Reliability Datasheet RD03 Reliability Data Sheet SnapLED 150 Emitter HPWSTH00/FH00/TL00/FL00 Description The following cumulative test results have been obtained from testing performed in accordance with the latest revision of MILSTD883. Lumileds tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain depends on the electrical and environmental characteristics of your application, but will probably be better than the performance outlined in Table 1. Table 1: Life Tests Demonstrated Performance Point Typical Performance Stress Test Conditions Total Device Hours Units Tested Units Failed MTBF Failure Rate (% /1K Hours) TS AllnGaP Amber and RedOrange TA = 55°C, IF = 150 mA 168,000 168 0 168,000 < 0.595 TS AllnGaP Amber and RedOrange TA = 55°C, IF = 160 mA 48,000 48 0 48,000 < 2.08 TS AllnGaP Amber and RedOrange TA = 55°C Pulse 50% Duty Factor, 2Hz IF = 200 mA 48,000 56,000 48 (1 Hz) 56 (2 Hz) 0 0 48,000 56,000 < 2.08 < 1.786 Colors Failure Rate Prediction The failure rate of semiconductor devices is determined by the junction temperature of the device. The relationship between ambient temperature and actual junction temperature is given by the following: TJ (°C) = TA (°C) + θJA PAVG where: TA = ambient temperature in °C θJA = thermal resistance of junctiontoambient in °C/watt PAVG = average power dissipated in watts The estimated MTBF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table on the following page using an activation energy of 0.43 eV (reference MILHDBK217). Table 2: Failure Rate Prediction (IF 150mA) Ambient Temperature (°C) Junction Temperature (°C) Point Typical [1] Performance in Time (60% Confidence) Failure Rate [1] MTBF (%/1K Hours) Performance [2] in Time (90% Confidence) Failure Rate [2] MTBF (%/1K Hours) 85 138 65,000 1.548 28,000 3.565 75 128 87,000 1.144 38,000 2.634 65 118 120,000 0.832 52,000 1.916 55 108 168,000 0.595 73,000 1.371 45 98 239,000 0.418 104,000 0.963 35 88 347,000 0.288 151,000 0.663 25 78 515,000 0.194 223,000 0.447 Notes: [1] The point typical MTBF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero failures, one failure is assumed for this calculation. [2] The 90% Confidence MTBF represents the minimum level of reliability performance which is expected from 90% of all samples. This confi dence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is commonly used in describing useful life failures. Refer to MILSTD690B for details on this methodology. [3] A failure is any LED which does not emit light and max. % Iv degradation is > 50%. [4] Assuming 115°C/W of θJA Example of Failure Rate Calculation Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is: (8 hours/day) x (5 days/week) / (168 hours/week) = 0.25 The point failure rate per year (8760 hours) at 25°C ambient temperature is: (0.060% / 1K hours) x (0.25) x (8760 hours/year) = 0.131% per year Similarly, 90% confidence level failure rate per year at 25°C: (0.137% / 1K hours) x (0.25) x (8760 hours/year) = 0.300% per year Table 3: Environmental Tests Test Name Reference Test Conditions Units Tested Units Failed Temperature Cycle MILSTD883 55°C to 100°C, 15 min. dwell, 5 min. transfer 4480 4480 0 0 952 952 0 0 40°C to 85°C, 18 min. dwell, 42 min. transfer, 115 mA, 5 min on/off 100 cycles 48 0 40°C to 85°C, 18 min. dwell, 42 min. transfer, 150 mA, 5 min on/off 100 cycles 56 0 Method 1010 20 cycles 100 cycles Temperature Cycle MILSTD883 Method 1010 40°C to 120°C, 15 min. dwell, 5 min. transfer 20 cycles 100 cycles Power Temperature Cycle Power Temperature Cycle Internal Reference Internal Reference SnapLED 150 Emitter Reliability Datasheet RD03 (7/05) 2 Electrostatic Discharge (ESD) Test The SnapLED 150 has been tested for ESD and has passed with minimal change in flux, forward voltage, and dominant wave length. Units were subjected to 16kV ESD with the human body model profile, and 400V with the machine model profile. Results of the test are shown in Table 4 below. Table 4: Electrostatic Discharge (ESD) Test Test Test Conditions Results Human Body Model 16 KV, 3 positive pulses, 3 negative pulses 95 units / 0 failures Machine Model 400 V, 3 positive pulses, 3 negative pulses 100 units / 0 failures * No appreciable change in flux, forward voltage, and dominant wavelength SnapLED 150 Emitter Reliability Datasheet RD03 (7/05) 3 Company Information Lumileds is a worldclass supplier of Light Emitting Diodes (LEDs) producing billions of LEDs annually. Lumileds is a fully integrated supplier, producing core LED material in all three base colors (Red, Green, Blue) and White. Lumileds has R&D development centers in San Jose, California and Best, The Netherlands. Production capabili ties in San Jose, California and Malaysia. Lumileds may make process or materials changes affecting the performance or other characteristics of our products. These products supplied after such changes will continue to meet published specifications, but may not be identical to products supplied as samples or under prior orders. Lumileds is pioneering the highflux LED technology and bridging the gap between solid state LED technology and the lighting world. Lumileds is absolutely dedicated to bringing the best and brightest LED technology to enable new applications and markets in the lighting world. www.luxeon.com www.lumileds.com For technical assistance or the location of your nearest Lumileds sales office, call: Worldwide: +1 408.435.6044 US toll free: 877.298.9455 Europe: +31 499.339.439 Asia: +65 6248.4759 Japan: +81 426.60.8532 Fax: +1 408.435.6855 Email us at [email protected] ©2005 Lumileds Lighting U.S. LLC. All rights reserved. Lumileds Lighting is a joint venture between Agilent Technologies and Philips Lighting. 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