TI ADS41B49IRGZ25 14-/12-bit, 250msps, ultralow-power adc with analog buffer Datasheet

ADS41B29
ADS41B49
www.ti.com
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
14-/12-Bit, 250MSPS, Ultralow-Power ADC
with Analog Buffers
Check for Samples: ADS41B29, ADS41B49
FEATURES
DESCRIPTION
•
The ADS41B29/B49 are members of the ultralowpower ADS4xxx analog-to-digital converter (ADC)
family, featuring integrated analog input buffers.
These devices use innovative design techniques to
achieve high dynamic performance, while consuming
extremely low power. The analog input pins have
buffers, with benefits of constant performance and
input impedance across a wide frequency range. The
devices are well-suited for multi-carrier, wide
bandwidth communications applications such as PA
linearization.
1
23
•
•
•
•
•
•
•
•
•
ADS41B49: 14-Bit, 250MSPS
ADS41B29: 12-Bit, 250MSPS
Integrated High-Impedance
Analog Input Buffer:
– Input Capacitance: 2pF
– 200MHz Input Resistance: 3kΩ
Maximum Sample Rate: 250MSPS
Ultralow Power:
– 1.8V Analog Power: 180mW
– 3.3V Buffer Power: 96mW
– I/O Power: 135mW (DDR LVDS)
High Dynamic Performance:
– SNR: 69dBFS at 170MHz
– SFDR: 82.5dBc at 170MHz
Output Interface:
– Double Data Rate (DDR) LVDS with
Programmable Swing and Strength:
– Standard Swing: 350mV
– Low Swing: 200mV
– Default Strength: 100Ω Termination
– 2x Strength: 50Ω Termination
– 1.8V Parallel CMOS Interface Also
Supported
Programmable Gain for SNR/SFDR Trade-Off
DC Offset Correction
Supports Low Input Clock Amplitude
Package: QFN-48 (7mm × 7mm)
The ADS41B49/29 have features such as digital gain
and offset correction. The gain option can be used to
improve SFDR performance at lower full-scale input
ranges, especially at high input frequencies. The
integrated dc offset correction loop can be used to
estimate and cancel the ADC offset. At lower
sampling rates, the ADC automatically operates at
scaled-down power with no loss in performance.
The devices support both double data rate (DDR)
low-voltage differential signaling (LVDS) and parallel
CMOS digital output interfaces. The low data rate of
the DDR LVDS interface (maximum 500MBPS)
makes it possible to use low-cost field-programmable
gate array (FPGA)-based receivers. The devices
have a low-swing LVDS mode that can be used to
further reduce the power consumption. The strength
of the LVDS output buffers can also be increased to
support 50Ω differential termination.
The devices are available in a compact QFN-48
package and are specified over the industrial
temperature range (–40°C to +85°C).
1
2
3
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments, Incorporated.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2012, Texas Instruments Incorporated
ADS41B29
ADS41B49
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION (1)
PRODUCT
PACKAGELEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
ADS41B29
QFN-48
RGZ
ADS41B49
(1)
(2)
QFN-48
RGZ
ECO PLAN (2)
LEAD/BALL
FINISH
PACKAGE
MARKING
–40°C to +85°C
GREEN (RoHS,
no Sb/Br)
Cu/NiPdAu
AZ41B29
–40°C to +85°C
GREEN (RoHS,
no Sb/Br)
Cu/NiPdAu
AZ41B49
ORDERING
NUMBER
TRANSPORT
MEDIA
ADS41B29IRGZR
Tape and reel
ADS41B29IRGZT
Tape and reel
ADS41B49IRGZR
Tape and reel
ADS41B49IRGZT
Tape and reel
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
Eco Plan is the planned eco-friendly classification. Green (RoHS, no Sb/Br): TI defines Green to mean Pb-Free (RoHS compatible) and
free of Bromine- (Br) and Antimony- (Sb) based flame retardants. Refer to the Quality and Lead-Free (Pb-Free) Data web site for more
information.
ABSOLUTE MAXIMUM RATINGS (1)
ADS41B29, ADS41B49
MIN
MAX
UNIT
Supply voltage range, AVDD
–0.3
2.1
V
Supply voltage range, AVDD_BUF
–0.3
3.9
V
Supply voltage range, DRVDD
–0.3
2.1
V
Voltage between AGND and DRGND
–0.3
0.3
V
Voltage between AVDD to DRVDD (when AVDD leads DRVDD)
–2.4
2.4
V
Voltage between DRVDD to AVDD (when DRVDD leads AVDD)
–2.4
2.4
V
Voltage between AVDD_BUF to DRVDD/AVDD
–4.2
4.2
V
–0.3
Minimum
(1.9, AVDD + 0.3)
V
–0.3
AVDD + 0.3
V
INP, INM
Voltage applied to input pins
Operating free-air temperature range, TA
(2)
CLKP, CLKM , RESET, SCLK,
SDATA, SEN, DFS
–40
Operating junction temperature range, TJ
Storage temperature range, Tstg
ESD, human body model (HBM)
(1)
(2)
2
–65
+85
°C
+125
°C
+150
°C
2
kV
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
When AVDD is turned off, it is recommended to switch off the input clock (or ensure the voltage on CLKP, CLKM is less than |0.3V|.
Doing so prevents the ESD protection diodes at the clock input pins from turning on.
Copyright © 2009–2012, Texas Instruments Incorporated
ADS41B29
ADS41B49
www.ti.com
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
RECOMMENDED OPERATING CONDITIONS
ADS41B29, ADS41B49
MIN
TYP
MAX
UNIT
1.7
1.8
1.9
V
3
3.3
3.6
V
1.7
1.8
1.9
V
SUPPLIES
AVDD
Analog supply voltage
AVDD_BUF
Analog buffer supply voltage
DRVDD
Digital supply voltage
ANALOG INPUTS
Differential input voltage range (1)
1.5
Input common-mode voltage
VPP
1.7 ± 0.05
V
Maximum analog input frequency with 1.5VPP input amplitude (2)
400
MHz
Maximum analog input frequency with 1VPP input amplitude (2)
600
MHz
CLOCK INPUT
ADS41B29/
ADS41B49
Low-speed mode enabled (3)
20
80
MSPS
Low-speed mode disabled (3)
> 80
250
MSPS
Input clock amplitude differential (VCLKP – VCLKM)
Sine wave, ac-coupled
1.5
VPP
LVPECL, ac-coupled
1.6
VPP
LVDS, ac-coupled
0.7
VPP
LVCMOS, single-ended, ac-coupled
1.8
Input clock duty Low-speed mode enabled
cycle
Low-speed mode disabled
0.2
V
40
50
60
%
35
50
65
%
DIGITAL OUTPUTS
CLOAD
Maximum external load capacitance from each output pin to DRGND
RLOAD
Differential load resistance between the LVDS output pairs
(LVDS mode)
TA
Operating free-air temperature
–40
5
pF
100
Ω
+85
°C
HIGH-PERFORMANCE MODES (4) (5) (6)
MODE 1
Set the MODE 1 register bits to get the best performance across sample
clock and input signal frequencies.
Register address = 03h, register data = 03h.
MODE 2
Set the MODE 2 register bit to get the best performance at high input signal
frequencies greater than 230MHz.
Register address = 4Ah, register data = 01h.
(1)
(2)
(3)
(4)
(5)
(6)
With 0dB gain. See the Gain for SFDR/SNR Trade-Off section in Application Information for the relationship between input voltage range
and gain.
See the Theory of Operation section in the Application Information.
See the Serial Interface section for details on the low-speed mode.
It is recommended to use these modes to get best performance. These modes can only be set with the serial interface.
See the Serial Interface section for details on register programming.
Note that these modes cannot be set when the serial interface is not used (when the RESET pin is tied high); see the Device
Configuration section.
Copyright © 2009–2012, Texas Instruments Incorporated
3
ADS41B29
ADS41B49
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
www.ti.com
ELECTRICAL CHARACTERISTICS: ADS41B29, ADS41B49
Typical values are at +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, 1.5VPP clock amplitude, 50% clock duty
cycle, –1dBFS differential analog input, and DDR LVDS interface, unless otherwise noted. Minimum and maximum values are
across the full temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8V, AVDD_BUF = 3.3V, and DRVDD = 1.8V.
ADS41B29
PARAMETER
TEST CONDITIONS
MIN
TYP
Resolution
SINAD
(signal-to-noise and distortion ratio), LVDS
SFDR
THD
68.3
69.5
dBFS
68.3
69.5
dBFS
69.1
dBFS
IMD
Input overload recovery
65.5
68
67.5
68.4
dBFS
fIN = 20MHz
68.3
69.5
dBFS
fIN = 70MHz
68.1
69.3
dBFS
fIN = 100MHz
68.2
69.3
dBFS
68.8
dBFS
65
67.8
66.5
67.4
dBFS
fIN = 20MHz
89
89
dBc
fIN = 70MHz
85
85
dBc
fIN = 100MHz
87
87
dBc
82
dBc
71
82
72
fIN = 300MHz
75
75
dBc
fIN = 20MHz
85
85
dBc
fIN = 70MHz
82
82
dBc
fIN = 100MHz
83
83
dBc
79.5
dBc
fIN = 300MHz
68
72
72
dBc
fIN = 20MHz
93
93
dBc
fIN = 70MHz
85
85
dBc
fIN = 100MHz
87
87
dBc
87
dBc
71
79.5
69
87
72
fIN = 300MHz
80
80
dBc
fIN = 20MHz
93
93
dBc
fIN = 70MHz
88
88
dBc
fIN = 100MHz
88
88
dBc
82
dBc
71
82
72
fIN = 300MHz
75
75
dBc
fIN = 20MHz
89
89
dBc
fIN = 70MHz
90
90
dBc
fIN = 100MHz
90
90
dBc
88
dBc
76
88
77.5
fIN = 300MHz
88
88
dBc
f1 = 185MHz, f2 = 190MHz,
each tone at –7dBFS
–86
–86
dBFS
Recovery to within 1% (of final
value) for 6dB overload with sinewave input
1
1
Clock
cycles
> 30
> 30
dB
PSRR
For 100mVPP signal on AVDD
supply, up to 10MHz
Effective number of bits
ENOB
fIN = 170MHz
11
INL
fIN = 170MHz
±1.5
4
66
fIN = 300MHz
AC power-supply rejection ratio
Integrated nonlinearity
66.5
fIN = 300MHz
fIN = 170MHz
Two-tone intermodulation
distortion
Bits
fIN = 70MHz
fIN = 170MHz
Worst spur
(other than second and third harmonics)
UNIT
fIN = 100MHz
fIN = 170MHz
HD3
14
dBFS
fIN = 170MHz
HD2
MAX
69.7
fIN = 170MHz
Third-harmonic distortion
TYP
68.4
fIN = 170MHz
Second-harmonic distortion
MIN
fIN = 20MHz
fIN = 170MHz
Total harmonic distortion
MAX
12
SNR (signal-to-noise ratio), LVDS
Spurious-free dynamic range
ADS41B49
11.2
±3.5
±2.5
LSBs
±5
LSBs
Copyright © 2009–2012, Texas Instruments Incorporated
ADS41B29
ADS41B49
www.ti.com
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
ELECTRICAL CHARACTERISTICS: GENERAL
Typical values are at +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, and 50% clock duty cycle, unless otherwise
noted. Minimum and maximum values are across the full temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8V,
AVDD_BUF = 3.3V, and DRVDD = 1.8V.
ADS41B29, ADS41B49
PARAMETER
MIN
TYP
MAX
UNIT
ANALOG INPUTS
Differential input voltage range
1.5
VPP
Differential input resistance, at dc (see Figure 60)
10
kΩ
Differential input capacitance (see Figure 61)
3.5
pF
Analog input bandwidth
800
MHz
2
µA
Analog input common-mode current (per input pin)
Common-mode output voltage
VCM
VCM output current capability
1.7
V
4
mA
DC ACCURACY
Offset error
–15
Temperature coefficient of offset error
Gain error as a result of
internal reference inaccuracy alone
Gain error of channel alone
2.5
15
0.003
EGREF
EGCHAN
–2
mV
mV/°C
2
2.5
%FS
%FS
POWER SUPPLY
IAVDD
Analog supply current
99.5
115
mA
IAVDD_BUF
Analog input buffer supply current
29
42
mA
IDRVDD (1)
Output buffer supply current
LVDS interface with 100Ω external termination
Low LVDS swing (200mV)
63
IDRVDD
Output buffer supply current
LVDS interface with 100Ω external termination
Standard LVDS swing (350mV)
75
IDRVDD output buffer supply current (1) (2)
CMOS interface (2)
8pF external load capacitance
fIN = 2.5MHz
35
Global power-down
10
Standby
200
(1)
(2)
mA
90
mA
mA
25
mW
mW
The maximum DRVDD current with CMOS interface depends on the actual load capacitance on the digital output lines. Note that the
maximum recommended load capacitance on each digital output line is 10pF.
In CMOS mode, the DRVDD current scales with the sampling frequency, the load capacitance on output pins, input frequency, and the
supply voltage (see the CMOS Interface Power Dissipation section in the Application Information).
Copyright © 2009–2012, Texas Instruments Incorporated
5
ADS41B29
ADS41B49
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
www.ti.com
DIGITAL CHARACTERISTICS
Typical values are at +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, and DRVDD = 1.8V, unless otherwise noted. Minimum and
maximum values are across the full temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8V, AVDD_BUF = 3.3V,
and DRVDD = 1.8V.
ADS41B29, ADS41B49
PARAMETER
TEST CONDITIONS
MIN
RESET, SCLK, SDATA, and
SEN support 1.8V and 3.3V
CMOS logic levels
1.3
OE only supports 1.8V CMOS
logic levels
1.3
TYP
MAX
UNIT
DIGITAL INPUTS (RESET, SCLK, SDATA, SEN, OE)
High-level input voltage
Low-level input voltage
High-level input voltage
Low-level input voltage
V
0.4
V
V
0.4
V
High-level input current: SDATA, SCLK (1)
VHIGH = 1.8V
10
µA
High-level input current: SEN (2)
VHIGH = 1.8V
0
µA
Low-level input current: SDATA, SCLK
VLOW = 0V
0
µA
Low-level input current: SEN
VLOW = 0V
–10
µA
DIGITAL OUTPUTS (CMOS INTERFACE: D0 TO D13, OVR_SDOUT)
High-level output voltage
DRVDD – 0.1
Low-level output voltage
DRVDD
V
0
0.1
V
DIGITAL OUTPUTS (LVDS INTERFACE: D0_D1_P/M to D12_D13_P/M, CLKOUTP/M)
High-level output voltage (3)
VODH
Standard swing LVDS
270
+350
430
mV
Low-level output voltage (3)
VODL
Standard swing LVDS
–430
–350
–270
mV
High-level output voltage (3)
VODH
Low swing LVDS
+200
Low-level output voltage (3)
VODL
Low swing LVDS
–200
Output common-mode voltage
VOCM
(1)
(2)
(3)
0.85
mV
mV
1.05
1.25
V
SDATA and SCLK have an internal 180kΩ pull-down resistor.
SEN has an internal 180kΩ pull-up resistor to AVDD.
With an external 100Ω termination.
THERMAL INFORMATION
THERMAL METRIC
ADS41B29,
ADS41B49
(1)
RGZ
UNITS
48 PINS
θJA
Junction-to-ambient thermal resistance
27.9
θJCtop
Junction-to-case (top) thermal resistance
15.1
θJB
Junction-to-board thermal resistance
5.4
ψJT
Junction-to-top characterization parameter
0.3
ψJB
Junction-to-board characterization parameter
5.4
θJCbot
Junction-to-case (bottom) thermal resistance
1.7
(1)
6
°C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
Submit Documentation Feedback
Copyright © 2009–2012, Texas Instruments Incorporated
Product Folder Link(s): ADS41B29 ADS41B49
ADS41B29
ADS41B49
www.ti.com
SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
PIN CONFIGURATION (LVDS MODE)
D8_D9_M
D6_D7_P
D6_D7_M
45
44
43
42
41
D2_D3_M
D8_D9_P
46
D2_D3_P
D10_D11_M
47
D4_D5_P
D10_D11_P
48
D4_D5_M
D12_D13_P
D12_D13_M
RGZ PACKAGE(1)
QFN-48
(TOP VIEW)
40
39
38
37
D0_D1_M
CLKOUTP
5
32
NC
DFS
6
31
NC
OE
7
30
RESET
AVDD
8
29
SCLK
AGND
9
28
SDATA
CLKP 10
27
SEN
CLKM 11
26
AVDD
AGND 12
25
AGND
13
14
15
16
17
18
19
20
21
22
23
24
AVDD
D0_D1_P
33
RESERVED
34
4
AVDD
3
CLKOUTM
AVDD_BUF
OVR_SDOUT
AVDD
DRVDD
AVDD
35
AGND
2
INM
DRVDD
AGND
DRGND
INP
36
VCM
1
AGND
DRGND
(1) The PowerPAD is connected to DRGND.
Figure 1. ADS41B49 LVDS Pinout
Copyright © 2009–2012, Texas Instruments Incorporated
Product Folder Link(s): ADS41B29 ADS41B49
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ADS41B29
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D10_D11_P
D10_D11_M
D8_D9_P
D8_D9_M
D6_D7_P
D6_D7_M
D4_D5_P
D4_D5_M
D2_D3_P
D2_D3_M
D0_D1_P
D0_D1_M
RGZ PACKAGE(2)
QFN-48
(TOP VIEW)
48
47
46
45
44
43
42
41
40
39
38
37
DRGND
1
36
DRGND
DRVDD
2
35
DRVDD
OVR_SDOUT
3
34
NC
CLKOUTM
4
33
NC
CLKOUTP
5
32
NC
DFS
6
31
NC
OE
7
30
RESET
AVDD
8
29
SCLK
AGND
15
16
17
18
19
20
21
22
23
24
AVDD
14
INP
13
RESERVED
AGND
AVDD
25
AVDD
AGND 12
AVDD_BUF
AVDD
AVDD
26
AGND
CLKM 11
AGND
SEN
INM
SDATA
27
AGND
28
VCM
9
CLKP 10
(2) The PowerPAD™ is connected to DRGND.
Figure 2. ADS41B29 LVDS Pinout
ADS41B49, ADS41B29 Pin Descriptions (LVDS Mode)
8
PIN NAME
PIN NUMBER
# OF
PINS
FUNCTION
AVDD
8, 18, 20, 22, 24, 26
6
I
1.8V analog power supply
AVDD_BUF
21
1
I
3.3V input buffer supply
AGND
9, 12, 14, 17, 19, 25
6
I
Analog ground
CLKP
10
1
I
Differential clock input, positive
CLKM
11
1
I
Differential clock input, negative
INP
15
1
I
Differential analog input, positive
INM
16
1
I
Differential analog input, negative
VCM
13
1
O
Outputs the common-mode voltage that can be used externally to bias the analog
input pins.
DESCRIPTION
RESET
30
1
I
Serial interface RESET input.
When using the serial interface mode, the internal registers must initialize through
hardware RESET by applying a high pulse on this pin or by using the software
reset option; refer to the Serial Interface section.
When RESET is tied high, the internal registers are reset to the default values. In
this condition, SDATA can be used as a control pin.
RESET has an internal 100kΩ pull-down resistor.
SCLK
29
1
I
This pin functions as a serial interface clock input when RESET is low. When
RESET is high, SCLK has no function and should be tied to ground. This pin has
an internal 180kΩ pull-down resistor
SDATA
28
1
I
This pin functions as a serial interface data input when RESET is low. When
RESET is high, SDATA functions as a STANDBY control pin (see Table 7). This
pin has an internal 180kΩ pull-down resistor.
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SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
ADS41B49, ADS41B29 Pin Descriptions (LVDS Mode) (continued)
PIN NAME
PIN NUMBER
# OF
PINS
FUNCTION
DESCRIPTION
SEN
27
1
I
This pin functions as a serial interface enable input when RESET is low. When
RESET is high, SEN has no function and should be tied to AVDD. This pin has an
internal 180kΩ pull-up resistor to AVDD.
OE
7
1
I
Output buffer enable input, active high; this pin has an internal 100kΩ pull-up
resistor to DRVDD.
DFS
6
1
I
Data format select input. This pin sets the DATA FORMAT (twos complement or
offset binary) and the LVDS/CMOS output interface type.
RESERVED
23
1
I
Digital control pin, reserved for future use
CLKOUTP
5
1
O
Differential output clock, true
CLKOUTM
4
1
O
Differential output clock, complement
D0_D1_P
Refer to Figure 1
1
O
Differential output data D0 and D1 multiplexed, true
D0_D1_M
Refer to Figure 1
1
O
Differential output data D0 and D1 multiplexed, complement
D2_D3_P
Refer to Figure 1
1
O
Differential output data D2 and D3 multiplexed, true
D2_D3_M
Refer to Figure 1
1
O
Differential output data D2 and D3 multiplexed, complement
D4_D5_P
Refer to Figure 1
1
O
Differential output data D4 and D5 multiplexed, true
D4_D5_M
Refer to Figure 1
1
O
Differential output data D4 and D5 multiplexed, complement
D6_D7_P
Refer to Figure 1
1
O
Differential output data D6 and D7 multiplexed, true
D6_D7_M
Refer to Figure 1
1
O
Differential output data D6 and D7 multiplexed, complement
D8_D9_P
Refer to Figure 1
1
O
Differential output data D8 and D9 multiplexed, true
D8_D9_M
Refer to Figure 1
1
O
Differential output data D8 and D9 multiplexed, complement
D10_D11_P
Refer to Figure 1
1
O
Differential output data D10 and D11 multiplexed, true
D10_D11_M
Refer to Figure 1
1
O
Differential output data D10 and D11 multiplexed, complement
D12_D13_P
Refer to Figure 1
1
O
Differential output data D12 and D13 multiplexed, true
D12_D13_M
Refer to Figure 1
1
O
Differential output data D12 and D13 multiplexed, complement
OVR_SDOUT
3
1
O
This pin functions as an out-of-range indicator after reset, when register bit
READOUT = 0, and functions as a serial register readout pin when
READOUT = 1. This pin is a 1.8V CMOS output pin (running off of DRVDD).
DRVDD
2, 35
2
I
1.8V digital and output buffer supply
DRGND
1, 36, PAD
2
I
Digital and output buffer ground
NC
Refer to Figure 1
—
—
Do not connect
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FUNCTIONAL BLOCK DIAGRAM
AVDD
AGND
DRVDD
DDR LVDS
Interface
DRGND
CLKP
CLKOUTP
CLOCKGEN
CLKOUTM
CLKM
D0_D1_P
D0_D1_M
D2_D3_P
AVDD_BUF
D2_D3_M
D4_D5_P
INP
Common
Digital Functions
14-Bit
ADC
Sampling
Circuit
DDR
Serializer
D4_D5_M
D6_D7_P
INM
D6_D7_M
D8_D9_P
Analog Buffers
D8_D9_M
Control
Interface
Reference
VCM
D10_D11_P
D10_D11_M
D12_D13_P
D12_D13_M
OVR_SDOUT
DFS
SEN
SDATA
SCLK
RESET
ADS41B49
OE
Figure 3. ADS41B49 Block Diagram
TIMING CHARACTERISTICS
Dn_Dn + 1_P
Logic 0
VODL
Logic 1
VODH
Dn_Dn + 1_M
VOCM
GND
(1) With external 100Ω termination.
Figure 4. LVDS Output Voltage Levels
10
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TIMING REQUIREMENTS: LVDS and CMOS Modes (1)
Typical values are at +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, sampling frequency = 250 MSPS, sine wave
input clock, CLOAD = 5pF (2), and RLOAD = 100Ω (3), unless otherwise noted. Minimum and maximum values are across the full
temperature range: TMIN = –40°C to TMAX = +85°C, AVDD = 1.8V, AVDD_BUF = 3.3V, and DRVDD = 1.7V to 1.9V.
PARAMETER
tA
CONDITIONS
Aperture delay
Variation of
aperture delay
tJ
MIN
TYP
MAX
UNIT
0.6
0.8
1.2
ns
Between two devices at
the same temperature and DRVDD supply
±100
Aperture jitter
ps
100
Wakeup time
fS rms
Time to valid data after coming out of STANDBY mode
5
25
Time to valid data after coming out of PDN GLOBAL mode
100
500
µs
µs
Gain enabled (default after reset)
21
Clock
cycles
Gain and offset correction enabled
22
Clock
cycles
ADC latency (4)
DDR LVDS MODE
Data setup time (5)
Data valid (6) to zero-crossing of CLKOUTP
0.75
1.1
ns
Zero-crossing of CLKOUTP to data becoming invalid (6)
0.35
0.6
ns
Clock propagation delay
Input clock rising edge cross-over to
output clock rising edge cross-over
1MSPS ≤ sampling frequency ≤ 250MSPS
3
4.2
Variation of tPDI
Between two devices at
the same temperature and DRVDD supply
LVDS bit
clock duty cycle
Duty cycle of differential clock, (CLKOUTP – CLKOUTM)
1MSPS ≤ sampling frequency ≤ 250MSPS
tRISE, tFALL
Data rise time,
Data fall time
Rise time measured from –100mV to +100mV
Fall time measured from +100mV to –100mV
1MSPS ≤ sampling frequency ≤ 250MSPS
0.14
ns
tCLKRISE,
tCLKFALL
Output clock rise time,
Output clock fall time
Rise time measured from –100mV to +100mV
Fall time measured from +100mV to –100mV
1MSPS ≤ sampling frequency ≤ 250MSPS
0.14
ns
tOE
Output enable (OE) to
data delay
Time to valid data after OE becomes active
50
tSU
tH
Data hold time
tPDI
(5)
5.4
±0.6
42
48
ns
ns
54
%
100
ns
1.6
ns
PARALLEL CMOS MODE (7)
tSTART
Input clock to data delay
tDV
Data valid time
tPDI
Input clock rising edge cross-over to start of data valid (6)
Time interval of valid data (6)
2.5
3.2
Clock propagation delay
Input clock rising edge cross-over to
output clock rising edge cross-over
1MSPS ≤ sampling frequency ≤ 200MSPS
4
5.5
Output clock duty cycle
Duty cycle of output clock, CLKOUT
1MSPS ≤ sampling frequency ≤ 200MSPS
47
%
ns
7
ns
tRISE, tFALL
Data rise time,
Data fall time
Rise time measured from 20% to 80% of DRVDD
Fall time measured from 80% to 20% of DRVDD
1 ≤ sampling frequency ≤ 250MSPS
0.35
ns
tCLKRISE,
tCLKFALL
Output clock rise time,
Output clock fall time
Rise time measured from 20% to 80% of DRVDD
Fall time measured from 80% to 20% of DRVDD
1 ≤ sampling frequency ≤ 200MSPS
0.35
ns
tOE
Output enable (OE) to
data delay
Time to valid data after OE becomes active
20
(1)
(2)
(3)
(4)
(5)
(6)
(7)
40
ns
Timing parameters are ensured by design and characterization but are not production tested.
CLOAD is the effective external single-ended load capacitance between each output pin and ground.
RLOAD is the differential load resistance between the LVDS output pair.
At higher frequencies, tPDI is greater than one clock period and overall latency = ADC latency + 1.
RLOAD is the differential load resistance between the LVDS output pair.
Data valid refers to a logic high of 1.26V and a logic low of 0.54V.
For fS > 200MSPS, it is recommended to use an external clock for data capture instead of the device output clock signal (CLKOUT).
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Table 1. LVDS Timing Across Sampling Frequencies
SAMPLING
FREQUENCY
(MSPS)
SETUP TIME (ns)
MIN
TYP
230
0.85
200
1.05
185
HOLD TIME (ns)
MAX
MIN
TYP
1.25
0.35
0.6
1.55
0.35
0.6
1.1
1.7
0.35
0.6
160
1.6
2.1
0.35
0.6
125
2.3
3
0.35
0.6
80
4.5
5.2
0.35
0.6
MAX
Table 2. CMOS Timing Across Sampling Frequencies
TIMING SPECIFIED WITH RESPECT TO OUTPUT CLOCK
SAMPLING
FREQUENCY
(MSPS)
MIN
TYP
200
1
185
160
tSETUP (ns)
tHOLD (ns)
MAX
MIN
TYP
1.6
2
1.3
2
1.8
2.5
125
2.5
80
4.8
tPDI (ns)
MAX
MIN
TYP
MAX
2.8
4
5.5
7
2.2
3
4
5.5
7
2.5
3.3
4
5.5
7
3.2
3.5
4.3
4
5.5
7
5.5
5.7
6.5
4
5.5
7
Table 3. CMOS Timing Across Sampling Frequencies
TIMING SPECIFIED WITH RESPECT TO INPUT CLOCK
SAMPLING FREQUENCY
(MSPS)
12
tSTART (ns)
MIN
MAX
MIN
TYP
250
1.6
2.5
3.2
230
1.1
2.9
3.5
200
0.3
3.5
4.2
185
0
3.9
4.5
170
–1.3
4.3
5
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TYP
tDV (ns)
MAX
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N+3
N+2
N+1
Sample N
N+4
N + 23
N + 22
N + 21
Input Signal
tA
CLKP
Input Clock
CLKM
CLKOUTM
CLKOUTP
tPDI
tH
21 Clock Cycles
DDR LVDS
(1)
tSU
(2)
Output Data
(DXP, DXM)
E
O
N - 21
E
O
N - 21
E
O
E
N - 19
O
N - 18
O
E
E
N - 17
O
O
E
E
O
N+1
N
E
O
E
O
N+2
tPDI
CLKOUT
tSU
Parallel CMOS
21 Clock Cycles
Output Data
N - 21
N - 20
N - 19
(1)
N - 18
tH
N-1
N
N+1
(1) At higher sampling frequencies, tDPI is greater than one clock cycle which then makes the overall latency = ADC latency + 1.
(2) E = Even bits (D0, D2, D4, etc). O = Odd bits (D1, D3, D5, etc).
Figure 5. Latency Diagram
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CLKM
Input
Clock
CLKP
tPDI
CLKOUTP
Output
Clock
CLKOUTM
tSU
Output Dn_Dn + 1_P
Data Pair Dn_Dn + 1_M
tSU
tH
Dn
(1)
tH
Dn + 1
(1)
(1) Dn = bits D0, D2, D4, etc. Dn + 1 = Bits D1, D3, D5, etc.
Figure 6. LVDS Mode Timing
CLKM
Input
Clock
CLKP
tPDI
Output
Clock
CLKOUT
tSU
Output
Data
Dn
tH
Dn
(1)
CLKM
Input
Clock
CLKP
tSTART
tDV
Output
Data
Dn
Dn
(1)
Dn = bits D0, D1, D2, etc.
Figure 7. CMOS Mode Timing
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DEVICE CONFIGURATION
The ADS41B29/49 have several modes that can be configured using a serial programming interface, as
described in Table 4, Table 5, and Table 6. In addition, the devices have two dedicated parallel pins for quickly
configuring commonly used functions. The parallel pins are DFS (analog 4-level control pin) and OE (digital
control pin). The analog control pins can be easily configured using a simple resistor divider (with 10% tolerance
resistors).
Table 4. DFS: Analog Control Pin
DESCRIPTION
(Data Format/Output Interface)
VOLTAGE APPLIED ON DFS
0, +100mV/0mV
Twos complement/DDR LVDS
(3/8) AVDD ± 100mV
Twos complement/parallel CMOS
(5/8) AVDD ± 100mV
Offset binary/parallel CMOS
AVDD, 0mV/–100mV
Offset binary/DDR LVDS
Table 5. OE: Digital Control Pin
VOLTAGE APPLIED ON OE
DESCRIPTION
0
Output data buffers disabled
AVDD
Output data buffers enabled
When the serial interface is not used, the SDATA pin can also be used as a digital control pin to place the device
in standby mode. To enable this, the RESET pin must be tied high. In this mode, SEN and SCLK do not have
any alternative functions. Keep SEN tied high and SCLK tied low on the board.
Table 6. SDATA: Digital Control Pin
VOLTAGE APPLIED ON SDATA
DESCRIPTION
0
Normal operation
Logic high
Device enters standby
AVDD
(5/8) AVDD
3R
(5/8) AVDD
GND
AVDD
2R
(3/8) AVDD
(3/8) AVDD
3R
To Parallel Pin
Figure 8. Simplified Diagram to Configure DFS Pin
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SERIAL INTERFACE
The analog-to-digital converter (ADC) has a set of internal registers that can be accessed by the serial interface
formed by the SEN (serial interface enable), SCLK (serial interface clock), and SDATA (serial interface data)
pins. Serial shift of bits into the device is enabled when SEN is low. Serial data SDATA are latched at every
falling edge of SCLK when SEN is active (low). The serial data are loaded into the register at every 16th SCLK
falling edge when SEN is low. In case the word length exceeds a multiple of 16 bits, the excess bits are ignored.
Data can be loaded in multiples of 16-bit words within a single active SEN pulse. The first eight bits form the
register address and the remaining eight bits are the register data. The interface can work with SCLK frequency
from 20MHz down to very low speeds (a few Hertz) and also with non-50% SCLK duty cycle.
Register Initialization
After power-up, the internal registers must be initialized to the default values. This initialization can be
accomplished in one of two ways:
1. Either through hardware reset by applying a high pulse on RESET pin (of width greater than 10ns), as shown
in Figure 9; or
2. By applying a software reset. When using the serial interface, set the RESET bit (D7 in register 0x00) high.
This setting initializes the internal registers to the default values and then self-resets the RESET bit low. In
this case, the RESET pin is kept low.
Register Address
SDATA
A7
A6
A5
A4
A3
Register Data
A2
A1
A0
D7
D6
D5
tSCLK
D4
tDSU
D3
D2
D1
D0
tDH
SCLK
tSLOADS
tSLOADH
SEN
RESET
Figure 9. Serial Interface Timing
SERIAL INTERFACE TIMING CHARACTERISTICS
Typical values at +25°C, minimum and maximum values across the full temperature range: TMIN = –40°C to TMAX = +85°C,
AVDD = 1.8V, and DRVDD = 1.8V, unless otherwise noted.
PARAMETER
MIN
TYP
UNIT
20
MHz
SCLK frequency (equal to 1/tSCLK)
tSLOADS
SEN to SCLK setup time
25
ns
tSLOADH
SCLK to SEN hold time
25
ns
tDSU
SDATA setup time
25
ns
tDH
SDATA hold time
25
ns
16
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MAX
fSCLK
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Serial Register Readout
The serial register readout function allows the contents of the internal registers to be read back on the
OVR_SDOUT pin. This readback may be useful as a diagnostic check to verify the serial interface
communication between the external controller and the ADC.
After power-up and device reset, the OVR_SDOUT pin functions as an over-range indicator pin by default. When
the readout mode is enabled, OVR_SDOUT outputs the contents of the selected register serially:
1. Set the READOUT register bit to '1'. This setting puts the device in serial readout mode and disables any
further writes to the internal registers except the register at address 0. Note that the READOUT bit itself is
also located in register 0. The device can exit readout mode by writing READOUT = 0. Only the contents of
the register at address 0 cannot be read in the register readout mode.
2. Initiate a serial interface cycle specifying the address of the register (A7 to A0) whose content has to be
read.
3. The device serially outputs the contents (D7 to D0) of the selected register on the OVR_SDOUT pin.
4. The external controller can latch the contents at the falling edge of SCLK.
5. To exit the serial readout mode, the reset register bit READOUT = 0 enables writes into all registers of the
device. At this point, the OVR_SDOUT pin becomes an over-range indicator pin.
Register Address A[7:0] = 00h
SDATA
0
0
0
0
0
0
Register Data D[7:0] = 01h
0
0
0
0
0
0
0
0
0
1
SCLK
SEN
OVR_SDOUT
(1)
a) Enable Serial Readout (READOUT = 1)
Register Address A[7:0] = 43h
SDATA
A7
A6
A5
A4
A3
A2
Register Data D[7:0] = XX (don’t care)
A1
A0
D7
D6
D5
D4
D3
D2
D1
D0
0
1
0
0
0
0
0
0
SCLK
SEN
OVR_SDOUT
(2)
b) Read Contents of Register 43h. This Register Has Been Initialized with 40h (device is put in global power-down mode).
(1) The OVR_SDOUT pin functions as OVR (READOUT = 0).
(2) The OVR_SDOUT pin functions as a serial readout (READOUT = 1).
Figure 10. Serial Readout Timing Diagram
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RESET TIMING CHARACTERISTICS
Power Supply
AVDD, DRVDD
t1
RESET
t3
t2
SEN
NOTE: A high pulse on the RESET pin is required in the serial interface mode in case of initialization through hardware reset. For parallel
interface operation, RESET must be permanently tied high.
Figure 11. Reset Timing Diagram
RESET TIMING REQUIREMENTS
Typical values at +25°C and minimum and maximum values across the full temperature range: TMIN = –40°C to TMAX = +85°C,
unless otherwise noted.
PARAMETER
t1
Power-on delay
t2
Reset pulse width
t3
(1)
18
TEST CONDITIONS
MIN
Delay from power-up of AVDD and DRVDD to RESET
pulse active
1
Pulse width of active RESET signal that resets the
serial registers
10
Delay from RESET disable to SEN active
100
TYP
MAX
UNIT
ms
ns
1 (1)
µs
ns
The reset pulse is needed only when using the serial interface configuration. If the pulse width is greater than 1µs, the device could
enter the parallel configuration mode briefly and then return back to serial interface mode.
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SERIAL REGISTER MAP
Table 7 summarizes the functions supported by the serial interface.
Table 7. Serial Interface Register Map (1)
(1)
REGISTER
ADDRESS
DEFAULT VALUE
AFTER RESET
A[7:0] (Hex)
D[7:0] (Hex)
D7
D6
D5
D4
D3
D2
D1
D0
00
00
0
0
0
0
0
0
RESET
READOUT
01
00
0
0
03
00
0
0
0
0
0
HIGH PERF MODE 1
25
50
26
00
0
3D
00
DATA FORMAT
3F
00
0
40
00
41
00
LVDS CMOS
42
08
CLKOUT FALL POSN
0
0
1
STBY
43
00
0
PDN
GLOBAL
0
PDN OBUF
0
0
4A
00
0
0
0
0
0
0
BF
00
REGISTER DATA
LVDS SWING
0
GAIN
0
0
TEST PATTERNS
0
0
0
0
EN
OFFSET
CORR
0
0
0
0
LVDS
LVDS DATA
CLKOUT
STRENGTH
STRENGTH
0
0
CUSTOM PATTERN D[13:8]
CUSTOM PATTERN D[7:0]
CMOS CLKOUT
STRENGTH
EN
CLKOUT
RISE
0
CF
00
DF
00
0
0
0
OFFSET CORR TIME CONSTANT
LOW SPEED
0
0
EN LVDS SWING
OFFSET PEDESTAL
FREEZE
OFFSET
CORR
EN
CLKOUT
FALL
CLKOUT RISE POSN
0
0
HIGH PERF
MODE 2
0
0
0
0
0
0
Multiple functions in a register can be programmed in a single write operation.
DESCRIPTION OF SERIAL REGISTERS
For best performance, two special mode register bits must be enabled:
HI PERF MODE 1 and HI PERF MODE 2.
Register Address 00h (Default = 00h)
7
6
5
4
3
2
1
0
0
0
0
0
0
0
RESET
READOUT
Bits[7:2]
Always write '0'
Bit 1
RESET: Software reset applied
This bit resets all internal registers to the default values and self-clears to 0 (default = 1).
Bit 0
READOUT: Serial readout
This bit sets the serial readout of the registers.
0 = Serial readout of registers disabled; the OVR_SDOUT pin functions as an over-voltage
indicator.
1 = Serial readout enabled; the OVR_SDOUT pin functions as a serial data readout.
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Register Address 01h (Default = 00h)
7
6
5
4
3
2
LVDS SWING
Bits[7:2]
(1)
0
0
0
0
LVDS SWING: LVDS swing programmability (1)
000000 =
011011 =
110010 =
010100 =
111110 =
001111 =
Bits[1:0]
1
Default LVDS swing; ±350mV with external 100Ω termination
LVDS swing increases to ±410mV
LVDS swing increases to ±465mV
LVDS swing increases to ±570mV
LVDS swing decreases to ±200mV
LVDS swing decreases to ±125mV
Always write '0'
The EN LVDS SWING register bits must be set to enable LVDS swing control.
Register Address 03h (Default = 00h)
7
6
5
4
3
2
1
0
0
0
0
0
0
HI PERF MODE 1
Bits[7:2]
Always write '0'
Bits[1:0]
HI PERF MODE 1: High performance mode 1
00 = Default performance after reset
01 = Do not use
10 = Do not use
11 = For best performance across sampling clock and input signal frequencies, set the HIGH PERF
MODE 1 bits
20
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Register Address 25h (Default = 50h)
7
6
5
4
GAIN
Bits[7:4]
3
0
2
1
0
TEST PATTERNS
GAIN: Gain programmability
These bits set the gain programmability in 0.5dB steps.
0000, 0001, 0010, 0011, 0100 = Do not use
0101 = 0dB gain (default after reset)
0110 = 0.5dB gain
0111 = 1dB gain
1000 = 1.5dB gain
1001 = 2dB gain
1010 = 2.5dB gain
1011 = 3dB gain
1100 = 3.5dB gain
Bit 3
Always write '0'
Bits[2:0]
TEST PATTERNS: Data capture
These bits verify data capture.
000 = Normal operation
001 = Outputs all 0s
010 = Outputs all 1s
011 = Outputs toggle pattern
In the ADS41B49, output data D[13:0] is an alternating sequence of 01010101010101 and
10101010101010.
In the ADS41B29, output data D[11:0] is an alternating sequence of 010101010101 and
101010101010.
100 = Outputs digital ramp
In ADS41B46, output data increments by one LSB (14-bit) every clock cycle from code 0 to
code 16383
In ADS41B26, output data increments by one LSB (12-bit) every 4th clock cycle from code 0 to
code 4095
101 = Output custom pattern (use registers 0x3F and 0x40 for setting the custom pattern)
110 = Unused
111 = Unused
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Register Address 26h (Default = 00h)
7
6
0
5
0
4
0
3
0
0
2
1
0
0
LVDS CLKOUT
STRENGTH
LVDS DATA
STRENGTH
Bits[7:2]
Always write '0'
Bit 1
LVDS CLKOUT STRENGTH: LVDS output clock buffer strength
This bit determines the external termination to be used with the LVDS output clock buffer.
0 = 100Ω external termination (default strength)
1 = 50Ω external termination (2x strength)
Bit 0
LVDS DATA STRENGTH: LVDS data buffer strength
This bit determines the external termination to be used with all of the LVDS data buffers.
0 = 100Ω external termination (default strength)
1 = 50Ω external termination (2x strength)
Register Address 3Dh (Default = 00h)
7
6
DATA FORMAT
Bits[7:6]
5
4
3
2
1
0
EN OFFSET
CORR
0
0
0
0
0
DATA FORMAT: Data format selection
These bits selects the data format.
00 = The DFS pin controls data format selection
10 = Twos complement
11 = Offset binary
Bit 5
ENABLE OFFSET CORR: Offset correction setting
This bit sets the offset correction.
0 = Offset correction disabled
1 = Offset correction enabled
Bits[4:0]
Always write '0'
Register Address 3Fh (Default = 00h)
7
0
6
5
4
3
2
1
0
0
CUSTOM
PATTERN D13
CUSTOM
PATTERN D12
CUSTOM
PATTERN D11
CUSTOM
PATTERN D10
CUSTOM
PATTERN D9
CUSTOM
PATTERN D8
Bits[7:6]
Always write '0'
Bits[5:0]
CUSTOM PATTERN (1)
These bits set the custom pattern.
(1)
22
For the ADS41B4x, output data bits 13 to 0 are CUSTOM PATTERN D[13:0]. For the ADS41B2x, output data bits 11 to 0 are CUSTOM
PATTERN D[13:2].
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Register Address 40h (Default = 00h)
7
6
5
4
3
2
1
0
CUSTOM
PATTERN D7
CUSTOM
PATTERN D6
CUSTOM
PATTERN D5
CUSTOM
PATTERN D4
CUSTOM
PATTERN D3
CUSTOM
PATTERN D2
CUSTOM
PATTERN D1
CUSTOM
PATTERN D0
Bits[7:0]
CUSTOM PATTERN (1)
These bits set the custom pattern.
(1)
For the ADS41B4x, output data bits 13 to 0 are CUSTOM PATTERN D[13:0]. For the ADS41B2x, output data bits 11 to 0 are CUSTOM
PATTERN D[13:2].
Register Address 41h (Default = 00h)
7
6
LVDS CMOS
Bits[7:6]
5
4
CMOS CLKOUT STRENGTH
3
EN CLKOUT
RISE
2
1
CLKOUT RISE POSN
0
EN CLKOUT
FALL
LVDS CMOS: Interface selection
These bits select the interface.
00, 10 = The DFS pin controls the selection of either LVDS or CMOS interface
01 = DDR LVDS interface
11 = Parallel CMOS interface
Bits[5:4]
CMOS CLKOUT STRENGTH
Controls strength of CMOS output clock only.
00 = Maximum strength (recommended and used for specified timings)
01 = Medium strength
10 = Low strength
11 = Very low strength
Bit 3
ENABLE CLKOUT RISE
0 = Disables control of output clock rising edge
1 = Enables control of output clock rising edge
Bits[2:1]
CLKOUT RISE POSN: CLKOUT rise control
Controls position of output clock rising edge
LVDS interface:
00 = Default position (timings are specified in this condition)
01 = Setup reduces by 500ps, hold increases by 500ps
10 = Data transition is aligned with rising edge
11 = Setup reduces by 200ps, hold increases by 200ps
CMOS interface:
00 = Default position (timings are specified in this condition)
01 = Setup reduces by 100ps, hold increases by 100ps
10 = Setup reduces by 200ps, hold increases by 200ps
11 = Setup reduces by 1.5ns, hold increases by 1.5ns
Bit 0
ENABLE CLKOUT FALL
0 = Disables control of output clock fall edge
1 = Enables control of output clock fall edge
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Register Address 42h (Default = 08h)
7
6
CLKOUT FALL POSN
Bits[7:6]
5
4
3
2
1
0
0
0
1
STBY
0
0
CLKOUT FALL POSN
Controls position of output clock falling edge
LVDS interface:
00 = Default position (timings are specified in this condition)
01 = Setup reduces by 400ps, hold increases by 400ps
10 = Data transition is aligned with rising edge
11 = Setup reduces by 200ps, hold increases by 200ps
CMOS interface:
00 = Default position (timings are specified in this condition)
01 = Falling edge is advanced by 100ps
10 = Falling edge is advanced by 200ps
11 = Falling edge is advanced by 1.5ns
Bits[5:4]
Always write '0'
Bit 3
Always write '1'
Bit 2
STBY: Standby mode
This bit sets the standby mode.
0 = Normal operation
1 = Only the ADC and output buffers are powered down; internal reference is active; wake-up time
from standby is fast
Bits[1:0]
24
Always write '0'
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Register Address 43h (Default = 00h)
7
6
5
4
3
2
1
0
PDN GLOBAL
0
PDN OBUF
0
0
EN LVDS SWING
Bit 0
Always write '0'
Bit 6
PDN GLOBAL: Power-down
0
This bit sets the state of operation.
0 = Normal operation
1 = Total power down; the ADC, internal references, and output buffers are powered down; slow
wake-up time.
Bit 5
Always write '0'
Bit 4
PDN OBUF: Power-down output buffer
This bit set the output data and clock pins.
0 = Output data and clock pins enabled
1 = Output data and clock pins powered down and put in high- impedance state
Bits[3:2]
Always write '0'
Bits[1:0]
EN LVDS SWING: LVDS swing control
00 = LVDS swing control using LVDS SWING register bits is disabled
01, 10 = Do not use
11 = LVDS swing control using LVDS SWING register bits is enabled
Register Address 4Ah (Default = 00h)
7
0
6
0
5
4
0
0
Bits[7:1]
Always write '0'
Bit[0]
HI PERF MODE 2: High performance mode 2
3
0
2
0
1
0
0
HI PERF
MODE 2
This bit is recommended for high input signal frequencies greater than 230MHz.
0 = Default performance after reset
1 = For best performance with high-frequency input signals, set the HIGH PERF MODE 2 bit
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Register Address BFh (Default = 00h)
7
6
5
4
3
2
OFFSET PEDESTAL
Bits[7:2]
1
0
0
0
OFFSET PEDESTAL
These bits set the offset pedestal.
When the offset correction is enabled, the final converged value after the offset is corrected is the
ADC mid-code value. A pedestal can be added to the final converged value by programming these
bits.
Bits[1:0]
26
ADS414x VALUE
PEDESTAL
011111
011110
011101
—
000000
—
111111
111110
—
100000
31LSB
30LSB
29LSB
—
0LSB
—
–1LSB
–2LSB
—
–32LSB
Always write '0'
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Register Address CFh (Default = 00h)
7
6
FREEZE
OFFSET
CORR
0
Bit 7
5
4
3
2
OFFSET CORR TIME CONSTANT
1
0
0
0
FREEZE OFFSET CORR
This bit sets the freeze offset correction.
0 = Estimation of offset correction is not frozen (bit EN OFFSET CORR must be set)
1 = Estimation of offset correction is frozen (bit EN OFFSET CORR must be set). When frozen, the
last estimated value is used for offset correction every clock cycle; see the OFFSET
CORRECTION section.
Bit 6
Always write '0'
Bits[5:2]
OFFSET CORR TIME CONSTANT
These bits set the offset correction time constant for the correction loop time constant in number of
clock cycles.
Bits[1:0]
VALUE
TIME CONSTANT (Number of Clock Cycles)
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1M
2M
4M
8M
16M
32M
64M
128M
256M
512M
1G
2G
Always write '0'
Register Address DFh (Default = 00h)
7
6
0
0
5
4
LOW SPEED
Bits[7:6]
Always write '0'
Bits[5:4]
LOW SPEED: Low-speed mode
3
2
1
0
0
0
0
0
00, 01, 10 = Low-speed mode disabled (default state after reset); this setting is recommended for
sampling rates greater than 80MSPS.
11 = Low-speed mode enabled; this setting is recommended for sampling rates less than or equal
to 80MSPS.
Bits[3:0]
Always write '0'
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ADS41B29
ADS41B49
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TYPICAL CHARACTERISTICS: ADS41B49
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
FFT FOR 20MHz INPUT SIGNAL
FFT FOR 170MHz INPUT SIGNAL
0
0
SFDR = 90.3dBc
SNR = 69.9dBFS
SINAD = 69.8dBFS
THD = 85.2dBc
−20
−20
−40
Amplitude (dB)
Amplitude (dB)
−40
−60
−60
−80
−80
−100
−100
−120
SFDR = 82.9dBc
SNR = 69.3dBFS
SINAD = 69dBFS
THD = 80.3dBc
0
25
50
75
100
−120
125
0
Figure 13.
100
125
FFT FOR TWO-TONE INPUT SIGNAL
0
SFDR = 70.7dBc
SNR = 68.4dBFS
SINAD = 66.3dBFS
THD = 69.3dBc
−20
Each Tone at
−7dBFS Amplitude
fIN1 = 185MHz
fIN2 = 190MHz
2−Tone IMD = 87.3dBFS
SFDR = 96.0dBFS
−20
−40
−40
Amplitude (dB)
Amplitude (dB)
75
Figure 12.
FFT FOR 300MHz INPUT SIGNAL
28
50
Frequency (MHz)
0
−60
−60
−80
−80
−100
−100
−120
25
Frequency (MHz)
0
25
50
75
100
125
−120
0
25
50
75
Frequency (MHz)
Frequency (MHz)
Figure 14.
Figure 15.
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100
125
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TYPICAL CHARACTERISTICS: ADS41B49 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
FFT FOR TWO-TONE INPUT SIGNAL
SFDR vs INPUT FREQUENCY
0
95
Each Tone at
−36dBFS Amplitude
fIN1 = 185MHz
fIN2 = 190MHz
2−Tone IMD = 89.7dBFS
SFDR = 106.4dBFS
−20
90
85
SFDR (dBc)
Amplitude (dB)
−40
−60
80
75
−80
70
−100
−120
65
0
25
50
75
100
60
125
0
50
100
150
Frequency (MHz)
200
250
300
350
400
Input Frequency (MHz)
Figure 16.
Figure 17.
SNR vs INPUT FREQUENCY
SFDR ACROSS GAIN AND INPUT FREQUENCY
70
96
150MHz
170MHz
220MHz
92
69.5
300MHz
400MHz
88
84
SFDR (dBc)
SNR (dBFS)
69
68.5
68
80
76
72
68
67.5
64
67
0
50
100
150
200
250
300
350
400
60
0
0.5
Input Frequency (MHz)
Figure 18.
1
1.5
2
2.5
3
3.5
Gain (dB)
Figure 19.
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ADS41B49
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TYPICAL CHARACTERISTICS: ADS41B49 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
PERFORMANCE ACROSS INPUT AMPLITUDE
(Single Tone)
150MHz
170MHz
220MHz
69
Input Frequency = 40MHz
300MHz
400MHz
SFDR(dBFS)
SFDR(dBc)
SNR
100
72.5
68
90
72
67
80
71.5
70
71
60
70.5
50
70
40
69.5
30
69
SFDR (dBc, dBFS)
SINAD (dBFS)
73
110
70
66
65
64
SNR (dBFS)
SINAD ACROSS GAIN AND INPUT FREQUENCY
63
62
61
60
20
−70
0
0.5
1
1.5
2
2.5
3
−60
−50
3.5
−40
−30
−20
−10
0
68.5
Amplitude (dBFS)
Gain (dB)
Figure 20.
Figure 21.
PERFORMANCE ACROSS INPUT AMPLITUDE
(Single Tone)
SFDR(dBFS)
SFDR(dBc)
SNR
110
71.5
80
71
70
70.5
60
70
50
69.5
40
69
30
68.5
−40
−30
Amplitude (dBFS)
−20
−10
0
68
SFDR (dBc)
SFDR (dBc, dBFS)
90
SNR (dBFS)
72
−50
88
69.5
84
69
80
68.5
76
68
72
67.5
68
1.5
1.55
1.6
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1.65
1.7
1.75
1.8
1.85
1.9
67
1.95
Input Common−Mode Voltage (V)
Figure 22.
30
SFDR
SNR
72.5
100
−60
70
Input Frequency = 170MHz
SNR (dBFS)
Input Frequency = 170MHz
20
−70
PERFORMANCE vs INPUT COMMON-MODE VOLTAGE
92
73
120
Figure 23.
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TYPICAL CHARACTERISTICS: ADS41B49 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
SFDR ACROSS TEMPERATURE vs AVDD SUPPLY
SNR ACROSS TEMPERATURE vs AVDD SUPPLY
69.6
90
Input Frequency = 170MHz
−40
−25
25
88
55
85
Input Frequency = 170MHz
−40
−25
25
1.75
1.85
69.2
55
85
86
SNR (dBFS)
SFDR (dBc)
68.8
84
82
68.4
68
80
67.6
78
1.75
1.8
1.85
67.2
1.7
1.9
AVDD Supply (V)
Figure 24.
Figure 25.
PERFORMANCE ACROSS DRVDD SUPPLY VOLTAGE
Input Frequency = 170MHz
67.8
67.4
84
1.7
1.75
1.8
1.85
1.9
DRVDD Supply (V)
67
1.95
SFDR (dBc)
68.2
86
SFDR
SNR
93
68.6
88
71
Input Frequency = 170MHz
SNR (dBFS)
SFDR (dBc)
PERFORMANCE ACROSS INPUT CLOCK AMPLITUDE
SNR
SFDR
90
1.9
95
69
92
82
1.65
1.8
AVDD Supply (V)
70
91
69
89
68
87
67
85
66
83
65
81
64
79
63
77
62
75
61
73
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
2.5
2.8
3.1
SNR (dBFS)
76
1.7
60
3.4
Differential Clock Amplitude (VPP)
Figure 26.
Figure 27.
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TYPICAL CHARACTERISTICS: ADS41B49 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
PERFORMANCE ACROSS INPUT CLOCK DUTY CYCLE
INTEGRAL NONLINEARITY
71
92
Input Frequency = 10MHz
2.5
THD
SNR
2
1.5
70.5
88
INL (LSB)
70
84
SNR (dBFS)
THD (dBc)
1
0.5
0
−0.5
69.5
80
−1
−1.5
−2
76
35
40
45
50
55
Input Clock Duty Cycle (%)
60
65
69
−2.5
0
2048
Figure 28.
32
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4096
6144 8192 10240 12288 14336 16384
Output Code (LSB)
Figure 29.
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TYPICAL CHARACTERISTICS: ADS41B29
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
FFT FOR 20MHz INPUT SIGNAL
FFT FOR 170MHz INPUT SIGNAL
0
0
SFDR = 89.6dBc
SNR = 68.6dBFS
SINAD = 68.5dBFS
THD = 85.2dBc
−20
−20
−40
Amplitude (dB)
Amplitude (dB)
−40
−60
−60
−80
−80
−100
−100
−120
SFDR = 82.3dBc
SNR = 68.1dBFS
SINAD = 67.8dBFS
THD = 79.9dBc
0
25
50
75
100
−120
125
0
75
Figure 30.
Figure 31.
FFT FOR 300MHz INPUT SIGNAL
100
125
FFT FOR TWO-TONE INPUT SIGNAL
0
SFDR = 70.8dBc
SNR = 67.4dBFS
SINAD = 65.7dBFS
THD = 69.4dBc
−20
Each Tone at
−7dBFS Amplitude
fIN1 = 185MHz
fIN2 = 190MHz
2−Tone IMD = 87.3dBFS
SFDR = 85.9 dBFS
−20
−40
−40
Amplitude (dB)
Amplitude (dB)
50
Frequency (MHz)
0
−60
−60
−80
−80
−100
−100
−120
25
Frequency (MHz)
0
25
50
75
100
125
−120
0
25
50
75
Frequency (MHz)
Frequency (MHz)
Figure 32.
Figure 33.
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100
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125
33
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TYPICAL CHARACTERISTICS: ADS41B29 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
FFT FOR TWO-TONE INPUT SIGNAL
SFDR vs INPUT FREQUENCY
0
95
Each Tone at
−36dBFS Amplitude
fIN1 = 185MHz
fIN2 = 190MHz
2−Tone IMD = 89.8dBFS
SFDR = 98.5dBFS
−20
90
85
SFDR (dBc)
Amplitude (dB)
−40
−60
80
75
−80
70
−100
−120
65
0
25
50
75
100
60
125
0
50
100
Frequency (MHz)
150
200
250
300
350
400
Input Frequency (MHz)
Figure 34.
Figure 35.
SNR vs INPUT FREQUENCY
SFDR ACROSS GAIN AND INPUT FREQUENCY
69
96
150MHz
170MHz
220MHz
92
68.5
300MHz
400MHz
88
84
SFDR (dBc)
SNR (dBFS)
68
67.5
67
80
76
72
68
66.5
64
66
0
50
100
150
200
250
300
350
400
60
0
0.5
Input Frequency (MHz)
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1.5
2
2.5
3
3.5
Gain (dB)
Figure 36.
34
1
Figure 37.
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ADS41B29
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SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
TYPICAL CHARACTERISTICS: ADS41B29 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
PERFORMANCE ACROSS INPUT AMPLITUDE
(Single Tone)
150MHz
170MHz
220MHz
68
Input Frequency = 170MHz
300MHz
400MHz
SFDR(dBFS)
SFDR(dBc)
SNR
110
71
70.5
100
67
90
70
80
69.5
70
69
60
68.5
63
50
68
62
40
67.5
30
67
SFDR (dBc, dBFS)
66
SINAD (dBFS)
71.5
120
69
65
64
SNR (dBFS)
SINAD ACROSS GAIN AND INPUT FREQUENCY
61
60
20
−70
0
0.5
1
1.5
2
2.5
3
−60
−50
3.5
−40
−30
−20
−10
0
66.5
Amplitude (dBFS)
Gain (dB)
Figure 38.
Figure 39.
PERFORMANCE ACROSS INPUT AMPLITUDE
(Single Tone)
SFDR(dBFS)
SFDR(dBc)
SNR
110
71
80
70.5
70
70
60
69.5
50
69
40
68.5
30
68
−40
−30
−20
Amplitude (dBFS)
−10
0
67.5
SFDR (dBc)
SFDR (dBc, dBFS)
90
SNR (dBFS)
71.5
−50
SFDR
SNR
72
100
−60
69
Input Frequency = 170MHz
88
68.5
84
68
80
67.5
76
67
72
66.5
68
1.5
1.55
1.6
1.65
1.7
1.75
1.8
1.85
1.9
SNR (dBFS)
Input Frequency = 40MHz
20
−70
PERFORMANCE vs INPUT COMMON-MODE VOLTAGE
92
72.5
120
66
1.95
Input Common−Mode Voltage (V)
Figure 40.
Figure 41.
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TYPICAL CHARACTERISTICS: ADS41B29 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
SFDR ACROSS TEMPERATURE vs AVDD SUPPLY
SNR ACROSS TEMPERATURE vs AVDD SUPPLY
68.6
90
Input Frequency = 170MHz
−40
−25
25
88
55
85
Input Frequency = 170MHz
−40
−25
25
1.75
1.85
68.2
55
85
86
SNR (dBFS)
SFDR (dBc)
67.8
84
82
67.4
67
80
66.6
78
1.75
1.8
1.85
66.2
1.7
1.9
AVDD Supply (V)
Figure 42.
Figure 43.
PERFORMANCE ACROSS DRVDD SUPPLY VOLTAGE
SNR
SFDR
Input Frequency = 170MHz
68.3
66.7
84
66.3
82
65.9
1.75
1.8
DRVDD Supply (V)
1.85
65.5
1.9
SFDR (dBc)
67.1
SNR (dBFS)
67.5
86
69
90
68
88
67
86
66
84
65
82
64
80
63
78
62
76
61
74
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
2.5
2.8
3.1
60
3.4
Differential Clock Amplitude (VPP)
Figure 44.
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SFDR
SNR
92
67.9
88
SFDR (dBc)
70
94
Input Frequency = 170MHz
36
1.9
PERFORMANCE ACROSS INPUT CLOCK AMPLITUDE
90
80
1.7
1.8
AVDD Supply (V)
SNR (dBFS)
76
1.7
Figure 45.
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TYPICAL CHARACTERISTICS: ADS41B29 (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
PERFORMANCE ACROSS INPUT CLOCK DUTY CYCLE
69
95
THD
SNR
90
68.5
85
68
80
67.5
75
35
40
45
50
55
60
65
SNR (dBFS)
THD (dBc)
Input Frequency = 10MHz
67
Input Clock Duty Cycle (%)
Figure 46.
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TYPICAL CHARACTERISTICS: GENERAL
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
CMRR ACROSS FREQUENCY
CMRR FFT
0
0
fIN = 170MHz
fCM = 10MHz, 50mVPP
SFDR = 77.69dB
Amplitude (fIN) = -1dBFS
Amplitude (fCM) = -93.8
Amplitude (fIN + fCM) = -78.8
Amplitude (fIN - fCM) = -81
−10
-20
−20
-40
Amplitude (dB)
CMRR (dB)
Input Frequency = 170MHz
50mVPP Signal Superimposed
on Input Common−Mode Voltage (1.7V)
−30
-60
-80
−50
-100
0
50
100
150
200
250
fIN + fCM =
180MHz
fCM = 10MHz
−40
−60
fIN - fCM =
160MHz
-120
300
0
25
50
Frequency of Input Common−Mode Signal (MHz)
75
100
125
Frequency (MHz)
Figure 47.
Figure 48.
PSRR ACROSS FREQUENCY
PSRR FFT
0
0
fIN = 10MHz
fPSRR = 1MHz, 50mVPP
Amplitude (fIN) = -1dBFS
Amplitude (fPSRR) = -65.6
Amplitude (fIN + fPSRR) = -67.5
Amplitude (fIN - fPSRR) = -68.3
PSRR on AVDD Supply 50mVPP
PSRR on AVDD 3V Supply 100mVPP
−10
-20
−20
-40
Amplitude (dB)
−30
PSRR (dB)
fIN = 170MHz
−40
−50
fIN
-60
fIN - fPSRR
fIN + fPSRR
-80
−60
fPSRR
-100
−70
−80
0
10
20
30
40
50
60
70
80
90
100
-120
0
5
10
Frequency of Signal on Supply (MHz)
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20
25
30
35
40
45
50
Frequency (MHz)
Figure 49.
38
15
Figure 50.
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TYPICAL CHARACTERISTICS: GENERAL (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
POWER ACROSS SAMPLING FREQUENCY
DRVDD CURRENT ACROSS SAMPLING FREQUENCY
290
80
Analog Power
DRVDD Power
270
250
70
230
DRVDD Current (mA)
Power (mW)
210
190
170
150
130
60
50
40
110
90
30
70
50
0
25
50
75
100
125
150
175
200
225
250
20
0
25
50
Sampling Speed (MSPS)
Figure 51.
75
100
125
150
175
200
225
250
Sampling Speed (MSPS)
Figure 52.
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TYPICAL CHARACTERISTICS: CONTOUR
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
SFDR CONTOUR
(0dB Gain, Applies to ADS41B29/B49)
250
240
83
86
76
Sampling Frequency (MSPS)
220
86
60
64
68
72
80
200
83
180
89
160
76
80
86
89
140
60
64
68
72
83
120
89
100
89
86
83
80
65
20
50
100
80
150
200
76
250
72
300
64
68
350
60
400
450
500
Input Frequency (MHz)
65
60
70
75
80
85
SFDR (dBc)
Figure 53.
SFDR CONTOUR
(3.5dB Gain, Applies to ADS41B29/B49)
250
240
Sampling Frequency (MSPS)
80
83
86
220
76
64
72
68
86
200
180
160
86
140
86
83
86
83 80
80
89
120
76
72
68
89
100
89
80
76
72
68
64
65
20
50
100
150
200
250
300
350
400
450
500
Input Frequency (MHz)
65
70
75
80
85
SFDR (dBc)
Figure 54.
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TYPICAL CHARACTERISTICS: CONTOUR (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
SNR CONTOUR
(0dB Gain, Applies to ADS41B49)
250
240
69
Sampling Frequency (MSPS)
220
68
69.5
200
67
69
180
160
69.5
70
68
140
67
120
69
66
100
80
69.5
70
20
50
100
150
67
68
69
65
200
250
65
66
300
350
400
64
450
500
Input Frequency (MHz)
64
65
66
67
68
69
70
SNR (dBFS)
Figure 55.
SNR CONTOUR
(3.5dB Gain, Applies to ADS41B49)
250
240
Sampling Frequency (MSPS)
220
66.5
200
66
180
65
160
66.5
140
66
120
65
100
80
66.5
67
20
50
100
150
200
64
65
66
65
250
300
350
400
63
450
500
Input Frequency (MHz)
62.5
63
63.5
64
64.5
65
65.5
66
66.5
67
SNR (dBFS)
Figure 56.
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TYPICAL CHARACTERISTICS: CONTOUR (continued)
At +25°C, AVDD = 1.8V, AVDD_BUF = 3.3V, DRVDD = 1.8V, maximum rated sampling frequency, sine wave input clock,
1.5VPP differential clock amplitude, 50% clock duty cycle, –1dBFS differential analog input, DDR LVDS output interface, and
32k-point FFT, unless otherwise noted.
SNR CONTOUR
(0dB Gain, Applies to ADS41B29)
250
240
Sampling Frequency (MSPS)
220
67
68.5
68
200
67.5
66
180
160
68
68.5
67
140
67.5
66
120
100
68
80
65
20
50
100
150
200
65
67
67.5
250
64
66
300
350
400
450
500
Input Frequency (MHz)
63
63.5
64
64.5
65
65.5
66
66.5
67
67.5
68.5
68
SNR (dBFS)
Figure 57.
SNR CONTOUR
(0dB Gain, Applies to ADS41B29)
250
240
65
Sampling Frequency (MSPS)
220
66
200
65.5
66
65
180
160
66
140
65.5
120
65
100
80
66
65.5
64
65
63
65
20
50
100
150
200
250
300
350
400
450
500
Input Frequency (MHz)
62.5
63
63.5
64
64.5
65
65.5
66
SNR (dBFS)
Figure 58.
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APPLICATION INFORMATION
THEORY OF OPERATION
The ADS41B49/29 is a family of buffered analog input and ultralow power ADCs with maximum sampling rates
up to 250MSPS. The conversion process is initiated by a rising edge of the external input clock and the analog
input signal is sampled. The sampled signal is sequentially converted by a series of small resolution stages, with
the outputs combined in a digital correction logic block. At every clock edge the sample propagates through the
pipeline, resulting in a data latency of 21 clock cycles. The output is available as 14-bit data or 12-bit data, in
DDR LVDS mode or CMOS mode, and coded in either straight offset binary or binary twos complement format.
ANALOG INPUT
The analog input pins have analog buffers (running off the AVDD_BUF supply) that internally drive the differential
sampling circuit. As a result of the analog buffer, the input pins present high input impedance to the external
driving source (10kΩ dc resistance and 3.5pF input capacitance). The buffer helps to isolate the external driving
source from the switching currents of the sampling circuit. This buffering makes it easy to drive the buffered
inputs compared to an ADC without the buffer.
The input common-mode is set internally using a 5kΩ resistor from each input pin to 1.7V, so the input signal can
be ac-coupled to the pins. Each input pin (INP, INM) must swing symmetrically between (VCM + 0.375V) and
(VCM – 0.375V), resulting in a 1.5VPP differential input swing.
The input sampling circuit has a high 3dB bandwidth that extends up to 800MHz (measured from the input pins
to the sampled voltage). Figure 59 shows an equivalent circuit for the analog input.
LPKG
1nH
INP
RROUTING
23W
CPAD
2.5pF
CPIN
0.5pF
Buffer
RBIAS
5kW
RPAD
200W
(2)
VCM = 1.7V
LPKG
1nH
INM
CPIN
0.5pF
(1)
CEQ
RROUTING
23W
Sampling
Circuit
REQ
RBIAS
5kW
CPAD
2.5pF
RPAD
200W
CEQ
Buffer
REQ
(1) CEQ refers to the equivalent input capacitance of the buffer = 4pF.
(2) REQ refers to the REQ buffer = 10Ω.
(3) This equivalent circuit is an approximation and valid for frequencies less than 700MHz.
Figure 59. Analog Input Equivalent Circuit
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Drive Circuit Requirements
For optimum performance, the analog inputs must be driven differentially. This technique improves the commonmode noise immunity and even-order harmonic rejection. A small resistor (5Ω to 10Ω) in series with each input
pin is recommended to damp out ringing caused by package parasitics.
Figure 60 and Figure 61 show the differential impedance (ZIN = RIN || CIN) seen by looking into the ADC input
pins. The presence of the analog input buffer results in an almost constant input capacitance up to 1GHz.
10
RIN (kW)
1
0.1
RIN Simulation
RIN Measurement
0.01
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
Figure 60. ADC Analog Input Resistance (RIN) Across Frequency
5
CIN (pF)
4
3
2
1
CIN Simulation
CIN Measurement
0
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
Frequency (GHz)
Figure 61. ADC Analog Input Capacitance (CIN) Across Frequency
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Driving Circuit
Two example driving circuit configurations are shown in Figure 62 and Figure 63—one optimized for low input
frequencies and the other optimized for high input frequencies. Notice in both cases that the board circuitry is
simplified compared to the non-buffered ADS4149.
In Figure 62, a single transformer is used and is suited for low input frequencies. To optimize even-harmonic
performance at high input frequencies (greater than the first Nyquist), the use of back-to-back transformers is
recommended (see Figure 63). Note that both drive circuits have been terminated by 50Ω near the ADC side.
The ac-coupling capacitors allow the analog inputs to self-bias around the required common-mode voltage.
5W
T1
INP
0.1mF
25W
0.1mF
25W
INM
1:1
5W
Figure 62. Drive Circuit for Low Input Frequencies
5W
T2
T1
INP
0.1mF
50W
0.1mF
50W
50W
50W
INM
1:1
1:1
5W
Figure 63. Drive Circuit for High Input Frequencies
The mismatch in the transformer parasitic capacitance (between the windings) results in degraded even-order
harmonic performance. Connecting two identical RF transformers back-to-back helps minimize this mismatch and
good performance is obtained for high-frequency input signals. An additional termination resistor pair may be
required between the two transformers, as shown in Figure 62 and Figure 63. The center point of this termination
is connected to ground to improve the balance between the P (positive) and M (negative) sides. The values of
the terminations between the transformers and on the secondary side must be chosen to obtain an effective 50Ω
(for a 50Ω source impedance).
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CLOCK INPUT
The ADS41B29/49 clock inputs can be driven differentially (sine, LVPECL, or LVDS) or single-ended (LVCMOS),
with little or no difference in performance between them. The common-mode voltage of the clock inputs is set to
VCM using internal 5kΩ resistors. This setting allows the use of transformer-coupled drive circuits for sine-wave
clock or ac-coupling for LVPECL and LVDS clock sources. Figure 64 shows an equivalent circuit for the input
clock.
Clock Buffer
LPKG
1nH
20W
CLKP
CBOND
1pF
RESR
100W
5kW
2pF
LPKG
1nH
20W
CEQ
CEQ
0.95V
5kW
CLKM
CBOND
1pF
RESR
100W
NOTE: CEQ is 1pF to 3pF and is the equivalent input capacitance of the clock buffer.
Figure 64. Input Clock Equivalent Circuit
A single-ended CMOS clock can be ac-coupled to the CLKP input, with CLKM connected to ground with a 0.1μF
capacitor, as shown in Figure 65. For best performance, the clock inputs must be driven differentially, reducing
susceptibility to common-mode noise. For high input frequency sampling, it is recommended to use a clock
source with very low jitter. Band-pass filtering of the clock source can help reduce the effects of jitter. There is no
change in performance with a non-50% duty cycle clock input. Figure 66 shows a differential circuit.
CMOS
Clock Input
0.1mF
0.1mF
CLKP
CLKP
Differential Sine-Wave,
PECL, or LVDS
Clock Input
VCM
0.1mF
0.1mF
CLKM
CLKM
Figure 65. Single-Ended Clock Driving Circuit
46
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Figure 66. Differential Clock Driving Circuit
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GAIN FOR SFDR/SNR TRADE-OFF
The ADS41B29/49 include gain settings that can be used to get improved SFDR performance. The gain is
programmable from 0dB to 3.5dB (in 0.5dB steps) using the GAIN register bits. For each gain setting, the analog
input full-scale range scales proportionally, as shown in Table 8.
The SFDR improvement is achieved at the expense of SNR; for each gain setting, the SNR degrades
approximately between 0.5dB and 1dB. The SNR degradation is reduced at high input frequencies. As a result,
the gain is very useful at high input frequencies because the SFDR improvement is significant with marginal
degradation in SNR. Therefore, the gain can be used to trade-off between SFDR and SNR.
After a reset, the gain is enabled with 0dB gain setting. For other gain settings, program the GAIN register bits.
Table 8. Full-Scale Range Across Gains
GAIN (dB)
TYPE
FULL-SCALE (VPP)
0
Default after reset
1.5
0.5
Programmable gain
1.41
1
Programmable gain
1.33
1.5
Programmable gain
1.26
2
Programmable gain
1.19
2.5
Programmable gain
1.12
3
Programmable gain
1.06
3.5
Programmable gain
1
OFFSET CORRECTION
The ADS41B29/49 has an internal offset corretion algorithm that estimates and corrects dc offset up to ±10mV.
The correction can be enabled using the EN OFFSET CORR serial register bit. Once enabled, the algorithm
estimates the channel offset and applies the correction every clock cycle. The time constant of the correction
loop is a function of the sampling clock frequency. The time constant can be controlled using the OFFSET CORR
TIME CONSTANT register bits, as described in Table 9.
Table 9. Time Constant of Offset Correction Loop
(1)
OFFSET CORR TIME CONSTANT
TIME CONSTANT, TCCLK
(Number of Clock Cycles)
TIME CONSTANT, TCCLK × 1/fS (sec) (1)
0000
1M
4ms
0001
2M
8ms
0010
4M
16.7ms
0011
8M
33.5ms
0100
16M
67ms
0101
32M
134ms
0110
64M
268ms
0111
128M
537ms
1000
256M
1.1s
1001
512M
2.15s
1010
1G
4.3s
1011
2G
8.6s
1100
Reserved
—
1101
Reserved
—
1110
Reserved
—
1111
Reserved
—
Sampling frequency, fS = 250MSPS.
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After the offset is estimated, the correction can be frozen by setting FREEZE OFFSET CORR = 1. Once frozen,
the last estimated value is used for the offset correction of every clock cycle. Note that offset correction is
disabled by a default after reset.
After a reset, the offset correction is disabled.. To use offset correction set EN OFFSET CORR to '1' and
program the required time constant. Figure 67 shows the time response of the offset correction algorithm after it
is enabled.
Output Code (LSB)
OFFSET CORRECTION
Time Response
8200
8190
8180
8170
8160
8150
8140
8130
8120
8110
8100
8090
8080
8070
8060
8050
8181
Offset of
10 LSBs
8192
Final converged value
Offset correction
converges to output
code of 8192
Offset correction
begins
-5
5
15
25
35
45
55
65
75
85
95
105
Time (ms)
Figure 67. Time Response of Offset Correction
POWER DOWN
The ADS41B29/49 has three power-down modes: power-down global, standby, and output buffer disable.
Power-Down Global
In this mode, the entire chip (including the ADC, internal reference, and the output buffers) is powered down,
resulting in reduced total power dissipation of about 7mW. The output buffers are in a high-impedance state. The
wake-up time from the global power-down to data becoming valid in normal mode is typically 100µs. To enter the
global power-down mode, set the PDN GLOBAL register bit.
Standby
In this mode, only the ADC is powered down and the internal references are active, resulting in a fast wake-up
time of 5µs. The total power dissipation in standby mode is approximately 200mW. To enter the standby mode,
set the STBY register bit.
Output Buffer Disable
The output buffers can be disabled and put in a high-impedance state; wakeup time from this mode is fast,
approximately 100ns. This can be controlled using the PDN OBUF register bit or using the OE pin.
Input Clock Stop
In addition, the converter enters a low-power mode when the input clock frequency falls below 1MSPS. The
power dissipation is approximately 92mW.
POWER-SUPPLY SEQUENCE
During power-up, the AVDD, AVDD_BUF, and DRVDD supplies can come up in any sequence. These supplies
are separated in the device. Externally, they can be driven from separate supplies or from a single supply.
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DIGITAL OUTPUT INFORMATION
The ADS41B29/49 provide either 14-bit data or 12-bit data, respectively, and an output clock synchronized with
the data.
Output Interface
Two output interface options are available: double data rate (DDR) LVDS and parallel CMOS. They can be
selected using the LVDS CMOS serial interface register bit or using the DFS pin.
DDR LVDS Outputs
In this mode, the data bits and clock are output using low voltage differential signal (LVDS) levels. Two data bits
are multiplexed and output on each LVDS differential pair, as shown in Figure 68 and Figure 69.
Pins
Pins
CLKOUTP
Output Clock
CLKOUTP
CLKOUTM
Output Clock
CLKOUTM
D0_D1_P
Data Bits D0, D1
D0_D1_P
Data Bits D0, D1
LVDS Buffers
LVDS Buffers
D0_D1_M
D2_D3_P
Data Bits D2, D3
D2_D3_M
D0_D1_M
D2_D3_P
Data Bits D2, D3
D2_D3_M
D4_D5_P
12-Bit
ADC Data
Data Bits D4, D5
D4_D5_M
D4_D5_P
14-Bit
ADC Data
Data Bits D4, D5
D4_D5_M
D6_D7_P
Data Bits D6, D7
D6_D7_P
Data Bits D6, D7
D6_D7_M
D6_D7_M
D8_D9_P
Data Bits D8, D9
D8_D9_P
Data Bits D8, D9
D8_D9_M
D8_D9_M
D10_D11_P
D10_D11_P
Data Bits D10, D11
Data Bits D10, D11
D10_D11_M
D10_D11_M
ADS41B29
D12_D13_P
Data Bits D12, D13
Figure 68. ADS41B29 LVDS Data Outputs
D12_D13_M
ADS41B49
Figure 69. ADS41B49 LVDS Data Outputs
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Even data bits (D0, D2, D4, etc.) are output at the falling edge of CLKOUTP and the odd data bits (D1, D3, D5,
etc.) are output at the rising edge of CLKOUTP. Both the rising and falling edges of CLKOUTP must be used to
capture all 14 data bits, as shown in Figure 70.
CLKOUTP
CLKOUTM
D0_D1_P,
D0_D1_M
D0
D1
D0
D1
D2_D3_P,
D2_D3_M
D2
D3
D2
D3
D4_D5_P,
D4_D5_M
D4
D5
D4
D5
D6_D7_P,
D6_D7_M
D6
D7
D6
D7
D8_D9_P,
D8_D9_M
D8
D9
D8
D9
D10_D11_P,
D10_D11_M
D10
D11
D10
D11
D12_D13_P,
D12_D13_M
D12
D13
D12
D13
Sample N
Sample N + 1
Figure 70. DDR LVDS Interface
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LVDS Output Data and Clock Buffers
The equivalent circuit of each LVDS output buffer is shown in Figure 71. After reset, the buffer presents an
output impedance of 100Ω to match with the external 100Ω termination.
The VDIFF voltage is nominally 350mV, resulting in an output swing of ±350mV with 100Ω external termination.
The VDIFF voltage is programmable using the LVDS SWING register bits from ±125mV to ±570mV.
Additionally, a mode exists to double the strength of the LVDS buffer to support 50Ω differential termination. This
mode can be used when the output LVDS signal is routed to two separate receiver chips, each using a 100Ω
termination. The mode can be enabled using the LVDS DATA STRENGTH and LVDS CLKOUT STRENGTH
register bits for data and output clock buffers, respectively.
The buffer output impedance behaves in the same way as a source-side series termination. By absorbing
reflections from the receiver end, it helps to improve signal integrity.
VDIFF
High
Low
OUTP
External
100W Load
OUTM
1.1V
ROUT
VDIFF
Low
High
NOTE: Use the default buffer strength to match 100Ω external termination (ROUT = 100Ω). To match with a 50Ω external termination, set the
LVDS STRENGTH bit (ROUT = 50Ω).
Figure 71. LVDS Buffer Equivalent Circuit
Parallel CMOS Interface
In CMOS mode, each data bit is output on a separate pin as the CMOS voltage level, for every clock cycle. The
rising edge of the output clock CLKOUT can be used to latch data in the receiver. Figure 72 depicts the CMOS
output interface.
Switching noise (caused by CMOS output data transitions) can couple into the analog inputs and degrade SNR.
The coupling and SNR degradation increases as the output buffer drive is made stronger. To minimize this
degradation, the CMOS output buffers are designed with controlled drive strength. The default drive strength
ensures a wide data stable window (even at 250MSPS) is provided so the data outputs have minimal load
capacitance. It is recommended to use short traces (one to two inches or 2,54cm to 5,08cm) terminated with less
than 5pF load capacitance, as shown in Figure 73.
For sampling frequencies greater than 200MSPS, it is recommended to use an external clock to capture data.
The delay from input clock to output data and the data valid times are specified for higher sampling frequencies.
These timings can be used to delay the input clock appropriately and use it to capture data.
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Pins
OVR
CLKOUT
CMOS Output Buffers
D0
D1
D2
D3
¼
¼
14-Bit
ADC Data
D11
D12
D13
ADS41B49
Figure 72. CMOS Output Interface
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Use External Clock Buffer
(> 200MSPS)
Input Clock
Receiver (FPGA, ASIC, etc.)
Flip-Flops
CLKOUT
CMOS Output Buffers
D0
D1
D2
CLKIN
D0_In
D1_In
D2_In
14-Bit ADC Data
D12
D13
D12_In
D13_In
ADS41Bx9
Use short traces between
ADC output and receiver pins (1 to 2 inches).
Figure 73. Using the CMOS Data Outputs
CMOS Interface Power Dissipation
With CMOS outputs, the DRVDD current scales with the sampling frequency and the load capacitance on every
output pin. The maximum DRVDD current occurs when each output bit toggles between '0' and '1' every clock
cycle. In actual applications, this condition is unlikely to occur. The actual DRVDD current would be determined
by the average number of output bits switching, which is a function of the sampling frequency and the nature of
the analog input signal.
Digital Current as a Result of CMOS Output Switching = CL × DRVDD × (N × fAVG)
where:
CL = load capacitance,
N × FAVG = average number of output bits switching.
(1)
Figure 52 illustrates the current across sampling frequencies at 2MHz analog input frequency.
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Input Over-Voltage Indication (OVR Pin)
The device has an OVR pin that provides information about analog input overload. At any clock cycle, if the
sampled input voltage exceeds the positive or negative full-scale range, the OVR pin goes high. The OVR
remains high as long as the overload condition persists. The OVR pin is a CMOS output buffer (running off
DRVDD supply), independent of the type of output data interface (DDR LVDS or CMOS).
For a positive overload, the D[13:0] output data bits are 0x3FFF in offset binary output format and 0x1FFF in
twos complement output format. For a negative input overload, the output code is 0x0000 in offset binary output
format and 0x2000 in twos complement output format.
Output Data Format
Two output data formats are supported: twos complement and offset binary. They can be selected using the
DATA FORMAT serial interface register bit or controlling the DFS pin in parallel configuration mode. In the event
of an input voltage overdrive, the digital outputs go to the appropriate full-scale level.
BOARD DESIGN CONSIDERATIONS
Grounding
A single ground plane is sufficient to give good performance, provided the analog, digital, and clock sections of
the board are cleanly partitioned. See the ADS414x, ADS412x EVM User Guide (SLWU067) for details on layout
and grounding.
Supply Decoupling
Because the ADS41B29/49 already include internal decoupling, minimal external decoupling can be used without
loss in performance. Note that decoupling capacitors can help filter external power-supply noise, so the optimum
number of capacitors depends on the actual application. The decoupling capacitors should be placed very close
to the converter supply pins.
Exposed Pad
In addition to providing a path for heat dissipation, the PowerPAD is also electrically internally connected to the
digital ground. Therefore, it is necessary to solder the exposed pad to the ground plane for best thermal and
electrical performance. For detailed information, see application notes QFN Layout Guidelines (SLOA122) and
QFN/SON PCB Attachment (SLUA271), both available for download at the TI web site (www.ti.com).
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DEFINITION OF SPECIFICATIONS
Analog Bandwidth – The analog input frequency at which the power of the fundamental is reduced by 3 dB with
respect to the low-frequency value.
Aperture Delay – The delay in time between the rising edge of the input sampling clock and the actual time at
which the sampling occurs. This delay is different across channels. The maximum variation is specified as
aperture delay variation (channel-to-channel).
Aperture Uncertainty (Jitter) – The sample-to-sample variation in aperture delay.
Clock Pulse Width/Duty Cycle – The duty cycle of a clock signal is the ratio of the time the clock signal remains
at a logic high (clock pulse width) to the period of the clock signal. Duty cycle is typically expressed as a
percentage. A perfect differential sine-wave clock results in a 50% duty cycle.
Maximum Conversion Rate – The maximum sampling rate at which specified operation is given. All parametric
testing is performed at this sampling rate unless otherwise noted.
Minimum Conversion Rate – The minimum sampling rate at which the ADC functions.
Differential Nonlinearity (DNL) – An ideal ADC exhibits code transitions at analog input values spaced exactly
1 LSB apart. The DNL is the deviation of any single step from this ideal value, measured in units of LSBs.
Integral Nonlinearity (INL) – The INL is the deviation of the ADC transfer function from a best fit line determined
by a least squares curve fit of that transfer function, measured in units of LSBs.
Gain Error – Gain error is the deviation of the ADC actual input full-scale range from its ideal value. The gain
error is given as a percentage of the ideal input full-scale range. Gain error has two components: error as a
result of reference inaccuracy and error as a result of the channel. Both errors are specified independently as
EGREF and EGCHAN.
To a first-order approximation, the total gain error is ETOTAL ~ EGREF + EGCHAN.
For example, if ETOTAL = ±0.5%, the full-scale input varies from (1 – 0.5/100) x FSideal to (1 + 0.5/100) x FSideal.
Offset Error – The offset error is the difference, given in number of LSBs, between the ADC actual average idle
channel output code and the ideal average idle channel output code. This quantity is often mapped into millivolts.
Temperature Drift – The temperature drift coefficient (with respect to gain error and offset error) specifies the
change per degree Celsius of the parameter from TMIN to TMAX. It is calculated by dividing the maximum deviation
of the parameter across the TMIN to TMAX range by the difference TMAX – TMIN.
Signal-to-Noise Ratio – SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN),
excluding the power at dc and the first nine harmonics.
SNR = 10Log10
PS
PN
(2)
SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the
reference, or dBFS (dB to full-scale) when the power of the fundamental is extrapolated to the converter fullscale range.
Signal-to-Noise and Distortion (SINAD) – SINAD is the ratio of the power of the fundamental (PS) to the power
of all the other spectral components including noise (PN) and distortion (PD), but excluding dc.
SINAD = 10Log10
PS
PN + PD
(3)
SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the
reference, or dBFS (dB to full-scale) when the power of the fundamental is extrapolated to the converter fullscale range.
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Effective Number of Bits (ENOB) – ENOB is a measure of the converter performance as compared to the
theoretical limit based on quantization noise.
ENOB =
SINAD - 1.76
6.02
(4)
Total Harmonic Distortion (THD) – THD is the ratio of the power of the fundamental (PS) to the power of the
first nine harmonics (PD).
THD = 10Log10
PS
PN
(5)
THD is typically given in units of dBc (dB to carrier).
Spurious-Free Dynamic Range (SFDR) – The ratio of the power of the fundamental to the highest other
spectral component (either spur or harmonic). SFDR is typically given in units of dBc (dB to carrier).
Two-Tone Intermodulation Distortion – IMD3 is the ratio of the power of the fundamental (at frequencies f1
and f2) to the power of the worst spectral component at either frequency 2f1 – f2 or 2f2 – f1. IMD3 is either given
in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the reference, or dBFS (dB
to full-scale) when the power of the fundamental is extrapolated to the converter full-scale range.
DC Power-Supply Rejection Ratio (DC PSRR) – DC PSSR is the ratio of the change in offset error to a change
in analog supply voltage. The dc PSRR is typically given in units of mV/V.
AC Power-Supply Rejection Ratio (AC PSRR) – AC PSRR is the measure of rejection of variations in the
supply voltage by the ADC. If ΔVSUP is the change in supply voltage and ΔVOUT is the resultant change of the
ADC output code (referred to the input), then:
DVOUT
PSRR = 20Log 10
(Expressed in dBc)
DVSUP
(6)
Voltage Overload Recovery – The number of clock cycles taken to recover to less than 1% error after an
overload on the analog inputs. This is tested by separately applying a sine wave signal with 6dB positive and
negative overload. The deviation of the first few samples after the overload (from the expected values) is noted.
Common-Mode Rejection Ratio (CMRR) – CMRR is the measure of rejection of variation in the analog input
common-mode by the ADC. If ΔVCM_IN is the change in the common-mode voltage of the input pins and ΔVOUT is
the resulting change of the ADC output code (referred to the input), then:
DVOUT
CMRR = 20Log10
(Expressed in dBc)
DVCM
(7)
Crosstalk (only for multi-channel ADCs) – This is a measure of the internal coupling of a signal from an
adjacent channel into the channel of interest. It is specified separately for coupling from the immediate
neighboring channel (near-channel) and for coupling from channel across the package (far-channel). It is usually
measured by applying a full-scale signal in the adjacent channel. Crosstalk is the ratio of the power of the
coupling signal (as measured at the output of the channel of interest) to the power of the signal applied at the
adjacent channel input. It is typically expressed in dBc.
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SBAS486E – NOVEMBER 2009 – REVISED JULY 2012
REVISION HISTORY
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision D (December 2010) to Revision E
Page
•
Changed Analog Inputs, Differential input capacitance parameter typical specification in Electrical Characteristics:
General table ........................................................................................................................................................................ 5
•
Updated Thermal Information table values ........................................................................................................................... 6
•
Changed register 25h default value in Table 7 ................................................................................................................... 19
•
Changed register 42 default and bit D3 values in Table 7 ................................................................................................. 19
•
Changed default value for Register Address 25h ............................................................................................................... 21
•
Changed default and bit 3 values for Register Address 42h .............................................................................................. 24
•
Changed value of input capacitance in Analog Input section ............................................................................................. 43
•
Updated Figure 59 and footnotes ....................................................................................................................................... 43
•
Updated Figure 60 .............................................................................................................................................................. 44
•
Updated Figure 61 .............................................................................................................................................................. 44
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PACKAGE OPTION ADDENDUM
www.ti.com
24-Jan-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package Qty
Drawing
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Top-Side Markings
(3)
(4)
ADS41B29IRGZ25
ACTIVE
VQFN
RGZ
48
25
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B29
ADS41B29IRGZR
ACTIVE
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B29
ADS41B29IRGZT
ACTIVE
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B29
ADS41B49IRGZ25
ACTIVE
VQFN
RGZ
48
25
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B49
ADS41B49IRGZR
ACTIVE
VQFN
RGZ
48
2500
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B49
ADS41B49IRGZT
ACTIVE
VQFN
RGZ
48
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-3-260C-168 HR
-40 to 85
AZ41B49
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
Only one of markings shown within the brackets will appear on the physical device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
24-Jan-2013
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Feb-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
ADS41B29IRGZR
VQFN
RGZ
48
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
2500
330.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
ADS41B29IRGZT
VQFN
RGZ
48
250
330.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
ADS41B49IRGZR
VQFN
RGZ
48
2500
330.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
ADS41B49IRGZT
VQFN
RGZ
48
250
330.0
16.4
7.3
7.3
1.5
12.0
16.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Feb-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
ADS41B29IRGZR
VQFN
RGZ
48
2500
336.6
336.6
28.6
ADS41B29IRGZT
VQFN
RGZ
48
250
336.6
336.6
28.6
ADS41B49IRGZR
VQFN
RGZ
48
2500
336.6
336.6
28.6
ADS41B49IRGZT
VQFN
RGZ
48
250
336.6
336.6
28.6
Pack Materials-Page 2
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