Vishay IRFB18N50K Power mosfet Datasheet

IRFB18N50K, SiHFB18N50K
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Requirement
500
RDS(on) (Ω)
VGS = 10 V
0.26
Qg (Max.) (nC)
120
Qgs (nC)
34
Qgd (nC)
54
Configuration
• Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
Available
RoHS*
COMPLIANT
• Fully Characterized Capacitance and Avalanche Voltage
and Current
Single
• Low RDS(on)
D
• Lead (Pb)-free Available
TO-220
APPLICATIONS
• Switch Mode Power Supply (SMPS)
G
• Uninterruptible Power Supply
S
G
D
• High Speed Power Switching
S
• Hard Switched and High Frequency Circuits
N-Channel MOSFET
ORDERING INFORMATION
Package
TO-220
IRFB18N50KPbF
SiHFB18N50K-E3
IRFB18N50K
SiHFB18N50K
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
Pulsed Drain
VGS at 10 V
TC = 25 °C
ID
TC = 100 °C
Currenta
IDM
Linear Derating Factor
Single Pulse Avalanche
Energyb
UNIT
V
17
11
A
68
1.8
W/°C
mJ
EAS
370
Currenta
IAR
17
A
Repetitive Avalanche Energya
EAR
22
mJ
Repetitive Avalanche
TC = 25 °C
Maximum Power Dissipation
PD
220
W
dV/dt
7.8
V/ns
TJ, Tstg
- 55 to + 150
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
for 10 s
300d
6-32 or M3 screw
10
°C
N
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature.
b. Starting TJ = 25 °C, L = 2.5 mH, RG = 25 Ω, IAS = 17 A.
c. ISD ≤ 17 A, dI/dt ≤ 376 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
WORK-IN-PROGRESS
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IRFB18N50K, SiHFB18N50K
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
Maximum
SYMBOL
Junction-to-Ambienta
Case-to-Sink, Flat, Greased Surface
Maximum Junction-to-Case
(Drain)a
TYP.
MAX.
RthJA
-
58
RthCS
0.50
-
RthJC
-
0.56
UNIT
°C/W
Note
a. Rth is measured at TJ approximately 90 °C.
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 µA
500
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.59
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
3.0
-
5.0
V
nA
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
VGS = ± 30 V
-
-
± 100
VDS = 500 V, VGS = 0 V
-
-
50
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
250
IGSS
IDSS
RDS(on)
gfs
ID = 10 Ab
VGS = 10 V
VDS = 50 V, ID = 10 A
µA
-
0.26
0.29
Ω
6.4
-
-
S
-
2830
-
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Effective Output Capacitance
Coss
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Turn-On Delay Time
td(on)
Rise Time
Fall Time
VGS = 0 V
Coss eff.
Total Gate Charge
Turn-Off Delay Time
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
tr
td(off)
-
330
-
-
38
-
VDS = 1.0 V, f = 1.0 MHz
-
3310
-
VDS = 400 V, f = 1.0 MHz
-
93
-
-
155
-
-
-
120
-
-
34
VDS = 0 V to 400
Vc
ID = 17 A, VDS = 400 V,
see fig. 6 and 13b
VGS = 10 V
VDD = 250 V, ID = 17 A,
RG = 7.5 Ω, see fig. 10b
tf
pF
nC
-
-
54
-
22
-
-
60
-
-
45
-
-
30
-
-
-
17
-
-
68
-
-
1.5
-
520
780
ns
-
5.3
8.0
µC
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 17 A, VGS = 0 Vb
TJ = 25 °C, IF = 17 A, dI/dt = 100 A/µsb
V
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c. Coss eff. is a fixed capacitance that givs the same charging time as Coss while VDS is rising from 0 to 80 % VDS.
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Document Number: 91100
S-80567-Rev. A, 20-Jun-08
IRFB18N50K, SiHFB18N50K
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
100
100.00
VGS
15V
12V
10V
8.0V
7.0V
6.0V
5.5V
BOTTOM 5.0V
10
1
0.1
ID, Drain-to-Source Current (A)
ID, Drain-to-Source Current (A)
TOP
5.0V
0.01
TJ = 150°C
10.00
1.00
TJ = 25°C
0.10
20µs PULSE WIDTH
Tj = 25°C
0.001
VDS = 100V
20µs PULSE WIDTH
0.01
0.1
1
10
100
5.0
VDS, Drain-to-Source Voltage (V)
Fig. 1 - Typical Output Characteristics
VGS
15V
12V
10V
8.0V
7.0V
6.0V
5.5V
BOTTOM 5.0V
ID, Drain-to-Source Current (A)
TOP
10
5.0V
1
0.1
20µs PULSE WIDTH
Tj = 150°C
0.01
0.1
1
10
VDS, Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
7.0
8.0
9.0
10.0
VGS , Gate-to-Source Voltage (V)
Fig. 3 - Typical Transfer Characteristics
RDS(on) , Drain-to-Source On Resistance
(Normalized)
100
6.0
100
3.0
ID = 17A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20 40 60 80 100 120 140 160
TJ , Junction Temperature ( ° C)
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRFB18N50K, SiHFB18N50K
Vishay Siliconix
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
C, Capacitance(pF)
10000
Ciss
1000
Coss
100
Crss
100
ISD , Reverse Drain Current (A)
100000
10
1
10
100
ID = 17A
16
TJ = 25 ° C
1
V GS = 0 V
0.5
0.8
1.1
1.4
VSD ,Source-to-Drain Voltage (V)
Fig. 7 - Typical Source-Drain Diode Forward Voltage
1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
V DS= 400V
V DS= 250V
V DS= 100V
100
ID , Drain Current (A)
VGS , Gate-to-Source Voltage (V)
20
10
0.1
0.2
1000
VDS, Drain-to-Source Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
TJ = 150 ° C
12
8
10us
100us
10
1ms
10ms
1
4
0
0.1
0
30
60
90
120
150
QG , Total Gate Charge (nC)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
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TC = 25 °C
TJ = 150 °C
Single Pulse
10
100
1000
10000
VDS , Drain-to-Source Voltage (V)
Fig. 8 - Maximum Safe Operating Area
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
IRFB18N50K, SiHFB18N50K
Vishay Siliconix
RD
VDS
20
VGS
D.U.T.
ID , Drain Current (A)
RG
+
- VDD
15
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
10
Fig. 10a - Switching Time Test Circuit
VDS
5
0
90 %
25
50
75
100
125
150
10 %
VGS
TC , Case Temperature ( °C)
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response(Z thJC )
1
D = 0.50
0.20
0.1
0.10
0.05
0.02
0.01
SINGLE PULSE
(THERMAL RESPONSE)
PDM
0.01
t1
t2
Notes:
1. Duty factor D =t 1 / t 2
2. Peak TJ = P DM x Z thJC + TC
0.001
0.00001
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
15 V
tp
L
VDS
D.U.T.
RG
IAS
20 V
tp
Driver
+
A
- VDD
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
IAS
Fig. 12b - Unclamped Inductive Waveforms
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IRFB18N50K, SiHFB18N50K
EAS , Single Pulse Avalanche Energy (mJ)
Vishay Siliconix
750
ID
7.6A
11A
BOTTOM 17A
TOP
600
450
300
150
0
25
50
75
100
125
150
Starting T J, Junction Temperature ( ° C)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
Current regulator
Same type as D.U.T.
50 kΩ
QG
VGS
12 V
0.2 µF
0.3 µF
QGS
QGD
+
D.U.T.
VG
-
VDS
VGS
3 mA
Charge
IG
ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
IRFB18N50K, SiHFB18N50K
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
•
•
•
•
RG
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91100.
Document Number: 91100
S-80567-Rev. A, 20-Jun-08
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Disclaimer
All product specifications and data are subject to change without notice.
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Document Number: 91000
Revision: 18-Jul-08
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