A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package FEATURES AND BENEFITS • 5 V supply operation • QVO temperature coefficient programmed at Allegro™ for improved accuracy • Miniature package options • High-bandwidth, low-noise analog output • High-speed chopping scheme minimizes QVO drift across operating temperature range • Temperature-stable quiescent voltage output and sensitivity • Precise recoverability after temperature cycling • Output voltage clamps provide short-circuit diagnostic capabilities • Undervoltage lockout (UVLO) • Wide ambient temperature range: –40°C to 150°C (SOT-23W), –40°C to 125°C (SIP) • Immune to mechanical stress • Enhanced EMC performance for stringent automotive applications PACKAGES: 3-pin ultramini SIP 1.5 mm × 4 mm × 3 mm (suffix UA) 3-pin SOT-23W 2 mm × 3 mm × 1 mm (suffix LH) DESCRIPTION New applications for linear output Hall-effect sensors, such as displacement and angular position, require higher accuracy and smaller package sizes. The Allegro A1308 and A1309 linear Hall-effect sensor ICs have been designed specifically to meet both requirements. These temperature-stable devices are available in both surface-mount and through-hole packages. The accuracy of each device is enhanced via end-of-line optimization. Each device features nonvolatile memory to optimize device sensitivity and the quiescent voltage output (QVO: output in the absence of a magnetic field) for a given application or circuit. This A1308 and A1309 optimized performance is sustained across the full operating temperature range by programming the temperature coefficient for both sensitivity and QVO at Allegro end-of-line test. These ratiometric Hall-effect sensor ICs provide a voltage output that is proportional to the applied magnetic field. The quiescent voltage output is adjusted around 50% of the supply voltage. The features of these linear devices make them ideal for use in automotive and industrial applications requiring high accuracy, and they operate across an extended temperature range, –40°C to 150°C (SOT-23W) or –40°C to 125°C (SIP). Each BiCMOS monolithic circuit integrates a Hall element, temperature-compensating circuitry to reduce the intrinsic Continued on the next page… Not to scale Functional Block Diagram V+ CBYPASS Tuned Filter Dynamic Offset Cancellation VCC Sensitivity and Sensitivity TC VOUT Offset and Offset TC GND A1308-9-DS, Rev. 7 January 4, 2017 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package DESCRIPTION (continued) sensitivity drift of the Hall element, a small-signal high-gain amplifier, a clamped low-impedance output stage, and a proprietary dynamic offset cancellation technique. The A1308 and A1309 sensor ICs are offered in two package styles. The LH is a SOT-23W style, miniature, low-profile package for surface-mount applications. The UA is a 3-pin, ultramini, single inline package (SIP) for through-hole mounting. Both packages are lead (Pb) free, with 100% matte-tin leadframe plating. SELECTION GUIDE Part Number Output Polarity Sensitivity (typ) (mV/G) Operating Ambient Temperature Range (TA) (°C) Packing [1] A1308LLHLX-05-T Forward 0.5 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1308KUA-1-T Forward 1.3 –40 to 125 500 pieces per bag 3-pin SIP through hole A1308LLHLX-1-T Forward 1.3 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1308LLHLX-2-T Forward 2.5 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1308KUA-2-T Forward 2.5 –40 to 125 500 pieces per bag 3-pin SIP through hole A1308KUA-3-T Forward 3.125 –40 to 125 500 pieces per bag 3-pin SIP through hole A1308LLHLX-3-T Forward 3.125 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1308KUA-5-T Forward 5 –40 to 125 500 pieces per bag 3-pin SIP through hole A1308LLHLX-5-T Forward 5 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1309LLHLX-9-T Forward 9 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount A1309KUA-9-T Forward 9 –40 to 125 500 pieces per bag 3-pin SIP through hole A1309LLHLX-RP9-T Reverse –9 –40 to 150 10,000 pieces per reel 3-pin SOT-23W surface mount 1 Package Contact Allegro for additional packing options. ABSOLUTE MAXIMUM RATINGS Rating Unit Forward Supply Voltage Characteristic Symbol VCC Notes 8 V Reverse Supply Voltage VRCC –0.1 V Forward Output Voltage VOUT 7 V Reverse Output Voltage VROUT Output Source Current IOUT(SOURCE) VOUT to GND IOUT(SINK) VCC to VOUT Output Sink Current –0.1 V 2 mA 10 mA Range K –40 to 125 °C Range L –40 to 150 °C Operating Ambient Temperature TA Maximum Junction Temperature TJ(max) 165 °C Tstg –65 to 170 °C Storage Temperature Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 2 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package PINOUT DIAGRAMS AND TERMINAL LIST TABLE LH Package Pinout UA Package Pinout 3 1 2 1 2 Terminal List Table Name Number Description LH UA VCC 1 1 Input power supply; tie to GND with bypass capacitor VOUT 2 3 Output signal GND 3 2 Ground 3 THERMAL CHARACTERISTICS: May require derating at maximum conditions; see application information Characteristic Symbol Test Conditions Package LH, 1-layer PCB with copper limited to solder pads Package Thermal Resistance RθJA Package LH, 2-layer PCB with 0.463 connected by thermal vias in.2 of copper area each side Package UA, 1-layer PCB with copper limited to solder pads Value Units 228 °C/W 110 °C/W 165 °C/W Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 3 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package OPERATING CHARACTERISTICS: Valid through TA , CBYPASS = 0.1 µF, VCC = 5 V, unless otherwise noted Characteristics Symbol Test Conditions Min. Typ. Max. Unit [1] ELECTRICAL CHARACTERISTICS Supply Voltage Undervoltage VCC 4.5 5.0 5.5 V VUVLOHI K temp. option tested at TA = 25°C to 125°C (device powers on); L temp. option tested at TA = 25°C to 150°C (device powers on) – – 3 V VUVLOLO K temp. option tested at TA = 25°C to 125°C (device powers off); L temp. option tested at TA = 25°C to 150°C (device powers off) 2.5 – – V Threshold [2] Supply Current ICC No load on VOUT – 9 11.5 mA Power-On Time [3][4] tPO TA = 25°C, CL(PROBE) = 10 pF – 50 – µs tVCC TA = 25°C 0.005 – 100 ms VCCOFF TA = 25°C 0 – 0.55 V µs VCC Ramp Time [3][4] VCC Off Level [3][4] Clamp [3][4] Delay to tCLP TA = 25°C, CL = 10 nF – 30 – Supply Zener Clamp Voltage VZ TA = 25°C, ICC = 14.5 mA 6 7.3 – V Small signal –3 dB – 20 – kHz TA = 25°C – 400 – kHz VCC = 5 V, TA = 25°C, CBYPASS = open, Sens ≥ 1.3 mV/G, no load on VOUT – 1.7 – G VCC = 5 V, TA = 25°C, CBYPASS = open, Sens = 0.5 mV/G, no load on VOUT – 2.8 – G VCC = 5 V, TA = 25°C, CBYPASS = open, Sens ≥ 1.3 mV/G, no load on VOUT – 1.5 – mG/√Hz VCC = 5 V, TA = 25°C, CBYPASS = open, Sens = 0.5 mV/G, no load on VOUT – 2.5 – mG/√Hz – 3 – Ω Internal Bandwidth [3] BWi Chopping Frequency [3][5] fC OUTPUT CHARACTERISTICS Output Referred Noise [3][6] Input Referred RMS Noise VN Density [3] DC Output Resistance [3] Output Load Resistance [3] Output Load Capacitance [3] Output Voltage Clamp [7][8] Sensitivity Quiescent Voltage Output (QVO) Sensitivity Temperature Coefficient VNRMS ROUT RL VOUT to GND 4.7 – – kΩ CL VOUT to GND – – 10 nF VCLPHIGH TA = 25°C, RL = 10 kΩ (VOUT to GND) 4.35 4.5 4.65 V VCLPLOW TA = 25°C, RL = 10 kΩ (VOUT to VCC) 0.40 0.55 0.70 V A1308LLHLX-05-T 0.43 0.5 0.57 mV/G A1308KUA-1-T 1.17 1.3 1.43 mV/G A1308LLHLX-1-T 1.17 1.3 1.43 mV/G A1308LLHLX-2-T 2.4 2.5 2.6 mV/G A1308KUA-2-T 2.4 2.5 2.6 mV/G 3.025 3.125 3.225 mV/G 3.025 3.125 3.225 mV/G A1308KUA-5-T 4.85 5 5.15 mV/G A1308LLHLX-5-T 4.85 5 5.15 mV/G A1309LLHLX-9-T 8.73 9 9.27 mV/G A1309KUA-9-T 8.73 9 9.27 mV/G Sens A1308KUA-3-T A1308LLHLX-3-T TA = 25°C A1309LLHLX-RP9-T –9.27 –9 –8.73 mV/G VOUT(Q) TA = 25°C 2.488 2.5 2.512 V TCSens Programmed at TA = 125°C (K temp. option) or 150°C (L temp. option), calculated relative to Sens at 25°C 0.08 0.12 0.16 %/°C Continued on the next page… Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 4 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package OPERATING CHARACTERISTICS (continued): Valid through TA , CBYPASS = 0.1 µF, VCC = 5 V, unless otherwise noted Characteristics Symbol Test Conditions Min. Typ. Max. Unit [1] LinERR – ±1.5 – % SymERR – ±1.5 – % – ±1.5 – % ERROR COMPONENTS Linearity Sensitivity Error Symmetry Sensitivity Error Ratiometry Quiescent Voltage Output Error [9] Ratiometry Sensitivity Error [9] Ratiometry Clamp Error [10] RatVOUT(Q) Across supply voltage range (relative to VCC = 5 V) RatSens Across supply voltage range (relative to VCC = 5 V) – ±1.5 – % RatVOUTCLP TA = 25°C, across supply voltage range (relative to VCC = 5 V) – ±1.5 – % A1308KUA-1-T –15 0 15 mV A1308KUA-2-T –10 0 10 mV –10 0 10 mV A1308KUA-5-T –20 0 10 mV A1309KUA-9-T –20 0 10 mV A1308LLHLX-05-T –15 0 15 mV A1308LLHLX-1-T –15 0 15 mV –20 – 0 mV –20 – 0 mV A1308LLHLX-5-T –30 – 0 mV A1309LLHLX-9-T –30 – 0 mV A1309LLHLX-RP9-T –30 – 0 mV – ±2 – % DRIFT CHARACTERISTICS A1308KUA-3-T Typical Quiescent Voltage Output Drift Across Temperature Range ∆VOUT(Q) TA = 125°C A1308LLHLX-2-T A1308LLHLX-3-T Sensitivity Drift Due to Package Hysteresis [11] ∆SensPKG TA = 150°C TA = 25°C, after temperature cycling 11 G (gauss) = 0.1 mT (millitesla), power-up, the output of the device is held low until VCC exceeds VUVLOHI. After the device is powered, the output remains valid until VCC drops below VUVLOLO , when the output is pulled low. 3 Determined by design and characterization, not evaluated at final test. 4 See the Characteristic Definitions section. 5 f varies as much as approximately ±20% across the full operating ambient temperature range and process. C 6 Output Referred Noise is calculated as 6 sigma (6 standard deviations) from characterization of a small sample of devices. Conversion of noise from gauss to mV(P-P) can be done by: Noise (G) × Sensitivity (mV/G) = Noise (mV(P-P)). 7V CLPLOW and VCLPHIGH scale with VCC due to ratiometry. 8 Parameter is tested at wafer probe only. 9 Percent change from actual value at V CC = 5 V, for a given temperature. 10 Percent change from actual value at V CC = 5 V, TA = 25°C. 11 Sensitivity drift through the life of the part, ΔSens LIFE , can have a typical error value ±3% in addition to package hysteresis effects. 2 On Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 5 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package CHARACTERISTIC DEFINITIONS Power-On Time. When the supply is ramped to its operating voltage, the device output requires a finite time to react to an input magnetic field. Power-On Time, tPO , is defined as the time it takes for the output voltage to begin responding to an applied magnetic field after the power supply has reached its minimum specified operating voltage, VCC(min), as shown in Figure 1. Delay to Clamp. A large magnetic input step may cause the clamp to overshoot its steady-state value. The Delay to Clamp, tCLP , is defined as the time it takes for the output voltage to settle within 1% of its steady-state value, after initially passing through its steady-state voltage, as shown in Figure 2. Quiescent Voltage Output. In the quiescent state (no significant magnetic field: B = 0 G), the output, VOUT(Q), is at a constant ratio to the supply voltage, VCC, across the entire operating ranges of VCC and Operating Ambient Temperature, TA. Quiescent Voltage Output Drift Across Temperature Range. Due to internal component tolerances and thermal considerations, the Quiescent Voltage Output, VOUT(Q), may drift due to temperature changes within the Operating Ambient Temperature, TA. For purposes of specification, the Quiescent Voltage Output Drift Across Temperature Range, ∆VOUT(Q) (mV), is defined as: ∆VOUT(Q) = VOUT(Q)(TA) –VOUT(Q)(25°C) V Sensitivity. The amount of the output voltage change is proportional to the magnitude and polarity of the magnetic field applied. This proportionality is specified as the magnetic sensitivity, Sens (mV/G), of the device and is defined as: VCC VCC(typ) VOUT 90% VOUT VCC(min) t2 tPO t1= time at which power supply reaches minimum specified operating voltage t2= time at which output voltage settles within ±10% of its steady-state value under an applied magnetic field 0 +t Figure 1: Definition of Power-On Time, tPO Device Output, VOUT (V) VOUT tCLP t1 t2 t1= time at which output voltage initially reaches steady-state clamp voltage t2= time at which output voltage settles to within 1% of steady-state clamp voltage Magnetic Input Signal Magnetic Input Signal VCLPHIGH VOUT(B+) – VOUT(B–) (2) (B+) – (B–) where B+ is the magnetic flux density in a positive field (south polarity) and B– is the magnetic flux density in a negative field (north polarity). Sens = t1 (1) time (µs) Figure 2: Definition of Delay to Clamp, tCLP Sensitivity Temperature Coefficient. The device sensitivity changes as temperature changes, with respect to its Sensitivity Temperature Coefficient, TCSENS. TCSENS is programmed at 150°C (L temperature device) or at 125°C (K temperature device), and calculated relative to the baseline sensitivity programming temperature of 25°C. TCSENS is defined as: 1 SensT2 – SensT1 TCSens = 100 × (%/°C) (3) SensT1 T2–T1 where T1 is the baseline Sens programming temperature of 25°C, and T2 is the TCSENS programming temperature of 150°C (L temperature device) or 125°C (K temperature device). The ideal value of Sens across the full ambient temperature range, SensIDEAL(TA), is defined as: SensIDEAL(TA) = SensT1 × [100 (%) + TCSENS (TA –T1)] (4) Sensitivity Drift Across Temperature Range. Secondorder sensitivity temperature coefficient effects cause the magnetic sensitivity, Sens, to drift from its ideal value across the operating ambient temperature range, TA. For purposes of specification, the Sensitivity Drift Across Temperature Range, ∆SensTC, Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 6 A1308 and A1309 is defined as: ∆SensTC = Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package SensTA – SensIDEAL(TA) SensIDEAL(TA) × 100 (%) (5) Sensitivity Drift Due to Package Hysteresis. Package stress and relaxation can cause the device sensitivity at TA = 25°C to change during and after temperature cycling. This change in sensitivity follows a hysteresis curve. For purposes of specification, the Sensitivity Drift Due to Package Hysteresis, ∆SensPKG, is defined as: ∆SensPKG = Sens(25°C)(2) – Sens(25°C)(1) Sens(25°C)(1) × 100 (%) (6) where Sens(25°C)(1) is the programmed value of sensitivity at TA = 25°C, and Sens(25°C)(2) is the value of sensitivity at TA = 25°C after temperature cycling TA up to 150°C (L temperature device) or 125°C (K temperature device), down to –40°C, and back up to 25°C. Linearity Sensitivity Error. The A1308 and A1309 are designed to provide linear output in response to a ramping applied magnetic field. Consider two magnetic fields, B1 and B2. Ideally, the sensitivity of a device is the same for both fields, for a given supply voltage and temperature. Linearity error is present when there is a difference between the sensitivities measured at B1 and B2. Linearity Sensitivity Error, LINERR , is calculated separately for positive (LinERR+) and negative (LinERR– ) applied magnetic fields. LINERR (%) is measured and defined as: Sens(B+)(2) × 100 LinERR+ = 1– Sens(B+)(1) (%) Sens(B–)(2) × 100 LinERR– = 1– Sens(B–)(1) (%) (7) |VOUT(Bx) – VOUT(Q)| Bx BMAX(–) = VCLPHIGH – VOUT(Q) (10) Sens VOUT(Q) – VCLPLOW Sens Symmetry Sensitivity Error. The magnetic sensitivity of the device is constant for any two applied magnetic fields of equal magnitude and opposite polarities. Symmetry error, SymERR (%), is measured and defined as: Sens(B+) × 100 (%) SymERR = 1– (11) Sens(B–) where SensBx is as defined in equation 10, and B+ and B– are positive and negative magnetic fields such that |B+| = |B–|. Ratiometry Error. The A1308 and A1309 provide ratiometric output. This means that the Quiescent Voltage Output, VOUT(Q) , magnetic sensitivity, Sens, and clamp voltages, VCLPHIGH and VCLPLOW , are proportional to the supply voltage, VCC. In other words, when the supply voltage increases or decreases by a certain percentage, each characteristic also increases or decreases by the same percentage. Error is the difference between the measured change in the supply voltage relative to 5 V and the measured change in each characteristic. The ratiometric error in quiescent voltage output, RatVOUT(Q) (%), for a given supply voltage, VCC, is defined as: (%) (12) The ratiometric error in magnetic sensitivity, RatSens (%), for a given supply voltage, VCC, is defined as: (8) and Bx are positive and negative magnetic fields, with respect to the quiescent voltage output, such that |B(+)(2)| > |B(+)(1)| and |B(–)(2)| > |B(–)(1)| The effective linearity error is: LinERR = max(|LinERR+| , |LinERR– |) BMAX(+) = VOUT(Q)(VCC) / VOUT(Q)(5V) × 100 RatVOUT(Q) = 1– VCC / 5 (V) where: SensBx = The output voltage clamps, VCLPHIGH and VCLPLOW , limit the operating magnetic range of the applied field in which the device provides a linear output. The maximum positive and negative applied magnetic fields in the operating range can be calculated: (9) Sens(VCC) / Sens(5V) × 100 (%) RatSens = 1– VCC / 5 (V) (13) The ratiometric error in the clamp voltages, RatVOUTCLP (%), for a given supply voltage, VCC, is defined as: VCLP(VCC) / VCLP(5V) × 100 RatVOUTCLP = 1– VCC / 5 (V) (%) (14) where VCLP is either VCLPHIGH or VCLPLOW . Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 7 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package Undervoltage Lockout. The A1308 and A1309 provide an undervoltage lockout feature which ensures that the device outputs a VOUT signal only when VCC is above certain thresholds . The undervoltage lockout feature provides a hysteresis of operation to eliminate indeterminate output states. The output of the A1308 and A1309 is held low (GND) until VCC exceeds VUVLOHI . After VCC exceeds VUVLOHI , the device VOUT output is enabled, providing a ratiometric output voltage that is proportional to the input magnetic signal and VCC . If VCC should drop back down below VUVLOLO for longer than tUVLO after the device is powered up, the output would be pulled low (see Figure 3) until VUVLOHI is reached again and VOUT would be reenabled. VUVLOHI VCC tUVLO VOUT time Figure 3: Definition of Undervoltage Lockout VCC Ramp Time. The time taken for VCC to ramp from 0 V to VCC(typ), 5 V (see Figure 4). VCC(typ) Supply Voltage, VCC (V) VCC Off Level. For applications in which the VCC pin of the A1308 or A1309 is being power-cycled (for example using a multiplexer to toggle the part on and off), the specification of VCC Off Level, VCCOFF , determines how high a VCC off voltage can be tolerated while still ensuring proper operation and startup of the device (see Figure 4). VUVLOLO tVCC VCCOFF 0 time Figure 4: Definition of VCC Ramp Time, tVCC Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 8 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package APPLICATION INFORMATION A1308 A1309 VOUT VCC 5V 0.1 µF RL GND 4.7 nF Figure 5: Typical Application Circuit Chopper Stabilization Technique When using Hall-effect technology, a limiting factor for switchpoint accuracy is the small signal voltage developed across the Hall element. This voltage is disproportionally small relative to the offset that can be produced at the output of the Hall sensor IC. This makes it difficult to process the signal while maintaining an accurate, reliable output over the specified operating temperature and voltage ranges. Chopper stabilization is a unique approach used to minimize Hall offset on the chip. Allegro employs a technique to remove key sources of the output drift induced by thermal and mechanical stresses. This offset reduction technique is based on a signal modulation-demodulation process. The undesired offset signal is separated from the magnetic fieldinduced signal in the frequency domain, through modulation. The subsequent demodulation acts as a modulation process for the offset, causing the magnetic field-induced signal to recover its original spectrum at baseband, while the DC offset becomes a high-frequency signal. The magnetic-sourced signal then can pass through a low-pass filter, while the modulated DC offset is suppressed. In addition to the removal of the thermal and mechanical stress-related offset, this novel technique also reduces the amount of thermal noise in the Hall sensor IC while completely removing the modulated residue resulting from the chopper operation. The chopper stabilization technique uses a high-frequency sampling clock. For demodulation process, a sample-and-hold technique is used. This high-frequency operation allows a greater sampling rate, which results in higher accuracy and faster signal-processing capability. This approach desensitizes the chip to the effects of thermal and mechanical stresses, and produces devices that have extremely stable quiescent Hall output voltages and precise recoverability after temperature cycling. This technique is made possible through the use of a BiCMOS process, which allows the use of low-offset, low-noise amplifiers in combination with highdensity logic integration and sample-and-hold circuits. Regulator Clock/Logic Hall Element Amp Anti-aliasing Tuned LP Filter Filter Figure 6: Chopper Stabilization Technique Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 9 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package Package LH, 3-Pin (SOT-23W) +0.12 2.98 –0.08 1.49 D 4°±4° 3 A +0.020 0.180–0.053 0.96 D +0.10 2.90 –0.20 +0.19 1.91 –0.06 2.40 0.70 D 0.25 MIN 1.00 2 1 0.55 REF 0.25 BSC 0.95 Seating Plane Gauge Plane 8X 10° REF B PCB Layout Reference View C Branding Reference View Branded Face 1.00 ±0.13 0.95 BSC +0.10 0.05 –0.05 0.40 ±0.10 For Reference Only; not for tooling use (reference DWG-2840) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown A Active Area Depth, 0.28 mm REF B Reference land pattern layout All pads a minimum of 0.20 mm from all adjacent pads; adjust as necessary to meet application process requirements and PCB layout tolerances C Branding scale and appearance at supplier discretion D Hall element, not to scale NNN 1 Part Number A1308LLHLX-05-T A1308LLHLX-1-T A1308LLHLX-2-T A1308LLHLX-3-T A1308LLHLX-5-T A1309LLHLX-9-T A1309LLHLX-RP9-T NNN 308 308 308 308 308 309 09R Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 10 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package Package UA, 3-Pin SIP +0.08 4.09 –0.05 45° B C E +0.08 3.02 –0.05 2.04 1.52 ±0.05 1.44 E 10° Mold Ejector Pin Indent E Branded Face A 1.02 MAX 45° 0.79 REF NNN 1 1 2 D Standard Branding Reference View 3 = Supplier emblem N = Last three digits of device part number +0.03 0.41 –0.06 14.99 ±0.25 +0.05 0.43 –0.07 For Reference Only; not for tooling use (reference DWG-9065) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown A Dambar removal protrusion (6X) B Gate and tie bar burr area C Active Area Depth, 0.50 mm REF D Branding scale and appearance at supplier discretion E Hall element (not to scale) 1.27 NOM Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 11 A1308 and A1309 Linear Hall-Effect Sensor ICs with Analog Output Available in a Miniature, Low-Profile Surface-Mount Package Revision History Number Date Description – June 27, 2014 Initial release 1 June 27, 2014 Updated product offerings 2 November 13, 2015 Updated product offerings 3 March 30, 2016 Updated product offerings 4 April 19, 2016 Updated product offerings 5 September 2, 2016 Updated product offerings 6 December 9, 2016 Updated product offerings 7 January 4, 2017 Updated product offerings Copyright ©2017, Allegro MicroSystems, LLC Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro’s products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro’s product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 12