PD-95265 IRF7811AVPbF IRF7811AVPbF • • • • • N-Channel Application-Specific MOSFETs Ideal for CPU Core DC-DC Converters Low Conduction Losses Low Switching Losses Minimizes Parallel MOSFETs for high current applications • 100% RG Tested • Lead-Free 1 8 S 2 7 S 3 6 4 5 S G Description This new device employs advanced HEXFET Power MOSFET technology to achieve an unprecedented balance of on-resistance and gate charge. The reduced conduction and switching losses make it ideal for high efficiency DC-DC converters that power the latest generation of microprocessors. SO-8 A A D D D D Top View DEVICE CHARACTERISTICS The IRF7811AV has been optimized for all parameters that are critical in synchronous buck converters including RDS(on), gate charge and Cdv/dt-induced turn-on immunity. The IRF7811AV offers an extremely low combination of Qsw & RDS(on) for reduced losses in both control and synchronous FET applications. IRF7811AV 11 mΩ RDS(on) QG QSW 17 nC 6.7 nC QOSS The package is designed for vapor phase, infra-red, convection, or wave soldering techniques. Power dissipation of greater than 2W is possible in a typical PCB mount application. 8.1 nC Absolute Maximum Ratings Symbol IRF7811AV Units Drain-to-Source Voltage Parameter VDS 30 V Gate-to-Source Voltage VGS ±20 Continuous Output Current TA = 25°C (VGS ≥ 4.5V) TL = 90°C c T Power Dissipation e T = 25°C L = 90°C Junction & Storage Temperature Range Continuous Source Current (Body Diode) Pulsed Source Current c A 11.8 100 IDM Pulsed Drain Current A 10.8 ID 2.5 PD TJ , TSTG 3.0 -55 to 150 IS 2.5 ISM 50 W °C A Thermal Resistance Parameter eh Maximum Junction-to-Lead h Maximum Junction-to-Ambient www.irf.com Symbol Typ Max RθJA ––– 50 RθJL ––– 20 Units °C/W 1 08/17/04 IRF7811AVPbF Electrical Characteristics Parameter Drain-to-Source Breakdown Voltage Symbol Min V(BR)DSS 30 Typ ––– Max Units Conditions ––– V VGS = 0V, ID = 250µA d Static Drain-to-Source On-Resistance RDS(on) ––– 11 14 Gate Threshold Voltage VGS(th) 1.0 ––– 3.0 V ––– ––– 50 µA VDS = 30V, VGS = 0V ––– ––– 20 µA VDS = 24V, VGS = 0V 100 mA VDS = 24V, VGS = 0V, TJ = 100°C Drain-to-Source Leakage Current IDSS ––– ––– Gate-to-Source Leakage Current IGSS ––– ––– ±100 Total Gate Charge, Control FET Qg ––– 17 26 Total Gate Charge, Synch FET Qg ––– 14 21 Pre-Vth Gate-to-Source Charge Qgs1 ––– 3.4 ––– Post-Vth Gate-to-Source Charge Qgs2 ––– 1.6 ––– Gate-to-Drain ("Miller") Charge Qgd ––– 5.1 ––– Switch Charge (Qgs2 + Qgd) QSW ––– 6.7 ––– Output Charge QOSS ––– 8.1 12 Gate Resistance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time mΩ VGS = 4.5V, ID = 15A VDS = VGS, ID = 250µA nA VGS = ± 20V nC VDS = 24V, ID = 15A, VGS = 5.0V VGS = 5.0V, VDS < 100mV VDS = 16V, ID = 15A VDS = 16V, VGS = 0 RG 0.5 ––– 4.4 Ω td(on) ––– 8.6 ––– ns tr ––– 21 ––– ID = 15A td(off) ––– 43 ––– VGS = 5.0V tf ––– 10 ––– Clamped Inductive Load Input Capacitance Ciss ––– 1801 ––– Output Capacitance Coss ––– 723 ––– Reverse Transfer Capacitance Crss ––– 46 ––– pF VDD = 16V VGS = 0V VDS = 10V Diode Characteristics Parameter Diode Forward Voltage Reverse Recovery Charge Reverse Recovery Charge (with Parallel Schottsky) f f Symbol Min VSD ––– Typ Max Units ––– 1.3 V Conditions TJ = 25°C, IS = 15A ,VGS = 0V d Qrr ––– 50 ––– nC di/dt = 700A/µs VDD = 16V, VGS = 0V, ID = 15A Qrr ––– 43 ––– nC di/dt = 700A/µs , (with 10BQ040) VDD = 16V, VGS = 0V, ID = 15A Notes: Repetitive rating; pulse width limited by max. junction temperature. Pulse width ≤ 400 µs; duty cycle ≤ 2%. When mounted on 1 inch square copper board, t < 10 sec. Typ = measured - Qoss Typical values of RDS(on) measured at VGS = 4.5V, QG, QSW and QOSS measured at VGS =5.0V, IF = 15A. Rθ is measured at TJ approximately 90°C 2 www.irf.com 2.0 6 VGS , Gate-to-Source Voltage (V) I D = 15A 1.5 (Normalized) RDS(on) , Drain-to-Source On Resistance IRF7811AVPbF 1.0 0.5 0.0 4 2 V GS = 4.5V -60 -40 -20 0 20 40 60 80 100 120 140 0 160 0 ( ° C) T J , Junction Temperature 10 15 20 Figure 2. Gate-to-Source Voltage vs. Typical Gate Charge 3000 0.020 V GS = 0V, f = 1 MHZ Ciss = C gs + C gd , Cds SHORTED Crss = C gd I D = 15A 0.018 2500 C, Capacitance(pF) Coss = C ds + C gd 0.016 0.014 0.012 Ciss 2000 Coss 1500 1000 0.010 500 0.008 0 Crss 3.0 6.0 9.0 12.0 15.0 1 V GS, Gate -to -Source Voltage (V) 100 Figure 4. Typical Capacitance vs. Drain-to-Source Voltage 100 ISD , Reverse Drain Current (A) 100 T J = 150 °C 10 TJ = 25 °C 1 0.1 10 V DS , Drain-to-Source Voltage (V) Figure 3. Typical Rds(on) vs. Gate-to-Source Voltage I D , Drain-to-Source Current (A) 5 Q G, Total Gate Charge (nC) Figure 1. Normalized On-Resistance vs. Temperature RDS(on) , Drain-to -Source On Resistance ( Ω) ID = 15A VDS = 16V V DS = 15V 20µs PULSE WIDTH 2.0 2.5 3.0 3.5 4.0 4.5 V GS, Gate-to-Source Voltage (V) Figure 5. Typical Transfer Characteristics www.irf.com TJ = 150 °C 10 TJ = 25 °C 1 0.1 5.0 V GS= 0 V 0.3 0.6 0.9 1.2 1.5 V SD ,Source-to-Drain Voltage (V) Figure 6. Typical Source-Drain Diode Forward Voltage 3 IRF7811AVPbF Thermal Response(Z thJA ) 100 D = 0.50 10 0.20 0.10 0.05 PDM 0.02 1 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJA + TA 0.1 0.0001 0.001 0.01 0.1 1 10 100 1000 t1, Rectangular Pulse Duration (sec) Figure 7. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient 50 u 8V 5 uH Schottky -6A VDD 450 50 u 16Vz500mW Repetition rate:100Hz 125nS Mic4452BM 450 50 Ohms probe V ds 90% 10% Vgs t d(on) t d(off) t f(v) t r (v) Switching Time Waveforms Figure 8. Clamped Inductive load test diagram and switching waveform 4 www.irf.com IRF7811AVPbF SO-8 Package Outline Dimensions are shown in millimeters (inches) D DIM B 5 A 8 7 6 5 H E 0.25 [.010] 1 2 3 A 4 MIN .0532 .0688 1.35 1.75 A1 .0040 e e1 0.25 .0098 0.10 .013 .020 0.33 0.51 c .0075 .0098 0.19 0.25 D .189 .1968 4.80 5.00 E .1497 .1574 3.80 4.00 e .050 BASIC 1.27 BASIC .025 BASIC 0.635 BASIC H .2284 .2440 5.80 6.20 K .0099 .0196 0.25 0.50 L .016 .050 0.40 1.27 y 0° 8° 0° 8° K x 45° A C y 0.10 [.004] A1 8X b 0.25 [.010] MAX b e1 6X MILLIMETERS MAX A 6 INCHES MIN 8X L 8X c 7 C A B F OOTPRINT NOT ES : 1. DIMENS IONING & TOLERANCING PER ASME Y14.5M-1994. 8X 0.72 [.028] 2. CONT ROLLING DIMENS ION: MILLIMET ER 3. DIMENS IONS ARE SHOWN IN MILLIMETERS [INCHES]. 4. OUTLINE CONFORMS TO JEDEC OUTLINE MS -012AA. 5 DIMENS ION DOES NOT INCLUDE MOLD PROT RUSIONS . MOLD PROTRUS IONS NOT TO EXCEED 0.15 [.006]. 6 DIMENS ION DOES NOT INCLUDE MOLD PROT RUSIONS . MOLD PROTRUS IONS NOT TO EXCEED 0.25 [.010]. 6.46 [.255] 7 DIMENS ION IS T HE LENGT H OF LEAD FOR SOLDERING TO A S UBST RAT E. 3X 1.27 [.050] 8X 1.78 [.070] SO-8 Part Marking EXAMPLE: T HIS IS AN IRF7101 (MOSFET ) INT ERNAT IONAL RECT IFIER LOGO XXXX F7101 DAT E CODE (YWW) P = DES IGNAT ES LEAD-FREE PRODUCT (OPT IONAL) Y = LAS T DIGIT OF T HE YEAR WW = WEEK A = AS S EMBLY S IT E CODE LOT CODE PART NUMBER www.irf.com 5 IRF7811AVPbF SO-8 Tape and Reel TERMINAL NUMBER 1 12.3 ( .484 ) 11.7 ( .461 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES: 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 330.00 (12.992) MAX. 14.40 ( .566 ) 12.40 ( .488 ) NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. OUTLINE CONFORMS TO EIA-481 & EIA-541. Data and specifications subject to change without notice. This product has been designed and qualified for the Consumer market. Qualifications Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.08/04 6 www.irf.com