bq2011 Gas Gauge IC for High Discharge Rates Features General Description ➤ Conservative and repeatable measurement of available charge in rechargeable batteries The bq2011 Gas Gauge IC is intended for battery-pack installation to maintain an accurate record of available battery charge. The IC monitors a voltage drop across a sense resistor connected in series between the negative battery terminal and ground to determine charge and discharge activity of the battery. The bq2011 is designed for systems such as power tools with very high discharge rates. ➤ Designed for portable equipment such as power tools with high discharge rates ➤ Designed for battery pack integration - 120µA typical standby current (self-discharge estimation mode) - Small size enables implementations in as little as 1 2 square inch of PCB ➤ Direct drive of LEDs for capacity display ➤ Self-discharge compensation using internal temperature sensor ➤ Simple single-wire serial communications port for subassembly testing ➤ 16-pin narrow SOIC Pin Connections 1 16 VCC SEG1 2 15 REF SEG2 3 14 NC 4 The bq2011 supports a simple singleline bidirectional serial link to an external processor (common ground). The bq2011 outputs battery information in response to external commands over the serial link. To support subassembly testing, the outputs may also be controlled by command. The external processor may also overwrite some of the bq2011 gas gauge data registers. The bq2011 may operate directly from four cells. With the REF output and an external transistor, a simple, inexpensive regulator can be built to provide VCC from a greater number of cells. Internal registers include available charge, temperature, capacity, battery ID, and battery status. Pin Names MODE SEG3 Battery self-discharge is estimated based on an internal timer and temperature sensor. Compensations for battery temperature and rate of charge or discharge are applied to the charge, discharge, and selfdischarge calculations to provide available charge information across a wide range of operating conditions. Initial battery capacity is set using the PFC and MODE pins. Actual battery capacity is automatically “learned” in the course of a discharge cycle from full to empty and may be displayed depending on the display mode. Nominal available charge may be directly indicated using a five-segment LED display. These segments are used to indicate graphically the nominal available charge. 13 DQ MODE Display mode output NC No connect SEG1 LED segment 1 DQ Serial communications input/output SEG2 LED segment 2 RBI Register backup input SEG3 LED segment 3 SB Battery sense input SEG4 LED segment 4 DISP Display control input SEG4 5 12 RBI SEG5 6 11 SB SEG5 LED segment 5 SR Sense resistor input PFC 7 10 DISP PFC Programmed full count selection input VCC 3.0–6.5V VSS 8 9 Voltage reference output VSS Negative battery terminal SR REF 16-Pin Narrow SOIC PN201101.eps 2/96 E 1 bq2011 DISP Pin Descriptions MODE DISP floating allows the LED display to be active during charge and discharge if VSRO < -1mV (charge) or VSRO > 2mV (discharge). Transitioning DISP low activates the display for 4 ± 0.5 seconds. Display mode output When left floating, this output selects relative mode for capacity display. If connected to the anode of the LEDs to source current, absolute mode is selected for capacity display. See Table 1. SEG1– SEG5 SB RBI Programmed full count selection input DQ Sense resistor input Serial I/O pin This is an open-drain bidirectional pin. The voltage drop (VSR) across the sense resistor RS is monitored and integrated over time to interpret charge and discharge activity. The SR input is tied to the low side of the sense resistor. VSR > VSS indicates discharge, and VSR < VSS indicates charge. The effective voltage drop, VSRO, as seen by the bq2011 is VSR + VOS (see Table 3). NC Register backup input This input is used to provide backup potential to the bq2011 registers during periods when VCC ≤ 3V. A storage capacitor should be connected to RBI. This three-level input pin defines the programmed full count (PFC) thresholds and scale selections described in Table 1. The state of the PFC pin is only read immediately after a reset condition. SR Secondary battery input This input monitors the single-cell voltage potential through a high-impedance resistive divider network for the end-of-discharge voltage (EDV) threshold and maximum cell voltage (MCV). LED display segment outputs Each output may activate an LED to sink the current sourced from MODE, the battery, or VCC. PFC Display control input REF Voltage reference output for regulator REF provides a voltage reference output for an optional micro-regulator. No connect 2 VCC Supply voltage input VSS Ground bq2011 Figure 1 shows a typical battery pack application of the bq2011 using the LED display with absolute mode as a charge-state indicator. The bq2011 can be configured to display capacity in either a relative or an absolute display mode. The relative display mode uses the last measured discharge capacity of the battery as the battery “full” reference. The absolute display mode uses the programmed full count (PFC) as the full reference, forcing each segment of the display to represent a fixed amount of charge. A push-button display feature is available for momentarily enabling the LED display. Functional Description General Operation The bq2011 determines battery capacity by monitoring the amount of charge input to or removed from a rechargeable battery. The bq2011 measures discharge and charge currents, estimates self-discharge, monitors the battery for low-battery voltage thresholds, and compensates for temperature and charge/discharge rates. The charge measurement is made by monitoring the voltage across a small-value series sense resistor between the negative battery terminal and ground. The available battery charge is determined by monitoring this voltage over time and correcting the measurement for the environmental and operating conditions. The bq2011 monitors the charge and discharge currents as a voltage across a sense resistor (see RS in Figure 1). A filter between the negative battery terminal and the SR pin may be required if the rate of change of the battery current is too great. R1 bq2011 Gas Gauge IC Q1 ZVNL110A REF MODE SEG1 C1 0.1 F VCC RB1 VCC SB SEG2 RB2 SEG3 DISP SEG4 VSS SEG5 SR RS PFC RBI DQ Charger Indicates optional. Directly connect to VCC across 4 cells (4.8V nominal and should not exceed 6.5V) with a resistor and a Zener diode to limit voltage during charge. Otherwise, R1, C1, and Q1 are needed for regulation of >4 cells. Load Programming resistors and ESD-protection diodes are not shown. R-C on SR may be required, (application-specific), where the maximum R should not exceed 20K. FG201101.eps Figure 1. Battery Pack Application Diagram—LED Display, Absolute Mode 3 bq2011 charge display translation. The temperature range is available over the serial port in 10°C increments as shown below: Register Backup The bq2011 RBI input pin is intended to be used with a storage capacitor to provide backup potential to the internal bq2011 registers when VCC momentarily drops below 3.0V. VCC is output on RBI when VCC is above 3.0V. TMPGG (hex) Temperature Range After VCC rises above 3.0V, the bq2011 checks the internal registers for data loss or corruption. If data has changed, then the NAC and FULCNT registers are cleared, and the LMD register is loaded with the initial PFC. 0x < -30°C 1x -30°C to -20°C 2x -20°C to -10°C Voltage Thresholds 3x -10°C to 0°C In conjunction with monitoring VSR for charge/discharge currents, the bq2011 monitors the single-cell battery potential through the SB pin. The single-cell voltage potential is determined through a resistor-divider network per the following equation: 4x 0°C to 10°C 5x 10°C to 20°C 6x 20°C to 30°C 7x 30°C to 40°C 8x 40°C to 50°C 9x 50°C to 60°C Ax 60°C to 70°C Bx 70°C to 80°C Cx > 80°C RB1 = N −1 RB2 where N is the number of cells, RB1 is connected to the positive battery terminal, and RB2 is connected to the negative battery terminal. The single-cell battery voltage is monitored for the end-of-discharge voltage (EDV) and for maximum cell voltage (MCV). The EDV threshold level is used to determine when the battery has reached an “empty” state, and the MCV threshold is used for fault detection during charging. The EDV and MCV thresholds for the bq2011 are fixed at: VEDV = 0.90V VMCV = 2.00V Layout Considerations The bq2011 measures the voltage differential between the SR and VSS pins. VOS (the offset voltage at the SR pin) is greatly affected by PC board layout. For optimal results, the PC board layout should follow the strict rule of a single-point ground return. Sharing high-current ground with small signal ground causes undesirable noise on the small signal nodes. Additionally: During discharge and charge, the bq2011 monitors VSR for various thresholds, VSR1–VSR4. These thresholds are used to compensate the charge and discharge rates. Refer to the discharge compensation section for details. EDV monitoring is disabled if VSR > VSR1 (50mV typical) and resumes 1 second after VSR drops back below VSR1. Reset n The bq2011 recognizes a valid battery whenever VSB is greater than 0.1V typical. VSB rising from below 0.25V resets the device. Reset can also be accomplished with a command over the serial port as described in the Reset Register section. The capacitors (SB and VCC) should be placed as close as possible to the SB and VCC pins, respectively, and their paths to VSS should be as short as possible. A high-quality ceramic capacitor of 0.1µf is recommended for VCC. n The sense resistor (RS) should be as close as possible to the bq2011. n The R-C on the SR pin should be located as close as possible to the SR pin. The maximum R should not exceed 20K. Temperature The bq2011 internally determines the temperature in 10°C steps centered from -35°C to +85°C. The temperature steps are used to adapt charge and discharge rate compensations, self-discharge counting, and available 4 bq2011 1. Gas Gauge Operation Last Measured Discharge (LMD) or learned battery capacity: The operational overview diagram in Figure 2 illustrates the operation of the bq2011. The bq2011 accumulates a measure of charge and discharge currents, as well as an estimation of self-discharge. Charge and discharge currents are temperature and rate compensated, whereas self-discharge is only temperature compensated. LMD is the last measured discharge capacity of the battery. On initialization (application of VCC or battery replacement), LMD = PFC. During subsequent discharges, the LMD is updated with the latest measured capacity in the Discharge Count Register (DCR) representing a discharge from full to below EDV. A qualified discharge is necessary for a capacity transfer from the DCR to the LMD register. The LMD also serves as the 100% reference threshold used by the relative display mode. The main counter, Nominal Available Charge (NAC), represents the available battery capacity at any given time. Battery charging increments the NAC register, while battery discharging and self-discharge decrement the NAC register and increment the DCR (Discharge Count Register). 2. Programmed Full Count (PFC) or initial battery capacity: The Discharge Count Register (DCR) is used to update the Last Measured Discharge (LMD) register only if a complete battery discharge from full to empty occurs without any partial battery charges. Therefore, the bq2011 adapts its capacity determination based on the actual conditions of discharge. The initial LMD and gas gauge rate values are programmed by using PFC. The PFC also provides the 100% reference for the absolute display mode. The bq2011 is configured for a given application by selecting a PFC value from Table 1. The correct PFC may be determined by multiplying the rated battery capacity in mAh by the sense resistor value: The battery's initial capacity is equal to the Programmed Full Count (PFC) shown in Table 1. Until LMD is updated, NAC counts up to but not beyond this threshold during subsequent charges. This approach allows the gas gauge to be charger-independent and compatible with any type of charge regime. Inputs PFC (mVh) Selecting a PFC slightly less than the rated capacity for absolute mode provides capacity above the full reference for much of the battery's life. Charge Current Discharge Current Self-Discharge Timer Rate and Temperature Compensation Rate and Temperature Compensation Temperature Compensation + Main Counters and Capacity Reference (LMD) Battery capacity (mAh) * sense resistor (Ω) = + - Nominal Available Charge (NAC) < Last Measured Discharged (LMD) Temperature Step, Other Data Temperature Translation Outputs Chip-Controlled Available Charge LED Display + Discharge Count Qualified Register (DCR) Transfer Serial Port FG201104.eps Figure 2. Operational Overview 5 bq2011 Select: Example: Selecting a PFC Value PFC = 34304 counts or 6.5mVh PFC = Z (float) MODE = not connected Given: Sense resistor = 0.005Ω Number of cells = 6 Capacity = 1300mAh, NiCd cells Current range = 1A to 80A Relative display mode Self-discharge = C 64 Voltage drop over sense resistor = 5mV to 400mV The initial full battery capacity is 6.5mVh (1300mAh) until the bq2011 “learns” a new capacity with a qualified discharge from full to EDV. Therefore: 1300mAh * 0.005Ω = 6.5mVh Table 1. bq2011 Programmed Full Count mVh Selections PFC Programmed Full Count (PFC) mVh H 27648 10.5 1 Z 34304 6.5 1 L 44800 8.5 1 H 42240 8.0 1 Z 31744 6.0 1 L 23808 4.5 1 Scale MODE Pin Display Mode Floating Relative Connected to LEDs Absolute 2640 5280 5280 5280 5280 5280 6 bq2011 3. Nominal Available Charge (NAC): Discharge Counting NAC counts up during charge to a maximum value of LMD and down during discharge and self discharge to 0. NAC is reset to 0 on initialization and on the first valid charge following discharge to EDV. To prevent overstatement of charge during periods of overcharge, NAC stops incrementing when NAC = LMD. All discharge counts where VSRO > 500µV cause the NAC register to decrement and the DCR to increment. Exceeding the fast discharge threshold (FDQ) if the rate is equivalent to VSRO > 2mV activates the display, if enabled. The display becomes inactive after VSRO falls below 2mV. Self-Discharge Estimation Note: NAC is set to the value in LMD when SEG5 is pulled low during a reset. 4. The bq2011 continuously decrements NAC and increments DCR for self-discharge based on time and temperature. The self-discharge count rate is programmed to be a nominal 1 80 * NAC rate per day. This is the rate for a battery whose temperature is between 20°–30°C. The NAC register cannot be decremented below 0. Discharge Count Register (DCR): The DCR counts up during discharge independent of NAC and could continue increasing after NAC has decremented to 0. Prior to NAC = 0 (empty battery), both discharge and self-discharge increment the DCR. After NAC = 0, only discharge increments the DCR. The DCR resets to 0 when NAC = LMD. The DCR does not roll over but stops counting when it reaches FFFFh. Count Compensations The bq2011 determines fast charge when the NAC updates at a rate of ≥2 counts/sec. Charge and discharge activity is compensated for temperature and charge/discharge rate before updating the NAC and/or DCR. Selfdischarge estimation is compensated for temperature before updating the NAC or DCR. The DCR value becomes the new LMD value on the first charge after a valid discharge to VEDV if: n n n No valid charge initiations (charges greater than 256 NAC counts; or 0.006 – 0.01C) occurred during the period between NAC = LMD and EDV detected. Charge Compensation Two charge efficiency factors are used for trickle charge and fast charge. Fast charge is defined as a rate of charge resulting in ≥ 2 NAC counts/sec (≥ 0.15C to 0.32C depending on PFC selections; see Table 2). The compensation defaults to the fast charge factor until the actual charge rate is determined. The self-discharge count is not more than 4096 counts (8% to 18% of PFC, specific percentage threshold determined by PFC). The temperature is ≥ 0°C when the EDV level is reached during discharge. Temperature adapts the charge rate compensation factors over three ranges between nominal, warm, and hot temperatures. The compensation factors are shown below. The valid discharge flag (VDQ) indicates whether the present discharge is valid for LMD update. Charge Counting Charge activity is detected based on a negative voltage on the VSR input. If charge activity is detected, the bq2011 increments NAC at a rate proportional to VSRO (VSR + VOS) and, if enabled, activates an LED display if VSRO < -1mV. Charge actions increment the NAC after compensation for charge rate and temperature. The bq2011 determines a valid charge activity sustained at a continuous rate equivalent to VSRO < -400µV. A valid charge equates to a sustained charge activity greater than 256 NAC counts. Once a valid charge is detected, charge counting continues until V SRO rises above -400µV. 7 Charge Temperature Trickle Charge Compensation Fast Charge Compensation <40°C 0.80 0.95 ≥ 40°C 0.75 0.90 bq2011 Discharge Compensation Table 2. Self-Discharge Compensation Corrections for the rate of discharge are made by adjusting an internal discharge compensation factor. The discharge factor is based on the dynamically measured VSR. The compensation factors during discharge are: NAC 10–20°C NAC 20–30°C NAC 30–40°C NAC 40–50°C NAC 75% 50–60°C NAC 75% 60–70°C NAC Approximate VSR Threshold Efficiency VSR < 50 mV 1.00 100% VSR1 > 50 mV 1.05 95% VSR2 > 100 mV 1.15 VSR4 > 253 mV 85% 1.25 1.25 Self-Discharge Compensation Typical Rate/Day < 10°C Discharge Compensation Factor VSR3 > 150 mV Temperature Range > 70°C Temperature compensation during discharge also takes place. At lower temperatures, the compensation factor increases by 0.05 for each 10°C temperature step below 10°C. NAC 320 160 80 40 20 10 5 2 .5 Error Summary Comp. factor = 1.00 + (0.05 * N) Capacity Inaccurate Where N = number of 10°C steps below 10°C and V SR < 50mV. The LMD is susceptible to error on initialization or if no updates occur. On initialization, the LMD value includes the error between the programmed full capacity and the actual capacity. This error is present until a valid discharge occurs and LMD is updated (see the DCR description on page 7). The other cause of LMD error is battery wear-out. As the battery ages, the measured capacity must be adjusted to account for changes in actual battery capacity. For example: T > 10°C: Nominal compensation, N = 0 0°C < T < 10°C: N = 1 (i.e., 1.00 becomes 1.05) -10°C < T < 0°C: N = 2 (i.e., 1.00 becomes 1.10) A Capacity Inaccurate counter (CPI) is maintained and incremented each time a valid charge occurs and is reset whenever LMD is updated from the DCR. The counter does not wrap around but stops counting at 255. The capacity inaccurate flag (CI) is set if LMD has not been updated following 64 valid charges. -20°C < T < -10°C: N = 3 (i.e., 1.00 becomes 1.15) -20°C < T < -30°C: N = 4 (i.e., 1.00 becomes 1.20) Self-Discharge Compensation The self-discharge compensation is programmed for a nominal rate of 1 80 * NAC per day. This is the rate for a battery within the 20–30°C temperature range (TMPGG = 6x). This rate varies across 8 ranges from <10°C to >70°C, doubling with each higher temperature step (10°C). See Table 2 Current-Sensing Error Table 3 illustrates the current-sensing error as a function of V SR . A digital filter eliminates charge and discharge counts to the NAC register when VSRO (VSR + VOS) is between -400µV and 500µV. Table 3. bq2011 Current-Sensing Errors Symbol INL INR Parameter Integrated non-linearity error Integrated nonrepeatability error Typical Maximum Units ±2 ±4 % ±1 ±2 % 8 Notes Add 0.1% per °C above or below 25°C and 1% per volt above or below 4.25V. Measurement repeatability given similar operating conditions. bq2011 logic-low state for a period, tSTRH,B. The next section is the actual data transmission, where the data should be valid by a period, tDSU, after the negative edge used to start communication. The data should be held for a period, tDV, to allow the host or bq2011 to sample the data bit. Communicating with the bq2011 The bq2011 includes a simple single-pin (DQ plus return) serial data interface. A host processor uses the interface to access various bq2011 registers. Battery characteristics may be easily monitored by adding a single contact to the battery pack. The open-drain DQ pin on the bq2011 should be pulled up by the host system, or may be left floating if the serial interface is not used. The final section is used to stop the transmission by returning the DQ pin to a logic-high state by at least a period, tSSU, after the negative edge used to start communication. The final logic-high state should be held until a period, tSV, to allow time to ensure that the bit transmission was stopped properly. The timings for data and break communication are given in the serial communication timing specification and illustration sections. The interface uses a command-based protocol, where the host processor sends a command byte to the bq2011. The command directs the bq2011 to either store the next eight bits of data received to a register specified by the command byte or output the eight bits of data specified by the command byte. Communication with the bq2011 is always performed with the least-significant bit being transmitted first. Figure 3 shows an example of a communication sequence to read the bq2011 NAC register. The communication protocol is asynchronous return-toone. Command and data bytes consist of a stream of eight bits that have a maximum transmission rate of 333 bits/sec. The least-significant bit of a command or data byte is transmitted first. The protocol is simple enough that it can be implemented by most host processors using either polled or interrupt processing. Data input from the bq2011 may be sampled using the pulse-width capture timers available on some microcontrollers. bq2011 Registers The bq2011 command and status registers are listed in Table 4 and described below. Command Register (CMDR) Communication is normally initiated by the host processor sending a BREAK command to the bq2011. A BREAK is detected when the DQ pin is driven to a logic-low state for a time, tB or greater. The DQ pin should then be returned to its normal ready-high logic state for a time, tBR. The bq2011 is now ready to receive a command from the host processor. The write-only CMDR register is accessed when eight valid command bits have been received by the bq2011. The CMDR register contains two fields: W/R bit n Command address The W/R bit of the command register is used to select whether the received command is for a read or a write function. The return-to-one data bit frame consists of three distinct sections. The first section is used to start the transmission by either the host or the bq2011 taking the DQ pin to a Written by Host to bq2011 CMDR = 03h LSB n Received by Host to bq2011 NAC = 65h MSB Break 1 1 0 0 0 0 0 0 LSB MSB 1 0 1 0 011 0 DQ TD201101.eps Figure 3. Typical Communication with the bq2011 9 bq2011 Table 4. bq2011 Command and Status Registers Symbol Register Name Control Field Loc. (hex) Read/ Write 7(MSB) 6 5 4 3 2 1 0(LSB) CMDR Command register 00h Write W/R AD6 AD5 AD4 AD3 AD2 AD1 AD0 FLGS1 Primary status flags register 01h Read CHGS BRP MCV CI VDQ n/u EDV n/u Temperature TMPGG and gas gauge 02h register Read TMP3 TMP2 TMP1 TMP0 GG3 GG2 GG1 GG0 NACH Nominal available charge high byte register 03h R/W NACH7 NACH6 NACH5 NACH4 NACH3 NACH2 NACH1 NACH0 NACL Nominal available charge low byte register 17h Read NACL7 NACL6 BATID Battery identification register 04h R/W BATID7 BATID6 BATID5 BATID4 BATID3 BATID2 BATID1 BATID0 LMD Last measured discharge register 05h R/W LMD7 LMD6 LMD5 LMD4 LMD3 LMD2 LMD1 LMD0 FLGS2 Secondary status flags register 06h Read CR DR2 DR1 DR0 n/u n/u n/u OVLD CPI Capacity inaccurate count register 09h Read CPI7 CPI6 CPI5 CPI4 CPI3 CPI2 CPI1 CPI0 OCTL Output control register 0ah Write 1 OC5 OC4 OC3 OC2 OC1 n/u OCE FULCNT Full count register 0bh Read FUL7 FUL6 FUL5 FUL4 FUL3 FUL2 FUL1 FUL0 RST Reset register 39h Write RST 0 0 0 0 0 0 0 Note: n/u = not used 10 NACL5 NACL4 NACL3 NACL2 NACL1 NACL0 bq2011 The BRP values are: The W/R values are: CMDR Bits FLGS1 Bits 7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 W/R - - - - - - - - BRP - - - - - - Where BRP is: Where W/R is: 0 The bq2011 outputs the requested register contents specified by the address portion of CMDR. 1 The following eight bits should be written to the register specified by the address portion of CMDR. 0 bq2011 is charged until NAC = LMD or discharged until the EDV flag is asserted 1 SB rising from below 0.1V, or a serial port initiated reset has occurred The maximum cell voltage flag (MCV) is asserted whenever the potential on the SB pin (relative to VSS) is above 2.0V. The MCV flag is asserted until the condition causing MCV is removed. The lower seven-bit field of CMDR contains the address portion of the register to be accessed. Attempts to write to invalid addresses are ignored. The MCV values are: CMDR Bits 7 - 6 5 AD6 AD5 FLGS1 Bits 4 3 2 1 0 AD4 AD3 AD2 AD1 AD0 (LSB) 7 6 5 4 3 2 1 0 - - MCV - - - - - Where MCV is: Primary Status Flags Register (FLGS1) The read-only FLGS1 register (address=01h) contains the primary bq2011 flags. 0 VSB < 2.0V 1 VSB > 2.0V The capacity inaccurate flag (CI) is used to warn the user that the battery has been charged a substantial number of times since LMD has been updated. The CI flag is asserted on the 64th charge after the last LMD update or when the bq2011 is reset. The flag is cleared after an LMD update. The charge status flag (CHGS) is asserted when a valid charge rate is detected. Charge rate is deemed valid when VSRO < -400µV. A VSRO of greater than400µV or discharge activity clears CHGS. The CHGS values are: The CI values are: FLGS1 Bits 7 6 5 4 3 2 1 0 CHGS - - - - - - - FLGS1 Bits Where CHGS is: 0 Either discharge activity detected or VSRO > -400µV 1 VSRO < -400µV 7 6 5 4 3 2 1 0 - - - CI - - - - Where CI is: The battery replaced flag (BRP) is asserted whenever the potential on the SB pin (relative to VSS), VSB, rises above 0.1V and determines the internal registers have been corrupted. The BRP flag is also set when the bq2011 is reset (see the RST register description). BRP is latched until either the bq2011 is charged until NAC = LMD or discharged until EDV is reached. BRP = 1 signifies that the device has been reset. 11 0 When LMD is updated with a valid full discharge or the bq2011 is reset 1 After the 64th valid charge action with no LMD updates bq2011 The valid discharge flag (VDQ) is asserted when the bq2011 is discharged from NAC=LMD. The flag remains set until either LMD is updated or one of three actions that can clear VDQ occurs: n TMPGG Temperature Bits 7 The self-discharge count register (SDCR) has exceeded the maximum acceptable value (4096 counts) for an LMD update. n A valid charge action equal to 256 NAC counts with VSRO < -400µV. n The EDV flag was set at a temperature below 0°C 5 4 3 2 1 0 - - - - VDQ - - - SDCR ≥ 4096, subsequent valid charge action detected, or EDV is asserted with the temperature less than 0°C 1 On first discharge after NAC = LMD 4 3 2 1 0 - - - - - - EDV - - 0 Temperature 0 0 0 0 T < -30°C 0 0 0 1 -30°C < T < -20°C 0 0 1 0 -20°C < T < -10°C 0 0 1 1 -10°C < T < 0°C 0 1 0 0 0°C < T < 10°C 0 1 0 1 10°C < T < 20°C 0 1 1 0 20°C < T < 30°C 0 1 1 1 30°C < T < 40°C 1 0 0 0 40°C < T < 50°C 1 0 0 1 50°C < T < 60°C 1 0 1 0 60°C < T < 70°C 1 0 1 1 70°C < T < 80°C 1 1 0 0 T > 80°C FLGS1 Bits 5 1 - TMP0 The EDV values are: 6 2 - TMP1 The end-of-discharge warning flag (EDV) warns the user that the battery is empty. SEG1 blinks at a 4Hz rate. EDV detection is disabled if VSR > VSR1. The EDV flag is latched until a valid charge has been detected. 7 3 TMP2 Where VDQ is: 0 4 TMP3 FLGS1 Bits 6 5 TMP1 TMP0 The bq2011 contains an internal temperature sensor. The temperature is used to set charge and discharge efficiency factors as well as to adjust the self-discharge coefficient. The temperature register contents may be translated as shown below. The VDQ values are: 7 6 TMP3 TMP2 Where EDV is: 0 Valid charge action detected and VSB ≥ 0.90V 1 VSB < 0.90V providing that VSR < VSR1 The bq2011 calculates the available charge as a function of NAC, temperature, and a full reference, either LMD or PFC. The results of the calculation are available via the display port or the gas gauge field of the TMPGG register. The register is used to give available capacity in 116 increments from 0 to 1516. Temperature and Gas Gauge Register (TMPGG) TMPGG Gas Gauge Bits The read-only TMPGG register (address=02h) contains two data fields. The first field contains the battery temperature. The second field contains the available charge from the battery. 12 7 6 5 4 3 2 1 0 - - - - GG3 GG2 GG1 GG0 bq2011 The CR values are: The gas gauge display and the gas gauge portion of the TMPGG register are adjusted for cold temperature dependencies. A piece-wise correction is performed as follows: Temperature FLGS2 Bits 7 6 5 4 3 2 1 0 CR - - - - - - - Available Capacity Calculation > 0°C NAC / “Full Reference” -20°C < T < 0°C 0.75 * NAC / “Full Reference” 0 When charge rate falls below 2 counts/sec < -20°C 0.5 * NAC / “Full Reference” 1 When charge rate is above 2 counts/sec Where CR is: The fast charge regime efficiency factors are used when CR = 1. When CR = 0, the trickle charge efficiency factors are used. The time to change CR varies due to the user-selectable count rates. The adjustment between > 0°C and -20°C < T < 0°C has a 4°C hysteresis. Nominal Available Charge Register (NAC) The discharge rate flags, DR2–0, are bits 6–4. The read/write NACH register (address=03h) and the read-only NACL register (address=17h) are the main gas gauging registers for the bq2011. The NAC registers are incremented during charge actions and decremented during discharge and self-discharge actions. The correction factors for charge/discharge efficiency are applied automatically to NAC. FLGS2 Bits 7 6 5 4 3 2 1 - DR2 DR1 DR0 - - - 0 They are used to determine the present discharge regime as follows: On reset, the NACH and NACL registers are cleared to zero. NACL stops counting when NACH reaches zero. When the bq2011 detects a valid charge, NACL resets to zero; writing to the NAC register affects the available charge counts and, therefore, affects the bq2011 gas gauge operation. DR2 DR1 DR0 VSR (V) 0 0 0 VSR < 50mV 0 0 1 50mV < VSR < 100mV (overload, OVLD=1) Battery Identification Register (BATID) 0 1 0 100mV < VSR < 150mV The read/write BATID register (address=04h) is available for use by the system to determine the type of battery pack. The BATID contents are retained as long as VCC is greater than 2V. The contents of BATID have no effect on the operation of the bq2011. There is no default setting for this register. 0 1 1 150mV < VSR < 253mV 1 0 0 VSRD > 253mV The overload flag (OVLD) is asserted when a discharge overload is detected, VSRD > 50mV. OVLD remains asserted as long as the condition persists and is cleared when VSRD < 50mV. Last Measured Discharge Register (LMD) LMD is a read/write register (address=05h) that the bq2011 uses as a measured full reference. The bq2011 adjusts LMD based on the measured discharge capacity of the battery from full to empty. In this way the bq2011 updates the capacity of the battery. LMD is set to PFC during a bq2011 reset. FLGS2 Bits 7 6 5 4 3 2 1 0 - - - - - - - OVLD DR2–0 and OVLD are set based on the measurement of the voltage at the SR pin relative to VSS. The rate at which this measurement is made varies with device activity. Secondary Status Flags Register (FLGS2) The read-only FLGS2 register (address=06h) contains the secondary bq2011 flags. The charge rate flag (CR) is used to denote the fast charge regime. Fast charge is assumed whenever a charge action is initiated. The CR flag remains asserted if the charge rate does not fall below 2 counts/sec. 13 bq2011 Full Count Register (FULCNT) Resetting the bq2011 sets the following: The read-only FULCNT register (address=0bh) provides the system with a diagnostic of the number of times the battery has been fully charged (NAC = LMD). The number of full occurrences can be determined by multiplying the value in the FULCNT register by 16. Any discharge action other than self-discharge allows detection of another full occurrence during the next valid charge action. n LMD = PFC n CPI, VDQ, NAC, and OCE = 0 or NAC = LMD when SEG5 = L n CI and BRP = 1 Display The bq2011 can directly display capacity information using low-power LEDs. If LEDs are used, the segment pins should be tied to VCC, the battery, or the MODE pin for programming the bq2011. Capacity Inaccurate Count Register (CPI) The read-only CPI register (address=09h) is used to indicate the number of times a battery has been charged without an LMD update. Because the capacity of a rechargeable battery varies with age and operating conditions, the bq2011 adapts to the changing capacity over time. A complete discharge from full (NAC=LMD) to empty (EDV=1) is required to perform an LMD update assuming there have been no intervening valid charges, the temperature is greater than or equal to 0°C, and the self-discharge counter is less than 4096 counts. The bq2011 displays the battery charge state in either absolute or relative mode. In relative mode, the battery charge is represented as a percentage of the LMD. Each LED segment represents 20% of the LMD. In absolute mode, each segment represents a fixed amount of charge, based on the initial PFC. In absolute mode, each segment represents 20% of the PFC. As the battery wears out over time, it is possible for the LMD to be below the initial PFC. In this case, all of the LEDs may not turn on, representing the reduction in the actual battery capacity. The CPI register is incremented every time a valid charge is detected. The register increments to 255 without rolling over. When the contents of CPI are incremented to 64, the capacity inaccurate flag, CI, is asserted in the FLGS1 register. CPI is reset whenever an update of the LMD register is performed, and the CI flag is also cleared. The capacity display is also adjusted for the present battery temperature. The temperature adjustment reflects the available capacity at a given temperature but does not affect the NAC register. The temperature adjustments are detailed in the TMPGG register description. Output Control Register (OCTL) When DISP is tied to VCC, the SEG1–5 outputs are inactive. When DISP is left floating, the display becomes active during charge if the NAC registers are counting at a rate equivalent to VSRO < -1mV or fast discharge if the NAC registers are counting at a rate equivalent to VSRO > 2mV. When pulled low, the segment output becomes active for 4 seconds, ± 0.5 seconds. The write-only OCTL register (address=0ah) provides the system with a means to check the display connections for the bq2011. The segment drivers may be overwritten by data from OCTL when the least-significant bit of OCTL, OCE, is set. The data in bits OC5–1 of the OCTL register (see Table 4 on page 10 for details) is output onto the segment pins, SEG 5–1 , respectively if OCE=1. Whenever OCE is written to 1, the MSB of OCTL should be set to a 1. The OCE register location must be cleared to return the bq2011 to normal operation. OCE may be cleared by either writing the bit to a logic zero via the serial port or by resetting the bq2011 as explained below. Note: Whenever the OCTL register is written, the MSB of OCTL should be written to a logic one. The segment outputs are modulated as two banks, with segments 1, 3, and 5 alternating with segments 2 and 4. The segment outputs are modulated at approximately 320Hz, with each bank active for 30% of the period. SEG1 blinks at a 4Hz rate whenever VSB has been detected to be below VEDV to indicate a low-battery condition or NAC is less than 10% of the LMD or PFC, depending on the display mode. Reset Register (RST) The reset register (address=39h) provides the means to perform a software-controlled reset of the device. A full device reset may be accomplished by first writing LMD (address = 05h) to 00h and then writing the RST register contents from 00h to 80h. Setting any bit other than the most-significant bit of the RST register is not allowed, and results in improper operation of the bq2011. Microregulator The bq2011 can operate directly from 4 cells. To facilitate the power supply requirements of the bq2011, an REF output is provided to regulate an external low-threshold nFET. A micropower source for the bq2011 can be inexpensively built using the FET and an external resistor. 14 bq2011 Absolute Maximum Ratings Symbol Parameter Minimum Maximum Unit VCC Relative to VSS -0.3 +7.0 V All other pins Relative to VSS -0.3 +7.0 V VSR Relative to VSS TOPR Operating temperature Note: Notes -0.3 +7.0 V Minimum 100Ω series resistor should be used to protect SR in case of a shorted battery (see the bq2011 application note for details). 0 +70 °C Commercial Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation should be limited to the Recommended DC Operating Conditions detailed in this data sheet. Exposure to conditions beyond the operational limits for extended periods of time may affect device reliability. DC Voltage Thresholds (TA = TOPR; V = 3.0 to 6.5V) Symbol Parameter Minimum Typical Maximum Unit 0.87 0.90 0.93 V Notes VEDV End-of-discharge warning VSR1 Discharge compensation threshold 20 50 75 mV SR (see note) VSR2 Discharge compensation threshold 70 100 125 mV SR (see note) VSR3 Discharge compensation threshold 120 150 175 mV SR (see note) VSR4 Discharge compensation threshold 220 253 275 mV SR (see note) VSRQ Valid charge - - -400 µV VSR + VOS VSRD Valid discharge 500 - - µV VSR + VOS VMCV Maximum single-cell voltage 1.95 2.0 2.05 V SB VBR Battery removed/replaced - 0.1 0.25 V SB Note: SB For proper operation of the threshold detection circuit, VCC must be at least 1.5V greater than the voltage being measured. 15 bq2011 DC Electrical Characteristics (TA = TOPR) Symbol Parameter VCC Supply voltage VOS Offset referred to VSR VREF RREF Minimum Typical Maximum Unit Notes 3.0 4.25 6.5 V VCC excursion from < 2.0V to ≥ 3.0V initializes the unit. - ±50 ±150 µV DISP = VCC Reference at 25°C 5.7 6.0 6.3 V IREF = 5µA Reference at -40°C to +85°C 4.5 - 7.5 V IREF = 5µA Reference input impedance 2.0 5.0 - MΩ VREF = 3V - 90 135 µA VCC = 3.0V, DQ = 0 180 µA VCC = 4.25V, DQ = 0 VCC = 6.5V, DQ = 0 ICC Normal operation - 120 - 170 250 µA VSB Battery input 0 - VCC V RSBmax SB input impedance 10 - - MΩ 0 < VSB < VCC IDISP DISP input leakage - - 5 µA VDISP = VSS IMODE MODE input leakage -0.2 - 0.2 µA DISP = VCC IRBI RBI data-retention current - - 100 nA VRBI > VCC < 3V RDQ Internal pulldown 500 - - KΩ VSR Sense resistor input -0.3 - 2.0 V RSR SR input impedance 10 - - MΩ VIHPFC PFC logic input high VCC - 0.2 - - V VILPFC PFC logic input low VIZPFC PFC logic input Z IIHPFC IILPFC VSR > VSS = discharge; VSR < VSS = charge -200mV < VSR < VCC PFC - - VSS + 0.2 V PFC float - float V PFC PFC input high current - 1.2 - µA VPFC = VCC/2 PFC input low current - 1.2 - µA VPFC = VCC/2 VOLSL SEGX output low, low VCC - 0.1 - V VCC = 3V, IOLS ≤ 1.75mA SEG1–SEG5 VOLSH SEGX output low, high VCC - 0.4 - V VCC = 6.5V, IOLS ≤ 11.0mA SEG1–SEG5 VOHML MODE output high, low VCC VCC - 0.3 - - V VCC = 3V, IOHMODE = -5.25mA VOHMH MODE output high, high VCC VCC - 0.6 - - V VCC = 6.5V, IOHMODE = -33.0mA IOHMODE MODE source current -33 - - mA At VOHMODE = VCC - 0.6V IOLS SEGX sink current 11.0 - - mA At VOLSH = 0.4V, VCC = 6.5V IOL Open-drain sink current 5.0 - - mA At VOL = VSS + 0.3V, DQ VOL Open-drain output low - - 0.5 V IOL ≤ 5mA, DQ VIHDQ DQ input high 2.5 - - V DQ VILDQ DQ input low - - 0.8 V DQ RFLOAT Float state external impedance - 5 - MΩ PFC Note: All voltages relative to VSS. 16 bq2011 Serial Communication Timing Specification (TA = TOPR) Symbol Parameter Minimum Typical Maximum Unit tCYCH Cycle time, host to bq2011 3 - - ms tCYCB Cycle time, bq2011 to host 3 - 6 ms tSTRH Start hold, host to bq2011 5 - - ns tSTRB Start hold, bq2011 to host 500 - - µs tDSU Data setup - - 750 µs tDH Data hold 750 - - µs tDV Data valid 1.50 - - ms tSSU Stop setup - - 2.25 ms tSH Stop hold 700 - - µs tSV Stop valid 2.95 - - ms tB Break 3 - - ms tBR Break recovery 1 - - ms Note: Notes See note The open-drain DQ pin should be pulled to at least VCC by the host system for proper DQ operation. DQ may be left floating if the serial interface is not used. Serial Communication Timing Illustration DQ (R/W "1") DQ (R/W "0") tSTRH tSTRB tDH tDSU tDV tSH tSSU DQ (BREAK) tSV tCYCH, tCYCB, tB 17 tBR bq2011 16-Pin SOIC Narrow (SN) 16-Pin SN (SOIC Narrow) D e Dimension Minimum A 0.060 A1 0.004 B 0.013 C 0.007 D 0.385 E 0.150 e 0.045 H 0.225 L 0.015 All dimensions are in inches. B E H A C A1 .004 L 18 Maximum 0.070 0.010 0.020 0.010 0.400 0.160 0.055 0.245 0.035 bq2011 Data Sheet Revision History Change No. Page No. 3 7 Description Nature of Change Self-discharge count rate Was: Is: 1 1 64 80 * NAC rate per day * NAC rate per day 3 7 Compensation factor 30–40°C Was: Is: 0.90 0.95 3 7 Compensation factor >40°C Was: Is: 0.80 0.90 4 7 Charge compensation Changed compensation factor variation with temperature 4 8 Self-discharge compensation Changed self-discharge compensation rate variation with temperature Notes: Changes 1 and 2 = See the 1995 Data Book. Change 3 = Jan. 1996 D changes from July 1994 C. Change 4 = Feb. 1996 E changes from Jan. 1996 D. Ordering Information bq2011 Temperature Range: blank = Commercial (0 to +70°C) Package Option: SN = 16-pin narrow SOIC Device: bq2011 Gas Gauge IC 19 PACKAGE OPTION ADDENDUM www.ti.com 26-Sep-2015 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Op Temp (°C) Device Marking (4/5) BQ2011SN-D118 NRND SOIC D 16 40 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR 0 to 70 2011 D118 BQ2011SN-D118TR NRND SOIC D 16 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR 0 to 70 2011 D118 BQ2011SN-D118TRG4 NRND SOIC D 16 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR 0 to 70 2011 D118 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. 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Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 TAPE AND REEL INFORMATION *All dimensions are nominal Device BQ2011SN-D118TR Package Package Pins Type Drawing SOIC D 16 SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) 2500 330.0 16.4 Pack Materials-Page 1 6.5 B0 (mm) K0 (mm) P1 (mm) 10.3 2.1 8.0 W Pin1 (mm) Quadrant 16.0 Q1 PACKAGE MATERIALS INFORMATION www.ti.com 14-Jul-2012 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) BQ2011SN-D118TR SOIC D 16 2500 367.0 367.0 38.0 Pack Materials-Page 2 IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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