ON MT9D115EB3STC-CR Cmos digital image sensor Datasheet

MT9D115: 1/5-Inch SOC Digital Image Sensor
Features
1/5-Inch System-On-A-Chip (SOC) CMOS Digital
Image Sensor
MT9D115 Datasheet, Rev. E
For the latest datasheet, please visit www.onsemi.com
Features
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Table 1:
Key Performance Parameters
Parameter
2 Mp resolution (1600H x 1200V)
1/5-inch optical format
Same or better image quality compared to MT9D112
Individual module ID support through one-time
programmable (OTP) memory
Surface fit lens correction (LC) to compensate for
lens/small pixel vignetting and corner color variations
Automatic functions: Exposure, white balance, black
level offset correction, flicker detection and
avoidance, color saturation control, defect
identification and correction, aperture correction,
and GPIO
Programmable controls: Exposure, white balance,
horizontal and vertical blanking, color, sharpness,
gamma, lens shading correction, horizontal and
vertical image flip, zoom, windowing, sampling rates,
and GPIO
15 frames per second (fps) at 1600H x 1200V with
moderate pixel clock frequency ( 64 MHz) to
minimize baseband reception interference and 30 fps
at 800H x 600V
2 x 2 pixel binning to improve low-light image quality
Support for external LED or xenon flash
On-chip phase-locked loop (PLL) to minimize the
number of system clocks
Low power modes to prolong battery life of portable
devices
Fail-safe I/Os with programmable output slew rate
Industry standard two-wire serial interface for
controls
10-bit parallel or MIPI serial interfaces for image data
Pixel size
Optical format
Array format (active)
Imaging area
CRA
Color filter array
Scan mode
Shutter
Input clock range
Output pixel clock
maximum
Output MIPI data rate
maximum
Max. Frame Rate
Responsivity
Signal-to-noise ratio
Dynamic range
Digital
Analog
Supply voltage
I/O
MIPI
Power consumption
Operating temperature
range
Package
Value
1.75 m x 1.75 m
1/5-inch
1600H x 1200V = 1.92 Mp
2.8 mm x 2.10 mm: 3.50 mm
diagonal (4:3 aspect ratio)
25°
RGB Bayer
Progressive
Electronic rolling shutter (ERS)
6 – 54 MHz
85 MHz
512 Mb/s
15 fps full res
30 fps 800 x 600
0.65 V/Lux-sec (550 nm)
39 dB (MAX)
63.9 dB (pixel)
1.8 V (nominal)
2.8 V (nominal)
1.8 V or 2.8 V (nominal)
1.7-1.95V
196mW1
–30°C to 70°C (at junction)
Bare die, CSP
Notes: 1. Power consumption for typical voltages at
800 x 600 video mode
Applications
• Cellular phones
• PC cameras
• PDAs
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015
MT9D115: 1/5-Inch SOC Digital Image Sensor
Ordering Information
Ordering Information
Table 2:
Available Part Numbers
Part Number
Product Description
Orderable Product Attribute Description
MT9D115D00STCK25AC1-200
2 MP 1/5" SOC
Die Sales, 200m Thickness
MT9D115EB3STC-CR
2 MP 1/5" CIS SOC
Chip Tray without Protective Film
MT9D115W00STCK25AC1-750
2 MP 1/5" SOC
Wafer Sales, 750m Thickness
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Table of Contents
Table of Contents
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
Ordering Information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
Architecture Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
Typical Connections. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
Decoupling Capacitor Recommendations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
Signal Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Control Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
Camera Functions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .37
Optics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40
Power Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41
Other Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51
GPIO Control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .53
Electrical Specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54
Appendix A- VDD_IO Current Addition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .59
Revision History. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .66
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
List of Figures
List of Figures
Figure 1:
MT9D115 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6
Figure 2:
Typical Configuration (connection) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
Figure 3:
SOC Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10
Figure 4:
Firmware Architecture. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Figure 5:
External Host Register Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12
Figure 6:
Two-Wire Serial Control Bus Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13
Figure 7:
Sensor Core Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
Figure 8:
Pixel Color Pattern Detail (Top Right Corner) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
Figure 9:
Imaging a Scene . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
Figure 10:
Six Pixels in Normal and Column Mirror Readout Modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Figure 11:
Six Rows in Normal and Row Mirror Readout Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Figure 12:
Eight Pixels in Normal and Column Skip 2X Readout Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
Figure 13:
Pixel Readout (no skipping) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20
Figure 14:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Figure 15:
Pixel Readout (x_odd_inc = 1, y_odd_inc = 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Figure 16:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
Figure 17:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 1, x_bin = 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
Figure 18:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 3, x_ybin = 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
Figure 19:
Valid Image Data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
Figure 20:
Pixel Data Timing Example. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
Figure 21:
Available Test Patterns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
Figure 22:
IFP Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
Figure 23:
Gamma Correction Curve. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30
Figure 24:
Timing of Full Frame Data or Scaled Data Passing Through the FIFO . . . . . . . . . . . . . . . . . . . . . . . . . .33
Figure 25:
Sequencer Finite State Machine . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36
Figure 26:
CRA vs. Image Height. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40
Figure 27:
Power Application Sequence Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
Figure 28:
Internal Power-On Reset. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
Figure 29:
Hard Reset Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Figure 30:
Soft Reset Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45
Figure 31:
Recommended Power Down Sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
Figure 32:
Hard Standby Mode Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .48
Figure 33:
Soft Standby Mode Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Figure 34:
Output Interface Timing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56
Figure 35:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption . . . . . . . . . . . . .59
Figure 36:
RESET_BAR Pad Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61
Figure 37:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption in the MT9D115
Sharing with Multiple Two-wire Serial Interface Devices62
Figure 38:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption in the MT9D115
Sharing with Multiple Two-wire Serial Interface Devices at Different IO Levels63
Figure 39:
System Setup with Independent Voltage Sources for MT9D115 and Controller Chip . . . . . . . . . . . .64
Figure 40:
Modifications to the Demo2 Sensor Head Board for VDD_IO Current Measurement. . . . . . . . . . . . .65
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
List of Tables
List of Tables
Table 1:
Table 2:
Table 3:
Table 4:
Table 5:
Table 6:
Table 7:
Table 8:
Table 9:
Table 10:
Table 11:
Table 12:
Table 13:
Table 14:
Table 15:
Table 16:
Table 17:
Table 18:
Table 19:
Table 20:
Table 21:
Table 22:
Table 23:
Table 24:
Table 25:
Table 26:
Table 27:
Table 28:
Table 29:
Table 30:
Key Performance Parameters. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1
Available Part Numbers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
Signal Description and Direction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
List of Drivers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
Two-Wire Serial Interface Timing Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14
Row Address Sequencing (Sampling). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
Row Address Sequencing (Binning) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
Data Formats Supported by MIPI Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32
YCbCr Output Data Ordering. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
RGB Ordering in Default Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
2-Byte RGB Format. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .34
Power Application Sequence Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42
POR Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43
Hard Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Soft Reset Signal Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45
Power Down Signal Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
Hard Standby Signal Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .48
Soft Standby Signal Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
Status of Signals During Different States. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
GPIO Related Registers and Variables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .53
Maximum Rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54
I/O Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .54
MIPI High-Speed Transmitter DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
MIPI High-Speed Transmitter AC Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
MIPI Low-Power Transmitter DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
MIPI Low-Power Transmitter AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55
AC Electricals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .56
DC Electricals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
Status of Signals During Standby State . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .60
Typical Mismatch Current in VDD_IO Due to Mismatch in RESET_BAR level and VDD_IO Level . .61
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Functional Description
Functional Description
The ON Semiconductor MT9D115 is a 1/5-inch 2 Mp CMOS digital image sensor with an
integrated advanced camera system. This camera system features a microcontroller
(MCU), a sophisticated image flow processor (IFP), MIPI and parallel output ports (only
one output port can be used at a time). The microcontroller manages all functions of the
camera system and sets key operation parameters for the sensor core to optimize the
quality of raw image data entering the IFP. The IFP will be responsible for processing and
enhancing the image.
The entire system-on-a-chip (SOC) has superior low-light performance that is particularly suitable for PC camera applications. The MT9D115 features ON Semiconductor’s
breakthrough low-noise CMOS imaging technology that achieves near-CCD image
quality (based on signal-to-noise ratio and low-light sensitivity) while maintaining the
inherent size, cost, and integration advantages of CMOS.
The ON Semiconductor MT9D115 can be operated in its default mode or programmed
for frame size, exposure, gain, and other parameters. The default mode output is a
800x600 image size at 30 frames per second (fps), assuming a 24 MHz input clock. It
outputs 8-bit data, using the parallel output port.
Architecture Overview
The MT9D115 combines a 2 Mp sensor core with an IFP to form a stand-alone solution
for both image acquisition and processing. Both the sensor core and the IFP have
internal registers that can be controlled by the user. In normal operation, an integrated
microcontroller autonomously controls most aspects of operation. The processed image
data is transmitted to the host system either through the parallel or MIPI interface.
Figure 1 shows the major functional blocks of the MT9D115.
MT9D115 Block Diagram
Sensor C ore
Im age F low Processor (IF P )
Output Interface
Formatter
Figure 1:
Pixel Array
F IF O
C olor Pipeline
MIPI
Parallel
Stats Engine
Internal R egister Bus
POR
R OM
M icrocontroller
SR AM
T w o- W ire Serial IF
System C ontrol
MT9D115 DS Rev. E Pub. 4/15 EN
M icrocontroller U nit (MCU)
6
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Typical Connections
Typical Connections
Figure 2:
Typical Configuration (connection)
MIPI
Power
TX
I/O
Power
RPULL-UP5
Slave two-wire
serial interface
VDD_IO
VDDIO_TX8
PLL
Power
VDD_PLL
Digital
Core
Power Analog
Power
VDD
VAA6
VAA_PIX6
SDATA
SCLK
SADDR
Active LOW reset
Standby mode
External clock in
(6–54 MHz)
General purpose I/Os
(FLASH, OE_BAR,
DOUT_LSB[1:0])
DOUT[7:0]
PIXCLK
RESET_BAR
To parallel
camera
port
LINE_VALID
STANDBY
EXTCLK
FRAME_VALID
GPI0[3:0]3
DOUT_N
OR4
DOUT_P
VPP7
CLK_N
To serial
camera
port2
CLK_P
DGND
GND_PLL
GND_IO
VDD_IO
0.1µF
Notes:
MT9D115 DS Rev. E Pub. 4/15 EN
AGND
VDDIO_TX/VDD
0.1µF
VAA_PIX/VDD_PLL/VAA
0.1µF
1. This typical configuration shows only one scenario out of multiple possible variations for this sensor.
2. If a MIPI Interface is not required, the following pads must be left floating: DOUT_P, DOUT_N, CLK_P,
and CLK_N.
3. The GPIO pads can serve multiple features that can be reconfigured. The function and direction will
vary by applications.
4. Only one output mode (serial or parallel) can be used at any time.
5. ON Semiconductor recommends a resistor value of 1.5Kto VDD_IO for the two-wire serial interface RPULL-UP; Higher values can be used for slower transmission speed.
6. VAA and VAA_PIX can be tied together. Although separate decoupling capacitors are recommended
for VAA and VAA_PIX, decoupling capacitors can be shared if one would like to reduce module size.
7. VPP is the OTP memory programming voltage and should be left floating during normal operation.
8. 1.8V supply is shared by MIPI interface and VDD to reduce the number of decoupling caps, and, subsequently, the module size. VDDIO_TX must be connected to a 1.8V power supply source, even
though MIPI interface is not used.
9. ON Semiconductor recommends that 0.1F and 1F decoupling capacitors for each power supply
are mounted as close as possible to the pad and that a 10F capacitor be placed nearby off-module.
Actual values and results can vary depending on layout and design considerations. Please follow
ON Semiconductor's recommended capacitor Recommendations.
10. VDD_PLL and VAA can share the same power source, in which case GND_PLL must be connected to
GND.
11. Internal pull-up in RESET_BAR pin and can be left floating when not connected.
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Decoupling Capacitor Recommendations
Decoupling Capacitor Recommendations
It is important to provide clean, well-regulated power to each power supply. The
customer is ultimately responsible for ensuring that clean power is provided for their
own designs because hardware design is influenced by many factors, including layout,
operating conditions, and component selection.
The recommendations for capacitor placement and values listed below are based on the
ON Semiconductor internal demo camera design and verified in hardware.
ON Semiconductor recommends the following, in order of preference:
1. Mount 0.1F and 1F decoupling capacitors for each power supply as close as possible to the pad and place a 10F capacitor nearby off-module.
2. If module limitations allow for only six decoupling capacitors for a three-regulator
design (VDD1V2 tied to external regulator), use a 0.1F and 1F capacitor for each of
the three regulated supplies. ON Semiconductor also recommends placing a 10F
capacitor for each supply off-module, but close to each supply.
3. If module limitations allow for only three decoupling capacitors, use a 1µF capacitor
(preferred) or a 0.1µF capacitor for each of the three regulated supplies. ON Semiconductor also recommends placing a 10µF capacitor for each supply off-module but
close to each supply.
4. Give priority to the VAA supply for additional decoupling capacitors.
ON Semiconductor does not recommend inductive filtering components.
Follow best practices when performing physical layout. Refer to technical note TN-09131.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Signal Descriptions
Signal Descriptions
Table 3:
Signal Description and Direction
Name
Type
Description
STANDBY
Input
Hardware standby
EXTCLK
Input
External clock input
Note
SADDR
Input
Two-wire interface device select address
SCLK
Input
Two-wire interface serial clock
RESET_BAR
Input
Hardware reset
CLK_N
Output
MIPI differential clock N
5
CLK_P
Output
MIPI differential clock P
5
DOUT_N
Output
MIPI differential data N
5
DOUT_P
Output
MIPI differential data P
5
DOUT[7:0]
Output
Parallel image data
1
FRAME_VALID
Output
Parallel pixel bus frame valid
1
4
LINE_VALID
Output
Parallel pixel bus line valid
1
PIXCLK
Output
Parallel pixel bus pixel clock
1
SDATA
Bidirectional
Two-wire interface serial data
Bidirectional/Output
2
2
GPIO_3/OE_BAR
Bidirectional/Output
General-purpose I/O or LSB for Raw 10 data output
during SOC Bypass
General-purpose I/O or LSB for Raw 10 data output
during SOC Bypass
General-purpose I/O or output enable
GPIO_2/FLASH
Bidirectional/Output
General-purpose I/O or flash control
VAA
Supply
Analog core power source 2.8V nominal
VAA_PIX
Supply
Analog core power source 2.8V nominal
VDD
Supply
Digital core power source 1.8V nominal
VDD_IO
Supply
Digital IO power source 1.8V or 2.8V nominal
VDD_PLL
Supply
Digital PLL power source 2.8V nominal
VDDIO_TX
Supply
Digital MIPI IO power source 1.8V nominal.
GPIO_0/DOUT_LSB[0]
GPIO_1/DOUT_LSB[1]
Notes:
MT9D115 DS Rev. E Pub. 4/15 EN
Bidirectional/Output
2
2
6
1. In serial only mode, DOUT[7:0], PIXCLK, and GPIO[3:0] can be left floating by setting R0x0026[1] =1.
If GPIO signals are required, DOUT[7:0] and PIXCLK must be tied to DGND and OE_BAR must be tied
to VDD_IO. GPIO_3 should be configured as an input for OE_BAR function and set R0x001A[8] = 1.
2. GPIO can be left floating if not used and must be programmed as outputs.
3. Must be connected to VDD_IO, internal 100k ohms typical at 2.8V VDDIO used.
4. Can be left floating if not used.
5. Must be connected to VDD, even in designs where the MIPI interface is not used.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Architecture
The MT9D115 from ON Semiconductor is the third-generation, two-megapixel camera
SOC. It is a microprocessor-based camera system that combines a sensor core with an
image flow processor (IFP) to form a standalone solution that includes image acquisition and processing. Both the sensor core and IFP have internal registers that can be
accessed by an external host. In normal operation, the integrated system microprocessor autonomously controls most aspects of operation. The image data is transmitted
to the external host system either through a parallel bus or a serial MIPI interface (see
Figure 3).
Figure 3:
SOC Block Diagram
To external host
Always ON
Two-wire
serial I/F
slave
GPIO
Sensor
Core
1KB data
RAM
Register Bus
Master
DMA
Instruction bus
Peripheral bus (SFR)
MCU
Input to
IFP
Interface
IFP
Math Coprocessor
Sleep Unit
24KB code
ROM
Register bus (ICB)
Memory data bus
1KB patch
RAM
Output from
IFP
Interface
parallel
MT9D115 DS Rev. E Pub. 4/15 EN
10
serial
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
The external host and the integrated microprocessor (MCU) can both access all the
internal resources (RAM and registers). The external host always has higher priority. The
following sections briefly describe the functionality of each key component of the
system.
Firmware
The firmware implements all automatic camera functions, such as auto exposure (AE),
auto white balance (AWB), and flicker detection/avoidance (FD), as well as control functions such as sequencer, mode/context, and histogram (see Table 4). The firmware
consists of drivers, generally one driver for each major automatic or control function
(see Figure 4).
Table 4:
List of Drivers
ID
Figure 4:
Driver Name
Description
ID = 1
Sequencer
Controls of camera main function
ID = 2
AE
Auto exposure
ID = 3
AWB
Auto white balance
ID = 4
Flicker Detection
Flicker detection and avoidance
ID = 7
Mode/Context
Context variables
ID = 11
Histogram
Reduce image flare and analyze image histogram
Firmware Architecture
Operation
Driver
Monitor
Mode
Control
Sequencer
Auto
White
Balance
Auto Function
Driver
Flicker
Avoidance
Auto
Exposure
Hardware
RAM
MT9D115 DS Rev. E Pub. 4/15 EN
STAT
11
IFP
Core
Output
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
External Host Interface (Two-Wire Slave-Only Interface)
The MT9D115 will appear as a two-wire serial interface slave to the external host. Its
base address is selectable by the external SADDR pin input (when SADDR = 0 then base
address = 0x78; when SADDR = 1 then base address = 0x7A). There are 32K addressable 16bit registers (that is, the starting address of each register always falls into even addresses)
within the MT9D115 but not all of them are being used (see Figure 5).
Figure 5:
External Host Register Map
S O C 2 re g s
0x3 4 0 0
S O C 1 re g s
0x3 2 1 0
C O R E re g s
0x3 0 1 2
0x1 0 7 0
0x0 9 8C
0x0 1 0 2
0x0 0 0 0
G P IO re g s
X D M A re g s
R X_S S re g s
S Y S C T L re g s
0x0 0 0 0
1K B
U se r -lo a d a b le m e m o ry
1K B
D rive r V a ria b le s
Internal Memory Resource
16-bit
The MT9D115 Register Reference provides detailed register explanations. Although most
registers are self-explanatory, the next paragraphs contain enhanced information about
XDMA registers are worth explaining here.
The XDMA registers allow the external host to indirectly access the internal memory
resources of the MT9D115, which include the firmware driver variables. To access the
variables, use logical accesses provided by the XDMA registers.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
The external host interface is implemented through a two-wire interface that enables
direct read/write access to hardware registers and indirect access to firmware variables
within the MT9D115. The interface is designed to be compatible with the MIPI alliance
standard for Camera Serial Interface 2 (CSI-2) 1.0, which uses the electrical characteristics and transfer protocols of the two-wire serial interface specifications.
The interface protocol uses a master/slave model in which a master controls one or
more slave devices. The sensor acts as a slave device to the external host which acts as a
master device. The master generates a clock (SCLK) that is an input to the sensor and
used to synchronize the transactions at the interface.
Data is transferred between the master and the slave on a bidirectional serial data bus
(SDATA). Both SCLK and SDATA are pulled up to VDD_IO off-chip by a 1.5K resistor.
Either the slave or master device can drive SDATA to LOW—the interface determines
which device is allowed to drive SDATA at any given time.
Figure 6:
Two-Wire Serial Control Bus Timing
Write Sequence
tSDS
tSRTS
tSCLK
tSRTH
tSTPS
tSHAW
tAHSW
tSDH
tSTPH
SCLK
SDATA
Write Start
Write
Address
Bit 7
Write
Address
Bit 0
Read Sequence
Register
Value
Bit 0
Register
Value
Bit 7
Ack
Ack
Stop
tSDSR
tSHAR
tAHSR
tSDHR
SCLK
SDATA
Read Start
MT9D115 DS Rev. E Pub. 4/15 EN
Read
Address
Bit 7
Read
Address
Bit 0
Register
Value
Bit 7
Ack
13
Register
Value
Bit 0
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Table 5:
Two-Wire Serial Interface Timing Data
fEXTCLK = 14 MHz; VDD = 1.8V; VDD_IO = 1.8V; VAA = 2.8V; VAA_PIX = 2.8V;
VDD_PLL = 2.8V; VDD_PHY = NA; TJ = 70°C; CLOAD = 68.5pF
Symbol
f
SCLK
t
SCLK
t
r
t
SRTS
Parameter
Min
Typ
Max
Unit
Serial interface input clock
frequency
Conditions
100
–
400
kHz
Serial interface input clock period
2.5
–
10
s
SCLK duty cycle
33
50
50
%
SCLK/SDATA rise time
Start setup time
–
–
300
ns
Master write to slave
600
–
–
ns
t
SRTH
Start hold time
Master write to slave
300
–
–
ns
tSDH
SDATA hold
Master write to slave
5
–
900
ns
tSDS
SDATA setup
Master write to slave
100
–
–
ns
tSHAW
SDATA hold to ack
Master write to slave
150
–
–
ns
tAHSW
Ack hold to SDATA
Master write to slave
150
–
–
ns
tSTPS
Stop setup time
Master write to slave
300
–
–
ns
tSTPH
Stop hold time
Master write to slave
600
–
–
ns
tSHAR
SDATA hold to ack
Master read from slave
300
–
–
ns
tAHSR
Ack hold to SDATA
Master read from slave
300
–
–
ns
tSDHR
SDATA hold
Master read from slave
300
–
650
ns
tSDSR
SDATA setup
Master read from slave
300
–
–
ns
tR and tF are dependent on system-level parameters such as the value of pull-up resistor used,
how the two-wire serial bus is routed, whether there are other devices on the serial bus, and the
strength of the supply used to pull-up the serial bus.
Note:
Always-On Power Domain
The always-on power domain (AOPD) provides an area of functionality that will always
be active while power is applied to the MT9D115. The external host interface is located
in the AOPD. The domain also includes miscellaneous clock and reset controls as well as
configuration registers for the sensor core, processor core, clock configuration, and
clock reset control. The user-loadable patch memory is also included in this domain.
This memory will remain powered when the main core power is shut down using the
standby command.
Sensor Core
The sensor core of the MT9D115 is a progressive-scan sensor that generates a stream of
pixel data at a constant frame rate, qualified by LINE_VALID (LV) and FRAME_VALID
(FV). The maximum pixel rate is 30 Mp/s, corresponding to a pixel clock rate of
63.25 MHz. See Figure 7 on page 15 for a block diagram of the sensor core. It includes a
2.0Mp active-pixel array. The timing and control circuitry sequences through the rows of
the array, resetting and then reading each row in turn. In the time interval between resetting a row and reading that row, the pixels in the row integrate incident light. The exposure is controlled by varying the time interval between reset and readout. After a row is
read, data from the columns are sequenced through an analog signal chain that provides
offset correction and gain, and then through an ADC. The output from the ADC is a
10-bit value for each pixel in the array.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
The pixel array contains optically active and light-shielded (dark) pixels. The dark pixels
provide data for the offset-correction algorithms (black level control).
The sensor core contains a set of control and status registers that can be used to control
many aspects of the sensor behavior including the frame size, exposure, and gain
settings. These registers are controlled by the firmware and can be accessed through a
two-wire serial interface. Register values written to the sensor core can be overwritten by
firmware.
The output from the core is a Bayer pattern, where alternate rows are a sequence of
either green and red pixels or blue and green pixels. The offset and gain stages of the
analog signal chain provide per-color control of the pixel data.
A flash strobe output signal is provided to allow an external xenon or LED light source to
synchronize with the sensor exposure time.
Figure 7:
Sensor Core Block Diagram
Control Registers
PLL
Timing
and
Control
Active -Pixel
Sensor (APS )
Array
Gr and Gb
Channel
Analog
Processing
Gr and Gb
Red and Blue
ADC
Gr and Gb
Red and Blue
Digital
Processing
10-bit
Data Out
Red and Blue
Channel
Sensor Core
Pixel Array
The sensor core uses a Bayer color pattern (see Figure 8). The even-numbered rows
contain green and red pixels. The odd-numbered rows contain blue and green pixels.
Even-numbered columns contain green and blue pixels. Odd-numbered columns
contain red and green pixels.
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Figure 8:
Pixel Color Pattern Detail (Top Right Corner)
Column Readout Direction
..
.
Black Pixels
First Clear
Pixel
Row
Readout
Direction
B G2 B G2 B G2
... Gr R Gr R Gr R
B Gb B Gb B G2
Gr R Gr R Gr R
B Gb B Gb B G2
Default Readout Order
By convention, the sensor core pixel array is shown with pixel (0,0) in the top right
corner. This reflects the actual layout of the array on the die. When the sensor is operating in a system, the active surface of the sensor faces the scene (see Figure 9).
When the image is read out of the sensor, it is read one row at a time, with the rows and
columns sequenced. By convention, data from the sensor is shown with the first pixel
read out in the case of the sensor core in the top left corner.
Figure 9:
Imaging a Scene
Lens
Scene
Sensor (rear view)
Row
Readout
Order
Column Readout Order
Pixel (0,0)
Analog Processing
Analog Readout Channel
The sensor core features an analog readout channel, (see Figure 7 on page 15). The
readout channel consists of a gain stage, a sample-and-hold stage with black level calibration capability, and a 10-bit ADC.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Gain Options
The MT9D115 provides per-color gain control as well as the option of global gain
control. The per-color and global gain control can be used interchangeably. A WRITE to
a global gain register is aliased as a WRITE of the same data to the four associated
color-dependent gain registers.
Integer digital gains in the range 0–7 can be programmed. A digital gain of 0 sets all pixel
values to 0 (the pixel data will simply represent the value applied by the pedestal block).
Gain settings are updated in every frame by the MCU auto functions such as AWB, AE,
and FD. To make manual adjustments to gain settings, the MCU automatic exposure and
automatic white balance adjustment features must be disabled.
Integration Time
The integration time (exposure) of the MT9D115 is controlled by variables. While coarse
integration time controls the integration duration in terms of row times, fine integration
time allows for sub-row times accuracy in terms of pixel clocks. Integration time is
updated in every frame by the MCU auto feature. Disable the MCU auto features to
make manual adjustments to integration time.
Because of the basic operation of the Electronic Roller Shutter (ERS), it is not advisable
to set an integration time that is greater than the frame time.
It is not necessary to reprogram the frame time on the MT9D115 to make longer integration times available because the frame time adjusts automatically. However, long integration times increase the likelihood of image degradation because of increased
accumulation of dark current.
If the integration time is changed while FV is asserted for frame n, the first frame output
using the new integration time is frame (n + 2). The sequence is as follows:
1. During frame n, the new integration time is held in the pending register.
2. At the start of frame (n + 1), the new integration time is transferred to the live register.
Integration for each row of frame (n + 1) has been completed using the old integration
time.
3. The earliest time that a row can start integrating using the new integration time is
immediately after that row has been read for frame (n + 1).
4. When frame (n + 2) is read out, it will have been integrated using the new integration
time.
If the integration time is changed on successive frames, each value written will be
applied for a single frame; the latency between writing a value and it affecting the frame
readout remains at two frames.
When the integration time and the gain are changed at the same time, the gain update is
held off by one frame so that the first frame output with the new integration time also
has the new gain applied.
External Generated Master Clock
If application does not use PLL, then the clock bypass bit in R0x0014 must be set before
exiting soft standby state as follows:
1. Write 0x25F9 to R0x0014 to set clock bypass bit
2. Delay min. of 100 ms
3. Write 0x4028 to R0x0018 to exit from soft standby state
4. After successful exit from soft standby state, disable the clock bypass bit by writing
0x21F9 to R0x0014
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
PLL-Generated Master Clock
The PLL can generate a master clock signal whose frequency is up to 85 MHz (input
clock from 6 MHz through 54 MHz).
PLL Setup
Because the input clock frequency is unknown, the sensor starts up with the PLL
disabled. The PLL takes time to power up. During this time, the behavior of its output
clock signal is not guaranteed. The PLL output frequency is determined by two
constants, M and N, and the input clock frequency.
Fin  2  M
VCO = ----------------------------N+1
VCO
PLL output frequency = ---------------P1 + 1
(EQ 1)
Digital Processing
Readout Options
The sensor core supports different readout options to modify the image before it is sent
to the IFP. The readout can be limited to a specific window of the original pixel array.
For preview modes, the sensor core supports both skipping and pixel averaging in
x and y directions.
By changing the readout direction the image can be flipped in the vertical direction
and/or mirrored in the horizontal direction.
Window Size
The image output size is set with registers x_addr_start, x_addr_end, y_addr_start, and
y_addr_end. The edge pixels in the 1600 x 1200 array are present to avoid edge defects
and should not be included in the visible window. Binning will change the image output
size.
Readout Modes
Horizontal Mirror
When the sensor is configured to mirror the image horizontally, the order of pixel
readout within a row is reversed, so that readout starts from x_addr_end and ends at
x_addr_start. Figure 10 shows a sequence of 6 pixels being read out with normal readout
and reverse readout. The SOC corrects for this change in sensor core output.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Figure 10:
Six Pixels in Normal and Column Mirror Readout Modes
LINE_VALID
Normal readout
DOUT[9:0]
G0
(9:0)
R0
(9:0)
G1
(9:0)
R1
(9:0)
G2
(9:0)
R2
(9:0)
R2
(9:0)
G2
(9:0)
R1
(9:0)
G1
(9:0)
R0
(9:0)
G0
(9:0)
Reverse readout
DOUT[9:0]
Vertical Flip
When the sensor is configured to flip the image vertically, the order in which pixel rows
are read out is reversed, so that row readout starts from y_addr_end and ends at y_addr_start. Figure 11 shows a sequence of six rows being read out with normal readout and
reverse readout. The SOC corrects for this change in sensor core output.
Figure 11:
Six Rows in Normal and Row Mirror Readout Modes
FRAME_VALID
Normal readout
Row0
(9:0)
Row1
(9:0)
Row2
(9:0)
Row3
(9:0)
Row4
(9:0)
Row5
(9:0)
Row5
(9:0)
Row4
(9:0)
Row3
(9:0)
Row2
(9:0)
Row1
(9:0)
Row0
(9:0)
Reverse readout
DOUT[9:0]
Column and Row Skip
The sensor core supports subsampling. Subsampling reduces the amount of data
processed by the analog signal chain in the sensor and thereby allows the frame rate to
be increased. This reduces the amount of row and column data processed and is equivalent to the skip2 readout mode provided by earlier ON Semiconductor image sensors.
Set the proper image output and crop sizes before enabling subsampling.
Figure 12:
Eight Pixels in Normal and Column Skip 2X Readout Modes
LINE_VALID
Normal readout
DOUT[9:0]
G0
(9:0)
R0
(9:0)
G1
(9:0)
R1
(9:0)
G0
(9:0)
R0
(9:0)
G2
(9:0)
R2
(9:0)
G2
(9:0)
R2
(9:0)
G3
(9:0)
R3
(9:0)
LINE_VALID
Column skip readout
DOUT[9:0]
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Pixel Readouts
Figures 13 through Figure 16 on page 22 show a sequence of data being read out with no
skipping, with x_odd_inc = 3 and y_odd_inc = 1, with x_odd_inc = 1 and y_odd_inc = 3,
and with x_odd_inc = 3 and y_odd_inc = 3.
Figure 13:
Pixel Readout (no skipping)
X Incrementing
Y Incrementing
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Figure 14:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 1)
X Incrementing
Y Incrementing
Figure 15:
Pixel Readout (x_odd_inc = 1, y_odd_inc = 3)
X Incrementing
Y Incrementing
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Architecture
Figure 16:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 3)
X Incrementing
Y Incrementing
Programming Restrictions when Skipping
When skipping is enabled as a viewfinder mode, and the sensor is switched back and
forth between full resolution and skipping, keep line_length_pck constant. This allows
the same integration times to be used in each mode.
When subsampling is enabled, it might be necessary to adjust the x_addr_end and y_addr_end settings. The values for these registers must correspond with rows/ columns that
form part of the subsampling sequence. Use the following rules to make the adjustment.
remainder = (addr_end – addr_start + 1  AND 4
(EQ 2)
if (remainder == 0) addr_end = addr_end – 2
(EQ 3)
Table 6 shows the row address sequencing for normal and subsampled (with
y_odd_inc = 3) readout. The same sequencing applies to column addresses for subsampled readout. Because the subsampling sequence only reads half of the rows and
columns, there are two possible subsampling sequences, depending upon the alignment
of the start address.
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Architecture
Table 6:
Row Address Sequencing (Sampling)
Normal
Subsampled Sequence 1
Subsampled Sequence 2
0
1
2
3
4
5
6
7
0
1
No data
No data
4
5
No data
No data
No data
No data
2
3
No data
No data
6
7
Binning
The MT9D115 sensor core supports 2 x 1 and 2 x 2 analog binning (column binning, also
called x-binning and row/column binning, also called xy-binning). Binning has many of
the same characteristics as subsampling. However, because binning gathers image data
from all pixels in the active window, rather than from a subset of pixels, it achieves superior image quality and avoids the aliasing artifacts that can be a characteristic side effect
of subsampling.
Enable binning by selecting the appropriate subsampling settings (x_odd_inc = 3 and
y_odd_inc = 1 for x-binning, x_odd_inc = 3 and y_odd_inc = 3 for xy-binning) and setting
the appropriate binning bit in read_mode register. As for subsampling, x_addr_end and
y_addr_end might require adjustment when binning is enabled.
The effect of the different subsampling settings is shown in Figure 17 and in Figure 18 on
page 24.
Figure 17:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 1, x_bin = 1)
X incrementing
Y incrementing
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Architecture
Figure 18:
Pixel Readout (x_odd_inc = 3, y_odd_inc = 3, x_ybin = 1)
X incrementing
Y incrementing
Binning Limitations
Binning requires a different sequencing of the pixel array and imposes different timing
limits on the operation of the sensor. In particular, xy-binning requires two READ operations from the pixel array for each line of output data, which has the effect of increasing
the minimum line blanking time.
As a result, when xy-binning is enabled, some of the programming limits declared in the
parameter limit registers are no longer valid. In addition, the default values for some of
the manufacturer-specific registers need to be reprogrammed. None of these adjustments are required for x-binning. The sensor must be taken out of streaming mode
before switching between binned and non-binned operation. The row addresses for
various binning modes are shown in Table 7.
Table 7:
Row Address Sequencing (Binning)
Normal
Binning Sequence 1
Binning Sequence 2
0
1
2
3
4
5
6
7
0, 2
1, 3
No data
No data
4, 6
5, 7
No data
No data
No data
No data
2, 4
3, 5
No data
No data
6, 8
7, 9
Raw Data Format
The sensor core image data is read out in a progressive scan. Valid image data is
surrounded by horizontal blanking and vertical blanking, (see Figure 19). The amount of
horizontal blanking and vertical blanking is programmable. LV is HIGH during the
shaded region of the figure.
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Architecture
Figure 19:
Valid Image Data
P0,0 P0,1 P0,2................................P0,n-1 P0,n
P1,0 P1,1 P1,2................................P1,n-1 P1,n
00 00 00 ............. 00 00 00
00 00 00 ............. 00 00 00
HORIZONTAL
BLANKING
VALID IMAGE
Pm-1,0 Pm-1,1.........................Pm-1,n-1 Pm-1,n
Pm,0 Pm,1.........................Pm,n-1 Pm,n
00 00 00 ............. 00 00 00
00 00 00 ............. 00 00 00
00 00 00 ..................................... 00 00 00
00 00 00 ..................................... 00 00 00
00 00 00 ............. 00 00 00
00 00 00 ............. 00 00 00
VERTICAL/HORIZONTAL
BLANKING
VERTICAL BLANKING
00 00 00 ............. 00 00 00
00 00 00 ............. 00 00 00
00 00 00 ................................ 00 00 00
00 00 00 ................................ 00 00 00
Raw Data Timing
The sensor core output data is synchronized with the PIXCLK output. When LV is HIGH,
one pixel’s data is output on the 10-bit DOUT output bus every PIXCLK period. By
default, the PIXCLK signal runs at the same frequency as the master clock, and its falling
edges occur one-half of a master clock period after transitions on LV, FV, and DOUT[9:0]
(see Figure 20). This allows PIXCLK to be used as a clock to sample the data. PIXCLK is
continuously enabled, even during the blanking period.
Figure 20:
Pixel Data Timing Example
LINE_VALID
PIXCLK
Blanking
DOUT0-DOUT9
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Valid Image Data
P0 (9:0)
P1 (9:0)
P2 (9:0)
25
P3 (9:0)
Blanking
P4 (9:0)
Pn-1 (9:0)
Pn (9:0)
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Input Interface to Image Flow Processor
The input interface to the IFP is the front end of the IFP, in which it will choose between
the sensor core output or a test pattern generator output. During normal operation, a
stream of raw Bayer image data from the sensor is continuously fed into the IFP. For
testing purposes, the test generator output is selected. The generator provides a selection of test patterns sufficient for basic testing of the IFP. Program variable (ID=7,
Offset=0x66) followed by REFRESH command to the sequencer in order to access
different test patterns (see Figure 21).
Depending on which test pattern has been selected, the user might need to program
additional registers in order to see the intended effects.
Figure 21:
Available Test Patterns
Test Pattern
Flat Field
mode_common_
mode_settings
test_mode
(ID=7, Offset=0x66)=2
Color Bar
mode_common_
mode_settings
test_mode
(ID=7, Offset=0x66)=3
Pseudo-Random
Horizontal Stripes
Example
mode_common
settings_test_mode
(ID=7, Offset=0x66)=1
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x1ff
test_pxl_g2 (R0x0106) = 0x1ff
test_pxl_blue (R0x0108) = 0x1ff
Vertical Ramp
Vertical Stripes
MT9D115 DS Rev. E Pub. 4/15 EN
Registers/Variables
mode_common
settings_test_mode
(ID=7, Offset=0x66)=4
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x17d
test_pxl_g2 (R0x0106) = 0x000
test_pxl_blue (R0x0108) = 0x000
mode_common_mode
settings_test_mode
(ID=7, Offset=0x66)=5
mode_common
settings_test_mode
(ID=7, Offset=0x66)=6
test_pxl_red (R0x0102) = 0x1ff
test_pxl_g1 (R0x0104) = 0x17d
test_pxl_g2 (R0x0106) = 0x000
test_pxl_blue (R0x0108) = 0x000
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Architecture
Image Flow Processor
Most IFP functions can be controlled directly by the MCU. The external host will control
it indirectly through the driver variables. IFP processing can be broken into three
different phases: pixel reconstruction, color rendering/statistics collection, and digital
scaling/output format. Figure 22 shows a simplified IFP block diagram and the
operating color space at each processing phase.
Figure 22:
IFP Block Diagram
Pixel Array
ADC
Raw Data Bypass
Test Pattern
Generator
Black
Level
Subtraction
Digital
Gain
Control,
Shading
Correction
RAW 10
Pixel Reconstruction
Defect Correction,
Nosie Reduction,
Color Interpolation
8-bit RGB
RGB to YUV
Statistics
Engine
Color Correction
Color Kill
Color Rendering/Statistics Collection
Digital Scaling/Output Format
Aperture
8-bit YUV
Correction
Scaler
Gamma
Correction
(10-to-8 Lookup )
Output Formatting
YUV to RGB
8-Bit RGB
Output
FIFO
Output
Format
MIPI
Serial Output
Parallel Output
Pixel Reconstruction (Lens Shading Correction)
First Black Level Subtraction and Digital Gain
Image stream processing starts with black level subtraction and multiplication of all
pixel values by a programmable digital gain. Both operations can be independently set
to separate values for each color channel (R, Gr, Gb, B). Independent color channel
digital gain can be adjusted with registers. Independent color channel black level adjustments can also be made. If the black level subtraction produces a negative result for a
particular pixel, the value of this pixel is set to “0.”
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Architecture
Shading Correction (SC)
Lenses tend to produce images whose brightness is significantly attenuated near the
edges. Other factors also cause fixed pattern signal gradients in images captured by
image sensors. The cumulative result of all factors is known as image shading. The
MT9D115 has an embedded shading correction module that can be programmed to
counter the shading effects on each individual R, Gb, Gr, and B color signal.
The Correction Function
Color-dependent solutions are calibrated using the sensor, lens system, and an image of
an evenly illuminated, featureless grey calibration field. The color correction functions
can be derived from the resulting image.
The correction functions can then be applied to each pixel value to equalize the
response across the image as follows:
P corrected (row,col)=P sensor (row,col)*f(row,col)
(EQ 4)
where P are the pixel values and f is the color dependent correction functions for each
color channel.
Defect Correction
The IFP performs continuous defect correction that can mask pixel array defects such as
high dark-current (hot) pixels and pixels that are darker or brighter than their neighbors
due to photoresponse nonuniformity. The module is edge-aware with exposure that is
based on configurable thresholds. The thresholds are changed continuously based on
the brightness of the current scene.
Noise Reduction
Noise reduction can be enabled or disabled. Thresholds can be set through register
settings.
Color Interpolation and Edge Detection
In the raw data stream fed by the sensor core to the IFP, each pixel is represented by a
10-bit integer number, which can be considered proportional to the pixel's response to a
one-color light stimulus, red, green, or blue, depending on the pixel's position under the
color filter array. Initial data processing steps—up to and including the defect correction—preserve the one-color-per-pixel nature of the data stream. After the defect correction, the data stream must be converted to a three-colors-per-pixel stream appropriate
for standard color processing. The conversion is done by an edge-sensitive color interpolation module. The module pads the incomplete color information available for each
pixel with information extracted from an appropriate set of neighboring pixels. The
algorithm used to select this set and extract the information seeks the best compromise
between preserving edges and filtering out high frequency noise in flat field areas. The
edge threshold can be set through register settings.
Aperture Correction
To increase image sharpness, a programmable 2D aperture correction (sharpening filter)
is applied to color-corrected image data. The gain and threshold for 2D correction can
be defined through variable settings.
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Architecture
Color Rendering/Statistics Collection (Color Correction)
Color Correction
To achieve good color fidelity of the IFP output, interpolated RGB values of all pixels are
subjected to color correction. The IFP multiplies each vector of three pixel colors by a
3 x 3 color correction matrix. The three components of the resulting color vector are all
sums of three 10-bit numbers. Because such sums can have up to 12 significant bits, the
bit width of the image data stream is widened to 12 bits per color (36 bits per pixel). The
color correction matrix can be programmed by the user or automatically selected by the
AWB algorithm implemented in the IFP. Ideally, color correction should produce output
colors that are independent of the spectral sensitivity and color crosstalk characteristics
of the image sensor. The optimal values of the color correction matrix elements depend
on those sensor characteristics and on the spectrum of light incident on the sensor. The
color correction variables can be adjusted through register settings.
Image Cropping
By configuring the cropped and output windows to various sizes, different zooming
levels (for example 4X, 2X, and 1X) can be achieved. The location of the cropped window
is also configurable so that panning is also supported. A separate cropped window is
defined for context A and context B. In both contexts, the height and width definitions
for the output window must be equal to or smaller than the cropped image.
Gamma Correction
The gamma correction curve (see Figure 23 on page 30) is implemented as a piecewise
linear function with 19 knee points, taking 12-bit arguments and mapping them to 8-bit
output. The abscissas of the knee points are fixed at 0, 64, 128, 256, 512, 768, 1024, 1280,
1536, 1792, 2048, 2304, 2560, 2816, 3072, 3328, 3584, 3840, and 4096. The 8-bit ordinates
are programmable through IFP registers.
The MT9D115 IFP includes a block for gamma correction that can adjust its shape based
on brightness to enhance the performance under certain lighting conditions. Two
custom gamma correction tables can be uploaded, one corresponding to a brighter
lighting condition, the other corresponding to a darker lighting condition. At power-up,
the IFP loads the two tables with default values. The final gamma correction table used
depends on the brightness of the scene and can take the form of either uploaded tables
or an interpolated version of the two tables. A single (non-adjusting) table for all conditions can also be used.
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Architecture
Figure 23:
Gamma Correction Curve
Gamma Correction
300
Output RGB, 8-bit
250
200
150
0.45
100
50
0
0
1000
2000
3000
4000
Input RGB, 12-bit
Color Kill
A color kill circuit is included to remove high or low light color artifacts. It affects only
pixels whose luminance exceeds a certain preprogrammed threshold. The U and V
values of those pixels are attenuated proportionally to the difference between their luminance and the threshold.
Digital Scaling/Output Format
Special Effects
Special effects like negative image, sepia, or black and white can be applied to the data
stream at this point. These effects can be enabled and selected by registers.
RGB to YUV Conversion
For further processing, the data is converted from RGB color space to YUV color space.
YUV Color Filter
As an optional processing step, noise suppression by one-dimensional low-pass filtering
of Y and/or UV signals is possible. A 3- or 5-tap filter can be selected for each signal.
Image Scaling
The IFP includes a scaler module to ensure that the size of images output by the
MT9D115 can be tailored to the needs of all users. When enabled, this module performs
rescaling of incoming images—shrinks them to arbitrarily selected width and height
without reducing the field of view and without discarding any pixel values.
The scaler performs pixel binning—divides each input image into rectangular bins
corresponding to individual pixels of the desired output image, averages pixel values in
these bins, and assembles the output image from the bin averages. Pixels lying on bin
boundaries contribute to more than one bin average; their values are added to bin-wide
sums of pixel values with fractional weights. The entire procedure preserves all image
information that can be included in the downsized output image and filters out high
frequency features that could cause aliasing.
Use the image cropping and scaler module together to implement a digital zoom and
pan. If the scaler is programmed to output images smaller than images coming from the
sensor core, zoom effect can be produced by cropping the latter from their maximum
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Architecture
size down to the size of the output images. The ratio of these two sizes determines the
maximum attainable zoom factor. For example, a 1600 x 1200 image rendered on a
250 x 150 display can be zoomed up to eight times, because
1280/160 = 1024/128 = 8. A panning effect can be achieved by fixing the size of the cropping window and moving it around the pixel array.
YUV-to-RGB/YUV Conversion and Output Formatting
The YUV data stream emerging from the scaling module can either exit the color pipeline as-is or be converted before exit to an alternative YUV or RGB data format.
Color Conversion Formulas
Y'U'V'
This conversion is ITU-R BT.601 scaled to make YUV range from 0 through 255. This
setting is recommended for JPEG encoding and is the most popular.
Y  = 0.299  R  + 0.587  G  + 0.114  B 
(EQ 5)
U  = 0.564  (B  – Y   + 128
(EQ 6)
V  = 0.713  (R  – Y   + 128
(EQ 7)
There is an option where 128 is not added to U'V'.
Y'Cb'Cr' Using sRGB Formulas
The MT9D115 implements the sRGB standard. This option provides YCbCr coefficients
for a correct 4:2:2 transmission.
16 < Y’< 235; 16 < Cb < 240; 16 < Cr < 240; and 0  RGB  255
Note:
Y  = (0.2126  R  + 0.7152  G  + 0.0722  B    (219  256) + 16
(EQ 8)
Cb  = 0.5389  (B  – Y    (224  256) + 128
(EQ 9)
Cr  = 0.635  (R  – Y    (224  256) + 128
(EQ 10)
Y'U'V' Using sRGB Formulas
Similar to the previous set of formulas, but has YUV spanning a range of 0 through 255.
Y  = 0.2126  R' + 0.7152  G' + 0.0722  B'
(EQ 11)
U  = 0.5389   B' – Y'  + 128 = – 0.1146  R' – 0.3854  G' + 0.5  B' + 128
(EQ 12)
V  = 0.635  (R  – Y   + 128 = 0.5  R ' – 0.4542  G' – 0.0458  B ' + 128
(EQ 13)
There is an option to disable adding 128 to U'V'. The reverse transform is as follows:
MT9D115 DS Rev. E Pub. 4/15 EN
R  = Y + 1.5748   V – 128 
(EQ 14)
G  = Y – 0.1873  (U – 128  – 0.4681  (V – 128)
(EQ 15)
B  = Y + 1.8556  (U – 128)
(EQ 16)
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Architecture
Output Interface from IFP
The output interface contains parallel image bus, MIPI serial bus interfaces, and walking
1s connectivity test generator.
Parallel and MIPI Output
The user can select to use either the serial MIPI output or the 10-bit parallel output to
transmit the data. Only one of the output modes can be used at any time.
The parallel output can be used with an output FIFO whose memory is shared with the
MIPI output FIFO to retain a constant pixel output clock independent from the scaling
factor.
When scaling the image or skipping lines, the data would be generated in bursts and the
pixel clock would turn on and off in intervals, which might lead to EMI problems. The
output FIFO will group all active pixel data together so the pixel clock can be run at a
constant speed.
The MIPI output transmitter implements a serial differential sub-LVDS transmitter
capable of up to 512 Mb/s. It supports multiple formats, error checking, and custom
short packets. The MIPI clock is defined as half the data rate frequency.
The virtual channel could be used by host MIPI RX circuits to differentiate between
preview and capture image data if the FW changes the channel number when switching
between contexts. The host cannot adequately time this switching of contexts and so
cannot use channel number in this way without FW support.
The hardware supports a configurable MIPI virtual channel in the MIPI Control register
(R0x3400). Firmware provides two variables that allow the MIPI virtual channel to be
changed according to context (preview/A, capture/B). The host can specify what
channel is used for which context through these variables.
Table 8:
Data Formats Supported by MIPI Interface
Note:
MT9D115 DS Rev. E Pub. 4/15 EN
Data Format
Data Type
YUV 422 8-bit
565RGB
555RGB
444RGB
RAW8
RAW10
0x1E
0x22
0x21
0x20
0x2A
0x2B
Data will be packed as RAW8 if the data type specified does not match any of the above data
types.
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Architecture
Output Format and Timing
YUV/RGB Output
YUV or RGB data can be output either directly from the output formatting block or
through a FIFO buffer with a capacity of 1024 bytes. This size is large enough to hold
one-fourth of a scan line at full resolution. Buffering of data is a way to equalize the data
output rate when image scaling is used. Scaling produces an intermittent data stream
consisting of short high-rate bursts separated by idle periods. High pixel clock frequency
during bursts may be undesirable due to EMI concerns.
Figure 24 shows the output timing of a YUV/RGB scan line when a scaled data stream is
equalized by buffering or when no scaling takes place. The pixel clock frequency
remains constant during each LV high period. Scaled data is output at a lower frequency
than full size frames, which helps to reduce EMI.
Figure 24:
Timing of Full Frame Data or Scaled Data Passing Through the FIFO
YUV/RGB Data Ordering
The MT9D115 supports swapping YCbCr mode (see Table 9).
Table 9:
YCbCr Output Data Ordering
Mode
Data Sequence
Default (no swap)
Swapped CrCb
Swapped YC
Swapped CrCb, YC
Yi
Yi
Cbi
Cri
Cbi
Cri
Yi
Yi
Cri
Cbi
Yi+1
Yi+1
Yi+1
Yi+1
Cri
Cbi
The RGB output data ordering in default mode is shown in Table 10. The odd and even
bytes are swapped when luma/chroma swap is enabled. R and B channels are bitwise
swapped when chroma swap is enabled.
Table 10:
RGB Ordering in Default Mode
MT9D115 DS Rev. E Pub. 4/15 EN
Mode (Swap Disabled)
Byte
D7D6D5D4D3D2D1D0
565RGB
Odd
Even
R7R6R5R4R3G7G6G5
G4G3G2B7B6B5B4B3
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Architecture
Table 10:
RGB Ordering in Default Mode (continued)
Mode (Swap Disabled)
Byte
D7D6D5D4D3D2D1D0
555RGB
Odd
Even
Odd
Even
Odd
Even
0 R7R6R5R4R3G7G6
G4G3G2B7B6B5B4B3
R7R6R5R4G7G6G5G4
B7B6B5B4 0 0 0 0
0 0 0 0 R7R66R5R4
G7G6G5G4B7B6B5B4
444xRGB
x444RGB
10-Bit Bypass Output
Raw 10-bit Bayer data from the sensor core can be output in bypass mode in two ways:
1. Using eight data output signals (DOUT[7:0]) and GPIO[1:0]. The GPIO signals are the
lowest two bits of data.
2. Using only eight signals (DOUT[7:0]) and a special 8 + 2 data format, shown in
Table 11.
Table 11:
2-Byte RGB Format
Byte
Bits Used
Bit Sequence
Odd bytes
8 data bits
D9D8D7D6D5D4D3D2
Even bytes
2 data bits + 6 unused bits
0 0 0 0 0 0 D 1D 0
FIFO
During normal pipeline operation, the output data rate is determined by a number of
factors: input image size, degree of scaling, and sensor operation mode. As these parameters change during normal sensor operation, output frequency changes. This output
frequency may generate RF noise, interfering with the mobile device. By using an output
FIFO to maintain a constant output clock frequency, noise is easily filtered out.
The FIFO accumulates data and after a certain number of bytes are stored, it will output
them in a single burst, making sure that the data rate within the burst remains constant.
This approach utilizes a free-running clock, thus making possible minimal RF interference.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Control Functions
Control Functions
Sequencer: Camera Operating System
The sequencer is a finite state machine that controls the general operations of the
camera and switching between operating modes. Camera operation is organized in
states such as enter preview, preview, leave preview, enter capture, and capture. The
sequencer carries out a number of commands such as run, go preview, go capture,
refresh, and refresh mode. The current state of the sequencer is indicated in a variable
seqr.state. To execute a command, the user must set a particular command number in
the variable seqr.cmd. ON Semiconductor recommends that the external host monitor
seqr.state to know when to change resolution or capture frames.
Each state has its configuration; therefore, the user should set up the state configuration
to customize the camera configuration before executing the corresponding program
such as GO TO CAPTURE. A typical camera operating scenario is:
1. Configure mode variables after hardware reset.
2. Configure preview mode.
3. Execute sensor REFRESH program.
4. Run in preview until shutter button is pressed.
5. Capture a frame.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Control Functions
Figure 25:
Sequencer Finite State Machine
Refresh or Run
PREVIEW
Go capture
ENTER
PREVIEW
LEAVE
PREVIEW
0X0018[2] = 0
Refresh mode
0X0018[2] = 1
POR
STANDBY
INIT
Go preview
CHG MODE
TO PREVIEW
Go preview
STANDBY
CHG MODE
TO CAPTURE
Refresh mode
STANDBY
STANDBY
Go capture
1
ENTER
CAPTURE
LEAVE
CAPTURE
Go preview or Go capture
CAPTURE
Refresh or Run
Note:
Any state except INIT can transition to Standby state by either hard standby or soft standby.
Mode: Context Information
The mode driver reduces integration efforts by managing most aspects of switching the
two contexts. It remembers vital register values for each image acquisition context and
loads these values to the appropriate registers in the IFP upon context switching.
For the mode driver variables to take effect, the user changes the variable values in the
mode driver (ID = 7). Upon the next mode change or sequencer's REFRESH command,
these driver variable values will be loaded to the appropriate physical sensor core and
IFP registers. The image processing will take the new values at the beginning of the next
frame acquired.
To control the output image size, the user can modify the mode driver variables such as
output_width_A, output_height_A, output_width_B, and output_height_B. The mode
driver will automatically apply any appropriate downscaling filter to achieve this output
image size as well as update the watermark of the output FIFO. It is important to set up
the sensor core to output an image equal to or larger than the crop window size, which in
turn is equal to or larger than the desired output image size.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Camera Functions
Camera Functions
Simple Rule-based Auto Exposure
The AE algorithm performs automatic adjustments of the image brightness by
controlling exposure time and analog gains of the sensor core as well as digital gains
applied to the image.
Auto exposure is implemented by a firmware (FW) driver that analyzes image statistics
collected by the exposure measurement engine, makes a decision, and programs the
sensor core and color pipeline to achieve the desired exposure. The measurement
engine subdivides the image into 16 windows organized as a 4 x 4 grid.
An AE algorithm mode is available: average brightness tracking (ABT).
The ABT AE uses a constant average tracking algorithm where a target brightness value
is compared to a current brightness value, and the gain and integration time are
adjusted accordingly to meet the target requirement.
AE Driver
DRT exposure mode is activated during preview. This mode can also be enabled during
video capture mode. The DRT exposure mode relies on the statistics engine to track
speed and amplitude of the change of the overall luminance in the selected windows of
the image.
Backlight compensation is achieved by weighting the luminance in the center of the
image higher than the luminance on the periphery. Other algorithm features include the
rejection of fast fluctuations in illumination (time averaging), control of speed of
response, and control of the sensitivity to the small changes. While the default settings
are adequate in most situations, the user can program target brightness, measurement
window, and other parameters.
The driver calculates image brightness based on average luma values received from
16 programmable equal-size rectangular windows forming a 4 x 4 grid. In preview mode,
16 windows are combined in two segments: central and peripheral. The central segment
includes four central windows. All remaining windows belong to the peripheral segment.
Scene brightness is calculated as average luma in each segment taken with certain
weights.
The driver changes AE parameters (integration time, gains, and so on) to drive brightness to the programmable target. The value of the single step approach to the target
value can be controlled.
To avoid unwanted reaction of AE on small fluctuations of scene brightness or momentary scene changes, the AE driver uses a temporal filter for luma and a threshold around
the AE luma target. The driver changes AE parameters only if the filtered luma is larger
than the AE target step and pushes the luma beyond the threshold.
Evaluative Algorithm
A scene-evaluative AE algorithm is available for use in snapshot mode. The algorithm
performs scene analysis and classification with respect to its brightness, contrast, and
composure and then decides to increase, decrease, or keep the original exposure target.
It makes the most difference for backlight and bright outdoor conditions.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Camera Functions
Accelerated Settling During Overexposure
The AE speed is direction-dependent. Transitioning from overexposure to target can
take more time than transitioning from underexposure. The AE driver has a mode that
speeds up AE for overexposed scenes.
The AE driver counts the number of AE windows whose average brightness is equal to or
greater than some value, 250 by default. For a scene that has saturated regions, the
average luma is underestimated because of signal clipping. The driver compensates
underestimation by a factor that can be defined.
Exposure Control
To achieve the required amount of exposure, the AE driver adjusts the sensor integration
time, gains, ADC reference, and IFP digital gains. In addition, ae_base_target (ID = 2,
offset = 0x4F) is available for the user to adjust the overall brightness of the scene.
Flicker Detection and Avoidance
Flicker occurs when the integration time is not an integer multiple of the period of the
light intensity. The automatic flicker detection block does not compensate for the flicker,
but rather avoids it by detecting the flicker frequency and adjusting the integration time.
To reject flicker, integration time is typically adjusted in increments of steps. The incremental step specifies the duration in row times equal to one flicker period. Thus, flicker
is rejected if integration time is kept to an integral factor of the flicker period.
Flicker cannot be avoided for integration times below the light intensity period (10ms for
50Hz environment).
Flicker shows up in the image as horizontal bars that roll up or down. The MCU looks for
these rolling bars using a thin horizontal window, which outputs luma average and is
applied to 48 points in the upper half of the image. The MCU repeats the same sampling
on the next frame; 48 samples from the previous frame are subtracted from corresponding samples from the current frame. Skipping more frames between subtraction
can be set by a variable. The MCU then smooths the 48 sampling points, applies an
amplitude threshold to avoid false detection, and looks at the resulting waveform. If
flicker is present, the waveform should have a frequency within the search range.
Assuming the flicker power is a sine wave, subtracting two frames results in:
sin(wt) – sin(wt + a) = 2  sin(a  2)  cos(wt + (a  2  
(EQ 17)
which is a cosine wave of the original frequency.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Camera Functions
Auto White Balance
The MT9D115 has a built-in AWB algorithm designed to compensate for the effects of
changing spectra of the scene illumination on the quality of the color rendition. The
algorithm consists of two major parts: a measurement engine performing statistical
analysis of the image and a driver performing the selection of the optimal color correction matrix, digital gains, and sensor core analog gains. While default settings of these
algorithms are adequate in most situations, the user can reprogram the base color
correction matrices, place limits on color channel gains, and control the speed of both
matrix and gain adjustments.
Flash
To take a snapshot, the user must send a command that changes the context from
preview to snapshot. The typical sequence of events after this command is:
1. The camera might turn on its LED flash, if it has one and is required to use it. With the
flash on, the camera exposure and white balance are automatically adjusted to the
changed illumination of the scene.
2. The camera captures one or more frames of desired size. A camera equipped with a
xenon flash strobes while capturing images. When the images are captured, the camera automatically returns to context A and resumes running in preview mode.
Note:
This sequence of events can take up to 10 frames.
Histogram: Dark Level Adjustments, Low Light and Tonal Controls
The histogram driver continually works to reduce image flare and continually analyzes
input image histogram and dynamically adjusts the black level. When flare is present
(hence, the histogram does not contain dark tones), it causes the driver to subtract a
higher black level, thus regaining the lost contrast. In certain situations, the scene may
contain no dark tones without flare. The histogram driver cannot distinguish this situation and alters the black level just the same, causing the image to have more contrast,
which looks acceptable in many situations.
Besides black level adjustments and low light scene parameters, this driver also contains
variables for the preloaded and custom gamma tables.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Optics
Optics
Figure 26 shows the CRA versus image height.
Figure 26:
CRA vs. Image Height
Image Height
CRA vs. Image Height Plot
30.00
28.00
26.00
24.00
22.00
20.00
CRA (deg)
18.00
16.00
14.00
12.00
10.00
8.00
6.00
4.00
2.00
0.00
0
10
20
30
40
50
60
70
80
Image Height (%)
Note:
MT9D115 DS Rev. E Pub. 4/15 EN
90
100
110
CRA
(%)
(mm)
(deg)
0
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
0.000
0.088
0.175
0.263
0.350
0.438
0.525
0.613
0.700
0.788
0.875
0.963
1.050
1.138
1.225
1.313
1.400
1.488
1.575
1.663
1.75
0.00
2.22
4.39
6.54
8.68
10.79
12.86
14.87
16.78
18.56
20.17
21.59
22.79
23.74
24.43
24.85
25.02
24.96
24.71
24.31
23.85
ON Semiconductor recommends a 670nm IR cut filter to achieve the best image quality; however, a 650nm IR cut filter is acceptable.
40
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Power Modes
Power Application Sequence
ON Semiconductor recommends the following sequence to maintain low power
consumption during this process:
Caution
Applying power to analog supplies prior to applying digital and IO supplies or any other failure to follow the correct power up sequence may result in high current consumption and die
heating. This can potentially result in performance and reliability issues.
1. Ensure that STANDBY is de-asserted and RESET_BAR is asserted.
2. Apply IO supply (VDD_IO) to the image sensor and wait for the IO supply to be stable.
3. Minimum of 1 ms after IO supply is stable, apply digital supply to the image sensor
and wait.
4. Enable EXTCLK and wait for the EXTCLK signal to stabilize.
5. De-assert RESET_BAR for a minimum of 10 EXTCLK cycles.
6. After asserting the RESET_BAR, apply analog supplies (VAA, VAA_PIX, and VDD_PLL) to
the image sensor.
7. After 6000 EXTCLK cycles from the end of step 6, the image sensor will be in soft
standby state.
8. Communication with the sensor thorough two-wire serial interface can start 1 EXTCLK after step 7.
In cases where the recommended procedure cannot be followed, the following condition would affect the sensor’s power consumption during the power application
sequence:
• When analog supplies are applied prior to the digital and IO supplies, high current
consumption on the analog supplies may be present.
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Figure 27:
Power Application Sequence Timing
t0
STANDBY
t4
RESET_BAR
VDD_IO
t1
t3
VDD
t2
EXTCLK
t5
VAA_, VAA_PIX,
VDD_PLL
t7
t6
Two-wire
serial bus
Table 12:
Power Application Sequence Timing
Parameters
Symbol
Min
Typ
Max
Units
Delay from stable RESET_BAR, STANDBY signals to VDDIO power start
t0
0
–
–
ns
Delay from stable VDD_IO to VDD start
t1
1
–
–
ms
Delay from stable VDD power to EXTCLK start
t2
0
–
–
ns
Delay from EXTCLK start to stable EXTCLK
t3
1
–
–
EXTCLK
RESET_BAR pulse width
t4
10
–
–
EXTCLK
Delay from RESET_BAR de-asserting to analog power supplies start
t5
1
–
–
EXTCLK
Delay from analog power stable to soft standby mode
t6
6000
–
–
EXTCLK
Delay from soft standby mode to first two-wire bus transaction
t7
1
–
–
EXTCLK
Power-On Reset
The sensor includes a power-on reset feature that initiates a reset upon power-up. Even
though this feature is included on the device, it is advised that the user still manually
assert a hard reset upon power-up.
The MT9D115’s POR circuit generates internal reset only and it will not generate the
external reset signal through RESET_BAR.
The POR circuit requires VDD ramp time to be less than 10µs. If the ramp time is longer
than 10µs, the POR operation is not guaranteed and external reset must be used.
The POR circuit will generate an internal reset when VDD falls below 1.25V (typical) for
1µs (typical) period, as shown in Figure 28 and described in Table 13.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
The POR circuit reset and external RESET_BAR signals are gated together to generate an
internal reset for MT9D115.
Figure 28:
Internal Power-On Reset
t1
VTRIG_RISING
VDD
VTRIG_FALLING
Table 13:
POR Parameters
Symbol
t1
Definition
Minimum VDD spike width below VTRIG_FALLING considered to be a reset
Min
Typ
Max
Unit
–
1
–
s
VTRIG_RISING
VDD rising trigger voltage
1.15
1.4
1.55
V
VTRIG_FALLING
VDD falling trigger voltage
1
1.25
1.45
V
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Hard Reset
The MT9D115 enters the reset state when the external RESET_BAR signal is asserted
LOW, as shown in Figure 29 and described in Table 14. All of the output signals will be in
High-Z state except the MIPI outputs, which will be driven LOW.
Figure 29:
Hard Reset Operation
t4
t1
t3
t2
EXTCLK
RESET_BAR
SDATA
All Outputs
Mode
Table 14:
Data Active After Programming
by Host Processor
Data Active
Reset
Entering Standby Mode and
Two-wire serial interface is Ready
Internal Boot Time
Hard Reset
Symbol
Definition
Min
t1
RESET_BAR pulse width
100
–
–
t2
Active EXTCLK required after RESET_BAR asserted
10
–
–
t3
Active EXTCLK required before RESET_BAR de-asserted
10
–
–
t4
Maximum internal boot time
–
–
6000
MT9D115 DS Rev. E Pub. 4/15 EN
44
Typ
Max
Unit
EXTCLK cycles
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Soft Reset
The host processor can reset the MT9D115 using the two-wire serial interface by writing
to SYSCTL 0x001A. Two types of soft reset are available. SYSCTL 0x001A[0] is used to
reset the MT9D115, which is similar to external RESET_BAR signal.
1. Set SYSCTL 0x001A1:0] to 0x3 to initiate internal reset cycle.
2. Wait 6000 EXTCLK cycles.
3. Reset SYSCTL 0x001A[0] to 0x0 for normal operation.
Figure 30:
Soft Reset Operation
t1
EXTCLK
SCLK
SDATA
Mode
Table 15:
Write Soft
Reset Command
Registers Reset
to Default Values
Reseting Registers
Soft Reset Signal Timing
Symbol
t1
MT9D115 DS Rev. E Pub. 4/15 EN
Parameter
Maximum soft reset time
45
Min
Typ
Max
Unit
–
–
6000
EXTCLKs
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Power Removal Sequence
ON Semiconductor recommends using the following method to remove the power
supplies from the image sensor.
1. Put the image sensor into either hard standby or soft standby mode as described in
“Standby Modes” on page 47.
2. Remove all digital and analog supplies.
During step 2, the digital and analog supplies can be removed safely either one by one or
at the same time, provided that step 1 is executed previously. To achieve a known power
down state in the sensor, execute step 1 before removing any power supplies during the
power removal process.
Figure 31:
Recommended Power Down Sequence
t1
t2
t3
EXTCLK
STANDBY
VAA
VDD
VDD_IO
STANDBY
ASSERTED
Table 16:
Symbol
STANDBY
MODE
Remove power supplies
Power Down Signal Timing
Parameter
Min
Typ
Max
Unit
1 frame + 40
–
–
EXTCLKs
Active EXTCLK required after STANDBY asserted
10
–
–
EXTCLKs
Power Supply Removal can be in any order and anytime
after completion of t2
0
–
–
EXTCLKs
t1
Standby entry complete
t2
t3
MT9D115 DS Rev. E Pub. 4/15 EN
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Standby Modes
The MT9D115 supports three standby modes:
• Soft standby
• Low leakage hard standby
• High leakage hard standby
For each mode, entry can be overridden by programming the standby_control register.
Patch codes, PLL configurations, parallel and MIPI IO selections are retained in all
standby modes.
Soft Standby
Soft standby can be enabled by register access; it disables the sensor core and most of
the digital logic. The two-wire serial interface is still active and the MT9D115 can be
programmed through register commands. All register settings and RAM content will be
preserved. Soft standby can be performed in any sequencer state.
Low Leakage Hard Standby
Hard standby mode uses the STANDBY signal to shut down digital power (VDD) and
ensure the lowest power consumption. All the two-wire serial interface settings and
firmware variables except patch codes, PLL configuration, parallel/MIPI IO and context
selections will be lost in this mode. Starting up from this mode is equivalent to power up
and current context selections. The two-wire serial interface will be inactive and the
sensor must be started up by de-asserting the STANDBY signal.
High Leakage Hard Standby (Without Loss of Variable Data)
High leakage hard standby mode (without the loss of variable data) can also be achieved.
This mode stores the variables and state of the sensor before entering standby (similar to
soft standby). The power consumption is lower than that of soft standby, with EXTCLK
enabled, as internal clocks are turned off, and the two-wire serial interface will be inactive.
Because the high leakage hard standby mode (without the loss of variable data) is also
activated by STANDBY, the en_vdd_dis_soft register needs to be programmed to indicate
the selection of this mode before STANDBY is asserted. De-asserting STANDBY will
cause the sensor to come out of the standby mode. This also causes the sensor to resume
operation from the state before the STANDBY signal was asserted. By default, asserting
the STANDBY signal causes the hard standby mode described above.
MT9D115 DS Rev. E Pub. 4/15 EN
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Hard Standby Mode
The MT9D115 can enter hard standby mode by using external STANDBY signal, as
shown in Figure 32. EXTCLK can be stopped to reduce the power consumption during
hard standby mode. Two-wire serial interface and IFP block shut down even when
EXTCLK is running during hard standby mode.
Entering Standby Mode
1. Assert STANDBY signal (HIGH).
Exiting Standby Mode
1. De-assert STANDBY signal (LOW).
2. Follow “Hard Reset” on page 44.
Figure 32:
Hard Standby Mode Operation
t4
t1
t2
t3
EXTCLK
STANDBY
STANDBY
ASSERTED
Note:
Table 17:
Symbol
STANDBY
MODE
EXTCLK Disabled
EXTCLK Enabled
In hard standby mode, EXTCLK is automatically gated off, and the two-wire serial interface is not
active.
Hard Standby Signal Timing
Parameter
Min
Typ
Max
Unit
1 Frame + 40
–
–
EXTCLKs
t1
Standby entry complete
t
2
Active EXTCLK required after STANDBY asserted
10
–
–
EXTCLKs
t
3
Active EXTCLK required before STANDBY
de-asserted
10
–
–
EXTCLKs
t
4
STANDBY time
1 Frame + 120
–
–
EXTCLKs
t
5
Active EXTCLK required before RESET_BAR
asserted
10
–
–
EXTCLKs
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Soft Standby Mode
The MT9D115 can enter soft standby mode by writing to a SYSCTL register through the
two-wire serial interface, as shown in Figure 33. EXTCLK can be stopped to reduce the
power consumption during soft standby mode. However, since two-wire serial interface
requires EXTCLK to operate, ON Semiconductor recommends that EXTCLK run continuously. If EXTCLK needs to be stopped, ON Semiconductor recommends using hardware standby mode.
Entering Standby Mode
1. SYSCTL 0x0018[3] must be set to “1” to activate standby mode. This will generate an
interrupt to the MCU when SYSCTL 0x0018[0] is set to “1.”
2. Set SYSCTL 0x0018[0] to “1” to initiate standby mode.
3. Check until SYSCTL 0x0018[14] changes to “1” to indicate MT9D115 is in standby
mode.
Exiting Standby Mode
1. Reset SYSCTL 0x0018[0] to “0.”
2. Check until SYSCTL 0x0018[14] changes to “0” to indicate the MT9D115 is out of
standby mode.
Figure 33:
Soft Standby Mode Operation
t4
t1
t2
t3
EXTCLK
SDATA
R0x0018[0]
Mode
Set R0x0018[0] = 1
Poll
Standby
R0x0018[14] Mode
EXTCLK Disabled
EXTCLK Enabled
R0x0018[14] = 1
Table 18:
Symbol
Soft Standby Signal Timing
Parameter
Min
Typ
1 Frame + 40
–
Active EXTCLK required after soft standby
activates
10
–
–
EXTCLKs
t3
Active EXTCLK required before soft standby deactivates
10
–
–
EXTCLKs
t4
Minimum standby time
1 Frame + 120
–
–
EXTCLKs
t1
Standby entry complete (R0x18[14] = 1)
t2
MT9D115 DS Rev. E Pub. 4/15 EN
49
Max
Unit
EXTCLKs
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Power Modes
Table 19:
Status of Signals During Different States
Signal
Reset
Post-Reset
DOUT[7:0]
High-Z
High-Z
PIXCLK
LV
FV
DOUT_N
DOUT_P
CLK_N
CLK_P
GPIO[3:0]
High-Z
High-Z
High-Z
0
0
0
0
High-Z
High-Z
High-Z
High-Z
0
0
0
0
High-Z
SADDR
SDATA
SCLK
Input
Input
Input
Input
I/O
Input
Note:
MT9D115 DS Rev. E Pub. 4/15 EN
Software Standby
Low Power Hard
Standby
High-Z by default (configurable through OE_BAR
High-Z by default
or two-wire serial interface register)
High-Z by default (configurable)
High-Z by default
High-Z by default (configurable)
High-Z by default
High-Z by default (configurable)
High-Z by default
0
0
0
0
0
0
0
0
Depending on how
Depending on how the system uses them as
the system uses them
DOUT_LSB1/DOUT_LSB0/FLASH/OE_BAR
as DOUT_LSBs/FLASH/
OE_BAR
Input
Input
Input
Input
Input
Input
Power
Down
X
X
X
X
X
X
X
X
X
X = “Don’t Care.”
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©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Other Features
Other Features
One-time Programmable Memory (OTPM)
The MT9D115 contains two bytes of OTPM, suitable for storing module identification
that can be programmed during the module manufacturing process. Programming the
OTP memory requires the use of a high voltage at the VPP pin. During normal operation,
the VPP pin should be left floating. The OTPM can be accessed through the two-wire
serial interface.
Programming the OTPM
Refer to TN-09-189: Programming OTP Memory to program the OTP Memory.
Sequence of Signals for OTPM Operation
Power Supplies
RESET_BAR
EXTCLK
SCLK / SDATA
VPP
Information to be
programmed to the register
Initiate programming
and poll status bit
Read programmed
values for status
Reading the OTPM
Reading the OTPM data requires the sensor to be fully powered and operational with its
clock input applied. The data can be read through a register from the two-wire serial
interface.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Other Features
GPIO and Output Enable Controls
General Purpose I/Os
The four GPIOs of the MT9D115 can be configured in multiple ways. Each of the I/Os
can be used as a simple input/output that can be programmed from the host. The status
of the GPIO is read at power up and can be used as a module ID to identify different
module suppliers. In addition, module ID can be stored in the OTP memory of the
sensor. Information on the OTP memory can be found in “One-time Programmable
Memory (OTPM)” on page 51.
If 10-bit RAW output is required, GPIO[1:0] can be configured as bit 1 and bit 0 (the LSBs)
of a 10-bit data bus.
GPIO[2] can be configured to output a flash pulse to trigger an external xenon or LED
flash or a shutter pulse to control an external shutter.
GPIO[3] can also be configured as an input to be used as an OE_BAR signal for the data
bus.
The general purpose inputs are enabled or disabled through register settings. Once
enabled, all four inputs must be driven to valid logic levels by external signals. The state
of the general purpose inputs can be read from a register.
Output Enable Control
When the parallel pixel data interface is enabled, its signals can be switched asynchronously between being driven and High-Z under signal or register control.
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MT9D115: 1/5-Inch SOC Digital Image Sensor
GPIO Control
GPIO Control
The MT9D115 has four general purpose I/O (GPIO) signals and that can be individually
programmed to perform various functions. Table 20 describes the GPIO registers and
variables.
Overview of GPIO Signals
• Extension of two lower data bits during 10-bit output mode
• External flash control output
• External OE_BAR control input for parallel port signals
Table 20:
GPIO Related Registers and Variables
Map
Address
Bits
Descriptions
SYSCTL
0x001A
[8]
GPIO[3] Enable.
GPIO[3] can be configured as an Output Enable pad.
0: GPIO[3] does not function as OE.
1: GPIO[3] functions as OE.
SYSCTL
0x001E
[6:4]
Controls the output slew rate of GPIO signals.
“111” programs the fastest slew rate. Refer to AC/DC specification in the data sheet for the
numbers. Default value is “000” for slowest slew rate.
SYSCTL
0x0024
[3:0]
The state of GPIO signals during power on. Read-only.
GPIO
0x1070
[12:9]
GPIO data port.
State of current GPIO signals can be read through this register.
GPIO
0x1074
[12:9]
GPIO Set command.
When GPIO is configured as output, setting this register to “1” will write “1” to GPIO port.
Use GPIO Clear command to clear.
GPIO
0x1076
[12:9]
GPIO Clear command.
When GPIO is configured as output, setting this register to “1” will write “0” to GPIO port.
Use GPIO Set command to set.
GPIO
0x1078
[12:9]
GPIO direction control for each GPIO signals.
0 = Output
1 = Input
After power-on, GPIO ports are in input mode.
MT9D115 DS Rev. E Pub. 4/15 EN
53
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Electrical Specifications
Electrical Specifications
Absolute Maximum Rating
Caution
Table 21:
Table 21 shows stress ratings only, and functional operation of the device at these or any
other conditions above those indicated in the product specification is not implied. Stresses
above those listed may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Maximum Rating
Rating
Symbol
Parameter
Min
Max
Unit
VDD_MAX
Core digital voltage
–0.3
2.4
V
VDD_IO_MAX
I/O digital voltage
–0.3
4.0
V
Analog voltage
–0.3
4.0
V
Pixel supply voltage
–0.3
4.0
V
VDD_PLL_MAX
PLL supply voltage
–0.3
4.0
V
VIH_MAX
Input HIGH voltage
–0.3
VDD_IO + 0.3
V
VAA_MAX
VAA_PIX_MAX
VIL_MAX
Input LOW voltage
–0.3
–
V
T_OP
Operating temperature (measured at junction)
–30
75
°C
T_ST
Storage temperature
–40
85
°C
I/O Parameters
Table 22:
I/O Parameters
fEXTCLK = 6–54 MHz, VDD = VDDIO_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; T = 25°C
j
Symbol
Parameter
Min
VIH
Input logic HIGH threshold
Typ
Max
Unit
Note
VDD_IO – 0.3
–
VDD_IO + 0.3
V
–
–
–
0.6
0.3
–
V
V
V
VDD_IO = 2.8V
VDD_IO = 1.8V
At specified at IOH
VIL
Input logic LOW threshold
VOH
Output logic HIGH threshold
– 0.1
– 0.1
VDD_IO – 0.3
VOL
Output logic LOW threshold
–
–
0.3
V
–
CIN
Input pins - (SCLK, SDATA)
capacitance
–
3.5
3.9
pF
–
CLOAD
Output pins - (SDATA) load
capacitance
–
–
30
pF
–
PUP_SDATA
SDATA pull-up resistor
–
1.5
–
k
–
Note:
MT9D115 DS Rev. E Pub. 4/15 EN
VIH and VIL specifications apply to the over- and undershoot (ringing) present in the MCLK.
54
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Electrical Specifications
MIPI Interface AC and DC Electrical Specifications
Introduction
The MIPI interface for the MT9D115 image sensor was designed to meet the MIPI Alliance Specification for D-PHY Version 1.0. Please refer to this document for details on
the MIPI specification and usage.
Electrical Specifications
Table 23:
MIPI High-Speed Transmitter DC Characteristics
fEXTCLK = 48 MHz; VDD = VDD_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Ambient temperature
Parameter
Description
HS transmit static common mode voltage
VCMTX
|VCMTX (1,0)|
VCMTX mismatch when output is
Differential-1 or Differential-0
|VOD|
HS transmit differential voltage
|VOD|
VOD mismatch when output is Differential-1
or Differential-0
VOHHS
HS output high voltage
Min
Nom
Max
Units
150
200
250
mV
16
mV
200
270
mV
14
mV
140
ZOS
Single-ended output impedance
ZOS
Single-ended output impedance mismatch
39
50
360
mV
64
Ohm
10
%
.
MIPI High-Speed Transmitter AC Characteristics
Table 24:
fEXTCLK = 48 MHz; VDD = VDD_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Ambient temperature
Parameter
Description
Min
tR and tF
20%-80% rise time and fall time
150
Table 25:
Nom
Max
Units
ps
MIPI Low-Power Transmitter DC Characteristics
fEXTCLK = 48 MHz; VDD = VDD_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Ambient temperature
Parameter
Description
Min
Nom
Max
Units
VOH
VOL
ZOLP
Thevenin output high level
Thevenin output low level
Output impedance of LP transmitter
1.1
-50
110
1.2
1.4
50
V
mV
Ohm
Table 26:
MIPI Low-Power Transmitter AC Characteristics
fEXTCLK = 48 MHz; VDD = VDD_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Ambient temperature
Parameter
Description
TRLP/TFLP
TREOT
V/tSR
CLOAD
15%-85% rise time and fall time
30%-85% rise time and fall time
Slew rate @ CLOAD = 70pF
Load capacitance
MT9D115 DS Rev. E Pub. 4/15 EN
Min
55
83
0
Nom
Max
Units
25
35
122
70
ns
ns
mV/ns
pF
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Electrical Specifications
AC Electricals
Figure 34:
Output Interface Timing Waveforms
Table 27:
AC Electricals
fEXTCLK = 6–54 MHz, VDD = VDDIO_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; T = 25°
j
Symbol
Parameter
fEXTCLK
tr
tf
DCEXTCLK
tJITTER
tCP
External input clock frequency
External input clock rise time
External input clock fall time
External input clock duty cycle
External input clock jitter
EXTCLK to PIXCLK propagation
delay
Pixel clock frequency
Pixel clock rise time
Pixel clock fall time
Pixel clock to data valid
Pixel clock to frame valid high
Pixel clock to frame valid low
Pixel clock to line valid high
Pixel clock to line valid low
Programmable slew = 7
fPIXCLK
tRPIXCLK
tFPIXCLK
tPD
tPFH
tPLH
tPFL
tPLL
PIXCLK pin slew
rate
Programmable slew = 4
Programmable slew = 0
MT9D115 DS Rev. E Pub. 4/15 EN
Conditions
From10% to 90% of Vp-p
From10% to 90% of Vp-p
Peak-to-peak
Cload = 15pF
Cload = 15pF
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
56
Min
Typ
Max
Unit
Note
6
40
5
2
2
50
-
54
5
5
60
500
45
MHz
ns
ns
%
ps
ns
2
1
1
6
-
2
2
1.2
0.6
1
0.5
0.3
0.15
85
5
5
0.6*PIXCLK
0.6*PIXCLK
0.6*PIXCLK
0.6*PIXCLK
0.6*PIXCLK
-
MHz
ns
ns
ns
ns
ns
ns
ns
V/ns
V/ns
V/ns
V/ns
V/ns
V/ns
3
4
5
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Electrical Specifications
Table 27:
AC Electricals
f
EXTCLK = 6–54 MHz, VDD = VDDIO_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Tj = 25°
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Note
Output pin slew
rate
Programmable slew = 7
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
VDD_IO = 2.8V, Cload = 45pF
VDD_IO = 1.8V, Cload = 45pF
-
1.6
0.8
1.25
0.55
0.3
0.15
-
V/ns
V/ns
V/ns
V/ns
V/ns
V/ns
5
Programmable slew = 4
Programmable slew = 0
Notes:
Table 28:
1. Measured when the PLL is off. Specification not applicable when PLL is on, but input HIGH/LOW
voltage should be within specification.
2. VIH and VIL specifications apply to the over- and undershoot (ringing) present in the MCLK.
3. Measurement done with PLL off.
4. Valid for Cload<20pF on PIXCLK, DOUT[9:0], LINE_VALID, and FRAME_VALID pads. Loads must be
matched as closely as possible.
5. PLL is off and EXTCLK is 24MHz.
DC Electricals
Setup Conditions: fEXTCLK = 6-54MHz, VDD = VDD_IO_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Tj = 25°C,
unless stated otherwise
Symbol
Parameter
VDD
VDD_PLL
VAA
VAA_PIX
VDD_IO
Digital core supply voltage
PLL supply voltage
Analog supply voltage
Pixel supply voltage
Digital IO supply voltage
VDDIO_TX
VPP
IDD_IO
MIPI supply voltage
OTPM supply voltage
Digital IO supply current
Condition
For VDD_IO = 1.8V
For VDD_IO = 2.8V
VDD_IO =1.8V
VDD_IO = 2.8V
VDD_IO = 1.8V
VDD_IO = 2.8V
Context A
Context B
IDD_PLL
IDD
IAA
IAA_PIX
IDDIO_TX
IDD
IAA
IAA_PIX
IDDIO_TX
MT9D115 DS Rev. E Pub. 4/15 EN
PLL supply current
Digital core supply current
Analog supply current
Pixel supply current
MIPI supply current
Digital core supply current
Analog supply current
Pixel supply current
MIPI supply current
PLL is OFF
PLL is ON
Operating in
Parallel mode
Context A
Context B
57
Min
Typ
Max
Unit
1.7
2.5
2.5
2.5
1.7
2.5
1.7
-
1.8
2.8
2.8
2.8
1.8
2.8
1.8
8
10
15
12
20
N/A
13
15
40
1.5
N/A
25
40
0.8
N/A
1.95
3.1
3.1
3.1
1.95
3.1
1.95
18
30
50
3
52
52
3
-
V
V
V
V
V
V
V
V
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Note
s
1
2
3
3
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Electrical Specifications
Table 28:
DC Electricals (continued)
Setup Conditions: fEXTCLK = 6-54MHz, VDD = VDD_IO_TX = VDD_IO = 1.8V; VAA = VAA_PIX = VDD_PLL = 2.8V; Tj = 25°C,
unless stated otherwise
Symbol
Parameter
IDD
IAA
IAA_PIX
IDDIO_TX
IDD
IAA
IAA_PIX
IDDIO_TX
Digital core supply current
Analog supply current
Pixel supply current
MIPI supply current
Digital core supply current
Analog supply current
Pixel supply current
MIPI supply current
Total Standby Current
IHardStandby
IHardStandby
ISoftStandby
ISoftStandby
ISoftStandby
Notes:
MT9D115 DS Rev. E Pub. 4/15 EN
Condition
Operating in
Serial mode
Context A
Context B
STANDBY pin asserted, R0x0028=1
STANDBY pin asserted, R0x0028=0
R0x0018[0]=1
R0x0018[0]=1, R0x0028=0
R0x0018[0]=1, R0x0028=1
Min
Typ
Max
Unit
-
23
40
1.5
5
35
40
0.8
8
-
50
50
3
3
70
70
3
10
20
90
90
2
3
mA
mA
mA
mA
mA
mA
mA
mA
A
A
A
mA
mA
Note
s
4
5
7
6
7
7
1.
2.
3.
4.
5.
VDD_IO current is dependent on the output data rate.
PLL is on with 85 MHz output frequency setting.
VDD_IO_TX current is only applicable in serial output mode.
PLL is on with 480 MHz VCO frequency settings.
Either with EXTCLK running or EXTCLK stopped and EXCLK pin is either pulled up or pulled down.
Measured at Tj = 70°C.
6. EXTCLK is stopped and EXCLK pin is either pulled up or pulled down.
7. EXTCLK running at 27 MHz.
58
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
Appendix A- VDD_IO Current Addition
Introduction
This appendix describes the system requirements to achieve lowest power consumption
in the VDD_IO domain during low power hardware standby mode in ON Semiconductor's MT9D115 CMOS digital image sensor.
VDD_IO Current
VDD_IO current is used to measure the power consumption of the IO pad ring of our
sensor. Therefore, it is extremely system-dependent and greatly affected by the external
conditions as current can flow out of the chip through the IO ring and into the system.
In this document, we outline requirements at the system level to achieve minimum
power consumption during low power hardware standby mode.
To achieve the lowest VDD_IO current, it is critical to match VDD_IO level in the sensor
and the controller. Otherwise, there can be elevated current drawn on the VDD_IO due to
mismatch in termination voltage level on the sensor pins. In ON Semiconductor system
design, the IO voltage between the sensor and the controller is matched by using the
same voltage regulator, as shown in Figure 35. This is recommended for both the system
design and setup to measure the VDD_IO power consumption.
Figure 35:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption
Voltage
R egulator
Vreg
M T9D113
2. 2kΩ
C ontroller
GN D
VIO_C ontroller
V DD_IO
S CLK
H igh-Z
S DATA
H igh-Z
R ESET_BAR, STANDBY
D rive HIGH
S ADDR , EXT C LK
D rive LOW
PIXC LK, F R AM E_VALID, LIN E_VALID,
D OUT [7:0], GPIO[1:0]
Input
GPIO[3:2]
GN D
GN D
MT9D115 DS Rev. E Pub. 4/15 EN
59
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
IO Pin States
In addition to matching VDD_IO levels between the controller chip and the sensor, the
control signals to the input pins of the sensor must be at a specified level to achieve
minimal VDD_IO current draw. Table 29 shows the pin states recommended to achieve
minimum VDD_IO current during hardware standby mode.
It is always a good practice to measure the pin voltage during hard standby and try to
match the recommended pin state.
Table 29:
Status of Signals During Standby State
Signal
State on Sensor Pin
DOUT[7:0]
High-Z by default (configurable through OE_BAR or twowire serial interface register)
High-Z by default (configurable)
High-Z by default (configurable)
High-Z by default (configurable)
Depending on how the system uses them as
DOUT_LSB1/DOUT_LSB0/FLASH/OE_BAR
0
0
0
0
Input
Input
Input
Input
Input
Input
PIXCLK
LINE_VALID
FRAME_VALID
GPIO[3:0]
DOUT_N
DOUT_P
CLK_N
CLK_P
SADDR
EXTCLK
SDATA
SCLK
RESET_BAR
STANDBY
Notes:
MT9D115 DS Rev. E Pub. 4/15 EN
ON Semiconductor Test
System
Note
No control
4
Pulled to GND
8, 9
Float
7
Pulled to GND
1, 6
High Z
3
Pulled to VDD_IO Level
2, 5
1. VIL specification for input signal applies. Refer to Table 20, “GPIO Related Registers and Variables,”
on page 53.
2. VIH specification for input signal applies. Refer to Table 20, “GPIO Related Registers and Variables,”
on page 53.
3. These pins are not directly connected to VDD_IO supply but through a voltage follower to the controller.
4. The pins on the controller connected to these sensor pins are input pins.
5. These pins are not directly connected to VDD_IO supply but through the controller.
6. These pins are not directly connected to GND but through the control signal on the controller.
7. These pins are floating in parallel mode operation.
8. Tie all the unused GPIO pins to DGND or VDD_IO level in the module.
9. If GPIO3 is connected to GPIO pin on the controller, program GPIO3 as an input before low power
hard standby mode and drive GPIO3 externally from the controller to DGND level.
60
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
RESET_BAR with Internal Pull-UP
The RESET_BAR pin has an internal pull-up device to VDD_IO (see Figure 36).
Figure 36:
RESET_BAR Pad Architecture
Since RPULLUP is active devices connected in triode state, the value of RPULLUP is dependent on the difference between VDD_IO and Vpad Level (see Table 30).
Table 30:
Typical Mismatch Current in VDD_IO Due to Mismatch in RESET_BAR level and VDD_IO Level
Conditions: VDD = VDD_IO_TX = 1.8V; VAA = VAA_PIX=VDD_PLL=2.8V; Tj=30°C, EXTCLK is off and tied to GND level. All
other pin states and levels are set according to ON Semiconductor E2E on pin states.
VDD_IO
1.80
2.80
Note:
MT9D115 DS Rev. E Pub. 4/15 EN
Vpad
Min
Typ
Max
1.70
1.80
1.95
2.50
2.80
3.10
14
2
–13
61
2
–54
18
5
–17
67
7
–60
22
10
–21
72
12
–66
Unit
A
The above data is for engineering purposes only. These represent typical values that can be
expected.
61
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
Recommended System and Test Setup with Multiple Serial Interface Slave Devices
The recommended system and test setup shown in Figure 37 is only valid for a system
where MT9D115 is the only two-wire serial interface slave device connected to the
controller chip. As the SCLK and SDATA are to be pulled high to the VDD_IO level during
the hardware standby to minimize the IO current consumption due to the data toggling
in the two-wire serial interface, this design is not feasible if there is an additional slave
device sharing the same two-wire serial interface on the controller chip.
In such systems, it is recommended to have a voltage follower to isolate the pull-up
resistors attached between the two-wire serial interface and VDD_IO supply of MT9D115
as shown in Figure 37. Otherwise, the data toggling from the two-wire serial interface
transactions to other could cause leakage from the VDD_IO supply of MT9D115.
Figure 37:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption in the MT9D115 Sharing
with Multiple Two-wire Serial Interface Devices
Voltage
R egulator
Vreg
Voltage F ollow er
M T9D113
C ontroller
V DD_IO
VIO_C ontroller
SC LK
X
S DATA
X
R ESET_BAR, STANDBY
D rive H IGH
S ADDR, EXT C LK
D rive LOW
PIXC LK, F R AM E_VALID,LIN E_VALID,
D OUT[7:0], GPIO[1:0]
GN D
GN D
Input
GPIO[3:2]
GN D
O th e r sla ve d e vice s
In addition, in some system designs where the IO level of the additional devices sharing
the same two-wire serial interface with MT9D115 is different from that of MT9D115, it is
recommended that the IO voltage level between the controller and the MT9D115 be
maintained to the same level by sourcing from the same voltage regular as shown in
Figure 38 on page 63.
MT9D115 DS Rev. E Pub. 4/15 EN
62
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
Figure 38:
Recommended System and Test Setup for Minimum VDD_IO Power Consumption in the MT9D115 Sharing
with Multiple Two-wire Serial Interface Devices at Different IO Levels
Voltage
R egulator
Vreg1
Voltage F ollow er
M T9D113
V DD _IO
VIO_C ontroller
SC LK
X
S DATA
X
R ESET_BAR, STANDBY
D rive H IGH
S ADDR, EXT C LK
D rive LOW
PIXC LK, F R AM E_VALID,LIN E_VALID,
D OUT [7:0], GPIO[1:0]
GN D
GN D
C ontroller
Input
GPIO[3:2]
GN D
Voltage
R egulator
O th e r sla ve d e vice s
Vreg2
For a system which uses separate voltage regulators for MT9D115 sensor and the
controller chip as shown in Figure 39, it is important to match the voltage levels between
two regulators as close as possible. If the voltage levels are not matched, there can be
additional current consumption in the VDD_IO domain connected to the sensor. This
additional current is generated in the internal pull up resistor present in RESET_BAR
pad and external resistors used for two-wire serial interface.
The current leakage from the voltage level mismatch in RESET_BAR pad can be characterized as follows:
IDD_IOmismatch = (Vreg2 - Vreg1)/ RpullupRESET_BAR@VDD_IO
The internal pull up resistance is dependent on the VDD_IO level. Typical levels of
mismatch current at different VDD_IO levels can be found in Table 30 on page 61.
MT9D115 DS Rev. E Pub. 4/15 EN
63
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
Figure 39:
System Setup with Independent Voltage Sources for MT9D115 and Controller Chip
Voltage
R egulator
Voltage
R egulator
Vreg1
Vreg2
GND
GND
DUT
2.2kΩ
V DD _IO
VIO_C ontroller
S CLK
H igh-Z
S DATA
H igh-Z
D rive H IGH
R ESET_BAR, STANDBY
S ADDR, EXT C LK
D rive LOW
PIXC LK, F R AM E_VALID, LIN E_VALID
D OUT [7:0], GPIO[1:0]
GND
MT9D115 DS Rev. E Pub. 4/15 EN
C ontroller
Input
GPIO[3:2]
GND
64
©Semiconductor Components Industries, LLC,2015.
MT9D115: 1/5-Inch SOC Digital Image Sensor
Appendix A- VDD_IO Current Addition
Test Sequence for Measuring VDD_IO Current at Hard Standby Mode
Follow the procedure defined within the sensor data sheet. The following test sequence
takes the MT9D115 as a reference. Contact your local ON Semiconductor Applications
Engineer for any specific product.
To measure VDD_IO current at hard standby mode:
1. Supply PWRDN (also known as STANDBY) pin (J11 pin2) with 0 volt externally.
2. Supply the RESET_BAR pin (U22 pin4) with VDD_IO volt externally.
3. Connect an ammeter between IDD_IO (J9) and DGND.
4. Use jumpers J5, J17, and J20 to make sure GPIO pins are connected to either GND or
VDD_IO.
At this point, the part is in operating mode and it is possible to load an .INI file to get
an image with DevWare.
5. Supply the PWRDN pin with VDD_IO volt externally and wait for one frame + 50 clock.
At this stage, the part is in hard standby.
6. By removing J1, the EXTCLK is disconnected to the part and then connect EXTCLK
pin (J1 pin2) to either DGND or VDD_IO.
7. Now the part is in hard standby with EXTCLK off. The user can read off the VDD_IO
current from the ammeter at step 3 above.
Figure 40:
Modifications to the Demo2 Sensor Head Board for VDD_IO Current Measurement
Modifications
J9 jumper removed to monitor IDDIO
by connecting Ammeter on Pins 1
and 2
To control the Reset pin externally,
U22 was removed and a 10KOhm
resistor connected to Pin 4, which is
connected to a 2.8V external source
J11 jumper removed to control the
STANDBY or PWDN pin externally.
A 10K resistor is connected for pullup on this pin. in 2 in operating= 0V,
Hard Standby= 2.8V using external
voltage source.
J1 jumper for CLOCK
Conclusion
It is important from the system perspective to ensure IO levels between MT9D115 and
|
© 2009 Aptina Imaging Corporation |
Aptina Confidential
the controller chip at the same potential
level
to achieve minimum IO power consump©2008
Micron
tion in MT9D115. A system configuration to achieve this is proposed in this document.
In addition, suggestions on how to approach system designs with multiple two-wire
serial interface devices and multiple IO level devices are provided.
2
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MT9D115: 1/5-Inch SOC Digital Image Sensor
Revision History
Revision History
Rev. E . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4/15/15
• Updated “Ordering Information” on page 2
Rev. D . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3/26/15
• Converted to ON Semiconductor template
• Removed confidential marking
Rev. C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3/14/12
• Updated notes for Table 3, “Signal Description and Direction,” on page 9
• Updated Figure 6: “Two-Wire Serial Control Bus Timing,” on page 13
• Updated “Parallel and MIPI Output” on page 32
• Added Figure 31: “Recommended Power Down Sequence,” on page 46
• Added Table 16, “Power Down Signal Timing,” on page 46
• Updated Table 22, “I/O Parameters,” on page 54
• Updated Table 25, “MIPI Low-Power Transmitter DC Characteristics,” on page 55
• Updated Table 28, “DC Electricals,” on page 57
Rev. B . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7/7/11
• Updated to Production
• Updated “Features” on page 1
• Updated Table 1, “Key Performance Parameters,” on page 1
• Updated Table 2, “Available Part Numbers,” on page 2
• Deleted “Overview”
• Added “Functional Description” on page 6
• Added “Architecture Overview” on page 6
• Updated Figure 11: “Six Rows in Normal and Row Mirror Readout Modes,” on page 19
Rev. A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3/16/10
• Initial release.
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