Keysight Medalist i3070 Series 5 In‑Circuit Test System The Keysight Technologies, Inc. Medalist i3070 Series 5 In‑Circuit Test (ICT) system introduces a new infrastructure with 3 new Capabilities: 1. The lexibility to incorporate external circuits to balance between ICT & functional testers and reduce investment on functional testers Data Sheet 2. Wider range of power handling capabilities for today’s high-powered products to reduce investment on power supply hardware 3. Improved test throughput to increase production volumes, making more tester resources available The Series 5 – Saves Costs. No Compromise. The Keysight Medalist i3070 Series 5 In‑Circuit Test System comes with industry‑leading limited access test technology, including the multiple‑award‑winning Cover‑Extend Technology. Latest Features on the Series 5 ICT System New Analog Measurement Card The new Analog Stimulus and Response Unit (ASRU) includes 1. BT-Basic DLL Integration This feature allows users to call any external DLL function by passing the parameters and receiving the results within the BT-Basic environment. Examples of DLL functions include flash programming, updating of databases and functional tests. 2. Keysight Medalist i3070 LED Test* Medalist i3070 LED Test is an industry-first digital LED test, integrated into ICT, to inspect the color and intensity of LEDs in the visible light spectrum (400-660 nm). It provides fast, reliable, and accurate inspection of LEDs for color (wavelength) and luminosity (intensity). 6. 60 V zener testing capabilities In today’s boards, because of their higher voltage power supply requirements, larger zener diodes are required. With the new ASRU card, a maximum of 60 V zeners can be tested instead of up to 18 V. 7. Digitized Measurement Circuit (DMC) with new frequency options The purpose of this circuit is to speed up the analog testing by using multiple ports on a microcontroller to digitize, at one time, the multiple readings taken during a test. The microcontroller ports can be assigned to the stimulus and response busses as well as the sense busses, so that all four readings on a 4-wire measurement can be taken at one time. This Digitized Measurement Circuit comes with two new frequency options: fr100k and fr200k. These frequencies are added to the AC testing methods for passive components like capacitors and inductors for better isolation of smaller components during test. This new measurement circuit is different and separate from the analog measurement circuit using Measurement Op-Amplifier (MOA). Tests generated for the MOA will have to be re-debugged if tested with the DMC because the internal circuit characteristics are different from the MOA. The stability and reliability of the measurement after the test has been debugged remains the same as when measured with the MOA circuit. * (Appropriate hardware is needed) 3. Two channels of high current capabilities of up to 10 A per channel The DUT power supply channels 3 and 4 on the ASRU card have their current capabilities increased from 4 A to 10 A per channel. This allows the channels to carry 10 A currents into the board for high current application testing, such as power supplies. 4. Power Monitoring Circuit The Power Monitoring Circuit (PMC) is a new safety feature. It not only provides real time monitoring but also helps users to distinguish between a power supply failure or a digital test failure in the event of a failed digital test. This feature also tries to prevent the back-drive current that can cause damage to ICs. 5. Fixture power supply This powering capability is intended for fixture electronics and other external powering purposes. It is controlled by the user with BT-BASIC commands for enabling and disabling. Figure 1. The new analog stimulus and response unit card in the Medalist i3070 Series 5 offers users many new features and faster analog tests 2 Latest Features on the Series 5 ICT System Incorporating External Electronics This capability is enabled through both hardware and software features added to the i3070 Series 5 test system. Connecting external instru‑ ments or equipment Balanced multiplexed 1:4 75 Ω ports Introduction of utility card The new utility card is an optional pin card that will fit in a card slot in any of the modules on the testhead. It has three cavities in the card to allow users to plug in their own custom electronics for added functional test or functionality during ICT. The user can now design his own card and make it part of the tester. One utility card can be installed on each module. Each custom electronics unit should come with the necessary software drivers that can be installed on the testhead controller. Each cavity on the utility card has two connectors; one is mainly for a signal bus to the board under test and the other for power and control to the external electronics installed in the cavity. Two balanced 1:4 multiplexed 75 Ω ports are available on the utility card to allow users to add differential signals to the board under test. These ports can be used individually for single sided signals. Parameter Rating Number of ports 2 Multiplexing 1:4 Bandwidth 3 dB (at 35 MHz ±3 MHz) Crosstalk < 1 MHz (–55 dB ±2 dB) Maximum current 2 A ±0.5 A Impedance General purpose relays Eight general purpose relays are available on the utility card. The control of these relays in software is the same as for the general purpose relays on the ASRU. Flexible 1:6 multiplexed power supply channels The Utility Card allows 48 V at 10 A on each of two 1:6 port power supply channels. Each power supply channel can be user-configured to be multiplexed to supply power to up to six individual boards on a panel or the individual relays can be configured to switch together to enable testing of a single board which requires 10 A current power supplies. 75 Ω per pair Please refer to the Keysight data sheet 5990-4411EN (Keysight Utility Card Specifications) for more details on the utility card. Figure 2. The new utility card on the Medalist i3070 Series 5 allows for customizable functional tests to be added at the in-circuit test process 3 Latest Features on the Series 5 ICT System Software Enhancement The Series 5 also includes software and enhancements listed below, and retains all the user-friendly features of the original i3070 system, such as: – DC test method for large capacitor testing When testing large capacitors, it is possible to specify the current instead of using the standard 100 mV across the capacitor. – Ease of use Point-and-click interfaces remove the user’s need to type in commands during the operation of the tester – Board Locator The Board Locator allows the user to search for any component on the board under test as well as probes and testhead resources. – AutoOptimizer Keysight Medalist i3070 tests can be optimized with the click of a button, reducing test time by 10 to 50 percent per test. – AutoDebug With the click of a button, the system can perform a complete analog test debug in a matter of hours. AutoDebug ine-tunes tests so boards pass reliably in production. Please refer to the Keysight Medalist i3070 In-Circuit Test System data sheet 5989-6292EN for detailed information on the original features which users can continue to enjoy on the Series 5. Figure 3. The Series 5 retains all the easy-to-use interfaces that many users are now accustomed to on the Medalist i3070 system Related Keysight Literature Publication title Pub number Keysight Medalist i3070 ICT Data Sheet 5989-6292EN Keysight Utility Card Specifications 5990-4411EN Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access Solution on In Circuit Test – A Case Study 5990-3741EN Keysight Medalist VTEP v2.0 Powered! With Cover-Extend Technology Flyer 5989-8429EN Overcoming Limited Access with Cover-Extend Technology at In-Circuit Test Case Study 5990-4218EN IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 In Circuit Systems White Paper 5990-3232EN Keysight Medalist Bead Probe Technology Product Overview 5989-5802EN Comparing Contact Performance on PCBA using Conventional Testpads and Bead Probes White Paper 5989-9918EN Using Bead Probes to Increase Test Access Case Study 5989-8420EN Related literature can be located on Keysight’s Medalist In-Circuit Test Solutions web site at: www.keysight.com/find/ict under the “Library” tab. 4 Speciications Keysight Medalist i3070 Series 5 Multiplexed Keysight Medalist i3070 Series 5 Un-multiplexed Maximum channels 1152 5184 Maximum nodes 5184 5184 Pin card HybridPlus double density Un-multiplexed hybrid 144 channel Driver/receiver mux ratio 9:2 multiplexing 1:1 tester-per-pin Vector application rate 6.25 MPs, 12.5 MPs, 20 MPs 6.25 MPs Logic level –3.5 V to 5 V (per digital channel pin programmable) 0 to 4.75 V (per-pin programmable) Logic threshold Dual threshold Single threshold Slew rate 25 V/µsec to 275 V/µsec (per digital channel pin programmable) 300 V/µsec (optimized fixed rise/fall time) Digital driver/Receiver offset –30 n to +100 n (per digital channel pin programmable) Not applicable Operating system Windows 7 Professional Test generation toolset Board Consultant Fixture Consultant Test Consultant Time-to-money test development Board/Fixture graphics display Browser Board Consultant Fixture consultant Browser Circuit analysis Keysight Medalist i3070 Application Software Automatic (IPG) with Monte Carlo simulation Windows graphical user interface (supports localization) Probe pin locator Interactive probe/pin locator with guided probed Runtime yield display Real time FPY (First Pass Yield) display at runtime Probe/fixture maintenance tools Worst probe reporting (reports real time fixture probe number that fails frequently) Yield enhancement tool Analog unpowered debug interface IYET (Intelligent Yield Enhancement Tool) Graphical user interface in spread sheet format (supports localization) Digital/Analog powered debug interface AutoDebug PushButton Debug AutoDebug on analog unpowered tests, TestJet, VTEP v2.0 (VTEP, iVTEP and NPM) and Cover-Extend Technology Modular construction for flexibility/scalability (1 to 4) Standard Dual-well construction for maximum throughput Standard Throughput multiplier Standard Failure message printer Standard (strip printer) Vacuum solenoids Built-in standard 5 Speciications Keysight Medalist i3070 Series 5 Multiplexed System power input connections Keysight Medalist i3070 Series 5 Un-multiplexed Included (power supply type will be specified based on regional requirements) Shipping and installation assistance Included (Keysight authorized representative) Analog unpowered measurement 2 to 6 wire measurement Backdriving current 750 mA Backdriving test program setup Automatic by logic family Overvoltage protection Yes Capacitor discharge protection Yes Arbitrary waveform generator Yes Fixture types supported Short wire, long wire Repeatability Excellent Transportability Excellent Temperature compensation AutoAdjust at every 5° C temperature drift/1000 hours of operation Open/short testing Yes (automatic IPG) Analog testing Yes (automatic IPG) Vector programming VCL and PCF Vectorless testing VTEP v2.0 and TestJet NAND tree program generator Language based Disabling analysis Yes (automatic IPG) Digital test pattern generator Frequency measurement Yes 60 MHz (beyond 60 MHz measurement possible using fixture electronics solution) Multilevel disable (digital isolation) Yes High-voltage testing capability 100 V Low-voltage testing capability No limit Number of analog guarding points Unlimited Worst probe report Yes First pass yield report Yes Component-level coverage report Yes Intelligent yield enhancement test Yes Limited access tools Yes Flash 70 device programming Yes Polarity check software Yes ICT Boundary Scan Yes PanelTest for panelized PCBAs Yes Simplate express fixturing software Yes Standard i3070 operating system Yes Multiple board versions software Yes Dual-well sharing Yes Throughput multiplier Relay-level diagnostics tool Yes Included 1-year license SPC quality tool Push-button Q-Stats 6 Speciications Keysight Medalist i3070 Series 5 Multiplexed Keysight Medalist i3070 Series 5 Un-multiplexed Software products Test development software bundle (stand alone) Includes: Express fixturing Drive thru Flash programming Multiple board versions Dual-well sharing Flash ISP Advanced probe spacing PLD ISP VTEP v2.0 Powered VTEP iVTEP NPM Cover-Extend Technology InterconnectPlus Advanced Boundary Scan 1149.6 Throughput multiplier Panel test TestJet Boundary Scan Polarity check Silicon nails Flash70 InterconnectPlus Boundary Scan Drive-Thru for VTEP v2.0 TestSight Developer Advanced Boundary Scan tool suite Test development software for Vectorless Test Extended Performance (VTEP) tool CAD translation software for ICT test and fixture development Flash ISP In-system programming for flash memory devices ISP suite Combined flash and PLD in-system programming software suite Silicon nails Test development tools for limited access test coverage Cover-Extend A hybrid of Boundary Scan and VTEP testing for added test coverage on limited test access boards Connect Check Analog testing in a limited access environment N/A Analog capabilities Shorts and Opens 2 Ω – 1000 Ω ± (0.25% + 2.2 Ω) Resistors 0.1 Ω to 10 MΩ ± (0.25% to 5% + plus system residual ≤ 3.5 W) Capacitors 10 pf to 10 mf ± (2% to 6% + *) * Plus system residual: ± 1 pF with capacitor compensation, 0 to +40 pF typical without capacitor compensation Inductors 5 μH to 100 H ± (2% to 5%) + plus system residual: 1 μH Potentiometer Same method as resistors Diode ± 0 – 19 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA Zener ± 0 – 18 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8 ± 19 – 60 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8 Transistor Depletion FET Fuse, switch, jumper Same method as Diode + DC Beta (10-1000 ± (15.0%)) 5 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W 0.1 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W 7 Speciications Keysight Medalist i3070 Series 5 Multiplexed Keysight Medalist i3070 Series 5 Un-multiplexed Hybrid plus double density Analog plus double density Access plus Utility Un-multiplexed hybrid 144-channel Utility Modules and pin cards Pin card Measurement card ASRU (Analog Stimulus Response Unit) Revision N Control card Number of modules supported Control XTP 1 to 4 modules (additional modules activation package to expand capabilities of systems having unused empty modules. Required additional hybrid card, Control XTP, ASRU card and associated cabling and hardware) DUT power supplies DUT power supplies type* Keysight PS6751Quad Output (0-50 V/0-5 A) Keysight 6624 Quad Output (0-20 V/0-2 A, 0-7 V/0-5 A, 0-50.5 V/0.0824 A, 0-20.2 V/0-2.06 A) Keysight 6621A Dual Output (0-7 V/0-10 A, 0-20.2 V/0-4.12 A) Keysight 6634 Single Output (0-100 V/0-1 A) Keysight 6642 Single Output (0-20 V/ 0-10 A) Number of supply channels Up to 24 programmable supplies or up to 32 channel with utility card Accessories Bar code reader For data entry of DUT board serial number Pin verification fixture Performance port To add external signal capabilities to your i3070 system Product support kits Multiple optional kits to choose from Consulting services Multiple service options and products to choose from User training * For system calibration and diagnostics Multiple optional training programs to choose from Refer to Keysight Medalist i3070 Series 5 Test Method and Specifications for more details Additional information on Keysight’s Medalist In-Circuit Test Solutions can be found at www.keysight.com/find/ict 8 09 | Keysight | Medalist i3070 Series 5 In‑Circuit Test System ‑ Data Sheet myKeysight www.keysight.com/find/mykeysight A personalized view into the information most relevant to you. www.axiestandard.org AdvancedTCA® Extensions for Instrumentation and Test (AXIe) is an open standard that extends the AdvancedTCA for general purpose and semiconductor test. Keysight is a founding member of the AXIe consortium. ATCA®, AdvancedTCA®, and the ATCA logo are registered US trademarks of the PCI Industrial Computer Manufacturers Group. For more information on Keysight Technologies’ products, applications or services, please contact your local Keysight office. The complete list is available at: www.keysight.com/find/contactus Americas Canada Brazil Mexico United States (877) 894 4414 55 11 3351 7010 001 800 254 2440 (800) 829 4444 Asia Paciic Australia China Hong Kong India Japan Korea Malaysia Singapore Taiwan Other AP Countries 1 800 629 485 800 810 0189 800 938 693 1 800 112 929 0120 (421) 345 080 769 0800 1 800 888 848 1 800 375 8100 0800 047 866 (65) 6375 8100 www.lxistandard.org LAN eXtensions for Instruments puts the power of Ethernet and the Web inside your test systems. 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DEKRA Certified ISO 9001:2008 Quality Management System Keysight Channel Partners www.keysight.com/find/channelpartners Get the best of both worlds: Keysight’s measurement expertise and product breadth, combined with channel partner convenience. www.keysight.com/find/ict www.keysight.com/find/i3070 Europe & Middle East Austria Belgium Finland France Germany Ireland Israel Italy Luxembourg Netherlands Russia Spain Sweden Switzerland United Kingdom 0800 001122 0800 58580 0800 523252 0805 980333 0800 6270999 1800 832700 1 809 343051 800 599100 +32 800 58580 0800 0233200 8800 5009286 0800 000154 0200 882255 0800 805353 Opt. 1 (DE) Opt. 2 (FR) Opt. 3 (IT) 0800 0260637 For other unlisted countries: www.keysight.com/find/contactus (BP‑07‑10‑14) This information is subject to change without notice. © Keysight Technologies, 2012 ‑ 2014 Published in USA, August 2, 2014 5990‑4344EN www.keysight.com