Numonyx JS48F4400P0R0Q0 Strataflashâ® cellular memory Datasheet

Numonyx™ StrataFlash® Cellular Memory
(M18)
Datasheet
Product Features
„
„
„
High-Performance Read, Program and Erase
— 96 ns initial read access
— 108 MHz with zero wait-state synchronous
burst reads: 7 ns clock-to-data output
— 133 MHz with zero wait-state synchronous
burst reads: 5.5 ns clock-to-data output
— 8-, 16-, and continuous-word
synchronous-burst Reads
— Programmable WAIT configuration
— Customer-configurable output driver
impedance
— Buffered Programming:
2.0 µs/Word (typ), 512-Mbit 65 nm;
Block Erase: 0.9 s per block (typ)
— 20 µs (typ) program/erase suspend
Architecture
— 16-bit wide data bus
— Multi-Level Cell Technology
— Symmetrically-Blocked Array Architecture
— 256-Kbyte Erase Blocks
— 1-Gbit device: Eight 128-Mbit partitions
— 512-Mbit device: Eight 64-Mbit partitions
— 256-Mbit device: Eight 32-Mbit partitions.
— 128-Mbit device: Eight 16-Mbit partitions.
— Read-While-Program and Read-While-Erase
— Status Register for partition/device status
— Blank Check feature
Quality and Reliability
— Expanded temperature: –30 °C to +85 °C
— Minimum 100,000 erase cycles per block
— ETOX™ X Process Technology (65 nm)
— ETOX™ IX Process Technology (90 nm)
„
„
„
„
Power
— Core voltage: 1.7 V - 2.0 V
— I/O voltage: 1.7 V - 2.0 V
— Standby current: 60 µA (typ) for 512-Mbit,
65 nm
— Deep Power-Down mode: 2 µA (typ)
— Automatic Power Savings mode
— 16-word synchronous-burst read current:
23 mA (typ) @ 108 MHz; 24 mA (typ) @
133 MHz
Software
— Numonyx™ Flash Data Integrator
(Numonyx™ FDI) optimized
— Basic Command Set and Extended
Command Set compatible
— Common Flash Interface
Security
— OTP Registers:
64 unique pre-programmed bits
2112 user-programmable bits
— Absolute write protection with VPP = GND
— Power-transition erase/program lockout
— Individual zero-latency block locking
— Individual block lock-down
Density and Packaging
— Density: 128-, 256-, and 512-Mbit, and 1Gbit
— Address-data multiplexed and nonmultiplexed interfaces
— x16D (105-ball) Flash SCSP
— x16C (107-ball) Flash SCSP
— 0.8 mm pitch lead-free solder-ball
Order Number: 309823-11
April 2008
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH NUMONYX™ PRODUCTS. NO LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR
OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT AS PROVIDED IN NUMONYX'S TERMS AND
CONDITIONS OF SALE FOR SUCH PRODUCTS, NUMONYX ASSUMES NO LIABILITY WHATSOEVER, AND NUMONYX DISCLAIMS ANY EXPRESS OR IMPLIED
WARRANTY, RELATING TO SALE AND/OR USE OF NUMONYX PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A
PARTICULAR PURPOSE, MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT. Numonyx
products are not intended for use in medical, life saving, life sustaining, critical control or safety systems, or in nuclear facility applications.
Legal L ines and D isc laim er s
Numonyx B.V. may make changes to specifications and product descriptions at any time, without notice.
Numonyx B.V. may have patents or pending patent applications, trademarks, copyrights, or other intellectual property rights that relate to the presented
subject matter. The furnishing of documents and other materials and information does not provide any license, express or implied, by estoppel or
otherwise, to any such patents, trademarks, copyrights, or other intellectual property rights.
Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Numonyx reserves these for
future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them.
Contact your local Numonyx sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Numonyx literature may be obtained by visiting the
Numonyx website at http://www.numonyx.com.
Numonyx, the Numonyx logo, and StrataFlash are trademarks or registered trademarks of Numonyx B.V. or its subsidiaries in other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 2008, Numonyx B.V., All Rights Reserved.
Datasheet
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April 2008
Order Number: 309823-11
Numonyx™ StrataFlash® Cellular Memory (M18)
Contents
1.0
Introduction .............................................................................................................. 8
1.1
Document Purpose .............................................................................................. 8
1.2
Nomenclature ..................................................................................................... 8
1.3
Acronyms........................................................................................................... 8
1.4
Conventions ....................................................................................................... 9
2.0
Functional Description ............................................................................................. 10
2.1
Product Overview .............................................................................................. 10
2.2
Configuration and Memory Map ........................................................................... 11
2.3
Device ID ......................................................................................................... 12
3.0
Package Information ............................................................................................... 13
4.0
Ballouts and Signal Descriptions.............................................................................. 23
4.1
Ballouts, x16D .................................................................................................. 23
4.1.1 x16D (105-Ball) Ballout, Non-Mux ............................................................ 23
4.1.2 x16D (105-Ball) Ballout, AD-Mux.............................................................. 24
4.1.3 x16D Mux (105-Ball) Ballout, AA/D Mux .................................................... 25
4.2
Signal Descriptions, x16D................................................................................... 26
4.3
Ballouts, x16C .................................................................................................. 29
4.3.1 x16C (107-Ball) Ballout, Non-Mux ............................................................ 29
4.3.2 x16C (107-Ball) Ballout, AD-Mux .............................................................. 31
4.3.3 x16C (107-Ball) Ballout, AA/D-Mux ........................................................... 32
4.4
Signal Descriptions x16C .................................................................................... 33
4.5
Ballouts, x16 Split Bus ....................................................................................... 37
4.5.1 x16 Split Bus (165-Ball) Ballout, Non-Mux ................................................. 37
4.6
Signal Descriptions, x16 Split Bus........................................................................ 38
5.0
Maximum Ratings and Operating Conditions............................................................ 42
5.1
Absolute Maximum Ratings................................................................................. 42
5.2
Operating Conditions ......................................................................................... 42
6.0
Electrical Characteristics ......................................................................................... 43
6.1
Initialization ..................................................................................................... 43
6.1.1 Power-Up/Down Characteristics................................................................ 43
6.1.2 Reset Characteristics .............................................................................. 43
6.1.3 Power Supply Decoupling ........................................................................ 43
6.2
DC Current Specifications ................................................................................... 44
6.3
DC Voltage Specifications ................................................................................... 46
6.4
Capacitance...................................................................................................... 47
7.0
NOR Flash AC Characteristics................................................................................... 48
7.1
AC Test Conditions ............................................................................................ 48
7.2
Read Specifications............................................................................................ 49
7.2.1 Read Timing Waveforms.......................................................................... 52
7.2.2 Timings: Non-Mux Device, Async Read ...................................................... 53
7.2.3 Timings: Non-Mux Device, Sync Read ....................................................... 54
7.2.4 Timings: AD-Mux Device, Async Read ....................................................... 57
7.2.5 Timings: AD-Mux Device, Sync Read ......................................................... 58
7.3
Write Specifications ........................................................................................... 60
7.3.1 Write Timing Waveforms ......................................................................... 61
7.3.2 Timings: Non Mux Device ........................................................................ 62
7.3.3 Timings: AD-Mux Device ......................................................................... 65
7.4
Program and Erase Characteristics....................................................................... 68
April 2008
Order Number: 309823-11
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.5
7.6
Reset Specifications ...........................................................................................69
Deep Power Down Specifications..........................................................................69
8.0
NOR Flash Bus Interface ..........................................................................................71
8.1
Bus Reads ........................................................................................................71
8.1.1 Asynchronous single-word reads ...............................................................72
8.1.2 Asynchronous Page Mode (Non-multiplexed devices only) ............................72
8.1.3 Synchronous Burst Mode .........................................................................72
8.2
Bus Writes ........................................................................................................73
8.3
Reset ...............................................................................................................73
8.4
Deep Power-Down .............................................................................................73
8.5
Standby ...........................................................................................................74
8.6
Output Disable ..................................................................................................74
8.7
Bus Cycle Interleaving ........................................................................................74
8.7.1 Read Operation During Program Buffer fill ..................................................75
8.8
Read-to-Write and Write-to-Read Bus Transitions...................................................75
8.8.1 Write to Asynchronous read transition .......................................................75
8.8.2 Write to synchronous read transition .........................................................75
8.8.3 Asynchronous/Synchronous read to write transition.....................................75
8.8.4 Bus write with active clock .......................................................................75
9.0
NOR Flash Operations ..............................................................................................76
9.1
Status Register..................................................................................................76
9.1.1 Clearing the Status Register .....................................................................77
9.2
Read Configuration Register ................................................................................77
9.2.1 Latency Count ........................................................................................78
9.3
Enhanced Configuration Register..........................................................................79
9.3.1 Output Driver Control ..............................................................................80
9.3.2 Programming the ECR .............................................................................80
9.4
Read Operations ................................................................................................81
9.4.1 Read Array ............................................................................................81
9.4.2 Read Status Register...............................................................................82
9.4.3 Read Device Information .........................................................................82
9.4.4 CFI Query ..............................................................................................83
9.5
Programming Modes ..........................................................................................83
9.5.1 Control Mode .........................................................................................84
9.5.2 Object Mode ..........................................................................................85
9.6
Programming Operations ....................................................................................88
9.6.1 Single-Word Programming .......................................................................88
9.6.2 Buffered Programming ............................................................................89
9.6.3 Buffered Enhanced Factory Programming (BEFP).........................................90
9.7
Block Erase Operations .......................................................................................92
9.8
Blank Check Operation .......................................................................................93
9.9
Suspend and Resume .........................................................................................93
9.10 Simultaneous Operations ....................................................................................95
9.11 Security ...........................................................................................................95
9.11.1 Block Locking .........................................................................................95
9.11.2 One-Time Programmable (OTP) Registers ..................................................97
9.11.3 Global Main-Array Protection ....................................................................99
10.0 Device Command Codes ......................................................................................... 100
11.0 Flow Charts............................................................................................................ 101
12.0 Common Flash Interface ........................................................................................ 110
12.1 Query Structure Output .................................................................................... 110
12.2 Block Status Register ....................................................................................... 111
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April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
12.3
12.4
12.5
CFI Query Identification String .......................................................................... 111
Device Geometry Definition .............................................................................. 113
Numonyx-Specific Extended Query Table ............................................................ 114
13.0 Next State ............................................................................................................. 120
A
AADM Mode ........................................................................................................... 128
B
Additional Information .......................................................................................... 136
C
Ordering Information ............................................................................................ 136
April 2008
Order Number: 309823-11
Datasheet
5
Numonyx™ StrataFlash® Cellular Memory (M18)
Revision History
Date
Revision
14-April-06
001
Initial Release
002
Updated the template (naming and branding).
On the cover page, changed BEFP from 1.6 µs/byte (typ) to 3.2 µs/Word (typ).
20-June-06
003
Correced the BEFP on the cover page to read 3.2 µs/Word and synchronized the BEFP on the
cover with that in Section 7.4, “Program and Erase Characteristics” on page 68.
Added Figure 1, “Mechanical Specifications: x16D (105-ball) package (8x10x1.0 mm)” on page 14 and
Figure 5, “Mechanical Specifications: x16 Split Bus (165-ball) package (10x11x1.2 mm)” on page 18.
Added the following line item part numbers:
—PF48F6000M0Y0BE
—PF38F6070M0Y0BE
—PF38F6070M0Y0VE
—PF48F6000M0Y1BE
October 2006
004
Removed information on the 90 nm Extended Flash Array (EFA) feature that is no longer
supported.
November 2006
005
Revised to include 65 nm, 1-Gbit device information. Moved sections for Device ID, Additional
Information, and Order Information to Functional Description chapter. Created a separate M18
Developer’s Manual to include the following information:
—Bus Interface
—Flash Operations
—Device Command Codes
—Flow Charts
—Common Flash Interface
—Next State Table
Removed line item PF5566MMY0C0 (512+512 M18 + 128 + 128 PSRAM) and its accompanying
package (8x11x1.4, x16C 107 ball).
Added the following line items:
—PF48F6000M0Y0BE, 65 nm
—PF38F6070M0Y0BE, 65 nm
—PF38F4060M0Y0B0
—PF58F0031M0Y1BE, 65 nm
—PF38F6070M0Y0C0, 65 nm
—PF38F4060M0Y0C0
—PF38F4060M0Y1C0
—PF38F6070M0Y0VE, 65 nm
Added the following packages to support new line items:
—8x10x1.0, x16D 105 ball
—11x15x1.2, x16D 105 ball
—11x11x1.2, x16C 107 ball
—8x10x1.2, x16C 107 ball
—10x11x1.2, x16SB 165 ball
November 2006
006
Updated line item information.
February 2007
007
Added the following line items and package as applicable:
PF48F4000M0Y0CE, 8x10x1.0 x16C
28-April-06
Description
June 2007
008
Merged the Developer Manual and Datasheet content into a single document.
March 2008
009
Updated the Performance specifications for 133MHz Capulet 1G improvements.
March 2007
008
Updated timing diagrams in AC Characteristics section.
Datasheet
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April 2008
Order Number: 309823-11
Numonyx™ StrataFlash® Cellular Memory (M18)
Date
Revision
July 2007
009
March 2008
010
April 2008
11
April 2008
Order Number: 309823-11
Description
Added note stating the value of RCR8 in timing diagrams inSection 7.2.1, “Read Timing Waveforms”
on page 52.
Resized several timing diagrams in AC Characteristics section.
Updated timing diagrams Figure 31, “Async Read to Write (Non-Mux)” on page 62, Figure 36, “Async Read
to Write (AD-Mux)” on page 66 and Figure 37, “Write to Async Read (AD-Mux)” on page 66
Updated Program performance specs with Capulet improved performance values.
Applied Numonyx branding.
Datasheet
7
Numonyx™ StrataFlash® Cellular Memory (M18)
1.0
Introduction
Numonyx™ StrataFlash® Cellular Memory is the sixth generation Numonyx™
StrataFlash® memory with multi-level cell (MLC) technology. It provides highperformance, low-power synchronous-burst read mode and asynchronous read mode
at 1.8 V. It features flexible, multi-partition read-while-program and read-while-erase
capability, enabling background programming or erasing in one partition
simultaneously with code execution or data reads in another partition. The eight
partitions allow flexibility for system designers to choose the size of the code and data
segments. The Numonyx™ StrataFlash® Cellular Memory is manufactured using Intel*
65 nm ETOX* X and 90 nm ETOX* IX process technology and is available in industrystandard chip-scale packaging.
1.1
Document Purpose
This document describes the specifications of the Numonyx™ StrataFlash® Cellular
Memory device.
1.2
Nomenclature
Table 1:
Definition of Terms
Term
Definition
1.8 V
Refers to VCC and VCCQ voltage range of 1.7 V to 2.0 V
Block
A group of bits that erase with one erase command
Main Array
A group of 256-KB blocks used for storing code or data
Partition
A group of blocks that share common program and erase circuitry and command status register
Programming Region
An aligned 1-KB section within the main array
Segment
A 32-byte section within the programming region
Byte
8 bits
Word
2 bytes = 16 bits
Kb
1024 bits
KB
1024 bytes
KW
1024 words
Mb
1,048,576 bits
MB
1,048,576 bytes
1.3
Acronyms
Table 2:
List of Acronyms
Acronym
Meaning
APS
Automatic Power Savings
CFI
Common Flash Interface
DU
Don’t Use
ECR
Enhanced Configuration Register (Flash)
Datasheet
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April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 2:
List of Acronyms
Acronym
Meaning
ETOX
EPROM Tunnel Oxide
FDI
Numonyx™ Flash Data Integrator
RCR
Read Configuration Register (Flash)
RFU
Reserved for Future Use
SCSP
Stacked Chip Scale Package
1.4
Conventions
Table 3:
Datasheet Conventions
Convention
Meaning
Group Membership Brackets
Square brackets are used to designate group membership or to define a group of signals with a
similar function, such as A[21:1].
VCC vs. VCC
When referring to a signal or package-connection name, the notation used is VCC. When
referring to a voltage level, the notation used is subscripted such as VCC .
Device
This term is used interchangeably throughout this document to denote either a particular die, or
all die in the package.
F[3:1]-CE#,
F[2:1]-OE#
This is the method used to refer to more than one chip-enable or output enable. When each is
referred to individually, the reference is F1-CE# and F1-OE# (for die #1), and F2-CE# and F2OE# (for die #2).
F-VCC P-VCC, S-VCC
When referencing flash memory signals, the notation used is F-VCC or F-VCC, respectively. When
the reference is to PSRAM signals or timings, the notation is prefixed with “P-” (for example, PVCC, P-VCC).
When referencing SRAM signals or timings, the notation is prefixed with “S-” (for example, SVCC or S-VCC).
P-VCC and S-VCC are RFU for stacked combinations that do not include PSRAM or SRAM.
R-OE#, R-LB#,
R-UB#, R-WE#
Used to identify RAM OE#, LB#, UB#, WE# signals, and are usually shared between two or
more RAM die. R-OE#, R-LB#, R-UB# and R-WE# are RFU for stacked combinations that do not
include PSRAM or SRAM.
00FFh
Denotes 16-bit hexadecimal numbers
00FF 00FFh
Denotes 32-bit hexadecimal numbers
April 2008
309823-10
Datasheet
9
Numonyx™ StrataFlash® Cellular Memory (M18)
2.0
Functional Description
2.1
Product Overview
The Numonyx™ StrataFlash® Cellular Memory (M18) device provides high read and
write performance at low voltage on a 16-bit data bus.
The flash memory device has a multi-partition architecture with read-while-program
and read-while-erase capability.
The device supports synchronous burst reads up to 108 MHz using ADV# and CLK
address-latching on some litho/density combinations and up to 133 MHz using CLK
address-latching only on some litho/density combinations. It is listed below in the
following table.
Table 4:
M18 Product Litho/Density/Frequency Combinations
Litho (nm)
90
65
Density (Mbit)
Supports frequency up to (MHz)
Sync read address-latching
256
133
CLK-latching
512
108
ADV#- and CLK-latching
128
133
CLK-latching
256
133
CLK-latching
512
133
CLK-latching
1024
108
ADV#- and CLK-latching
1024
133
CLK-latching
In continuous-burst mode, a data Read can traverse partition boundaries.
Upon initial power-up or return from reset, the device defaults to asynchronous arrayread mode. Synchronous burst-mode reads are enabled by programming the Read
Configuration Register. In synchronous burst mode, output data is synchronized with a
user-supplied clock signal. A WAIT signal provides easy CPU-to-flash memory
synchronization.
Designed for low-voltage applications, the device supports read operations with VCC at
1.8 V, and erase and program operations with VPP at 1.8 V or 9.0 V. VCC and VPP can
be tied together for a simple, ultra-low power design. In addition to voltage flexibility, a
dedicated VPP connection provides complete data protection when VPP is less than
VPPLK.
A Status Register provides status and error conditions of erase and program
operations.
One-Time-Programmable (OTP) registers allow unique flash device identification that
can be used to increase flash content security. Also, the individual block-lock feature
provides zero-latency block locking and unlocking to protect against unwanted program
or erase of the array.
The flash memory device offers three power savings features:
• Automatic Power Savings (APS) mode: The device automatically enters APS
following a read-cycle completion.
• Standby mode: Standby is initiated when the system deselects the device by
deasserting CE#.
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Numonyx™ StrataFlash® Cellular Memory (M18)
• Deep Power-Down (DPD) mode: DPD provides the lowest power consumption and
is enabled by programming in the Enhanced Configuration Register. DPD is initiatied
by asserting the DPD pin.
2.2
Configuration and Memory Map
The Numonyx™ StrataFlash® Cellular Memory device features a symmetrical block
architecture. The flash device main array is divided as follows:
• The main array of the 128-Mbit device is divided into eight 16-Mbit partitions. Each
parition is divided into eight 256-KByte blocks: 8 x 8 = 64 blocks in the main array
of a 128-Mbit device.
• The main array of the 256-Mbit device is divided into eight 32-Mbit partitions. Each
parition is divided into sixteen 256-KByte blocks: 8 x 16 = 128 blocks in the main
array of a 256-Mbit device.
• The main array of the 512-Mbit device is divided into eight 64-Mbit partitions. Each
parition is divided into thirty-two 256-KByte blocks: 8 x 32 = 256 blocks in the
main array of a 256-Mbit device.
• The main array of the 1-Gbit device is divided into eight 128-Mbit partitions. Each
parition is divided into sixty-four 256-KByte blocks: 8 x 64 = 512 blocks in the
main array of a 1-Gbit device.
Each block is divided into as many as two-hundred-fifty-six 1-KByte programming
regions. Each region is divided into as many as thirty-two 32-Byte segments.
Main Array Memory Map (Sheet 1 of 2)
128-Mbit Device
Blk
#
0E000000E1FFFF
224
1C000001C1FFFF
448
3800000381FFFF
55
06E000006FFFFF
111
0DE00000DFFFFF
223
1BE00001BFFFFF
447
37E000037FFFFF
0C000000C1FFFF
192
1800000181FFFF
384
3000000301FFFF
47
05E000005FFFFF
95
0BE00000BFFFFF
191
17E000017FFFFF
383
2FE00002FFFFFF
...
0A000000A1FFFF
160
1400000141FFFF
320
2800000281FFFF
39
04E000004FFFFF
79
09E000009FFFFF
159
13E000013FFFFF
319
27E000027FFFFF
0400000041FFFF
32
64
0800000081FFFF
64
128
1000000101FFFF
128
...
80
...
0500000051FFFF
...
40
...
...
128
...
64
...
32
...
96
...
0600000061FFFF
...
48
...
...
128
...
64
...
32
...
...
112
...
...
3FE00003FFFFFF
...
128
511
...
1FE00001FFFFFF
Address
Range
...
255
Blk
#
...
64
Address
Range
1-Gbit Device
Mbit
0700000071FFFF
32
April 2008
309823-10
0FE00000FFFFFF
Blk
#
...
16
127
...
4
16
32
Address
Range
...
5
16
07E000007FFFFF
Blk
#
512-Mbit Device
Mbit
56
...
6
16
...
7
256-Mbit Device
Mbit
...
63
Address
Range
...
Mbit
...
Partition
...
Table 5:
256
2000000201FFFF
Datasheet
11
Numonyx™ StrataFlash® Cellular Memory (M18)
Main Array Memory Map (Sheet 2 of 2)
128-Mbit Device
Blk
#
0FE00000FFFFFF
128
Address
Range
255
1FE00001FFFFFF
23
02E000002FFFFF
47
05E000005FFFFF
95
0BE00000BFFFFF
191
17E000017FFFFF
128
64
0800000081FFFF
128
1000000101FFFF
15
01E000001FFFFF
31
03E000003FFFFF
63
07E000007FFFFF
127
0FE00000FFFFFF
...
64
0800000081FFFF
7
00E000000FFFFF
15
01E000001FFFFF
31
03E000003FFFFF
63
07E000007FFFFF
0000000001FFFF
0
0000000001FFFF
128
...
...
0400000041FFFF
...
32
0
...
0200000021FFFF
...
16
64
...
128
0100000011FFFF
32
...
64
8
0000000001FFFF
...
32
...
0400000041FFFF
...
32
...
0200000021FFFF
...
16
...
...
64
...
32
...
1800000181FFFF
...
192
...
0C000000C1FFFF
...
96
...
0600000061FFFF
...
...
127
Blk
#
0
0000000001FFFF
Device ID
Table 6:
Device ID codes
Density
Litho (nm)
128 Mbit
65
256 Mbit
512 Mbit
1024 Mbit
Note:
64
Address
Range
48
0
2.3
07E000007FFFFF
Blk
#
...
16
0
32
...
16
1
63
Address
Range
1-Gbit Device
Mbit
0300000031FFFF
...
16
2
03E000003FFFFF
Blk
#
512-Mbit Device
Mbit
24
...
16
...
3
256-Mbit Device
Mbit
...
31
Address
Range
...
Mbit
...
Partition
...
Table 5:
65, 90
65, 90
65
Product
Non-Mux
Device Identifier Code
(Hex)
8900
AD-Mux
8903
Non-Mux
8901
AD-Mux
8904
Non-Mux
887E
AD-Mux
8881
Non-Mux
88B0
AD-Mux
88B1
To order parts listed above and to obtain a datasheet for the M18 SCSP parts, please contact your local Numonyx sales
office.
Datasheet
12
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
3.0
Package Information
The following figures show the ballout package information for the device:
• Figure 1, “Mechanical Specifications: x16D (105-ball) package (8x10x1.0 mm)”
• Figure 2, “Mechanical Specifications: x16D (105-ball) package (8x10x1.4 mm)” on
page 15
• Figure 3, “Mechanical Specifications: x16D (105-ball) package (9x11x1.2 mm)”
• Figure 4, “Mechanical Specifications: x16D (105 balls) Package (11x15x1.2 mm)”
on page 17
• Figure 5, “Mechanical Specifications: x16 Split Bus (165-ball) package (10x11x1.2
mm)”
• Figure 6, “Mechanical Specifications: x16C (107-ball) package (8x10x1.0 mm)” on
page 19
• Figure 7, “Mechanical Specifications: x16C (107-ball) package (8x10x1.2 mm)” on
page 20
• Figure 8, “Mechanical Specifications: x16C (107-ball) package (8x11x1.2 mm)” on
page 21
• Figure 9, “Mechanical Specifications: x16C (107-ball) package (11x11x1.2 mm)”
on page 22
April 2008
309823-10
Datasheet
13
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 1:
Mechanical Specifications: x16D (105-ball) package (8x10x1.0 mm)
S1
Pin
1
Corner
1
2
3
4
5
6
7
8
9
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
SCS
Top View P
- Ball Si de
Down
A2
A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
Datasheet
14
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Min
Nom
Max
1.0
0.200
0.325
9.90
7.90
0.700
0.500
Notes
Min
Nom
Max
0.0394
0.0079
0.660
0.375
10.00
8.00
0.800
105
0.800
0.600
0.425
10.10
8.10
0.0128
0.3898
0.3110
0.100
0.900
0.700
0.0276
0.0197
0.0260
0.0148
0.3937
0.3150
0.0315
105
0.0315
0.0236
0.0167
0.3976
0.3189
0.0039
0.0354
0.0276
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 2:
Mechanical Specifications: x16D (105-ball) package (8x10x1.4 mm)
S1
Pi n
1
Corner
1
2
3
4
5
6
7
8
9
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
SCS
Top View P
- Ball Si de
Down
A2
A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
April 2008
309823-10
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Min
Nom
Max
1.4
0.200
0.325
9.90
7.90
0.700
0.500
Notes
Min
Nom
Max
0.0551
0.0079
1.070
0.375
10.00
8.00
0.800
105
0.800
0.600
0.425
10.10
8.10
0.0128
0.3898
0.3110
0.100
0.900
0.700
0.0276
0.0197
0.0421
0.0148
0.3937
0.3150
0.0315
105
0.0315
0.0236
0.0167
0.3976
0.3189
0.0039
0.0354
0.0276
Datasheet
15
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 3:
Mechanical Specifications: x16D (105-ball) package (9x11x1.2 mm)
S1
Pin 1
Corner
1
2
3
4
5
6
7
8
9
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
Top View - Ball Side Down
A2 A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
Datasheet
16
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Min
Nom
Max
1.2
0.200
0.325
10.90
8.90
1.200
1.000
Notes
Min
Nom
Max
0.0472
0.0079
0.860
0.375
11.00
9.00
0.800
105
1.300
1.100
0.425
11.10
9.10
0.0128
0.4291
0.3504
0.100
1.400
1.200
0.0472
0.0394
0.0339
0.0148
0.4331
0.3543
0.0315
105
0.0512
0.0433
0.0167
0.4370
0.3583
0.0039
0.0551
0.0472
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 4:
April 2008
309823-10
Mechanical Specifications: x16D (105 balls) Package (11x15x1.2 mm)
Datasheet
17
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 5:
Mechanical Specifications: x16 Split Bus (165-ball) package (10x11x1.2 mm)
S1
Ball one Corner
1
2
3
4
5
6
7
8
9
10
11
12
S2
A
B
C
D
E
F
G
D
H
J
K
L
M
e
N
b
P
R
E
Top View - Ball
Side Down
A2 A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
Datasheet
18
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Millimeters
Min
Nom
Max
1.2
0.200
0.325
10.90
9.90
1.325
1.500
Notes
Inches
Min
Nom
Max
0.0472
0.0079
0.860
0.375
11.00
10.00
0.650
165
1.425
1.600
0.425
11.10
10.10
0.0128
0.4291
0.3898
0.100
1.525
1.700
0.0522
0.0591
0.0339
0.0148
0.4331
0.3937
0.0256
165
0.0561
0.0630
0.0167
0.4370
0.3976
0.0039
0.0600
0.0669
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 6:
Mechanical Specifications: x16C (107-ball) package (8x10x1.0 mm)
S1
Pin
1
Corner
1
2
3
4
5
6
7
8
9
10
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
SCS
Top View P
- Ball Side
Down
A2
A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
April 2008
309823-10
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Min
Nom
Max
1.0
0.200
0.325
9.90
7.90
0.700
0.500
Notes
Min
Nom
Max
0.0394
0.0079
0.660
0.375
10.00
8.00
0.800
107
0.800
0.600
0.425
10.10
8.10
0.0128
0.3898
0.3110
0.100
0.900
0.700
0.0276
0.0197
0.0260
0.0148
0.3937
0.3150
0.0315
107
0.0315
0.0236
0.0167
0.3976
0.3189
0.0039
0.0354
0.0276
Datasheet
19
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 7:
Mechanical Specifications: x16C (107-ball) package (8x10x1.2 mm)
S1
Pi n
1
Corner
1
2
3
4
5
6
7
8
9
10
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
SCS
Top View P
- Ball Si de
Down
A2
A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
Datasheet
20
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Min
Nom
Max
1.2
0.200
0.325
9.90
7.90
0.700
0.500
Notes
Min
Nom
Max
0.0472
0.0079
0.860
0.375
10.00
8.00
0.800
107
0.800
0.600
0.425
10.10
8.10
0.0128
0.3898
0.3110
0.100
0.900
0.700
0.0276
0.0197
0.0339
0.0148
0.3937
0.3150
0.0315
107
0.0315
0.0236
0.0167
0.3976
0.3189
0.0039
0.0354
0.0276
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 8:
Mechanical Specifications: x16C (107-ball) package (8x11x1.2 mm)
Pin 1
Corner
S1
1
2
3
4
5
6
7
8
9
S2
A
B
C
D
E
D
F
G
H
J
K
e
L
M
b
E
Top View - Ball Side Down
A2
A1
A
Y
Note: Drawing not to scale.
Dimensions
Package Height
Ball Height
Package Body Thickness
Ball (Lead) Width
Package Body Length
Package Body Width
Pitch
Ball (Lead) Count
Seating Plane Coplanarity
Corner to Ball Distance Along E
Corner to Ball Distance Along D
April 2008
309823-10
Symbol
A
A1
A2
b
D
E
e
N
Y
S1
S2
Millimeters
Min
Nom
Max
1.2
0.200
0.325
10.90
7.90
0.700
1.000
Notes
Inches
Min
Nom
Max
0.0472
0.0079
0.860
0.375
11.00
8.00
0.800
107
0.800
1.100
0.425
11.10
8.10
0.0128
0.4291
0.3110
0.100
0.900
1.200
0.0276
0.0394
0.0339
0.0148
0.4331
0.3150
0.0315
107
0.0315
0.0433
0.0167
0.4370
0.3189
0.0039
0.0354
0.0472
Datasheet
21
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 9:
Datasheet
22
Mechanical Specifications: x16C (107-ball) package (11x11x1.2 mm)
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
4.0
Ballouts and Signal Descriptions
This section provides ballout and signal description information for x16D (105-ball),
x16C (107-ball), and x16 Split Bus (165-ball) packages, Non-Mux, AD-Mux, AA/D Mux
interfaces.
4.1
Ballouts, x16D
4.1.1
x16D (105-Ball) Ballout, Non-Mux
Figure 10: x16D (105-Ball) Electrical Ballout, Non-Mux
Pin 1
1
2
3
4
5
6
7
8
9
A
DU
A4
A6
A7
A19
A23
A24
A25
DU
A
B
A2
A3
A5
A17
A18
F-DPD
A22
A26
A16
B
C
A1
VSS
VSS
VSS
D-VCC
VSS
VSS
VSS
A15
C
D
A0
S-VCC
D-VCC
F1-VCC
ADV#
F2-VCC
D-VCC
N-ALE
A14
D
E
F-WP1#
WE#
D2-CS#
Depop
(Index)
N-CLE
F4-CE# /
A27
A21
A10
A13
E
F
F-WP2#
D1-CS#
D-CAS#
D-RAS#
Depop
(RFUs)
N-RE# /
S-CS1#
A20
A9
A12
F
G
RFU
F2-CE#
F1-CE#
D-BA0
Depop
(RFUs)
D-CKE
F-RST#
A8
A11
G
H
N-RY/BY#
N-WE# /
S-CS2
F3-CE#
D-BA1
D-CLK#
D-WE#
OE#
D-DM1 /
S-UB#
D-DM0 /
S-LB#
H
J
F-VPP
VCCQ
VCCQ
F1-VCC
D-CLK
F2-VCC
VCCQ
VCCQ
F-WAIT
J
K
DQ2
VSS
VSS
VSS
F-CLK
VSS
VSS
VSS
DQ13
K
L
DQ1
DQ3
DQ5
DQ6
DQ7
DQ9
DQ11
DQ12
DQ14
L
M
DU
DQ0
D-LDQS
DQ4
DQ8
DQ10
D-UDQS
DQ15
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
April 2008
309823-10
Active Balls
De-Populated Balls
Reserved for Future Use
Do Not Use
Datasheet
23
Numonyx™ StrataFlash® Cellular Memory (M18)
4.1.2
x16D (105-Ball) Ballout, AD-Mux
Figure 11: x16D (105-Ball) Electrical Ballout, AD-Mux
Pin 1
1
2
3
4
5
6
7
8
9
A
DU
A4
A6
A7
A19
A23
A24
A25
DU
A
B
A2
A3
A5
A17
A18
F-DPD
A22
A26
A16
B
C
A1
VSS
VSS
VSS
D-VCC
VSS
VSS
VSS
A15
C
D
A0
S-VCC
D-VCC
F1-VCC
ADV#
F2-VCC
D-VCC
N-ALE
A14
D
E
F-WP1#
WE#
D2-CS#
Depop
(Index)
N-CLE
F4-CE# /
A27
A21
A10
A13
E
F
F-WP2#
D1-CS#
D-CAS#
D-RAS#
Depop
(RFUs)
N-RE# /
S-CS1#
A20
A9
A12
F
G
RFU
F2-CE#
F1-CE#
D-BA0
Depop
(RFUs)
D-CKE
F-RST#
A8
A11
G
H
N-RY/BY#
N-WE# /
S-CS2
F3-CE#
D-BA1
D-CLK#
D-WE#
OE#
D-DM1 /
R-UB#
D-DM0 /
R-LB#
H
J
F-VPP
VCCQ
VCCQ
F1-VCC
D-CLK
F2-VCC
VCCQ
VCCQ
F-WAIT
J
K
AD2
VSS
VSS
VSS
F-CLK
VSS
VSS
VSS
AD13
K
L
AD1
AD3
AD5
AD6
AD7
AD9
AD11
AD12
AD14
L
M
DU
AD0
D-LDQS
AD4
AD8
AD10
D-UDQS
AD15
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
Datasheet
24
Active Balls
De-Populated Balls
Reserved for Future Use
Do Not Use
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
4.1.3
x16D Mux (105-Ball) Ballout, AA/D Mux
Figure 12: x16D (105-Ball) Electrical Ballout, AA/D Mux
Pin 1
1
2
3
4
5
6
7
8
9
A
DU
A4
A6
A7
RFU
RFU
RFU
RFU
DU
A
B
A2
A3
A5
RFU
RFU
F-DPD
RFU
F-ADV2#
RFU
B
C
A1
VSS
VSS
VSS
D-VCC
VSS
VSS
VSS
A15
C
D
A0
S-VCC
D-VCC
F-VCC
F-ADV#
F-VCC
D-VCC
N-ALE
A14
D
E
F-WP1#
WE#
D2-CS#
Depop
(Index)
N-CLE
F4-CE#
RFU
A10
A13
E
F
F-WP2#
D1-CS#
D-CAS#
D-RAS#
Depop
(RFU)
S-CS1 /
N-RE#
RFU
A9
A12
F
G
RFU
F2-CE#
F1-CE#
D-BA0
Depop
(RFU)
D-CKE
F-RST#
A8
A11
G
H
N-RY/BY#
S-CS2 /
N-WE#
F3-CE#
D-BA1
D-CLK#
D-WE#
OE#
D-DM1 /
S-UB#
D-DM0 /
S-LB#
H
J
F-VPP
VCCQ
VCCQ
F-VCC
D-CLK
F-VCC
VCCQ
VCCQ
F-WAIT
J
K
AD2
VSS
VSS
VSS
F-CLK
VSS
VSS
VSS
AD13
K
L
AD1
AD3
AD5
AD6
AD7
AD9
AD11
AD12
AD14
L
M
DU
AD0
D-LDQS
AD4
AD8
AD10
D-UDQS
AD15
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
April 2008
309823-10
Active Balls
De-Populated Balls
Reserved for Future Use
Do Not Use
Datasheet
25
Numonyx™ StrataFlash® Cellular Memory (M18)
4.2
Table 7:
Symbol
Signal Descriptions, x16D
Signal Descriptions, x16D Non-Mux/AD-Mux; x16D AA/D-Mux (Sheet 1 of 4)
Type
Signal Descriptions
Notes
Address and Data Signals, Non-Mux
ADDRESS: Global device signals.
Shared address inputs for all memory die during Read and Write operations.
• 4-Gbit: AMAX = A27
• 2-Gbit: AMAX = A26
• 1-Gbit: AMAX = A25
• 512-Mbit: AMAX = A24
• 256-Mbit: AMAX = A23
• 128-Mbit: AMAX = A22
• A[12:0] are the row and A[9:0] are the column addresses for 512-Mbit LPSDRAM.
• A[12:0] are the row and A[8:0] are the column addresses for 256-Mbit LPSDRAM.
• A[11:0] are the row and A[8:0] are the column addresses for 128-Mbit LPSDRAM.
Unused address inputs should be treated as RFU.
A[MAX: 0]
Input
DQ[15:0]
Input/
Output
DATA INPUT/OUTPUTS: Global device signals.
DQ[15:0] are used to input commands and write-data during Write cycles, and to output readdata during Read cycles. During NAND accesses, DQ[7:0] are used to input commands, addressdata, and write-data, and to output read-data.
Data signals are High-Z when the device is deselected or its output is disabled.
Input
FLASH ADDRESS VALID: Flash-specific signal; low-true input.
During synchronous flash Read operations, the address is latched on the rising edge of F-ADV#,
or on the first rising edge of F-CLK after F-ADV# goes low for devices that support up to 108
MHz, or on the last rising edge of F-CLK after F-ADV# goes low for devices that support up to
133 MHz.
In an asynchronous flash Read operation, the address is latched on the rising edge of F-ADV# or
continuously flows through while F-ADV# is low.
F-ADV#
1
Address and Data Signals, AD-Mux
A[MAX:16]
AD[15:0]
A[15:0]
Datasheet
26
Input
Input /
Output
Input
ADDRESS: Global device signals.
Shared address inputs for all Flash and SRAM memory die during Read and Write operations.
• 4-Gbit: AMAX = A27
• 2-Gbit: AMAX = A26
• 1-Gbit: AMAX = A25
• 512-Mbit: AMAX = A24
• 256-Mbit: AMAX = A23
• 128-Mbit: AMAX = A22
Unused address inputs should be treated as RFU.
1
ADDRESS-DATA MULTIPLEXED INPUTS/ OUTPUTS: AD-Mux flash and SRAM lower address
and data signals; LPSDRAM data signals.
During AD-Mux flash and SRAM Write cycles, AD[15:0] are used to input the lower address
followed by commands or write-data.
During AD-Mux flash Read cycles, AD[15:0] are used to input the lower address followed by
read-data output.
During LPSDRAM accesses, AD[15:0] are used to input commands and write-data during Write
cycles or to output read-data during Read cycles.
During NAND accesses, AD[7:0] are used to input commands, address, or write-data, and to
output read-data.
AD[15:0] are High-Z when the flash or SRAM is deselected or its output is disabled.
RFU, except for DRAM.
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 7:
Symbol
F-ADV#
A[MAX: 0]
AD[15:0]
F-ADV#
F-ADV2#
Signal Descriptions, x16D Non-Mux/AD-Mux; x16D AA/D-Mux (Sheet 2 of 4)
Type
Signal Descriptions
Input
FLASH ADDRESS VALID: Flash-specific signal; low-true input.
During synchronous flash Read operations, the address is latched on the rising edge of F-ADV#,
or on the first rising edge of F-CLK after F-ADV# goes low for devices that support up to 108
MHz, or on the last rising edge of F-CLK after F-ADV# goes low for devices that support up to
133 MHz.
In an asynchronous flash Read operation, the address is latched on the rising edge of F-ADV#.
Input
ADDRESS: Global device signals.
Shared address inputs for all memory die during Read and Write operations.
• 4-Gbit: AMAX = A27
• 2-Gbit: AMAX = A26
• 1-Gbit: AMAX = A25
• 512-Mbit: AMAX = A24
• 256-Mbit: AMAX = A23
• 128-Mbit: AMAX = A22
• A[12:0] are the row and A[9:0] are the column addresses for 512-Mbit LPSDRAM.
• A[12:0] are the row and A[8:0] are the column addresses for 256-Mbit LPSDRAM.
• A[11:0] are the row and A[8:0] are the column addresses for 128-Mbit LPSDRAM.
Unused address inputs should be treated as RFU.
Input /
Output
ADDRESS-DATA MULTIPLEXED INPUTS/ OUTPUTS: AAD-Mux flash address and data;
LPSDRAM data.
During AAD-Mux flash Write cycles, AD[15:0] are used to input the upper address, lower
address, and commands or write-data.
During AAD-Mux flash Read cycles, AD[15:0] are used to input the upper address and lower
address, and output read-data.
During LPSDRAM accesses, AD[15:0] are used to input commands and write-data during Write
cycles or to output read-data during Read cycles.
During NAND accesses, AD[7:0] are used to input commands, address-data, or write-data, and
to output read-data.
AD[15:0] are High-Z when the device is deselected or its output is disabled.
Input
FLASH ADDRESS VALID: Flash-specific signal; low-true input.
During a synchronous flash Read operation, the address is latched on the F-ADV# rising edge or
the first F-CLK edge after F-ADV# low in devices that support up to 104 MHz, and on the last
rising F-CLK edge after F-ADV# low in devices that support upto 133 MHz.
During a synchronous flash Read operation, the address is latched on the rising edge of F-ADV#
or the first active F-CLK edge whichever occurs first.
In an asynchronous flash Read operation, the address is latched on the rising edge of F-ADV#.
During AAD-Mux flash accesses, the upper address is latched on the valid edge of F-CLK while
F-ADV2# is low; the lower address is latched on the valid edge of F-CLK while F-ADV# is low.
The upper address is always latched first, followed by the lower address.
Notes
1
Control Signals
F[4:1]CE#
Input
FLASH CHIP ENABLE: Flash-specific signal; low-true input.
When low, F-CE# selects the associated flash memory die. When high, F-CE# deselects the
associated flash die. Flash die power is reduced to standby levels, and its data and F-WAIT
outputs are placed in a High-Z state.
• F1-CE# is dedicated to flash die #1.
• F[4:2]-CE# are dedicated to flash die #4 through #2, respectively, if present. Otherwise,
any unused flash chip enable should be treated as RFU.
• For NOR/NAND stacked device, F1-CE# selects NOR die #1, F2-CE# selects NOR die #2
while F4-CE# selects NAND die #1 and NAND die #2 using virtual chip-select scheme, F3CE# selects NAND die #3 if present.
F-CLK
Input
FLASH CLOCK: Flash-specific signal; rising active-edge input.
F-CLK synchronizes the flash with the system clock during synchronous operations.
D-CLK
Input
LPSDRAM CLOCK: LPSDRAM-specific signal; rising active-edge input.
D-CLK synchronizes the LPSDRAM and DDR LPSDRAM with the system clock.
2
D-CLK#
Input
DDR LPSDRAM CLOCK: DDR LPSDRAM-specific signal; falling active-edge input.
D-CLK# synchronizes the DDR LPSDRAM with the system clock.
2
April 2008
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1
Datasheet
27
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 7:
Symbol
Signal Descriptions, x16D Non-Mux/AD-Mux; x16D AA/D-Mux (Sheet 3 of 4)
Type
Signal Descriptions
OE#
Input
OUTPUT ENABLE: Flash- and SRAM-specific signal; low-true input.
When low, OE# enables the output drivers of the selected flash or SRAM die. When high, OE#
disables the output drivers of the selected flash or SRAM die and places the output drivers in
High-Z.
F-RST#
Input
FLASH RESET: Flash-specific signal; low-true input.
When low, F-RST# resets internal operations and inhibits writes. When high, F-RST# enables
normal operation.
F-WAIT
Output
FLASH WAIT: Flash -specific signal; configurable-true output.
When asserted, F-WAIT indicates invalid output data. F-WAIT is driven whenever F-CE# and
OE# are low. F-WAIT is High-Z whenever F-CE# or OE# is high.
Notes
WE#
Input
WRITE ENABLE: Flash- and SRAM-specific signal; low-true input.
When low, WE# enables Write operations for the enabled flash or SRAM die.
D-WE#
Input
LPSDRAM WRITE ENABLE: LPSDRAM-specific signal; low-true input.
D-WE#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-CAS#, and D-RAS#, define the
LPSDRAM command or operation. D-WE# is sampled on the rising edge of D-CLK.
FWP[2:1]#
Input
FLASH WRITE PROTECT: Flash-specific signals; low-true inputs.
When low, F-WP# enables the Lock-Down mechanism. When high, F-WP# overrides the LockDown function, enabling locked-down blocks to be unlocked with the Unlock command.
• F-WP1# is dedicated to flash die #1.
• F-WP2# is common to all other flash dies, if present. Otherwise it is RFU.
• For NOR/NAND stacked device, F-WP1# selects all NOR dies; F-WP2# selects all NAND dies.
F-DPD
Input
FLASH DEEP POWER-DOWN: Flash-specific signal; configurable-true input.
When enabled in the ECR, F-DPD is used to enter and exit Deep Power-Down mode.
N-CLE
Input
NAND COMMAND LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-CLE enables commands to be latched on the rising edge of N-WE#.
2
N-ALE
Input
NAND ADDRESS LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-ALE enables addresses to be latched on the rising edge of N-WE#.
2
N-RE#
Input
NAND READ ENABLE: NAND-specific signal; low-true input.
When low, N-RE# enables the output drivers of the selected NAND die. When high, N-RE#
disables the output drivers of the selected NAND die and places the output drivers in High-Z.
N-RY/BY#
Output
2
2, 4
NAND READY/BUSY: NAND-specific signal; low-true output.
When low, N-RY/BY# indicates the NAND is busy performing a read, program, or erase
operation. When high, N-RY/BY# indicates the NAND device is ready.
2
N-WE#
Input
NAND WRITE ENABLE: NAND-specific signal; low-true input.
When low, N-WE# enables Write operations for the enabled NAND die.
D-CKE
Input
LPSDRAM CLOCK ENABLE: LPSDRAM-specific signal; high-true input.
When high, D-CKE indicates that the next D-CLK edge is valid. When low, D-CKE indicates that
the next D-CLK edge is invalid and the selected LPSDRAM die is suspended.
2
D-BA[1:0]
Input
LPSDRAM BANK SELECT: LPSDRAM-specific input signals.
D-BA[1:0] selects one of four banks in the LPSDRAM die.
2
D-RAS#
Input
LPSDRAM ROW ADDRESS STROBE: LPSDRAM-specific signal; low-true input.
D-RAS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-CAS#, and D-WE#, define the
LPSDRAM command or operation. D-RAS# is sampled on the rising edge of D-CLK.
2
D-CAS#
Input
LPSDRAM COLUMN ADDRESS STROBE: LPSDRAM-specific signal; low-true input.
D-CAS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-RAS#, and D-WE#, define the
LPSDRAM command or operation. D-CAS# is sampled on the rising edge of D-CLK.
2
Input
LPSDRAM CHIP SELECT: LPSDRAM-specific signal; low-true input.
When low, D-CS# selects the associated LPSDRAM memory die and starts the command input
cycle. When D-CS# is high, commands are ignored but operations continue.
• D-CS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-RAS#, D-CAS#, and D-WE#, define
the LPSDRAM command or operation. D-CS# is sampled on the rising edge of D-CLK.
• D[2:1]-CS# are dedicated to LPSDRAM die #2 and die #1, respectively, if present.
Otherwise, any unused LPSDRAM chip selects should be treated as RFU.
2
D[2:1]CS#
Datasheet
28
2, 5
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 7:
Symbol
Signal Descriptions, x16D Non-Mux/AD-Mux; x16D AA/D-Mux (Sheet 4 of 4)
Type
Signal Descriptions
Notes
Input
LPSDRAM DATA MASK: LPSDRAM-specific signal; high-true input.
When high, D-DM[1:0] controls masking of input data during writes and output data during
reads.
• D-DM1 corresponds to the data on DQ[15:8].
• D-DM0 corresponds to the data on DQ[7:0].
2, 3
D-UDQS
D-LDQS
Input /
Output
LPSDRAM UPPER/LOWER DATA STROBE: DDR LPSDRAM-specific input/output signals.
D-UDQS and D-LDQS provide as output the read-data strobes, and as input the write-data
strobes.
• D-UDQS corresponds to the data on DQ[15:8].
• D-LDQS corresponds to the data on DQ[7:0].
2
S-CS1#
S-CS2
Input
SRAM CHIP SELECTS: SRAM-specific signals; S-CS1# low-true input, S-CS2 high-true input.
When both are asserted, S-CS1# and S-CS2 select the SRAM die. When either is deasserted, the
SRAM die is deselected and its power is reduced to standby levels.
2, 4, 5
S-UB#
S-LB#
Input
SRAM UPPER/LOWER BYTE ENABLES: SRAM-specific signals; low-true inputs.
When low, S-UB# enables DQ[15:8] and S-LB# enables DQ[7:0] during SRAM Read and Write
cycles. When high, S-UB# masks DQ[15:8] and S-LB# masks DQ[7:0].
2, 3
D-DM[1:0]
Power Signals
F-VPP
Power
FLASH PROGRAM/ERASE VOLTAGE: Flash specific.
F-VPP supplies program or erase power to the flash die.
F1-VCC
Power
FLASH CORE POWER SUPPLY: Flash specific.
F1-VCC supplies the core power to the NOR flash die.
F2-VCC
Power
FLASH CORE POWER SUPPLY: Flash specific.
F2-VCC supplies the core power to either 1) the NOR flash die in stack packages with multiple
NOR flash dies, or 2) NAND flash die in stack packages with NOR-NAND flash dies.
VCCQ
Power
I/O POWER SUPPLY: Global device I/O power.
VCCQ supplies the device input/output driver voltage.
D-VCC
Power
LPSDRAM CORE POWER SUPPLY: LPSDRAM specific.
D-VCC supplies the core power to the LPSDRAM die.
2
S-VCC
Power
SRAM POWER SUPPLY: SRAM specific.
S-VCC supplies the core power to the SRAM die.
2
VSS
Groun
d
DEVICE GROUND: Global ground reference for all signals and power supplies.
Connect all VSS balls to system ground. Do not float any VSS connections.
DU
—
DO NOT USE:
Ball should not be connected to any power supplies, signals, or other balls. Ball can be left
floating.
RFU
—
RESERVED FOR FUTURE USE:
Reserved by Numonyx for future device functionality/enhancement. Ball must be left floating.
6
Notes:
1.
F4-CE# and A27 share the same package ball at location E6. Only one signal function is available, depending on the
stacked device combination.
2.
Only available on stacked device combinations with NAND, SRAM, and/or LPSDRAM die; otherwise, treated as RFU.
3.
D-DM[1:0] and S-UB#/S-LB# share the same package balls at locations H8 and H9, respectively. Only one signal function
for each ball location is available, depending on the stacked device combination.
4.
S-CS1# and N-RE# share the same package ball at location F6. Only one signal function is available, depending on the
stacked device combination.
5.
S-CS2 and N-WE# share the same package ball at location H2. Only one signal function is available, depending on the
stacked device combination.
6.
In stack packages with only one NOR flash die, this signal can be left floating.
4.3
Ballouts, x16C
4.3.1
x16C (107-Ball) Ballout, Non-Mux
April 2008
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Datasheet
29
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 13: x16C (107-Ball) Electrical Ballout, Non-Mux
Pin 1
1
A
2
3
4
5
6
7
8
9
DU
N-CLE
A27
A26
P-VCC
F-DPD
VSS
DU
A
B
DU
A4
A18
A19
VSS
F1-VCC
F2-VCC
A21
A11
B
C
N-ALE
A5
R-LB#
A23
VSS
S-CS2
CLK
A22
A12
C
D
VSS
A3
A17
A24
F-VPP
R-WE#
P1-CS#
A9
A13
D
E
VSS
A2
A7
A25
F-WP1#
ADV#
A20
A10
A15
E
F
F-WP2#
A1
A6
R-UB#
F-RST#
F-WE#
A8
A14
A16
F
G
VCCQ
A0
DQ8
DQ2
DQ10
DQ5
DQ13
WAIT
F2-CE#
G
H
VSS
R-OE#
DQ0
DQ1
DQ3
DQ12
DQ14
DQ7
F2-OE# /
N-RE#
H
J
RFU
S-CS1# /
N-WE#
F1-OE#
DQ9
DQ11
DQ4
DQ6
DQ15
VCCQ
J
K
F4-CE#
F1-CE#
P2-CS#
F3-CE#
S-VCC
P-VCC
F2-VCC
VCCQ
P-Mode# /
P-CRE
K
L
RFU
VSS
VSS
VCCQ
F1-VCC
VSS
VSS
VSS
VSS
L
M
DU
N-RY/BY#
RFU
RFU
RFU
RFU
RFU
RFU
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
Datasheet
30
Active Balls
Reserved for Future Use
Do Not Use
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
4.3.2
x16C (107-Ball) Ballout, AD-Mux
Figure 14: x16C (107-Ball) Electrical Ballout, AD-Mux
Pin 1
1
A
2
3
4
5
6
7
8
9
DU
N-CLE
A27
A26
P-VCC
F-DPD
VSS
DU
A
B
DU
RFU
A18
A19
VSS
F1-VCC
F2-VCC
A21
RFU
B
C
N-ALE
RFU
R-LB#
A23
VSS
S-CS2
CLK
A22
RFU
C
D
VSS
RFU
A17
A24
F-VPP
R-WE#
P1-CS#
RFU
RFU
D
E
VSS
RFU
RFU
A25
F-WP1#
ADV#
A20
RFU
RFU
E
F
F-WP2#
RFU
RFU
R-UB#
F-RST#
F-WE#
RFU
RFU
A16
F
G
VCCQ
RFU
AD8
AD2
AD10
AD5
AD13
WAIT
F2-CE#
G
H
VSS
R-OE#
AD0
AD1
AD3
AD12
AD14
AD7
F2-OE# /
N-RE#
H
J
RFU
S-CS1# /
N-WE#
F1-OE#
AD9
AD11
AD4
AD6
AD15
VCCQ
J
K
F4-CE#
F1-CE#
P2-CS#
F3-CE#
S-VCC
P-VCC
F2-VCC
VCCQ
P-Mode# /
P-CRE
K
L
RFU
VSS
VSS
VCCQ
F1-VCC
VSS
VSS
VSS
VSS
L
M
DU
N-RY/BY#
RFU
RFU
RFU
RFU
RFU
RFU
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
April 2008
309823-10
Active Balls
Reserved for Future Use
Do Not Use
Datasheet
31
Numonyx™ StrataFlash® Cellular Memory (M18)
4.3.3
x16C (107-Ball) Ballout, AA/D-Mux
Figure 15: x16C (107-Ball) Electrical Ballout, AA/D-Mux
Pin 1
1
A
2
3
4
5
6
7
8
9
DU
N-CLE
RFU
RFU
P-VCC
F-DPD
VSS
DU
A
B
DU
RFU
RFU
RFU
VSS
F1-VCC
F2-VCC
RFU
RFU
B
C
N-ALE
RFU
R-LB#
RFU
VSS
S-CS2
CLK
RFU
RFU
C
D
VSS
RFU
RFU
RFU
F-VPP
R-WE#
P1-CS#
RFU
RFU
D
E
VSS
RFU
RFU
RFU
F-WP1#
ADV#
RFU
RFU
RFU
E
F
F-WP2#
RFU
RFU
R-UB#
F-RST#
F-WE#
RFU
RFU
RFU
F
G
VCCQ
RFU
AD8
AD2
AD10
AD5
AD13
WAIT
F2-CE#
G
H
VSS
R-OE#
AD0
AD1
AD3
AD12
AD14
AD7
F2-OE# /
N-RE#
H
J
RFU
S-CS1# /
N-WE#
F1-OE#
AD9
AD11
AD4
AD6
AD15
VCCQ
J
K
F4-CE#
F1-CE#
P2-CS#
F3-CE#
S-VCC
P-VCC
F2-VCC
VCCQ
P-Mode# /
P-CRE
K
L
RFU
VSS
VSS
VCCQ
F1-VCC
VSS
VSS
VSS
VSS
L
M
DU
N-RY/BY#
RFU
RFU
RFU
F-ADV2#
RFU
RFU
DU
M
1
2
3
4
5
6
7
8
9
Top View - Ball Side Down
Legend:
Datasheet
32
Active Balls
Reserved for Future Use
Do Not Use
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
4.4
Table 8:
Symbol
Signal Descriptions x16C
Signal Descriptions for x16C / x16C AD-Mux / x16C AA/D-Mux Ballout (Sheet 1
of 3)
Type
Signal Descriptions
Notes
Address and Data Signals, Non-Mux
ADDRESS: Global device signals.
Shared address inputs for all memory die during Read and Write operations.
• 4-Gbit: AMAX = A27• 128-Mbit: AMAX = A22
• 2-Gbit: AMAX = A26• 64-Mbit: AMAX = A21
• 1-Gbit: AMAX = A25• 32-Mbit: AMAX = A20
• 512-Mbit: AMAX = A24• 16-Mbit: AMAX = A19
• 256-Mbit: AMAX = A23• 8-Mbit: AMAX = A18
Unused address inputs should be treated as RFU.
A[MAX:0]
Input
DQ[15:0]
Input /
Output
DATA INPUT/OUTPUTS: Global device signals.
Inputs data and commands during Write cycles, outputs data during Read cycles. Data signals
are High-Z when the device is deselected or its output is disabled.
Input
ADDRESS VALID: Flash- and Synchronous PSRAM-specific signal; low-true input.
During synchronous flash Read operations, the address is latched on the rising edge of F-ADV#,
or on the first rising edge of F-CLK after F-ADV# goes low for devices that support up to 108
MHz, or on the last rising edge of F-CLK after F-ADV# goes low for devices that support up to
133 MHz.
In an asynchronous flash Read operation, the address is latched on the rising edge of ADV# or
continuously flows through while ADV# is low.
ADV#
Address and Data Signals, AD-Mux
A[MAX:16]
AD[15:0]
ADV#
Input
ADDRESS: Global device signals.
Shared address inputs for all memory die during Read and Write operations.
• 4-Gbit: AMAX = A27• 128-Mbit: AMAX = A22
• 2-Gbit: AMAX = A26• 64-Mbit: AMAX = A21
• 1-Gbit: AMAX = A25• 32-Mbit: AMAX = A20
• 512-Mbit: AMAX = A24• 16-Mbit: AMAX = A19
• 256-Mbit: AMAX = A23• 8-Mbit: AMAX = A18
Unused address inputs should be treated as RFU.
Input /
Output
ADDRESS-DATA MULTIPLEXED INPUTS/ OUTPUTS: Global device signals.
During AD-Mux Write cycles, AD[15:0] are used to input the lower address followed by
commands or data. During AD-Mux Read cycles, AD[15:0] are used to input the lower address
followed by read-data output.
During NAND accesses, AD[7:0] is used to input commands, address-data, or write-data, and
output read-data.
AD[15:0] are High-Z when the device is deselected or its output is disabled.
Input
ADDRESS VALID: Flash- and Synchronous PSRAM-specific signal; low-true input.
During synchronous flash Read operations, the address is latched on the rising edge of F-ADV#,
or on the first rising edge of F-CLK after F-ADV# goes low for devices that support up to 108
MHz, or on the last rising edge of F-CLK after F-ADV# goes low for devices that support up to
133 MHz.
In an asynchronous flash Read operation, the address is latched on the rising edge of ADV#.
Address and Data Signals, AAD-Mux
AD[15:0]
April 2008
309823-10
Input /
Output
ADDRESS-DATA MULTIPLEXED INPUTS/ OUTPUTS: Global device signals.
During AAD-Mux flash Write cycles, AD[15:0] are used to input the upper address, lower
address, and commands or data. During AAD-Mux flash Read cycles, AD[15:0] are used to
input the upper address and lower address, and output read-data.
During NAND accesses, AD[7:0] is used to input commands, address-data, or write-data, and
output read-data.
AD[15:0] are High-Z when the device is deselected or its output is disabled.
Datasheet
33
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 8:
Symbol
F-ADV2#
ADV#
Signal Descriptions for x16C / x16C AD-Mux / x16C AA/D-Mux Ballout (Sheet 2
of 3)
Type
Input
Signal Descriptions
Notes
FLASH ADDRESS VALID: Flash-specific signal; low-true input.
During AAD-Mux flash accesses, the upper address is latched on the valid edge of CLK while
F-ADV2# is low; the lower address is latched on the valid edge of CLK while ADV# is low.
The upper address is always latched first, followed by the lower address.
Control Signals
F[4:1]-CE#
Input
FLASH CHIP ENABLE: Flash-specific signal; low-true input.
When low, F-CE# selects the associated flash memory die. When high, F-CE# deselects the
associated flash die. Flash die power is reduced to standby levels, and its data and F-WAIT
outputs are placed in a High-Z state.
• F1-CE# is dedicated to flash die #1.
• F[4:2]-CE# are dedicated to flash die #4 through #2, respectively, if present. Otherwise,
any unused flash chip enable should be treated as RFU.
• For NOR/NAND stacked device, F1-CE# selects NOR die #1, F2-CE# selects NOR die #2
while F4-CE# selects NAND die #1 and NAND die #2 using virtual chip-select scheme, F3CE# selects NAND die #3 if present.
CLK
Input
CLOCK: Flash- and Synchronous PSRAM-specific input signal.
CLK synchronizes the flash and/or synchronous PSRAM with the system clock during
synchronous operations.
F[2:1]-OE#
Input
FLASH OUTPUT ENABLE: Flash-specific signal; low-true input.
When low, F-OE# enables the output drivers of the selected flash die. When high, F-OE#
disables the output drivers of the selected flash die and places the output drivers in High-Z.
• For NOR only stacked device, F[2:1]-OE# are common to all NOR dies in the device.
• For NOR/NAND stacked device, F1-OE# enables all NOR dies, F2-OE# selects all NAND dies
if present.
2
R-OE#
Input
RAM OUTPUT ENABLE: PSRAM- and SRAM-specific signal; low-true input.
When low, R-OE# enables the output drivers of the selected memory die. When high, R-OE#
disables the output drivers of the selected memory die and places the output drivers in High-Z.
1
F-RST#
Input
FLASH RESET: Flash-specific signal; low-true input.
When low, F-RST# resets internal operations and inhibits writes. When high, F-RST# enables
normal operation.
Output
WAIT: Flash -and Synchronous PSRAM-specific signal; configurable true-level output.
When asserted, WAIT indicates invalid output data. When deasserted, WAIT indicates valid
output data.
• WAIT is driven whenever the flash or the synchronous PSRAM is selected and its output
enable is low.
• WAIT is High-Z whenever flash or the synchronous PSRAM is deselected, or its output
enable is high.
F-WE#
Input
FLASH WRITE ENABLE: Flash-specific signal; low-true input.
When low, F-WE# enables Write operations for the enabled flash die. Address and data are
latched on the rising edge of F-WE#.
R-WE#
Input
RAM WRITE ENABLE: PSRAM- and SRAM-specific signal; low-true input.
When low, R-WE# enables Write operations for the selected memory die. Data is latched on the
rising edge of R-WE#.
F-WP[2:1]#
Input
FLASH WRITE PROTECT: Flash-specific signals; low-true inputs.
When low, F-WP# enables the Lock-Down mechanism. When high, F-WP# overrides the LockDown function, enabling locked-down blocks to be unlocked with the Unlock command.
• F-WP1# is dedicated to flash die #1.
• F-WP2# is common to all other flash dies, if present. Otherwise it is RFU.
• For NOR/NAND stacked device, F-WP1# selects all NOR dies, while F-WP2# selects all
NAND dies.
F-DPD
Input
FLASH DEEP POWER-DOWN: Flash-specific signal; configurable-true input.
When enabled in the ECR, F-DPD is used to enter and exit Deep Power-Down mode.
N-CLE
Input
NAND COMMAND LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-CLE enables commands to be latched on the rising edge of N-WE#.
WAIT
Datasheet
34
1
1
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 8:
Symbol
Signal Descriptions for x16C / x16C AD-Mux / x16C AA/D-Mux Ballout (Sheet 3
of 3)
Type
Signal Descriptions
N-ALE
Input
NAND ADDRESS LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-ALE enables addresses to be latched on the rising edge of N-WE#.
N-RE#
Input
NAND READ ENABLE: NAND-specific signal; low-true input.
When low, N-RE# enables the output drivers of the selected NAND die. When high, N-RE#
disables the output drivers of the selected NAND die and places the output drivers in High-Z.
N-RY/BY#
Output
NAND READY/BUSY: NAND-specific signal; low-true output.
When low, N-RY/BY# indicates the NAND is busy performing a Read, Program, or Erase
operation. When high, N-RY/BY# indicates the NAND device is ready.
Notes
1
1, 2
1
N-WE#
Input
NAND WRITE ENABLE: NAND-specific signal; low-true input.
When low, N-WE# enables Write operations for the enabled NAND die.
1, 4
P-CRE
Input
PSRAM CONTROL REGISTER ENABLE: Synchronous PSRAM-specific signal; high-true input.
When high, P-CRE enables access to the Refresh Control Register (P-RCR) or Bus Control
Register (P-BCR). When low, P-CRE enables normal Read or Write operations.
1, 3
P-MODE#
Input
PSRAM MODE#: Asynchronous only PSRAM-specific signal; low-true input.
When low, P-MODE# enables access to the configuration register, and to enter or exit LowPower mode. When high, P-MODE# enables normal Read or Write operations.
1, 3
P[2:1]-CS#
Input
PSRAM CHIP SELECT: PSRAM-specific signal; low-true input.
When low, P-CS# selects the associated PSRAM memory die. When high, P-CS# deselects the
associated PSRAM die. PSRAM die power is reduced to standby levels, and its data and WAIT
outputs are placed in a High-Z state.
• P1-CS# is dedicated to PSRAM die #1.
• P2-CS# IS dedicated to PSRAM die #2. Otherwise, any unused PSRAM chip select should be
treated as RFU.
1
S-CS1#
S-CS2
Input
SRAM CHIP SELECTS: SRAM-specific signals; S-CS1# low-true input, S-CS2 high-true input.
When both S-CS1# and S-CS2 are asserted, the SRAM die is selected. When either S-CS1# or
S-CS2 is deasserted, the SRAM die is deselected.
1, 4
R-UB#
R-LB#
Input
RAM UPPER/LOWER BYTE ENABLES: PSRAM- and SRAM-specific signals; low-true inputs.
When low, R-UB# enables DQ[15:8] and R-LB# enables DQ[7:0] during PSRAM or SRAM Read
and Write cycles. When high, R-UB# masks DQ[15:8] and R-LB# masks DQ[7:0].
1
Power Signals
F-VPP
Power
FLASH PROGRAM/ERASE VOLTAGE: Flash specific.
F-VPP supplies program or erase power to the flash die.
F[2:1]-VCC
Power
FLASH CORE POWER SUPPLY: Flash specific.
F[2:1]-VCC supplies the core power to the flash die.
For NOR/NAND stacked device, F1-VCC is dedicated for all NOR dies, F2-VCC is dedicated for all
NAND dies.
VCCQ
Power
I/O POWER SUPPLY: Global device I/O power.
VCCQ supplies the device input/output driver voltage.
P-VCC
Power
PSRAM CORE POWER SUPPLY: PSRAM specific.
P-VCC supplies the core power to the PSRAM die.
1
S-VCC
Power
SRAM POWER SUPPLY: SRAM specific.
S-VCC supplies the core power to the SRAM die.
1
VSS
Groun
d
DEVICE GROUND: Global ground reference for all signals and power supplies.
Connect all VSS balls to system ground. Do not float any VSS connections.
DU
—
DO NOT USE:
Ball should not be connected to any power supplies, signals, or other balls. Ball can be left
floating.
RFU
—
RESERVED for FUTURE USE:
Reserved by Numonyx for future device functionality and enhancement. Ball must be left
floating.
April 2008
309823-10
5
Datasheet
35
Numonyx™ StrataFlash® Cellular Memory (M18)
Notes:
1.
Only available on stacked device combinations with NAND, SRAM, and/or LPSDRAM die. Otherwise treated as RFU.
2.
F2-OE# and N-RE# share the same package ball at location H9. Only one signal function is available, depending on the
stacked device combination.
3.
P-CRE and P-MODE# share the same package ball at location K9. Only one signal function is available, depending on the
stacked device combination.
4.
S-CS1# and N-WE# share the same package ball at location J2. Only one signal function is available, depending on the
stacked device combination.
5.
The F2-VCC signal applies to a NAND flash die if one exists; if not, the F2-VCC signal applies to the NOR flash die.
Datasheet
36
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
4.5
Ballouts, x16 Split Bus
4.5.1
x16 Split Bus (165-Ball) Ballout, Non-Mux
Figure 16: x16 Split Bus (165 Active Ball) Electrical Ballout, Non-Mux
Pin 1
1
A
2
3
4
5
6
7
8
9
10
11
12
DU
B: D-A2
B: D-A0
B: D-BA0
B: D-A12
B: D-A8
B: D-A6
B: D-A4
DU
B: D-BA1 B: D-WE# B: D-A13
B: D-A9
B: D-A7
B: D-A5
RFU
B: D-CKE B: D-A14
A: VSS
RFU
A: F-D7 / A: F-D14 /
N-ADQ7 N-ADQ14
C
A: F-D15 / A: F-D6 /
N-ADQ15 N-ADQ6
D
B
DU
A: F-A15
B: D-A3
B: D-A1
C
A: F-A13
A: F-A14
A: F-A16
A: VSS
D
A: F-A12
A: F-A22 A: F2-CE# B: D-A10 B: D-VCC
E
A: F-A11
A: F-A21
A: N-R/B# A: F-DPD
F
A: F-A10
A: F-A20
A: F-WE#
G
A: F-A9
H
J
A: F3CE# /
N2-CE#
B: D-A11
A: F4CE# /
N1-CE#
A
DU
B
B: D1CE#
B: D2CE#
B: DCLK#
B: D-CLK
A: VSS
RFU
B: DRAS#
B: DCAS#
RFU
A: FWAIT
A: VCCQ
RFU
A: F-D13 /
N-ADQ13
E
A: VSS
Depop
(Index)
Depop
(RFU)
Depop
(RFU)
A: F2VCC /
N-VCC
A: VSS
A: VCCQ
A: VSS
A: F-D5 /
N-ADQ5
F
A: F-A26 A: F-WP1#
A: FWP2# /
N-WP#
RFU
Depop
(RFU)
Depop
(RFU)
B: D-VCC
RFU
A: FADV#
A: F-D12 / A: F-D4 /
N-ADQ12 N-ADQ4
G
A: F-A8
A: F-A24
A: F-A25
A: VSS
A: F1-CE#
Depop
(RFU)
Depop
(RFU)
A: F1VCC
A: VSS
RFU
A: F-A18
A: F-A19
A: F-A23 A: N-CLE
Depop
(RFU)
Depop
(RFU)
RFU
RFU
Depop
(RFU)
Depop
(RFU)
RFU
A: VSS
A: VCCQ
RFU
A: F-VPP
A: FRST#
A: F2VCC /
N-VCC
B: D-VCC
H
A: F-OE# A: F-D10 / A: F-D11 /
N-ADQ10 N-ADQ11
J
A: VSS
A: F-D3 /
N-ADQ3
K
A: VCCQ
RFU
A: F-D2 /
N-ADQ2
L
A: F-A7
A: F-A17
L
A: F-A5
A: F-A6
M
A: F-A3
A: F-A4
RFU
B: DVDDQ
B: D-DM0
B: DVDDQ
B: DVDDQ
B: DDM1
B: DVDDQ
A: VSS
A: F-D1 /
N-ADQ1
A: F-D9 /
N-ADQ9
M
N
A: F-A1
A: F-A2
B: D-VSS
B: DDQS0
B: D-VSS
A: VSS
B: D-VSS
B: DDQS1
B: D-VSS
RFU
A: F-D8 /
N-ADQ8
A: F-D0 /
N-ADQ0
N
P
DU
A: F-A0
B: D-D1
B: D-D3
B: D-D5
B: D-D7
B: D-D8
B: D-D10 B: D-D12
B: D-D14
RFU
DU
P
DU
B: D-D0
B: D-D2
B: D-D4
B: D-D6
B: D-D9
B: D-D11 B: D-D13
B: D-D15
DU
1
2
A: VSS
A: F-CLK
K
R
RFU
RFU
A: N-ALE A: N-WE# A: F1-VCC A: N-RE#
3
4
5
6
7
8
Top View - Ball Side Down
April 2008
309823-10
9
10
11
R
12
B5173 -01
Datasheet
37
Numonyx™ StrataFlash® Cellular Memory (M18)
4.6
Table 9:
Symbol
Signal Descriptions, x16 Split Bus
Signal Descriptions, x16 Split Bus, Non-Mux (Sheet 1 of 4)
Type
Signal Descriptions
Notes
Address and Data Signals, Non-Mux
Input
FLASH ADDRESS: Flash device signals.
Dedicated address inputs for Flash memory die during read and write operations.
• 2-Gbit: AMAX = A26
• 1-Gbit: AMAX = A25
• 512-Mbit: AMAX = A24
• 256-Mbit: AMAX = A23
• 128-Mbit: AMAX = A22
Unused address inputs are RFU.
D-A[MAX:0]
Input
LPSDRAM ADDRESS: LSPDRAM device signals.
Dedicated address inputs for LPSDRAM memory die during read and write operations.
• A[12:0] are the row and A[9:0] are the column addresses for 512-Mbit LPSDRAM.
• A[12:0] are the row and A[8:0] are the column addresses for 256-Mbit LPSDRAM.
• A[11:0] are the row and A[8:0] are the column addresses for 128-Mbit LPSDRAM.
Unused address inputs are RFU.
F-DQ[15:0]
Input/
Output
FLASH DATA INPUT/OUTPUTS: Flash device signals.
• Inputs Flash data and commands during write cycles.
• Outputs data during read cycles.
• Data signals are High-Z when the device is deselected or its output is disabled.
D-DQ[15:0]
Input/
Output
LPSDRAM DATA INPUT/OUTPUTS: LPSDRAM device signals.
• Inputs LPSDRAM data and commands during write cycles.
• Outputs data during read cycles.
• Data signals are High-Z when the device is deselected or its output is disabled.
F-A[MAX:0]
Address and Data Signals, A/D Mux
F-A[MAX:16]
F-ADQ[15:0]
Input
Input /
Output
ADDRESS: Flash device signals.
Shared address inputs for all Flash memory die during Read and Write operations.
• 2-Gbit: AMAX = A26
• 1-Gbit: AMAX = A25
• 512-Mbit: AMAX = A24
• 256-Mbit: AMAX = A23
• 128-Mbit: AMAX = A22
Unused address inputs should be treated as RFU.
ADDRESS-DATA MULTIPLEXED INPUTS/ OUTPUTS: AD-Mux flash lower address and data
signals; LPSDRAM data signals.
During AD-Mux flash Write cycles, ADQ[15:0] are used to input the lower address followed by
commands or write-data.
During AD-Mux flash Read cycles, ADQ[15:0] are used to input the lower address followed by
read-data output.
During LPSDRAM accesses, ADQ[15:0] are used to input commands and write-data during
Write cycles or to output read-data during Read cycles.
During NAND accesses, ADQ[7:0] are used to input commands, address, or write-data, and to
output read-data.
ADQ[15:0] are High-Z when the flash is deselected or its output is disabled.
Control Signals
Datasheet
38
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 9:
Symbol
Signal Descriptions, x16 Split Bus, Non-Mux (Sheet 2 of 4)
Type
Signal Descriptions
Input
FLASH ADDRESS VALID: Flash-specific signal; low-true input.
During synchronous flash Read operations, the address is latched on the rising edge of FADV#, or on the first rising edge of F-CLK after F-ADV# goes low for devices that support up
to 108 MHz, or on the last rising edge of F-CLK after F-ADV# goes low for devices that support
up to 133 MHz.
In an asynchronous flash Read operation, the address is latched on the rising edge of F-ADV#.
F[4:1]-CE#
Input
FLASH CHIP ENABLE: Flash-specific signal; low-true input.
When low, F-CE# selects the associated flash memory die.
When high, F-CE# deselects the associated flash die. Flash die power is reduced to standby
levels, and its data and F-WAIT outputs are placed in a High-Z state.
• F1-CE# is dedicated to flash die #1.
• F[4:2]-CE# are dedicated to flash die #4 through #2, respectively, if present. Otherwise,
treat any unused flash chip enable as RFU.
• When NAND is used, F4-CE# is dedicated for NAND die 1 and NAND die 2. Otherwise, this
is RFU.
F-CLK
Input
FLASH CLOCK: Flash-specific signal; configurable active-edge input.
F-CLK synchronizes the flash memory with the system clock during synchronous operations.
D-CLK
Input
LPSDRAM CLOCK: LPSDRAM-specific signal; rising active-edge input.
D-CLK synchronizes the LPSDRAM and DDR LPSDRAM with the system clock.
1
D-CLK#
Input
DDR LPSDRAM CLOCK: DDR LPSDRAM-specific signal; falling active-edge input.
D-CLK# synchronizes the DDR LPSDRAM with the system clock.
1
F-OE#
Input
FLASH OUTPUT ENABLE: Flash-specific signal; low-true input.
• When low, OE# enables the output drivers of the selected flash die.
• When high, OE# disables the output drivers of the selected flash die and places the
output drivers in High-Z.
F-RST#
Input
FLASH RESET: Flash-specific signal; low-true input.
• When low, F-RST# resets internal operations and inhibits writes.
• When high, F-RST# enables normal operation.
F-ADV#
Notes
FLASH WAIT: Flash-specific signal; configurable-true output.
When asserted, F-WAIT indicates invalid output data.
• F-WAIT is driven whenever F-CE# and OE# is low.
• F-WAIT is High-Z whenever F-CE# or OE# is high.
F-WAIT
Output
F-WE#
Input
FLASH WRITE ENABLE: Flash-specific signal; low-true input.
When low, WE# enables write operations for the selected flash die.
N-WE#
Input
NAND WRITE ENABLE: NAND-specific signal; low-true input.
When low, WE# enables write operations for the selected NAND die.
1
D-WE#
Input
LPSDRAM WRITE ENABLE: LPSDRAM-specific signal; low-true input.
D-WE#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-CAS#, and D-RAS#, define
the LPSDRAM command or operation. D-WE# is sampled on the rising edge of D-CLK.
1
F-WP[2:1]#
Input
FLASH WRITE PROTECT: Flash-specific signals; low-true inputs.
When low, F-WP# enables the Lock-Down mechanism.
When high, F-WP# overrides the Lock-Down function, enabling locked-down blocks to be
unlocked with the Unlock command.
• F-WP1# is dedicated to flash die #1.
• F-WP2# is used for NAND die when available. Otherwise, this signal is for all other NOR
die.
F-DPD
Input
FLASH DEEP POWER-DOWN: Flash-specific signal; configurable-true input.
When enabled in the ECR, F-DPD is used to enter or exit Deep Power-Down mode.
N-CLE
Input
NAND COMMAND LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-CLE enables commands to be latched on the rising edge of WE#.
1
N-ALE
Input
NAND ADDRESS LATCH ENABLE: NAND-specific signal; high-true input.
When high, N-ALE enables addresses to be latched on the rising edge of WE#.
1
April 2008
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Datasheet
39
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 9:
Signal Descriptions, x16 Split Bus, Non-Mux (Sheet 3 of 4)
Symbol
Type
Signal Descriptions
Notes
N-R/B#
Output
NAND READY/BUSY: NAND-specific signal; low-true output.
• When low, N-RY/BY# indicates the NAND device is busy performing a read, program, or
erase operations.
• When high, N-RY/BY# indicates the NAND device is ready.
1
N-RE#
Output
NAND READ ENABLE: NAND-specific signal; drives the data onto the flash bus after the falling
edge of N-RE#.
This signal increments the internal column address and reads out each data.
1
D-CKE
Input
LPSDRAM CLOCK ENABLE: LPSDRAM-specific signal; high-true input.
• When high, D-CKE indicates that the next D-CLK edge is valid.
• When low, D-CKE indicates that the next D-CLK edge is invalid and the selected LPSDRAM
die is suspended.
1
D-BA[1:0]
Input
LPSDRAM BANK SELECT: LPSDRAM-specific input signals.
D-BA[1:0] selects one of four banks in the LPSDRAM die.
1
D-RAS#
Input
LPSDRAM ROW ADDRESS STROBE: LPSDRAM-specific signal; low-true input.
D-RAS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-CAS#, and D-WE#, define
the LPSDRAM command or operation. D-RAS# is sampled on the rising edge of D-CLK.
1
D-CAS#
Input
LPSDRAM COLUMN ADDRESS STROBE: LPSDRAM-specific signal; low-true input.
D-CAS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-CS#, D-RAS#, and D-WE#, define
the LPSDRAM command or operation. D-CAS# is sampled on the rising edge of D-CLK.
1
Input
LPSDRAM CHIP ENABLE: LPSDRAM-specific signal; low-true input.
When low, D-CS# selects the associated LPSDRAM memory die and starts the command input
cycle.
When D-CS# is high, commands are ignored but operations continue.
• D-CS#, together with A[MAX:0], D-BA[1:0], D-CKE, D-RAS#, D-CAS#, and D-WE#,
define the LPSDRAM command or operation. D-CS# is sampled on the rising edge of DCLK.
• D[2:1]-CS# are dedicated to LPSDRAM die #2 and die #1, respectively, if present.
Otherwise, treat any unused LPSDRAM chip selects as RFU.
1
Input
LPSDRAM DATA MASK: LPSDRAM-specific signal; high-true input.
When high, D-DM[1:0] controls masking of input data during writes and output data during
reads.
• D-DM1 corresponds to the data on DQ[15:8].
• D-DM0 corresponds to the data on DQ[7:0].
1
LPSDRAM UPPER/LOWER DATA STROBE: DDR LPSDRAM-specific input/output signals.
D-DQS1 and D-DQS0 provide as output the read data strobes, and as input the write data
strobes.
• D-DQS1 corresponds to the data on DQ[15:8].
• D-DQS0 corresponds to the data on DQ[7:0].
1
3
2,3
D[2:1]-CE#
D-DM[1:0]
D-DQS1
D-DQS0
Input /
Output
S-CS1#
S-CS2#
Input
SRAM CHIP SELECTS: SRAM-specific signals.
• S-CS1# low-true input.
• S-CS2# high-true input.
• When both are asserted, S-CS1# and S-CS2 select the SRAM die.
• When either is deasserted, the SRAM die is deselected and its power is reduced to
standby levels.
S-UB#
S-LB#
Input
SRAM UPPER/LOWER BYTE ENABLES: SRAM-specific signals; low-true inputs.
• When low, S-UB# enables DQ[15:8] and S-LB# enables DQ[7:0] during SRAM read and
write cycles.
• When high, S-UB# masks DQ[15:8] and S-LB# masks DQ[7:0].
Power
FLASH PROGRAM/ERASE VOLTAGE: Flash specific.
F-VPP supplies program or erase power to the flash die.
Power Signals
F-VPP
Datasheet
40
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 9:
Symbol
Signal Descriptions, x16 Split Bus, Non-Mux (Sheet 4 of 4)
Type
Signal Descriptions
F[2:1]-VCC
Power
FLASH CORE POWER SUPPLY: Flash specific.
F-VCC supplies the core power to the flash die.
• F1-VCC is dedicated for NOR die.
• F2-VCC is used for NAND die when available. Otherwise, this signal is for NOR die. (When
NAND is available, the F2-VCC signal is named N-VCC.)
D-VCC
Power
LPSDRAM CORE POWER SUPPLY: LPSDRAM specific.
D-VCC supplies the core power to the LPSDRAM die.
S-VCC
Power
SRAM POWER SUPPLY: SRAM specific.
S-VCC supplies the core power to the SRAM die.
VCCQ
Power
FLASH I/O POWER SUPPLY: Global device I/O power.
VCCQ supplies the device input/output driver voltage to the flash die.
D-VDDQ
Power
LPSDRAM I/O POWER SUPPLY: Global device I/O power.
VDDQ supplies the device input/output driver voltage to the LPSDRAM die.
VSS
Ground
FLASH DEVICE GROUND: Global ground reference for all flash signals and power supplies.
Connect all A: VSS balls to system ground. Do not float any VSS connections.
D-VSS
Ground
LPSDRAM DEVICE GROUND: Global ground reference for all LPSDRAM signals and power
supplies.
Connect all B: D-VSS balls to system ground. Do not float any VSS connections.
DU
—
DO NOT USE:
Do not connect this ball to any power supplies, signals, or other balls. This ball can be left
floating.
RFU
—
RESERVED for FUTURE USE:
Reserved by Numonyx for future device functionality and enhancement. This ball must be left
floating.
Notes
1
1
1
Notes:
6.
Available only on stacked device combinations with NAND, and/or LPSDRAM die. Otherwise, treat the signal as RFU.
April 2008
309823-10
Datasheet
41
Numonyx™ StrataFlash® Cellular Memory (M18)
5.0
Maximum Ratings and Operating Conditions
5.1
Absolute Maximum Ratings
Warning:
Stressing the device beyond the Absolute Maximum Ratings may cause permanent
damage. These are stress ratings only.
NOTICE: This document contains information available at the time of its release. The specifications are subject to change without
notice. Verify with your local Numonyx sales office that you have the latest datasheet before finalizing a design.
Table 10: Absolute Maximum Ratings
Parameter
Min
Max
Unit
Conditions
Notes
Temperature under Bias Expanded
–30
+85
°C
—
1
Storage Temperature
–65
+125
°C
—
1
F-VCC Voltage
–2.0
VCCQ + 2.0
V
—
2,3
VCCQ and P-VCC Voltage
–2.0
VCCQ + 2.0
V
—
2,4
Voltage on any input/output signal (except
VCC, VCCQ,and VPP)
–2.0
VCCQ + 2.0
V
—
2,4
F-VPP Voltage
–2.0
+11.5
V
—
2,3
ISH Output Short Circuit Current
—
100
mA
—
5
VPPH Time
—
80
Hours
100,000
—
Cycles
Block Program/Erase Cycles: Main Blocks
6
F-VPP = VCC or F-VPP = VPPH
6
Notes:
1.
Temperature is Ambient, not Case.
2.
Voltage is referenced to VSS.
3.
During signal transitions, minimum DC voltage may undershoot to –2.0 V for periods < 20 ns; maximum DC voltage
may overshoot to VCC (max) + 2.0 V for periods < 20 ns.
4.
During signal transitions, minimum DC voltage may undershoot to –1.0 V for periods < 20 ns; maximum DC voltage
may overshoot to VCCQ (max) + 1.0 V for periods < 20 ns.
5.
Output shorted for no more than one second. No more than one output shorted at a time.
6.
Operation beyond this limit may degrade performance.
5.2
Operating Conditions
Warning:
Operation beyond the “Operating Conditions” is not recommended and extended
exposure beyond the “Operating Conditions” may affect device reliability.
Table 11: Operating Conditions
Symbol
Description
Min
Max
Unit
Conditions
TC
Operating Temperature (Case Temperature)
–30
+85
°C
—
VCC
VCC Supply Voltage
+1.7
+2.0
V
—
VCCQ
I/O Supply Voltage
+1.7
+2.0
V
—
VPPL
Programming Voltage (Logic Level)
+0.9
+2.0
V
—
VPPH
Factory Programming Voltage (High Level)
+8.5
+9.5
V
—
Datasheet
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6.0
Electrical Characteristics
6.1
Initialization
Proper device initialization and operation is dependent on the power-up/down
sequence, reset procedure, and adequate power-supply decoupling. The following
sections describe each of these areas.
6.1.1
Power-Up/Down Characteristics
To prevent conditions that could result in spurious program or erase operations, the
power-up/power-down sequence shown in Table 12 is recommended. Note that each
power supply must reach its minimum voltage range before applying/removing the
next supply voltage.
Table 12: Power-Up/Down Sequence
Power Supply
Voltage
Power-Up Sequence
VCC(min)
1st
VCCQ(min)
2nd
VPP(min)
3rd
1st
2nd*
1st*
Power-Down Sequence
3rd
Sequencing not
required*
2nd
2nd
1st
2nd
1st*
2nd*
Sequencing not
required*
1st
* Power supplies connected or sequenced together.
Device inputs must not be driven until all supply voltages reach their minimum range.
RST# should be low during power transitions.
Note:
If VCCQ is below VLKOQ, the device is reset.
6.1.2
Reset Characteristics
During power-up and power-down, RST#should be asserted to prevent spurious
program or erase operations. While RST#is low, device operations are disabled; all
inputs such as address and control are ignored; and all outputs such as data and WAIT
are placed in High-Z. Invalid bus conditions are effectively masked out.
Upon power-up, RST#can be deasserted after tVCCPH, allowing the device to exit from
reset. Upon exiting from reset, the device defaults to asynchronous Read Array mode,
and the Status Register defaults to 0080h. Array data is available after tPHQV, or a buswrite cycle can begin after tPHWL.
If RST#is asserted during a program or erase operation, the operation will abort and
array contents at that location will be invalid.
For proper system initialization, connect RST#to the low-true reset signal that asserts
whenever the processor is reset. This will ensure the flash device is in the expected
read mode (i.e., Read Array) upon startup.
6.1.3
Power Supply Decoupling
High-speed flash memories require adequate power-supply decoupling to prevent
external transient noise from affecting device operations, and to prevent internallygenerated transient noise from affecting other devices in the system.
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Ceramic chip capacitors of 0.01 to 0.1 µF capacitors should be used between all VCC,
VCCQ, VPPsupply connections and system ground. These high-frequency, inherently
low-inductance capacitors should be placed as close as possible to the device package,
or on the opposite side of the printed circuit board close to the center of the devicepackage footprint.
Larger (4.7 µF to 33.0 µF) electrolytic or tantulum bulk capacitors should also be
distributed as needed throughout the system to compensate for voltage sags caused by
circuit trace inductance.
Transient current magnitudes depend on the capacitive and inductive loading on the
device’s outputs. For best signal integrity and device performance, high-speed design
rules should be used when designing the printed-circuit board. Circuit-trace
impedances should match output-driver impedance with adequate ground-return
paths. This will help minimize signal reflections (overshoot/undershoot) and noise
caused by high-speed signal edge rates.
6.2
DC Current Specifications
The M18 device includes specifications for different lithographies, densities, and
frequencies. For additional information on combinations, see Table 4, “M18 Product
Litho/Density/Frequency Combinations” on page 10 in the Section 2.0, “Functional
Description.
Table 13: DC Current Specifications (Sheet 1 of 3)
Sym
ILI
ILO
Parameter
Litho
(nm)
Density
(Mbit)
Input Load Current
Output Leakage Current
1.7 V – 2.0 V
Unit
Typ
Max
—
±1
—
±1
256
35
95
512
50
120
128
45
115
256
50
130
512
60
160
1,024
70
185
256
35
95
512
50
120
128
45
115
256
50
130
512
60
160
1,024
70
185
Test Conditions
Notes
µA
VCC = VCC Max
VCCQ = VCCQ Max
VIN = VCCQ or VSS
µA
VCC = VCC Max
VCCQ = VCCQ Max
VIN = VCCQ or VSS
µA
VCC = VCCMax
VCCQ = VCCQMax
CE# = VCCQ
RST# = VCCQ or GND
(for ICCS)
WP# = VIH
1,2
µA
VCC = VCC Max
VCCQ = VCCQ Max
CE# = VSSQ
RST# = VCCQ
All inputs are at rail to
rail (VCCQ or VSSQ).
—
1
90
ICCS
VCC Standby
65
90
ICCAPS
APS
65
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 13: DC Current Specifications (Sheet 2 of 3)
Sym
Parameter
Litho
(nm)
Density
(Mbit)
IDPD
DPD
ICCR
Average VCC Read: Asynchronous Single Word Read
f = 5 MHz, (1 CLK)
ICCR
Average VCC Read:
Page Mode Read
f = 13 MHz, (17 CLK)
ICCR
Average VCC Read:
Synchronous Burst Read
f = 66 MHz, LC = 7
ICCR
Average VCC Read:
Synchronous Burst Read
f = 108 MHz, LC = 10
ICCR
Average VCC Read:
Synchronous Burst Read
f = 133 MHz, LC = 13
ICCW,
ICCE
ICCBC
VCC Program
VCC Erase
VCC Blank Check
1.7 V – 2.0 V
Unit
Typ
2
25
Test Conditions
Notes
Max
30
30
µA
VCC = VCC Max
VCCQ = VCCQ Max
CE# = VCCQ
RST# = VCCQ
ECR[15] = VCCQ
DPD = VCCQ or VSSQ
All inputs are at rail to
rail (VCCQ or VSSQ).
mA
VCC = VCCMAX
CE# = VIL
OE# = VIH
Inputs: VIL or VIH
1,3,4,5
VCC = VCCMAX
CE# = VIL
OE# = VIH
Inputs: VIL or VIH
1,3,4,5
VCC = VCCMAX
CE# = VIL
OE# = VIH
Inputs: VIL or VIH
1,3,4,5
VCC = VCCMAX
CE# = VIL
OE# = VIH
Inputs: VIL or VIH
1,3,4,5
VCC = VCCMAX
CE# = VIL
OE# = VIH
Inputs: VIL or VIH
1,3,4,5
8
Burst = 16 Word
11
15
mA
Burst = 8 Word
22
32
mA
Burst = 16 Word
19
26
mA
Burst = Continuous
25
34
mA
Burst = 8 Word
26
36
mA
Burst = 16 Word
23
30
mA
Burst = Continuous
30
42
mA
Burst = 8 Word
26
35
mA
Burst = 16 Word
24
33
mA
Burst = Continuous
33
46
mA
35
50
mA
VPP = VPPL or VPP =
VPPH, program/erase in
progress
1,3,4,
5,7
35
95
µA
CE# = VCCQ; suspend in
progress
1,3,6
256
90
ICCWS,
ICCES
VCC Program Suspend
VCC Erase Suspend
512
50
120
128
45
115
256
50
130
512
60
160
1,024
70
185
0.2
5
µA
VPP = VPPL; suspend in
progress
3
2
15
µA
VPP ≤ VCC
3
0.05
0.1
mA
VPP = VPPL = VPPH,
program in progress
3
65
IPPS,
IPPWS,
IPPES
VPP Standby
VPP Program Suspend
VPP Erase Suspend
IPPR
VPP Read
IPPW
VPP Program
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 13: DC Current Specifications (Sheet 3 of 3)
Sym
Parameter
IPPE
IPPBC
Litho
(nm)
Density
(Mbit)
1.7 V – 2.0 V
Unit
Test Conditions
Notes
0.1
mA
VPP = VPPL = VPPH, erase
in progress
3
0.1
mA
VPP = VPPL = VPPH, blank
check in progress
3
Typ
Max
VPP Erase
0.05
VPP Blank Check
0.05
Notes:
1.
2.
3.
4.
5.
6.
7.
All currents are RMS unless noted. Typical values at typical VCC, TC = +25 °C.
ICCS is the average current measured over any 5 ms time interval 5 µs after CE# is deasserted.
Sampled, not 100% tested.
VCC read + program current is the sum of VCC read and VCC program currents.
VCC read + erase current is the sum of VCC read and VCC erase currents.
ICCES is specified with the device deselected. If device is read while in erase suspend, current is ICCES plus ICCR
ICCW, ICCE measured over typical or max times specified in Section 7.4, “Program and Erase
8.
IDPD is the current measured 40 µs after entering DPD.
Characteristics” on page 68
6.3
DC Voltage Specifications
Table 14: DC Voltage Specifications
Symbol
Parameter
V CCQ
1.7 V – 2.0 V
Unit
Min
Max
Test Condition
Notes
VIL
Input Low Voltage
0
0.4
—
1
VIH
Input High Voltage
VCCQ –0.4
VCCQ
—
—
VCC = VCCMIN
VCCQ = VCCQMIN
IOL = 100 µA
—
VCC = VCCMIN
VCCQ = VCCQMIN
IOH = –100 µA
—
VOL
Output Low Voltage
—
0.1
VOH
Output High Voltage
VCCQ –0.1
—
VPPLK
VPP Lock-Out Voltage
—
0.4
—
2
VLKO
VCC Lock Voltage
1.0
—
—
—
VLKOQ
VCCQ Lock Voltage
0.9
—
—
—
V
Notes:
1.
During signal transitions, voltage can undershoot to –1.0 V and overshoot to maximum VCCQ+1.0 V for durations of < 2
ns.
2.
VPP ≤ VPPLK inhibits erase and program operations. Do not use VPPL and VPPH outside their valid ranges.
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
6.4
Capacitance
Table 15: Capacitance
Symbol
Parameter
Min
Typ
Max
CIN
Input Capacitance (Address, CLK, CE#,
OE#, ADV#, WE#, WP#, DPD and RST#)
2
4
6
COUT
Output Capacitance (Data and WAIT)
2
5
6
Unit
pF
Condition
VIN = 0 - 2.0 V
Notes
1,2
VOUT = 0 - 2.0 V
Notes:
1.
TC = +25°C, f = 1 MHz.
2.
Sampled, not 100% tested.
3.
Silicon die capacitance only. Add 1 pF for discrete packages; for SCSP total capacitance equals 2 pF + sum of silicon die
capacitance.
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.0
NOR Flash AC Characteristics
Timing symbols used in the timing diagrams within this document conform to the
following conventions:
Figure 17: Timing Symbol Notation Convention
t
E L Q V
Source Signal
Source State
Target State
Target Signal
Table 16: Codes for Timing Signals and Timing States
Signal
Code
State
Code
Address
A
High
H
Data - Read
Q
Low
L
Data - Write
D
High-Z
Z
Chip Enable (CE#)
E
Low-Z
X
Output Enable (OE#)
G
Valid
V
Write Enable (WE#)
W
Invalid
I
Address Valid (ADV#)
V
—
—
Reset (RST#)
P
—
—
Clock (CLK)
C
—
—
WAIT
T
—
—
Note:
Exceptions to this conventions include tACC and tAPA. tACC is a generic timing symbol
that refers to the aggregate initial-access delay as determined by tAVQV, tELQV, and
tGLQV (whichever is satisfied last) of the flash device. tAPA is specified in the flash
device datasheet, and is the address-to-data delay for subsequent page-mode reads.
7.1
AC Test Conditions
Figure 18: AC Input/Output Reference Waveform
VC CQ
Input
0V
V IH
V CC Q/2
Test Points
VC CQ /2
Output
V IL
tRISE/FALL
Note:
AC test inputs are driven at VCCQ for Logic ‘1’ and 0.0 V for Logic ‘0’. Input/output timing begins and ends at VCCQ/2.
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 17: AC Input Requirements
Symbol
Parameter
Frequency
tRISE/FALL
Inputs rise/fall time (Address, CLK, CE#,
OE#, ADV#, WE#, WP#)
tASKW
Address-Address skew
Min
Max
@133MHz, 108MHz
0.3
1.2
@66MHz
0
3
0
3
Unit
ns
Condition
VIL to VIH or VIH to VIL
At VCCQ/2
Figure 19: Transient Equivalent Testing Load Circuit
Device
Under Test
Out
CL
Notes:
1.
See the following table for component values.
2.
Test configuration component value for worst case speed conditions.
3.
CL includes jig capacitance.
Table 18: Test Configuration Component Value for Worst Case Speed Conditions
Test Configuration
CL (pF)
1.7 V Standard Test
30
2.0 V Standard Test
30
Figure 20: Clock Input AC Waveform
R201
R202
V IH
CLK [C] V CCQ /2
V IL
R203
CLKINPUT.vsd
7.2
Read Specifications
Read specifications for 108 MHz and 133 MHz M18 devices are included here. For
additional information on lithography, density, and frequency combinations, see
Table 4, “M18 Product Litho/Density/Frequency Combinations” on page 10 in the
Section 2.0, “Functional Description.
Devices which support frequencies up to 133 MHz must meet additional timing
specifications for synchronous reads (for address latching with CLK) as listed in
Table 20, “AC Read, 133 MHz, VCCQ = 1.7 V to 2.0 V” on page 51.
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 19: AC Read, 108 MHz, VCCQ = 1.7 V to 2.0 V (Sheet 1 of 2)
96 ns
Nbr.
Parameter1
Symbol
Min
Unit
Notes
Max
Asynchronous Specifications
R1
tAVAV
Read cycle time
96
—
ns
—
R2
tAVQV
Address to output valid
—
96
ns
—
R3
tELQV
CE# low to output valid
—
96
ns
—
R4
tGLQV
OE# low to output valid
—
20
ns
2
R5
tPHQV
RST# high to output valid
—
150
ns
—
R6
tELQX
CE# low to output in low-Z
0
—
ns
3
R7
tGLQX
OE# low to output in low-Z
0
—
ns
2,3
R8
tEHQZ
CE# high to output in high-Z
—
9
ns
OE# high to output in high-Z
—
9
ns
Output hold from first occurring address, CE#, or OE# change
0
—
ns
R9
tGHQZ
R10
tOH
3
R11
tEHEL
CE# pulse width high
7
—
ns
—
R12
tELTV
CE# low to WAIT valid
—
11
ns
—
R13
tEHTZ
CE# high to WAIT high Z
—
9
ns
3
R14
tGHTV
OE# high to WAIT valid (AD-Mux only)
—
7
ns
—
R15
tGLTV
OE# low to WAIT valid
—
7
ns
—
R16
tGLTX
OE# low to WAIT in low-Z
0
—
ns
3
R17
tGHTZ
OE# low to WAIT in high-Z (non-mux only)
0
9
ns
3
Latching Specifications
R101
tAVVH
Address setup to ADV# high
5
—
ns
—
R102
tELVH
CE# low to ADV# high
9
—
ns
—
R103
tVLQV
ADV# low to output valid
—
96
ns
—
R104
tVLVH
ADV# pulse width low
7
—
ns
—
R105
tVHVL
ADV# pulse width high
7
—
ns
—
R106
tVHAX
Address hold from ADV# high
5
—
ns
4
R107
tVHGL
ADV# high to OE# low (AD-Mux only)
7
—
ns
—
R108
tAPA
Page address access (non-mux only)
—
15
ns
—
R111
tPHVH
RST# high to ADV# high
30
—
ns
—
Clock Specifications
R200
fCLK
CLK frequency
—
108
MHz
—
R201
tCLK
CLK period
9.26
—
ns
—
R202
tCH/CL
CLK high/low time
0.45
0.55
CLK
period
—
R203
tFCLK/RCLK
CLK fall/rise time
0.3
1.2
ns
—
Synchronous Specifications
R301
tAVCH
Address setup to CLK high
5
—
ns
—
R302
tVLCH
ADV# low setup to CLK high
5
—
ns
—
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 19: AC Read, 108 MHz, VCCQ = 1.7 V to 2.0 V (Sheet 2 of 2)
96 ns
Nbr.
Parameter 1
Symbol
Unit
Notes
—
ns
—
Min
Max
R303
tELCH
CE# low setup to CLK high
5
R304
tCHQV
CLK to output valid
—
7
ns
—
R305
tCHQX
Output hold from CLK high
2
—
ns
—
R306
tCHAX
Address hold from CLK high
5
—
ns
4
R307
tCHTV
CLK high to WAIT valid
—
7
ns
—
R311
tCHVL
CLK high to ADV# Setup
2
—
ns
—
R312
tCHTX
WAIT hold from CLK
2
—
ns
—
Notes:
1.
See Figure 18, “AC Input/Output Reference Waveform” on page 48 for timing measurements and
maximum allowable input slew rate.
2.
OE# may be delayed by up to tELQV – tGLQV after CE#’s falling edge without impact to tELQV.
3.
Sampled, not 100% tested.
4.
Address hold in synchronous burst mode is tCHAX or tVHAX, whichever timing specification is satisfied first.
Table 20: AC Read, 133 MHz, VCCQ = 1.7 V to 2.0 V (Sheet 1 of 2)
96 ns
Nbr.
Parameter 1
Symbol
Min
Max
96
—
Units
Notes
ns
—
Asynchronous Specifications
R1
tAVAV
Read cycle time
R2
tAVQV
Address to output valid
—
96
ns
—
R3
tELQV
CE# low to output valid
—
96
ns
—
R4
tGLQV
OE# low to output valid
—
7
ns
2
R5
tPHQV
RST# high to output valid
—
150
ns
—
R6
tELQX
CE# low to output in low-Z
0
—
ns
3
R7
tGLQX
OE# low to output in low-Z
0
—
ns
2,3
R8
tEHQZ
CE# high to output in high-Z
—
7
ns
R9
tGHQZ
OE# high to output in high-Z
—
7
ns
3
R10
tOH
Output hold from first occurring address, CE#, or OE# change
0
—
ns
R11
tEHEL
CE# pulse width high
7
—
ns
—
R12
tELTV
CE# low to WAIT valid
—
8
ns
—
R13
tEHTZ
CE# high to WAIT high Z
—
7
ns
3
R14
tGHTV
OE# high to WAIT valid (AD-Mux only)
—
5.5
ns
—
R15
tGLTV
OE# low to WAIT valid
—
5.5
ns
—
R16
tGLTX
OE# low to WAIT in low-Z
0
—
ns
3
R17
tGHTZ
OE# high to WAIT in high-Z (non-mux only)
0
7
ns
3
—
ns
—
—
ns
—
96
ns
—
Latching Specifications
R101
tAVVH
Address setup to ADV# high
5
R102
tELVH
CE# low to ADV# high
7
R103
tVLQV
ADV# low to output valid
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 20: AC Read, 133 MHz, VCCQ = 1.7 V to 2.0 V (Sheet 2 of 2)
96 ns
Nbr.
R104
Parameter1
Symbol
Min
Max
Units
Notes
tVLVH
ADV# pulse width low
7
—
ns
—
R105
tVHVL
ADV# pulse width high
7
—
ns
—
R106
tVHAX
Address hold from ADV# high
5
—
ns
—
R107
tVHGL
ADV# high to OE# low (AD-Mux only)
2
—
ns
—
R108
tAPA
Page address access (non-mux only)
—
15
ns
—
R111
tPHVH
RST# high to ADV# high
30
—
ns
—
Clock Specifications
R200
fCLK
CLK frequency
R201
tCLK
CLK period
R202
tCH/CL
R203
tFCLK/RCLK
—
133
MHz
—
7.5
—
ns
—
CLK high/low time
0.45
0.55
CLK
Period
4
CLK fall/rise time
0.3
1.2
ns
—
2
—
ns
—
Synchronous Specifications
R301
tAVCH
Address setup to CLK high
R302
tVLCH
ADV# low setup to CLK high
R303
tELCH
CE# low setup to CLK high
R304
tCHQV
R305
tCHQX
R306
tCHAX
Address hold from CLK high
2
—
ns
—
R307
tCHTV
CLK high to WAIT valid
—
5.5
ns
—
R311
tCHVL
CLK high to ADV# Setup
2
—
ns
—
R312
tCHTX
WAIT hold from CLK high
2
—
ns
—
R313
tCHVH
ADV# hold from CLK high
2
—
ns
—
R314
tCHGL
CLK to OE# low (AD-Mux only)
2
—
ns
—
R315
tACC
Read access time from address latching clock
96
—
ns
—
R316
tVLVH
ADV# pulse width low for sync reads
1
2
clks
—
R317
tVHCH
ADV# high to CLK high
2
—
ns
—
2
—
ns
—
2.5
—
ns
—
CLK to output valid
—
5.5
ns
—
Output hold from CLK high
2
—
ns
—
Notes:
1.
See Figure 18, “AC Input/Output Reference Waveform” on page 48 for timing measurements and
maximum allowable input slew rate.
2.
OE# may be delayed by up to tELQV – tGLQV after CE#’s falling edge without impact to tELQV.
3.
Sampled, not 100% tested.
7.2.1
Read Timing Waveforms
The following sections show the timing waveforms for Asynchronous and Synchronous
read specifications for Non-Mux and AD-Mux M18 devices.
The Synchronous read timing waveforms apply to both the 108 and 133 MHz devices.
However please note that M18 devices which only support up to 108 MHz need not
meet the R313 to R317 timing specifications.
Datasheet
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Please note that the WAIT signal polarity in all the timing waveforms is low-true
(RCR10 = 0). WAIT is shown as de-asserted with valid data (RCR8 = 0). WAIT is deasserted during asynchronous reads.
Table 21: List of Read Timing waveforms
M18 Device
Description
Async Page-Mode Read
Synchronous 8- or 16-word Burst Read
Non-Mux
Synchronous Continuous Mis-aligned Burst Read
Synchronous Burst with Burst-Interrupt
Async Single-Word Read
Synchronous 8- or 16-word Burst Read
ADMux
Synchronous Continuous Mis-aligned Burst Read
Synchronous Burst with Burst-Interrupt
7.2.2
Timings: Non-Mux Device, Async Read
Figure 21: Async Page-Mode Read (Non-Mux)
R1
R2
R106
A[MAX:4]
A[3:0]
R101
R111
R105
R104
R103
ADV#
R102
R11
R13
R3
CE#
R4
R17
OE#
R12
R15
R16
WAIT
R9
R8
R7
R108
R10
R6
R108
R10
R108
R10
R10
DQ[15:0]
R5
RST#
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.2.3
Timings: Non-Mux Device, Sync Read
Figure 22: Sync Single-Word Array/Non-Array Read, 108 MHz
Latency Count
R301
R306
CLK [C]
R2
Address [A]
R101
R106
R105
R104
ADV# [V]
R303
R102
R3
CE# [E]
R7
OE# [G]
R16
R307
R13
WAIT [T]
R4
R304
R305
R8
R9
Data [D/Q]
Figure 23: Synchronous 8- or 16-word Burst Read (Non-Mux)
R1
Latency Count
R201
R202
R202
CLK
R306
R302
A[MAX:0]
R301
R101
R106
R317
R104
R316
R311
R105
R313
ADV#
R11
R102
R303
CE#
OE#
R16
R307
R307
R312
R15
R12
R13
R17
WAIT
R315
R304
R7
R4
R103
R3
R2
R8
R305
R304
R305
R304
R9
DQ[15:0]
R111
R5
RST#
Notes:
1.
8-word and 16-word burst are always wrap-only.
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2.
3.
R2, R3 and R103 apply to legacy-latching only; R315 and R316 apply to clock-only latching only.
For legacy-latching (ADV# OR CLK latching), ADV# can be held low throughout the synchronous read operation.
.
Figure 24: Synchronous Continuous Mis-aligned Burst (Non-Mux)
R1
Latency Count
R201
R202
R202
CLK
R306
R302
A[MAX:0]
R301
R101
R105
R106
R317
R104
R316
R311
R313
ADV#
R102
R303
R11
CE#
OE#
R12
R15
R307
R307
R312
R307
R312
R13
R16
R17
WAIT
R315
R4
R103
R7
R6
R10
R10
R9
R305
R304
R8
R304
R305
R304
R2
R3
DQ[15:0]
Q
Q
Q
End of WL
Q
Q
Q
R111
R5
RST #
Notes:
1.
R2, R3 and R103 apply to legacy-latching only; R315 and R316 apply to clock-only latching only.
2.
For legacy-latching (ADV# OR CLK latching), ADV# can be held low throughout the synchronous read operation.
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Numonyx™ StrataFlash® Cellular Memory (M18)
.
Figure 25: Sync Burst with Burst-Interrupt (Non-Mux)
R202
Latency Count
R1
R201
R202
CLK
R302
R306
R302
R306
A[MAX:0]
R301
R101
R301
R101
R10
R106
R317
R313
R313
R311
R104
R316
R311
R105
R104
R316
ADV#
R303
R102
R11
R102
R303
CE#
OE#
R12
R307
R312
R307
R16
R15
WAIT
R315
R7
R4
R103
R6
R304
R304
R305
R2
R3
DQ[15:0]
Q
R305
Q
Q
Q
R111
R5
RST#
Notes:
1.
R2, R3 and R103 apply to legacy-latching only; R315 and R316 apply to clock-only latching only
2.
For legacy-latching (ADV# OR CLK latching), ADV# can be held low throughout the synchronous read operation.
3.
A burst can be interrupted by toggling CE# or ADV#. If ADV# interrupts burst, then R105 applies.
Datasheet
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7.2.4
Timings: AD-Mux Device, Async Read
Figure 26: Async Single-Word Read (AD-Mux)
R1
R1
R2
A[MAX:16]
R2
A
A
R7
A/DQ[15:0]
R7
A
Q
A
R101
R101
Q
R106
R106
R111
R103
R104
R104
R105
R103
ADV#
R10
R8
R11
R102
R3
R102
R10
R8
R3
CE#
R4
R107
R4
R9
R107
R9
OE#
R12
R13
R12
R13
WAIT
R5
RST#
Note:
Diagram shows back-to-back read operations.
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.2.5
Timings: AD-Mux Device, Sync Read
.
Figure 27: Synchronous 8- or 16-word burst read (AD-Mux)
R1
R201
Latency Count
R202
R202
CLK
A[MAX:16]
A
A
R315
R302
R306
R304
R305
R304
R302
R2
A/DQ[15:0]
A
Q
Q
R306
Q
A
R313
R313
R301
R101
R301
R101
R106
R317
R10
R104
R104
R311
R103
R311
R316
R105
R316
ADV#
R303
R102
R3
R11
R303
R102
CE#
R7
R107
R314
R10
R9
R4
OE#
R307
R15
R16
R12
WAIT
R111
R5
RST#
Notes:
1.
8-word and 16-word burst are always wrap-only.
2.
R2, R3 and R103 apply to legacy-latching only; R315 and R316 apply to clock-only latching only.
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Figure 28: Synchronous Continuous Mis-Aligned Burst (AD-Mux)
R1
Latency Count
R201
R202
R202
CLK
A[MAX:16]
A
R306
R315
R304
R305
R2
R302
R304
R305
R304
A/DQ[15:0]
A
Q
Q
Q
R104
R301
R101
End of WL
Q
Q
Q
R105
R106
R317
R316
R103
R311
R313
ADV#
R102
R11
R8
R10
R3
R303
CE#
R107
R314
R7
R10
R9
R4
OE#
R307
R307
R312
R15
R16
R12
R307
R312
R13
R14
WAIT
R111
R5
RST#
Note:
R2, R3 and R103 apply to legacy-latching only; R315 and R316 apply to clock-only latching only.
Figure 29: Synchronous Burst with Burst-Interrupt (AD-Mux)
R1
R201
Latency Count
R202
R202
CLK
A[MAX:16]
A
A
R315
R302
R306
R304
R305
R304
R2
A/DQ[15:0]
R302
A
Q
Q
R306
Q
A
R313
R313
R301
R101
R301
R101
R10
R106
R317
R104
R104
R103
R311
R311
R316
R316
R105
ADV#
R303
R102
R3
R11
R303
R102
CE#
R7
R107
R314
R10
R9
R4
OE#
R307
R15
R16
R12
WAIT
R111
R5
RST#
Notes:
1.
R2, R3 and R103 apply to legacy-latching only (ADV# OR CLK latching); R315 and R316 apply to clock-only latching only
2.
A burst can be interrupted by toggling CE# or ADV#.
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.3
Write Specifications
The M18 device includes specifications for different lithographies, densities, and
frequencies. For additional information on combinations, see Table 4, “M18 Product
Litho/Density/Frequency Combinations” on page 10 in the Section 2.0, “Functional
Description.
Table 22: AC Write Specifications
Number
Symbol
Parameter
(1, 2)
Min
Max
Units
Notes
150
—
ns
1,2,3
W1
tPHWL
RST# high recovery to WE# low
W2
tELWL
CE# setup to WE# low
0
—
ns
1,2
W3
tWLWH
WE# write pulse width low
40
—
ns
1,2,4
W4
tDVWH
Data setup to WE# high
40
—
ns
W5
tAVWH
Address setup to WE# high
40
—
ns
W6
tWHEH
CE# hold from WE# high
0
—
ns
W7
tWHDX
Data hold from WE# high
0
—
ns
W8
tWHAX
Address hold from WE# high (non-mux only)
W9
tWHWL
WE# pulse width high
W10
tVPWH
VPP setup to WE# high
W11
tQVVL
VPP hold from Status read
W12
tQVBL
WP# hold from Status read
W13
tBHWH
WP# setup to WE# high
W14
tWHGL
WE# high to OE# low
W15
tVLWH
ADV# low to WE# high (AD-Mux only)
W16
tWHQV
WE# high to read valid
0
—
ns
20
—
ns
200
—
ns
0
—
ns
0
—
ns
200
—
ns
1,2
1,2,5
1,2,3,7
0
—
ns
1,2,8
55
—
ns
1,2
tAVQV +30
—
ns
1,2,3,9
Write to Synchronous Read Specifications
W19
tWHCH
WE# high to Clock high
15
—
ns
1,2,3,6,9
W27
tWHEL
WE# high to CE# low
9
—
ns
1,2,3,6,9
W28
tWHVL
WE# high to ADV# low
7
—
ns
1,2,3,6,9
Bus Write with Active Clock Specifications
W21
tVHWL
ADV# high to WE# low
—
27
ns
W22
tCHWL
Clock high to WE# low
—
27
ns
Notes:
1.
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
1,2,10,11
Write timing characteristics during erase suspend are the same as write-only operations.
A write operation can be terminated with either CE# or WE#.
Sampled, not 100% tested.
Write pulse width low (tWLWH or tELEH) is defined from CE# or WE# low (whichever occurs last) to CE# or WE# high
(whichever occurs first). Hence, tWLWH = tELEH = tWLEH = tELWH.
Write pulse width high (tWHWL or tEHEL) is defined from CE# or WE# high (whichever occurs first) to CE# or WE# low
(whichever occurs last). Hence, tWHWL = tEHEL = tWHEL = tEHWL).
tWHCH must be met when transitioning from a write cycle to a synchronous burst read. In addition there must be a CE#
toggle after WE# goes high.
VPP and WP# should be at a valid level until erase or program success is determined.
When doing a Read Status operation following any command that alters the Status Register data, W14 is 20ns.
Add 10ns if the write operations results in a RCR or block lock status change, for the subsequent read operation to reflect
this change.
This specification is applicable only if the part is configured in synchronous mode and an active clock is running. Either
tVHWL or tCHWL must be met depending on the whether the address is latched on ADV# or CLK.
These specifications are not applicable to 133 MHz devices.
Datasheet
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7.3.1
Write Timing Waveforms
The following sections show the timing waveforms for write specifications and write-toread and read-to-write transitions for Non-Mux and AD-Mux M18 devices.
The Synchronous read timings apply to both the 108 and 133 MHz devices. However
please note that M18 devices which only support up to 108 MHz need not meet the
R313 to R317 timing specifications.
Please note that the WAIT signal polarity in all the timing waveforms is low-true
(RCR10 = 0). WAIT is de-asserted during asynchronous reads.
Table 23: List of Write Timing waveforms
M18 Device
Description
Write to Write
Async Read to Write
Non-Mux
Write to Async Read
Sync Read to Write
Write to Sync Read
Write to Write
Async Read to Write
ADMux
Write to Async Read
Sync Read to Write
Write to Sync Read
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.3.2
Timings: Non Mux Device
Figure 30: Write to Write (Non-Mux)
W5
W8
W5
W8
Addres s [A]
ADV#
W2
W6
W2
W6
CE# [E}
W3
W9
W3
WE# [W]
OE# [G]
W7
W7
W4
W4
Data [D/Q]
W1
RST# [P]
W13
WP#
Figure 31: Async Read to Write (Non-Mux)
Address [A]
A
A
R105
ADV# [V]
R11
CE# [E]
OE# [G]
W6
W2
W3
W15
WE# [W]
R4
R10
R8
R9
R2
R3
D/Q[15:0]
Q
R15
W7
W4
D
R17
WAIT [T]
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Figure 32: Write to Async Read (Non-Mux)
Address [A]
Write Adr
Read Adr
ADV# [V]
W2
R11
CE# [E]
W5
W6
W3
W8
WE# [W]
W14
OE# [G]
R15
High-Z
WAIT [T]
R17
R4
R3
R2
W7
W4
R10
R8
W16
R9
D
Data [D/Q]
Q
.
Figure 33: Sync Read to Write (Non-Mux)
R311
R313
W22
CLK [C]
R301
R306
W5
Address [A]
R303
R11
CE# [E]
R302
R316
R105
ADV# [V]
W3
WE# [W]
OE# [G]
R305
R304
R304
Data [D/Q]
WAIT [T]
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Q0
High-Z
R307
R305
W4
Q1
W7
D
High-Z
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 34: Write to Sync Read (Non-Mux)
W19
R302
R303
CLK
R301
Address [A]
Wrt Addr
Rd Addr
R311
R105
R313
ADV# [V]
W9
R11
W27
CE# [E]
W3
W22
W28
WE# [W]
W14
OE# [G]
W7
W4
Data [D/Q]
R304
D
R304
R305
Q0
R304
R305
Q1
R305
Q2
R307
R15
WAIT [T]
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7.3.3
Timings: AD-Mux Device
Figure 35: Write to Write (AD-Mux)
A[max-16] [A]
W5
W4
R101
A/DQ[15-0] [A/D]
W7
A
D
A
R106
D
W15
ADV# [v]
W2
W6
W2
W6
CE# [E]
W3
W9
W3
WE# [W]
OE# [G]
W1
RST# [P]
W13
WP#
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 36: Async Read to Write (AD-Mux)
A[Max:16]
A
A
A/DQ[15:0]
A
R2
R10
Q
R101
A
D
R105
ADV# [V]
R8
R11
R3
CE# [E]
R4
R107
R9
OE# [G]
W7
W3
W4
W15
WE# [W]
R12
R13
R12
R13
WAIT [T]
Figure 37: Write to Async Read (AD-Mux)
W5
A[Max:16]
A
A
W4
W7
A/DQ[15:0]
A
R2
D
A
Q
R11
W6
R3
R8
CE# [E]
R105
W15
ADV# [V]
W2
W3
WE# [W]
R4
R107
W14
R9
OE# [G]
R12
R12
R13
R13
WAIT [T]
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Figure 38: Sync Read to Write (AD-Mux)
R311
R313
W22
CLK [C]
R301
A[Max:16]
R306
W5
A
A
R305
R304
R304
A/DQ[15:0]
A
Q0
R305
Q1
R303
A
D
R11
CE# [E]
R302
R316
W15
ADV# [V]
W7
W4
WE# [W]
OE# [G]
R307
High-Z
WAIT [T]
High-Z
Notes:
1.
CLK may be stopped during write cycle.
2.
W22 is the time between the Address-latching-CLK and WE#. In case of ADV#-latching, W21 must be met instead.
Figure 39: Write to Sync Read (AD-Mux)
W19
CLK
W5
A[Max:16]
A
A/DQ[15:0]
A
A
W4
W7
D
R304
A
R305
R304
Q0
R305
R304
Q1
R305
Q2
R307
R15
WAIT [T ]
R105
W15
W28
ADV# [V]
R11
CE# [E]
W3
W22
W27
WE# [W]
W14
OE# [G]
Note:
CLK may be stopped during write cycle.
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.4
Program and Erase Characteristics
The M18 device includes specifications for different lithographies, densities, and
frequencies. For additional information on combinations, see Table 4, “M18 Product
Litho/Density/Frequency Combinations” on page 10 in the Section 2.0, “Functional
Description.
Table 24: Program-Erase Characteristics
VPPL/V PPH
Nbr.
Symbol
Parameter
Litho (nm)
Density
(Mbit)
Min
Typ
Max
Single word (first
word)
—
—
—
115
230
Single word
(subsequent word)
—
—
—
50
230
Single word
—
—
—
250
500
2.15
4.3
Unit
Notes
µs
1,2
Conventional Word Programming
W200
tPROG/W
Program
Time
Buffered Programming
W200
W250
tPROG/W
tPROG/PB
Program
Time
One Buffer (512
words)
90
256, 512
65
128, 256, 512,
1024
90
256, 512
—
µs
ms
1.02
1
2.05
Buffered Enhanced Factory Programming
W451
W452
tBEFP/W
Program
Time
Single word
4.2
—
—
65
128, 256, 512
Buffered EFP Setup
—
—
5
—
—
Erase
Time
128-Kword Main
Array Block
—
—
—
0.9
4
Suspen
d
Latency
Program suspend
—
—
—
20
30
Erase suspend
—
—
—
20
30
Main array block
—
—
—
3.2
—
tBEFP/
Setup
2.0
1,3,4
µs
1
Erasing and Suspending
W501
tERS/MAB
W600
tSUSP/P
W601
tSUSP/E
s
µs
1
1
1
Blank Check
W702
tBC/MB
Blank
Check
ms
1
Notes:
1.
Typical values measured at TC = +25 °C and nominal voltages. Performance numbers are valid for all speed versions.
Sampled, but not 100% tested.
2.
First and subsequent words refer to first word and subsequent words in Control Mode programming region.
3.
Averaged over entire device.
4.
BEFP not validated at VPPL.
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
7.5
Reset Specifications
Table 25: Reset Specifications
Nbr.
Symbol
P1
tPLPH
P2
tPLRH
P3
tVCCPH
Notes:
1.
2.
3.
4.
5.
6.
7.
Parameter
Min
RST# pulse width low
Max
Unit
Notes
ns
1,2,3,4,7
100
RST# low to device reset during erase
—
25
RST# low to device reset during program
—
25
300
—
VCC Power valid to RST# de-assertion (high)
1,3,4,7
µs
1,3,4,7
1,4,5,6
These specifications are valid for all device versions (packages and speeds).
The device may reset if tPLPH is < tPLPH MIN, but this is not guaranteed.
Not applicable if RST# is tied to Vccq.
Sampled, but not 100% tested.
If RST# is tied to the VCC supply, device will not be ready until tVCCPH after VCC ≥ VCC min.
If RST# is tied to any supply/signal with VCCQ voltage levels, the RST# input voltage must not exceed VCC until VCC ≥
VCC(min).
Reset completes within tPLPH if RST# is asserted while no erase or program operation is executing.
Figure 40: Reset Operation Timing
P1
(A) Reset during
read mode
RST# [P]
R5
VIH
VIL
Abort
Complete
P2
(B) Reset during
program or block erase
P1 ≤ P2
RST# [P]
VIL
P2
(C) Reset during
program or block erase
P1 ≥ P2
R5
VIH
RST# [P]
Abort
Complete
R5
VIH
VIL
P3
(D) VCC Power-up to
RST# high
7.6
VCC
VCC
0V
Deep Power Down Specifications
Table 26: Deep Power Down Specifications (Sheet 1 of 2)
Nbr.
S1
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Symbol
tSLSH (tSHSL)
Parameter
DPD asserted pulse width
Min
Max
Unit
Notes
100
—
ns
1,2,3
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 26: Deep Power Down Specifications (Sheet 2 of 2)
Nbr.
Symbol
S2
tEHSH (tEHSL)
CE# high to DPD asserted
0
—
1,2
S3
tSHEL (tSLEL)
DPD deasserted to CE# low
75
—
1,2
tPHEL
RST# high during DPD state to CE# low (DPD
deasserted to CE# low)
75
—
S4
Parameter
Min
Max
Unit
µs
Notes
1,2
Notes:
1.
These specifications are valid for all device versions (packages and speeds).
2.
Sampled, but not 100% tested.
3.
DPD must remain asserted for the duration of Deep Power Down mode. DPD current levels are achieved 40 µs after
entering the DPD mode.
Figure 41: Deep Power Down Operation Timing
S2
S1
DPD [S]
S3
CE# [E]
RST# [P]
Note:
DPD pin is low-true (ECR14 = 0)
Figure 42: Reset During Deep Power Down Operation Timing
RST# [P]
S2
DPD [S]
S4
CE# [E]
Note:
DPD pin is low-true (ECR14 = 0)
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8.0
NOR Flash Bus Interface
The flash device uses low-true control signal inputs, and is selected by asserting the
chip enable (CE#) input. The output enable (OE#) input is asserted for read
operations, while the write enable (WE#) input is asserted for write operations. OE#
and WE# should never be asserted at the same time; otherwise, indeterminate device
operation will result. All bus cycles to or from the flash memory conform to standard
microcontroller bus cycles.
Commands are written to the device to control all operations.
Table 27 shows the logic levels that must be applied to the control-signal inputs of the
device for the various bus operations.
Table 27: Flash Memory Control Signals
Operation
RST#
DPD2
CE#1
OE#1
WE# 1
Address1
Data I/O
Reset
Low
High
X
X
X
X
High-Z
Read
High
High
Low
Low
High
Valid
Output
Output Disable
High
High
Low
High
High
X
High-Z
High
High
Low
High
Valid
Input
High
High
Standby
High
High
Deep Power-Down
High
Low
Write
High
Low
Valid
Input
High
X
X
X
High-Z
High
X
X
X
High-Z
Notes:
1.
X = Don’t care (High or Low)
2.
DPD polarity determined by ECR14. Shown low-true here.
8.1
Bus Reads
To perform a read operation, both CE# and OE# must be asserted; #RST# and WE#
must be deasserted. OE# is the data-output control and when asserted, the output
data is driven on to the data I/O bus. All read operations are independent of the
voltage level on VPP.
The Automatic Power Savings (APS) feature provides low power operation following
reads during active mode. After data is read from the memory array and the address
lines are quiescent, APS automatically places the device into standby. In APS, device
current is reduced to ICCAPS.
The device supports two read configurations:
• Asynchronous reads. RCR15 = 1. This is the default configuration after power-up/
reset.
— Non-multiplexed devices support asynchronous page-mode reads. ADMultiplexed devices support only asychronous single-word reads.
• Synchronous Burst reads. RCR15 = 0.
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8.1.1
Asynchronous single-word reads
In asynchronous single-word read mode, a single word of data corresponding to the
address is driven onto the data bus after the initial access delay. The address is latched
when ADV# is deasserted. For AD-multiplexed devices, ADV# must be deasserted
before OE# is asserted.
If only asynchronous reads are to be performed, CLK must be tied to a valid VIH or VIL
level, and the WAIT signal can be floated. In addition, for non-multiplexed devices,
ADV# must be tied to ground.
8.1.2
Asynchronous Page Mode (Non-multiplexed devices only)
In asynchronous page mode, sixteen data words are “sensed” simultaneously from the
flash memory array and loaded into an internal page buffer. The buffer word
corresponding to the initial address is driven onto the data bus after the initial access
delay. Subsequent words in the page are output after the page access delay. A[3:0]
bits determine which page word is output during a read operation. A[MAX:4] and ADV#
must be stable throughout the page access.
WAIT is deasserted during asynchronous page mode. ADV# can be driven high to latch
the address, or held low throughout the read cycle. CLK is not used for asynchronous
page-mode reads, and is ignored.
8.1.3
Synchronous Burst Mode
Synchronous burst mode is a clock-synchronous read operation that improves the read
performance of flash memory over that of asynchronous reads.
Synchronous burst mode is enabled by programming the Read Configuration Register
(RCR) of the flash memory device. The RCR is also used to configure the burst
parameters of the flash device, including Latency Count, burst length of 8, 16 and
continuous, and WAIT polarity.
Three additional signals are used for burst mode: CLK, ADV#, and WAIT.
The address for synchronous read operations is latched on the ADV# rising edge or the
first rising CLK edge after ADV# low, whichever occurs first for devices that support up
to 108 MHz. For devices that support up to 133 MHz, the address is latched on the last
CLK edge when ADV# is low.
During synchronous read modes, the first word is output from the data buffer on the
rising CLK edge after the initial access latency delay. Subsequent data is output on
rising CLK edges following a tCHQV delay. However, for a synchronous non-array read,
the same word of data will be output on successive rising clock edges until the burst
length requirements are satisfied.
8.1.3.1
WAIT Operation
Upon power up or exit from reset, WAIT polarity defaults to low-true operation (RCR10
= 0). During synchronous reads (RCR15 = 0), WAIT asserts when read data is invalid,
and deasserts when read data is valid. During asynchronous reads (RCR15 = 1), WAIT
is deasserted. During writes, WAIT is High-Z on non-mux devices, and deasserted on
AD-mux devices. Table 28 summarizes WAIT behavior.
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Table 28: WAIT Behavior Summary
Device Operation
Device not selected
Non-Mux Device
Standby
WE#
WAIT
X
X
High-Z
High
High
High-Z
Sync Read
Low
High
Active
Async Read
Low
High
Deasserted
High
Low
High-Z
High
High
Deasserted
Sync Read
Low
High
Active
Async Read
Low
High
Deasserted
Write
High
Low
Deasserted
Output Disable
High
OE#
Output Disable
Write
AD-Mux Device
CE#
Low
Notes
1
2
2
Notes:
1.
X = don’t care (high or low).
2.
Active: WAIT asserted = invalid data; WAIT deasserted = valid data.
8.2
Bus Writes
To perform a write operation, both CE# and WE# are asserted while RST# and OE# are
deasserted. All device write operations are asynchronous, with CLK being ignored, but
CLK can be kept active/toggling. During a write operation in non-muxed devices,
address and data are latched on the rising edge of WE# or CE#, whichever occurs first.
During a write operation in muxed devices, address is latched during the rising edge of
ADV# OR CE# whichever occurs first and Data is latched during the rising edge of WE#
OR CE# whichever occurs first.
8.3
Reset
The device enters a reset mode when RST# is asserted. In reset mode, internal
circuitry is turned off and outputs are placed in a high-impedance state. The device
shuts down any operation in progress, a process which takes a minimum amount of
time to complete.
To return from reset mode, RST# must be deasserted. Normal operation is restored
after a wake-up interval.
8.4
Deep Power-Down
The device enters DPD mode when the following two conditions are met: ECR15 is
set(1) and DPD is asserted. The two conditions can be satisfied in any order. ECR14 bit
determines the DPD asserted logic level. While in this mode, RST# and CE# must be
deasserted.
The device exits DPD mode when DPD is deasserted. There is an exit latency before the
device returns to standby mode and any operations are allowed. See the datasheet for
the timing specifications.
The device should not be placed in DPD mode when a program/erase operation is
ongoing or suspended. If the device enters DPD mode in the middle of a program,
erase or suspend, the operation is terminated and the memory contents at the aborted
location (for a program) or block (for an erase) are no longer valid.
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Numonyx™ StrataFlash® Cellular Memory (M18)
While in DPD mode, the read-mode of each partition, configuration registers (RCR and
ECR), and block lock bits, are preserved. Status register is reset to 0080h; i.e., if the
Status register contains error bits, they will be cleared.
8.5
Standby
When CE# is deasserted, the device is deselected and placed in standby, substantially
reducing power consumption. In standby, data outputs are placed in high-Z,
independent of the level placed on OE#. If deselected during a Program or Erase
operation, the device continues to consume active power until the operation is
complete. There is no additional latency for subsequent read operations.
8.6
Output Disable
When OE# is deasserted with CE# asserted, the device outputs are disabled. Output
pins are placed in a high-impedance state. WAIT is deasserted in AD-muxed devices
and driven to High-Z in non-multiplexed devices.
8.7
Bus Cycle Interleaving
When issuing commands to the device, a read operation can occur between the two
write cycles of a 2-cycle command. (See Figure 43 and Figure 44) However, a write
operation cannot occur between the two write cycles of a 2-cycle command and will
cause a command sequence error (See Figure 45).
Figure 43: Operating Mode with Correct Command Sequence Example
Address [A]
Partition A
Partition A
Partition B
WE# [W]
OE# [G]
Data [D/Q]
0x20
0xD0
0xFF
Figure 44: Operating Mode with Correct Command Sequence Example
Address [A]
Partition A
Partition B
Partition A
WE# [W]
OE# [G]
Data [D/Q]
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0x20
Valid Array Data
0xD0
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Figure 45: Operating Mode with Illegal Command Sequence Example
Address [A]
Partition A
Partition B
Partition A
Partition A
WE# [W]
OE# [G]
Data [D/Q]
8.7.1
0x20
0xFF
0xD0
SR[7:0]
Read Operation During Program Buffer fill
Due to the large buffer size of devices, the system interrupt latency may be impacted
during the buffer fill phase of a buffered programming operation. Please refer to the
relevant Application Note listed in Section 1.4, “Additional Information” on page 7 to
implement a software solution for your system.
8.8
Read-to-Write and Write-to-Read Bus Transitions
Consecutive read and write bus cycles must be properly separated from each other to
avoid bus contention. These cycle separation specs are described in the sections below.
8.8.1
Write to Asynchronous read transition
To transition from a bus write to an asynchronous read operation, either CE# or ADV#
must be toggled after WE# goes high.
8.8.2
Write to synchronous read transition
To transition from a bus write to a synchronous read operation, either CE# or ADV#
must be toggled after WE# goes high. In addition, W19 (tWHCH -WE# high to CLK high)
must be met.
8.8.3
Asynchronous/Synchronous read to write transition
To transition from a asynchronous/synchronous read to a write operation, either CE# or
ADV# must be toggled after OE# goes high.
8.8.4
Bus write with active clock
To perform a bus write when the device is in synchronous mode and the clock is active,
W21 (tVHWL- ADV# High to WE# Low) or W22 (tCHWL -Clock high to WE# low) must be
met.
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9.0
NOR Flash Operations
This section describes the operational features of NOR flash memory. Operations are
command-based—command codes are first issued to the device, and then the device
performs the desired operation. All command codes are issued to the device using buswrite cycles as explained in Section 3.0, “NOR Flash Bus Interface” on page 10. A
complete list of available command codes can be found in Section 5.0, “Device
Command Codes” on page 40.
9.1
Status Register
The Status Register (SR) is a 16-bit, read-only register that indicates device and
partition status, and operational errors. To read the Status Register, issue the Read
Status Register command. Subsequent reads output Status Register information on
AD/DQ[15:10].
SR status bits are set and cleared by the device. SR error bits are set by the device,
and must be cleared using the Clear Status Register command. Upon power-up or exit
from reset, the Status Register defaults to 0080h.
Table 29: Status Register Bit Definitions (Sheet 1 of 2)
Status Register (SR) Bits
Default Value = 0080h
Reserved
Region
Program
Status
Ready
Status
Erase
Suspend
Status
Erase
Error
Program
Error
Program
/Erase
Voltage
Error
Program
Suspend
Status
BlockLocked
Error
Partition
Status
15-10
9-8
7
6
5
4
3
2
1
0
Bit
15-10
Name
Reserved
Description
Reserved for future use; these bits will always be set to zero.
SR9
0
1
9-8
Region Program Status
0
1
SR8
0 = Region program successful.
0 = Region program error - Attempted write with object data to Control
Mode region.
1 = Region program error - Attempted rewrite to Object Mode region.
1 = Region program error - Attempted write using illegal command.
SR4 will also be set along with SR[8,9] for the above error
conditions.
7
Ready Status
0
1
= Device is busy; SR[9:8], SR[6:1] are invalid;
= Device is ready; SR[9:8], SR[6:1] are valid.
6
Erase Suspend Status
0
1
= Erase suspend not in effect.
= Erase suspend in effect.
5
Erase
Error /
Blank
Check
Error
4
Program
Error
3
V PP Error
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76
Command
Sequence Error
SR5
0
0
1
1
0
1
SR4
0 =
1 =
0 =
1 =
Program or erase operation successful.
Program error - operation aborted.
Erase error: operation aborted / Blank check error: operation failed.
Command sequence error - command aborted.
= VPP within acceptable limits during program or erase operation.
= VPP not within acceptable limits during program or erase operation.
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Table 29: Status Register Bit Definitions (Sheet 2 of 2)
Status Register (SR) Bits
Default Value = 0080h
Reserved
Region
Program
Status
Ready
Status
Erase
Suspend
Status
Erase
Error
Program
Error
Program
/Erase
Voltage
Error
Program
Suspend
Status
BlockLocked
Error
Partition
Status
15-10
9-8
7
6
5
4
3
2
1
0
Bit
Name
Description
2
Program Suspend Status
0
1
= Program suspend not in effect.
= Program suspend in effect.
1
Block-Locked Error
0
1
= Block NOT locked during program or erase - operation successful.
= Block locked during program or erase - operation aborted.
SR7
0
0
Partition Status
0
1
1
9.1.1
SR0
0 = Active program or erase operation in addressed partition.
BEFP: Program or Verify complete, or Ready for data.
1 = Active program or erase operation in other partition.
BEFP: Program or Verify in progress.
0 = No active program or erase operation in any partition.
BEFP: Operation complete
1 = Reserved.
Clearing the Status Register
The Status Register (SR) contain status and error bits which are set by the device. SR
status bits are cleared by the device; however, SR error bits are cleared by issuing the
Clear Status Register command. Resetting the device also clears the Status Register.
Table 30: Clear Status Register Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Clear Status Register
Device Address
Data Bus
0050h
Address Bus
---
Data Bus
---
Depending on the current state of the partition, issuing the Clear Status Command will
place the addressed partition in Read Status mode. Please see 'Next State' Table for
further details. Other partitions are not affected.
Note:
Care should be taken to avoid Status Register ambiguity. If a command sequence error
occurs while in an Erase Suspend condition, the Status Register will indicate a
Command Sequence error by setting SR4 and SR5. When the erase operation is
resumed (and finishes), any errors that may have occurred during the erase operation
will be masked by the Command Sequence error. To avoid this situation, clear the
Status Register prior to resuming a suspended erase operation.
The Clear Status Register command functions independent of the voltage level on VPP.
9.2
Read Configuration Register
The Read Configuration Register (RCR) is a 16-bit read/write register used to select
bus-read modes, and to configure synchronous-burst read characteristics of the flash
device. All Read Configuration Register bits are set and cleared using the Program Read
Configuration Register command.
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Upon power-up or exit from reset, the Read Configuration Register defaults to
asynchronous mode (RCR15 = 1; RCR[14:11] and RCR[9:0] are ignored).
To read the RCR value, issue the Read Device Information command to the desired
partition. Subsequent reads from the <partition base address> + 05h will output
RCR[15:0] on the data bus.
When using a Latency Count of Code 2 and a Data Hold of two cycles (CR9 = 1), WAIT
must be configured to deassert with valid data (CR8 = 0).
Table 31: Read Configuration Register Bit Definitions
Read Configuration Register (RCR)
Read
Mode
15
Latency Count
14
13
Bit
15
Default: CR15 = 1
12
WAIT
Polarity
R
WAIT
Delay
Reserved
10
9
8
7:3
11
Name
Read Mode
Burst Length
2
1
0
Description
0 = Synchronous burst-mode reads
1 = Asynchronous page-mode reads (default)
Bits:
14:11
Latency Count
14 13 12 11
0 0 1 1 =
0 1 0 0 =
0 1 0 1 =
0 1 1 0 =
0 1 1 1 =
1 0 0 0 =
1 0 0 1 =
1 0 1 0 =
1 0 1 1 =
1 1 0 0 =
(Other bit settings are
10
WAIT Polarity
0
1
9
Reserved
Write 0 to reserved bits
8
WAIT Delay
0
1
7:3
Reserved
2:0
9.2.1
Burst Length
3
4
5
6
7
8
9
10
11
12
reserved)
= WAIT signal is active low (default)
= WAIT signal is active high
= WAIT de-asserted with valid data
= WAIT de-asserted one cycle before valid data (default)
Write 0 to reserved bits
0
0
1
1
1
1
0
1
1
= 8-word burst (wrap only)
= 16-word burst (wrap only)
= Continuous-word burst (no-wrap; default) (Other bit settings
are reserved)
Latency Count
The Latency Count value programmed into RCR[14:11] is the number of valid CLK
edges from address-latch to the start of the data-output delay. When the Latency
Count has been satisfied, output data is driven after tCHQV.
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Figure 46: Latency Count Period
Latency Count
CLK Latch (1)
CLK
ADV# (1)
ADV#-Latch (2)
ADV# (2)
A[Max:0]
CE#
OE#
tCHQV
DQ[15:0]
Notes:
1.
Address latched on valid clock edge with ADV# low and LC count begins.
2.
Address latched on ADV# rising edge. LC count begins on subsequent valid CLK edge.
Table 32: CLK Frequencies for LC Settings
VCCQ = 1.7 V to 2.0 V
Latency Count Setting
3
Frequency Supported (MHz)
≤ 32.6 MHz
4
≤ 43.5 MHz
5
≤ 54.3 MHz
6
≤ 65.2 MHz
7
≤ 76.1 MHz
8
≤ 87 MHz
9
≤ 97.8 MHz
10
≤ 108.7 MHz
11
≤ 119.6 MHz
12
≤ 130.4 MHz
13
≤ 133.3 MHz
9.3
Enhanced Configuration Register
The Enhanced Configuration Register (ECR) is a volatile 16-bit, read/write register used
to select Deep Power Down (DPD) operation and to modify the output-driver strength
of the flash device. All Enhanced Configuration Register bits are set and cleared using
the Program Enhanced Configuration Register command. Upon power-up or exit from
reset, the Enhanced Configuration Register defaults to 0004h.
To read the value of the ECR, issue the Read Device Information command to the
desired partition. Subsequent reads from the <partition base address> + 06h returns
ECR[15:0].
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Table 33: Enhanced Configuration Register Bit Definitions
Enhanced Configuration Register
Default = 0004h
Deep Power Down
(DPD) Mode
DPD Polarity
Reserved
15
14
13:3
Bit
Output Driver Control
2
Name
Deep Power Down (DPD) Mode
0
1
= DPD Disabled (default)
= DPD Enabled
14
DPD Pin Polarity
0
1
= Active Low (default)
= Active High
Reserved
0
Description
15
13:3
1
Write 0 to reserved bits
Bits:
2:0
9.3.1
Output Driver Control
2 1 0
0 0 1 = 1
0 1 0 = 2
0 1 1 = 3
1 0 0 = 4 (default)
1 0 1 = 5
1 1 0 = 6
(Other bit settings are reserved)
Output Driver Control
Output Driver Control enables the user to adjust the device’s output-driver strength of
the data I/O bus and WAIT signal. Upon power-up or reset, ECR[2:0] defaults to an
output impedance setting of 30 Ohms. To change the output-driver strength, ECR[2:0]
must be programmed to the desired setting as shown in Table 34, “Output Driver
Control Characteristics”.
Table 34: Output Driver Control Characteristics
Control Bits ECR[2:0]
Impedance @ VCCQ/2 (Ohm)
Driver Multiplier
Load Driven at Same Speed (pF)
001
(1)
90
1/3
10
010
(2)
60
1/2
15
011
(3)
45
2/3
20
100
(4) default
30
1
30
101
(5)
20
3/2
35
110
(6)
15
2
40
9.3.2
Programming the ECR
The ECR is programmed by issuing the Program Enhanced Configuration Register
command. This is a two-cycle command sequence requiring a Setup command to be
issued first, followed by a Confirm command. Bus-write cycles to the flash device
between the setup and confirm commands are not allowed—a command sequence
error will result. However, flash bus-read cycles between the Setup and Confirm
commands are allowed.
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Table 35: Program Enhanced Configuration Register Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Program Enhanced Configuration Register
Address Bus
Data Bus
Address Bus
Data Bus
Register Data
0060h
Register Data
0004h
To program the Enhanced Configuration Register, the desired settings for ECR[15:0]
are placed on the address bus. The setup command (0060h) is driven on the data bus.
Upon issuing the setup command, the device/addressed partition is automatically
changed to Read Status Register mode.
Next, the Confirm command (0004h) is driven on the data bus. After issuing the
Confirm command, the addressed partition is automatically switched to Read Array
mode.
This command functions independently of the applied VPP voltage.
Note:
Since the desired register value is placed on the address lines, any hardwareconnection offsets between the host’s address outputs and the flash device’s address
inputs must be considered, similar to programming the RCR.
9.4
Read Operations
The following types of data can be read from the device: array data, device
information, CFI data, and device status Upon power-up or return from reset, the
device defaults to Read Array mode. To change the device’s read mode, the appropriate
command must be issued to the device. Table 36, “Read Mode Command Bus Cycles”
shows the command codes used to configure the device for the desired read mode. The
following sections describe each read mode.
Table 36: Read Mode Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Data Bus
Address Bus
Data Bus
Read Array
Partition Address
00FFh
---
---
Read Status Register
Partition Address
0070h
---
---
Read Device Information
Partition Address
0090h
---
---
CFI Query
Partition Address
0098h
---
---
9.4.1
Read Array
Upon power-up or exit from reset, the device defaults to Read Array mode. Issuing the
Read Array command places the addressed partition in Read Array mode. Subsequent
reads output array data. The addressed partition remains in Read Array mode until a
different read command is issued, or a program or erase operation is performed in that
partition, in which case, the read mode is automatically changed to Read Status.
To changea partition to Read Array mode while it is programming or erasing, first issue
the Suspend command. After the operation has been suspended, issue the Read Array
command to the partition. When the program or erase operation is subsequently
resumed, the read state of the partition will not change. To change the read state of
the partition to Status read mode, issue a Read Status command to the partition.
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Note:
Issuing the Read Array command to a partition that is actively programming or erasing
causes subsequent reads from that partition to output invalid data. Valid array data is
output only after the program or erase operation has finished.
The Read Array command functions independent of the voltage level on VPP.
9.4.2
Read Status Register
Issuing the Read Status Register command places the addressed partition in Read
Status Register mode. Subsequent reads from that partition output Status Register
information. The addressed partition remains in Read Status Register mode until a
different read-mode command is issued to that partition. Performing a program, erase,
or block-lock operation also changes the partition’s read mode to Read Status Register
mode.
The Status Register is updated on the falling edge of CE#, or OE# when CE# is low.
Status Register contents are valid only when SR7 = 1.
The Read Status Register command functions independent of the voltage level on VPP.
9.4.3
Read Device Information
Issuing the Read Device Information command places the addressed partition in Read
Device Information mode. Subsequent reads output device information on the data
bus. The address offsets for reading the available device information are shown here.
Table 37: Device Information Summary
Device Information
Address Bus
Data Bus
Device Manufacturer Code (Numonyx)
Partition Base Address + 00h
0089h
Device ID Code
Partition Base Address + 01h
Device IDs
Main Block Lock Status
Block Base Address + 02h
D0 = Lock Status
D1 = Lock-Down Status
Read Configuration Register
Partition Base Address + 05h
Configuration Register Data
Enhanced Configuration Register
Partition Base Address + 06h
Enhanced Configuration
Register Data
OTP Lock Register 0
Partition Base Address + 80h
Lock Register 0 Data
OTP Register - Factory Segment
Partition Base Address + 81h to 84h
Factory-Programmed Data
OTP Register - User-Programmable Segment
Partition Base Address + 85h to 88h
User Data
OTP Lock Register 1
Partition Base Address + 89h
Lock Register 1 Data
OTP Registers 1 through 16
Partition Base Address + 8Ah to 109h
User Data
The addressed partition remains in Read Device Information mode until a different read
command is issued. Also, performing a program, erase, or block-lock operation changes
the addressed partition to Read Status Register mode.
Note:
Issuing the Read Device Information command to a partition that is actively
programming or erasing changes that partition’s read mode to Read Device Information
mode. Subsequent reads from that partition will return invalid data until the program or
erase operation has completed.
The Read Device Information command functions independent of the voltage level on
VPP.
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9.4.4
CFI Query
Issuing the CFI Query command places the addressed partition in CFI Query mode.
Subsequent reads from that partition output CFI information.
The addressed partition remains in CFI Query mode until a different read command is
issued, or a program or erase operation is performed, which changes the read mode to
Read Status Register mode.
Note:
Issuing the CFI Query command to a partition that is actively programming or erasing
changes that partition’s read mode to CFI Query mode. Subsequent reads from that
partition will return invalid data until the program or erase operation has completed.
The CFI Query command functions independent of the voltage level on VPP.
9.5
Programming Modes
To understand programming modes, it is also important to understand the fundamental
memory array configuration. The flash device main array is divided as follows:
• The main array of the 128-Mbit device is divided into eight 16-Mbit partitions. Each
parition is divided into eight 256-KByte blocks: 8 x 8 = 64 blocks in the main array
of a 128-Mbit device.
• The main array of the 256-Mbit device is divided into eight 32-Mbit partitions. Each
partition is divided into sixteen 256-KByte blocks: 8 x 16 = 128 blocks in the main
array of a 256-Mbit device.
• The main array of the 512-Mbit device is divided into eight 64-Mbit partitions. Each
partition is divided into thirty-two 256-KByte blocks: 8 x 32 = 256 blocks in the
main array of a 256-Mbit device.
• The main array of the 1-Gbit device is divided into eight 128-Mbit partitions. Each
partition is divided into sixty-four 256-KByte blocks: 8 x 64 = 512 blocks in the
main array of a 1-Gbit device.
Each block is divided into as many as two-hundred-fifty-six 1-KByte programming
regions. Each region is divided into as many as thirty-two 32-Byte segments.
Each programming region in a flash block can be configured for one of two
programming modes: Control Mode or Object Mode. The programming mode is
automatically set based on the data pattern when a region is first programmed. The
selection of either Control Mode or Object Mode is done according to the specific needs
of the system with consideration given to two types of information:
• Control Mode: Flash File System (FFS) or Header information, including frequently
changing code or data
• Object Mode: Large, infrequently changing code or data, such as objects or
payloads
By implementing the appropriate programming mode, software can efficiently organize
how information is stored in the flash memory array.
Control Mode programming regions and Object Mode programming regions can be
intermingled within the same erase block. However, the programming mode of any
region within a block can be changed only after erasing the entire block.
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9.5.1
Control Mode
Control Mode programming is invoked when only the A-half (A3 = 0) of the
programming region is programmed to 0s, as shown in Figure 47, “Configurable
Programming Regions: Control Mode and Object Mode” on page 85. The B-half (A3 =
1) remains erased. Control mode allows up to 512 bytes of data to be programmed in
the region. The information can be programmed in bits, bytes, or words.
Control Mode supports the following programming methods:
— Single-word Programming (0041h)
— Buffered Programming (00E9h/00D0h), and
— Buffered Enhanced Factory Programming (0080h/00D0h)
When buffered programming is used in Control Mode, all addresses must be in the Ahalf of the buffer (A3 = 0). During buffer fill, the B-half (A3 = 1) addresses do not need
to be filled with 0xFFFF.
Control Mode programming is useful for storing dynamic information, such as FFS
Headers, File Info, and so on. Typically, Control Mode programming does not require
the entire 512 bytes of data to be programmed at once. It may also contain data that is
changed after initial programming using a technique known as “bit twiddling”. Header
information can be augmented later with additional new information within a Control
Mode-programmed region. This allows implementation of legacy file systems, as well as
transaction-based power-loss recovery.
In a control mode region, programming operations can be performed multiple times.
However, care must be taken to avoid programming any zero’s in the B-half (A3 = 1) of
the region. Violation of this usage will cause SR4 and SR9 to be set, and the program
operation will be aborted. See Table 38, “Programming Region Next State Table” on
page 88 for details.
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Figure 47: Configurable Programming Regions: Control Mode and Object Mode
Main Array
256-Kbyte Block
256 KBytes
256 KBytes
256 programming regions of 1-Kbyte in each 256-Kbyte block
..
256 KBytes
256 KBytes
..
256 KBytes
..
.
..
.
..
.
..
.
1 KByte
Programming region in Object Mode
Address Bit A3 = 0: Allows up to 1
KByte of data to be programmed .
512 Bytes
512 Bytes
Programming region in Control Mode
A half
(Control
Mode )
B half
(Erased)
Address Bit A3 = 1: Allows up to 512
Bytes of data to be programmed to
the A half by bit, byte, or word.
..
.
1 KByte
Programming region in Object Mode
1 KByte
Programming region in Object Mode
..
.
256 KBytes
256 KBytes
..
..
256 KBytes
9.5.2
Object Mode
Object mode programming is invoked when one or more bits are programmed to zero
in the B-half of the programming region (A3 = 1). Object mode allows up to 1KB to be
stored in a programming region. Multiple regions are used to store more than 1Kbyte of
information. If the object is less than 1Kbyte, the unused content will remain as 0xFFFF
(erased).
Object Mode supports two programming methods:
— Buffered Programming (00E9h/00D0h), and
— Buffered Enhanced Factory Programming (0080h/00D0h)
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Single-word programming (0041h) is not supported in Object mode. To perform
multiple programming operations within a programming region, Control mode must be
used.
Object mode is useful for storing static information, such as objects or payloads, that
rarely change.
Once the programming region is configured in Object mode, it cannot be augmented or
over-written without first erasing the entire block containing the region. Subsequent
programming operations to a programming region configured in Object mode will cause
SR4 and SR8 to be set and the program operation to be aborted. See Table 38,
“Programming Region Next State Table” on page 88 for details.
Note:
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Issuing the 41h command to the B-half of an erased region will set error bits SR8 and
SR9, and the programming operation will not proceed. See Table 38, “Programming
Region Next State Table” on page 88 for more details.
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Figure 48: Configurable Programming Regions: Control Mode and Object Mode Segments
32 Bytes
Segments
Object
Object
Object
Object
.
.
...
31
30
3
2
1
0
Object
Object
Object
Object
Object
Object
Program up to
1 KByte of data
Programming region in
Object Mode
1 KByte
.
.
.
256-Kbyte Block
1 KByte
512 Bytes
A half
(Control
Mode)
Program up to 512
Bytes of data
Segments
Sequence Table Entry
Header
3
2
1
0
Header
Header
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
F
.
.
Header
File Information
Header
Directory Information
Header
Sequence Table Entry
Header
16 Bytes
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B half
(Erased)
Programming
region in
Control Mode
...
31
30
512 Bytes
16 Bytes
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Table 38: Programming Region Next State Table
Command Issued
Current State of
Programming
Region
0041h to B-half
(A3 = 1)
Erased
Program Fail; Illegal
Command
SR[4,8,9] = 1
Control Mode
00E9h to B-half
(A3 = 1)
00E9h to A-half
(A3 = 0)
Program Successful
SR[4,8,9] = 0
Region configured to
Control Mode
Program Successful
SR[4,8,9] = 0
Region configured to
Object Mode
Program Successful
SR[4,8,9] = 0
Region configured to
Control Mode
Program Successful
SR[4,8,9] = 0
Program Fail;
Object data to Control
mode region
SR[4,9] = 1
SR8 = 0
Program Successful
SR[4,8,9] = 0
Program Fail; Rewrite to Object mode region
SR[4,8] = 1
SR9 = 0
Object Mode
9.6
0041h to A-half
(A3 = 0)
Programming Operations
Programming the flash array changes ‘ones’ to ‘zeros’. To change zeros to ones, an
Erase operation must be performed. Only one programming operation can occur at a
time. Programming is permitted during Erase Suspend.
Information is programmed into the flash array by issuing the appropriate command.
Table 39, “Programming Commands Bus Cycles” shows the two-cycle command
sequences used for programming.
Table 39: Programming Commands Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Data Bus
Address Bus
Data Bus
Single-Word Program
Device Address
0041h
Device Address
Array Data
Buffered Program
Device Address
00E9h
Device Address
00D0h
Buffered Enhanced Factory Program
Device Address
0080h
Device Address
00D0h
Caution:
All programming operations require the addressed block to be unlocked, and a
valid VPP voltage applied throughout the programming operation. Otherwise,
the programming operation will abort, setting the appropriate Status Register
error bit(s).
The following sections describe each programming method.
9.6.1
Single-Word Programming
Main array programming is performed by first issuing the Single-Word Program
command. This is followed by writing the desired data at the desired array address. The
read mode of the addressed partition is automatically changed to Read Status Register
mode, which remains in effect until another read-mode command is issued.
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Note:
Issuing the Read Status Register command to another partition switches that partition’s
read mode to Read Status Register mode, thereby allowing programming progress to
be monitored from that partition’s address.
Single-Word Programming is supported in Control mode only. The array address
specified must be in the A-half of the programming region.
During programming, the Status Register indicates a busy status (SR7 = 0). Upon
completion, the Status Register indicates a ready status (SR7 = 1). The Status Register
should be checked for any errors, then cleared.
The only valid commands during programming are Read Array, Read Device
Information, CFI Query, Read Status and Program Suspend. After programming has
finished, any valid command can be issued.
Note:
Issuing the Read Array, Read Device Information, or CFI Query command to a partition
that is actively programming causes subsequent reads from that partition to output
invalid data. Valid data is output only after the program operation has finished.
Standby power levels are not realized until the programming operation has finished.
Asserting RST# immediately aborts the programming operation, and array contents at
the addressed location are indeterminate. The addressed block should be erased, and
the data re-programmed.
9.6.2
Buffered Programming
Buffered Programming programs multiple words simultaneously into the flash memory
array. Data is first written to a write buffer and then programmed into the flash
memory array in buffer-size increments. This can significantly reduce the effective
word-write time. Section 6.0, “Flow Charts” on page 41 contains a flow chart of the
buffered-programming operation.
Note:
Optimal performance and power consumption is realized only by aligning the start
address on 32-word boundaries, e.g., A[4:0] = 00000b. Crossing a 32-word boundary
during a Buffered Programming operation can cause the programming time to double.
Buffered Programming is supported in both Control mode and Object mode. In Object
mode, the region must be programmed only once between erases. However in Control
mode, the region may be programmed multiple times.
Caution:
When using the Buffered Program command in Object mode, the start address
must be aligned to the 512-word buffer boundary. In Control mode, the
programming array address specified must be in the A-half of the
programming region.
First issue the Read Status command to the desired partition. The read mode of the
addressed partition is changed to Read Status Register mode.
Poll SR7 to determine write-buffer availability (0 = not available, 1 = available). If the
write buffer is not available, re-issue the Read Status command and check SR7; repeat
until SR7 = 1.
If desired issue a Read Array command to the desired partition to change the read
mode of the partition to Array reads.
To perform a buffered programming operation, issue the Buffered Program setup
command at the desired starting address. Next, issue a word count at the desired
starting address. The word count is the total number of words to be written into the
write buffer, minus one. This value can range from 0000h (one word) up to a maximum
of 01FFh (512 words). Exceeding the allowable range causes the operation to abort.
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Following the word count, subsequent bus-write cycles fill the write buffer with userdata up to the word count.
Note:
User-data is programmed into the flash array at the address issued when filling the
write buffer.
The Confirm command (00D0h) is issued after all user-data is written into the write
buffer. The read mode of the device/addressed partition is automatically changed to
Read Status Register mode. If other than the Confirm command is issued to the device,
a command sequence error occurs and the operation aborts.
After the Confirm command has been issued, the write-buffer contents are
programmed into the flash memory array. The Status Register indicates a busy status
(SR7 = 0) during array programming.
During array programming, the only valid commands are Read Array, Read Device
Information, CFI Query, Read Status, and Program Suspend. After array programming
has completed (SR7 = 1), any valid command can be issued. Reading from another
partition is allowed while data is being programmed into the flash memory array from
the write buffer.
Note:
Issuing the Read Array, Read Device Information, or CFI Query command to a partition
that is actively programming or erasing causes subsequent reads from that partition to
output invalid data. Valid data is output only after the program or erase operation has
finished.
Upon completion of array programming, the Status Register indicates ready (SR7 =
1b). A full Status Register check should be performed to check for any programming
errors. Then the Status Register should be cleared using the Clear Status Register
command.
A subsequent buffered programming operation can be initiated by repeating the
buffered programming sequence. Any errors in the Status Register caused by the
previous operation must be cleared to prevent them from masking any errors that may
occur during the subsequent operation.
9.6.3
Buffered Enhanced Factory Programming (BEFP)
Buffered Enhanced Factory Programming (BEFP) improves programming performance
through the use of the write buffer, elevated programming voltage (VPPH), and
enhanced programming algorithm. User-data is written into the write buffer, then the
buffer contents are automatically written into the flash array in buffer-size increments.
BEFP is allowed in both Control Mode and Object Mode. The programming mode
selection for the entire flash array block is driven by the specific type of information,
such as header or object data. Header/object data is aligned on a 1 KB programming
region boundary in the main array block.
Internal verification during programming (inherent to MLC technology) and Status
Register error checking are used to determine proper completion of the programming
operation. This eliminates delays incurred when switching between single-word
program and verify operations.
BEFP consists of three distinct phases:
1. Setup Phase: VPPH and block-lock checks
2. Program/Verify Phase: buffered programming and verification
3. Exit Phase: block-error check
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Section 6.0, “Flow Charts” on page 41 contains a flow chart of the BEFP operation.
Table 40, “BEFP Requirements and Considerations” on page 91 lists specific BEFP
requirements and considerations.
Note:
For BEFP voltage and temperature operating restrictions, see the datasheet. The block
erase cycles in Table 40, “BEFP Requirements and Considerations” are recommended
for optimal performance. If exceeded some degradation in performance may occur;
however, the internal algorithm will still function correctly.
Table 40: BEFP Requirements and Considerations
Temperature (TCASE) must be 25 °C, ± 5 °C
BEFP Requirements
Voltage on VCC must be within the allowable operating range
Voltage on VPP must be within the allowable operating range
Block being programmed must be erased and unlocked
Block cycling below 100 erase cycles
BEFP Considerations
Reading from another partition during EFP (RWW) is not allowed
BEFP programs within one block at a time
BEFP cannot be suspended
9.6.3.1
Setup Phase
Issuing the BEFP Setup and Confirm command sequence starts the BEFP algorithm. The
read mode of the addressed partition is automatically changed to Read Status Register
mode.
The address used when issuing the setup/confirm commands must be buffer-size
aligned within the block being programmed -- buffer contents cannot cross block
boundaries.
Caution:
The Read Status Register command must not be issued -- it will be interpreted
as data to be written to the write buffer.
A setup delay (tBEFP/Setup) occurs while the internal algorithm checks VPP and block-lock
status. If errors are detected, the appropriate Status Register error bits are set and the
operation aborts.
The Status Register should be polled for successful BEFP setup, indicated by SR[7,0] =
0 (Device Busy, Buffer Ready for Data).
9.6.3.2
Program/Verify Phase
Data is first written into the write buffer, then programmed into the flash array. During
the buffer-fill sequence, the address used must be buffer-size aligned. Use of any other
address will cause the operation to abort with a program fail error, and any data
previously loaded in the buffer will not be programmed into the array.
The buffer-fill data is stored in sequential buffer locations starting at address 00h. A
word count equal to the maximum buffer size is used, therefore, the buffer must be
completely filled. If the amount of data is less than the maximum buffer size, the
remaining buffer locations must be “padded” with FFFFh to completely fill the buffer.
Flash array programming starts as soon as the write buffer is full. Data words from the
write buffer are programmed into sequential array locations. SR0 = 1 indicates the
write buffer is not available while the BEFP algorithm programs the array.
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The Status Register should be polled for SR0 = 0 (Buffer Ready for Data) to determine
when the array programming has completed, and the write buffer is again available for
loading. The internal address is automatically incremented to enable subsequent array
programming to continue from where the previous buffer-fill/array-program sequence
ended within the block. This cycle can be repeated to program the entire block.
To exit the Program/Verify Phase, write FFFFh to an address outside of the block.
9.6.3.3
Exit Phase
The Status Register should be polled for SR7 = 1 (Device Ready) indicating the BEFP
algorithm has finished running, and the device has returned to normal operation. A full
error check should be performed to ensure the block was programmed successfully.
9.7
Block Erase Operations
Erasing a block changes ‘zeros’ to ‘ones’. To change ones to zeros, a program operation
must be performed (see Section 9.6, “Programming Operations). Erasing is performed
on a block basis— an entire block is erased each time an erase command sequence is
issued. Once a block is fully erased, all addressable locations within that block read as
logical ‘ones’ (FFFFh).
Only one block-erase operation can occur at a time. A block-erase operation is not
permitted during Program Suspend.
To perform a block-erase operation, issue the Block Erase command sequence at the
desired block address. Table 41 shows the two-cycle Block Erase command sequence.
Table 41: Block-Erase Command Bus Cycles
Command
Setup Write Cycle
Address Bus
Block Erase
Caution:
Device Address
Data Bus
0020h
Confirm Write Cycle
Address Bus
Block Address
Data Bus
00D0h
All block-erase operations require the addressed block to be unlocked, and a
valid voltage applied to VPP throughout the block-erase operation. Otherwise,
the operation aborts, setting the appropriate Status Register error bit(s).
The Erase Confirm command latches the address of the block to be erased. The
addressed block is preconditioned (programmed to all zeros), erased, and then verified.
The read mode of the addressed partition is automatically changed to Read Status
Register mode, and remains in effect until another read-mode command is issued.
Note:
Issuing the Read Status Register command to another partition switches that partition’s
read mode to the Read Status Register, thereby allowing block-erase progress to be
monitored from that partition’s address. SR0 indicates whether the addressed partition
or other partition is erasing.
During a block-erase operation, the Status Register indicates a busy status (SR7 = 0).
Upon completion, the Status Register indicates a ready status (SR7 = 1). The Status
Register should be checked for any errors, and then cleared.
The only valid commands during a block erase operation are Read Array, Read Device
Information, CFI Query, Read Status and Erase Suspend. After the block-erase
operation has completed, any valid command can be issued.
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Note:
Issuing the Read Array command to a partition that is actively erasing a main block
causes subsequent reads from that partition to output invalid data. Valid array data is
output only after the block-erase operation has finished.
Standby power levels are not realized until the block-erase operation has finished.
Asserting RST# immediately aborts the block-erase operation, and array contents at
the addressed location are indeterminate. The addressed block should be erased, and
the data re-programmed.
9.8
Blank Check Operation
Blank Check is used to see if a main-array block is completely erased. A Blank Check
operation is performed one block at a time, and cannot be used during Program
Suspend or Erase Suspend.
To use Blank Check, first issue the Blank Check setup command followed by the confirm
command. The read mode of the addressed partition is automatically changed to Read
Status Register mode, which remains in effect until another read-mode command is
issued.
Table 42: Blank Check Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Blank Check
Block Address
Data Bus
00BCh
Address Bus
Block Address
Data Bus
00D0h
During a blank check operation, the Status Register indicates a busy status (SR7 = 0).
Upon completion, the Status Register indicates a ready status (SR7 = 1).
Note:
Issuing the Read Status Register command to another partition switches that partition’s
read mode to Read Status Register mode, thereby allowing the blank check operation
to be monitored from that partition’s address.
The Status Register should be checked for any errors, and then cleared. If the Blank
Check operation fails, i.e., the block is not completely erased, then the Status Register
will indicate a Blank Check error (SR[7,5] = 1).
The only valid command during a Blank Check operation is Read Status. Blank Check
cannot be suspended. After the blank check operation has completed, any valid
command can be issued.
9.9
Suspend and Resume
Program and erase operations of the main array can be suspended to perform other
device operations, and then subsequently resumed. However, OTP Register
programming or blank check operations cannot be suspended.
To suspend an on-going erase or program operation, issue the Suspend command to
any device address; the corresponding partition is not affected. Table 43 shows the
Suspend and Resume command bus-cycles.
Note:
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Issuing the Suspend command does not change the read mode of the partition. The
partition will be in Read Status Register mode from when the erase or program
command was first issued, unless the read mode was changed prior to issuing the
Suspend command.
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Table 43: Suspend and Resume Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Data Bus
Address Bus
Data Bus
Suspend
Device Address
00B0h
---
---
Resume
Device Address
00D0h
---
---
The program or erase operation suspends at pre-determined points during the
operation after a delay of tSUSP. Suspend is achieved when SR[7,6] = 1 (erasesuspend) or SR[7,2] = 1 (program-suspend).
Note:
Throughout the Block Erase Suspend or Program Suspend period, the addressed block
must remain unlocked and a valid voltage applied to VPP. Otherwise, the erase or
program operation will abort, setting the appropriate Status Register error bit(s). Also,
WP# must remain unchanged.
Asserting RST# aborts suspended block-erase and programming operations -- array
contents at the addressed locations are indeterminate. The addressed block should be
erased, and the data re-programmed.
Not all commands are allowed when the device is suspended. Table 44 shows which
device commands are allowed during Program Suspend or Erase Suspend.
Table 44: Valid Commands During Suspend
Device Command
Program Suspend
Erase Suspend
Read Array
Allowed
Allowed
Read Status Register
Allowed
Allowed
Clear Status Register
Allowed
Allowed
Read Device Information
Allowed
Allowed
CFI Query
Allowed
Allowed
Word Program
Not Allowed
Allowed
Buffered Program
Not Allowed
Allowed
Buffered Enhanced Factory Program
Not Allowed
Not Allowed
Block Erase
Not Allowed
Not Allowed
Program/Erase Suspend
Not Allowed
Not Allowed
Program/Erase Resume
Allowed
Allowed
During Suspend, reading from a block that is being erased or programmed is not
allowed. Also, programming to a block that is in erase-suspend state is not allowed,
and if attempted, will result in Status Register program error to be set (SR4 = 1).
A block-erase under program-suspend is not allowed. However, word-program under
erase-suspend is allowed, and can be suspended. This results in a simultaneous erasesuspend/ program-suspend condition, indicated by SR[7,6,2] = 1.
To resume a suspended program or erase operation, issue the Resume command to
any device address. The read mode of the resumed partition is unchanged; issue the
Read Status Register command to return the partition to Read Status mode. The
operation continues where it left off, and the respective Status Register suspend bits
are cleared.
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When the Resume command is issued during a simultaneous erase-suspend/ programsuspend condition, the programming operation is resumed first. Upon completion of the
programming operation, the Status Register should be checked for any errors, and
cleared. The resume command must be issued again to complete the erase operation.
Upon completion of the erase operation, the Status Register should be checked for any
errors, and cleared.
9.10
Simultaneous Operations
The multi-partition architecture of the flash device allows programming or erasing to
occur in one partition while reads are performed from another partition. Only status
reads are allowed in partitions that are busy programming or erasing.
Note:
When OTP Registercommands are issued to a parameter any partition address, the OTP
Registeris mapped onto that partition.
Table 45, “Read-While-Program and Read-While-Erase Rules” shows the rules for
reading from a partition while simultaneously programming or erasing within another
partition.
Table 45: Read-While-Program and Read-While-Erase Rules
Read modes allowed when program/erase busy in partition A
Active Operation
Read Status
Array Reads
Non-Array Reads1
Main-Array Program
All partitions
All partitions except busy partition A
All partitions except busy partition A
Main-Array Erase
All partitions
All partitions except busy partition A
All partitions except busy partition A
OTP Register Program
All partitions
All partitions except busy partition A
Not allowed
Note:
OTP Register, Device Information, CFI Query.
9.11
Security
The flash device incorporates features for protecting main-array contents and for
implementing system-level security schemes. The following sections describe the
available features.
9.11.1
Block Locking
Two methods of block-lock control are available: software and hardware. Software
control uses the Block Lock and Block Unlock commands; hardware control uses WP#
along with the Block Lock-Down command.
Upon power up or exit from reset, all main array blocks are locked, but not locked
down. Locked blocks cannot be erased or programmed.
Block lock and unlock operations are independent of the voltage level on VPP.
Table 46 summarizes the command bus-cycles.
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 46: Block Locking Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Lock Block
Block Address
Data Bus
Address Bus
Data Bus
0060h
Block Address
0001h
Unlock Block
Block Address
0060h
Block Address
00D0h
Lock-Down Block
Block Address
0060h
Block Address
002Fh
To lock, unlock, or lock-down a block, first issue the setup command to any address
within the desired block. The read mode of the addressed partition is automatically
changed to Read Status Register mode. Next, issue the desired confirm command to
the block’s address. Note that the confirm command determines the operation
performed. The Status Register should be checked for any errors, and then cleared.
The lock status of a block can be determined by issuing the Read Device Information
command, and then reading from <block base address> + 02h. DQ0 indicates the lock
status of the addressed block (0 = unlocked, 1 = locked), and DQ1 indicates the lockdown status of the addressed block (0 = lock-down not issued; 1 = locked-down
issued). Section 9.4.3, “Read Device Information” on page 82 summarizes the details
of this operation.
Blocks cannot be locked or unlocked while being actively programmed or erased. Blocks
can be locked or unlocked during erase-suspend, but not during program-suspend.
Note:
If a block-erase operation is suspended, and then the block is locked or locked down,
the lock status of the block will be changed immediately. When resumed, the erase
operation will still complete.
Block lock-down protection is dependent on WP#. When WP# = VIL , blocks locked
down are locked, and cannot be unlocked using the Block Unlock command. When
WP# = VIH, block lock-down protection is disabled—locked-down blocks can be
individually unlocked using the Block Unlock command. Subsequently, when WP# =
VIL, previously locked-down blocks are once again locked and locked-down, including
locked-down blocks that may have been unlocked while WP# was de-asserted.
A locked-down block can only be unlocked by issuing the Unlock Block command with
WP# deasserted. To return an unlocked block to the locked-down state, a Lock-Down
command must be issued prior to asserting WP#.
Issuing the Block Lock-Down command to an unlocked block does not lock the block.
However, asserting WP# after issuing the Block Lock-Down command locks (and locks
down) the block. Lock-down for all blocks is cleared upon power-up or exit from reset.
Figure 49 summarizes block-locking operations.
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 49: Block Locking Operations
Locked
[X,0,1]
Locked
Down2
[0,1,1]
Hardware
Locked2
[0,1,1]
WP# = V IL
Power Up
-orExit from Reset
WP# = VIH
Unlocked
[X,0,0]
Software
Locked
[1,1,1]
Unlocked
[1,1,0]
Software Control (Lock, Unlock, Lock-Down Command)
Hardware Control (WP#)
Notes:
1.
[n,n,n] denotes logical state of WP#, DQ1,and DQ0, respectively; X = Don’t Care.
2.
[0,1,1] states should be tracked by system software to differentiate between the Hardware-Locked state and the LockDown state.
9.11.2
One-Time Programmable (OTP) Registers
The device contains seventeen 128-bit One-Time Programmable (OTP) Registers, and
twoa 16-bit OTP Lock Registers, as shown in Figure 50, “2-Kbit OTP Registers” on
page 98. The OTP Lock Register 0 is used for locking the OTP Register 0, and OTP Lock
Register 1 is used for locking OTP Registers 1 through 16.
The OTP Register 0 consists of two 64-bit segments: a lower segment that is preprogrammed with a unique 64-bit value and locked at the factory; and an upper
segment that contains all “ones” and is user-programmable. OTP Registers 1 through
16 contain all “ones” and are user-programmable.
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Datasheet
97
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 50: 2-Kbit OTP Registers
0x109
128-bit OTP Register 16
(User-Programmable)
0x102
0x91
128-bit OTP Register 1
(User-Programmable)
0x8A
0x89
15 14 13 12 11 10 9
8
7
6
5
4
3
2
1
0
1
0
OTP Lock Register 1
0x88
64-bit Segment
(User-Programmable)
0x85
0x84
128-Bit OTP Register 0
64-bit Segment
(Factory-Programmed)
0x81
0x80
15 14 13 12 11 10 9
8
7
6
5
4
3
2
OTP Lock Register 0
Each register contains OTP bits that can only be programmed from “one” to “zero” register bits cannot be erased from “zero” back to “one”. This feature makes the OTP
registers particularly useful for implementing system-level security schemes, for
permanently storing data, or for storing fixed system parameters.
OTP Lock Register bits “lock out” subsequent programming of the corresponding OTP
register. Each OTP Register can be locked by programming its corresponding lock bit to
zero. As long as an OTP register remains unlocked (that is, its lock bit = 1), any of its
remaining “one” bits can be programmed to “zero”.
Caution:
Once an OTP Register is locked, it cannot be unlocked. Attempts to program a
locked OTP Register will fail with error bits set.
To program any OTP bits, first issue the Program OTP Register setup command at any
device address. Next, write the desired OTP Register data at the desired OTP Register
address. OTP Register and OTP Lock Register programming is performed 16 bits at a
time; only “zeros” within the data word affect any change to the OTP register bits.
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 47: Program OTP Register Command Bus Cycles
Setup Write Cycle
Confirm Write Cycle
Command
Address Bus
Program OTP Register
Device Address
Data Bus
00C0h
Address Bus
OTP Register Address
Data Bus
Register Data
Attempting to program an OTP register outside of the OTP register space causes a
program error (SR4 = 1). Attempting to program a locked OTP Register causes a
program error and a lock error (SR4 = 1, SR1 = 1).
To read from any of the OTP registers, first issue the Read Device Information
command. Then read from the desired OTP Register address offset. For additional
details, refer to Section 9.4.3, “Read Device Information” on page 82.
9.11.3
Global Main-Array Protection
Global main-array protection can be implemented by controlling VPP. When
programming or erasing main-array blocks, VPP must be equal to, or greater than VPPL
(min). When VPP is below VPPLK, program or erase operations are inhibited, thus
providing absolute protection of the main array.
Various methods exist for controlling VPP, ranging from simple logic control to off-board
voltage control. Figure 51 shows example VPP supply connections that can be used to
support program/erase operations and main-array protection.
Figure 51: Example VPP Supply Connections
VCC
VCC
VCC
VPPH
VCC
VPPL
VPP
PROT#
VPP
≤ 10ΚΩ
•
•
Factory Programming: VPP = VPPH
Program/Erase Protection: VPP ≤ VPPLK
VCC
•
•
VCC
Program/Erase Enable: PROT# = VIH
Program/Erase Protection: PROT# = VIL
VCC
VPPL
VCC
VPPL
VPP
VPP
VPPH
•
•
April 2008
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Low-Voltage Programming: VPP = VPPL
- orFactory Programming: VPP = VPPH
•
•
Low-Voltage Programming: VPP = VCC
Program/Erase Protection: None
Datasheet
99
Numonyx™ StrataFlash® Cellular Memory (M18)
10.0
Device Command Codes
Table 48: Command Bus Operations
Code
(Setup/Confirm)
Description
Program Read
Configuration Register
0060h/0003h
Issuing this command sequence programs the Read Configuration
Register. The RCR value is placed on the address bus.
Program Enhanced
Configuration Register
0060h/0004h
Issuing this command sequence programs the Enhanced
Configuration Register. The ECR value is placed on the address
bus.
Program OTP Register
00C0h
Issuing this command programs the Protection Registers or the
Lock Registers associated with them.
Read Array
00FFh
Issuing this command places the addressed partition in Read Array
mode. Subsequent reads outputs array data.
Read Status Register
0070h
Issuing this command places the addressed partition in Read
Status mode. Subsequent reads outputs Status Register data.
Clear Status Register
0050h
Issuing this command clears all error bits in the Status Register.
Read Device Information
0090h
Issuing this command places the addressed partition in Read
Device Information mode. Subsequent reads from specified
address offsets outputs unique device information.
CFI Query
0098h
Issuing this command places the addressed partition in CFI Query
mode. Subsequent reads from specified address offsets outputs
CFI data.
Word Program
0041h
This command prepares the device for programming a single word
into the flash array. On the next bus write cycle, the address and
data are latched and written to the flash array. The addressed
partition automatically switches to Read Status Register mode.
Security
Program/Erase Operations
Read Modes
Registers
Command
Buffered Program
00E9h/00D0h
This command sequence initiates and executes a buffered
programming operation. Additional bus write/read cycles are
required between the setup and confirm commands to properly
perform this operation. The addressed partition automatically
switches to Read Status Register mode.
Buffered Enhanced Factory
Program
0080h/00D0h
This command sequence initiates and executes a BEFP operation.
Additional bus write/read cycles are required after the confirm
command to properly perform the operation. The addressed
partition automatically switches to Read Status Register mode.
Block Erase
0020h/00D0h
Issuing this command sequence erases the addressed block. The
addressed partition automatically switches to Read Status mode.
Program/Erase Suspend
00B0h
Issuing this command to any device address initiates a suspend of
a program or block-erase operation already in progress. SR6 = 1
indicates erase suspend, and SR2 = 1 indicates program suspend.
Program/Erase Resume
00D0h
Issuing this command to any device address resumes a suspended
program or block-erase operation. A program suspend nested
within an erase suspend is resumed first.
Blank Check
00BCh/00D0h
This command sequence initiates the blank check operation on a
block.
Lock Block
0060h/0001h
Issuing this command sequence sets the lock bit of the addressed
block.
Unlock Block
0060h/00D0h
Issuing this command sequence clears the lock bit of the
addressed block.
Lock Down Block
0060h/002Fh
Issuing this command sequence locks down the addressed block.
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Numonyx™ StrataFlash® Cellular Memory (M18)
11.0
Flow Charts
Figure 52: Word Program for Main Array Flowchart
WORD PROGRAM PROCEDURE
Bus
Command
Operation
Start
Write 0x41,
Word Address
Write
Program
Setup
Data = 0x41
Addr = Location to program
Write
Data
Data = Data to program
Addr = Location to program
Read
None
Main or Parameter status register data
Idle
None
Check SR[7]
1 = WSM Ready
0 = WSM Busy
(Setup )
Write Data,
Word Address
(Confirm)
Program
Suspend
Loop
Read Status
Register
No
SR[7] =
Comments
0
Suspend?
Yes
Repeat for subsequent Word Program operations.
Full Status Register check can be done after each program, or
after a sequence of program operations.
1
Full Status
Check
(if desired)
Write 0xFF after the last operation to set to the Read Array
state.
Program
Complete
FULL STATUS CHECK PROCEDURE
Read Status
Register
SR[4] =
Bus
Command
Operation
0
SR[1] =
1
Idle
None
Check SR[4]:
1 = Data Program Error
Idle
None
Check SR[1]:
1 = Block locked; operation aborted
Idle
None
Check SR[3]:
1 = VPP Error
Program
Success
1
Device Protect
Error
Comments
0
Check SR[8] AND SR[9]:
SR[3] =
1
0
SR[8] or
SR[9] =
0
Program Fail
0 0=Region program successful.
Vpp Range
Error
Idle
1
See Table on the
right for explantion
None
1 0= Attempted write with object
data to C ontrol Mode region
.
0 1= Attempted rewrite to Object
Mode region.
1 1=Attempted write using illegal
command.
SR[3] MUST be cleared before the Write State Machine will
allow further program attempts.
If an error is detected, clear the Status Register before
continuing operations - only the Clear Staus Register
command clears the Status Register error bits.
.
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Datasheet
101
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 53: Program Suspend/Resume Flowchart
PR OG R AM SUSPEN D / RESUM E PRO CEDUR E
S ta rt
P ro g ra m
Bus
Com m and
O p e ra tio n
S uspend
W rite B 0 h
A n y A d d re s s
W rite
R ead
S ta tu s
W rite S R (1 )
S a m e P a rtitio n
W rite
R e a d S ta tu s
R e g is te r
R ead
S R .7 =
0
C o m m e n ts
P ro g ra m D a ta = B 0 h
S u s p e n d A d d r = B lo c k to s u s p e n d (B A )
R ead
S ta tu s
D a ta = S R (1 )
A d d r = S a m e p a rtitio n
S ta tu s re g is te r d a ta
A d d r = S u s p e n d e d b lo c k (B A )
S ta n d b y
C h e c k S R .7
1 = W S M re a d y
0 = W S M busy
S ta n d b y
C h e c k S R .2
1 = P ro g ra m s u s p e n d e d
0 = P ro g ra m c o m p le te d
1
S R .2 =
R ead
0
P ro g ra m
C o m p le te d
1
A rra y
W rite
W rite F F h
S u s p P a rtitio n
R ead
A rra y
R e a d a rra y d a ta fro m b lo c k o th e r th a n
th e o n e b e in g p ro g ra m m e d
R ead
R e a d A rra y
D a ta
D one
R e a d in g
P ro g ra m
Yes
R esum e
W rite
P ro g ra m
R esum e
D a ta = D 0 h
A d d r = S u s p e n d e d b lo c k (B A )
If th e s u s p e n d e d p a rtitio n w a s p la c e d in R e a d A r ra y m o d e :
No
W rite
R ead
A rra y
W rite D 0 h
A n y A d d re s s
W rite F F h
P g m 'd P a rtitio n
P ro g ra m
R esum ed
R e a d A rra y
D a ta
R ead
D a ta = F F h
A d d r = A n y a d d re s s w ith in th e
s u s p e n d e d p a rtitio n
R ead
S ta tu s
R e tu rn p a rtitio n to S ta tu s m o d e :
D a ta = S R (1 )
A d d r = S a m e p a rtitio n
S ta tu s
W rite 7 0 h
S a m e P a rtitio n
P G M _ S U S .W M F
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 54: Buffered Program Flowchart
Buffer Programming Procedure
Issue Read Status
Register Command
at Partition Address
No
0 = No
Flash Ready?
SR[7] =
Commands may be issued to the device.
Only other
partitions of
the device
can be read
No write commands are allowed during this period. Current and other partitions of
the device can be read by addressing the location and driving OE# low.
1 = Yes
Yes
Issue Read Array
Command at Partition
1 = Yes
Address
Timeout error
Set Timeout or
Loop Counter
Issue Buffer Prog. Cmd.
0xE9,
Block Address
Write Word Count-1,
Buffer Address
Buffer Program Data,
Word Address
X=X+1
X= 0
Write Buffer Data,
Word Address
X = N?
Abort Buffer
Program?
Yes
Write to another
Block Address
Yes
Command
Read
(Note 1)
None
SR[7] = Valid
Addr = Block Address
Idle
None
Check SR[7]:
1 = Write Buffer available
0 = No Write Buffer available
Write
(Note 2)
Read Array
Data = 0xFF
Addr = Block Address
Write
(Note 3)
Buffer Prog.
Setup
Data = 0xE9
Addr = Block Address
Write
(Notes 4,5)
None
Data = N = Word Count - 1
(N = 0 corresponds to count = 1)
Addr = Buffer Address
Write
(Notes 6, 7)
None
Data = Write Buffer Data
Addr = Word Address
Write
(Notes 6, 7)
None
Data = Write Buffer Data
Addr = Word Address
Write
(Note 8)
Buffer Prog.
Conf.
Data = 0xD0
Addr = Block Address
Read
(Note 9)
None
Status register Data
Addr = Block Address
Standby
None
Check SR[7]:
1 = WSM Ready
0 = WSM Busy
Comments
NOTES:
1. The device outputs the Status Register when read.
2. The device outputs the array data when read.
3. Buffer Programming is available in the main array only. This
algorithm may be used for MLC or PSBC programming. Upon
issuing 0xE9 the partition state does not changed.
4. Word count value on D[8:0] is loaded into the word count
register. Count ranges for this device are N = 0x000 to 0x1FF.
5. Buffer address on A[MAX:9] specifies a single 512-word
buffer-size array region. This is latched and held constant
during the entire operation.
6. The word address within the buffer, specified by A [8:0], is
provided. Upper address bits are ignored.
7. The device aborts the Buffer Program command if the current
address is outside the original block address .
8. Upon issuing 0xD0 the partition is placed in Status Read
mode. If block address changes, Buffer Program will abort.
9. The Status Register indicates an improper command
sequence if the Buffer Program command is aborted; use the
Clear Status Register command to clear error bits.
No
No
Write Confirm 0xD0
and Block Address
Buffer Program Aborted
Full status check can be done after all erase and write
sequences complete. For a detailed flowchart, please refer to
‘Full Status Check Procedure’ flowchart under ‘Word Program
for Main Array’ flowchart.
Suspend
Program
Loop
Read Status Register
No
SR[7] =?
0
Suspend
Program?
Write 0xFF after the last operation to place the partition in the
Read Array state.
Yes
1
Full Status
Check if Desired
Program Complete
April 2008
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Timeout?
Bus
Operation
.
.
Datasheet
103
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 55: Buffered EFP Flowchart
BUFFERED ENHANCED FACTORY PROGRAMMING (Buffered-EFP) PROCEDURE
Setup Phase
Program & Verify Phase
Start
Data Stream Ready
VPP applied ,
Block unlocked
Initialize Count :
X= 0
Exit Phase
Read Status Reg .
No (SR [7]=0)
BEFP
Exited?
Yes
ST
Write 0x80 @
1 ST Word Address
Write Data @ 1
Word Address
Write 0xD0 @
1ST Word Address
Increment Count :
X = X+1
N
BEFP setup delay
(SR [7]=1)
Full Status Check
Procedure
Program
Complete
X = 512?
Y
Read Status Reg .
Read Status Reg .
No (SR[0]=1)
Yes (SR[7]=0)
BEFP Setup
Done ?
Program
Done ?
No (SR[7]=1)
Yes (SR[0]=0)
Check V PP , Lock
Errors (SR[3,1])
N
Last
Data?
Y
Exit
Write 0xFFFF,
Address Not within
Current Block
BEFP Exit
BEFP Program & Verify
BEFP Setup
Bus
State
Operation
Write
Unlock
Block
VPPH applied to VPP
Write
(Note 2)
BEFP
Setup
Data = 0x80 @ 1
Address
Write
BEFP
Confirm
Data = 0xD0 @ 1ST
Word Address
Read
Status
Register
Data = Status Reg . Data
Address = 1ST Word Addr
Standby
BEFP
Setup
Done ?
Standby
Error
Condition
Check
Comments
ST
Bus State Operation
Read
Word
Check SR [7]:
0 = BEFP Ready
1 = BEFP Not Ready
If SR[ 7] is set , check:
SR[3] set = VPP Error
SR[1] set = Locked Block
Status
Register
Comments
Data = Status Register Data
Address = 1ST Word Addr .
Operation
Comments
Read
Status
Register
Check SR [ 0]:
0 = Ready for Data
1 = Not Ready for Data
Standby
Check Exit
Status
X=0
Repeat for subsequent blocks ;
Standby
Data Stream
Ready ?
Standby
Initialize
Count
Write
(Note 3)
Load
Buffer
Standby
Increment
Count
Standby
Buffer
Full?
X = 512?
Yes = Read SR [0]
No = Load Next Data Word
Read
Status
Register
Data = Status Reg . data
Address = 1ST Word Addr .
Standby
Program
Done?
Check SR [ 0]:
0 = Program Done
1 = Program in Progress
Standby
Last
Data?
Write
Bus
State
Data = Data to Program
Address = 1ST Word Addr .
X = X+1
Data = Status Reg . Data
Address = 1ST Word Addr
Check SR [7]:
0 = Exit Not Completed
1 = Exit Completed
After BEFP exit , a full Status Register check can
determine if any program error occurred ;
See full Status Register check procedure in the
Word Program flowchart .
Write 0xFF to enter Read Array state .
No = Fill buffer again
Yes = Exit
Exit Prog & Data = 0xFFFF @ address not in
Verify Phase current block
NOTES:
1. BEFP is available in the main array only .
2. First-word address to be programmed within the target block must be aligned on a write
-buffer boundary .
3. Write-buffer contents are programmed sequentially to the flash array starting at the first word address
; WSM internally increments addressing .
Datasheet
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 56: Block Erase for Main Array Flowchart
BLOCK ERASE PROCEDURE
Bus
Command
Comments
Operation
Block
Data = 0x20
Erase
Write
Addr = Block to be erased (BA)
Setup
Start
Write 0x20
Block Address
(Block Erase)
Write
Erase
Confirm
Read
None
Status Register data
Idle
None
Check SR[7]:
1 = WSM ready
0 = WSM busy
Write 0xD0,
(Erase Confirm )
Block Address
Suspend
Erase
Loop
Read Status
(2)
Register
No
0
SR[7] =
Suspend
Erase
Data = 0xD0
Addr = Block to be erased (BA)
Yes
Repeat for subsequent block erasures.
Full Status register check can be done after each block erase
or after a sequence of block erasures.
1
Full Erase
Status Check
(if desired)
Write 0xFF after the last operation to enter read array mode.
Block Erase
Complete
FULL ERASE STATUS CHECK PROCEDURE
Read Status
Register
SR[4,5] =
Bus
Command
Operation
1,1
SR[5] =
0
Idle
None
Check SR[4,5]:
Both 1 = Command Sequence Error
Idle
None
Check SR[5]:
1 = Block Erase Error
Idle
None
Check SR[1]:
1 = Attempted erase of locked block;
erase aborted.
Idle
None
Check SR[3]:
1 = VPP Range Error
Command
Sequence Error
0
Block Erase
Success
1
SR[1] =
1
Block Locked
Error
1
VPP Range
Error
0
SR[3] =
Comments
SR[1,3] must be cleared before the Write State Machine will
allow further erase attempts.
Only the Clear Status Register command clears SR[1, 3, 4, 5].
0
Erase Fail
April 2008
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attempting an erase retry or other error recovery.
.
Datasheet
105
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 57: Erase Suspend/Resume Flowchart
ERASE SUSPEND / RESUME PROCEDURE
Start
Write 0x70,
Same Partition
Write 0xB0,
Any Address
Bus
Command
Operation
(Read Status)
(Erase Suspend)
Read Status
Register
SR[7] =
SR[6] =
Read Array
Data
Read or
Program?
No
Read
Status
Write
Erase
Suspend
Read
None
Status Register data.
Addr = Same partition
Idle
None
Check SR[7]:
1 = WSM ready
0 = WSM busy
Idle
None
Check SR[6]:
1 = Erase suspended
0 = Erase completed
Erase
Completed
0
Write
1
Read
Write
0
1
Program
Read or
Write
Program
Loop
Write
Done
(Erase Resume)
(Read Status)
Datasheet
106
Write 0x70,
Same Partition
Data = 0x70
Addr = Any partition address
Data = 0xB0
Addr = Same partition address as
above
Read Array Data = 0xFF or 0x40
Addr = Any address within the
or Program
suspended partition
None
Read array or program data from/to
block other than the one being erased
Program Data = 0xD0
Resume Addr = Any address
If the suspended partition was placed in
Read Array mode or a Program Loop:
Write 0xD0,
Any Address
Erase
Resumed
Comments
Write
Read
Status
Register
Return partition to Status mode:
Data = 0x70
Addr = Same partition
Write 0xFF,
(Read Array)
Erased Partition
Read Array
Data
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 58: Main Array Block Lock Operations Flowchart
LOCKING OPERATIONS PROCEDURE
Start
Write 0x60,
Block Address
Bus
Command
Operation
(Lock Setup)
Write either
0x01/0xD0/0x2F, (Lock Confirm)
Block Address
Optional
Write 0x90
(Read Device ID)
Write
Lock
Setup
Data = 0x60
Addr = Block to lock/unlock/lock-down
Lock,
Data = 0x01 (Block Lock)
Unlock, or
0xD0 (Block Unlock)
Lock-Down
0x2F (Lock-Down Block)
Confirm Addr = Block to lock/unlock/lock-down
Write
Read
Data = 0x90
(Optional) Device ID Addr = Block address + offset 2
Read Block Lock Block Lock status data
(Optional) Status Addr = Block address + offset 2
Read Block
Lock Status
Locking
Change?
Write
Comments
No
Yes
Idle
None
Confirm locking change on D[1,0].
Write
Read
Array
Data = 0xFF
Addr = Block address
Write 0xFF
(Read Main
Array)
Partition Address
Lock Change
Complete
April 2008
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d
Datasheet
107
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 59: Protection Register Programming Flowchart
PROTECTION REGISTER PROGRAMMING PROCEDURE
Bus
Command
Operation
Start
Write 0xC0,
PR Address
Program Data = 0xC0
PR Setup Addr = First Location to Program
Write
Protection Data = Data to Program
Program Addr = Location to Program
(Confirm Data)
Read Status
Register
SR[7] =
Write
(Program Setup )
Write PR
Address & Data
Comments
Read
None
Status Register Data.
Idle
None
Check SR[7]:
1 = WSM Ready
0 = WSM Busy
Program Protection Register operation addresses must be
within the Protection Register address space. Addresses
outside this space will return an error.
0
1
Repeat for subsequent programming operations.
Full Status
Check
(if desired)
Full Status Register check can be done after each program, or
after a sequence of program operations.
Write 0xFF after the last operation to set Read Array state
.
Program
Complete
FULL STATUS CHECK PROCEDURE
Read Status
Register Data
SR[4] =
Bus
Command
Operation
0
Idle
None
Check SR[4]:
1 =Programming Error
Idle
None
Check SR[1]:
1 = Block locked; operation aborted
Idle
None
Check SR[3]:
1 =VPP Range Error
Protection Register
Program Pass
1
SR[1] =
1
Register Locked;
Program Aborted
0
SR[3] =
SR[3] must be cleared before the Write State Machine will
allow further program attempts.
1
0
Protection Register
Program Fail
Datasheet
108
Comments
VPP Range Error
Only the Clear Staus Register command clears SR[1 , 3, 4].
If an error is detected, clear the Status register before
attempting a program retry or other error recovery.
.
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 60: Blank Check Operation Flowchart
BLANK CHECK PROCEDURE
Start
Bus
Command
Operation
Blank
Write
Check
Setup
Blank
Write
Check
Confirm
Write 0xBC,
Block Address
Write 0xD0,
Block Address
Data = 0xBC
Addr = Block to be read (BA)
Data = 0xD0
Addr = Block to be read (BA)
Read
None
Status Register data.
Idle
None
Check SR[7]:
1 = WSM ready
0 = WSM busy
Read Status
Register
No
Comments
0
0
SR[7] =
Repeat for subsequent block Blank Check.
1
Full Status register check should be read after Blank Check
has been performed on each block.
Full Blank
Check Status
Read
Blank Check
FULL BLANK CHECK STATUS CHECK PROCEDURE
Read Status
Register
SR[4,5] =
Bus
Command
Operation
1,1
SR[5] =
0
Blank Check
Successful
April 2008
309823-10
1
Idle
None
Check SR[4,5]:
Both 1 = Command Sequence Error
Idle
None
Check SR[5]:
1 = Blank Check Error
Command
Sequence Error
0
Blank Check
Error
Comments
SR[1,3] must be cleared before the Write State Machine will
allow Blank Check to be performed.
Only the Clear Status Register command clears SR[1, 3, 4, 5].
If an error is detected, clear the Status register before
attempting a Blank Check retry or other error recovery.
Datasheet
109
Numonyx™ StrataFlash® Cellular Memory (M18)
12.0
Common Flash Interface
The Common Flash Interface (CFI) is part of an overall specification for multiple
command-set and control-interface descriptions. It describes the database structure
containing the data returned by a read operation after issuing the CFI Query command.
System software can parse this database structure to obtain information about the
flash device, such as block size, density, bus width, and electrical specifications. The
system software will then know which command set(s) to use to properly perform flash
writes, block erases, reads and otherwise control the flash device.
12.1
Query Structure Output
The Query database allows system software to obtain information for controlling the
flash device. This section describes the device’s CFI-compliant interface that allows
access to Query data.
Query data are presented on the lowest-order data outputs (A/DQ7-0) only. The
numerical offset value is the address relative to the maximum bus width supported by
the device. On this family of devices, the Query table device starting address is a 10h,
which is a word address for x16 devices.
For a word-wide (x16) device, the first two Query-structure bytes, ASCII “Q” and “R,”
appear on the low byte at word addresses 10h and 11h. This CFI-compliant device
outputs 00h data on upper bytes. The device outputs ASCII “Q” in the low byte
(A/DQ7-0) and 00h in the high byte (A/DQ15-8).
At Query addresses containing two or more bytes of information, the least significant
data byte is presented at the lower address, and the most significant data byte is
presented at the higher address.
In all of the following tables, addresses and data are represented in hexadecimal
notation, so the “h” suffix has been dropped. In addition, since the upper byte of wordwide devices is always “00h,” the leading “00” has been dropped from the table
notation and only the lower byte value is shown. Any x16 device outputs can be
assumed to have 00h on the upper byte in this mode.
Table 49: Summary of Query Structure Output as a Function of Device and Mode
Hex
Offset
Device
Device Addresses
Hex
Code
ASCII
00010:
51
“Q”
00011:
52
“R”
Table 50: Example of Query Structure Output of x16 Devices (Sheet 1 of 2)
Word Addressing
Offset
Byte Addressing
Hex Code
AX - A0
Value
A15 - A0
Offset
Hex Code
AX - A0
Value
A7 - A0
00010h
0051
“Q”
00010h
0051
“Q”
00011h
0052
“R”
00011h
0052
“R”
00012h
0059
“Y”
00012h
0059
“Y”
00013h
P_IDLO
PrVendor
00013h
P_IDLO
PrVendor
00014h
P_IDHI
ID#
00014h
P_IDLO
ID#
Datasheet
110
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 50: Example of Query Structure Output of x16 Devices (Sheet 2 of 2)
Word Addressing
Offset
Byte Addressing
Hex Code
AX - A0
Value
Offset
A15 - A0
AX - A0
00015h
PLO
PrVendor
00015h
00016h
PHI
TblAdr
00016h
00017h
A_IDLO
AltVendor
00017h
00018h
A_IDHI
ID#
00018h
12.2
Hex Code
Value
A7 - A0
P_IDHI
ID#
Block Status Register
The Block Status Register indicates whether an erase operation completed successfully
or whether a given block is locked or can be accessed for flash program/erase
operations.
Block Erase Status (BSR[1]) allows system software to determine the success of the
last block erase operation. BSR[1] can be used just after power-up to verify that the
VCC supply was not accidentally removed during an erase operation. Only issuing
another operation to the block resets this bit. The Block Status Register is accessed
from word address 02h within each block.
Table 51: Block Status Register
Offset
Length
(BA + 2)h
1
(BA + 2)h
Address
Value
Block Lock Status Register
BA + 2
-00 or -01
1
BSR.0 Block Lock Status:
0 = Unlocked
1 = Locked
BA + 2
(bit 0): 0 or 1
(BA + 2)h
1
BSR.1 Block Lock Down Status:
0 = Not Locked Down
1 = Locked Down
BA + 2
(bit 0): 0 or 1
(BA + 2)h
1
BSR.2-3, 6-7: Reserved for future use
BA + 2
(bit 0): 0 or 1
Note:
Description
BA = The beginning of a Block Address; that is, 020000h is the beginning location in word mode of the 256-KB block 1.
12.3
CFI Query Identification String
The Identification String provides verification that the component supports the
Common Flash Interface specification. It also indicates the specification version and
supported vendor-specified command set(s).
Table 52: CFI Identification (Sheet 1 of 2)
Offset
Length
10h
3
April 2008
309823-10
Description
Query unique ASCII string “QRY”
Address
Hex Code
Value
10
--51
“Q”
11
--52
“R”
12
--59
“Y”
Datasheet
111
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 52: CFI Identification (Sheet 2 of 2)
Offset
Length
Description
13h
2
Primary vendor command set and control interface ID code.
16-bit ID code for vendor-specified algorithms.
15h
2
Extended Query Table primary algorithm address.
17h
2
Alternate vendor command set and control interface ID code.
0000h means no second vendor-specified algorithm exists.
19h
2
Secondary algorithm Extended Query Table address. 0000h
means none exists.
Address
Hex Code
13
--00
14
--02
15
--0A
16
--01
17
--00
18
--00
19
--00
1A
--00
Value
Table 53: System Interface Information (Sheet 1 of 2)
Offset
Length
1Bh
1
1Ch
1Dh
Description
Address
Hex Code
Value
VCC logic supply minimum
program/erase voltage.
bits 0-3 BCD 100 mV
bits 4-7 BCD volts
1B
--17
1.7 V
1
VCC logic supply maximum
program/erase voltage.
bits 0-3 BCD 100 mV
bits 4-7 BCD volts
1C
--20
2.0 V
1
VPP [programming] supply
minimum program/erase voltage.
bits 0-3 BCD 100 mV
bits 4-7 hex volts
1D
--85
8.5 V
1Eh
1
VPP [programming] supply
maximum program/erase
voltage.
bits 0-3 BCD 100 mV
bits 4-7 hex volts
1E
--95
9.5 V
1Fh
1
“n” such that typical single word
program timeout = 2n µs.
1F
--06
64 µs
2048 µs (256, 512 Mbit 90 nm; 1024 Mbit - 65
nm)
1024 µs (128. 256, 512
Mbit - 65 nm)
20h
1
“n” such that typical full buffer
write timeout = 2n µs.
20
--0B (256, 512 Mbit - 90 nm;
1024 Mbit - 65 nm)
--0A (128. 256, 512 Mbit 65 nm)
21h
1
“n” such that typical block erase
timeout = 2n ms.
21
--0A
1s
22h
1
“n” such that typical full chip
erase timeout = 2 n ms.
22
--00
NA
23h
1
“n” such that maximum word
program timeout = 2n times
typical.
23
--02
256 µs
Datasheet
112
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 53: System Interface Information (Sheet 2 of 2)
Offset
Length
Description
Address
Hex Code
Value
1
“n” such that maximum buffer
write timeout = 2n times typical.
24
--02 (256, 512 Mbit - 90 nm;
128, 256, 512 Mbit - 65 nm)
--01 (1024 Mbit - 65 nm)
8192 µs (256, 512 Mbit 90 nm; 128, 256, 512
Mbit - 65 nm)
4096 µs (1024 Mbit - 65
nm)
24h
25h
1
“n” such that maximum block
erase timeout = 2n times typical.
25
--02
4s
26h
1
“n” such that maximum chip
erase timeout = 2n times typical.
26
--00
NA
12.4
Device Geometry Definition
Table 54: Device Geometry Definition
Offset
27h
Length
1
Description
n such that device size in bytes =
Address
2 n.
2
7
6
5
4
3
2
1
0
—
—
—
—
x64
x32
x16
x8
15
14
13
12
11
10
9
8
—
—
—
—
—
—
—
—
Table 55, “Device
Geometry Definition: Addr,
Hex Code, Value” on
page 114
28:
--01
29:
--00
--0A
--00
x16
2
n such that maximum number of bytes in write buffer = 2n.
2A:
2B:
2Ch
1
Number of erase block regions (x) within the device:
1) x = 0 means no erase blocking; the device erases in bulk.
2) x specifies the number of device regions with one or more
contiguous, same-size erase blocks.
3) Symmetrically blocked partitions have one blocking region.
2C:
2Dh
4
Erase block region 1 information:
bits 0 - 15 = y, y + 1 = number of identical-size erase blocks.
bits 16 - 31 = z, region erase block(s) size are z x 256 bytes.
2D:
2E:
2F:
30:
31h
4
Reserved for future erase block region information.
31:
32:
33:
34:
35h
4
Reserved for future erase block region information.
35:
36:
37:
38:
2Ah
April 2008
309823-10
Value
27:
Flash device interface code assignment: n such that n + 1 specifies
the bit field that represents the flash device width capabilities as
described here:
28h
Hex Code
1024
Table 55, “Device
Geometry
Definition: Addr,
Hex Code, Value”
on page 114
Datasheet
113
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 55: Device Geometry Definition: Addr, Hex Code, Value
128 Mbit
256 Mbit
512 Mbit
1 Gbit
Address
B
T
B
T
B
T
B
T
27
18
—
19
—
1A
—
1B
—
28
01
—
01
—
01
—
01
—
29
00
—
00
—
00
—
00
—
2A
0A
—
0A
—
0A
—
0A
—
2B
00
—
00
—
00
—
00
—
2C
01
—
01
—
01
—
01
—
2D
3F
—
7F
—
FF
—
FF
—
2E
00
—
00
—
00
—
01
—
2F
00
—
00
—
00
—
00
—
30
04
—
04
—
04
—
04
—
12.5
Numonyx-Specific Extended Query Table
Table 56: Primary Vendor-Specific Extended Query (Sheet 1 of 2)
Offset
P = 10Ah
Length
Description (Optional flash features and
commands
(P+0)h
(P+1)h
3
Primary extended query table.
Unique ASCII string PRI
(P+2)h
Address
Hex Code
Value
10A:
--50
P
10B:
--52
R
10C:
--49
I
(P+3)h
1
Major version number, ASCII
10D:
--31
1
(P+4)h
1
Minor version number, ASCII
10E:
--34
4
Datasheet
114
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 56: Primary Vendor-Specific Extended Query (Sheet 2 of 2)
Offset
P = 10Ah
Length
Description (Optional flash features and
commands
Optional feature and command support:
(1 = yes; 0 = no)
Bits 10 - 31 are reserved; undefined bits are 0.
If the value in bit 31 is 1, an additional 31 bit field of
optional features follows the bit 30 field.
(P+5)h
(P+6)h
(P+7)h
(P+8)h
4
Address
Hex Code
10F:
--E6 (Non-Mux)
--66 (A/D Mux)
110:
--07
111:
--00
112:
--00
Bit 0: Chip erase supported.
Bit 0 = 0
No
Bit 1: Suspend erase supported.
Bit 1 = 1
Yes
Bit 2: Suspend program supported.
Bit 2 = 1
Yes
Bit 3: Legacy lock/unlock supported.
Bit 3 = 0
No
Bit 4: Queued erase supported.
Bit 4 = 0
No
Bit 5: Instant individual block locking supported.
Bit 5 = 1
Yes
Bit 6: OTP bits supported.
Bit 6 = 1
Yes
Bit 7: Page mode read supported.
Bit 7 = 0
No: A/D Mux
Yes: Non-Mux
Bit 8: Synchronous read supported.
Bit 8 = 1
Yes
Bit 9: Simultaneous operations supported.
(P+9)h
1
Value
Bit 9 = 1
Yes
Bit 30: CFI links to follow.
Bit 30 = 0
No
Bit 31: Another Optional Features field to follow.
Bit 31 = 0
No
Supported functions after Suspend: Read Array, Status,
Query. Other supported options include:
Bits 1 - 7: Reserved; undefined bits are 0.
113:
Bit 0: Program supported after Erase Suspend.
--01
Bit 0 = 1
114:
115:
Yes
--33
--00
2
Block Lock Status Register mask: Bits 2 - 3 and 6 - 15
are reserved; undefined bits are 0.
2
Bit 0: Block Lock Bit Status register active.
Bit 0 = 1
Yes
2
Bit 1: Block Lock Down bit Status active.
Bit 1 = 1
Yes
(P+C)h
1
Vcc logic supply highest performance program/erase
voltage:
Bits 0 - 3: BCD value in 100 mV
Bits 4 - 7: BCD value in volts
116:
--18
1.8 V
(P+D)h
1
VPP optimum program/erase supply voltage:
Bits 0 - 3: BCD value in 100 mV
Bits 4 - 7: Hex value in volts
117:
--90
9.0 V
(P+A)h
(P+B)h
April 2008
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Datasheet
115
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 57: One Time Programmable (OTP) Register Information
Offset
P = 10Ah
(P+E)h
(P+F)h
(P+10)h
(P+11)h
(P+12)h
Length
1
4
Description
Address
Hex Code
Value
118:
--02
2
Bits 0 - 7 = Lock/bytes JEDEC plane physical low address.
119:
--80
80h
Bits 8 - 15 = Lock/bytes JEDEC plane physical high address.
11A:
--00
00h
Bits 16 - 23 = n where 2 equals factory preprogrammed bytes.
11B:
--03
8 byte
Bits 24 - 31 = n where 2n equals user programmable bytes.
11C:
--03
8 byte
11D:
11E:
11F:
120:
--89
--00
--00
--00
89h
00h
00h
00h
Bits 32 - 39 = n where n equals factory programmed groups (low
byte).
Bits 40 - 47 = n where n equals factory programmed groups
(high byte).
Bits 48 - 55 = n where 2n equals factory programmed bytes/
groups.
121:
122:
123:
--00
--00
--00
0
0
0
Bits 56 - 63 = n where n equals user programmed groups (low
byte).
Bits 64 - 71 = n where n equals user programmed groups (high
byte).
Bits 72 - 79 = n where n equals user programmable bytes/
groups.
124:
125:
126:
--10
--00
--04
16
0
16
Number of OTP register fields in JEDEC ID space. 00h indicates
that 256 OTP fields are available.
OTP Field 1: OTP Description: This field describes user available
OTP register bytes. Some are preprogrammed with device-unique
serial numbers. Others are user programmable.
Bits 0 - 15 point to the OTP register Lock byte, the register’s first
byte.
The following bytes are factory preprogrammed and userprogrammable:
n
OTP Field 2: OTP Description
Bits 0 - 31 point to the OTP register physical Lock word address in
the JEDEC plane.
(P+13)h
(P+14)h
(P+15)h
(P+16)h
(P+17)h
(P+18)h
(P+19)h
(P+1A)h
(P+1B)h
(P+1C)h
Datasheet
116
The following bytes are factory or user programmable:
10
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 58: Burst Read Information
Offset
P = 10Ah
Length
Description (Optional flash features and
commands)
Address
Hex Code
Value
127:
--05 (Non Mux)
--00 (A/D Mux
32-byte (Non Mux)
0 (AD Mux)
(P+1D)h
1
Page Mode Read capability:
Bits 0 - 7 = n where 2n hex value represents the
number of read-page bytes. See offset 28h for
device word width to determine page-mode data
output width. 00h indicates no read page buffer.
(P+1E)h
1
Number of synchronous mode read configuration
fields that follow. 00h indicates no burst capability.
128:
--03
3
1
Synchronous mode read capability configuration 1:
Bits 3 - 7 = Reserved.
Bits 0 - 2 = n where 2n+1 hex value represents the
maximum number of continuous synchronous reads
when the device is configured for its maximum word
width.
A value of 07h indicates that the device is capable of
continuous linear bursts that will output data until
the internal burst counter reaches the end of the
device’s burstable address space.
This fields’s 3-bit value can be written directly to the
Read Configuration Register bits 0 - 2 if the device is
configured for its maximum word width. See offset
28h for word width to determine the burst data
output width.
129:
--02
8
(P+1F)h
(P+20)h
1
Synchronous mode read capability configuration 2.
12A:
--03
16
(P+21)h
1
Synchronous mode read capability configuration 3.
12B:
--07
Cont
Table 59: Partition and Erase Block Information—Region 1 (Sheet 1 of 2)
Offset
P = 10Ah
Bottom
(P+22)h
Address
Description (Optional flash features and commands)
Length
Top
(P+22)h
Number of device hardware partition regions with the device:
x = 0: a single hardware partition device (no fields follow). x specifies the
number of device partition regions containing one or more contiguous
erase block regions.
1
Bottom
Top
12C:
12C:
12D:
12D:
12E:
12E:
Partition Region 1 Information
(P+23)h
(P+23)h
(P+24)h
(P+24)h
Data size of this Partition Region information field: (number of
addressable locations, including this field.
2
Number of identical partitions within the partition region.
1
(P+25)h
(P+25)h
(P+26)h
(P+26)h
(P+27)h
(P+27)h
Number of Program or Erase operations allowed in a partition:
Bits 0 - 3 = Number of simultaneous Program operations.
Bits 4 - 7 = Number of simultaneous Erase operations.
(P+28)h
(P+29)h
April 2008
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12F:
12F:
130:
130:
1
131:
131:
(P+28)h
Number of Program or Erase operations allowed in other partitions while a
partition in this region is in Program mode:
Bits 0 - 3 = Number of simultaneous Program operations.
Bits 4 - 7 = Number of simultaneous Erase operations.
1
132:
132:
(P+29)h
Number of Program or Erase operations allowed in other partitions while a
partition in this region is in Erase mode:
Bits 0 - 3 = Number of simultaneous Program operations.
Bits 4 - 7 = Number of simultaneous Erase operations.
1
133:
133:
Datasheet
117
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 59: Partition and Erase Block Information—Region 1 (Sheet 2 of 2)
Offset
P = 10Ah
Bottom
(P+2A)h
Address
Description (Optional flash features and commands)
Length
Top
Types of erase block regions in this partition region:
x = 0: No erase blocking; the partition region erases in bulk.
x = Number of erase block regions with contiguous, same-size erase
blocks.
Symmetrically blocked partitions have one blocking region.
Partition size = (Type 1 blocks) x (Type 1 block sizes) + (Type 2 blocks) x
(Type 2 block sizes) +...+ (Type n blocks) x (Type n block sizes).
(P+2A)h
(P+2B)h
(P+2B)h
(P+2C)h
(P+2C)h
4
Partition 1 (Erase Block Type 1):
Block erase cycles x 1000
2
(P+31)h
Partition 1 (Erase Block Type 1) bits per cell; internal EDAC:
Bits 0 - 3 = bits per cell in erase region
Bit 4 = internal EDAC used (1=yes, 0=no)
Bit 5 - 7 = reserved for future use
(P+32)h
(P+32)h
Partition 1 (Erase Block Type 1) page mode and synchronous mode
capabilities:
Bits 0 = page mode host reads permitted (1=yes, 0=no)
Bit 1 = synchronous host reads permitted (1=yes, 0=no)
Bit 2 = synchronous host writes permitted (1=yes, 0=no)
Bit 3 - 7 = reserved for future use
(P+33)h
(P+33)h
(P+34)h
(P+34)h
(P+35)h
(P+35)h
(P+2D)h
(P+2E)h
(P+2E)h
(P+2F)h
(P+2F)h
(P+30)h
(P+30)h
(P+31)h
(P+36)h
(P+36)h
(P+37)h
(P+37)h
(P+38)h
(P+38)h
Partition 1 (Erase Block Type 1) programming region information:
Bits 0 - 7 = x, 2x: programming region aligned size (bytes)
Bit 8 - 14 = reserved for future use
Bit 15 = legacy flash operation; ignore 0:7
Bit 16 - 23 = y: control mode valid size (bytes)
Bit 24 - 31 = reserved for future use
Bit 32 - 39 = z: control mode invalid size (bytes)
Bit 40 - 46 = reserved for future use
Bit 47 = legacy flash operation (ignore 23:16 and 39:32)
Top
134:
134:
135:
135:
136:
136:
137:
137:
138:
138:
1
Partition region 1 erase block type 1 information:
Bits 0 - 15 = y, y + 1: Number of identical-sized erase blocks in a
partition.
Bits 16 - 30 = z, where region erase block(s) size is z x 256 bytes.
(P+2D)h
Bottom
139:
139:
13A:
13A:
1
13B:
13B:
1
13C:
13C:
13D:
13D:
13E:
13E:
13F:
13F:
140:
140:
141:
141:
142:
142:
6
Table 60: Partition and Erase Block Region Information (Sheet 1 of 2)
128 Mbit
256 Mbit
512 Mbit
1 Gbit
Address
12C:
B
T
B
T
B
T
B
T
--01
—
--01
—
--01
—
--01
—
12D:
--16
—
--16
—
--16
—
--16
—
12E:
--00
—
--00
—
--00
—
--00
—
12F:
--08
—
--08
—
--08
—
--08
—
130:
--00
—
--00
—
--00
—
--00
—
131:
--11
—
--11
—
--11
—
--11
—
132:
--00
—
--00
—
--00
—
--00
—
133:
--00
—
--00
—
--00
—
--00
—
Datasheet
118
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 60: Partition and Erase Block Region Information (Sheet 2 of 2)
128 Mbit
256 Mbit
512 Mbit
1 Gbit
Address
B
T
B
T
B
T
B
T
134:
--01
—
--01
—
--01
—
--01
—
135:
--07
—
--0F
—
--1F
—
--3F
—
136:
--00
—
--00
—
--00
—
--00
—
137:
--00
—
--00
—
--00
—
--00
—
138:
--04
—
--04
—
--04
—
--04
—
139:
--64
—
--64
—
--64
—
--64
—
13A:
--00
—
--00
—
--00
—
--00
—
13B:
--12
—
--12
—
--12
—
--12
—
13C:
--02 Mux
--03 Non Mux
—
--02 Mux
--03 Non Mux
—
--02 Mux
--03 Non Mux
—
--02 Mux
--03 Non Mux
—
13D:
--0A
—
--0A
—
--0A
—
--0A
—
13E:
--00
—
--00
—
--00
—
--00
—
13F:
--10
—
--10
—
--10
—
--10
—
140:
--00
—
--00
—
--00
—
--00
—
141:
--10
—
--10
—
--10
—
--10
—
142:
--00
—
--00
—
--00
—
--00
—
April 2008
309823-10
Datasheet
119
Numonyx™ StrataFlash® Cellular Memory (M18)
13.0
Next State
The Next State Table shows command inputs and the resulting next state of the chip.
The Output Next State Table shows command inputs and the resulting output
multiplexed next state of the chip.
Table 61: Next State Table (Sheet 1 of 7)
OTP
Busy
IS in OTP
Busy
Datasheet
120
IS
in
OT
P
Bu
sy
OT
P
Bu
sy
OTP Busy
Re
ad
y
(U
nlo
ck
Blo
ck)
(C
0h
)
(0
1h
)
(2
Fh
)
(0
3h
,
04
h)
Lo
ck
/
RC
R
/
EC
R
Se
tu
p
BC
Se
tu
p
OT
P
Se
tu
p
(9)
(5)
(5)
Blank Check
Lock/RCR/ECR Setup
Ready (Lock Error [Botch])
Re
ad
y
(L
oc
k
Er
ror
[B
ot
ch
])
Ready
Re
ad
y
(L
oc
k
Bl
oc
k)
Re
ad
y
(L
oc
k
do
wn
Bl
oc
k)
Re
ad
y
(S
et
CR
)
OTP Busy
IS in
OTP
Busy
OTP Busy
Illegal State
in OTP Busy
OTP Busy
(2)
(B
Ch
)
WSM Operation Completes
(9
0h
,
98
h)
Other Commands
(9)
Write ECR/RCR Confirm
Ready
Read ID/Query
(6)
(5
0h
)
Block Address Change
(9)
Lock-down Blk Confirm
BE
FP
Se
tu
p
(7
0h
)
OTP Busy
OT
P
Bu
sy
(6
0h
)
(5)
Er
as
e
Se
tu
p
(B
0)
Clear SR
(D
0h
)
Read Status
(8
0h
)
Pgm/Ers Suspend
Confirm
(9)
BEFP Setup
(4,12)
(4,5,12)
Erase Setup
(2
0h
)
Ready (Lock
Error [Botch])
Lock/RCR/ECR
Setup
Setup
(E
9h
)
BP
Se
tu
p
Lock Blk Confirm
Re
ad
y
Pr
og
rm
Se
tu
p
(13)
(4
1h
)
BP Setup
(F
Fh
)
OTP Setup
Ready
Word Pgm Setup
Current Chip State
Array Read
(3)
(4,5,12)
Command Input and Resulting Chip Next State
(x
xh
)
other
N/
A
Ready
N/
A
N/
A
Ready
(Lock Error
[Botch])
N/
A
N/
A
OTP Busy
N/
A
N/
A
OTP Busy
Re
ad
y
OTP Busy
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 2 of 7)
Busy
Word
Progra
m
(0
3h
,
04
h)
(9)
(x
xh
)
other
N/
A
Pgm Busy
Word Pgm
Busy
N/
A
Pgm Busy
Word
Program
Suspend
N/
A
Word Pgm
Susp
Word Program Busy
Pg
m
Bu
sy
IS
in
Pg
m
Bu
sy
Pg
m
Bu
sy
IS in
Pgm
Busy
Pg
m
Bu
sy
Pg
m
Su
sp
Word Pgm
Busy
IS in Word
Pgm Busy
Suspend
Pg
m
Su
sp
(E
r
bit
s
cle
ar)
Pg
m
Su
sp
IS
in
Pg
m
Su
sp
Pg
m
Su
sp
en
d
IS in
Pgm
Susp
Pg
m
Bu
sy
Pgm
Susp
W
or
d
Pg
m
Su
sp
Illegal State
in Pgm
Suspend
WSM Operation Completes
(2
Fh
)
(2)
Write ECR/RCR Confirm
(0
1h
)
(5)
(5)
(B
Ch
)
Other Commands
(9)
Lock-down Blk Confirm
(6
0h
)
Block Address Change
(9)
Lock Blk Confirm
(9
0h
,
98
h)
Word Pgm Busy
April 2008
309823-10
OTP Setup
(5
0h
)
Blank Check
(6)
(7
0h
)
IS in Pgm
Busy
IS in Pgm
Suspend
(C
0h
)
(5)
Setup
(B
0)
Lock/RCR/ECR Setup
(D
0h
)
Read ID/Query
(8
0h
)
Clear SR
(2
0h
)
Read Status
(E
9h
)
Pgm/Ers Suspend
Confirm
(9)
BEFP Setup
(4,12)
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input and Resulting Chip Next State
N/
A
Re
ad
y
N/
A
Word Program Suspend
Datasheet
121
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 3 of 7)
BP Load 2
Datasheet
122
(x
xh
)
other
Re
ad
y
(E
rro
r
[B
ot
ch
])
BP Confirm
if data load
in program
buffer is
complete,
else BP
load 2
WSM Operation Completes
(9)
(2)
Write ECR/RCR Confirm
(0
3h
,
04
h)
Other Commands
(9)
Lock-down Blk Confirm
(2
Fh
)
Block Address Change
(9)
Lock Blk Confirm
(0
1h
)
(5)
(5)
Blank Check
(B
Ch
)
BP Confirm if data load in program buffer is complete, ELSE BP load 2
(10)
Re
ad
y
(E
rro
r
[B
ot
ch
])
BP Busy
BP
Bu
sy
IS in BP
Busy
BP
Bu
sy
IS in BP
Suspend
(6
0h
)
BP Load 2 if word count >0, else BP confirm
(10)
BP
Suspend
(9
0h
,
98
h)
BP Load 1
BP Load 1
Buffer
Progra
m
(BP)
OTP Setup
(5
0h
)
Setup
BP
Confirm
(C
0h
)
(5)
(7
0h
)
(6)
(B
0)
Lock/RCR/ECR Setup
(D
0h
)
Read ID/Query
(8
0h
)
Clear SR
(2
0h
)
Read Status
(E
9h
)
Pgm/Ers Suspend
(9)
Confirm
(4,12)
BEFP Setup
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input and Resulting Chip Next State
BP
Su
sp
IS
in
BP
Bu
sy
IS
in
BP
Su
sp
BP
Bu
sy
Ill
eg
al
St
at
e
in
BP
Bu
sy
BP
Su
sp
en
d
Ill
eg
al
St
at
e
in
BP
Bu
sy
BP
Bu
sy
Re
ad
y
(E
rro
r
[B
ot
ch
])
BP
Bu
sy
BP
Su
sp
BP
Bu
sy
BP
Su
sp
en
d
BP
Bu
sy
BP
Su
sp
(E
r
bit
s
cle
ar)
BP
Su
sp
IS
in
BP
Bu
sy
BP
Bu
sy
BP
Bu
sy
IS
in
BP
Su
sp
BP
Su
sp
en
d
N/
A
N/
A
Re
ad
y
BP Susp
N/
A
BP
Su
sp
en
d
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 4 of 7)
Setup
Busy
IS
in
Er
as
e
Bu
sy
Er
as
e
Bu
sy
Era
se
Bu
sy
Era
se
Bu
sy
Er
as
e
Su
sp
W
or
d
Pg
m
Se
tu
p
in
Er
as
e
Su
sp
BP
Se
tu
p
in
Er
as
e
Su
sp
IS in
Erase
Suspen
d
Er
as
e
Su
sp
Erase Busy
(9)
(5)
IS in Erase
Busy
WSM Operation Completes
Write ECR/RCR Confirm
(0
3h
,
04
h)
(2)
Lock-down Blk Confirm
(2
Fh
)
Other Commands
(9)
Lock Blk Confirm
(0
1h
)
Block Address Change
(9)
OTP Setup
(5)
Lock/RCR/ECR Setup
Blank Check
(B
Ch
)
(x
xh
)
other
N/
A
Ready (Err
Botch0])
N/
A
Erase Busy
N/
A
Erase Busy
Re
ad
y
Era
se
Bu
sy
Erase
Suspen
d
Er
as
e
Su
sp
(E
r
bit
s
cle
ar)
Er
as
e
Su
sp
Lo
ck
/
RC
R/
EC
R
Se
tu
p
in
Er
as
e
Su
sp
Er
as
e
Su
sp
IS
in
Er
as
e
Su
sp
Erase
Suspend
N/
A
Erase Susp
N/
A
Word Pgm
Busy in Ers
Suspend
N/
A
Erase Suspend
Setup
April 2008
309823-10
(6
0h
)
Ready (Error [Botch])
IS in Erase
Susp
Busy
(9
0h
,
98
h)
(5
0h
)
Erase Busy
Erase
Word
Progra
m in
Erase
Suspe
nd
(6)
(7
0h
)
IS in Erase
Busy
Suspend
(C
0h
)
(5)
IS in
Erase
Busy
(B
0)
Read ID/Query
(D
0h
)
Clear SR
(8
0h
)
Read Status
(2
0h
)
Pgm/Ers Suspend
(E
9h
)
Ready (Error [Botch])
Er
as
e
Bu
sy
(9)
Confirm
(4,12)
BEFP Setup
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input and Resulting Chip Next State
Word Pgm busy in Erase Suspend
W
or
d
Pg
m
bu
sy
in
Er
as
e
Su
sp
IS
in
Pg
m
bu
sy
in
Er
s
Su
sp
W
or
d
Pg
m
bu
sy
in
Er
as
e
Su
sp
IS in
Word
Pgm
busy in
Ers
Susp
Wo
rd
Pg
m
bu
sy
in
Era
se
Su
sp
W
or
d
Pg
m
Su
sp
in
Er
s
Su
sp
Word Pgm
busy in Erase
Susp
IS in Word
Pgm busy in
Ers Susp
Word Pgm busy in Erase Susp
N/
A
Er
as
e
Su
sp
Datasheet
123
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 5 of 7)
Suspend
Illegal
State in
Word
Program
Suspend
in Erase
Suspend
Datasheet
124
(2
Fh
)
(0
3h
,
04
h)
(x
xh
)
(9)
Word Pgm
busy in
Erase
Suspend
Word Pgm busy in Erase Suspend
W
or
d
Pg
m
su
sp
in
Er
as
e
Su
sp
iS
in
pg
m
su
sp
in
Er
as
e
Su
sp
W
or
d
Pg
m
su
sp
in
Er
as
e
Su
sp
IS in
pgm
susp in
Erase
Susp
Wo
rd
Pg
m
bu
sy
in
Era
se
Su
sp
W
or
d
Pg
m
su
sp
in
Er
as
e
Su
sp
W
or
d
Pg
m
Su
sp
in
Er
as
e
Su
sp
W
or
d
Pg
m
Su
sp
in
Er
as
e
Su
sp
:
Er
ror
bit
s
cle
ar
W
or
d
Pg
m
Su
sp
in
Er
as
e
Su
sp
IS in Word
Pgm Susp in
Erase Susp
Word Pgm Suspend in Erase Suspend
other
Word Pgm
Susp in
Erase Susp
N/
A
WSM Operation Completes
Write ECR/RCR Confirm
(0
1h
)
(2)
Lock-down Blk Confirm
(B
Ch
)
(5)
Blank Check
(5)
(6
0h
)
Other Commands
(9)
Lock Blk Confirm
(9
0h
,
98
h)
Block Address Change
(9)
OTP Setup
(C
0h
)
(5)
(5
0h
)
Lock/RCR/ECR Setup
(7
0h
)
(6)
(B
0)
Read ID/Query
(D
0h
)
Clear SR
(8
0h
)
Read Status
(2
0h
)
Pgm/Ers Suspend
(E
9h
)
Illegal
State (IS)
in Pgm
busy in
Erase
Suspend
Word
Progra
m in
Erase
Suspe
nd
(9)
Confirm
(4,12)
BEFP Setup
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input and Resulting Chip Next State
IS
in
Er
as
e
Su
sp
Word Pgm
Susp in
Erase Susp
N/
A
Word
PgmSuspen
d in Erase
Suspend
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 6 of 7)
BP Load 2
Erase Suspend (Error
[BotchBP])
BP
Bu
sy
in
Er
as
e
Su
sp
IS
in
BP
Bu
sy
in
Er
as
e
Su
sp
BP
Bu
sy
in
Er
as
e
Su
sp
BP
Bu
sy
in
Ers
Su
sp
Illegal State
in BP Busy in
Erase Susp
IS in BP
Busy
April 2008
309823-10
(x
xh
)
other
Er
as
e
Su
sp
:
Er
ror
[B
ot
ch
]
BP Confirm
in Erase
Suspend
when
count=0,
ELSE BP
load 2
N/
A
BP Busy in
Erase Susp
WSM Operation Completes
(9)
(2)
Write ECR/RCR Confirm
(0
3h
,
04
h)
Other Commands
(9)
Lock-down Blk Confirm
(2
Fh
)
Block Address Change
(9)
Lock Blk Confirm
(0
1h
)
(5)
(5)
Blank Check
(B
Ch
)
BP Confirm if data load in program buffer is complete, ELSE BP load 2
(10)
BP Susp
(6
0h
)
BP Load 2 if word count >0, else BP confirm
(10)
BP Busy
(9
0h
,
98
h)
BP Load 1
BP Load 1
BP in
Erase
Suspe
nd
OTP Setup
(5
0h
)
Setup
BP
Confirm
(C
0h
)
(5)
(7
0h
)
(6)
(B
0)
Lock/RCR/ECR Setup
(D
0h
)
Read ID/Query
(8
0h
)
Clear SR
(2
0h
)
Read Status
(E
9h
)
Pgm/Ers Suspend
(9)
Confirm
(4,12)
BEFP Setup
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input and Resulting Chip Next State
Erase Susp: Error [Botch BP]
BP
Su
sp
in
Er
as
e
Su
sp
BP Busy in
Erase Susp
IS in BP Busy
in Erase
Suspend
BP Busy in
Erase Susp
IS
in
BP
Su
sp
in
Er
as
e
Su
sp
BP
Su
sp
in
Er
as
e
Su
sp
Illegal
State in
BP Busy
in Erase
Susp
BP
Bu
sy
in
Era
se
Su
sp
BP Susp
in Erase
Susp
BP
Su
sp
in
Er
as
e
Su
sp
:
Er
ror
bit
s
cle
ar
BP
Su
sp
in
Er
as
e
Su
sp
IS in BP Busy
in Erase
Suspend
Er
as
e
Su
sp
IS
in
Er
as
e
Su
sp
BP Busy in Erase Suspend
BP
Su
sp
in
Er
as
e
Su
sp
N/
A
BP Susp in
Erase Susp
N/
A
BP Susp in
Erase Susp
N/
A
Datasheet
125
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 61: Next State Table (Sheet 7 of 7)
BC
Bu
sy
IS in BC
Busy
BEFP
BEFP Busy
Datasheet
126
(B
Ch
)
(2
Fh
)
(0
3h
,
04
h)
(x
xh
)
other
Er
as
e
Su
sp
:
Er
ror
[B
ot
ch
]
Er
as
e
Su
sp
Bl
k
Lo
ck
Er
as
e
Su
sp
Bl
k
Lk
Do
wn
Er
as
e
Su
sp
CR
Se
t
Erase Susp: Lock Error
[Botch]
N/
A
Erase
Susp: Error
[Botch]
N/
A
Ready:
Error
[Botch]
N/
A
IS in BC
Busy
BC Busy
N/
A
BC Busy
Ready: Error [Botch]
BE
FP
Lo
ad
Da
ta
Other Commands
(9)
Ready: Error [Botch]
(2)
(0
1h
)
(5)
(5)
(6
0h
)
BC Busy
WSM Operation Completes
(9
0h
,
98
h)
Block Address Change
(9)
Write ECR/RCR Confirm
(5
0h
)
Blank Check
(6)
(7
0h
)
BC Busy
IS in Blank
Check
Busy
Setup
(9)
BC
Bu
sy
IS
in
BC
Bu
sy
Lock-down Blk Confirm
Ready (Error [Botch])
BC
Bu
sy
Lock Blk Confirm
Setup
Blank
Check
Busy
OTP Setup
Erase Suspend: Lock
Error [Botch]
Blank
Check
(BC)
(C
0h
)
(5)
Lock/RCR/ECR
Setup in Erase
Suspend
Era
se
Su
sp:
Un
loc
k
Blo
ck
(B
0)
Lock/RCR/ECR Setup
(D
0h
)
Read ID/Query
(8
0h
)
Clear SR
(2
0h
)
Read Status
(E
9h
)
Pgm/Ers Suspend
(9)
Confirm
(4,12)
BEFP Setup
(4,5,12)
Erase Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
Word Pgm Setup
Current Chip State
Array Read
(3)
(4,5,12)
Command Input and Resulting Chip Next State
Re
ad
y
BC Busy
N/
A
Ready: Error [Botch]
BEFP Program and Verify Busy (if Block Address given matches address given on
BEFP Setup command). Commands treated as data. (7)
Re
ad
y
BEFP Busy
Re
ad
y
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 62: Output Next State Table
(0
3h
,
04
h)
ot
he
r
WSM Operation Completes
(2
Fh
)
(9)
(2)
Write ECR/RCR Confirm
(0
1h
)
Other Commands
(9)
Lock-down Blk Confirm
(B
Ch
)
(5)
(5)
Blank Check
Lock/RCR/ECR Setup
(6
0h
)
Block Address Change
(9)
Lock Blk Confirm
(9
0h
,
98
h)
Status
Read
Status
Read
Status Read
Output MUX
does not
change
Output MUX does not Change
Output
MUX
does
not
Change
ID/Query Read
Status Read
Array Read
Status
Read
Output MUX does not Change
BP Busy
BP Busy in Erase Suspend
Word Program Busy,
Word Prgm Busy in Erase
Suspend,
Erase Busy
Status Read
Output MUX will not change
Output MUX does not change
BP Setup, Load 1, Load 2
BP Setup, Load1, Load 2 in Erase Susp.
Status
Read
Array Read
Ar
ra
y
Re
ad
Output MUX does not change
Status Read
Status Read
OTP Busy
OTP Setup
(5
0h
)
Read ID/Query
(6)
(7
0h
)
Lock/RCR/ECR Setup,
Lock/RCR/ECR Setup in
Erase Susp
Ready,
Word Prgm Suspend,
BP Suspend,
Phase-1 BP Suspend,
Erase Suspend,
BP Suspend in Erase
Suspend
(C
0h
)
(5)
BEFP Setup,
BEFP Pgm & Verify Busy,
Erase Setup,
OTP Setup,
BP Confirm
WordPgmSetup,
Word Pgm Setup in Erase
Susp,
BP Confirm in Erase
Suspend,
Blank Check Setup,
Blank Check Busy
(B
0)
Clear SR
(D
0h
)
Read Status
Confirm
(8
0h
)
Pgm/Ers Suspend
(4,12)
BEFP Setup
(2
0h
)
(9)
(4,5,12)
(E
Bh
)
Erase Setup
(E
9h
)
Generic Command Setup
(4
1h
)
(13)
(F
Fh
)
BP Setup
(4,5,12)
Word Pgm Setup
Current Chip State
Array Read
(3)
Command Input to Chip and Resulting Output MUX Next State
SR
Re
ad
Notes:
1.
The Partition Data When Read field shows what users read from the flash chip after issuing the appropriate command,
given the Partition Address is not changed from the address given during the command. Read-while-write functionality
gives more flexibility in data output from the device. The data read from the chip depends on the Partition Address applied
to the device. Depending on the command issued to the chip, each partition is placed into one of the following three
output states during commands: Read Array, Read Status or Read ID/CFI. This partition's output state is retained until a
April 2008
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127
Numonyx™ StrataFlash® Cellular Memory (M18)
2.
3.
4.
5.
6.
7.
8.
9.
10.
11.
12.
13.
new command is issued to the chip at that Partition Address. This allows the user to set partition #1's output state to Read
Array, and partition #4's output state to Read Status. Each time the partition address is changed to partition #4 (without
issuing a new command), the Status will be read from the chip.
Illegal commands include commands outside of the allowed command set (allowed commands: 41H [pgm], 20H [erase],
etc.)
All partitions default to Read Array on powerup.
If a Read Array is attempted from a busy partition, the result is unreliable data. When the user returns to this partition
address later, the output mux will be in the “Read Array” state from its last visit. the Read ID and Read Query commands
perform the same function in the device. The ID and Query data are located at different locations in the address map.
1st and 2nd cycles of "2 cycles write commands" must be given to the same partition address, or unexpected results will
occur.
The Clear Status command clears only the error bits in the status register if the device is not in the following modes: 1)
WSM running (Pgm Busy, Erase Busy, Pgm Busy In Erase Suspend, OTP Busy, BEFP modes) 2) Suspend states (Erase
Suspend, Pgm Suspend, Pgm Suspend In Erase Suspend).
BEFP writes are allowed only when the status register bit #0 = 0 or else the data is ignored.
The current state is that of the chip and not of the partition. Each partition remembers which output (Array, ID/CFI or
Status) it was last pointed to on the last instruction to the chip, but the next state of the chip does not depend on where
the partition's output mux is presently pointing to.
Confirm commands (Lock Block, Unlock Block, Lock-Down Block, Configuration Register and Blank Check) perform the
operation and then move to the Ready State.
Buffered programming will botch when a different block address (as compared to address given with E9 command) is
written during the BP Load1 and BP Load2 states.
WA0 refers to the block address latched during the first write cycle of the current operation.
All two cycle commands are considered as a contiguous whole during device suspend states. Individual commands are not
parsed separately; that is, the 2nd cycle of an erase command issued in program suspend will NOT resume the program
operation.
The Buffered Program setup command (0xE9) will not change the partition state. The Buffered Program Confirm command
(0xD0) will place the partition in read status mode.
Appendix A AADM Mode
A.1
AADM Feature Overview
The following is a list of general requirements for AADM mode. Additional details can be
found in subsequent sections.
• Feature Availability: AADM mode is available in devices that are configured as A/
D MUX. With this configuration, AADM mode is enabled by setting a specific volatile
bit in the RCR.
• High Address Caputure (A[MAX:16]): When AADM mode is enabled,
A[MAX:16] and A[15:0] are captured from the A/DQ[15:0] balls. The selection of
A[MAX:16] or A[15:0] is determined by the state of the OE# input, as A[MAX:16]
is captured when OE# is at VIL.
• Read & Write Cycle Support: In AADM mode, both asynchronous and
synchronous Cycles are supported.
• Customer Requirements: For AADM operation, the customer is required to
ground A16-Amax.
• Other Characteristics: For AADM, all other device characteristics (pgm time,
erase time, ICCS, etc.) are the same as A/D MUX unless otherwise stated.
A.2
AADM Mode Enable (RCR[4]=1)
Setting RCR.4 to its non-default state (‘1b) enables AADM mode:
• The default device configuration upon Reset or Powerup is A/D MUX Mode
• Upon setting RCR[4]=1, the upper Addresses A[max:16] are latched as all 0’s by
default.
Datasheet
128
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Numonyx™ StrataFlash® Cellular Memory (M18)
A.3
Bus Cycles and Address Capture
AADM bus operations have one or two address cycles. For two address cycles, the
upper address (A[MAX:16]) must be issued first, followed by the lower address
(A[15:0]). For bus operations with only one address cycle, only the lower address is
issued. The upper address that applies is the one that was most recently latched on a
previous bus cycle. For all read cycles, sensing begins when the lower address is
latched, regardless of whether there are one or two address cycles.
In bus cycles, the external signal that distinguishes the upper address from the lower
address is OE#. When OE# is at VIH, a lower address is captured; when OE# is at VIL,
an upper address is captured.
When the bus cycle has only one address cycle, the timing waveform is similar to A/D
MUX mode. The lower address is latched when OE# is at VIH, and data is subsequently
outputted after the falling edge of OE#.
Note:
When the device initially enters AADM mode, the upper address is internally latched as
all 0’s.
A.3.1
WAIT Behavior
The WAIT behavior in AADM mode functions the same as the legacy M18 non-MUX
WAIT behavior (ADMux WAIT behavior is unique). In other words, WAIT will always be
driven whenever DQ[15:0] is driven, and WAIT will tri-state whenever DQ[15:0] tristate. In asynchronous mode (RCR[15] = ‘1b), WAIT always indicates “valid data”
when driven. In synchronous mode (RCR[15] = ‘0b), WAIT indicates “valid data” only
after the latency count has lapsed and the data output data is truly valid.
A.3.2
Asynchronous Read and Write Cycles
For asynchronous read and write cycles, ADV# must be toggled high-low-high a
minimum of one time and a maximum of two times during a bus cycle. If ADV# is
toggled low twice during a bus cycle, OE# must be held low for the first ADV# rising
edge and OE# must be held high for the second ADV# rising edge. The first ADV#
rising edge (with OE# low) captures A[MAX:16]. The second ADV# rising edge (with
OE# high) captures A[15:0]. Each bus cycle must toggle ADV# high-low-high at least
one time in order to capture A[15:0]. For asynchronous reads, sensing begins when the
lower address is latched.
During asynchronous cycles, it is optional to capture A[MAX:16]. If these addresses are
not captured, then the previously captured A[MAX:16] contents will be used.
A.3.2.1
Asynchronous Read Cycles
For asynchronous read and latching specifications, refer to Table 63, “AADM
Aynchronous and Latching Timings” on page 130. For asynchronous read timing
diagrams, refer to Figure 61, “AADM Asynchronous Read Cycle (Latching A[MAX:0])”
on page 130 and Figure 62, “AADM Asynchronous Read Cycle (Latching A[15:0] only)”
on page 131. For AADM, note that asynchronous read access is from the rising edge of
ADV# rather than the falling edge. (i.e. TVHQV rather than TVLQV)
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129
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 63: AADM Aynchronous and Latching Timings
Num
Sym
Min (nS)
Max (nS)
Num
Sym
Min (nS)
R4
tGLQV
20
R17
tGHTZ
R5
tPHQV
150
R101
tAVVH
5
9
R6
tELQX
0
R102
tELVH
9
R7
tGLQX
0
R104
tVLVH
7
R8
tEHQZ
9
R105
tVHVL
7
R9
tGHQZ
9
R106
tVHAX
5
3
R10
tOH
0
R107
tVHGL
R11
tEHEL
7
R109
tVHQV(1)
96
R12
tELTV
11
R111
tPHVH
30
R13
tEHTZ
9
R127
tGHVH
3
R15
tGLTV
7
R128
tGLVH
3
R16
tGLTX
R129
tVHGH
3
0
Max (nS)
Notes:
1.
TVHQV applies to asynchronous read access time.
2.
A read cycle may be restarted prior to completing a pending read operation, but this may occur only once before the sense
operation is allowed to complete.
Figure 61: AADM Asynchronous Read Cycle (Latching A[MAX:0])
A/DQ[15:0]
A[MAX:16]
A[15:0]
R101
DQ[15:0]
R106
R106
R105
R101
R104
R104
R109
ADV#
R8
R102
R11
CE#
R128
R7
R129
R127
R9
R107
R4
R127+R107
OE#
R15
R16
R17
R13
WAIT
Notes:
1.
Diagram shows WAIT as active low (RCR.10=0)
Datasheet
130
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Numonyx™ StrataFlash® Cellular Memory (M18)
1
Figure 62: AADM Asynchronous Read Cycle (Latching A[15:0] only)
A/DQ[15:0]
A[15:0]
R101
DQ[15:0]
R106
R104
R109
ADV#
R8
R102
R11
CE#
R7
R107
R9
R4
R127+R107
OE#
R15
R16
R17
R13
WAIT
Notes:
1.
Diagram shows WAIT as active low (RCR.10=0).
2.
Without latching A[MAX:16] in the Asynchronous Read Cycle, the previously latched A[MAX:16] applies.
A.3.2.2
Asynchronous Write Cycles
For asynchronous write specifications, refer to Table 64, “AADM Write Timings” on
page 132. For asynchronous write timing diagrams, refer to Figure 63, “AADM
Asynchronous Write Cycle (Latching A[MAX:0])” on page 132 and Figure 64, “AADM
Asynchronous Write Cycle (Latching A[15:0] only)” on page 132.
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Numonyx™ StrataFlash® Cellular Memory (M18)
Table 64: AADM Write Timings
Num
Symbol
Min(nS)
Num
Symbol
Min(nS)
W1
tPHWL
150
W9
tWHWL
20
W2
tELWL
0
W10
tVPWH
200
W3
tWLWH
40
W11
tWVVL
0
W4
tDVWH
40
W13
tBHWH
200
W6
tWHEH
0
W14
tWHGL
0
W7
tWHDX
0
W23
tGHWL
0
Figure 63: AADM Asynchronous Write Cycle (Latching A[MAX:0])
W7
A/DQ[15:0]
A[MAX:16]
A[15:0]
DQ[15:0]
ADV#
W6
CE#
OE#
W14
W23
W2
W4
W2
W3
W9
WE#
W13
WP#
W1
RST#
Figure 64: AADM Asynchronous Write Cycle (Latching A[15:0] only)
W7
A/DQ[15:0]
A[15:0]
DQ[15:0]
ADV#
W6
CE#
OE#
W14
W4
W2
W2
W3
W9
WE#
W13
WP#
W1
RST#
Datasheet
132
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Numonyx™ StrataFlash® Cellular Memory (M18)
A.3.3
Synchronous Read and Write Cycles
Just as asynchronous bus cycles, synchronous bus cycles (RCR[15] = ‘0b) can have
one or two address cycles. If the are two address cycles, the upper address must be
latched first with OE# at VIL followed by the lower address with OE# at VIH. If there is
only one address cycle, only the lower address will be latched and the previously
latched upper address applies. For reads, sensing begins when the lower address is
latched, but for synchronous reads, addresses are latched on a rising clock CLK instead
of a rising ADV# edge.
For synchronous bus cycles with two address cycles, it is not necessary to de-assert
ADV# between the two address cycles. This allows both the upper and lower address to
be latched in only two clock periods.
A.3.3.1
Synchronous Read Cycles
For synchronous read specifications, refer to Table 65, “AADM Synchronous Timings” on
page 133. For synchronous read timing diagrams, refer to the following:
• Figure 65, “AADM Sync Burst Read Cycle (ADV# De-asserted between Address
Cycles)” on page 134
• Figure 66, “AADM Sync Burst Read Cycle (ADV# Not De-asserted between Address
Cycles)” on page 134
• Figure 67, “AADM Sync Burst Read Cycle (Latching A[15:0] only)” on page 135
Table 65: AADM Synchronous Timings
Num
Sym
Target (104 MHz)
(108MHz)
Notes
(3)
Num
Sym
Target (104 MHz)
(108MHz)
Min (nS)
Max (nS)
9
See note
1
R311
tCHVL
2.5
1.5
5
R312
tCHTX
2
R313
tCHVH
2
2
R314
tCHGL
2.5
4
R201
tCLK
R203
tRISE/FALL
R301
tAVCH
3
R302
tVLCH
3
R303
tELCH
3.5
R304
tCHQV
R305
tCHQX
2
R306
tCHAX
5
R307
tCHTV
2
7
4
7
Min (nS)
R316
tVLVH
tCLK
R317
tVHCH
3
R318
tCHGH
2
R319
tGHCH
3
R320
tGLCH
3
Max (nS)
Notes
(3)
2*tCLK
Notes:
1.
The device must operate down to 9.6MHz in synchronous burst mode.
2.
During the address capture phase of a read burst bus cycle, OE# timings relative to CLK shall be identical to those of
ADV# relative to CLK.
3.
In synchronous burst read cycles, the asynchronous OE# to ADV# setup and hold times must also be met (Tghvh & Tvhgl)
to signify that the address capture phase of the bus cycle is complete.
4.
To prevent A/D bus contention between the host and the memory device, OE# may only be asserted low after the host has
satisfied the ADDR hold spec, Tchax.
5.
Rise and fall time specified between Vil & Vih
6.
A read cycle may only be terminated (prior to the completion of sensing data) one time before a full bus cycle must be
allowed to complete.
April 2008
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Datasheet
133
Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 65: AADM Sync Burst Read Cycle (ADV# De-asserted between Address Cycles)
A/DQ[15:0]
A[MAX:16]
A[15:0]
R306
DQ[15:0]
DQ[15:0]
A
R306
R315
R301
R305
R301
R304
CLK
R302
R302
R317
R311
R317
R313
R311
R316
R313
R316
ADV#
R303
CE#
R318
R314
R320
R319
OE#
WE#
R307
R312
WAIT
Notes:
1.
Diagram shows WAIT as active low (RCR.10=0) and asserted with Data (RCR.8=0).
2.
For no-wrap bursts, end-of-wordline WAIT states could occur (not shown in timing diagram).
Figure 66: AADM Sync Burst Read Cycle (ADV# Not De-asserted between Address Cycles)
A/DQ[15:0]
A[MAX:16]
A[15:0]
R306
DQ[15:0]
R306
DQ[15:0]
A
R305
R315
R301
R301
R304
CLK
R302
R317
R311
R313
ADV#
R303
CE#
R318
R320
R314
R319
OE#
WE#
R307
R312
WAIT
Notes:
1.
Diagram shows WAIT as active low (RCR.10=0) and asserted with Data (RCR.8=0)
Datasheet
134
April 2008
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Numonyx™ StrataFlash® Cellular Memory (M18)
Figure 67: AADM Sync Burst Read Cycle (Latching A[15:0] only)
A/DQ[15:0]
A[15:0]
DQ[15:0]
R306
DQ[15:0]
A
R305
R315
R301
R304
CLK
R302
R311
R317
R313
ADV#
R303
CE#
R314
OE#
WE#
R307
R312
WAIT
Notes:
1.
Diagram shows WAIT as active low (RCR.10=0) and asserted with Data (RCR.8=0).
2.
For no-wrap bursts, end-of-wordline WAIT states could occur (not shown in timing diagram)
3.
Without latching A[MAX:16] in the Sync Read Cycle, the previously latched A[MAX:16] applies.
A.3.4
Synchronous Write Cycles
For synchronous writes, only the address latching cycle(s) are synchronous.
Synchronous address latching is depicted in the timing diagrams for synchronous read
cycles:
• Figure 65, “AADM Sync Burst Read Cycle (ADV# De-asserted between Address
Cycles)” on page 134
• Figure 66, “AADM Sync Burst Read Cycle (ADV# Not De-asserted between Address
Cycles)” on page 134
• Figure 67, “AADM Sync Burst Read Cycle (Latching A[15:0] only)” on page 135
The actual write operation (rising WE# edge) is asynchronous and is independent of
CLK. Asynchronous writes are depicted in the timing diagrams for asynchronous write
cycles:
• Figure 63, “AADM Asynchronous Write Cycle (Latching A[MAX:0])” on page 132
• Figure 64, “AADM Asynchronous Write Cycle (Latching A[15:0] only)” on page 132
A.3.5
System Boot
Systems that use the AADM mode will boot from the bottom 128k Bytes of device
memory because A[MAX:16] are expected to be grounded in-system. The 128k Byte
boot region is sufficient to perform required boot activities before setting RCR[4] to
enable AADM mode.
April 2008
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Datasheet
135
Numonyx™ StrataFlash® Cellular Memory (M18)
Appendix B Additional Information
Order Number
Document/Tool
315567
Numonyx™ StrataFlash® Cellular Memory (M18) Developer’s Manual
307654
Numonyx™ StrataFlash® Cellular Memory (M18 SCSP); 2048-Mbit M18 (Non-Mux and AD-Mux I/O)
Family with Synchronous PSRAM Datasheet
310048
Designing with Numonyx™ StrataFlash
Cellular Memory, Application Note 822
309311
Numonyx™ StrataFlash
Note 841
315651
Migration Guide for Numonyx™ StrataFlash
860
310058
Effect of Program Buffer Size on System Interrupt Latency, Application Note 816
®
® Wireless Memory and Pre-enabling Numonyx™ StrataFlash®
Cellular Memory (M18 SCSP) to ARM
®
PrimeCellTM Design Guide, Application
® Cellular Memory (M18) 90 nm to 65 nm, Application Note
Notes:
4.
Visit Numonyx’s World Wide Web home page at http://www.numonyx.com for technical documentation and tools or for
the most current information on Numonyx flash products.
Appendix C Ordering Information
To order samples, obtain datasheets or inquire about any stack combination, please
contact your local Numonyx representative.
Table 66: 38F Type Stacked Components
PF
Package
Designator
38F
Product Line
Designator
5070
Product Die/
Density
Configuration
M0
Y
NOR Flash Prodcut
Family
Voltage/NOR
Flash CE#
Configuration
First character
applies to Flash
die #1
V=
1.8 V Core
and I/O;
Separate Chip
Enable per die
Second character
applies to Flash
die #2
(See
0
Parameter /
Mux
Configuration
B
Ballout
Identifier
0
Device
Details
Char 1 = Flash
die #1
Char 2 = Flash
die #2
Char 3 =
RAM die #1
PF =
SCSP, RoHS
RD =
SCSP, Leaded
Stacked NOR
Flash + RAM
Char 4 =
RAM die #2
(See
Table 68,
“38F / 48F
Density
Decoder”
on
page 137 for
Table 69,
“NOR Flash
Family
Decoder” on
page 138 for
(See
details)
Table 70,
“Voltage /
NOR Flash
CE#
Configurati
on
Decoder”
on
page 138
for details)
0=
No parameter
blocks; NonMux I/O
interface
(See
Table 71,
“Parameter
/ Mux
Configurati
on
Decoder”
on
page 138
B=
x16D
Ballout
(See
Table 72
,
“Ballout
Decoder
” on
page 13
9 for
0=
Original
released
version of
this
product
details)
for details)
details)
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136
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Table 67: 48F Type Stacked Components
PC
48F
Package
Designator
Product Line
Designator
PC =
Easy BGA,
RoHS
4400
Product Die/
Density
Configuration
P0
V
NOR Flash Prodcut
Family
Voltage/NOR
Flash CE#
Configuration
First character
applies to Flash
dies #1 and #2
V=
1.8 V Core
and 3 V I/O;
Virtual Chip
Enable
Second character
applies to Flash
dies #3 and #4
(See
Char 1 = Flash
die #1
Char 2 = Flash
die #2
RC =
Easy BGA,
Leaded
JS =
TSOP, RoHS
TE =
TSOP, Leaded
Char 3 = Flash
die #3
Stacked
NOR Flash
only
PF =
SCSP, RoHS
RD =
SCSP, Leaded
Char 4 = Flash
die #4
(See
Table 68,
“38F / 48F
Density
Decoder” on
page 137 for
(See Table 69,
“NOR Flash
Family
Decoder” on
page 138 for
details)
Table 70,
“Voltage /
NOR Flash
CE#
Configurati
on
Decoder”
on
page 138
for details)
B
Parameter /
Mux
Configuration
B=
Bottom
parameter;
Non-Mux I/O
interface
0
Ballout
Identifier
0=
Discrete
Ballout
(See
(See
Table 71,
“Parameter
/ Mux
Configurati
on
Decoder”
on
page 138
Table 72
,
“Ballout
Decoder
” on
page 13
9 for
0
Device
Details
0=
Original
released
version of
this
product
details)
for details)
details)
Table 68: 38F / 48F Density Decoder
Code
Flash Density
RAM Density
0
No Die
No Die
1
32-Mbit
4-Mbit
2
64-Mbit
8-Mbit
3
128-Mbit
16-Mbit
4
256-Mbit
32-Mbit
5
512-Mbit
64-Mbit
6
1-Gbit
128-Mbit
7
2-Gbit
256-Mbit
8
4-Gbit
512-Mbit
9
8-Gbit
1-Gbit
A
16-Gbit
2-Gbit
B
32-Gbit
4-Gbit
C
64-Gbit
8-Gbit
D
128-Gbit
16-Gbit
E
256-Gbit
32-Gbit
F
512-Gbit
64-Gbit
April 2008
309823-10
Datasheet
137
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 69: NOR Flash Family Decoder
Code
Family
Marketing Name
C
C3
Numonyx™ Advanced+ Boot Block Flash Memory
J
J3v.D
Numonyx™ Embedded Flash Memory
L
L18 / L30
Numonyx™ StrataFlash® Wireless Memory
M
M18
Numonyx™ StrataFlash® Cellular Memory
P
P30 / P33
Numonyx™ StrataFalsh® Embedded Memory
W
W18 / W30
Numonyx™ Wireless Flash Memory
0(zero)
-
No Die
Table 70: Voltage / NOR Flash CE# Configuration Decoder
I/O Voltage
(Volt)
Code
Core Voltage (Volt)
CE# Configuration
Z
3.0
1.8
Seperate Chip Enable per die
Y
1.8
1.8
Seperate Chip Enable per die
X
3.0
3.0
Seperate Chip Enable per die
V
3.0
1.8
Virtual Chip Enable
U
1.8
1.8
Virtual Chip Enable
T
3.0
1.8
Virtual Chip Enable
R
3.0
1.8
Virtual Address
Q
1.8
1.8
Virtual Address
P
3.0
3.0
Virtual Address
Table 71: Parameter / Mux Configuration Decoder (Sheet 1 of 2)
Code, Mux
Identification
0 = Non Mux
1 = AD Mux
3 = "Full" AD
Mux
B = Non Mux
C = AD Mux
F = "Full" Ad
Mux
Number of Flash Die
Any
NA
Flash Die 1
Flash Die 2
Flash Die 3
Flash Die 4
Notation used for stacks that contain no parameter blocks
1
Bottom
-
-
-
2
Bottom
Top
-
-
Bottom
Bottom
Top
-
Bottom
Top
Bottom
Top
Bottom
Bottom
-
-
Bottom
Bottom
Top
Top
3
X16
4
2
4
Datasheet
138
Bus Width
X32
April 2008
309823-10
Numonyx™ StrataFlash® Cellular Memory (M18)
Table 71: Parameter / Mux Configuration Decoder (Sheet 2 of 2)
Code, Mux
Identification
T = Non Mux
U = AD Mux
W = "Full" Ad
Mux
Number of Flash Die
Bus Width
Flash Die 1
Flash Die 2
Flash Die 3
Flash Die 4
1
Top
-
-
-
2
Top
Bottom
-
-
Top
Top
Bottom
-
Top
Bottom
Top
Bottom
Top
Top
-
-
Top
Top
Bottom
Bottom
X16
3
4
2
X32
4
Table 72: Ballout Decoder
Code
Ballout Definition
0 (Zero)
SDiscrete ballout (Easay BGA and TSOP)
B
x16D ballout, 105 ball (x16 NOR + NAND + DRAM Share Bus)
C
x16C ballout, 107 ball (x16 NOR + NAND + PSRAM Share Bus)
Q
QUAD/+ ballout, 88 ball (x16 NOR + PSRAM Share Bus)
U
x32SH ballout, 106 ball (x32 NOR only Share Bus)
V
x16SB ballout, 165 ball (x16 NOR / NAND + x16 DRAM Split Bus
W
x48D ballout, 165 ball (x16/x32 NOR + NAND + DRAM Split Bus
April 2008
309823-10
Datasheet
139