Seme LAB D1209UK Metal gate rf silicon fet Datasheet

TetraFET
D1209UK
METAL GATE RF SILICON FET
MECHANICAL DATA
GOLD METALLISED
MULTI-PURPOSE SILICON
DMOS RF FET
20W – 12.5V – 400MHz
PUSH–PULL
A
C
B
(2 pls)
3
2
K
1
E
D
5
4
G (4 pls)
F
FEATURES
• SIMPLIFIED AMPLIFIER DESIGN
H
J
I
M
N
• SUITABLE FOR BROAD BAND APPLICATIONS
DK
PIN 1
PIN 3
PIN 5
SOURCE (COMMON) PIN 2
DRAIN 2
PIN 4
GATE 1
DRAIN 1
GATE 2
• VERY LOW Crss
• SIMPLE BIAS CIRCUITS
• LOW NOISE
DIM
A
B
C
D
E
F
G
H
I
J
K
M
N
mm
6.45
1.65R
45°
16.51
6.47
18.41
1.52
4.82
24.76
1.52
0.81R
0.13
2.16
Tol.
0.13
0.13
5°
0.76
0.13
0.13
0.13
0.25
0.13
0.13
0.13
0.02
0.13
Inches
0.254
0.065R
45°
0.650
0.255
0.725
0.060
0.190
0.975
0.060
0.032R
0.005
0.085
Tol.
0.005
0.005
5°
0.03
0.005
0.005
0.005
0.010
0.005
0.005
0.005
0.001
0.005
• HIGH GAIN – 10 dB MINIMUM
APPLICATIONS
• HF/VHF/UHF COMMUNICATIONS
from 1 MHz to 500 MHz
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
PD
BVDSS
BVGSS
ID(sat)
Tstg
Tj
Power Dissipation
Drain – Source Breakdown Voltage *
Gate – Source Breakdown Voltage *
Drain Current *
Storage Temperature
Maximum Operating Junction Temperature
100W
40V
±20V
10A
–65 to 150°C
200°C
* Per Side
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
Website: http://www.semelab.co.uk
E-mail: [email protected]
6/99
D1209UK
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
Typ.
Max. Unit
PER SIDE
BVDSS
IDSS
Drain–Source Breakdown
Voltage
Zero Gate Voltage
Drain Current
V
VGS = 0
ID = 10mA
VDS = 12.5V
VGS = 0
1
mA
1
mA
7
V
IGSS
Gate Leakage Current
VGS = 20V
VDS = 0
VGS(th)
Gate Threshold Voltage*
ID = 10mA
VDS = VGS
gfs
Forward Transconductance*
VDS = 10V
ID = 1A
40
1
0.8
S
10
dB
50
%
20:1
—
TOTAL DEVICE
Common Source Power Gain
h
PO = 20W
Drain Efficiency
VDS = 12.5V
VSWR
Load Mismatch Tolerance
f = 400MHz
GPS
IDQ = 0.8A
PER SIDE
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
VDS = 0
VDS = 12.5V VGS = 0
Reverse Transfer Capacitance VDS = 12.5V VGS = 0
* Pulse Test:
60
pF
f = 1MHz
40
pF
f = 1MHz
4
pF
VGS = –5V f = 1MHz
Pulse Duration = 300 ms , Duty Cycle £ 2%
HAZARDOUS MATERIAL WARNING
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly
toxic and care must be taken during handling and mounting to avoid damage to this area.
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.
THERMAL DATA
RTHj–case
Semelab plc.
Thermal Resistance Junction – Case
Telephone +44(0)1455 556565. Fax +44(0)1455 552612.
Website: http://www.semelab.co.uk
E-mail: [email protected]
Max. 1.75°C / W
6/99
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