GAL16V8/883 High Performance E2CMOS PLD Generic Array Logic™ Features Functional Block Diagram • HIGH PERFORMANCE E2CMOS® TECHNOLOGY — 7.5 ns Maximum Propagation Delay — Fmax = 100 MHz — 6 ns Maximum from Clock Input to Data Output — TTL Compatible 12 mA Outputs — UltraMOS® Advanced CMOS Technology I/CLK CLK 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q 8 OLMC I/O/Q I I 2 • E CELL TECHNOLOGY — Reconfigurable Logic — Reprogrammable Cells — 100% Tested/100% Yields — High Speed Electrical Erasure (<100ms) — 20 Year Data Retention PROGRAMMABLE AND-ARRAY (64 X 32) • ACTIVE PULL-UPS ON ALL PINS (GAL16V8D-7 and GAL16V8D-10) I I • EIGHT OUTPUT LOGIC MACROCELLS — Maximum Flexibility for Complex Logic Designs — Programmable Output Polarity — Also Emulates 20-pin PAL® Devices with Full Function/ Fuse Map/Parametric Compatibility I I • PRELOAD AND POWER-ON RESET OF ALL REGISTERS — 100% Functional Testability I • APPLICATIONS INCLUDE: — DMA Control — State Machine Control — High Speed Graphics Processing — Standard Logic Speed Upgrade I OE I/OE • ELECTRONIC SIGNATURE FOR IDENTIFICATION Description Pin Configuration The GAL16V8/883 is a high performance E2CMOS programmable logic device processed in full compliance to MIL-STD-883. This military grade device combines a high performance CMOS process with Electrically Erasable (E2) floating gate technology to provide the highest speed/power performance available in the 883 qualified PLD market. The GAL16V8D/883, at 7.5ns maximum propagation delay time, is the world's fastest military qualified CMOS PLD. CERDIP LCC I/CLK 1 20 I/O/Q I The generic GAL architecture provides maximum design flexibility by allowing the Output Logic Macrocell (OLMC) to be configured by the user. The GAL16V8/883 is capable of emulating all standard 20-pin PAL® devices with full function/fuse map/parametric compatibility. I I I I/CLK Vcc 3 2 20 I/O/Q 18 I I GAL16V8 6 Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. Therefore, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified. I 16 Top View I 8 9 I GND I/O/Q I 19 4 I/O/Q I I/O/Q I I/O/Q I/O/Q 14 11 13 I/OE I/O/Q I/O/Q I/O/Q Vcc 5 GAL 16V8 I/O/Q I/O/Q 15 I I/O/Q I I/O/Q I I/O/Q I I/O/Q GND 10 11 I/OE Copyright © 2010 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice. LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com 16v8mil_04 1 April 2010 Devices have been discontinued. • 50% REDUCTION IN POWER FROM BIPOLAR — 75mA Typ Icc Specifications GAL16V8D-7/10/883 Absolute Maximum Ratings(1) Recommended Operating Conditions Supply voltage VCC ...................................... –0.5 to +7V Input voltage applied .......................... –2.5 to VCC +1.0V Off-state output voltage applied ......... –2.5 to VCC +1.0V Storage Temperature ................................ –65 to 150°C Case Temperature with Power Applied ........................................ –55 to 125°C Case Temperature (TC) .............................. –55 to 125°C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL VIL VIH IIL1 IIH VOL VOH IOL IOH IOS2 ICC MIN. TYP.3 MAX. UNITS Input Low Voltage Vss – 0.5 — 0.8 V Input High Voltage 2.0 — Vcc+1 V PARAMETER CONDITION Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –100 μA Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC — — 10 μA Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V Low Level Output Current — — 12 mA High Level Output Current — — –2 mA –30 — –150 mA — 75 130 mA Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25°C Operating Power VIL = 0.5V VIH = 3.0V L-7/-10 Supply Current ftoggle = 15MHz Outputs Open 1) The leakage current is due to the internal pull-up on all pins. See Input Buffer section for more information. 2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 °C 2 Devices have been discontinued. 1.Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Specifications GAL16V8D-7/10/883 AC Switching Characteristics Over Recommended Operating Conditions PARAMETER fmax3 twh twl ten tdis -7 -10 MIN. MAX. MIN. MAX. DESCRIPTION UNITS A Input or I/O to Combinational Output 1 7.5 2 10 ns A Clock to Output Delay 1 6 1 7 ns — Clock to Feedback Delay — 6 — 7 ns — Setup Time, Input or Feedback before Clock↑ 7 — 10 — ns — Hold Time, Input or Feedback after Clock↑ 0 — 0 — ns A Maximum Clock Frequency with External Feedback, 1/(tsu + tco) 76.9 — 58.8 — MHz A Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) 76.9 — 58.8 — MHz A Maximum Clock Frequency with No Feedback 100 — 62.5 — MHz — Clock Pulse Duration, High 5 — 8 — ns — Clock Pulse Duration, Low 5 — 8 — ns B Input or I/O to Output Enabled 1 9 — 10 ns B OE to Output Enabled 1 7 — 10 ns C Input or I/O to Output Disabled 1 9 — 10 ns C OE to Output Disabled 1 7 — 10 ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (TA = 25°C, f = 1.0 MHz) SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS CI Input Capacitance 10 pF VCC = 5.0V, VI = 2.0V CI/O I/O Capacitance 10 pF VCC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested. 3 Devices have been discontinued. tpd tco tcf2 tsu th TEST COND1. Specifications GAL16V8D/883 Absolute Maximum Ratings(1) Recommended Operating Conditions Supply voltage VCC ...................................... –0.5 to +7V Input voltage applied .......................... –2.5 to VCC +1.0V Off-state output voltage applied ......... –2.5 to VCC +1.0V Storage Temperature ................................ –65 to 150°C Case Temperature with Power Applied ........................................ –55 to 125°C Case Temperature (TC) .............................. –55 to 125°C Supply voltage (VCC) with Respect to Ground ..................... +4.50 to +5.50V DC Electrical Characteristics Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL VIL VIH IIL IIH VOL VOH IOL IOH IOS1 ICC MIN. TYP.2 MAX. UNITS Input Low Voltage Vss – 0.5 — 0.8 V Input High Voltage 2.0 — Vcc+1 V PARAMETER CONDITION Input or I/O Low Leakage Current 0V ≤ VIN ≤ VIL (MAX.) — — –10 μA Input or I/O High Leakage Current 3.5V ≤ VIN ≤ VCC — — 10 μA Output Low Voltage IOL = MAX. Vin = VIL or VIH — — 0.5 V Output High Voltage IOH = MAX. Vin = VIL or VIH 2.4 — — V Low Level Output Current — — 12 mA High Level Output Current — — –2 mA –30 — –150 mA — 75 130 mA Output Short Circuit Current VCC = 5V VOUT = 0.5V TA= 25°C Operating Power VIL = 0.5V VIH = 3.0V L -15/ -20/-30 Supply Current ftoggle = 15MHz Outputs Open 1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester ground degradation. Characterized but not 100% tested. 3) Typical values are at Vcc = 5V and TA = 25 °C 4 Devices have been discontinued. 1.Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). Specifications GAL16V8D/883 AC Switching Characteristics Over Recommended Operating Conditions PARAMETER -15 TEST DESCRIPTION COND1. fmax3 twh twl ten tdis -30 MIN. MAX. MIN. MAX. MIN. MAX. UNITS A Input or I/O to Combinational Output 3 15 3 20 3 30 ns A Clock to Output Delay 2 12 2 15 2 20 ns — Clock to Feedback Delay — 12 — 15 — 20 ns — Setup Time, Input or Feedback before Clock↑ 12 — 15 — 25 — ns — Hold Time, Input or Feedback after Clock↑ 0 — 0 — 0 — ns A Maximum Clock Frequency with External Feedback, 1/(tsu + tco) 41.6 — 33.3 — 22.2 — MHz A Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) 41.6 — 33.3 — 22.2 — MHz A Maximum Clock Frequency with No Feedback 50 — 41.6 — 33.3 — MHz — Clock Pulse Duration, High 10 — 12 — 15 — ns — Clock Pulse Duration, Low 10 — 12 — 15 — ns B Input or I/O to Output Enabled — 15 — 20 — 30 ns B OE to Output Enabled — 15 — 18 — 25 ns C Input or I/O to Output Disabled — 15 — 20 — 30 ns C OE to Output Disabled — 15 — 18 — 25 ns 1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Descriptions section. 3) Refer to fmax Descriptions section. Capacitance (TA = 25°C, f = 1.0 MHz) SYMBOL PARAMETER MAXIMUM* UNITS TEST CONDITIONS CI Input Capacitance 10 pF VCC = 5.0V, VI = 2.0V CI/O I/O Capacitance 10 pF VCC = 5.0V, VI/O = 2.0V *Characterized but not 100% tested. 5 Devices have been discontinued. tpd tco tcf2 tsu th -20 Specifications GAL16V8/883 Switching Waveforms INPUT or I/O FEEDBACK VALID INPUT tsu th CLK VALID INPUT tco REGISTERED OUTPUT tpd COMBINATIONAL OUTPUT 1/fmax (external fdbk) Combinatorial Output Registered Output INPUT or I/O FEEDBACK OE tdis ten tdis COMBINATIONAL OUTPUT ten REGISTERED OUTPUT Input or I/O to Output Enable/Disable twh OE to Output Enable/Disable twl CLK 1/ fmax (internal fdbk) CLK tcf 1/ fmax (w/o fb) REGISTERED FEEDBACK Clock Width fmax with Feedback 6 tsu Devices have been discontinued. INPUT or I/O FEEDBACK Specifications GAL16V8/883 fmax Descriptions CLK LOGIC ARRAY REGISTER CLK LOGIC ARRAY tco fmax with External Feedback 1/(tsu+tco) REGISTER Note: fmax with external feedback is calculated from measured tsu and tco. t cf t pd CLK fmax with Internal Feedback 1/(tsu+tcf) LOGIC ARRAY REGISTER Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd. tsu + th fmax with No Feedback Note: fmax with no feedback may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%. Switching Test Conditions Input Pulse Levels Input Rise and Fall Times Input Timing Reference Levels Output Timing Reference Levels +5V GND to 3.0V 3ns 10% – 90% 1.5V 1.5V Output Load R1 See Figure 3-state levels are measured 0.5V from steady-state active level. FROM OUTPUT (O/Q) UNDER TEST TEST POINT Output Load Conditions (see figure) Test Condition A B C Active High Active Low Active High Active Low R1 R2 CL 390Ω ∞ 390Ω ∞ 390Ω 750Ω 750Ω 750Ω 750Ω 750Ω 50pF 50pF 50pF 5pF 5pF R2 C L* *C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE 7 Devices have been discontinued. tsu Specifications GAL16V8/883 GAL16V8 Ordering Information (MIL-STD-883 and SMD) Ordering # Tpd (ns) Tsu (ns) Tco (ns) Icc (mA) 7.5 7 6 130 20-Pin CERDIP GAL16V8D-7LD/8832 130 20-Pin LCC GAL16V8D-7LR/8831 10 10 7 130 15 20 30 12 15 25 12 15 20 130 MIL-STD-883 20-Pin CERDIP 20-Pin LCC 20-Pin CERDIP SMD # 5962-8983907RA 5962-89839072A GAL16V8D-10LD/883 2 5962-8983904RA GAL16V8D-10LR/883 2 5962-89839042A GAL16V8D-15LD/883 2 5962-8983903RA 2 5962-89839032A 130 20-Pin LCC GAL16V8D-15LR/883 130 20-Pin CERDIP GAL16V8D-20LD/8832 5962-8983902RA 130 20-Pin LCC GAL16V8D-20LR/8832 5962-89839022A 2 5962-8983901RA 130 20-Pin CERDIP GAL16V8D-30LD/883 Note: Lattice Semiconductor recognizes the trend in military device procurement towards using SMD compliant devices, as such, ordering by this number is recommended. 1. Discontinued per PCN #06-07. 2. Discontinued per PCN #05A-10. Part Number Description XXXXXXXX _ XX X X X GAL16V8D Device Name MIL Process /883 = 883 Process Speed (ns) Package D = CERDIP R = LCC L = Low Power Power 8 Devices have been discontinued. 130 Package