PD- 91363E IRLR024N IRLU024N HEXFET® Power MOSFET l l l l l l Logic-Level Gate Drive Surface Mount (IRLR024N) Straight Lead (IRLU024N) Advanced Process Technology Fast Switching Fully Avalanche Rated D VDSS = 55V RDS(on) = 0.065Ω G ID = 17A S Description Fifth Generation HEXFET® Power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible onresistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. The D-PAK is designed for surface mounting using vapor phase, infrared, or wave soldering techniques. The straight lead version (IRFU series) is for through-hole mounting applications. Power dissipation levels up to 1.5 watts are possible in typical surface mount applications. D-Pak I-Pak IRLR024N IRLU024N Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, V GS @ 10V Continuous Drain Current, V GS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Max. Units 17 12 72 45 0.3 ± 16 68 11 4.5 5.0 -55 to + 175 A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) Thermal Resistance Parameter RθJC RθJA RθJA Junction-to-Case Case-to-Ambient (PCB mount)** Junction-to-Ambient Typ. Max. Units ––– ––– ––– 3.3 50 110 °C/W ** When mounted on 1" square PCB (FR-4 or G-10 Material ) . For recommended footprint and soldering techniques refer to application note #AN-994 www.irf.com 1 2/10/00 IRLR/U024N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) ∆V(BR)DSS/∆TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current V(BR)DSS Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time LD Internal Drain Inductance LS Internal Source Inductance Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance IGSS Min. Typ. Max. Units Conditions 55 ––– ––– V V GS = 0V, ID = 250µA ––– 0.061 ––– V/°C Reference to 25°C, ID = 1mA ––– ––– 0.065 VGS = 10V, ID = 10A ––– ––– 0.080 Ω VGS = 5.0V, ID = 10A ––– ––– 0.110 VGS = 4.0V, ID = 9.0A 1.0 ––– 2.0 V VDS = VGS, ID = 250µA 8.3 ––– ––– S VDS = 25V, ID = 11A ––– ––– 25 VDS = 55V, VGS = 0V µA ––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C ––– ––– 100 VGS = 16V nA ––– ––– -100 VGS = -16V ––– ––– 15 ID = 11A ––– ––– 3.7 nC VDS = 44V ––– ––– 8.5 VGS = 5.0V, See Fig. 6 and 13 ––– 7.1 ––– VDD = 28V ––– 74 ––– ID = 11A ns ––– 20 ––– RG = 12Ω, VGS = 5.0V ––– 29 ––– R D = 2.4Ω, See Fig. 10 Between lead, ––– 4.5 ––– nH 6mm (0.25in.) G from package ––– 7.5 ––– and center of die contact ––– 480 ––– VGS = 0V ––– 130 ––– pF V DS = 25V ––– 61 ––– ƒ = 1.0MHz, See Fig. 5 D S Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– 17 showing the A G integral reverse ––– ––– 72 S p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 11A, V GS = 0V ––– 60 90 ns TJ = 25°C, IF = 11A ––– 130 200 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11) VDD = 25V, starting TJ = 25°C, L = 790µH RG = 25Ω, I AS = 11A. (See Figure 12) ISD ≤ 11A, di/dt ≤ 290A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C 2 Pulse width ≤ 300µs; duty cycle ≤ 2%. This is applied for I-PAK, LS of D-PAK is measured between lead and center of die contact Uses IRLZ24N data and test conditions. www.irf.com IRLR/U024N 100 100 VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTTOM 2.5V 10 1 2.5 V 20µ s P U L S E W ID T H T J = 2 5°C 0.1 0.1 VGS 15V 12V 10V 8.0V 6.0V 4.0V 3.0V BOTTOM 2.5V TOP ID , D rain-to-S ource C urrent (A ) ID , D ra in -to-S ou rce C u rrent (A ) TOP 1 10 10 2 .5V 1 2 0µ s P U LS E W ID T H T J = 1 75 °C 0.1 A 100 0.1 V D S , D rain-to-S ource V oltage (V ) R D S (on ) , D rain -to-S ou rc e O n R es is tan c e (N orm a liz ed) 3.0 I D , D rain-to-So urce C urren t (A ) TJ = 2 5 °C TJ = 1 7 5 °C 10 1 V DS = 1 5V 2 0µ s P U L S E W ID TH 3 4 5 6 7 8 9 V G S , G ate-to -So urce Voltag e (V) Fig 3. Typical Transfer Characteristics www.irf.com A 100 Fig 2. Typical Output Characteristics 100 2 10 V D S , D rain-to-S ource V oltage (V ) Fig 1. Typical Output Characteristics 0.1 1 10 A I D = 17 18 AA 2.5 2.0 1.5 1.0 0.5 V G S = 1 0V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , J unc tion T em perature (°C ) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRLR/U024N C iss 600 C , Capacitance (pF) V GS C is s C rs s C o ss 400 = = = = 15 0V , f = 1M H z C g s + C g d , Cd s S H O R T E D C gd C d s + C gd V G S , G ate-to-S ource V oltage (V ) 800 C oss 200 C rss 0 10 V D S = 4 4V V D S = 2 8V 12 9 6 3 FO R TE S T C IRC UIT S E E FIG U R E 1 3 0 A 1 I D = 11 A 100 0 4 V D S , D rain-to-S ourc e V oltage (V ) 16 A 20 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 1000 O P E R AT ION IN TH IS AR E A LIM ITE D B Y R D S (on) I D , D rain C urrent (A ) I S D , R ev ers e D rain C urre nt (A ) 12 Q G , T otal G ate C harge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage T J = 1 75 °C T J = 25°C 10 VG S = 0V 1 0.4 0.8 1.2 1.6 V S D , S ource-to-D rain V oltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 8 A 2.0 100 1 0µ s 1 00 µ s 10 T C = 25°C T J = 175°C S ingle P ulse 1 1 1m s 1 0m s 10 A 100 VD S , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRLR/U024N 20 RD VDS I D , Drain Current (A) VGS 15 RG 10 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % D.U.T. + -VDD 5V Fig 10a. Switching Time Test Circuit 5 VDS 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Therm al R esponse (Z thJ C ) 10 D = 0 .5 0 1 0 .2 0 0 .1 0 0 .0 5 PD M 0 .0 2 0 .0 1 0.1 t S IN G L E P U L S E (T H E R M A L R E S P O N S E ) 1 t2 N ote s: 1 . D u ty fac tor D = t 1 / t 2 2. P e a k TJ = P D M x Z th JC + T C 0.01 0.00001 0.0001 0.001 0.01 0.1 A 1 t 1 , R e ctan g ula r P ulse D u ratio n (sec ) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRLR/U024N 1 5V L VDS D .U .T RG IA S 20V D R IV E R + V - DD 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit A E A S , S ingle Pulse Avalanc he E nergy (m J) 140 TO P 120 B OTTOM ID 4 .5 A 7.8 A 1 1A 100 80 60 40 20 0 V D D = 25 V 25 50 A 75 100 125 150 175 S tarting T J , J unc tion T em perature (°C ) V (B R )D SS tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Current Regulator Same Type as D.U.T. Fig 12b. Unclamped Inductive Waveforms 50KΩ QG 12V .2µF .3µF 10 V QGS + V - DS VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform 6 D.U.T. QGD IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRLR/U024N Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test Driver Gate Drive P.W. D= Period + - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFET® MOSFETs www.irf.com 7 IRLR/U024N D-Pak (TO-252AA) Package Outline Dimensions are shown in millimeters (inches) 2 .3 8 (.0 9 4 ) 2 .1 9 (.0 8 6 ) 6 .7 3 (.2 6 5 ) 6 .3 5 (.2 5 0 ) -A 1 .2 7 (.0 5 0 ) 0 .8 8 (.0 3 5 ) 5 .4 6 (.2 1 5 ) 5 .2 1 (.2 0 5 ) 1 .1 4 (.0 4 5 ) 0 .8 9 (.0 3 5 ) 0 .5 8 (.0 2 3 ) 0 .4 6 (.0 1 8 ) 4 6 .4 5 (.2 4 5 ) 5 .6 8 (.2 2 4 ) 6 .2 2 (.2 4 5 ) 5 .9 7 (.2 3 5 ) 1.0 2 (.0 4 0 ) 1.6 4 (.0 2 5 ) 1 2 1 0 .4 2 (.4 1 0 ) 9 .4 0 (.3 7 0 ) 0 .5 1 (.0 2 0 ) M IN . -B 1 .5 2 (.0 6 0 ) 1 .1 5 (.0 4 5 ) 2X 1 .1 4 (.0 4 5 ) 0 .7 6 (.0 3 0 ) L E A D A S S IG N M E N T S 1 - GATE 3 2 - D R A IN 3 - S OU R CE 4 - D R A IN 0 .8 9 (.0 3 5 ) 3X 0 .6 4 (.0 2 5 ) 0 .2 5 ( .0 1 0 ) 0 .5 8 (.0 2 3 ) 0 .4 6 (.0 1 8 ) M A M B N O TE S : 2 .2 8 ( .0 9 0 ) 1 D IM E N S IO N IN G & T O L E R A N C IN G P E R A N S I Y 1 4 .5 M , 1 9 8 2 . 4 .5 7 ( .1 8 0 ) 2 C O N T R O L L IN G D IM E N S IO N : IN C H . 3 C O N F O R M S T O J E D E C O U T L IN E T O -2 5 2 A A . 4 D IM E N S IO N S S H O W N A R E B E F O R E S O L D E R D IP , S O L D E R D IP M A X. + 0 .1 6 (.0 0 6 ) . D-Pak (TO-252AA) Part Marking Information 8 www.irf.com IRLR/U024N I-Pak (TO-251AA) Package Outline Dimensions are shown in millimeters (inches) 6 .7 3 (.26 5 ) 6 .3 5 (.25 0 ) 2 .3 8 (.0 9 4 ) 2 .1 9 (.0 8 6 ) -A 1 .2 7 (.0 5 0 ) 0 .8 8 (.0 3 5 ) 5 .4 6 (.2 1 5 ) 5 .2 1 (.2 0 5 ) 0 .5 8 (.0 2 3 ) 0 .4 6 (.0 1 8 ) 4 6 .4 5 (.2 4 5 ) 5 .6 8 (.2 2 4 ) 6 .2 2 (.2 4 5 ) 5 .9 7 (.2 3 5 ) 1 .5 2 (.0 6 0 ) 1 .1 5 (.0 4 5 ) 1 2 L E A D A S S IG N M E N T S 1 - G A TE 2 - D R A IN 3 - S OUR C E 4 - D R A IN 3 -B - N O TE S : 1 D IM E N S IO N IN G & TO L E R A N C IN G P E R A N S I Y 1 4 .5 M , 19 8 2 . 2.2 8 (.0 9 0) 1.9 1 (.0 7 5) 2 C O N T R O L L IN G D IM E N S IO N : IN C H . 3 C O N F O R M S T O J E D E C O U TL IN E T O -2 5 2 A A . 9 .6 5 (.3 8 0 ) 8 .8 9 (.3 5 0 ) 4 D IM E N S IO N S S H O W N A R E B E F O R E S O L D E R D IP , S O L D E R D IP M A X . + 0 .1 6 (.0 0 6 ). 3X 1 .1 4 (.0 45 ) 0 .7 6 (.0 30 ) 2 .2 8 (.0 9 0 ) 2X 3X 1 .1 4 (.0 4 5 ) 0 .8 9 (.0 3 5 ) 0 .8 9 ( .0 3 5 ) 0 .6 4 ( .0 2 5 ) 0 .2 5 (.0 1 0 ) M A M B 0 .58 (.0 2 3 ) 0 .46 (.0 1 8 ) I-Pak (TO-251AA) Part Marking Information www.irf.com 9 IRLR/U024N D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR 1 6.3 ( .641 ) 1 5.7 ( .619 ) 12 .1 ( .4 76 ) 11 .9 ( .4 69 ) F E E D D IR E C T IO N TRL 16 .3 ( .641 ) 15 .7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) F E E D D IR E C T IO N NO T ES : 1. C O N T R O LL IN G D IM E N S IO N : M ILLIM E T E R . 2. A LL D IM E N S IO N S A R E S H O W N IN M ILL IM E T E R S ( IN C H E S ). 3. O U T L IN E C O N F O R M S T O E IA -4 81 & E IA -54 1. 13 IN C H 16 m m NOTES : 1. O U T LIN E C O N F O R M S T O E IA -481 . WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 252-7105 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 Data and specifications subject to change without notice. 2/10 10 www.irf.com Note: For the most current drawings please refer to the IR website at: http://www.irf.com/package/