TA76431S TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic TA76431S Adjustable Precision Shunt Regulator Features z Precision reference voltage: VREF = 2.495 V ± 2% z Small temperature coefficient: |αVREF| = 46 ppm/°C z Adjustable output voltage: VREF ≤ VOUT ≤ 36 V z Low dynamic output impedance: |ZKA| = 0.15 Ω (Typ.) Pin Assignment Marking side 1 2 3 REF A K Weight: 0.36 g (Typ.) Functional Block Diagram Circuit Symbol This IC contains electrostatic sensitive elements. Please handle with caution. Marking TA76 431S Part No. (or abbreviation code) Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish. 1 2006-12-20 TA76431S Equivalent Circuit Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit Cathode voltage VKA 37 V Cathode current IK −100~150 mA Reference voltage VREF 7 V Reference current IREF 50 μA Reference-anode reverse current −IREF 10 mA PD 800 mW Operating temperature Topr −40~85 °C Storage temperature Tstg −55~150 °C Power dissipation Ta = 25°C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Range Characteristics Symbol Min Typ. Max Unit Cathode voltage VKA VREF ― 36 V Cathode current IK 1 ― 100 mA Topr −40 ― 85 °C Operating temperature 2 2006-12-20 TA76431S Electrical Characteristics (Unless otherwise specified, Ta = 25°C, IK = 10 mA) Characteristics Reference voltage Symbol Test Circuit VREF ― VKA = VREF ― Deviation of reference input voltage over temperature VREF (dev) (Note 1) Ratio of change in reference input voltage to the change in cathode voltage ΔVREF/ΔV Reference input current Deviation of reference input current over temperature IREF IREF (dev) (Note 1) Test Condition Min Typ. Max Unit 2.440 2.495 2.550 V 0°C ≤ Ta ≤ 70°C, VKA = VREF ― 8 17 mV ― VREF ≤ VKA ≤ 10 V ― 0.8 2.7 ― 10 V ≤ VKA ≤ 36 V ― 0.5 2.0 ― VKA = VREF ― 1.4 4 μA ― 0°C ≤ Ta ≤ 70°C, VKA = VREF R1 = 10 kΩ, R2 = ∞ ― 0.3 1.2 μA mV/V Minimum cathode current for regulation IKmin ― VKA = VREF ― 0.4 1.0 mA Off-state cathode current IKoff ― VKA = 36 V, VREF = 0 V ― ― 1.0 μA Dynamic impedance |ZKA| ― VKA = VREF, f ≤ 1 kHz 1 mA ≤ IK ≤ 100 mA ― 0.15 0.5 Ω Note 1: The deviation parameters VREF (dev) and IREF (dev) are defined as the maximum variation of the VREF and IREF over the rated temperature range. The average temperature coefficient of the VREF is defined as: 3 2006-12-20 TA76431S Test Parameter (1) VKA = VREF mode (2) VKA > VREF mode (3) Off-state mode Typical Applications (1) 2.5 V reference (2) Shunt regulator 4 2006-12-20 TA76431S 5 2006-12-20 TA76431S 6 2006-12-20 TA76431S Package Dimensions 7 2006-12-20 TA76431S RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2006-12-20