121.3 8.24 57.70 49 148 1600 625.0 8-bit 51.6 19.39 135.72 40 127 3190 313.5 12-bit 106.9 9.35 65.47 49 148 1600 625.0 400kHz Fast 1.2V 1.7MHz High-Speed 3.4MHz High-Speed Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 29 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009 .................................................................................................................................................................................................................................................. www.ti.com I2C Write I2C Read Clock Stretched SCL CCLK Address Byte SDA 1 0 0 1 0 Command Byte A1 R/W A0 0 0 C3 C2 C1 C0 PD1 PD0 Address Byte M TSC2007 ACK X 0 0 1 0 1 0 R/W 1 A0 Acquisition 1 6 SCLs D11 D10 0 D9 D8 D7 D6 D5 TSC2007 ACK TSC2007 ACK START Data Byte 2 Data Byte 1 A1 Conversion 1 15 CCLKs STOP or REPEATED START ( Acquisition 2 4 CCLKs Conversion 7 15 CCLKs Conversion 2 15 CCLKs D4 0 D3 D2 D1 D0 0 0 0 1 MASTER NACK MASTER ACK MAV Filter 19 CCLKs 0 STOP or REPEATED START ) 148 CCLKs (Filter is Enabled, 12-Bit Mode) Figure 33. Data Acquisition Cycle (Filter Enabled) I2C Write I2C Read Clock Stretched SCL CCLK Address Byte SDA 1 0 0 1 0 Command Byte A1 A0 R/W 0 C3 C2 TSC2007 ACK START Address Byte Data Byte 2 Data Byte 1 R/W 0 C1 C0 PD1 PD0 M X 0 1 0 0 1 0 A1 A0 1 0 D11 D10 TSC2007 ACK TSC2007 ACK Acquisition 1 6 SCLs Conversion 1 15 CCLKs STOP or REPEATED START ( D9 D8 D7 D6 D5 D4 0 D3 MASTER ACK D2 D1 D0 0 0 0 0 1 MASTER NACK STOP or REPEATED START ) 15 CCLKs (Filter is Disabled, 12-Bit Mode) Figure 34. Data Acquisition Cycle (Filter Disabled) 30 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 POWER-ON RESET (POR) During TSC2007 power-up, an internal power-on reset (POR) is automatically implemented. The POR brings the TSC to the default working condition, and checks the A0 and A1 pins for the two LSBs of the I2C address. The TSC2007 senses the power-up curve to decide whether or not to implement a POR. It is required to follow the power-on/off slope and interval requirements, as provided in the Electrical Characteristics, in order to ensure a proper POR of the TSC2007. tVDD_ON_RAMP tVDD_OFF_RAMP 1.2V to 3.6V 0.9V VDD 0.3V 0V tVDD_OFF Figure 35. Power-On Reset Timing Table 7. Timing Requirements for Figure 35 PARAMETER TEST CONDITIONS VDD off ramp MIN TA = –40°C to +85°C VDD off time VDD on ramp MAX UNIT 2 kV/s TA = –40°C to +85°C, VDD = 0V 1.2 TA = –20°C to +85°C, VDD = 0V 0.3 s s TA = –40°C to +85°C 12 kV/s VDD Off Time for Valid POR (s) 1.4 1.2 1.0 Recommended VDD Off Time for TA = -40°C to +85°C 0.8 0.6 0.4 0.2 0 Typical VDD Off Time for Various Temperatures -40 -20 0 20 40 Temperature (°C) 60 80 100 Figure 36. VDD Off Time vs Temperature Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 31 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com LAYOUT The following layout suggestions should obtain optimum performance from the TSC2007. Keep in mind that many portable applications have conflicting requirements for power, cost, size, and weight. In general, most portable devices have fairly clean power and grounds because most of the internal components are very low power. This situation would mean less bypassing for the converter power and less concern regarding grounding. However, each situation is unique and the following suggestions should be reviewed carefully. For optimum performance, care should be taken with the physical layout of the TSC2007 circuitry. The basic SAR architecture is sensitive to glitches or sudden changes on the power supply, reference, ground connections, and digital inputs that occur immediately before latching the output of the analog comparator. Therefore, during any single conversion for an n-bit SAR converter, there are n windows in which large external transient voltages can easily affect the conversion result. Such glitches might originate from switching power supplies, nearby digital logic, and high power devices. The degree of error in the digital output depends on the reference voltage, layout, and the exact timing of the external event. The error can change if the external event changes in time with respect to the SCL input. With this consideration in mind, power to the TSC2007 should be clean and well-bypassed. A 0.1µF ceramic bypass capacitor should be placed as close to the device as possible. In addition, a 1µF to 10µF capacitor may also be needed if the impedance of the connection between VDD/REF and the power supply is high. A bypass capacitor is generally not needed on the VDD/REF pin because the internal reference is buffered by an internal op amp. If an external reference voltage originates from an op amp, make sure that it can drive any bypass capacitor that is used without oscillation. The TSC2007 architecture offers no inherent rejection of noise or voltage variation with regard to using an external reference input, which is of particular concern when the reference input is tied to the power supply. Any noise and ripple from the supply appears directly in the digital results. While high-frequency noise can be filtered out, voltage variation because of line frequency (50Hz or 60Hz) can be difficult to remove. Some package options have pins labeled as VOID. Avoid any active trace going under any pin marked as VOID unless it is shielded by a ground or power plane. The GND pin should be connected to a clean ground point. In many cases, this point is the analog ground. Avoid connections that are too near the grounding point of a microcontroller or digital signal processor. If needed, run a ground trace directly from the converter to the power-supply entry or battery connection point. The ideal layout includes an analog ground plane dedicated to the converter and associated analog circuitry. In the specific case of use with a resistive touch screen, care should be taken with the connection between the converter and the touch screen. Resistive touch screens have fairly low resistance; therefore, the interconnection should be as short and robust as possible. Loose connections can be a source of error when the contact resistance changes with flexing or vibrations. As indicated previously, noise can be a major source of error in touch-screen applications (for example, applications that require a back-lit LCD panel). This electromagnetic interfence (EMI) noise can be coupled through the LCD panel to the touch screen and cause flickering of the converted A/D converter data. Several things can be done to reduce this error, such as using a touch screen with a bottom-side metal layer connected to ground, which couples the majority of noise to ground. Additionally, filtering capacitors, from Y+, Y–, X+, and X– to ground, can also help. Note, however, that the use of these capacitors increases screen settling time and requires a longer time for panel voltages to stabilize. The resistor value varies depending on the touch screen sensor used. The PENIRQ pull-up resistor (RIRQ) may be adequate for most of sensors. 32 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 TSC2007 www.ti.com...................................................................................................................................................... SBAS405A – MARCH 2007 – REVISED MARCH 2009 Revision History Changes from Original (March 2007) to Revision A ....................................................................................................... Page • • • • • • • • • • • • • Added IEC discharge information to Absolute Maximum Ratings table ................................................................................ 2 Added Power On/Off Slope Requirements section to Electrical Characteristics ................................................................... 4 Added pin 1 identifier to YZG pinout drawing ........................................................................................................................ 5 Changed tOF to tF in Timing Requirements tables.................................................................................................................. 6 Changed Fall time for both SDA and SCL signals from 10 (min) and 80 (max) to 20 (min) and 160 (max) in Timing Requirements table for High-Speed mode ............................................................................................................................ 7 Changed resistance ratio from 80 to 91 in the Internal Temperature Sensor section......................................................... 15 Changed T result from 2.648 to 2.573 (because of change to resistance ratio) ................................................................. 15 Added text to clarify temperature 1 and 2 measurement timings in last sentence on page................................................ 15 Changed text in Reference mode to clarify singled-ended operation.................................................................................. 17 Changed Figure 27 caption text from PINTDAV to PENIRQ............................................................................................... 19 Added "patent pending" to Figure 28................................................................................................................................... 20 Added subsections to Throughput Rate and I2C Bus Traffic section to clarify 8- and 12-bit operation.............................. 28 Added Power-On Reset section .......................................................................................................................................... 31 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 33 TSC2007 SBAS405A – MARCH 2007 – REVISED MARCH 2009...................................................................................................................................................... www.ti.com MECHANICAL DATA 34 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): TSC2007 PACKAGE OPTION ADDENDUM www.ti.com 15-Apr-2017 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) HPA00612IYZGR ACTIVE DSBGA YZG 12 3000 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 TSC2007I HPA00765IYZGR ACTIVE DSBGA YZG 12 3000 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 TSC2007I TSC2007IPW ACTIVE TSSOP PW 16 90 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TSC2007 TSC2007IPWG4 ACTIVE TSSOP PW 16 90 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TSC2007 TSC2007IPWR ACTIVE TSSOP PW 16 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TSC2007 TSC2007IPWRG4 ACTIVE TSSOP PW 16 2000 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM -40 to 85 TSC2007 TSC2007IYZGR ACTIVE DSBGA YZG 12 3000 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 TSC2007I TSC2007IYZGT ACTIVE DSBGA YZG 12 250 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 TSC2007I (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com (4) 15-Apr-2017 There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF TSC2007 : • Automotive: TSC2007-Q1 NOTE: Qualified Version Definitions: • Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 17-Jun-2015 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant TSC2007IPWR TSSOP PW 16 2000 330.0 12.4 6.9 5.6 1.6 8.0 12.0 Q1 TSC2007IYZGR DSBGA YZG 12 3000 180.0 8.4 1.75 2.25 0.81 4.0 8.0 Q1 TSC2007IYZGT DSBGA YZG 12 250 180.0 8.4 1.75 2.25 0.81 4.0 8.0 Q1 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 17-Jun-2015 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) TSC2007IPWR TSSOP PW 16 2000 367.0 367.0 35.0 TSC2007IYZGR DSBGA YZG 12 3000 182.0 182.0 20.0 TSC2007IYZGT DSBGA YZG 12 250 182.0 182.0 20.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated (TI) reserves the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. TI’s published terms of sale for semiconductor products (http://www.ti.com/sc/docs/stdterms.htm) apply to the sale of packaged integrated circuit products that TI has qualified and released to market. Additional terms may apply to the use or sale of other types of TI products and services. Reproduction of significant portions of TI information in TI data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such reproduced documentation. Information of third parties may be subject to additional restrictions. Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Buyers and others who are developing systems that incorporate TI products (collectively, “Designers”) understand and agree that Designers remain responsible for using their independent analysis, evaluation and judgment in designing their applications and that Designers have full and exclusive responsibility to assure the safety of Designers' applications and compliance of their applications (and of all TI products used in or for Designers’ applications) with all applicable regulations, laws and other applicable requirements. Designer represents that, with respect to their applications, Designer has all the necessary expertise to create and implement safeguards that (1) anticipate dangerous consequences of failures, (2) monitor failures and their consequences, and (3) lessen the likelihood of failures that might cause harm and take appropriate actions. Designer agrees that prior to using or distributing any applications that include TI products, Designer will thoroughly test such applications and the functionality of such TI products as used in such applications. TI’s provision of technical, application or other design advice, quality characterization, reliability data or other services or information, including, but not limited to, reference designs and materials relating to evaluation modules, (collectively, “TI Resources”) are intended to assist designers who are developing applications that incorporate TI products; by downloading, accessing or using TI Resources in any way, Designer (individually or, if Designer is acting on behalf of a company, Designer’s company) agrees to use any particular TI Resource solely for this purpose and subject to the terms of this Notice. TI’s provision of TI Resources does not expand or otherwise alter TI’s applicable published warranties or warranty disclaimers for TI products, and no additional obligations or liabilities arise from TI providing such TI Resources. TI reserves the right to make corrections, enhancements, improvements and other changes to its TI Resources. TI has not conducted any testing other than that specifically described in the published documentation for a particular TI Resource. Designer is authorized to use, copy and modify any individual TI Resource only in connection with the development of applications that include the TI product(s) identified in such TI Resource. NO OTHER LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE TO ANY OTHER TI INTELLECTUAL PROPERTY RIGHT, AND NO LICENSE TO ANY TECHNOLOGY OR INTELLECTUAL PROPERTY RIGHT OF TI OR ANY THIRD PARTY IS GRANTED HEREIN, including but not limited to any patent right, copyright, mask work right, or other intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information regarding or referencing third-party products or services does not constitute a license to use such products or services, or a warranty or endorsement thereof. Use of TI Resources may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. TI RESOURCES ARE PROVIDED “AS IS” AND WITH ALL FAULTS. TI DISCLAIMS ALL OTHER WARRANTIES OR REPRESENTATIONS, EXPRESS OR IMPLIED, REGARDING RESOURCES OR USE THEREOF, INCLUDING BUT NOT LIMITED TO ACCURACY OR COMPLETENESS, TITLE, ANY EPIDEMIC FAILURE WARRANTY AND ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, AND NON-INFRINGEMENT OF ANY THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. TI SHALL NOT BE LIABLE FOR AND SHALL NOT DEFEND OR INDEMNIFY DESIGNER AGAINST ANY CLAIM, INCLUDING BUT NOT LIMITED TO ANY INFRINGEMENT CLAIM THAT RELATES TO OR IS BASED ON ANY COMBINATION OF PRODUCTS EVEN IF DESCRIBED IN TI RESOURCES OR OTHERWISE. IN NO EVENT SHALL TI BE LIABLE FOR ANY ACTUAL, DIRECT, SPECIAL, COLLATERAL, INDIRECT, PUNITIVE, INCIDENTAL, CONSEQUENTIAL OR EXEMPLARY DAMAGES IN CONNECTION WITH OR ARISING OUT OF TI RESOURCES OR USE THEREOF, AND REGARDLESS OF WHETHER TI HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Unless TI has explicitly designated an individual product as meeting the requirements of a particular industry standard (e.g., ISO/TS 16949 and ISO 26262), TI is not responsible for any failure to meet such industry standard requirements. Where TI specifically promotes products as facilitating functional safety or as compliant with industry functional safety standards, such products are intended to help enable customers to design and create their own applications that meet applicable functional safety standards and requirements. Using products in an application does not by itself establish any safety features in the application. Designers must ensure compliance with safety-related requirements and standards applicable to their applications. Designer may not use any TI products in life-critical medical equipment unless authorized officers of the parties have executed a special contract specifically governing such use. Life-critical medical equipment is medical equipment where failure of such equipment would cause serious bodily injury or death (e.g., life support, pacemakers, defibrillators, heart pumps, neurostimulators, and implantables). Such equipment includes, without limitation, all medical devices identified by the U.S. Food and Drug Administration as Class III devices and equivalent classifications outside the U.S. TI may expressly designate certain products as completing a particular qualification (e.g., Q100, Military Grade, or Enhanced Product). Designers agree that it has the necessary expertise to select the product with the appropriate qualification designation for their applications and that proper product selection is at Designers’ own risk. Designers are solely responsible for compliance with all legal and regulatory requirements in connection with such selection. Designer will fully indemnify TI and its representatives against any damages, costs, losses, and/or liabilities arising out of Designer’s noncompliance with the terms and provisions of this Notice. Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2017, Texas Instruments Incorporated