Revised February 2000 DM74ALS37A Quadruple 2-Input NAND Buffer General Description Features This device contains four independent gates, each of which performs the logic NAND function. ■ Switching specifications at 50 pF ■ Switching specifications guaranteed over full temperature and VCC range ■ Advanced oxide-isolated, ion-implanted Schottky TTL process ■ Functionally and pin for pin compatible with LS TTL counterpart ■ Improved AC performance over LS37 ■ Improved line receiving characteristics Ordering Code: Order Number Package Number Package Description DM74ALS37AM M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow DM74ALS37AN N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram Function Table Y = AB Inputs Output A B Y L L H L H H H L H H H L H = HIGH Logic Level L = LOW Logic Level © 2000 Fairchild Semiconductor Corporation DS006192 www.fairchildsemi.com DM74ALS37A Quadruple 2-Input NAND Buffer September 1986 DM74ALS37A Absolute Maximum Ratings(Note 1) Supply Voltage 7V Input Voltage 7V 0°C to +70°C Operating Free Air Temperature Range Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. −65°C to +150°C Storage Temperature Range Typical θJA N Package 83.0°C/W M Package 114.0°C/W Recommended Operating Conditions Symbol Parameter Min Nom Max Units 4.5 5 5.5 V VCC Supply Voltage VIH HIGH Level Input Voltage VIL LOW Level Input Voltage 0.8 V IOH HIGH Level Output Current −2.6 mA IOL LOW Level Output Current 24 mA TA Free Air Operating Temperature 70 °C 2 V 0 Electrical Characteristics over recommended operating free air temperature range. All typical values are measured at VCC = 5V, TA = 25°C. Symbol Parameter Conditions VIK Input Clamp Voltage VCC = 4.5V, II = −18 mA VOH HIGH Level VCC = 4.5V Output Voltage VIL = Max Min IOH = −2.6 mA IOH = −400 µA VOL II 2.4 Typ Max Units −1.5 V 3.3 V VCC − 2 V LOW Level VCC = 4.5V IOL = 12 mA 0.25 0.4 V Output Voltage VIH = 2V IOL = 24 mA 0.35 0.5 V 0.1 mA Input Current @ Maximum Input Voltage VCC = 5.5V, VIH = 7V IIH HIGH Level Input Current VCC = 5.5V, VIH = 2.7V 20 µA IIL LOW Level Input Current VCC = 5.5V, VIL = 0.4V −0.1 mA IO Output Drive Current VCC = 5.5V −112 mA ICCH Supply Current with Outputs HIGH ICCL Supply Current with Outputs LOW VO = 2.25V −30 VCC = 5.5V, VI = 0V 0.86 1.6 mA VCC = 5.5V, VI = 4.5V 4.0 7.8 mA Min Max Units 2 8 ns 2 7 ns Switching Characteristics over recommended operating free air temperature range Symbol tPLH tPHL Parameter Conditions Propagation Delay Time VCC = 4.5V to 5.5V LOW-to-HIGH Level Output RL = 500Ω Propagation Delay Time CL = 50 pF HIGH-to-LOW Level Output www.fairchildsemi.com 2 DM74ALS37A Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M14A 3 www.fairchildsemi.com DM74ALS37A Quadruple 2-Input NAND Buffer Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 4