DATASHEET CA3127 FN662 Rev.5.00 Jun 5, 2006 High Frequency NPN Transistor Array The CA3127 consists of five general purpose silicon NPN transistors on a common monolithic substrate. Each of the completely isolated transistors exhibits low 1/f noise and a value of fT in excess of 1GHz, making the CA3127 useful from DC to 500MHz. Access is provided to each of the terminals for the individual transistors and a separate substrate connection has been provided for maximum application flexibility. The monolithic construction of the CA3127 provides close electrical and thermal matching of the five transistors. Features Ordering Information • VHF Amplifiers PART NUMBER PART MARKING • Gain Bandwidth Product (fT) . . . . . . . . . . . . . . . . . >1GHz • Power Gain . . . . . . . . . . . . . . . . . . 30dB (Typ) at 100MHz • Noise Figure. . . . . . . . . . . . . . . . . 3.5dB (Typ) at 100MHz • Five Independent Transistors on a Common Substrate • Pb-Free Plus Anneal Available (RoHS Compliant) Applications • Multifunction Combinations - RF/Mixer/Oscillator TEMP. RANGE (°C) PACKAGE PKG. DWG. # CA3127M CA3127 -55 to 125 16 Ld SOIC M16.15 CA3127MZ (Note) CA3127MZ -55 to 125 16 Ld SOIC (Pb-free) M16.15 NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020. • Sense Amplifiers • Synchronous Detectors • VHF Mixers • IF Converter • IF Amplifiers • Synthesizers • Cascade Amplifiers Pinout CA3127 (SOIC) TOP VIEW 1 16 Q1 15 2 Q2 14 3 13 4 Q5 SUBSTRATE 5 12 11 6 Q3 FN662 Rev.5.00 Jun 5, 2006 Q4 7 10 8 9 Page 1 of 9 CA3127 Absolute Maximum Ratings Thermal Information The following ratings apply for each transistor in the device Collector-to-Emitter Voltage, VCEO . . . . . . . . . . . . . . . . . . . . .15V Collector-to-Base Voltage, VCBO . . . . . . . . . . . . . . . . . . . . . . .20V Collector-to-Substrate Voltage, VCIO (Note 1) . . . . . . . . . . . . .20V Collector Current, IC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20mA Thermal Resistance (Typical, Note 2) JA (°C/W) SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 Maximum Power Dissipation, PD (Any One Transistor) . . . . .85mW Maximum Junction Temperature (Die). . . . . . . . . . . . . . . . . . . 175°C Maximum Junction Temperature (Plastic Packages). . . . . . . . 150°C Maximum Storage Temperature Range . . . . . . . . . . -65°C to 150°C Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300°C (SOIC - Lead Tips Only) Operating Conditions Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . .-55°C to 125°C CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTES: 1. The collector of each transistor of the CA3127 is isolated from the substrate by an integral diode. The substrate (Terminal 5) must be connected to the most negative point in the external circuit to maintain isolation between transistors and to provide for normal transistor action. 2. JA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications TA = 25°C PARAMETER TEST CONDITIONS MIN TYP MAX UNITS DC CHARACTERISTICS (For Each Transistor) Collector-to-Base Breakdown Voltage IC = 10A, IE = 0 20 32 - V Collector-to-Emitter Breakdown Voltage IC = 1mA, IB = 0 15 24 - V Collector-to-Substrate Breakdown-Voltage IC1 = 10A, IB = 0, IE = 0 20 60 - V Emitter-to-Base Breakdown Voltage (Note 3) IE = 10A, IC = 0 4 5.7 - V Collector-Cutoff-Current VCE = 10V IB = 0 - - 0.5 A Collector-Cutoff-Current VCB = 10V, IE = 0 - - 40 nA DC Forward-Current Transfer Ratio VCE = 6V IC = 5mA 35 88 - IC = 1mA 40 90 - IC = 0.1mA 35 85 - IC = 5mA 0.71 0.81 0.91 V IC = 1mA 0.66 0.76 0.86 V IC = 0.1mA 0.60 0.70 0.80 V Base-to-Emitter Voltage VCE = 6V Collector-to-Emitter Saturation Voltage IC = 10mA, IB = 1mA - 0.26 0.50 V Magnitude of Difference in VBE Q1 and Q2 Matched VCE = 6V, IC = 1mA - 0.5 5 mV - 0.2 3 A Magnitude of Difference in IB DYNAMIC CHARACTERISTICS Noise Figure f = 100kHz, RS = 500, IC = 1mA - 2.2 - dB Gain-Bandwidth Product VCE = 6V, IC = 5mA - 1.15 - GHz Collector-to-Base Capacitance VCB = 6V, f = 1MHz - - pF Collector-to-Substrate Capacitance VCI = 6V, f = 1MHz - See Fig. 5 - pF Emitter-to-Base Capacitance VBE = 4V, f = 1MHz - - pF Voltage Gain VCE = 6V, f = 10MHz, RL = 1k, IC = 1mA - 28 - dB Power Gain Cascode Configuration f = 100MHz, V+ = 12V, IC = 1mA 27 30 - dB - 3.5 - dB Noise Figure FN662 Rev.5.00 Jun 5, 2006 Page 2 of 9 CA3127 Electrical Specifications TA = 25°C PARAMETER TEST CONDITIONS MIN TYP MAX UNITS - 400 - - 4.6 - k Input Capacitance - 3.7 - pF Output Capacitance - 2 - pF Magnitude of Forward Transadmittance - 24 - mS Input Resistance Common-Emitter Configuration VCE = 6V, IC = 1mA, f = 200 MHz Output Resistance NOTE: 3. When used as a zener for reference voltage, the device must not be subjected to more than 0.1mJ of energy from any possible capacitance or electrostatic discharge in order to prevent degradation of the junction. Maximum operating zener current should be less than 10mA. Test Circuits V+ 10k BIAS-CURRENT ADJ 470 pF RL 2 51 6 4 0.01 F 1F VO Q2 0.01F 8 1F 0.01 F Q3 3 470pF 470pF 7 VI GEN FIGURE 1. VOLTAGE-GAIN TEST CIRCUIT USING CURRENT-MIRROR BIASING FOR Q2 1.5 - 8pF C2 (NOTE 5) 12 SHIELD Q5 VI 2 1000pF 13 VO 8.2 k 0.47H 14 620 1000 pF 1000 pF 0.3H 4 Q2 1.8pF C1 (NOTE 5) OHMITE Z144 560 3 +12V 25k Q3 1000 pF 7 NOTES: 750 1% 1000 pF 6 8 TEST POINT 5 4. This circuit was chosen because it conveniently represents a close approximation in performance to a properly unilateralized single transistor of this type. The use of Q3 in a current-mirror configuration facilitates simplified biasing. The use of the cascode circuit in no way implies that the transistors cannot be used individually. 5. E.F. Johnson number 160-104-1 or equivalent. FIGURE 2. 100MHz POWER-GAIN AND NOISE-FIGURE TEST CIRCUIT FN662 Rev.5.00 Jun 5, 2006 Page 3 of 9 CA3127 GENERAL RADIO 1021-P1 100MHz GENERATOR ATTN 100MHz TEST SET BOONTON 91C RF VOLTMETER 12VDC POWER SUPPLY FIGURE 3A. POWER GAIN SET-UP VHF NOISE SOURCE HEWLETT PACKARD HP343A 100MHz TEST SET 100MHz POST AMPLIFIER 12VDC POWER SUPPLY 15VDC POWER SUPPLY NOISE FIGURE METER HEWLETT PACKARD HP342A FIGURE 3B. NOISE FIGURE SET-UP FIGURE 3. BLOCK DIAGRAMS OF POWER-GAIN AND NOISE-FIGURE TEST SET-UPS Typical Performance Curves TA = 25°C VCE = 6V RSOURCE = 500 f = 10Hz 30 f = 100Hz 20 f = 1kHz 10 f = 10kHz f = 100kHz NOISE FIGURE (dB) NOISE FIGURE (dB) 30 TA = 25°C VCE = 6V RSOURCE = 1k f = 10Hz f = 100Hz 20 f = 1kHz f = 10kHz 10 f = 100kHz 0 0.01 0.1 1.0 COLLECTOR CURRENT (mA) FIGURE 4. NOISE FIGURE vs COLLECTOR CURRENT FN662 Rev.5.00 Jun 5, 2006 0 0.01 0.1 1.0 COLLECTOR CURRENT (mA) FIGURE 5. NOISE FIGURE vs COLLECTOR CURRENT Page 4 of 9 CA3127 Typical Performance Curves (Continued) 1.0 BASE-TO-EMITTER VOLTAGE (V) GAIN-BANDWIDTH PRODUCT (GHz) TA = 25°C VCE = 6V 1.2 1.1 1.0 0.9 0.8 TA = -55°C 0.9 TA = 25°C 0.8 0.7 TA = 125°C 0.6 0.5 0.4 0 1 2 3 4 5 6 7 8 9 10 0.1 1 COLLECTOR CURRENT (mA) COLLECTOR CURRENT (mA) FIGURE 6. GAIN-BANDWIDTH PRODUCT vs COLLECTOR CURRENT FIGURE 7. BASE-TO-EMITTER VOLTAGE vs COLLECTOR CURRENT TA = 25°C f = 1MHz CAPACITANCE (pF) CCE CCB TRANSISTOR 2.25 2.00 CAPACITANCE (pF) 10 CEB CCI PKG TOTAL PKG TOTAL PKG TOTAL PKG TOTAL 1.50 BIAS (V) 1.25 Q1 0.025 0.190 0.090 0.125 0.365 0.610 0.475 1.65 1.00 Q2 0.015 0.170 0.225 0.265 0.130 0.360 0.085 1.35 Q3 0.040 0.200 0.215 0.240 0.360 0.625 0.210 1.40 Q4 0.040 0.190 0.225 0.270 0.365 0.610 0.085 1.25 Q5 0.010 0.165 0.095 0.115 0.140 0.365 0.090 1.35 1.75 CCI 0.75 CEB 0.50 CCB 0.25 0 1 2 3 4 5 6 7 8 9 - 6V - 6V - 4V - 6V 10 BIAS VOLTAGE (V) FIGURE 8A. CAPACITANCE vs BIAS VOLTAGE FOR Q2 FN662 Rev.5.00 Jun 5, 2006 FIGURE 8B. TYPICAL CAPACITANCE VALUES AT f = 1MHz. THREE TERMINAL MEASUREMENT. GUARD ALL TERMINALS EXCEPT THOSE UNDER TEST. Page 5 of 9 CA3127 Typical Performance Curves (Continued) 40 40 TA = 25°C, VCE = 6V, RL = 100 FOR TEST CIRCUIT SEE FIGURE 19 35 IC = 1mA 30 25 VOLTAGE GAIN (dB) 30 VOLTAGE GAIN (dB) IC = 5mA 35 IC = 5mA 20 15 IC = 1mA 10 IC = 0.5mA 5 IC = 0.2mA 0 IC = 0.5mA 25 20 IC = 0.2mA 15 10 5 0 -5 -5 -10 1M 10M 100M FREQUENCY (Hz) -10 1M 1G TA = 25°C, VCE = 6V, RL = 1k FOR TEST CIRCUIT SEE FIGURE 19 10M 100M FREQUENCY (Hz) 1G FIGURE 10. VOLTAGE GAIN vs FREQUENCY 100 TA = 25°C 8 80 70 60 50 40 0.1 1.0 COLLECTOR CURRENT (mA) FIGURE 11. DC FORWARD-CURRENT TRANSFER RATIO (hFE) vs COLLECTOR CURRENT FN662 Rev.5.00 Jun 5, 2006 10 TA = 25°C, VCE = 6V, IC = 1mA 7 SUSCEPTANCE (b11) (mS) 90 VCE = 6V INPUT CONDUCTANCE (g11) OR DC FORWARD CURRENT TRANSFER RATIO FIGURE 9. VOLTAGE GAIN vs FREQUENCY b11 6 5 4 g11 3 2 1 0 100M FREQUENCY (Hz) 1G FIGURE 12. INPUT ADMITTANCE (Y11) vs FREQUENCY Page 6 of 9 CA3127 OUTPUT CONDUCTANCE (g22) (mS) 8 g11 7 6 5 b11 4 3 2 1 1 2 3 4 5 6 7 8 COLLECTOR CURRENT (mA) 9 10 b22 2.8 2.7 0.350 2.6 g22 2.5 0.300 2.4 0.275 2.3 0.250 2.2 0.225 2.1 0.200 2.0 0.175 0 1 2 3 4 5 6 7 8 9 10 11 COLLECTOR CURRENT (mA) 1.9 12 FIGURE 15. OUTPUT ADMITTANCE (Y22) vs COLLECTOR CURRENT FN662 Rev.5.00 Jun 5, 2006 8 b22 0.7 7 0.6 6 0.5 5 0.4 4 0.3 3 g22 0.2 2 0.1 1 0 1G FREQUENCY (Hz) TA = 25°C 0.375 0.325 0.8 FIGURE 14. OUTPUT ADMITTANCE (Y22) vs FREQUENCY OUTPUT SUSCEPTANCE (b22) (mS) OUTPUT CONDUCTANCE (g22) (mS) 0.400 0.9 0 100M FIGURE 13. INPUT ADMITTANCE (Y11) vs COLLECTOR CURRENT TA = 25°C VCE = 6V f = 200MHz 1.0 VCE = 6V f = 200MHz 100 0 80 -20 |Y21| 60 40 21 -40 -60 -80 20 0 1 2 PHASE-ANGLE OF FORWARD TRANSADMITTANCE (|21|) (°) 0 TA = 25°C VCE = 6V IC = 1mA 1.1 MAGNITUDE OF FORWARD TRANSADMITTANCE (|Y21|) (mS) 0 1.3 1.2 OUTPUT SUSCEPTANCE (b22) (mS) (Continued) TA = 25°C VCE = 6V f = 200MHz 9 SUSCEPTANCE (b11) (mS) INPUT CONDUCTANCE (g11) OR Typical Performance Curves -100 3 4 5 6 7 8 9 10 11 12 COLLECTOR CURRENT (mA) FIGURE 16. FORWARD TRANSADMITTANCE (Y21) vs COLLECTOR CURRENT Page 7 of 9 CA3127 (Continued) TA = 25°C -30 -40 21 -50 -60 |Y21| 30 -70 20 -80 10 -90 0 100M PHASE-ANGLE OF FORWARD TRANSADMITTANCE (|21|) (°) MAGNITUDE OF FORWARD TRANSADMITTANCE (|Y21|) (mS) -20 MAGNITUDE OF REVERSE TRANSADMITTANCE (|Y12|) (mS) -10 VCE = 6V IC = 1mA f = 200MHz 12 -80 -90 -100 |Y12| 0.21 -110 -120 -130 -140 -100 0 1G 150M 200M FREQUENCY (Hz) TA = 25°C VCE = 6V PHASE-ANGLE OF REVERSE TRANSADMITTANCE (|12|) (°) Typical Performance Curves FIGURE 17. FORWARD TRANSADMITTANCE (Y21) vs FREQUENCY 1 2 -150 3 4 5 6 7 8 9 10 11 12 COLLECTOR CURRENT (mA) FIGURE 18. REVERSE TRANSADMITTANCE (Y12) vs COLLECTOR CURRENT 0.6 0.5 -90 -95 12 0.4 -100 0.3 0.2 -105 |Y12| -110 -115 0.1 0 100M PHASE-ANGLE OF REVERSE TRANSADMITTANCE (|12|) (°) MAGNITUDE OF REVERSE TRANSADMITTANCE (|Y12|) (mS) TA = 25°C VCE = 6V IC = 1mA -120 FREQUENCY (Hz) 1G FIGURE 19. REVERSE TRANSADMITTANCE (Y12) vs FREQUENCY FN662 Rev.5.00 Jun 5, 2006 Page 8 of 9 CA3127 Small Outline Plastic Packages (SOIC) M16.15 (JEDEC MS-012-AC ISSUE C) N INDEX AREA H 0.25(0.010) M 16 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE B M INCHES E -B- 1 2 3 L SEATING PLANE -A- A D h x 45° -C- e A1 B 0.25(0.010) M C 0.10(0.004) C A M SYMBOL MIN MAX MIN MAX NOTES A 0.0532 0.0688 1.35 1.75 - A1 0.0040 0.0098 0.10 0.25 - B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 - D 0.3859 0.3937 9.80 10.00 3 E 0.1497 0.1574 3.80 4.00 4 e B S 0.050 BSC 1.27 BSC - H 0.2284 0.2440 5.80 6.20 - h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6 N NOTES: MILLIMETERS 16 0° 16 8° 0° 1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95. 7 8° Rev. 1 6/05 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. “L” is the length of terminal for soldering to a substrate. 7. “N” is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. © Copyright Intersil Americas LLC 1996-2006. All Rights Reserved. All trademarks and registered trademarks are the property of their respective owners. For additional products, see www.intersil.com/en/products.html Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/en/support/qualandreliability.html Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com FN662 Rev.5.00 Jun 5, 2006 Page 9 of 9