TC7MH595FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC7MH595FK 8-Bit Shift Register/Latch (3-State) The TC7MH595FK is an advanced high speed 8 bit shift register/latch fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent bipolar schottky TTL while maintaining the CMOS low power dissipation. The TC7MH595FK contains an 8 bit static shift register which feeds an 8 bit storage register. Shift operation is accomplished on the positive going transition of the SCK input. The output register is loaded with the contents of the shift register on the positive going transition of the RCK input. Since RCK and SCK signals are independent, parallel outputs can be held stable during the shift operation. And, since Weight: 0.02 g (typ.) the parallel outputs are 3-state, it can be directly connected to 8 bit bus. This register can be used in serial-to-parallel conversion, data receivers, etc. An input protection circuit ensures that 0 to 5.5 V can be applied to the input pins without regard to the supply voltage. This device can be used to interface 5 V to 3 V systems and two supply systems such as battery back up. This circuit prevents device destruction due to mismatched supply and input voltages. Features • High speed: fmax = 185 MHz (typ.) (VCC = 5 V) • Low power dissipation: ICC = 4 μA (max) (Ta = 25°C) • High noise immunity: VNIH = VNIL = 28% VCC (min) • Power down protection is provided on all inputs. • Balanced propagation delays: tpLH ≈ tpHL • Wide operating voltage range: VCC (opr) = 2~5.5 V • Low noise: VOLP = 1.0 V (max) • Pin and function compatible with 74ALS595 1 2007-10-19 TC7MH595FK Pin Assignment (top view) IEC Logic Symbol QB 1 16 VCC QC 2 15 QA G RCK SCLR QD 3 14 SI QE 4 13 G QF 5 12 RCK QG 6 11 SCK QH 7 10 SCLR GND 8 9 QH’ SCK SI (13) (12) (10) (11) (14) EN3 C2 SRG8 R C/1 → 1D 2D 3 2D 3 (15) (1) (2) (3) (4) (5) (6) (7) (9) QA QB QC QD QE QF QG QH QH’ Truth Table Inputs Function SI SCK SCLR RCK G X X X X H QA thru QH outputs disable X X X X L QA thru QH outputs enable X X L X X Shift register is cleared. L H X X First stage of S.R. becomes “L”. Other stages store the data of previous stage, respectively. H H X X First stage of S.R. becomes “H”. Other stages store the data of previous stage, respectively. X H X X State of S.R. is not changed. X X X X S.R. data is stored into storage register. X X X X Storage register stage is not changed. X: Don’t care 2 2007-10-19 TC7MH595FK Timing Chart SCK SI RCK SCLR G QA QB QC QD QE QF QG QH QH’ System Diagram SCLR SI SCK RCK G 10 14 R D Q D R Q R D Q R D Q D R Q R D Q R D Q D R SCK SCK SCK SCK SCK SCK SCK SCK D Q D Q D Q D Q D Q D Q D Q D Q RCK RCK RCK RCK RCK RCK RCK RCK QH’ Q 9 11 12 13 15 QA 1 2 3 4 QB QC QD QE 3 5 QF 6 7 QG QH 2007-10-19 TC7MH595FK Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5~7.0 V DC input voltage VIN −0.5~7.0 V VOUT −0.5~VCC + 0.5 V Input diode current IIK −20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±75 mA Power dissipation PD 180 mW Storage temperature Tstg −65~150 °C DC output voltage Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Operating Ranges (Note) Characteristics Symbol Rating Unit Supply voltage VCC 2.0~5.5 V Input voltage VIN 0~5.5 V VOUT 0~VCC V Operating temperature Topr −40~85 °C Input rise and fall time dt/dv Output voltage 0~100 (VCC = 3.3 ± 0.3 V) 0~20 (VCC = 5 ± 0.5 V) ns/V Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 4 2007-10-19 TC7MH595FK Electrical Characteristics DC Characteristics Characteristics High level Symbol Test Condition VIH ⎯ Ta = 25°C Min Typ. Max Min Max 2.0 1.50 ⎯ ⎯ 1.50 ⎯ 3.0~5.5 VCC × 0.7 ⎯ ⎯ VCC × 0.7 ⎯ 2.0 ⎯ ⎯ 0.50 ⎯ 0.50 3.0~5.5 ⎯ ⎯ VCC × 0.3 ⎯ VCC × 0.3 2.0 1.9 2.0 ⎯ 1.9 ⎯ 3.0 2.9 3.0 ⎯ 2.9 ⎯ 4.5 4.4 4.5 ⎯ 4.4 ⎯ IOH = −4 mA 3.0 2.58 ⎯ ⎯ 2.48 ⎯ IOH = −8 mA 4.5 3.94 ⎯ ⎯ 3.80 ⎯ 2.0 ⎯ 0 0.1 ⎯ 0.1 3.0 ⎯ 0 0.1 ⎯ 0.1 4.5 ⎯ 0 0.1 ⎯ 0.1 IOL = 4 mA 3.0 ⎯ ⎯ 0.36 ⎯ 0.44 IOL = 8 mA 4.5 ⎯ ⎯ 0.36 ⎯ 0.44 5.5 ⎯ ⎯ ±0.25 ⎯ ±2.50 μA ⎯ VIL IOH = −50 μA High level VOH VIN = VIH or VIL Output voltage IOL = 50 μA Low level VOL Unit VCC (V) Input voltage Low level Ta = −40~85°C VIN = VIH or VIL VIN = VIH or VIL V V 3-state output off-state current IOZ Input leakage current IIN VIN = 5.5 V or GND 0~5.5 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 5.5 ⎯ ⎯ 4.0 ⎯ 40.0 μA VOUT = VCC or GND Timing Requirements (Input: tr = tf = 3 ns) Characteristics Minimum pulse width (SCK, RCK) Minimum pulse width ( SCLR ) Minimum set-up time (SI-SCK) Minimum set-up time (SCK-RCK) Minimum set-up time ( SCLR -RCK) Minimum hold time (SI-SCK) Minimum hold time (SCK-RCK, SCLR -RCK) Minimum removal time ( SCLR ) Symbol Test Condition tw (H) tw (L) ⎯ tw (L) ⎯ ts ⎯ ts ⎯ ts ⎯ th ⎯ th ⎯ trem ⎯ 5 Ta = 25°C Ta = −40~85°C VCC (V) Typ. Limit Limit 3.3 ± 0.3 ⎯ 5.0 5.0 5.0 ± 0.5 ⎯ 5.0 5.0 3.3 ± 0.3 ⎯ 5.0 5.0 5.0 ± 0.5 ⎯ 5.0 5.0 3.3 ± 0.3 ⎯ 3.5 3.5 5.0 ± 0.5 ⎯ 3.0 3.0 3.3 ± 0.3 ⎯ 8.0 8.5 5.0 ± 0.5 ⎯ 5.0 5.0 3.3 ± 0.3 ⎯ 8.0 9.0 5.0 ± 0.5 ⎯ 5.0 5.0 3.3 ± 0.3 ⎯ 1.5 1.5 5.0 ± 0.5 ⎯ 2.0 2.0 3.3 ± 0.3 ⎯ 0 0 5.0 ± 0.5 ⎯ 0 0 3.3 ± 0.3 ⎯ 3.0 3.0 5.0 ± 0.5 ⎯ 2.5 2.5 Unit ns ns ns ns ns ns ns ns 2007-10-19 TC7MH595FK AC Characteristics (Input: tr = tf = 3 ns) Characteristics Propagation delay time (SCK-QH’) Propagation delay time ( SCLR -QH’) Propagation delay time (RCK-Qn) Output enable time Output disable time Symbol Ta = 25°C Test Condition VCC (V) CL (pF) Min Typ. Max Min Max 15 ⎯ 8.8 13.0 1.0 15.0 50 ⎯ 11.3 16.5 1.0 18.5 15 ⎯ 6.2 8.2 1.0 9.4 50 ⎯ 7.7 10.2 1.0 11.4 15 ⎯ 8.4 12.8 1.0 13.7 50 ⎯ 10.9 16.3 1.0 17.2 15 ⎯ 5.9 8.0 1.0 9.1 50 ⎯ 7.4 10.0 1.0 11.1 15 ⎯ 7.7 11.9 1.0 13.5 50 ⎯ 10.2 15.4 1.0 17.0 15 ⎯ 5.4 7.4 1.0 8.5 50 ⎯ 6.9 9.4 1.0 10.5 15 ⎯ 7.5 11.5 1.0 13.5 50 ⎯ 9.0 15.0 1.0 17.0 15 ⎯ 4.8 8.6 1.0 10.0 50 ⎯ 8.3 10.6 1.0 12.0 3.3 ± 0.3 50 ⎯ 12.1 15.7 1.0 16.2 5.0 ± 0.5 50 ⎯ 7.6 10.3 1.0 11.0 3.3 ± 0.3 tpLH tpHL ⎯ 5.0 ± 0.5 3.3 ± 0.3 tpHL ⎯ 5.0 ± 0.5 3.3 ± 0.3 tpLH tpHL ⎯ 5.0 ± 0.5 tpZL tpZH tpLZ tpHZ 3.3 ± 0.3 RL = 1 kΩ 5.0 ± 0.5 RL = 1 kΩ 3.3 ± 0.3 Maximum clock frequency fmax ⎯ 5.0 ± 0.5 Input capacitance Output capacitance Power dissipation capacitance Ta = −40~85°C 15 80 150 ⎯ 70 ⎯ 50 55 130 ⎯ 50 ⎯ 15 135 185 ⎯ 115 ⎯ 50 95 155 ⎯ 85 ⎯ Unit ns ns ns ns ns MHz CIN ⎯ ⎯ 4 10 ⎯ 10 pF COUT ⎯ ⎯ 6 ⎯ ⎯ ⎯ pF ⎯ 87 ⎯ ⎯ ⎯ pF CPD (Note) Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC 6 2007-10-19 TC7MH595FK Noise Characteristics (Input: tr = tf = 3 ns) Characteristics Ta = 25°C Test Condition Symbol VCC (V) Typ. Limit Unit Quiet output maximum dynamic VOL VOLP CL = 50 pF 5.0 0.8 1.0 V Quiet output minimum dynamic VOL VOLV CL = 50 pF 5.0 −0.8 −1.0 V Minimum high level dynamic input voltage VIH VIHD CL = 50 pF 5.0 ⎯ 3.5 V Maximum low level dynamic input voltage VIL VILD CL = 50 pF 5.0 ⎯ 1.5 V Input Equivalent Circuit Input 7 2007-10-19 TC7MH595FK Package Dimensions Weight: 0.02 g (typ.) 8 2007-10-19 TC7MH595FK RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 9 2007-10-19