IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE FAST CMOS 18-BIT REGISTERED TRANSCEIVER IDT74FCT16501AT/CT FEATURES: DESCRIPTION: • • • • • The FCT16501T 18-bit registered transceivers are built using advanced dual metal CMOS technology. These high-speed, low-power 18-bit registered bus transceivers combine D-type latches and D-type flip-flops to allow data flow in transparent, latched and clocked modes. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch enable (LEAB and LEBA) and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in transparent mode when LEAB is high. When LEAB is low, the A data is latched if CLKAB is held at a high or low logic level. If LEAB is low, the A bus data is stored in the latch/flip-flop on the low-to-high transition of CLKAB. OEAB is the output enable for the B port. Data flow from the B port to the A port is similar but requires using OEBA, LEBA and CLKBA. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin. The FCT16501T are ideally suited for driving high-capacitance loads and low-impedance backplanes. The output buffers are designed with power off disable capability to allow "live insertion" of boards when used as backplane drivers. • • • • 0.5 MICRON CMOS Technology High-speed, low-power CMOS replacement for ABT functions Typical tSK(o) (Output Skew) < 250ps Low input and output leakage ≤ 1µA (max.) ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) High drive outputs (–32mA IOH, 64mA IOL) Power off disable outputs permit “live insertion” Typical VOLP (Output Ground Bounce) < 1.0V at VCC = 5V, TA = 25°C Available in TSSOP package FUNCTIONAL BLOCK DIAGRAM 1 OEAB 30 CLKBA 28 LEBA 27 OEBA CLKAB LEAB A1 55 2 C C D D 54 B1 3 C C D D TO 17 OTHER CHANNELS The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE june 2006 1 © 2006 Integrated Device Technology, Inc. DSC-5435/4 IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE ABSOLUTE MAXIMUM RATINGS(1) PIN CONFIGURATION Symbol OEAB 1 56 VTERM(2) Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Max Unit –0.5 to 7 V LEAB 2 55 CLKAB VTERM(3) –0.5 to VCC+0.5 V A1 3 54 B1 TSTG Storage Temperature –65 to +150 °C GND 4 53 GND IOUT DC Output Current –60 to +120 mA A2 5 52 B2 A3 6 51 B3 V CC 7 50 V CC A4 8 49 B4 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. All device terminals except FCT162XXX Output and I/O terminals. 3. Output and I/O terminals for FCT162XXX. A5 9 48 B5 A6 10 47 B6 GND 11 46 GND A7 12 45 B7 A8 13 44 B8 A9 14 43 B9 Symbol A 10 15 42 B 10 A 11 16 41 B 11 A 12 17 40 B 12 GND 18 39 GND A 13 19 38 B 13 A 14 20 37 B 14 A 15 21 36 B 15 V CC 22 35 V CC A 16 23 34 B 16 A 17 24 33 B 17 GND 25 32 GND A 18 26 31 B 18 OEBA 27 30 CLKBA LEBA 28 29 GND CAPACITANCE (TA = +25°C, f = 1.0MHz) Parameter(1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 3.5 6 pF COUT Output Capacitance VOUT = 0V 3.5 8 pF NOTE: 1. This parameter is measured at characterization but not tested. FUNCTION TABLE(1, 4) OEAB L H H H H H H TSSOP LEAB X H H L L L L Inputs CLKAB X X X ↑ ↑ L H Ax X L H L H X X Outputs Bx Z L H L H B(2) B(3) NOTES: 1. A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA, LEBA, and CLKBA. 2. Output level before the indicated steady-state input conditions were established. 3. Output level before the indicated steady-state input conditions were established, provided that CLKAB was HIGH before LEAB went LOW. 4. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-impedance ↑ = LOW-to-HIGH Transition TOP VIEW PIN DESCRIPTION Pin Names OEAB OEBA LEAB LEBA CLKAB CLKBA Ax Bx Description GND Description A-to-B Output Enable Input B-to-A Output Enable Input (Active LOW) A-to-B Latch Enable Input B-to-A Latch Enable Input A-to-B Clock Input B-to-A Clock Input A-to-B Data Inputs or B-to-A 3-State Outputs B-to-A Data Inputs or A-to-B 3-State Outputs 2 IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10% Symbol Test Conditions(1) Parameter Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current (Input pins)(5) VCC = Max. — — ±1 µA — — ±1 — — ±1 VI = VCC Input HIGH Current (I/O pins)(5) IIL Input LOW Current (Input pins)(5) VI = GND Input LOW Current (I/O pins)(5) IOZH High Impedance Output Current IOZL (3-State Output pins)(5) VIK Clamp Diode Voltage IOS Short Circuit Current VH Input Hysteresis ICCL ICCH ICCZ Quiescent Power Supply Current VCC = Max. — — ±1 VO = 2.7V — — ±1 VO = 0.5V — — ±1 — –0.7 –1.2 –80 –140 –250 mA — 100 — mV — 5 500 µA VCC = Min., IIN = –18mA VCC = Max., VO = GND(3) — VCC = Max. VIN = GND or VCC µA V OUTPUT DRIVE CHARACTERISTICS Symbol IO VOH Parameter Output Drive Current Output HIGH Voltage VOL Output LOW Voltage IOFF Input/Output Power Off Leakage(5) Test Conditions(1) VCC = Max., VO = 2.5V(3) VCC = Min. IOH = –3mA VIN = VIH or VIL IOH = –15mA IOH = –32mA(4) VCC = Min. IOL = 64mA VIN = VIH or VIL VCC = 0V, VIN or VO ≤ 4.5V NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. 4. Duration of the condition can not exceed one second. 5. This test limit for this parameter is ±5µA at TA = –55°C. 3 Min. –50 2.5 2.4 2 — Typ.(2) — 3.5 3.5 3 0.2 Max. –180 — — — 0.55 Unit mA — — ±1 μA V V IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE POWER SUPPLY CHARACTERISTICS Symbol ΔICC ICCD Parameter Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) IC Total Power Supply Current(6) Test Conditions(1) VCC = Max. VIN = 3.4V(3) VCC = Max., Outputs Open OEAB = OEBA = VCC or GND One Input Toggling 50% Duty Cycle VCC = Max., Outputs Open fCP = 10MHz (CLKAB) 50% Duty Cycle OEAB = OEBA = VCC LEAB = GND One Bit Toggling fi = 5MHz 50% Duty Cycle VCC = Max., Outputs Open fCP = 10MHz (CLKAB) 50% Duty Cycle OEAB = OEBA = VCC LEAB = GND Eighteen Bits Toggling fi = 2.5MHz 50% Duty Cycle Min. — Typ.(2) 0.5 Max. 1.5 Unit mA VIN = VCC VIN = GND — 75 120 µA/ MHz VIN = VCC VIN = GND — 0.8 1.7 mA VIN = 3.4V VIN = GND — 1.3 3.2 VIN = VCC VIN = GND — 3.8 6.5(5) VIN = 3.4V VIN = GND — 8.5 20.8(5) NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fCPNCP/2 + fiNi) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fi = Input Frequency Ni = Number of Inputs at fi 4 IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE SWITCHING CHARACTERISTICS OVER OPERATING RANGE Symbol fMAX tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tSU tH tSU tH tW tW tSK(o) Parameter Condition(1) CLKAB or CLKBA frequency(3) CL = 50pF RL = 500Ω Propagation Delay Ax to Bx or Bx to Ax Propagation Delay LEBA to Ax, LEAB to Bx Propagation Delay CLKBA to Ax, CLKAB to Bx Output Enable Time OEBA to Ax, OEAB to Bx Output Disable Time OEBA to Ax, OEAB to Bx Set-up Time, HIGH or LOW Ax to CLKAB, Bx to CLKBA Hold Time, HIGH or LOW Ax to CLKAB, Bx to CLKBA Set-up Time HIGH or LOW Clock LOW Ax to LEAB, Bx to LEBA Clock HIGH Hold Time, HIGH or LOW Ax to LEAB, Bx to LEBA LEAB or LEBA Pulse Width HIGH(3) CLKAB or CLKBA Pulse Width HIGH or LOW(3) Output Skew(4) FCT16501AT Min.(2) Max. Unit — 1.5 150 5.1 — 1.5 150 4.3 MHz ns 1.5 5.6 1.5 4.4 ns 1.5 5.6 1.5 4.4 ns 1.5 6 1.5 4.8 ns 1.5 5.6 1.5 5.2 ns 3 — 2.4 — ns 0 — 0 — ns 3 1.5 1.5 — — — 2 1.5 0.5 — — — ns ns 3 3 — — 3 3 — — ns ns — 0.5 — 0.5 ns NOTES: 1. See test circuits and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. This parameter is guaranteed but not tested. 4. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design. 5 FCT16501CT Min.(2) Max. IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE TEST CIRCUITS AND WAVEFORMS V CC SWITCH POSITION 7.0V Test Switch Open Drain Disable Low Enable Low Closed All Other Tests Open 500Ω V OUT VIN Pulse Generator D.U.T. 50pF RT 500Ω CL DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. Test Circuits for All Outputs DATA INPUT tH tSU TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tSU 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE 1.5V tW 3V 1.5V 0V HIGH-LOW-HIGH PULSE 1.5V 3V 1.5V 0V tH Pulse Width Set-up, Hold, and Release Times ENABLE SAME PHASE INPUT TRANSITION tPLH tPHL OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL 3V 1.5V 0V DISABLE 3V 1.5V CONTROL INPUT OUTPUT NORMALLY LOW 3V 1.5V 0V OUTPUT NORMALLY HIGH Propagation Delay SWITCH CLOSED tPZH SWITCH OPEN 0V tPLZ tPZL VOH 1.5V VOL 3.5V 1.5V 3.5V 0.3V VOL tPHZ 0.3V 1.5V 0V VOH 0V Enable and Disable Times NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. 6 IDT74FCT16501AT/CT FAST CMOS 18-BIT REGISTERED TRANSCEIVER INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION IDT XX FCT Temp. Range XXX Family XXXX Device Type XX Package CORPORATE HEADQUARTERS 6024 Silver Creek Valley Road San Jose, CA 95138 PA PAG Thin Shrink Small Outline Package TSSOP - Green 501AT 501CT 18-Bit Registered Transceiver 16 Double-Density, 5 Volt, High Drive 74 – 40°C to +85°C for SALES: 800-345-7015 or 408-284-8200 fax: 408-284-2775 www.idt.com 7 for Tech Support: [email protected]