BZX55 SERIES DO-35 Glass-Encapsulate Diodes Zener Diodes Features ●Pd ●Vz 0.5W 2.4V-75V DO-35 Applications ● Stabilizing Voltage Symbol Unit Conditions Max Pd mW L=4mm,TL=25℃ 500 Zener current IZ mA Ptot /VZ Maximum junction temperature Tj ℃ 175 Tstg ℃ -65 to +175 Item Power dissipation Storage temperature range See Table Electrical Characteristics(Ta=25℃ Unless otherwise specified) Symbol Unit Conditions Max Thermal resistance RθJA ℃/W junction to ambient air, L=4mm,TL=constant 300 Forward voltage VF V IF=200mA 1.5 Item High Diode Semiconductor 1 Electrical Characteristics (TA=25℃ unless otherwise noted) BZX55C.. Zener voltage Dynamic resistance range Part Number RZJT at IZT VZ at IZT RZJK at IZK f = 1 KHZ f = 1 KHZ V Test current Temperature Coefficient Test current IZT TKVZ IZK mA Ω Reverse leakage current IR at Tamb=25℃ mA %/K Min. Max. BZX55C2V4 2.28 2.56 < 85 < 600 BZX55C2V7 2.5 2.9 < 85 < 600 BZX55C3V0 2.8 3.2 < 85 BZX55C3V3 3.1 3.5 BZX55C3V6 3.4 3.8 BZX55C3V9 3.7 BZX55C4V3 4 BZX55C4V7 4.4 5 < 60 < 600 5 - 0.05 0.02 BZX55C5V1 4.8 5.4 < 35 < 550 5 - 0.02 0.02 BZX55C5V6 5.2 6 < 25 < 450 5 - 0.05 0.05 BZX55C6V2 5.8 6.6 < 10 < 200 5 0.03 BZX55C6V8 6.4 7.2 <8 < 150 5 BZX55C7V5 7 7.9 <7 < 50 5 BZX55C8V2 7.7 8.7 <7 < 50 BZX55C9V1 8.5 9.6 < 10 < 50 BZX55C10 9.4 10.6 < 15 BZX55C11 10.4 11.6 < 20 IR at Tamb=150℃ μA at VR V Min. Max. 5 - 0.09 - 0.06 1 < 50 < 100 1 5 - 0.09 - 0.06 1 < 10 < 50 1 < 600 5 - 0.08 - 0.05 1 <4 < 40 1 < 85 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 < 85 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 4.1 < 85 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 4.6 < 75 < 600 5 - 0.06 - 0.03 1 <1 < 20 1 1 < 0.5 < 10 1 1 < 0.1 <2 1 1 < 0.1 <2 1 0.06 1 < 0.1 <2 2 0.03 0.07 1 < 0.1 <2 3 0.03 0.07 1 < 0.1 <2 5 5 0.03 0.08 1 < 0.1 <2 6.2 5 0.03 0.09 1 < 0.1 <2 6.8 < 70 5 0.03 0.1 1 < 0.1 <2 7.5 < 70 5 0.03 0.11 1 < 0.1 <2 8.2 BZX55C12 11.4 12.7 < 20 < 90 5 0.03 0.11 1 < 0.1 <2 9.1 BZX55C13 12.4 14.1 < 26 < 110 5 0.03 0.11 1 < 0.1 <2 10 BZX55C15 13.8 15.6 < 30 < 110 5 0.03 0.11 1 < 0.1 <2 11 BZX55C16 15.3 17.1 < 40 < 170 5 0.03 0.11 1 < 0.1 <2 12 BZX55C18 16.8 19.1 < 50 < 170 5 0.03 0.11 1 < 0.1 <2 13 BZX55C20 18.8 21.2 < 55 < 220 5 0.03 0.11 1 < 0.1 <2 15 BZX55C22 20.8 23.3 < 55 < 220 5 0.04 0.12 1 < 0.1 <2 16 BZX55C24 22.8 25.6 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 18 BZX55C27 25.1 28.9 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 20 BZX55C30 28 32 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 22 BZX55C33 31 35 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 24 BZX55C36 34 38 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 27 BZX55C39 37 41 < 90 < 500 2.5 0.04 0.12 0.5 < 0.1 <5 30 BZX55C43 40 46 < 90 < 600 2.5 0.04 0.12 0.5 < 0.1 <5 33 BZX55C47 44 50 < 110 < 700 2.5 0.04 0.12 0.5 < 0.1 <5 36 BZX55C51 48 54 < 125 < 700 2.5 0.04 0.12 0.5 < 0.1 < 10 39 BZX55C56 52 60 < 135 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 43 BZX55C62 58 66 < 150 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 47 BZX55C68 64 72 < 200 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 51 BZX55C75 70 79 < 250 < 1500 2.5 0.04 0.12 0.5 < 0.1 < 10 56 High Diode Semiconductor 2 Electrical Characteristics (TA=25℃ unless otherwise noted) BZX55B.. Zener voltage Dynamic resistance Test current Temperature Coefficient Test current IZT TKVZ IZK range RZJT at IZT VZ at IZT Part Number RZJK at IZK f = 1 KHZ f = 1 KHZ V mA Ω Min. Max. BZX55B2V7 2.64 2.76 < 85 < 600 BZX55B3V0 2.94 3.06 < 90 < 600 BZX55B3V3 3.24 3.36 < 90 BZX55B3V6 3.52 3.68 < 90 BZX55B3V9 3.82 3.98 BZX55B4V3 4.22 BZX55B4V7 BZX55B5V1 Reverse leakage current IR at Tamb=25℃ mA %/K IR at Tamb=150℃ μA at VR V Min. Max. 5 - 0.09 - 0.06 1 < 10 < 50 1 5 - 0.08 - 0.05 1 <4 < 40 1 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 < 90 < 600 5 - 0.08 - 0.05 1 <2 < 40 1 4.38 < 90 < 600 5 - 0.06 - 0.03 1 <1 < 20 1 4.6 4.8 < 80 < 600 5 - 0.05 0.02 1 < 0.5 < 10 1 5 5.2 < 60 < 550 5 - 0.02 0.02 1 < 0.1 <2 1 BZX55B5V6 5.48 5.72 < 40 < 450 5 - 0.05 0.05 1 < 0.1 <2 1 BZX55B6V2 6.08 6.32 < 10 < 200 5 0.03 0.06 1 < 0.1 <2 2 BZX55B6V8 6.66 6.94 <8 < 150 5 0.03 0.07 1 < 0.1 <2 3 BZX55B7V5 7.35 7.65 <7 < 50 5 0.03 0.07 1 < 0.1 <2 5 BZX55B8V2 8.04 8.36 <7 < 50 5 0.03 0.08 1 < 0.1 <2 6.2 BZX55B9V1 8.92 9.28 < 10 < 50 5 0.03 0.09 1 < 0.1 <2 6.8 BZX55B10 9.8 10.2 < 15 < 70 5 0.03 0.1 1 < 0.1 <2 7.5 BZX55B11 10.78 11.22 < 20 < 70 5 0.03 0.11 1 < 0.1 <2 8.2 BZX55B12 11.76 12.24 < 20 < 90 5 0.03 0.11 1 < 0.1 <2 9.1 BZX55B13 12.74 13.26 < 26 < 110 5 0.03 0.11 1 < 0.1 <2 10 BZX55B15 14.7 15.3 < 30 < 110 5 0.03 0.11 1 < 0.1 <2 11 BZX55B16 15.7 16.3 < 40 < 170 5 0.03 0.11 1 < 0.1 <2 12 BZX55B18 17.64 18.36 < 50 < 170 5 0.03 0.11 1 < 0.1 <2 13 BZX55B20 19.6 20.4 < 55 < 220 5 0.03 0.11 1 < 0.1 <2 15 BZX55B22 21.55 22.45 < 55 < 220 5 0.04 0.12 1 < 0.1 <2 16 BZX55B24 23.5 24.5 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 18 BZX55B27 26.4 27.6 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 20 BZX55B30 29.4 30.6 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 22 BZX55B33 32.4 33.6 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 24 BZX55B36 35.3 36.7 < 80 < 220 5 0.04 0.12 1 < 0.1 <2 27 BZX55B39 38.2 39.8 < 90 < 500 2.5 0.04 0.12 0.5 < 0.1 <5 30 BZX55B43 42.1 43.9 < 90 < 600 2.5 0.04 0.12 0.5 < 0.1 <5 33 BZX55B47 46.1 47.9 < 110 < 700 2.5 0.04 0.12 0.5 < 0.1 <5 36 BZX55B51 50 52 < 125 < 700 2.5 0.04 0.12 0.5 < 0.1 < 10 39 BZX55B56 54.9 57.1 < 135 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 43 BZX55B62 60.8 63.2 < 150 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 47 BZX55B68 66.6 69.4 < 200 < 1000 2.5 0.04 0.12 0.5 < 0.1 < 10 51 BZX55B75 73 76.5 < 250 < 1500 2.5 0.04 0.12 0.5 < 0.1 < 10 56 High Diode Semiconductor 3 Typical Characteristics FIG2: Thermal Resistance vs. Lead Length RthA(K/W) FIG1: Total Power Dissipation vs. Ambient Temperature Ptot(W) 600 500 400 500 400 TL=constant 300 300 200 200 100 0 100 0 40 80 200 160 120 0 0 Tamb (℃) 10 5 20 15 L ( mm) FIG4: Typical Ch ang e of W orking Voltage vs. Junctio n Tem p erature Vztn Vz(mV) FIG3:Typical Change of Working Voltage under Operating Conditions at Tamb=25 ℃ 1000 Tj=25℃ 1.3 V ztn=Vzt/V z(25 ℃ ) 1.2 TKvz= 10 ×1 0-4/K 100 -4× 10-4/K 8×10 -4/K 1.1 6×10 -4/K 4 ×10-4/K 2 ×10-4/K 1.0 Iz=5mA 10 0 -4× 10-4/K -4× 10-4/K 0.9 1 0 5 10 15 20 0.8 25 -60 60 0 120 180 Vz(V) Tj( ℃ ) F IG 6: F orw ard C urrent vs. F orw ard V oltage IF(mA) TKvz(10-4/K) F IG 5: T em perature C oefficient of V z vs. Z -volta ge 15 240 100 10 10 T j=25 ℃ 1.0 5 0.1 0 0.01 -5 0 10 20 30 40 50 V z(V ) 0.001 0 0.2 0.4 High Diode Semiconductor 0.6 0.8 1.0 V F (V ) 4 .022(0.55) MAX .079(2.00) MAX 1.02(26.0) MIN .165(4.20) MAX 1.02(26.0) MIN DO-35 Unit: in inches (millimeters) JSHD JSHD High Diode Semiconductor 5 Ammo Box Packaging Specifications For Axial Lead Rectifiers High Diode Semiconductor 6