Intersil ISL21007CFB820Z Precision, low noise fgaâ ¢ voltage reference Datasheet

Precision, Low Noise FGA™ Voltage References
ISL21007
Features
The ISL21007 FGA™ voltage references are extremely low
power, high precision, and low noise voltage references
fabricated on Intersil’s proprietary Floating Gate Analog
technology. The ISL21007 features very low noise (4.5µVP-P for
0.1Hz to 10Hz) and very low operating current (150µA, Max). In
addition, the ISL21007 family features guaranteed initial
accuracy as low as ±0.5mV.
• Reference Output Voltage . . . .1.250V, 2.048V, 2.500V, 3.000V
This combination of high initial accuracy, low drift, and low
output noise performance of the ISL21007 enables versatile
high performance control and data acquisition applications
with low power consumption.
• Initial Accuracy . . . . . . . . . . . . . . . . . . . . . . . ±0.5mV (B grade)
• Input Voltage Range
ISL21007-12, 20, 25. . . . . . . . . . . . . . . . . . . . . . . 2.7V to 5.5V
ISL21007-30. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.2V to 5.5V
• Low Output Voltage Noise . . . . . . . . 4.5µVP-P (0.1Hz to 10Hz)
• Supply Current . . . . . . . . . . . . . . . . . . . . . . . . . . . 150µA (Max)
• Temperature Coefficient . . . . . . . . . . . . . . 3ppm/°C (B grade)
• Operating Temperature Range. . . . . . . . . . .-40°C to +125°C
• Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Ld SOIC
Available Options
• Pb-Free (RoHS Compliant)
Applications
VOUT
OPTION
(V)
INITIAL
ACCURACY
(mV)
TEMPCO.
(ppm/°C)
ISL21007BFB812Z
1.250
±0.5
3
ISL21007CFB812Z
1.250
±1.0
5
ISL21007DFB812Z
1.250
±2.0
10
ISL21007BFB820Z
2.048
±0.5
3
• Industrial/Instrumentation Equipment
ISL21007CFB820Z
2.048
±1.0
5
ISL21007DFB820Z
2.048
±2.0
10
Related Literature
ISL21007BFB825Z
2.500
±0.5
3
ISL21007CFB825Z
2.500
±1.0
5
ISL21007DFB825Z
2.500
±2.0
10
ISL21007BFB830Z
3.000
±0.5
3
ISL21007CFB830Z
3.000
±1.0
5
ISL21007DFB830Z
3.000
±2.0
10
PART
NUMBER
July 14, 2011
FN6326.8
1
• High Resolution A/Ds and D/As
• Digital Meters
• Bar Code Scanners
• Basestations
• Battery Management/Monitoring
• AN1533, “X-Ray Effects on Intersil FGA References”
• AN1494, “Reflow and PC Board Assembly Effects on Intersil
FGA References”
Pin Configuration
ISL21007
(8 LD SOIC)
TOP VIEW
GND or NC
1
8
DNC
VIN
2
7
DNC
DNC
3
6
VOUT
GND
4
5
TRIM
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas Inc. 2007, 2011. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
ISL21007
Ordering Information
PART NUMBER
(Notes 1, 2, 3)
PART
MARKING
VOUT OPTION
(V)
GRADE
TEMP. RANGE
(°C)
PACKAGE
(Pb-Free)
PKG. DWG. #
ISL21007BFB812Z
21007BF Z12
1.250
±0.5mV, 3ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007CFB812Z
21007CF Z12
1.250
±1.0mV, 5ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007DFB812Z
21007DF Z12
1.250
±2.0mV, 10ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007BFB820Z
21007BF Z20
2.048
±0.5mV, 3ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007CFB820Z
21007CF Z20
2.048
±1.0mV, 5ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007DFB820Z
21007DF Z20
2.048
±2.0mV, 10ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007BFB825Z
21007BF Z25
2.500
±0.5mV, 3ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007CFB825Z
21007CF Z25
2.500
±1.0mV, 5ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007DFB825Z
21007DF Z25
2.500
±2.0mV, 10ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007BFB830Z
21007BF Z30
3.000
±0.5mV, 3ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007CFB830Z
21007CF Z30
3.000
±1.0mV, 5ppm/°C
-40 to +125
8 Ld SOIC
M8.15
ISL21007DFB830Z
21007DF Z30
3.000
±2.0mV, 10ppm/°C
-40 to +125
8 Ld SOIC
M8.15
NOTES:
1. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte tin
plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil Pb-free
products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
2. Add “-T*” suffix for tape and reel. Please refer to TB347 for details on reel specifications.
3. For Moisture Sensitivity Level (MSL), please see device information page for ISL21007. For more information on MSL please see techbrief TB363.
2
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ISL21007
Pin Descriptions
PIN NUMBER
PIN NAME
DESCRIPTION
1
GND or NC
2
VIN
Power Supply Input Connection
4
GND
Ground
5
TRIM
Allows user trim VOUT ±2.5%
6
VOUT
Voltage Reference Output Connection
3, 7, 8
DNC
Do Not Connect; Internal Connection - Must Be Left Floating
Ground or No Connection
Typical Application Circuit
1 GND
+3V
C1
10µF
2 VIN
3 NC
4 GND
NC 8
NC 7
VOUT 6
TRIM 5
ISL21007-12, 20, 25, 30
SPI BUS
X79000
1 SCK
2 A0
3 A1
4 A2
5 SI
6 SO
7 RDY
8 UP
9 DOWN
10 OE
CS 20
CLR 19
VCC 18
VH 17
VL 16
C1
0.001µF
VREF 15
VSS 14
VOUT 13
VBUF 12
LOW NOISE DAC OUTPUT
VFB 11
FIGURE 1. TYPICAL APPLICATION PRECISION 12-BIT SUBRANGING DAC
3
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July 14, 2011
ISL21007
Absolute Voltage Ratings
Thermal Information
Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Max Voltage VIN to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.5V
Max Voltage VOUT to GND (10s). . . . . . . . . . . . . . . . . . . . . . -0.5V to VOUT + 1
Voltage on “DNC” pins . . . . . . . . . No connections permitted to these pins.
ESD Rating
Human Body Model (HBM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6kV
Machine Model (MM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 600V
Charged Device Model (CDM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2kV
Thermal Resistance (Typical, Note 5)
Environmental Operating Conditions
Temperature Range (Industrial) . . . . . . . . . . . . . . . . . . . . .-40°C to +125°C
θJA (°C/W)
8 Ld SOIC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
113.12
Continuous Power Dissipation (Note 5) . . . . . . . . . . . . . . . . . . . .TA = +70°C
8 Ld SOIC Derate 5.88mW/°C above +70°C. . . . . . . . . . . . . . . . . . 471mW
Pb-Free Reflow Profile (Note 6). . . . . . . . . . . . . . . . . . . . . . . . see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
X-Ray Exposure (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mRem
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typ values are for information purposes only. Unless otherwise noted,
all tests are at the specified temperature and are pulsed tests, therefore: TJ = TC = TA
NOTES:
4. Measured with no filtering, distance of 10” from source, intensity set to 55kV and 70mA current, 30s duration. Other exposure levels should be
analyzed for Output Voltage drift effects. See “Applications Information” on page 16.
5. θJA is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
6. Post-reflow drift for the ISL21007 devices will range from 100µV to 1.0mV based on experimental results with devices on FR4 double sided boards.
The design engineer must take this into account when considering the reference voltage after assembly.
Common Electrical Specifications (ISL21007-12, -20, -25, -30)
specified. Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
VOA
TC VOUT
IIN
DESCRIPTION
VOUT Accuracy @ TA = +25°C
Output Voltage Temperature
Coefficient (Note NOTES:)
TA = -40°C to +125°C, unless otherwise
MIN
MAX
(Note 10) TYP (Note 10)
CONDITIONS
ISL21007B
-0.5
+0.5
mV
ISL21007C
-1.0
+1.0
mV
ISL21007D
-2.0
+2.0
mV
ISL21007B
3
ppm/°C
ISL21007C
5
ppm/°C
ISL21007D
10
ppm/°C
150
µA
Supply Current
75
Trim Range
tR
UNIT
±2.0
±2.5
%
120
µs
Turn-on Settling Time
VOUT = ±0.1%
Ripple Rejection
f = 10kHz
60
dB
eN
Output Voltage Noise
0.1Hz ≤ f ≤ 10Hz
4.5
µVP-P
VN
Broadband Voltage Noise
10Hz ≤ f ≤ 1kHz
2.2
µVRMS
Noise Density
f = 1kHz
60
nV/√Hz
Electrical Specifications (ISL21007-12, VOUT = 1.250V)
specified. Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
DESCRIPTION
VIN
Input Voltage Range
VOUT
Output Voltage
ΔVOUT /ΔVIN
Line Regulation
4
CONDITIONS
VIN = 3.0V, TA = -40°C to +125°C, unless otherwise
MIN
(Note 10)
TYP
2.7
MAX
(Note 10)
UNIT
5.5
V
1.250
2.7V < VIN < 5.5V
100
V
700
µV/V
FN6326.8
July 14, 2011
ISL21007
Electrical Specifications (ISL21007-12, VOUT = 1.250V)
VIN = 3.0V, TA = -40°C to +125°C, unless otherwise
specified. Boldface limits apply over the operating temperature range, -40°C to +125°C. (Continued)
PARAMETER
ΔVOUT/ΔIOUT
DESCRIPTION
Load Regulation
CONDITIONS
MIN
(Note 10)
TYP
MAX
(Note 10)
UNIT
Sourcing: 0mA ≤ IOUT ≤ 7mA
10
100
µV/mA
Sinking: -7mA ≤ IOUT ≤ 0mA
20
150
µV/mA
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
40
mA
ΔVOUT/ΔTA
Thermal Hysteresis (Note 8)
ΔTA = +165°C
50
ppm
ΔVOUT/Δt
Long Term Stability (Note 9)
TA = +25°C
100
ppm
Electrical Specifications (ISL21007-20, VOUT = 2.048V)
specified. Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
DESCRIPTION
CONDITIONS
VIN = 3.0V, TA = -40°C to +125°C, unless otherwise
MIN
(Note 10)
TYP
2.7
MAX
(Note 10)
UNIT
5.5
V
VIN
Input Voltage Range
VOUT
Output Voltage
ΔVOUT /ΔVIN
Line Regulation
2.7V < VIN < 5.5V
50
200
µV/V
ΔVOUT/ΔIOUT
Load Regulation
Sourcing: 0mA ≤ IOUT ≤ 7mA
10
100
µV/mA
Sinking: -7mA ≤ IOUT ≤ 0mA
20
150
µV/mA
2.048
V
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
50
mA
ΔVOUT/ΔTA
Thermal Hysteresis (Note 8)
ΔTA = +165°C
50
ppm
ΔVOUT/Δt
Long Term Stability (Note 9)
TA = +25°C
75
ppm
Electrical Specifications (ISL21007-25, VOUT = 2.500V)
Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
DESCRIPTION
CONDITIONS
VIN = 3.0V, TA = -40°C to +125°C, unless otherwise specified.
MIN
(Note 10)
TYP
MAX
(Note 10)
UNIT
5.5
V
VIN
Input Voltage Range
VOUT
Output Voltage
ΔVOUT /ΔVIN
Line Regulation
2.7V < VIN < 5.5V
50
200
µV/V
ΔVOUT/ΔIOUT
Load Regulation
Sourcing: 0mA ≤ IOUT ≤ 5mA
10
100
µV/mA
Sinking: -5mA ≤ IOUT ≤ 0mA
20
150
µV/mA
2.7
2.500
V
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
50
mA
ΔVOUT/ΔTA
Thermal Hysteresis (Note 8)
ΔTA = +165°C
50
ppm
ΔVOUT/Δt
Long Term Stability (Note 9)
TA = +25°C
50
ppm
Electrical Specifications (ISL21007-30, VOUT = 3.000V)
Boldface limits apply over the operating temperature range, -40°C to +125°C.
PARAMETER
DESCRIPTION
CONDITIONS
VIN = 5.0V, TA = -40°C to +125°C, unless otherwise specified.
MIN
(Note 10)
TYP
UNIT
5.5
V
VIN
Input Voltage Range
VOUT
Output Voltage
ΔVOUT /ΔVIN
Line Regulation
3.2V < VIN < 5.5V
50
200
µV/V
ΔVOUT/ΔIOUT
Load Regulation
Sourcing: 0mA ≤ IOUT ≤ 7mA
10
100
µV/mA
Sinking: -7mA ≤ IOUT ≤ 0mA
20
150
µV/mA
5
3.2
MAX
(Note 10)
3.000
V
FN6326.8
July 14, 2011
ISL21007
Electrical Specifications (ISL21007-30, VOUT = 3.000V)
VIN = 5.0V, TA = -40°C to +125°C, unless otherwise specified.
Boldface limits apply over the operating temperature range, -40°C to +125°C. (Continued)
PARAMETER
DESCRIPTION
CONDITIONS
MIN
(Note 10)
TYP
MAX
(Note 10)
UNIT
ISC
Short Circuit Current
TA = +25°C, VOUT tied to GND
50
mA
ΔVOUT/ΔTA
Thermal Hysteresis (Note 8)
ΔTA = +165°C
50
ppm
ΔVOUT/Δt
Long Term Stability (Note 9)
TA = +25°C
50
ppm
NOTES:
7. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in VOUT is divided by the
temperature range; in this case, -40°C to +125°C = +165°C.
8. Thermal Hysteresis is the change of VOUT measured at TA = +25°C after temperature cycling over a specified range, ΔTA. VOUT is read initially at
TA = +25°C for the device under test. The device is temperature cycled and a second VOUT measurement is taken at +25°C. The difference between
the initial VOUT reading and the second VOUT reading is then expressed in ppm. For Δ TA = +165°C, the device under test is cycled from +25°C to
+125°C to -40°C to +25°C.
9. Long term drift is logarithmic in nature and diminishes over time. Drift after the first 1000 hours will be approximately 10ppm/√(1kHrs).
10. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
6
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-12)
120
95
UNIT 3
90
100
UNIT 2
60
IIN (µA)
IIN (µA)
+125°C
85
80
UNIT 1
40
80
+25°C
75
70
20
-40°C
65
0
2.5
3.0
3.5
4.0
4.5
VIN (V)
5.0
5.5
60
2.5
6.0
1.25015
UNIT 3
1.25005
1.25000
UNIT 2
1.24995
1.24990
UNIT 1
1.24985
2.5
3.0
3.5
4.0
VIN (V)
4.5
5.0
100
4.0
VIN (V)
4.5
5.0
5.5
+125°C
50
0
+25°C
-50
-40°C
-100
-150
-200
-250
-300
2.5
5.5
3.0
3.5
4.0
4.5
5.0
5.5
6.0
VIN (V)
FIGURE 5. LINE REGULATION OVER TEMPERATURE
FIGURE 4. LINE REGULATION (3 UNITS)
0.15
1.25010
+125°C
+25°C
UNIT 1
1.25005
0.10
1.25000
0.05
0.00
VOUT (V)
ΔVOUT (mV)
3.5
150
1.25010
1.24980
3.0
FIGURE 3. I IN vs VIN OVER TEMPERATURE
ΔVO (µV)
(NORMALIZED TO VIN = 3.0V)
VOUT (V)
(NORMALIZED TO 1.250V AT VIN = 3.0V)
FIGURE 2. IIN vs VIN (3 UNITS)
-40°C
-0.05
1.24995
UNIT 2
1.24990
UNIT 3
1.24985
-0.10
-0.15
(REXT = 100kΩ)
1.24980
-7
-6 -5 -4
SINKING
-3 -2 -1 0 1 2 3
OUTPUT CURRENT (mA)
4 5 6 7
SOURCING
FIGURE 6. LOAD REGULATION OVER TEMPERATURE
7
1.24975
-40
-20
0
20
40
60
80
100
120
140
TEMPERATURE (°C)
FIGURE 7. VOUT vs TEMPERATURE (3 UNITS)
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-12)
(REXT = 100kΩ) (Continued)
X: 200mV/DIV
Y: 10µs/DIV
0
10nF LOAD
100nF LOAD
PSRR (dB)
-20
ΔVIN = +0.3V
-40
-60
ΔVIN = -0.3V
1µF LOAD
-80
1nF LOAD
NO LOAD
-100
1.00E+00
1.00E+02
1.00E+04
1.00E+0
FREQUENCY (Hz)
FIGURE 9. LINE TRANSIENT RESPONSE, NO CAPACITIVE LOAD
FIGURE 8. PSRR vs CAPACITIVE LOADS
X: 20µs/DIV
Y: 1V/DIV
X: 200mV/DIV
Y: 10µs/DIV
ΔVIN = +0.3V
VIN
VOUT = 1.25V
ΔVIN = -0.3V
FIGURE 11. TURN-ON TIME
FIGURE 10. LINE TRANSIENT RESPONSE, 0.001µF LOAD
CAPACITANCE
GAIN IS x1000,
NOISE IS 4.5µVP-P
140
1nF
10nF
120
100nF
2mV/DIV
ZOUT (Ω)
100
NO LOAD
80
60
40
20
0
1.00E+00
1.00E+01
1.00E+02
1.00E+03
1.00E+04
1.00E+05
1.00E+06
FREQUENCY (Hz)
FIGURE 12. ZOUT vs FREQUENCY
8
FIGURE 13. VOUT NOISE, 0.1Hz TO 10Hz
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-12)
NO OUTPUT CAPACITANCE
X: 50µs/DIV
Y: 1V/DIV
(REXT = 100kΩ) (Continued)
+7mA
-7mA
FIGURE 14. LOAD TRANSIENT RESPONSE
Typical Performance Curves (ISL21007-20)
95
95
90
90
UNIT 2
+125°C
85
80
IIN (uA)
85
IIN (µA)
(REXT = 100kΩ)
80
UNIT 1
75
75
70
-40°C
65
+25°C
60
70
UNIT 3
65
2.7
3.1
55
3.5
3.9
4.3
4.7
5.1
50
2.7
5.5
3.1
3.5
3.9
2.04815
UNIT 2
2.04810
2.04805
UNIT 1
UNIT 3
2.04795
2.04790
2.5
3.0
3.5
4.0
4.5
VIN(V)
FIGURE 17. LINE REGULATION (3 UNITS)
9
4.7
5.1
5.5
FIGURE 16. IIN vs VIN OVER TEMPERATURE
5.0
5.5
VOUT (V)
(NORMALIZED TO 2.048V AT VIN = 3V)
VOUT (V) NORMALIZED TO 2.048V AT
VIN = 3.0V
FIGURE 15. IIN vs VIN (3 UNITS)
2.04800
4.3
VIN (V)
VIN (V)
2.04815
-40°C
2.04810
2.04805
+125°C
+25°C
2.04800
2.04795
2.5
3.0
3.5
4.0
4.5
5.0
5.5
VIN(V)
FIGURE 18. LINE REGULATION OVER TEMPERATURE
FN6326.8
July 14, 2011
ISL21007
Δ VOUT (mV) NORMALIZED TO 0mA
1.6
1.2
+125°C
0.0
0.4
-40°C
0.0
-0.4
+25°C
-0.8
-1.2
-7
-6
-5
-4
SINKING
-3
-2
-1
0
1
2
3
OUTPUT CURRENT (mA)
4
5
6
SOURCING
FIGURE 19. LOAD REGULATION OVER TEMPERATURE
7
VOUT(V) NORMALIZED TO 2.048V AT +25°C
Typical Performance Curves (ISL21007-20)
(REXT = 100kΩ) (Continued)
2.0496
2.0492
2.0488
UNIT 2
2.0484
UNIT 1
2.0480
2.0476
UNIT 3
2.0472
-40
-25
-10
5
20
35
50
65
80
95
110 125
TEMPERATURE (°C)
FIGURE 20. VOUT vs TEMPERATURE (3 UNITS)
X: 200mV/DIV
Y: 10µs/DIV
0
10nF LOAD
100nF LOAD
-20
PSRR (dB)
ΔVIN = +0.3V
-40
1µF LOAD
-60
-80
ΔVIN = -0.3V
NO LOAD
-100
1.0E+01
1.0E+03
1.0E+05
FREQUENCY (Hz)
FIGURE 21. PSRR vs CAPACITIVE LOADS
FIGURE 22. LINE TRANSIENT RESPONSE, NO CAPACITIVE LOAD
X: 100µs/DIV
Y: 2V/DIV
X: 200mV/DIV
Y: 10µs/DIV
ΔVIN = +0.3V
VIN
VOUT = 2.048V
ΔVIN = -0.3V
FIGURE 23. LINE TRANSIENT RESPONSE, 0.001µF LOAD
CAPACITANCE
10
FIGURE 24. TURN-ON TIME
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-20)
(REXT = 100kΩ) (Continued)
GAIN IS x1000,
NOISE IS 4.5µVP-P
140
1nF
10nF
120
100nF
2mV/DIV
ZOUT (Ω)
100
NO LOAD
80
60
40
20
0
1.00E+00
1.00E+01
1.00E+02
1.00E+03
1.00E+04
1.00E+05
1.00E+06
FREQUENCY (Hz)
FIGURE 25. ZOUT VS FREQUENCY
FIGURE 26. VOUT NOISE, 0.1Hz TO 10Hz
X: 20µs/DIV
Y: 200mV/DIV
X: 20µs/DIV
Y: 200mV/DIV
+7mA
-7mA
-7mA
FIGURE 27. LOAD TRANSIENT RESPONSE, 0.001µF LOAD
CAPACITANCE
FIGURE 28. LOAD TRANSIENT RESPONSE, NO CAPACITIVE LOAD
Typical Performance Curves (ISL21007-25)
UNIT 3
95
100
+125°C
90
UNIT 2
85
IIN (µA)
80
IIN (µA)
(REXT = 100kΩ)
100
120
UNIT 1
60
40
80
+25°C
-40°C
75
70
20
0
+7mA
65
60
2.5
3.0
3.5
4.0
4.5
5.0
VIN (V)
FIGURE 29. IIN vs VIN (3 UNITS)
11
5.5
6.0
2.5
3.0
3.5
4.0
4.5
5.0
5.5
VIN (V)
FIGURE 30. IIN vs VIN OVER TEMPERATURE
FN6326.8
July 14, 2011
ISL21007
2.5002
(REXT = 100kΩ) (Continued)
100
ΔVO (µV)
(NORMALIZED TO VIN = 3.0V)
VOUT (V)
(NORMALIZED TO 2.500V AT VIN = 3V)
Typical Performance Curves (ISL21007-25)
UNIT 1
2.5001
2.5000
UNIT 2
2.4999
UNIT 3
2.4998
2.4997
2.4996
2.5
3.0
3.5
4.0
4.5
5.0
50
0
-50
-100
-150
+125°C
-200
-250
-300
-40°C
-350
-400
2.5
5.5
+25°C
3.0
4.0
3.5
VIN (V)
FIGURE 31. LINE REGULATION (3 UNITS)
0.6
2.5003
5.5
6.0
UNIT 2
2.5002
0.4
2.5001
-40°C
0.2
2.5000
+25°C
VOUT (V)
ΔVOUT (mV)
5.0
FIGURE 32. LINE REGULATION OVER TEMPERATURE
+125°C
0
4.5
VIN (V)
-0.2
-0.4
UNIT 1
2.4999
2.4998
2.4997
2.4996
-0.6
2.4995
-0.8
2.4994
-1.0
-7 -6 -5 -4
2.4993
-40
SINKING
-3 -2 -1
0
1
2
3
OUTPUT CURRENT (mA)
4
5
6
7
UNIT 3
-20
0
FIGURE 33. LOAD REGULATION OVER TEMPERATURE
20
40
60
80
100
120
140
TEMPERATURE (°C)
SOURCING
FIGURE 34. VOUT vs TEMPERATURE (3 UNITS)
X: 200mV/DIV
Y: 10µs/DIV
10
NO LOAD
1nF
10nF
100nF
0
-10
PSRR (dB)
-20
-30
ΔVIN = +0.3V
1µF
-40
-50
ΔVIN = -0.3V
-60
-70
-80
-90
-100
1.E+00
1.E+02
1.E+04
1.E+06
FREQUENCY (Hz)
FIGURE 35. PSRR vs CAPACITIVE LOADS
12
FIGURE 36. LINE TRANSIENT RESPONSE, NO CAPACITIVE LOAD
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-25)
X: 200mV/DIV
Y: 10µs/DIV
(REXT = 100kΩ) (Continued)
X: 20µs/DIV
Y: 1V/DIV
ΔVIN = +0.3V
VIN
VOUT = 2.5V
ΔVIN = -0.3V
FIGURE 37. LINE TRANSIENT RESPONSE, 0.001µF LOAD
CAPACITANCE
FIGURE 38. TURN-ON TIME
GAIN IS x1000,
NOISE IS 4.5µVP-P
140
1nF
10nF
120
100nF
2mV/DIV
ZOUT (Ω)
100
NO LOAD
80
60
40
20
0
1.00E+00
1.00E+01
1.00E+02
1.00E+03
1.00E+04
1.00E+05
1.00E+06
FREQUENCY (Hz)
FIGURE 40. VOUT NOISE, 0.1Hz TO 10Hz
FIGURE 39. ZOUT vs FREQUENCY
NO OUTPUT CAPACITANCE
X: 50µs/DIV
Y: 500mV/DIV
+5mA
-5mA
FIGURE 41. LOAD TRANSIENT RESPONSE
13
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-30)
(REXT = 100kΩ)
120
120
UNIT 2
100
80
80
IIN (µA)
IIN (µA)
+125°C
100
UNIT 3
UNIT 1
60
60
40
40
20
20
0
3.2
3.7
4.2
4.7
+25°C
0
3.2
5.2
-40°C
3.7
4.2
UNIT 2
UNIT 3
2.9975
2.9965
2.9955
3.2
3.6
4.0
4.4
4.8
5.2
5.6
3.001
VOUT (V) NORMALIZED TO 3.0V AT
5.0VIN
VOUT(V) NORMALIZED TO 3.0V AT
5.0VIN
2.9985
FIGURE 43. IIN vs VIN OVER TEMPERATURE
UNIT 1
2.9995
3.000
2.999
+125°C
+25°C
2.998
2.997
-40°C
2.996
2.995
2.994
3.2
3.6
4.0
VIN (V)
-0.05
-0.10
+125°C
-0.15
-0.20
-0.25
-7 -6 -5 -4 -3 -2 -1
SINKING
0
1
LOAD (mA)
2
3
4
5
6
SOURCING
FIGURE 46. LOAD REGULATION OVER TEMPERATURE
14
7
VOUT (V) NORMALIZED TO 3.0V AT +25°C
Δ VOUT (mV) NORMALIZED TO
0mA
-40°C
+25°C
4.8
5.2
5.6
FIGURE 45. LINE REGULATION OVER TEMPERATURE
0.10
0.05
4.4
VIN (V)
FIGURE 44. LINE REGULATION (3 UNITS)
0.00
5.2
VIN (V)
VIN (V)
FIGURE 42. IIN vs VIN (3 UNITS)
3.0005
4.7
3.0006
3.0004
3.0002
UNIT 3
3.0000
2.9998
UNIT 2
2.9996
UNIT 1
2.9994
2.9992
2.9990
-40 -25 -10
5
20
35
50
65
80
95 110 125
TEMPERATURE (°C)
FIGURE 47. VOUT vs TEMPERATURE (3 UNITS)
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-30)
(REXT = 100kΩ) (Continued)
PSRR (dB)
X: 200mV/DIV
Y: 10µs/DIV
10
0 VIN (DC) = 5.0V
-10 VIN (AC) = 50mVP-P
-20
-30
-40
-50
-60
-70
-80
-90
-100
1.E+00
1.E+02
NO LOAD
1nF
10nF
100nF
ΔVIN = +0.5V
1µF
ΔVIN = -0.5V
1.E+04
1.E+06
FREQUENCY (Hz)
FIGURE 48. PSRR vs CAPACITIVE LOADS
FIGURE 49. LINE TRANSIENT RESPONSE, NO CAPACITIVE LOAD
X: 200mV/DIV
Y: 10µs/DIV
VIN = 5.0V
ΔVIN = +0.5V
1V/DIV
VOUT = 3.0V
ΔVIN = -0.5V
20µs/DIV
FIGURE 51. TURN-ON TIME
FIGURE 50. LINE TRANSIENT RESPONSE, 0.001µF LOAD
CAPACITANCE
GAIN IS x1000,
NOISE IS 4.5µVP-P
140
1nF
10nF
120
100nF
2mV/DIV
ZOUT (Ω)
100
NO LOAD
80
60
40
20
0
1.00E+00
1.00E+01
1.00E+02
1.00E+03
1.00E+04
1.00E+05
1.00E+06
FREQUENCY (Hz)
FIGURE 52. ZOUT vs FREQUENCY
15
FIGURE 53. VOUT NOISE, 0.1Hz TO 10Hz
FN6326.8
July 14, 2011
ISL21007
Typical Performance Curves (ISL21007-30)
(REXT = 100kΩ) (Continued)
200mV/DIV
+7mA
-7mA
100µs/DIV
FIGURE 54. LOAD TRANSIENT RESPONSE
Applications Information
FGA Technology
The ISL21007 voltage reference uses floating gate technology to
create references with very low drift and supply current.
Essentially, the charge stored on a floating gate cell is set
precisely in manufacturing. The reference voltage output itself is
a buffered version of the floating gate voltage. The resulting
reference device has excellent characteristics which are unique
in the industry: very low temperature drift, high initial accuracy,
and almost zero supply current. Also, the reference voltage itself
is not limited by voltage bandgaps or zener settings, so a wide
range of reference voltages can be programmed (standard
voltage settings are provided, but customer-specific voltages are
available).
The process used for these reference devices is a floating gate
CMOS process, and the amplifier circuitry uses CMOS transistors
for amplifier and output transistor circuitry. While providing
excellent accuracy, there are limitations in output noise level and
load regulation due to the MOS device characteristics. These
limitations are addressed with circuit techniques discussed in
other sections.
Micropower Operation
The ISL21007 consumes extremely low supply current due to the
proprietary FGA technology. Low noise performance is achieved
using optimized biasing techniques. Supply current is typically
75µA and noise is 4.5µVP-P benefitting precision, low noise
portable applications such as handheld meters and instruments.
Data Converters in particular can utilize the ISL21007 as an
external voltage reference. Low power DAC and ADC circuits will
realize maximum resolution with lowest noise.
Handling and Board Mounting
FGA references provide excellent initial accuracy and low
temperature drift at the expense of very little power drain. There
are some precautions to take to insure this accuracy is not
compromised. Excessive heat during solder reflow can cause
excessive initial accuracy drift, so the recommended +260°C
16
max temperature profile should not be exceeded. Expect up to
1mV drift from the solder reflow process.
FGA references are susceptible to excessive X-radiation like that
used in PC board manufacturing. Initial accuracy can change
10mV or more under extreme radiation. If an assembled board
needs to be X-rayed, care should be taken to shield the FGA
reference device.
Board Mounting Considerations
For applications requiring the highest accuracy, board mounting
location should be reviewed. Placing the device in areas subject to
slight twisting can cause degradation of the accuracy of the
reference voltage due to die stresses. It is normally best to place the
device near the edge of a board, or the shortest side, as the axis of
bending is most limited at that location. Obviously, mounting the
device on flexprint or extremely thin PC material will likewise cause
loss of reference accuracy.
Board Assembly Considerations
FGA references provide high accuracy and low temperature drift
but some PC board assembly precautions are necessary. Normal
Output voltage shifts of 100µV to 1mV can be expected with Pbfree reflow profiles or wave solder on multi-layer FR4 PC boards.
Precautions should be taken to avoid excessive heat or extended
exposure to high reflow or wave solder temperatures, this may
reduce device initial accuracy.
Post-assembly x-ray inspection may also lead to permanent
changes in device output voltage and should be minimized or
avoided. If x-ray inspection is required, it is advisable to monitor
the reference output voltage to verify excessive shift has not
occurred. If large amounts of shift are observed, it is best to add
an X-ray shield consisting of thin zinc (300µm) sheeting to allow
clear imaging, yet block x-ray energy that affects the FGA
reference.
Special Applications Considerations
In addition to post-assembly examination, there are also other Xray sources that may affect the FGA reference long term
accuracy. Airport screening machines contain X-rays and will
FN6326.8
July 14, 2011
ISL21007
have a cumulative effect on the voltage reference output
accuracy. Carry-on luggage screening uses low level X-rays and is
not a major source of output voltage shift, however, if a product is
expected to pass through that type of screening over 100 times,
it may need to consider shielding with copper or aluminum.
Checked luggage X-rays are higher intensity and can cause
output voltage shift in much fewer passes, thus devices expected
to go through those machines should definitely consider
shielding. Note that just two layers of 1/2 ounce copper planes
will reduce the received dose by over 90%. The leadframe for the
device which is on the bottom also provides similar shielding.
If a device is expected to pass through luggage X-ray machines
numerous times, it is advised to mount a 2-layer (minimum) PC
board on the top, along with a ground plane underneath, which will
effectively shield it from 50 to 100 passes through the machine.
Since these machines vary in X-ray dose delivered, it is difficult to
produce an accurate maximum pass recommendation.
Noise Performance and Reduction
The output noise voltage in a 0.1Hz to 10Hz bandwidth is typically
4.5µVP-P. The noise measurement is made with a bandpass filter
made of a 1-pole high-pass filter with a corner frequency at 0.1Hz
and a 2-pole low-pass filter with a corner frequency at 12.6Hz to
create a filter with a 9.9Hz bandwidth. Noise in the 10kHz to 1MHz
bandwidth is approximately 40µVP-P with no capacitance on the
output. This noise measurement is made with a 2 decade
bandpass filter made of a 1-pole high-pass filter with a corner
frequency at 1/10 of the center frequency and 1-pole low-pass
filter with a corner frequency at 10 times the center frequency.
Load capacitance up to 1000pF can be added but will result in
only marginal improvements in output noise and transient
response. The output stage of the ISL21007 is not designed to
drive heavily capacitive loads, so for load capacitances above
0.001µF, the noise reduction network shown in Figure 55 is
recommended. This network reduces noise significantly over the
full bandwidth. Noise is reduced to less than 20µVP-P from 1Hz to
1MHz using this network with a 0.01µF capacitor and a 2kΩ
resistor in series with a 10µF capacitor. Also, transient response is
improved with higher value output capacitor. The 0.01µF value can
be increased for better load transient response with little sacrifice
in output stability.
17
Turn-On Time
The ISL21007 devices have low supply current and thus the time
to bias up internal circuitry to final values will be longer than with
higher power references. Normal turn-on time is typically 120µs.
This is shown in Figure 10. Circuit design must take this into
account when looking at power-up delays or sequencing.
Temperature Coefficient
The limits stated for temperature coefficient (tempco) are governed
by the method of measurement. The overwhelming standard for
specifying the temperature drift of a reference is to measure the
reference voltage at two temperatures, take the total variation,
(VHIGH – VLOW), and divide by the temperature extremes of
measurement (THIGH – TLOW). The result is divided by the nominal
reference voltage (at T = +25°C) and multiplied by 106 to yield
ppm/°C. This is the “Box” method for specifying temperature
coefficient.
Output Voltage Adjustment
The output voltage can be adjusted up or down by 2.5% by placing a
potentiometer from VOUT to ground, and connecting the wiper to the
TRIM pin. The TRIM input is high impedance, so no series resistance
is needed. The resistor in the potentiometer should be a low tempco
(<50ppm/°C) and the resulting voltage divider should have very low
tempco <5ppm/°C. A digital potentiometer such as the ISL95810
provides a low tempco resistance and excellent resistor and tempco
matching for trim applications. See Figure 59 and TB473 for further
information.
VIN = 5.0V
10µF
0.1µF
VIN
ISL21007
VO
GND
2kΩ
0.01µF
10µF
FIGURE 55. HANDLING HIGH LOAD CAPACITANCE
FN6326.8
July 14, 2011
ISL21007
Typical Application Circuits
VIN = +5.0V
R = 200Ω
2N2905
VIN
ISL21007 VOUT
VOUT = 2.500V
2.5V/50mA
0.001µF
GND
FIGURE 56. PRECISION 2.500V 50mA REFERENCE
+2.7 TO 5.5V
10µF
0.1µF
VIN
VOUT
ISL21007-25
VOUT = 2.500V
GND
0.001µF
VCC
RH
VOUT
X9119
(UNBUFFERED)
+
SDA
2-WIRE BUS
EL8178
SCL
VSS
–
VOUT
(BUFFERED)
RL
FIGURE 57. 2.500V FULL SCALE LOW-DRIFT, LOW NOISE, 10-BIT ADJUSTABLE VOLTAGE SOURCE
+2.7 TO 5.5V
0.1µF
10µF
VIN
EL8178
VOUT
ISL21007-12
+
VOUT SENSE
–
LOAD
GND
FIGURE 58. KELVIN SENSED LOAD
18
FN6326.8
July 14, 2011
ISL21007
Typical Application Circuits (Continued)
10µF
+2.7 TO 5.5V
0.1µF
VIN
2.5V ±2.5%
VOUT
ISL21007-12
TRIM
GND
I2C BUS
SDA
VCC
SCL
ISL95810
VSS
RH
RL
FIGURE 59. OUTPUT ADJUSTMENT USING THE TRIM PIN
For additional products, see www.intersil.com/product_tree
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
19
FN6326.8
July 14, 2011
ISL21007
Package Outline Drawing
M8.15
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE
Rev 3, 3/11
DETAIL "A"
1.27 (0.050)
0.40 (0.016)
INDEX
6.20 (0.244)
5.80 (0.228)
AREA
0.50 (0.20)
x 45°
0.25 (0.01)
4.00 (0.157)
3.80 (0.150)
1
2
8°
0°
3
0.25 (0.010)
0.19 (0.008)
SIDE VIEW “B”
TOP VIEW
2.20 (0.087)
SEATING PLANE
5.00 (0.197)
4.80 (0.189)
1.75 (0.069)
1.35 (0.053)
1
8
2
7
0.60 (0.023)
1.27 (0.050)
3
6
4
5
-C-
1.27 (0.050)
0.51(0.020)
0.33(0.013)
SIDE VIEW “A
0.25(0.010)
0.10(0.004)
5.20(0.205)
TYPICAL RECOMMENDED LAND PATTERN
NOTES:
1. Dimensioning and tolerancing per ANSI Y14.5M-1982.
2. Package length does not include mold flash, protrusions or gate burrs.
Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006
inch) per side.
3. Package width does not include interlead flash or protrusions. Interlead
flash and protrusions shall not exceed 0.25mm (0.010 inch) per side.
4. The chamfer on the body is optional. If it is not present, a visual index
feature must be located within the crosshatched area.
5. Terminal numbers are shown for reference only.
6. The lead width as measured 0.36mm (0.014 inch) or greater above the
seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch).
7. Controlling dimension: MILLIMETER. Converted inch dimensions are not
necessarily exact.
8. This outline conforms to JEDEC publication MS-012-AA ISSUE C.
20
FN6326.8
July 14, 2011
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