Preliminary Data Sheet ICE10N60 Product Summary ICE10N60 N-Channel Enhancement Mode MOSFET HALOGEN Features • Low rDS(on) • Ultra Low Gate Charge • High dv/dt capability • High Unclamped Inductive Switching (UIS) capability • High peak current capability • Increased transconductance performance • Optimized design for high performance power systems FREE ID TA=25oC 10A Max V(BR)DSS ID=250uA 600V Min rDS(on) VGS=10V 0.28 Typ Qg VDS=480V 41nC Typ D G S T0220 Standard Metal Heatsink ICEMOS AND ITS SISTER COMPANY 3D SEMI OWN THE FUNDAMENTAL PATENTS FOR SUPERJUNCTION MOSFETS. THE MAJORITY OF THESE PATENTS HAVE 17 to 20 YEARS OF REMAINING LIFE. THIS PORTFOLIO HAS GRANTED PATENTS ISSUED IN USA, CHINA, KOREA, JAPAN, TAIWAN & EUROPE. Maximum ratings b 1=Gate, 2=Drain, 3=Source. , at Tj=25oC, unless otherwise specified Parameter Symbol Conditions Value Unit Continuous drain current ID Tc=25oC 10 A Pulsed drain current ID, pulse Tc=25oC 30 A Avalanche energy, single pulse E AS ID=8.3A 340 mJ Avalanche current, repetitive I AR limited by Tjmax 5 A MOSFET dv/dt ruggedness dv/dt VDS=480V, ID=10A, Tj=125oC 50 V/ns Gate source voltage VGS Power dissipation Ptot Operating and storage temperature Tj, Tstg Mounting torque static ±20 AC (f>1Hz) ±30 Tc=25oC 95 -55 to +150 M 3 & 3.5 screws 60 V W o C Ncm a When mounted on 1inch square 2oz copper clad FR-4 b Preliminary Data Sheet – Specifications subject to change SP-10N60-000-3 05/15/2013 1 Preliminary Data Sheet ICE10N60 Parameter Symbol Conditions Values Min Typ Max - - 1.3 Unit Thermal characteristics Thermal resistance, junctioncase a RthJC o Thermal resistance, junctionambient a RthJA leaded - - 62 Soldering temperature, wave soldering only allowed at leads T sold 1.6mm (0.063in.) from case for 10 s - - 260 Electrical characteristics Gate source leakage current o C b , at T =25oC, unless otherwise specified j Static characteristics Drain-source breakdown voltage V(BR)DSS VGS(th) Gate threshold voltage Zero gate voltage drain current C/W IDSS IGSS Drain-source on-state resistance RDS (on) Gate resistance RG VGS=0 V, ID=250µA 600 630 - VDS=VGS, ID=250µA VDS=600V, VGS=0V, o Tj=25 C 2.1 3 3.9 - 0.1 1 - - 100 VGS=±20 V, VDS=0V VGS=10V, ID=5A, o Tj=25 C VGS=10V, ID=5A, o Tj=150 C - - 100 - 0.28 0.33 - 0.75 - f=1 MHZ, open drain - 5 - - 1250 - - 600 - - 5 - - 12 - - 6 - - 3.5 - - 54 7 - VDS=600V, VGS=0V, o Tj=150 C V µA nA Ω Ω Dynamic characteristics Input capacitance Ciss Output capacitance Reverse transfer capacitance Coss Transconductance gfs Turn-on delay time Rise time td(on) Turn-off delay time td(off) Fall time tf SP-10N60-000-3 05/15/2013 Crss tr VGS=0 V, VDS=25 V, f=1 MHz VDS>2*ID*RDS, ID=5A VDS=380V, VGS=10V, ID=10A, RG=4Ω (External) - pF S ns - 2 Preliminary Data Sheet ICE10N60 Parameter Symbol Conditions Values Unit Min Typ Max - 7.1 - - 14.5 - - 41 - - 5.2 - V - 0.9 1.2 V - 332 - ns - 4.4 - µC - 25.6 - A Gate charge characteristics Gate to source charge Qgs Gate to drain charge Qgd Gate charge total Qg Gate plateau voltage Vplateau VDS=480 V, ID=10A, VGS=0 to 10 V nC Reverse Diode Diode forward voltage VSD Reverse recovery time trr Reverse recovery charge Qrr Peak reverse recovery current Irm SP-10N60-000-3 05/15/2013 VGS=0V, IS=IF VRR=300V, IS=IF, diFIdt=100 A/µS 3 Preliminary Data Sheet ICE10N60 Transfer Characteristics Output Characteristics 30 30 7V VGS=10V to 8V 25 ID - Drain Current (A) ID - Drain Current (A) 25 20 6V 15 10 5V 20 15 10 TJ = 150˚C 5 5 25˚C 0 0 0 5 10 15 0 20 2 4 6 8 VGS - Gate-to-Source (V) VDS - Drain-to-Source Voltage (V) On Resistance vs Junction Temperature On Resistance vs Drain Current 4.0 RDS(on) - On State Resistance (Normalized) RDS(on) - On-State Resistance (mΩ) 800 700 600 500 VGS = 10V 400 300 200 100 3.5 VGS = 10V ID = 5A 3.0 2.5 2.0 1.5 1.0 0.5 0 0.0 0 5 10 15 20 ID - Drain current (A) 25 30 -50 9 1.3 VGS(th) - Gate Threshold Voltage (Normalized) 1.4 8 VDS = 480V ID = 10A 6 0 25 50 75 100 125 150 Gate Threshold Voltage vs Junction Temperature 10 7 -25 TJ - Junction Temperature (˚C) Gate Charge VGS - Gate-to-Source Voltage (V) 10 5 4 3 2 1 1.2 1.1 ID = 250μA 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0 0 10 20 30 Qg - Total Gate Charge (nC) SP-10N60-000-3 05/15/2013 40 50 -50 -25 0 25 50 75 100 125 150 TJ - Junction Temperature (˚C) 4 Preliminary Data Sheet ICE10N60 Capacitance Drain-to-Source Breakdown Voltage vs. Junction Temperature 1.2 V(BR)DSS - Drain-to-Source Breakdown Voltage (Normalized) 100000 C-Capacitance (pF) 10000 Ciss 1000 Coss 100 10 Crss 1 0 200 400 VDS - Drain-to-Source Voltage (V) 1.1 ID = 1mA 1.0 0.9 0.8 -50 600 Maximum Rated Forward Biased Safe Operating Area 0 25 50 75 100 TJ - Junction Temperature (˚C) 125 150 Transient Thermal Response, Junction-to-Case 100 10 10us 100us 1 1ms 10ms DC 0.1 RDS(on) Limit Package Limit Thermal Limit 0.01 r(t), Transient Thermal Resistance (Normalized) 1.00 Single Pulse, Tc = 25oC, Tj=150oC, VGS = 10V ID - Drain Current (A) -25 0.5 0.2 0.1 0.10 0.05 0.02 0.01 Single Pulse 0.00 1 10 100 VDS - Drain-to-Source Voltage (V) SP-10N60-000-3 05/15/2013 1000 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 1.0E+00 t - Time (seconds) 5 Preliminary Data Sheet ICE10N60 SP-10N60-000-3 05/15/2013 6 Preliminary Data Sheet ICE10N60 SP-10N60-000-3 05/15/2013 7 Preliminary Data Sheet ICE10N60 ICEMOS SUPERJUNCTION PATENT PORTFOLIO ICEMOS GRANTED PATENTS US7,429,772 US7,439,178 US7,446,018 US7,579,607 US7,723,172 US7,795,045 US7,846,821 US7,944,018 US8,012,806 US8,030,133 3D SEMI PATENTS LICENSED TO ICEMOS US7,041,560B2 US7,023,069B2 US7,364,994 US7,227,197B2 US7,304,944B2 US7,052,982B2 US7,339,252 US7,410,891 US7,439,583 US7,227,197B2 US6,635,906 US6,936,867 US7,015,104 US9,109,110 US7,271,067 US7,354,818 US7,052,982, US7,199,006B2 Note: additional patents in China, Korea, Japan, Taiwan, Europe have also been granted to IceMOS and 3D Semi for Superjunction MOSFETs with 70 additional Patent applications in process in the USA and the above listed countries. SP-10N60-000-3 05/15/2013 8 Preliminary Data Sheet ICE10N60 Marking Information YY = Last two digits of the year WW = Work week calendar on Icemos subcon assembly & test house * YYWW * XXXX00 ICE10N60 = Initial for Icemos subcon assembly and test house XXXX = Wafer Lot ID 00 = may be used for wafer ID in a special case. = "00" is used unless specified. ICE10N60 = ICE is Icemos logo and 10N60 is a designated device part number SP-10N60-000-3 05/15/2013 9