NDF02N60Z, NDD02N60Z N-Channel Power MOSFET 600 V, 4.8 W Features • • • • • Low ON Resistance Low Gate Charge ESD Diode−Protected Gate 100% Avalanche Tested These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant www.onsemi.com VDSS RDS(on) (MAX) @ 1 A 600 V 4.8 W ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise noted) Rating Symbol Drain−to−Source Voltage NDF VDSS NDD 600 D (2) V Continuous Drain Current RqJC (Note 1) ID 2.4 2.2 A Continuous Drain Current RqJC TA = 100°C (Note 1) ID 1.6 1.4 A Pulsed Drain Current, VGS @ 10 V IDM 10 9 A Power Dissipation RqJC PD 24 57 W Gate−to−Source Voltage VGS ±30 V Single Pulse Avalanche Energy, ID = 2.4 A EAS 120 mJ ESD (HBM) (JESD 22−A114) Vesd 2500 V RMS Isolation Voltage (t = 0.3 sec., R.H. ≤ 30%, TA = 25°C) (Figure 17) VISO Peak Diode Recovery (Note 2) dv/dt 4.5 V/ns Continuous Source Current (Body Diode) IS 2.4 A Maximum Temperature for Soldering Leads TL 260 °C TJ, Tstg −55 to 150 °C Operating Junction and Storage Temperature Range N−Channel Unit 4500 G (1) S (3) V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Limited by maximum junction temperature 2. ISD = 2.4 A, di/dt ≤ 100 A/ms, VDD ≤ BVDSS, TJ = +150°C 1 2 3 NDF02N60ZG, NDF02N60ZH TO−220FP CASE 221AH 4 4 1 2 3 NDD02N60Z−1G IPAK CASE 369D 1 2 3 NDD02N60ZT4G DPAK CASE 369AA ORDERING AND MARKING INFORMATION See detailed ordering, marking and shipping information on page 7 of this data sheet. © Semiconductor Components Industries, LLC, 2015 January, 2014 − Rev. 8 1 Publication Order Number: NDF02N60Z/D NDF02N60Z, NDD02N60Z THERMAL RESISTANCE Parameter Junction−to−Case (Drain) Junction−to−Ambient Steady State Symbol Value Unit NDF02N60Z NDD02N60Z RqJC 4.9 2.2 °C/W (Note 3) NDF02N60Z (Note 4) NDD02N60Z (Note 3) NDD02N60Z−1 RqJA 51 41 80 3. Insertion mounted 4. Surface mounted on FR4 board using 1″ sq. pad size, (Cu area = 1.127 in sq [2 oz] including traces). ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Characteristic Test Conditions Symbol Min VGS = 0 V, ID = 1 mA BVDSS 600 Reference to 25°C, ID = 1 mA DBVDSS/ DTJ Typ Max Unit OFF CHARACTERISTICS Drain−to−Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Drain−to−Source Leakage Current VDS = 600 V, VGS = 0 V Gate−to−Source Forward Leakage 25°C V 0.6 IDSS V/°C 1 150°C mA 50 VGS = ±20 V IGSS Static Drain−to−Source On−Resistance VGS = 10 V, ID = 1.0 A RDS(on) Gate Threshold Voltage VDS = VGS, ID = 50 mA VGS(th) Forward Transconductance VDS = 15 V, ID = 1.2 A gFS ±10 mA 4.0 4.8 W 4.0 4.5 V ON CHARACTERISTICS (Note 5) 3.0 1.7 S DYNAMIC CHARACTERISTICS Input Capacitance (Note 6) Output Capacitance (Note 6) VDS = 25 V, VGS = 0 V, f = 1.0 MHz Ciss 215 274 325 Coss 25 34 45 Reverse Transfer Capacitance (Note 6) Crss 4.0 7.0 10 Total Gate Charge (Note 6) Qg 5.0 10 16 Qgs 1.5 2.4 4.0 Qgd 3.5 5.3 8.0 Gate−to−Source Charge (Note 6) Gate−to−Drain (“Miller”) Charge (Note 6) VDD = 300 V, ID = 2.4 A, VGS = 10 V pF nC Plateau Voltage VGP 6.4 V Gate Resistance Rg 4.9 W td(on) 9.0 ns tr 7.0 RESISTIVE SWITCHING CHARACTERISTICS Turn−On Delay Time Rise Time Turn−Off Delay Time VDD = 300 V, ID = 2.4 A, VGS = 10 V, RG = 5 W Fall Time td(off) 15 tf 7.0 SOURCE−DRAIN DIODE CHARACTERISTICS (TC = 25°C unless otherwise noted) Diode Forward Voltage IS = 2.4 A, VGS = 0 V VSD Reverse Recovery Time VGS = 0 V, VDD = 30 V IS = 2.4 A, di/dt = 100 A/ms trr 240 ns Qrr 0.7 mC Reverse Recovery Charge 1.6 V Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 5. Pulse Width ≤ 380 ms, Duty Cycle ≤ 2%. 6. Guaranteed by design. www.onsemi.com 2 NDF02N60Z, NDD02N60Z TYPICAL CHARACTERISTICS 4.0 4.0 3.5 7.0 V ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 3.5 3.0 VGS = 10 V 2.5 6.5 V 2.0 6.0 V 1.5 1.0 5.5 V 0.5 0.0 0.0 VDS = 25 V 3.0 2.5 2.0 1.5 TJ = 25°C 1.0 TJ = 150°C 0.5 5.0 V 5.0 10.0 15.0 20.0 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 25.0 0.0 3 4 5 6 7 8 9 VGS, GATE−TO−SOURCE VOLTAGE (V) 6.00 ID = 1 A TJ = 25°C 5.50 5.25 5.00 4.75 4.50 4.25 4.00 3.75 5.0 5.5 6.0 6.5 7.0 7.5 8.0 8.5 9.0 9.5 10.0 VGS, GATE−TO−SOURCE VOLTAGE (V) BVDSS, NORMALIZED BREAKDOWN VOLTAGE (V) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) Figure 3. On−Region versus Gate−to−Source Voltage 2.50 2.25 2.00 ID = 1 A VGS = 10 V 1.75 1.50 1.25 1.00 0.75 0.50 0.25 −50 −25 0 25 50 75 100 125 10 Figure 2. Transfer Characteristics RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) Figure 1. On−Region Characteristics 5.75 TJ = −55°C 150 TJ, JUNCTION TEMPERATURE (°C) 5.25 5.00 VGS = 10 V TJ = 25°C 4.75 4.50 4.25 4.00 3.75 0.0 0.3 0.5 0.8 1.0 1.3 1.5 1.8 2.0 2.3 ID, DRAIN CURRENT (A) Figure 4. On−Resistance versus Drain Current and Gate Voltage 1.15 ID = 1 mA 1.10 1.05 1.00 0.95 0.90 −50 Figure 5. On−Resistance Variation with Temperature −25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) Figure 6. BVDSS Variation with Temperature www.onsemi.com 3 2.5 150 NDF02N60Z, NDD02N60Z TYPICAL CHARACTERISTICS 600 10 550 TJ = 25°C VGS = 0 V f = 1 MHz C, CAPACITANCE (pF) TJ = 150°C 1.0 TJ = 125°C 450 400 350 300 Ciss 250 200 150 100 50 0 0 50 100 150 200 250 300 350 400 450 500 550 600 0 5 10 15 20 25 30 35 40 VDS, DRAIN−TO−SOURCE VOLTAGE (V) VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 7. Drain−to−Source Leakage Current versus Voltage Figure 8. Capacitance Variation VGS, GATE−TO−SOURCE VOLTAGE (V) 0.10 Coss Crss 15.0 14.0 13.0 12.0 11.0 10.0 9.0 8.0 7.0 6.0 5.0 4.0 3.0 2.0 1.0 0.0 350 QT 300 VDS 250 VGS QGS 200 QGD 150 VDS = 300 V ID = 2.4 A TJ = 25°C 0 1 2 3 4 5 6 7 8 9 10 100 50 0 11 45 50 1.1 1.2 VDS, DRAIN−TO−SOURCE VOLTAGE (V) IDSS, LEAKAGE (mA) 500 Qg, TOTAL GATE CHARGE (nC) Figure 9. Gate−to−Source Voltage and Drain−to−Source Voltage versus Total Charge 10.0 1000 IS, SOURCE CURRENT (A) t, TIME (ns) VDD = 300 V ID = 2.4 A VGS = 10 V 100 td(off) tr tf td(on) 10 TJ = 150°C 1.0 125°C 25°C −55°C 1.0 1 10 0.1 0.3 100 0.4 0.5 0.6 0.7 0.8 0.9 1.0 RG, GATE RESISTANCE (W) VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 10. Resistive Switching Time Variation versus Gate Resistance Figure 11. Diode Forward Voltage versus Current www.onsemi.com 4 NDF02N60Z, NDD02N60Z TYPICAL CHARACTERISTICS 100 VGS v 30 V SINGLE PULSE TC = 25°C 10 100 ms 1 ms 10 ms 1 dc 0.1 0.01 10 ms ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 100 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 1 10 100 1000 10 VGS v 30 V SINGLE PULSE TC = 25°C 1 100 ms 1 ms 10 ms dc 0.1 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.01 0.1 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 10 ms 1 10 100 1000 VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 12. Maximum Rated Forward Biased Safe Operating Area NDD02N60Z Figure 13. Maximum Rated Forward Biased Safe Operating Area NDF02N60Z 10 R(t) (C/W) 1 50% (DUTY CYCLE) 20% 10% 0.1 5% 2% 1% RqJC = 2.2°C/W Steady State SINGLE PULSE 0.01 1E−06 1E−05 1E−04 1E−03 1E−02 1E−01 1E+00 1E+01 1E+02 1E+03 PULSE TIME (s) Figure 14. Thermal Impedance (Junction−to−Case) for NDD02N60Z R(t) (C/W) 100 10 50% (DUTY CYCLE) 20% 10% 5.0% 1 2.0% 1.0% 0.1 0.01 1E−06 RqJA = 41°C/W Steady State SINGLE PULSE 1E−05 1E−04 1E−03 1E−02 1E−01 1E+00 1E+01 PULSE TIME (s) Figure 15. Thermal Impedance (Junction−to−Ambient) for NDD02N60Z www.onsemi.com 5 1E+02 1E+03 NDF02N60Z, NDD02N60Z 10 50% (DUTY CYCLE) R(t) (C/W) 1 20% 10% 5% 2% 0.1 1% RqJC = 4.9°C/W Steady State SINGLE PULSE 0.01 1E−06 1E−05 1E−04 1E−03 1E−02 1E−01 1E+00 1E+01 PULSE TIME (s) Figure 16. Thermal Impedance (Junction−to−Case) for NDF02N60Z LEADS HEATSINK 0.110″ MIN Figure 17. Isolation Test Diagram Measurement made between leads and heatsink with all leads shorted together. *For additional mounting information, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. www.onsemi.com 6 1E+02 1E+03 NDF02N60Z, NDD02N60Z ORDERING INFORMATION Package Shipping† NDF02N60ZG TO−220FP (Pb−Free, Halogen−Free) 50 Units / Rail NDF02N60ZH TO−220FP (Pb−Free, Halogen−Free) 50 Units / Rail NDD02N60Z−1G IPAK (Pb−Free, Halogen−Free) 75 Units / Rail NDD02N60ZT4G DPAK (Pb−Free, Halogen−Free) 2500 / Tape and Reel Order Number †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. MARKING DIAGRAMS 4 Drain 4 Drain YWW 2N 60ZG Gate YWW 2N 60ZG NDF02N60ZG or NDF02N60ZH AYWW Source 1 2 3 Gate Drain Source Drain TO−220FP IPAK A Y WW G, H = Location Code = Year = Work Week = Pb−Free, Halogen−Free Package www.onsemi.com 7 2 1 Drain 3 Gate Source DPAK NDF02N60Z, NDD02N60Z PACKAGE DIMENSIONS TO−220 FULLPACK, 3−LEAD CASE 221AH ISSUE F A E B P E/2 0.14 Q D M B A A H1 M A1 C NOTE 3 1 2 3 L L1 3X 3X SEATING PLANE b2 c b 0.25 M B A M C A2 e SIDE VIEW FRONT VIEW SECTION D−D A NOTE 6 NOTE 6 H1 D D A SECTION A−A ALTERNATE CONSTRUCTION www.onsemi.com 8 NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. CONTOUR UNCONTROLLED IN THIS AREA. 4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH AND GATE PROTRUSIONS. MOLD FLASH AND GATE PROTRUSIONS NOT TO EXCEED 0.13 PER SIDE. THESE DIMENSIONS ARE TO BE MEASURED AT OUTERMOST EXTREME OF THE PLASTIC BODY. 5. DIMENSION b2 DOES NOT INCLUDE DAMBAR PROTRUSION. LEAD WIDTH INCLUDING PROTRUSION SHALL NOT EXCEED 2.00. 6. CONTOURS AND FEATURES OF THE MOLDED PACKAGE BODY MAY VARY WITHIN THE ENVELOP DEFINED BY DIMENSIONS A1 AND H1 FOR MANUFACTURING PURPOSES. DIM A A1 A2 b b2 c D E e H1 L L1 P Q MILLIMETERS MIN MAX 4.30 4.70 2.50 2.90 2.50 2.90 0.54 0.84 1.10 1.40 0.49 0.79 14.70 15.30 9.70 10.30 2.54 BSC 6.60 7.10 12.50 14.73 --2.80 3.00 3.40 2.80 3.20 NDF02N60Z, NDD02N60Z PACKAGE DIMENSIONS IPAK CASE 369D ISSUE C C B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. E R 4 Z A S 1 2 3 −T− SEATING PLANE K J F D G H 3 PL 0.13 (0.005) M DIM A B C D E F G H J K R S V Z INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.090 BSC 0.034 0.040 0.018 0.023 0.350 0.380 0.180 0.215 0.025 0.040 0.035 0.050 0.155 −−− STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN T www.onsemi.com 9 MILLIMETERS MIN MAX 5.97 6.35 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 2.29 BSC 0.87 1.01 0.46 0.58 8.89 9.65 4.45 5.45 0.63 1.01 0.89 1.27 3.93 −−− NDF02N60Z, NDD02N60Z PACKAGE DIMENSIONS DPAK (SINGLE GAUGE) CASE 369AA ISSUE B A E b3 c2 B Z D 1 L4 A 4 L3 b2 e 2 NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCHES. 3. THERMAL PAD CONTOUR OPTIONAL WITHIN DIMENSIONS b3, L3 and Z. 4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR BURRS. MOLD FLASH, PROTRUSIONS, OR GATE BURRS SHALL NOT EXCEED 0.006 INCHES PER SIDE. 5. DIMENSIONS D AND E ARE DETERMINED AT THE OUTERMOST EXTREMES OF THE PLASTIC BODY. 6. DATUMS A AND B ARE DETERMINED AT DATUM PLANE H. C H DETAIL A 3 c b 0.005 (0.13) M H C L2 GAUGE PLANE C L SEATING PLANE A1 L1 DETAIL A ROTATED 905 CW 2.58 0.102 5.80 0.228 3.00 0.118 1.60 0.063 INCHES MIN MAX 0.086 0.094 0.000 0.005 0.025 0.035 0.030 0.045 0.180 0.215 0.018 0.024 0.018 0.024 0.235 0.245 0.250 0.265 0.090 BSC 0.370 0.410 0.055 0.070 0.108 REF 0.020 BSC 0.035 0.050 −−− 0.040 0.155 −−− MILLIMETERS MIN MAX 2.18 2.38 0.00 0.13 0.63 0.89 0.76 1.14 4.57 5.46 0.46 0.61 0.46 0.61 5.97 6.22 6.35 6.73 2.29 BSC 9.40 10.41 1.40 1.78 2.74 REF 0.51 BSC 0.89 1.27 −−− 1.01 3.93 −−− STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN SOLDERING FOOTPRINT* 6.20 0.244 DIM A A1 b b2 b3 c c2 D E e H L L1 L2 L3 L4 Z 6.17 0.243 SCALE 3:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. 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