IDT74LVC07A 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS INDUSTRIAL TEMPERATURE RANGE 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS AND 5 VOLT TOLERANT I/O IDT74LVC07A FEATURES: DESCRIPTION: • 0.5 MICRON CMOS Technology • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) • VCC = 3.3V ± 0.3V, Normal Range • VCC = 2.7V to 3.6V, Extended Range µ W typ. static) • CMOS power levels (0.4µ • Rail-to-Rail output swing for increased noise margin • All inputs, outputs, and I/Os are 5V tolerant • Supports hot insertion • Available in SOIC, SSOP, and TSSOP packages This hex buffer/driver is built using advanced dual metal CMOS technology. The outputs of the LVC07A device are open-drain and can be connected to other open-drain outputs to implement active-low wired-OR or active-high wired-AND functions. The maximum sink current is 24mA. The LVC07A has been designed with a +24mA output driver. This driver is capable of driving a moderate to heavy load while maintaining speed performance. Inputs can be driven from either 2.5V, 3.3V (LVTTL), or 5V (CMOS) devices. This feature allows the use of this device as a translator in a mixedsystem environment. DRIVE FEATURES: APPLICATIONS: • High Output Drivers: ±24mA • Reduced system switching noise • 5V and 3.3V mixed voltage systems • Data communication and telecommunication systems FUNCTIONAL BLOCK DIAGRAM A PIN CONFIGURATION Y 1A 1 14 VCC 1Y 2 13 6A 2A 3 12 6Y 2Y 4 11 5A 3A 5 10 5Y 3Y 6 9 4A GND 7 8 4Y SOIC/ SSOP/ TSSOP TOP VIEW PIN DESCRIPTION Pin Names FUNCTION TABLE (EACH BUFFER/DRIVER)(1) Description Inputs Outputs (with pull-up) xA Data Inputs xA xY xY Data Outputs H H L L NOTE: 1. H = HIGH Voltage Level L = LOW Voltage Level The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE JULY 2000 1 ©2000 Integrated Device Technology, Inc. DSC-4723/1 IDT74LVC07A 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS INDUSTRIAL TEMPERATURE RANGE CAPACITANCE (TA = +25°C, F = 1.0MHz) ABSOLUTE MAXIMUM RATINGS(1) Symbol Description Max Unit Conditions Typ. Max. Unit VTERM Terminal Voltage with Respect to GND –0.5 to +6.5 V CIN Input Capacitance VIN = 0V 4.5 6 pF TSTG Storage Temperature –65 to +150 °C COUT Output Capacitance VOUT = 0V 5.5 8 pF IOUT DC Output Current –50 to +50 mA CI/O I/O Port Capacitance VIN = 0V 6.5 8 pF IIK IOK Continuous Clamp Current, VI < 0 or VO < 0 –50 mA ICC ISS Continuous Current through each VCC or GND ±100 mA Symbol Parameter(1) NOTE: 1. As applicable to the device type. NOTE: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Operating Condition: TA = –40°C to +85°C Symbol VIH VIL Typ.(1) — Max. — Unit VCC = 2.3V to 2.7V Min. 1.7 VCC = 2.7V to 3.6V 2 — — V VCC = 4.5V to 5.5V 0.7 x VCC — — VCC = 2.3V to 2.7V — — 0.7 VCC = 2.7V to 3.6V — — 0.8 VCC = 4.5V to 5.5V — — 0.3 x VCC Parameter Input HIGH Voltage Level Input LOW Voltage Level Test Conditions V Input Leakage Current VCC = 3.6V VI = 0 to 5.5V — — ±5 µA IOZH High Impedance Output Current VCC = 3.6V VO = 0 to 5.5V — — ±10 µA IOZL (3-State Output pins) IOFF Input/Output Power Off Leakage VCC = 0V, VIN or VO ≤ 5.5V — — ±50 µA VIK Clamp Diode Voltage VCC = 2.3V, IIN = –18mA — –0.7 –1.2 V VH ICCL ICCH ICCZ ∆ICC Input Hysteresis Quiescent Power Supply Current VCC = 3.3V VCC = 3.6V, VIN = GND or VCC — — 100 — — 10 mV µA Quiescent Power Supply Current Variation One input at VCC - 0.6V, other inputs at VCC or GND — — 500 µA IIH IIL NOTE: 1. Typical values are at VCC = 3.3V, +25°C ambient. 2 IDT74LVC07A 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS INDUSTRIAL TEMPERATURE RANGE OUTPUT DRIVE CHARACTERISTICS Symbol VOL Test Conditions(1) Parameter Output LOW Voltage VCC = 2.3V to 3.6V IOL = 0.1mA VCC = 2.3V Min. Max. Unit — 0.2 V IOL = 6mA — 0.4 IOL = 12mA — 0.7 VCC = 2.7V IOL = 12mA — 0.4 VCC = 3V IOL = 24mA — 0.55 NOTE: 1. VIH and VIL must be within the min. or max. range shown in the DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE table for the appropriate VCC range. TA = – 40°C to + 85°C. OPERATING CHARACTERISTICS, TA = 25°C Symbol CPD VCC = 2.5V±0.2V VCC = 3.3V±0.3V VCC = 5V±0.5V Test Conditions Typical Typical Typical Unit CL = 0pF, f = 10Mhz 2.5 4 7 pF Parameter Power Dissipation Capacitance per Buffer/Driver SWITCHING CHARACTERISTICS(1) VCC = 2.5V±0.2V Symbol tPZL VCC = 3.3V ± 0.3V VCC = 5V±0.5V Min. Max. Min. Max. Min. Max. Min. Max. Unit xA to xY 1 2.8 1 3.3 1 2.9 1 2.6 ns Output Skew(2) — — — — — — — 500 ps Parameter VCC = 2.7V tPLZ tSK(o) NOTES: 1. See TEST CIRCUITS AND WAVEFORMS. TA = – 40°C to + 85°C. 2 Skew between any two outputs of the same package and switching in the same direction. 3 IDT74LVC07A 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS INDUSTRIAL TEMPERATURE RANGE TEST CIRCUITS AND WAVEFORMS TEST CONDITIONS VCC(1) VCC(2) VCC(2) = 2.5V±0.2V =3.3V±0.3V & 2.7V = 5V±0.5V VLOAD 2 x Vcc 6 2 x Vcc V VIH Vcc 2.7 3 V VT Vcc / 2 1.5 1.5 V Symbol Unit VLZ 150 300 200 mV VHZ 150 300 200 mV CL 30 50 50 pF tPHL tPLH tPHL VIH VT 0V OPPOSITE PHASE INPUT TRANSITION LVC QUAD Link Propagation Delay tPZL VOUT D.U.T. OUTPUT SWITCH NORMALLY CLOSED LOW tPZH OUTPUT SWITCH NORMALLY OPEN HIGH 500Ω RT CL LVC QUAD Link Test Circuit for All Outputs VIH VT 0V CONTROL INPUT GND 500Ω VIN DISABLE ENABLE Open (1, 2) tPLH OUTPUT VLOAD VCC Pulse Generator VIH VT 0V VOH VT VOL SAME PHASE INPUT TRANSITION tPLZ VLOAD/2 VT VLOAD/2 VLZ VOL tPHZ VOH VHZ 0V VT 0V LVC QUAD Link DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. NOTE: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. Enable and Disable Times NOTES: 1. Pulse Generator for All Pulses: Rate ≤ 10MHz; tF ≤ 2ns; tR ≤ 2ns. 2. Pulse Generator for All Pulses: Rate ≤ 10MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. DATA INPUT SWITCH POSITION Test Switch tPZL tPLZ tPHZ tPZH VLOAD INPUT OUTPUT 1 tSU tSK (x) ASYNCHRONOUS CONTROL VIH VT 0V tPHL1 tSK (x) tREM tPLH2 tSU tH LVC QUAD Link Set-up, Hold, and Release Times VOH VT VOL LOW-HIGH-LOW PULSE VOH VT VOL OUTPUT 2 tH TIMING INPUT SYNCHRONOUS CONTROL tPLH1 VIH VT 0V VIH VT 0V VIH VT 0V VIH VT 0V VT tW HIGH-LOW-HIGH PULSE tPHL2 VT LVC QUAD Link tSK(x) = tPLH2 - tPLH1 or tPHL2 - tPHL1 Pulse Width LVC QUAD Link Output Skew - tSK(X) NOTES: 1. For tSK(o) OUTPUT1 and OUTPUT2 are any two outputs. 2. For tSK(b) OUTPUT1 and OUTPUT2 are in the same bank. 4 IDT74LVC07A 3.3V CMOS HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION XX LVC XXX XX IDT Temp. Range Device Type Package DC PY PG Small Outline IC Shrink Small Outline Package Thin Shrink Small Outline Package 07A Hex Buffer/Driver with Open Drain Outputs, +24mA 74 – 40°C to +85°C CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com 5 for Tech Support: [email protected] (408) 654-6459