LTC2208-14 14-Bit, 130Msps ADC FEATURES DESCRIPTION n The LTC®2208-14 is a 130Msps, sampling 14-bit A/D converter designed for digitizing high frequency, wide dynamic range signals with input frequencies up to 700MHz. The input range of the ADC can be optimized with the PGA front end. n n n n n n n n n n n n n Sample Rate: 130Msps 77.1dBFS Noise Floor 98dB SFDR SFDR >81dB at 250MHz (1.5VP-P Input Range) PGA Front End (2.25VP-P or 1.5VP-P Input Range) 700MHz Full Power Bandwidth S/H Optional Internal Dither Optional Data Output Randomizer LVDS or CMOS Outputs Single 3.3V Supply Power Dissipation: 1.32W Clock Duty Cycle Stabilizer Pin Compatible 16-Bit Version 130Msps: LTC2208 (16-Bit) 64-Pin (9mm × 9mm) QFN Package The LTC2208-14 is perfect for demanding communications applications, with AC performance that includes 77.1dBFS Noise Floor and 98dB spurious free dynamic range (SFDR). Ultralow jitter of 70fsRMS allows undersampling of high input frequencies with excellent noise performance. Maximum DC specs include ±1.5LSB INL, ±0.5LSB DNL (no missing codes). The digital output can be either differential LVDS or single-ended CMOS. There are two format options for the CMOS outputs: a single bus running at the full data rate or demultiplexed buses running at half data rate. A separate output power supply allows the CMOS output swing to range from 0.5V to 3.6V. APPLICATIONS n n n n n n Telecommunications Receivers Cellular Base Stations Spectrum Analysis Imaging Systems ATE The ENC+ and ENC– inputs may be driven differentially or single-ended with a sine wave, PECL, LVDS, TTL or CMOS inputs. An optional clock duty cycle stabilizer allows high performance at full speed with a wide range of clock duty cycles. L, LT, LTC, LTM, Linear Technology and the Linear logo are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. TYPICAL APPLICATION 3.3V 32k Point FFT, fIN = 15.11MHz, –1dB, PGA = 0, RAND “On”, Dither “OFF” SENSE 2.2μF AIN+ 1.25V COMMON MODE BIAS VOLTAGE + ANALOG INPUT AIN– 14-BIT PIPELINED ADC CORE S/H AMP – OVDD INTERNAL ADC REFERENCE GENERATOR 0.5V TO 3.6V 0 0.1μF OF CLKOUT D13 • • • D0 OUTPUT DRIVERS CORRECTION LOGIC AND SHIFT REGISTER –10 –20 –30 AMPLITUDE (dBFS) VCM CMOS OR LVDS OGND CLOCK/DUTY CYCLE CONTROL ENC + ENC – 3.3V 0.1μF 0.1μF 0.1μF SHDN DITH MODE LVDS RAND –70 –80 –100 –110 –120 0 220814 TA01 PGA –50 –60 –90 VDD GND –40 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G05 ADC CONTROL INPUTS 220814fb 1 LTC2208-14 ABSOLUTE MAXIMUM RATINGS PIN CONFIGURATION OVDD = VDD (Notes 1 and 2) TOP VIEW 64 PGA 63 RAND 62 MODE 61 LVDS 60 OF+/0FA 59 OF–/DA13 58 D13+/DA12 57 D13–/DA11 56 D12+/DA10 55 D12–/DA9 54 D11+/DA8 53 D11–/DA7 52 D10+/DA6 51 D10–/DA5 50 OGND 49 OVDD Supply Voltage (VDD) ................................... –0.3V to 4V Digital Output Ground Voltage (OGND) ........ –0.3V to 1V Analog Input Voltage (Note 3) ..... –0.3V to (VDD + 0.3V) Digital Input Voltage .................... –0.3V to (VDD + 0.3V) Digital Output Voltage................ –0.3V to (OVDD + 0.3V) Power Dissipation ............................................ 2000mW Operating Temperature Range LTC2208C-14 ........................................... 0°C to 70°C LTC2208I-14 ........................................–40°C to 85°C Storage Temperature Range ..................–65°C to 150°C Digital Output Supply Voltage (OVDD) .......... –0.3V to 4V SENSE 1 GND 2 VCM 3 GND 4 VDD 5 VDD 6 GND 7 AIN+ 8 AIN– 9 GND 10 GND 11 ENC+ 12 ENC– 13 GND 14 VDD 15 VDD 16 48 D9+/DA4 47 D9–/DA3 46 D8+/DA2 45 D8–/DA1 44 D7+/DA0 43 D7–/DNC 42 D6+/DNC 41 D6–/CLKOUTA 40 CLKOUT+/CLKOUTB 39 CLKOUT–/OFB 38 D5+_ /DB13 37 D5 /DB12 36 D4+/DB11 35 D4–/DB10 34 D3+/DB9 33 D3–/DB8 VDD 17 GND 18 SHDN 19 DITH 20 NC 21 NC 22 DNC/DB0 23 DNC/DB1 24 D0–/DB2 25 D0+/DB3 26 D1–/DB4 27 D1+/DB5 28 D2–/DB6 29 D2+/DB7 30 OGND 31 OVDD 32 65 UP PACKAGE 64-LEAD (9mm s 9mm) PLASTIC QFN EXPOSED PAD (PIN 65) IS GND, MUST BE SOLDERED TO PCB BOARD TJMAX = 150°C, θJA = 20°C/W ORDER INFORMATION LEAD FREE FINISH TAPE AND REEL PART MARKING* PACKAGE DESCRIPTION TEMPERATURE RANGE LTC2208CUP-14#PBF LTC2208CUP-14#TRPBF LTC2208UP-14 64-Lead (9mm × 9mm) Plastic Plastic QFN 0°C to 70°C LTC2208IUP-14#PBF LTC2208IUP-14#TRPBF 64-Lead (9mm × 9mm) Plastic Plastic QFN –40°C to 85°C LTC2208UP-14 Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container. Consult LTC Marketing for information on non-standard lead based finish parts. For more information on lead free part marking, go to: http://www.linear.com/leadfree/ For more information on tape and reel specifications, go to: http://www.linear.com/tapeandreel/ CONVERTER CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) PARAMETER CONDITIONS Integral Linearity Error Differential Analog Input (Note 5) Differential Linearity Error Offset Error MIN TYP MAX UNITS l ±1 ±1.5 LSB Differential Analog Input l ±0.2 ±0.5 LSB (Note 6) l ±2 ±10.8 mV ±10 Offset Drift l ±0.2 μV/°C ±2.3 Gain Error External Reference Full-Scale Drift Internal Reference External Reference ±30 ±15 ppm/°C ppm/°C Transition Noise External Reference 0.8 LSBRMS %FS 220814fb 2 LTC2208-14 ANALOG INPUT The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS VIN Analog Input Range (AIN+ – AIN–) MIN 3.135V ≤ VDD ≤ 3.465V VIN, CM Analog Input Common Mode Differential Input (Note 7) l 1 IIN Analog Input Leakage Current 0V ≤ AIN+, AIN– ≤ VDD l ISENSE SENSE Input Leakage Current 0V ≤ SENSE ≤ VDD l IMODE MODE Pin Pull-Down Current to GND ILVDS LVDS Pin Pull-Down Current to GND CIN Analog Input Capacitance tAP TYP MAX UNITS 1.5 to 2.25 1.25 VP-P 1.5 V –1 1 μA –3 3 μA 10 μA 10 μA 6.5 1.8 pF pF Sample-and-Hold Acquisition Delay Time 1 ns tJITTER Sample-and-Hold Acquisition Delay Time Jitter 70 fsRMS CMRR Analog Input Common Mode Rejection Ratio 1V < (AIN+ = AIN–) <1.5V 80 dB BW-3dB Full Power Bandwidth RS ≤ 25Ω 700 MHz Sample Mode ENC+ < ENC– Hold Mode ENC+ > ENC– DYNAMIC ACCURACY The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 4) SYMBOL PARAMETER CONDITIONS SNR Signal-to-Noise Ratio 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) 30MHz Input (2.25V Range, PGA = 0), TA = 25ºC 30MHz Input (2.25V Range, PGA = 0) 30MHz Input (1.5V Range, PGA = 1) MIN l 75.7 75.4 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1), TA = 25ºC 140MHz Input (1.5V Range, PGA = 1) l 73.5 73.3 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) SFDR Spurious Free Dynamic Range 2nd or 3rd Harmonic 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) 30MHz Input (2.25V Range, PGA = 0) 30MHz Input (1.5V Range, PGA = 1) l 84 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1) 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) l 81.5 TYP MAX UNITS 77.1 74.9 dBFS dBFS 77 77 74.9 dBFS dBFS dBFS 76.9 74.8 dBFS dBFS 76.4 74.6 74.6 dBFS dBFS dBFS 75 73.6 dBFS dBFS 98 98 dBc dBc 96 98 dBc dBc 90 93 dBc dBc 85 95 dBc dBc 76 81 dBc dBc 220814fb 3 LTC2208-14 DYNAMIC ACCURACY The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 4) SYMBOL PARAMETER CONDITIONS SFDR Spurious Free Dynamic Range 4th Harmonic or Higher 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) MIN 100 100 dBc dBc 100 100 dBc dBc 95 95 dBc dBc 90 90 dBc dBc 77 74.8 dBFS dBFS 76.9 76.9 74.7 dBFS dBFS dBFS 76.6 74.6 dBFS dBFS 76.3 74.5 74.5 dBFS dBFS dBFS 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) 73.6 72.9 dBFS dBFS 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) 105 105 dBFS dBFS 30MHz Input (2.25V Range, PGA = 0) 30MHz Input (1.5V Range, PGA = 1) 105 105 dBFS dBFS 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) 105 105 dBFS dBFS 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1) 100 100 dBFS dBFS 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) 100 100 dBFS dBFS 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) 115 115 dBFS dBFS 110 110 dBFS dBFS 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) 110 110 dBFS dBFS 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1) 107 107 dBFS dBFS 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) 105 105 dBFS dBFS 30MHz Input (2.25V Range, PGA = 0) 30MHz Input (1.5V Range, PGA = 1) l 87 l 85 250MHz Input (2.25V Range, PGA = 0) 250MHz Input (1.5V Range, PGA = 1) 5MHz Input (2.25V Range, PGA = 0) 5MHz Input (1.5V Range, PGA = 1) 30MHz Input (2.25V Range, PGA = 0), TA = 25ºC 30MHz Input (2.25V Range, PGA = 0 30MHz Input (1.5V Range, PGA = 1) l 75.4 75.1 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1), TA = 25ºC 140MHz Input (1.5V Range, PGA = 1) SFDR SFDR Spurious Free Dynamic Range at –25dBFS Dither “OFF” Spurious Free Dynamic Range at –25dBFS Dither “ON” UNITS dBc dBc 140MHz Input (2.25V Range, PGA = 0) 140MHz Input (1.5V Range, PGA = 1) Signal-to-Noise Plus Distortion Ratio MAX 100 100 70MHz Input (2.25V Range, PGA = 0) 70MHz Input (1.5V Range, PGA = 1) S/(N+D) TYP 30MHz Input (2.25V Range, PGA = 0) 30MHz Input (1.5V Range, PGA = 1) l l 73.4 73 95 220814fb 4 LTC2208-14 COMMON MODE BIAS CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) PARAMETER CONDITIONS MIN TYP MAX UNITS VCM Output Voltage IOUT = 0 1.15 1.25 1.35 V VCM Output Tempco IOUT = 0 40 ppm/°C VCM Line Regulation 3.135V ≤ VDD ≤ 3.465V 1 mV/ V VCM Output Resistance | IOUT | ≤ 1mA 2 Ω DIGITAL INPUTS AND DIGITAL OUTPUTS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS ENCODE INPUTS (ENC+, ENC–) VID Differential Input Voltage (Note 7) VICM Common Mode Input Voltage Internally Set Externally Set (Note 7) l 0.2 V 1.6 1.2 V 3 RIN Input Resistance (See Figure 2) 6 kΩ CIN Input Capacitance (Note 7) 3 pF LOGIC INPUTS (DITH, PGA, SHDN, RAND) VIH High Level Input Voltage VDD = 3.3V l VIL Low Level Input Voltage VDD = 3.3V l l IIN Digital Input Current VIN = 0V to VDD CIN Digital Input Capacitance (Note 7) 2 V 0.8 V ±10 μA 1.5 pF 3.299 3.29 V V LOGIC OUTPUTS (CMOS MODE) OVDD = 3.3V VOH VOL High Level Output Voltage Low Level Output Voltage VDD = 3.3V VDD = 3.3V IO = –10μA IO = –200μA l IO = 160μA IO = 1.60mA l 3.1 0.01 0.1 0.4 V V ISOURCE Output Source Current VOUT = 0V –50 mA ISINK Output Sink Current VOUT = 3.3V 50 mA VOH High Level Output Voltage VDD = 3.3V IO = –200μA 2.49 V VOL Low Level Output Voltage VDD = 3.3V IO = 1.6mA 0.1 V VOH High Level Output Voltage VDD = 3.3V IO = –200μA 1.79 V VOL Low Level Output Voltage VDD = 3.3V IO = 1.6mA 0.1 V OVDD = 2.5V OVDD = 1.8V LOGIC OUTPUTS (LVDS MODE) STANDARD LVDS VDD Differential Output Voltage 100Ω Differential Load l 247 350 454 VOS Output Common Mode Voltage 100Ω Differential Load l 1.125 1.2 1.375 VDD Differential Output Voltage 100Ω Differential Load l 125 175 250 VOS Output Common Mode Voltage 100Ω Differential Load l 1.125 1.2 1.375 mV V LOW POWER LVDS mV V 220814fb 5 LTC2208-14 POWER REQUIREMENTS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. AIN = –1dBFS. (Note 4) SYMBOL PARAMETER CONDITIONS VDD Analog Supply Voltage (Note 8) PSHDN Shutdown Power SHDN = VDD l MIN TYP MAX UNITS 3.135 3.3 3.465 V 0.2 mW STANDARD LVDS OUTPUT MODE OVDD Output Supply Voltage IVDD Analog Supply Current IOVDD PDIS (Note 8) l 3 3.3 3.6 V l 401 470 mA Output Supply Voltage l 71 90 mA Power Dissipation l 1498 1782 mW 3.3 3.6 V LOW POWER LVDS OUTPUT MODE (Note 8) l OVDD Output Supply Voltage 3 IVDD Analog Supply Current l 401 470 mA IOVDD Output Supply Voltage l 40 50 mA PDIS Power Dissipation l 1356 1650 mW CMOS OUTPUT MODE (Note 8) l OVDD Output Supply Voltage IVDD Analog Supply Current l PDIS Power Dissipation l 0.5 3.6 V 401 470 mA 1320 1551 mW TIMING CHARACTERISTICS The l denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. (Note 4) SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS fS Sampling Frequency (Note 8) l 130 MHz tL ENC Low Time Duty Cycle Stabilizer Off (Note 7) Duty Cycle Stabilizer On (Note 7) l l 3.65 2.6 3.846 3.846 1000 1000 ns ns tH ENC High Time Duty Cycle Stabilizer Off (Note 7) Duty Cycle Stabilizer On (Note 7) l l 3.65 2.6 3.846 3.846 1000 1000 ns ns tAP Sample-and-Hold Aperture Delay 1 –1 ns LVDS OUTPUT MODE (STANDARD AND LOW POWER) tD ENC to DATA Delay (Note 7) l 1.3 2.5 1.3 –0.6 3.8 ns 2.5 3.8 ns 0 0.6 ns tC ENC to CLKOUT Delay (Note 7) l tSKEW DATA to CLKOUT Skew (tC-tD) (Note 7) l tRISE Output Rise Time 0.5 ns tFALL Output Fall Time 0.5 ns Data Latency Data Latency 7 Cycles CMOS OUTPUT MODE tD ENC to DATA Delay (Note 7) l 1.3 2.7 4 ns tC ENC to CLKOUT Delay (Note 7) l 1.3 2.7 4 ns tSKEW DATA to CLKOUT Skew (tC-tD) (Note 7) l –0.6 0 0.6 ns Data Latency Data Latency Full Rate CMOS Demuxed 7 7 Cycles Cycles 220814fb 6 LTC2208-14 ELECTRICAL CHARACTERISTICS Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: All voltage values are with respect to GND, with GND and OGND shorted (unless otherwise noted). Note 3: When these pin voltages are taken below GND or above VDD, they will be clamped by internal diodes. This product can handle input currents of greater than 100mA below GND or above VDD without latchup. Note 4: VDD = 3.3V, fSAMPLE = 130MHz, LVDS outputs, differential ENC+/ ENC– = 2VP-P sine wave with 1.6V common mode, input range = 2.25VP-P with differential drive (PGA = 0), unless otherwise specified. Note 5: Integral nonlinearity is defined as the deviation of a code from a “best fit straight line” to the transfer curve. The deviation is measured from the center of the quantization band. Note 6: Offset error is the offset voltage measured from –1/2LSB when the output code flickers between 00 0000 0000 0000 and 11 1111 1111 1111 in 2’s complement output mode. Note 7: Guaranteed by design, not subject to test. Note 8: Recommended operating conditions. TIMING DIAGRAM LVDS Output Mode Timing All Outputs are Differential and Have LVDS Levels tAP ANALOG INPUT N+1 N+4 N N+3 N+2 tH tL ENC– ENC+ tD N–7 D0-D13, OF CLKOUT+ CLKOUT – N–6 N–5 N–4 N–3 tC 220814 TD01 220814fb 7 LTC2208-14 TIMING DIAGRAM Full-Rate CMOS Output Mode Timing All Outputs are Single-Ended and Have CMOS Levels tAP ANALOG INPUT N+1 N+4 N N+3 N+2 tH tL – ENC ENC+ tD N–7 DA0-DA13, OFA N–6 N–5 N–4 N–3 tC CLKOUTA CLKOUTB HIGH IMPEDANCE DB0-DB13, OFB 220814 TD02 Demultiplexed CMOS Output Mode Timing All Outputs are Single-Ended and Have CMOS Levels tAP ANALOG INPUT N+1 N N+4 N+2 N+3 tH tL – ENC ENC+ tD DA0-DA13, OFA N–8 N–6 N–4 N–7 N–5 N–3 tD DB0-DB13, OFB tC CLKOUTA CLKOUTB 220814 TD03 220814fb 8 LTC2208-14 TYPICAL PERFORMANCE CHARACTERISTICS Differential Nonlinearity (DNL) vs Output Code 1.0 0.5 0.8 0.4 0.6 0.3 0.4 0.2 0.2 0 –0.2 –0.4 200000 150000 0.1 0 –0.1 100000 –0.2 –0.6 –0.3 –0.8 –0.4 –1.0 50000 –0.5 0 4096 12288 8192 OUTPUT CODE 0 16384 4096 12288 8192 OUTPUT CODE 220814 G01 0 8176 16384 –20 –20 –20 –30 –30 –30 –70 –80 AMPLITUDE (dBFS) 0 –10 AMPLITUDE (dBFS) 0 –10 –60 –40 –50 –60 –70 –80 –50 –60 –70 –80 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 10 40 30 20 50 FREQUENCY (MHz) 60 –120 0 10 40 30 20 50 FREQUENCY (MHz) 220814 G04 0 0 –10 –10 –20 –20 –20 –30 –30 –30 –60 –70 –80 AMPLITUDE (dBFS) 0 –50 –40 –50 –60 –70 –80 –50 –60 –70 –80 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G07 60 –40 –90 0 40 30 20 50 FREQUENCY (MHz) 32k Point 2-Tone FFT, fIN = 20.14MHz and 14.25MHz, –25dBFS, PGA = 0, RAND = “On”, Dither “Off” –10 –40 10 220814 G06 32k Point 2-Tone FFT, fIN = 20.14MHz and 14.25MHz, –7dBFS, PGA = 0, RAND = “On”, Dither “Off” AMPLITUDE (dBFS) AMPLITUDE (dBFS) 0 60 220814 G05 128k Point FFT, fIN = 15.11MHz, –40dBFS, PGA = 0, RAND = “On”, Dither “On” 8186 –40 –90 0 8184 128k Point FFT, fIN = 15.11MHz, –40dBFS, PGA = 0, RAND = “On”, Dither “Off” 0 –50 8182 8180 OUTPUT CODE 220814 G03 32k Point FFT, fIN = 15.11MHz, –1dBFS, PGA = 0, RAND = “On”, Dither “Off” –10 –40 8178 220814 G02 32k Point FFT, fIN = 5.21MHz, –1dBFS, PGA = 0, RAND = “On”, Dither “Off” AMPLITUDE (dBFS) AC Grounded Input Histogram 250000 COUNT DNL ERROR (LSB) INL ERROR (LSB) Integral Nonlinearity (INL) vs Output Code –120 0 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G08 0 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G09 220814fb 9 LTC2208-14 TYPICAL PERFORMANCE CHARACTERISTICS SFDR vs Input Level, fIN = 15.1MHz, PGA = 0, RAND = “On”, Dither “Off” 32k Point FFT, fIN = 30.11MHz, –1dBFS, PGA = 0, RAND = “On”, Dither “Off” SFDR vs Input Level, fIN = 15.1MHz, PGA = 0, RAND = “On”, Dither “On” 120 0 120 –10 –20 100 80 60 40 20 –30 AMPLITUDE (dBFS) SFDR (dBc AND dBFS) SFDR (dBc AND dBFS) 100 80 60 40 –40 –50 –60 –70 –80 –90 –100 20 –110 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) 0 220814 G10 0 –20 –20 –20 –30 –30 –30 –60 –70 –80 AMPLITUDE (dBFS) 0 –10 AMPLITUDE (dBFS) 0 –10 –40 –50 –60 –70 –80 –40 –50 –60 –70 –80 –90 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 10 40 30 20 50 FREQUENCY (MHz) 60 –120 0 10 40 30 20 50 FREQUENCY (MHz) 0 60 220814 G13 220814 G14 128k Point FFT, fIN = 70.11MHz, –40dBFS, PGA = 0, RAND = “On”, Dither “Off” 128k Point FFT, fIN = 70.11MHz, –40dBFS, PGA = 0, RAND = “On”, Dither “On” 0 –10 –20 –20 –20 –30 –30 –30 –50 –60 –70 –80 AMPLITUDE (dBFS) 0 –10 –40 –50 –60 –70 –80 –50 –60 –70 –80 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G16 60 –40 –90 0 40 30 20 50 FREQUENCY (MHz) 220814 G15 0 –40 10 32k Point FFT, fIN = 70.11MHz, –1dBFS, PGA = 1, RAND = “On”, Dither “Off” –10 AMPLITUDE (dBFS) AMPLITUDE (dBFS) 0 60 32k Point FFT, fIN = 70.11MHz, –10dBFS, PGA = 0, RAND = “On”, Dither “Off” 0 –50 40 30 20 50 FREQUENCY (MHz) 220814 G12 32k Point FFT, fIN = 70.11MHz, –1dBFS, PGA = 0, RAND = “On”, Dither “Off” –10 –40 10 220814 G11 32k Point FFT, fIN = 30.11MHz, –25dBFS, PGA = 0, RAND = “On”, Dither “On” AMPLITUDE (dBFS) –120 0 –120 0 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G17 0 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G18 220814fb 10 LTC2208-14 TYPICAL PERFORMANCE CHARACTERISTICS SFDR vs Input Level, fIN = 70.2MHz, PGA = 0, RAND = “On”, Dither “Off” 32k Point 2-Tone FFT, fIN = 67.2MHz and 74.4MHz, –7dBFS, PGA = 0, RAND = “On”, Dither “Off” SFDR vs Input Level, fIN = 70.2MHz, PGA = 0, RAND = “On”, Dither “On” 120 0 120 –10 –20 100 80 60 40 20 –30 AMPLITUDE (dBFS) SFDR (dBc AND dBFS) SFDR (dBc AND dBFS) 100 80 60 40 –40 –50 –60 –70 –80 –90 –100 20 –110 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) 0 220814 G19 0 –20 –20 –20 –30 –30 –30 –70 –80 AMPLITUDE (dBFS) 0 –10 AMPLITUDE (dBFS) 0 –10 –60 –40 –50 –60 –70 –80 –40 –50 –60 –70 –80 –90 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 0 10 40 30 20 50 FREQUENCY (MHz) –120 0 60 220814 G22 10 40 30 20 50 FREQUENCY (MHz) 0 60 10 40 30 20 50 FREQUENCY (MHz) 220814 G23 SFDR vs Input Level, fIN = 140.1MHz, PGA = 1, RAND = “On”, Dither “Off” 60 220814 G24 32k Point FFT, fIN = 170.1MHz, –1dBFS, PGA = 1, RAND = “On”, Dither “Off” SFDR vs Input Level, fIN = 140.1MHz, PGA = 1, RAND = “On”, Dither “On” 0 120 120 60 32k Point FFT, fIN = 140.11MHz, –1dBFS, PGA = 1, RAND = “On”, Dither “Off” 0 –50 40 30 20 50 FREQUENCY (MHz) 220814 G21 32k Point FFT, fIN = 140.11MHz, –1dBFS, PGA = 0, RAND = “On”, Dither “Off” –10 –40 10 220814 G20 32k Point 2-Tone FFT, fIN = 67.2MHz and 74.4MHz, –15dBFS, PGA = 0, RAND = “On”, Dither “Off” AMPLITUDE (dBFS) –120 0 –10 80 60 40 –30 AMPLITUDE (dBFS) SFDR (dBc AND dBFS) SFDR (dBc AND dBFS) –20 100 100 80 60 40 –50 –60 –70 –80 –90 –100 20 20 –40 –110 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) 0 220814 G25 0 –80 –70 –60 –50 –40 –30 –20 –10 INPUT LEVEL (dBFS) –120 0 220814 G26 0 10 40 30 20 50 FREQUENCY (MHz) 60 220814 G27 220814fb 11 LTC2208-14 TYPICAL PERFORMANCE CHARACTERISTICS 32k Point FFT, fIN = 250.11MHz, –10dBFS, PGA = 1, RAND = “On”, Dither “Off” 32k Point FFT, fIN = 380.11MHz, –1dBFS, PGA = 1, RAND = “On”, Dither “Off” 0 0 –10 –10 –20 –20 –20 –30 –30 –30 –40 –50 –60 –70 –80 AMPLITUDE (dBFS) 0 –10 AMPLITUDE (dBFS) AMPLITUDE (dBFS) 32k Point FFT, fIN = 250.11MHz, –1dBFS, PGA = 1, RAND = “On”, Dither “Off” –40 –50 –60 –70 –80 –40 –50 –60 –70 –80 –90 –90 –90 –100 –100 –100 –110 –110 –110 –120 –120 0 10 40 30 20 50 FREQUENCY (MHz) –120 0 60 10 40 30 20 50 FREQUENCY (MHz) –10 100 –40 95 –70 –80 77 76 PGA = 0 PGA = 1 SNR (dBFS) SFDR (dBc) AMPLITUDE (dBFS) –30 90 85 PGA = 0 –90 75 74 PGA = 1 80 73 75 –100 72 70 –110 –120 0 10 40 30 20 50 FREQUENCY (MHz) 71 65 60 0 50 100 150 250 200 INPUT FREQUENCY (MHz) 220814 G31 105 105 100 100 95 90 85 80 SNR IVDD vs Sample Rate, fIN = 5.1MHz, –1dBfs 470 450 SFDR VDD = 3.47V 430 95 IVDD (mA) SNR AND SFDR (dBFS) 110 300 220814 G33 SNR and SFDR vs Supply Voltage (VDD), fIN = 5.1MHz, –1dBFS 110 SFDR 200 100 INPUT FREQUENCY (MHz) 0 300 220814 G32 SNR and SFDR vs Sample Rate fIN = 5.1MHz, –1dBFS SNR AND SFDR (dBFS) SNR vs Input Frequency 105 –20 60 78 110 –60 40 30 20 50 FREQUENCY (MHz) 220814 G30 SFDR (HD2 and HD3) vs Input Frequency 0 –50 10 220814 G29 220814 G28 32k Point FFT, fIN = 380.11MHz, –10dBFS, PGA = 1, RAND = “On”, Dither “Off” 90 85 80 VDD = 3.3V 410 VDD = 3.13V 390 SNR 370 75 75 70 0 60 0 25 50 75 100 125 150 175 200 SAMPLE RATE (Msps) 220814 G34 70 2.8 350 3.2 3.0 3.4 SUPPLY VOLTAGE (V) 3.6 220814 G35 0 20 40 60 80 100 120 140 160 SAMPLE RATE (Msps) 220814 G36 220814fb 12 LTC2208-14 TYPICAL PERFORMANCE CHARACTERISTICS Gain Error Drift vs Temperature, Internal Reference, Drift from 25°C SNR and SFDR vs Duty Cycle 0.2 110 80 SNR DCS ON 70 60 0 –0.1 –0.2 –0.3 0 –0.02 –0.04 –0.06 –0.10 70 –0.5 –50 –30 DUTY CYCLE (%) 30 50 –10 10 TEMPERATURE (°C) 70 90 –0.12 –50 –30 30 –10 10 50 TEMPERATURE (°C) 220814 G38 220814 G37 Input Offset Voltage Drift vs Temperature, Drift from 25°C 70 90 220814 G39 SNR and SFDR vs Input Common Mode Voltage 0.24 100 SFDR 0.20 SNR (dBFS) AND SFDR (dBc) INPUT OFFSET VOLTAGE (mV) 0.02 –0.08 –0.4 SNR DCS OFF 50 GAIN ERROR DRIFT (%) GAIN ERROR DRIFT (%) 90 0.15 0.10 0.05 90 80 SNR 70 0 –0.05 –50 –30 30 50 –10 10 TEMPERATURE (°C) 70 60 0.50 90 0.8 4 0.6 3 FULL-SCALE ERROR (%) 5 0.2 0 –0.2 –0.4 2 1 0 –1 –2 –0.6 –3 –0.8 –4 –1.0 –5 0 50 100 150 200 250 300 350 400 450 500 TIME AFTER WAKE-UP OR CLOCK START (μs) 2208 G42 2.00 Full-Scale Settling After Wake Up from Shutdown or Starting Encode Clock 1.0 0.4 0.75 1.00 1.25 1.50 1.75 INPUT COMMON MODE VOLTAGE (V) 220814 G41 220814 G40 Mid-Scale Settling After Wake Up from Shutdown or Starting Encode Clock FULL-SCALE ERROR (%) SFDR AND SNR (dBFS) SFDR DCS OFF 40 0.06 0.04 100 30 0.08 0.1 SFDR DCS ON 60 Gain Error Drift vs Temperature, External Reference, Drift from 25°C 0 100 200 300 400 500 600 700 800 900 1000 TIME FROM WAKE-UP OR CLOCK START (μs) 2208 G43 220814fb 13 LTC2208-14 PIN FUNCTIONS For CMOS Mode. Full Rate or Demultiplexed SENSE (Pin 1): Reference Mode Select and External Reference Input. Tie SENSE to VDD to select the internal 2.5V bandgap reference. An external reference of 2.5V or 1.25V may be used; both reference values will set a full scale ADC range of 2.25V (PGA = 0). GND (Pins 2, 4, 7, 10, 11, 14, 18): ADC Power Ground. VCM (Pin 3): 1.25V Output. Optimum voltage for input common mode. Must be bypassed to ground with a minimum of 2.2μF. Ceramic chip capacitors are recommended. VDD (Pins 5, 6, 15, 16, 17): 3.3V Analog Supply Pin. Bypass to GND with 0.1μF ceramic chip capacitors. AIN+ (Pin 8): Positive Differential Analog Input. AIN– (Pin 9): Negative Differential Analog Input. ENC+ (Pin 12): Positive Differential Encode Input. The sampled analog input is held on the rising edge of ENC+. Internally biased to 1.6V through a 6.2kΩ resistor. Output data can be latched on the rising edge of ENC+. ENC– (Pin 13): Negative Differential Encode Input. The sampled analog input is held on the falling edge of ENC –. Internally biased to 1.6V through a 6.2kΩ resistor. Bypass to ground with a 0.1μF capacitor for a single-ended Encode signal. SHDN (Pin 19): Power Shutdown Pin. SHDN = low results in normal operation. SHDN = high results in powered down analog circuitry and the digital outputs are placed in a high impedance state. DITH (Pin 20): Internal Dither Enable Pin. DITH = low disables internal dither. DITH = high enables internal dither. Refer to Internal Dither section of this data sheet for details on dither operation. NC (Pins 21, 22): No Connect. DB0-DB13 (Pins 23-30 and 33-38): Digital Outputs, B Bus. DB13 is the MSB. Active in demultiplexed mode. The B bus is in high impedance state in full rate CMOS mode. OGND (Pins 31 and 50): Output Driver Ground. OVDD (Pins 32 and 49): Positive Supply for the Output Drivers. Bypass to ground with O.1μF capacitor. OFB (Pin 39): Overflow/Underflow Digital Output for the B Bus. OFB is high when an over or under flow has occurred on the B bus. This pin goes to high impedance state in full rate CMOS mode. CLKOUTB (Pin 40): Data Valid Output. CLKOUTB will toggle at the sample rate in full rate CMOS mode or at 1/2 the sample rate in demultiplexed mode. Latch the data on the falling edge of CLKOUTB. CLKOUTA (Pin 41): Inverted Data Valid Output. CLKOUTA will toggle at the sample rate in full rate CMOS mode or at 1/2 the sample rate in demultiplexed mode. Latch the data on the rising edge of CLKOUTA. DNC (Pins 42, 43): Do Not Connect in CMOS Mode. DA0-DA13 (Pins 44-48 and 51-59): Digital Outputs, A Bus. DA13 is the MSB. Output bus for full rate CMOS mode and demultiplexed mode. OFA (Pin 60): Overflow/Underflow Digital Output for the A Bus. OFA is high when an over or under flow has occurred on the A bus. LVDS (Pin 61): Data Output Mode Select Pin. Connecting LVDS to 0V selects full rate CMOS mode. Connecting LVDS to 1/3VDD selects demultiplexed CMOS mode. Connecting LVDS to 2/3VDD selects Low Power LVDS mode. Connecting LVDS to VDD selects Standard LVDS mode. MODE (Pin 62): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Connecting MODE to 0V selects offset binary output format and disables the clock duty cycle stabilizer. Connecting MODE to 1/3VDD selects offset binary output format and enables the clock duty cycle stabilizer. Connecting MODE to 2/3VDD selects 2’s complement output format and enables the clock duty cycle stabilizer. Connecting MODE to VDD selects 2’s complement output format and disables the clock duty cycle stabilizer. RAND (Pin 63): Digital Output Randomization Selection Pin. RAND low results in normal operation. RAND high selects D1-D13 to be EXCLUSIVE-ORed with D0 (the LSB). The output can be decoded by again applying an XOR operation between the LSB and all other bits. This mode of operation reduces the effects of digital output interference. 220814fb 14 LTC2208-14 PIN FUNCTIONS PGA (Pin 64): Programmable Gain Amplifier Control Pin. Low selects a front-end gain of 1, input range of 2.25VP-P. High selects a front-end gain of 1.5, input range of 1.5VP-P. GND (Exposed Pad): ADC Power Ground. The exposed pad on the bottom of the package must be soldered to ground. NC (Pins 21, 22): No Connect. NC (Pins 23, 24): Do Not Connect in LVDS Mode. D0–/D0+ to D13–/D13+ (Pins 25-30, 33-38, 41-48 and 51-58): LVDS Digital Outputs. All LVDS outputs require differential 100Ω termination resistors at the LVDS receiver. D13+/D13– is the MSB. OGND (Pins 31 and 50): Output Driver Ground. For LVDS Mode. Standard or Low Power OVDD (Pins 32 and 49): Positive Supply for the Output Drivers. Bypass to ground with 0.1μF capacitor. SENSE (Pin 1): Reference Mode Select and External Reference Input. Tie SENSE to VDD to select the internal 2.5V bandgap reference. An external reference of 2.5V or 1.25V may be used; both reference values will set a full scale ADC range of 2.25V (PGA = 0). CLKOUT–/CLKOUT + (Pins 39 and 40): LVDS Data Valid 0utput. Latch data on the rising edge of CLKOUT +, falling edge of CLKOUT –. GND (Pins 2, 4, 7, 10, 11, 14, 18): ADC Power Ground. VCM (Pin 3): 1.25V Output. Optimum voltage for input common mode. Must be bypassed to ground with a minimum of 2.2μF. Ceramic chip capacitors are recommended. VDD (Pins 5, 6, 15, 16, 17): 3.3V Analog Supply Pin. Bypass to GND with 0.1μF ceramic chip capacitors. AIN + (Pin 8): Positive Differential Analog Input. AIN – (Pin 9): Negative Differential Analog Input. ENC + (Pin 12): Positive Differential Encode Input. The sampled analog input is held on the rising edge of ENC+. Internally biased to 1.6V through a 6.2kΩ resistor. Output data can be latched on the rising edge of ENC+. ENC – (Pin 13): Negative Differential Encode Input. The sampled analog input is held on the falling edge of ENC –. Internally biased to 1.6V through a 6.2kΩ resistor. Bypass to ground with a 0.1μF capacitor for a single-ended Encode signal. SHDN (Pin 19): Power Shutdown Pin. SHDN = low results in normal operation. SHDN = high results in powered down analog circuitry and the digital outputs are set in high impedance state. DITH (Pin 20): Internal Dither Enable Pin. DITH = low disables internal dither. DITH = high enables internal dither. Refer to Internal Dither section of the data sheet for details on dither operation. OF–/OF+ (Pins 59 and 60): Overflow/Underflow Digital Output OF is high when an over or under flow has occurred. LVDS (Pin 61): Data Output Mode Select Pin. Connecting LVDS to 0V selects full rate CMOS mode. Connecting LVDS to 1/3VDD selects demultiplexed CMOS mode. Connecting LVDS to 2/3VDD selects Low Power LVDS mode. Connecting LVDS to VDD selects Standard LVDS mode. MODE (Pin 62): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Connecting MODE to 0V selects offset binary output format and disables the clock duty cycle stabilizer. Connecting MODE to 1/3VDD selects offset binary output format and enables the clock duty cycle stabilizer. Connecting MODE to 2/3VDD selects 2’s complement output format and enables the clock duty cycle stabilizer. Connecting MODE to VDD selects 2’s complement output format and disables the clock duty cycle stabilizer. RAND (Pin 63): Digital Output Randomization Selection Pin. RAND low results in normal operation. RAND high selects D1-D13 to be EXCLUSIVE-ORed with D0 (the LSB). The output can be decoded by again applying an XOR operation between the LSB and all other bits. The mode of operation reduces the effects of digital output interference. PGA (Pin 64): Programmable Gain Amplifier Control Pin. Low selects a front-end gain of 1, input range of 2.25VP-P. High selects a front-end gain of 1.5, input range of 1.5VP-P. GND (Exposed Pad Pin 65): ADC Power Ground. The exposed pad on the bottom of the package must be soldered to ground. 220814fb 15 LTC2208-14 BLOCK DIAGRAM AIN+ AIN– VDD INPUT S/H FIRST PIPELINED ADC STAGE SECOND PIPELINED ADC STAGE THIRD PIPELINED ADC STAGE FOURTH PIPELINED ADC STAGE FIFTH PIPELINED ADC STAGE GND DITHER SIGNAL GENERATOR CORRECTION LOGIC AND SHIFT REGISTER ADC CLOCKS RANGE SELECT OVDD SENSE PGA VCM BUFFER ADC REFERENCE DIFFERENTIAL INPUT LOW JITTER CLOCK DRIVER CONTROL LOGIC OUTPUT DRIVERS • • • VOLTAGE REFERENCE OGND ENC+ ENC– SHDN PGA RAND M0DE LVDS CLKOUT+ CLKOUT– OF+ OF– D13+ D13– D0+ D0– 220814 F01 DITH Figure 1. Functional Block Diagram 220814fb 16 LTC2208-14 OPERATION DYNAMIC PERFORMANCE Signal-to-Noise Plus Distortion Ratio The signal-to-noise plus distortion ratio [S/(N+D)] is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components at the ADC output. The output is band limited to frequencies above DC to below half the sampling frequency. Signal-to-Noise Ratio The signal-to-noise (SNR) is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components, except the first five harmonics. Total Harmonic Distortion Total harmonic distortion is the ratio of the RMS sum of all harmonics of the input signal to the fundamental itself. The out-of-band harmonics alias into the frequency band between DC and half the sampling frequency. THD is expressed as: THD = –20Log (√(V22 + V32 + V42 + ... VN2)/V1) where V1 is the RMS amplitude of the fundamental frequency and V2 through VN are the amplitudes of the second through nth harmonics. Intermodulation Distortion If the ADC input signal consists of more than one spectral component, the ADC transfer function nonlinearity can produce intermodulation distortion (IMD) in addition to THD. IMD is the change in one sinusoidal input caused by the presence of another sinusoidal input at a different frequency. If two pure sine waves of frequencies fa and fb are applied to the ADC input, nonlinearities in the ADC transfer function can create distortion products at the sum and difference frequencies of mfa ± nfb, where m and n = 0, 1, 2, 3, etc. For example, the 3rd order IMD terms include (2fa + fb), (fa + 2fb), (2fa - fb) and (fa - 2fb). The 3rd order IMD is defined as the ratio of the RMS value of either input tone to the RMS value of the largest 3rd order IMD product. Spurious Free Dynamic Range (SFDR) The ratio of the RMS input signal amplitude to the RMS value of the peak spurious spectral component expressed in dBc. SFDR may also be calculated relative to full scale and expressed in dBFS. Full Power Bandwidth The Full Power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3dB for a full scale input signal. Aperture Delay Time The time from when a rising ENC + equals the ENC– voltage to the instant that the input signal is held by the sampleand-hold circuit. Aperture Delay Jitter The variation in the aperture delay time from convertion to conversion. This random variation will result in noise when sampling an AC input. The signal to noise ratio due to the jitter alone will be: SNRJITTER = –20log (2π • fIN • tJITTER) 220814fb 17 LTC2208-14 APPLICATIONS INFORMATION CONVERTER OPERATION The LTC2208-14 is a CMOS pipelined multistep converter with a front-end PGA. As shown in Figure 1, the converter has five pipelined ADC stages; a sampled analog input will result in a digitized value seven cycles later (see the Timing Diagram). The analog input is differential for improved common mode noise immunity and to maximize the input range. Additionally, the differential input drive will reduce even order harmonics of the sample and hold circuit. The encode input is also differential for improved common mode noise immunity. The LTC2208-14 has two phases of operation, determined by the state of the differential ENC+/ENC – input pins. For brevity, the text will refer to ENC+ greater than ENC – as ENC high and ENC+ less than ENC – as ENC low. Each pipelined stage shown in Figure 1 contains an ADC, a reconstruction DAC and an interstage amplifier. In operation, the ADC quantizes the input to the stage and the quantized value is subtracted from the input by the DAC to produce a residue. The residue is amplified and output by the residue amplifier. Successive stages operate out of phase so that when odd stages are outputting their residue, the even stages are acquiring that residue and vice versa. When ENC is low, the analog input is sampled differentially directly onto the input sample-and-hold capacitors, inside the “input S/H” shown in the block diagram. At the instant that ENC transitions from low to high, the voltage on the sample capacitors is held. While ENC is high, the held input voltage is buffered by the S/H amplifier which drives the first pipelined ADC stage. The first stage acquires the output of the S/H amplifier during the high phase of ENC. When ENC goes back low, the first stage produces its residue which is acquired by the second stage. At the same time, the input S/H goes back to acquiring the analog input. When ENC goes high, the second stage produces its residue which is acquired by the third stage. An identical process is repeated for the third and fourth stages, resulting in a fourth stage residue that is sent to the fifth stage for final evaluation. Each ADC stage following the first has additional range to accommodate flash and amplifier offset errors. Results from all of the ADC stages are digitally delayed such that the results can be properly combined in the correction logic before being sent to the output buffer. 18 SAMPLE/HOLD OPERATION AND INPUT DRIVE Sample/Hold Operation Figure 2 shows an equivalent circuit for the LTC2208-14 CMOS differential sample and hold. The differential analog inputs are sampled directly onto sampling capacitors (CSAMPLE) through NMOS transitors. The capacitors shown attached to each input (CPARASITIC) are the summation of all other capacitance associated with each input. During the sample phase when ENC is low, the NMOS transistors connect the analog inputs to the sampling capacitors and they charge to, and track the differential input voltage. When ENC transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when ENC is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As ENC transitions from high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the LTC2208-14 VDD RPARASITIC 3Ω AIN+ RON 20Ω CSAMPLE 4.9pF CPARASITIC 1.8pF VDD RPARASITIC 3Ω AIN– RON 20Ω CSAMPLE 4.9pF CPARASITIC 1.8pF VDD 1.6V 6k ENC+ ENC– 6k 1.6V 220814 F02 Figure 2. Equivalent Input Circuit 220814fb LTC2208-14 APPLICATIONS INFORMATION input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen. Common Mode Bias The ADC sample-and-hold circuit requires differential drive to achieve specified performance. Each input should swing ±0.5625V for the 2.25V range (PGA = 0) or ±0.375V for the 1.5V range (PGA = 1), around a common mode voltage of 1.25V. The VCM output pin (Pin 3) is designed to provide the common mode bias level. VCM can be tied directly to the center tap of a transformer to set the DC input level or as a reference level to an op amp differential driver circuit. The VCM pin must be bypassed to ground close to the ADC with 2.2μF or greater. Input Drive Impedance As with all high performance, high speed ADCs the dynamic performance of the LTC2208-14 can be influenced by the input drive circuitry, particularly the second and third harmonics. Source impedance and input reactance can influence SFDR. At the falling edge of ENC the sample and hold circuit will connect the 4.9pF sampling capacitor to the input pin and start the sampling period. The sampling period ends when ENC rises, holding the sampled input on the sampling capacitor. Ideally, the input circuitry should be fast enough to fully charge the sampling capacitor during the sampling period 1/(2F encode); however, this is not always possible and the incomplete settling may degrade the SFDR. The sampling glitch has been designed to be as linear as possible to minimize the effects of incomplete settling. For the best performance it is recommended to have a source impedance of 100Ω or less for each input. The source impedance should be matched for the differential inputs. Poor matching will result in higher even order harmonics, especially the second. provide isolation from ADC S/H switching. The LTC2208-14 has a very broadband S/H circuit, DC to 700MHz; it can be used in a wide range of applications; therefore, it is not possible to provide a single recommended RC filter. Figures 3, 4a and 4b show three examples of input RC filtering at three ranges of input frequencies. In general it is desirable to make the capacitors as large as can be tolerated—this will help suppress random noise as well as noise coupled from the digital circuitry. The LTC220814 does not require any input filter to achieve data sheet specifications; however, no filtering will put more stringent noise requirements on the input drive circuitry. Transformer Coupled Circuits Figure 3 shows the LTC2208-14 being driven by an RF transformer with a center-tapped secondary. The secondary center tap is DC biased with VCM, setting the ADC input signal at its optimum DC level. Figure 3 shows a 1:1 turns ratio transformer. Other turns ratios can be used; however, as the turns ratio increases so does the impedance seen by the ADC. Source impedance greater than 50Ω can reduce the input bandwidth and increase high frequency distortion. A disadvantage of using a transformer is the loss of low frequency response. Most small RF transformers have poor performance at frequencies below 1MHz. Center-tapped transformers provide a convenient means of DC biasing the secondary; however, they often show poor balance at high input frequencies, resulting in large 2nd order harmonics. VCM 5Ω AIN+ 10Ω T1 8.2pF 35Ω Input Filtering A first order RC low pass filter at the input of the ADC can serve two functions: limit the noise from input circuitry and LTC2208-14 8.2pF 0.1μF 10Ω INPUT DRIVE CIRCUITS 2.2μF 5Ω T1 = MA/COM ETC1-1T RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE EXCEPT 2.2μF 35Ω 5Ω AIN– 8.2pF 220814 F03 Figure 3. Single-Ended to Differential Conversion Using a Transformer. Recommended for Input Frequencies from 5MHz to 100MHz 220814fb 19 LTC2208-14 APPLICATIONS INFORMATION Figure 4a shows transformer coupling using a transmission line balun transformer. This type of transformer has much better high frequency response and balance than flux coupled center tap transformers. Coupling capacitors are added at the ground and input primary terminals to allow the secondary terminals to be biased at 1.25V. Figure 4b shows the same circuit with components suitable for higher input frequencies. VCM 2.2μF 0.1μF 0.1μF 5Ω AIN+ 10Ω ANALOG INPUT T1 1:1 25Ω 0.1μF 25Ω 10Ω T1 = MA/COM ETC1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE EXCEPT 2.2μF LTC2208-14 4.7pF 4.7pF 5Ω AIN– 4.7pF 220814 F04a Reference Operation Figure 6 shows the LTC2208-14 reference circuitry consisting of a 2.5V bandgap reference, a programmable gain amplifier and control circuit. The LTC2208-14 has three modes of reference operation: Internal Reference, 1.25V external reference or 2.5V external reference. To use the internal reference, tie the SENSE pin to VDD. To use an external reference, simply apply either a 1.25V or 2.5V reference voltage to the SENSE input pin. Both 1.25V and 2.5V applied to SENSE will result in a full scale range of 2.25VP-P (PGA = 0). A 1.25V output, VCM is provided for a common mode bias for input drive circuitry. An external bypass capacitor is required for the VCM output. This provides a high frequency low impedance path to ground for internal and external circuitry. This is also the compensation capacitor for the reference; it will not be stable without this capacitor. The minimum value required for stability is 2.2μF. Figure 4a. Using a Transmission Line Balun Transformer. Recommended for Input Frequencies from 100MHz to 250MHz VCM HIGH SPEED DIFFERENTIAL AMPLIFIER VCM ANALOG INPUT 2.2μF 0.1μF 5Ω ANALOG INPUT 25Ω 0.1μF T1 1:1 0.1μF 25Ω T1 = MA/COM ETC1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE EXCEPT 2.2μF AIN+ + CM LTC2208-14 – 2.2μF 25Ω AIN– 2.2pF 5Ω 2.2pF AMPLIFIER = LTC6600-20, LT1993, ETC. AIN– LTC2208-14 12pF + – AIN+ 25Ω 12pF 220814 F05 Figure 5. DC Coupled Input with Differential Amplifier 220814 F04b Figure 4b. Using a Transmission Line Balun Transformer. Recommended for Input Frequencies from 250MHz to 500MHz Direct Coupled Circuits Figure 5 demonstrates the use of a differential amplifier to convert a single ended input signal into a differential input signal. The advantage of this method is that it provides low frequency input response; however, the limited gain bandwidth of any op amp or closed-loop amplifier will degrade the ADC SFDR at high input frequencies. Additionally, wideband op amps or differential amplifiers tend to have high noise. As a result, the SNR will be degraded unless the noise bandwidth is limited prior to the ADC input. TIE TO VDD TO USE INTERNAL 2.5V REFERENCE OR INPUT FOR EXTERNAL 2.5V REFERENCE OR INPUT FOR EXTERNAL 1.25V REFERENCE RANGE SELECT AND GAIN CONTROL INTERNAL ADC REFERENCE SENSE PGA 2.5V BANDGAP REFERENCE VCM BUFFER 1.25V 2.2μF 220814 F06 Figure 6. Reference Circuit 220814fb 20 LTC2208-14 APPLICATIONS INFORMATION The internal programmable gain amplifier provides the internal reference voltage for the ADC. This amplifier has very stringent settling requirements and is not accessible for external use. The SENSE pin can be driven ±5% around the nominal 2.5V or 1.25V external reference inputs. This adjustment range can be used to trim the ADC gain error or other system gain errors. When selecting the internal reference, the SENSE pin should be tied to VDD as close to the converter as possible. If the sense pin is driven externally it should be bypassed to ground as close to the device as possible with 1μF ceramic capacitor. VCM 1.25V 2.2μF 3.3V 1μF 2 LT1461-2.5 4 6 SENSE LTC2208-14 In applications where jitter is critical (high input frequencies), take the following into consideration: 1. Differential drive should be used. 2. Use as large an amplitude possible. If using transformer coupling, use a higher turns ratio to increase the amplitude. 3. If the ADC is clocked with a fixed frequency sinusoidal signal, filter the encode signal to reduce wideband noise. 4. Balance the capacitance and series resistance at both encode inputs such that any coupled noise will appear at both inputs as common mode noise. The encode inputs have a common mode range of 1.2V to 3V. Each input may be driven from ground to VDD for single-ended drive. 2.2μF LTC2208-14 220814 F07 VDD TO INTERNAL ADC CLOCK DRIVERS Figure 7. A 2.25V Range ADC with an External 2.5V Reference PGA Pin The PGA pin selects between two gain settings for the ADC front-end. PGA = 0 selects an input range of 2.25VP-P; PGA = 1 selects an input range of 1.5VP-P. The 2.25V input range has the best SNR; however, the distortion will be higher for input frequencies above 100MHz. For applications with high input frequencies, the low input range will have improved distortion; however, the SNR will be approximately 1.8dB worse. See the Typical Performance Characteristics section. VDD 1.6V 6k ENC + VDD 1.6V 6k ENC– 220814 F08a Figure 8a. Equivalent Encode Input Circuit Driving the Encode Inputs The noise performance of the LTC2208-14 can depend on the encode signal quality as much as on the analog input. The encode inputs are intended to be driven differentially, primarily for noise immunity from common mode noise sources. Each input is biased through a 6k resistor to a 1.6V bias. The bias resistors set the DC operating point for transformer coupled drive circuits and can set the logic threshold for single-ended drive circuits. Any noise present on the encode signal will result in additional aperture jitter that will be RMS summed with the inherent ADC aperture jitter. 0.1μF ENC+ T1 50Ω 100Ω 0.1μF 50Ω 0.1μF T1 = MA/COM ETC1-1-13 RESISTORS AND CAPACITORS ARE 0402 PACKAGE SIZE LTC2208-14 8.2pF ENC– 220814 F08b Figure 8b. Transformer Driven Encode 220814fb 21 LTC2208-14 APPLICATIONS INFORMATION ENC+ VTHRESHOLD = 1.6V 1.6V ENC– LTC2208-14 0.1μF 220814 F09 Figure 9. Single-Ended ENC Drive, Not Recommended for Low Jitter DIGITAL OUTPUTS Digital Output Modes 3.3V MC100LVELT22 3.3V 130Ω Q0 130Ω ENC+ D0 ENC– LTC2208-14 Q0 83Ω The lower limit of the LTC2208-14 sample rate is determined by droop of the sample and hold circuits. The pipelined architecture of this ADC relies on storing analog signals on small valued capacitors. Junction leakage will discharge the capacitors. The specified minimum operating frequency for the LTC2208-14 is 1Msps. 83Ω 220814 F10 Figure 10. ENC Drive Using a CMOS to PECL Translator The LTC2208-14 can operate in four digital output modes: standard LVDS, low power LVDS, full rate CMOS, and demultiplexed CMOS. The LVDS pin selects the mode of operation. This pin has a four level logic input, centered at 0, 1/3VDD, 2/3VDD and VDD. An external resistor divider can be used to set the 1/3VDD and 2/3VDD logic levels. Table 1 shows the logic states for the LVDS pin. Table 1. LVDS Pin Function LVDS DIGITAL OUTPUT MODE Maximum and Minimum Encode Rates 0V(GND) Full-Rate CMOS The maximum encode rate for the LTC2208-14 is 130Msps. For the ADC to operate properly the encode signal should have a 50% (±5%) duty cycle. Each half cycle must have at least 3.65ns for the ADC internal circuitry to have enough settling time for proper operation. Achieving a precise 50% duty cycle is easy with differential sinusoidal drive using a transformer or using symmetric differential logic such as PECL or LVDS. When using a single-ended ENCODE signal asymmetric rise and fall times can result in duty cycles that are far from 50%. 1/3VDD Demultiplexed CMOS 2/3VDD Low Power LVDS VDD LVDS An optional clock duty cycle stabilizer can be used if the input clock does not have a 50% duty cycle. This circuit uses the rising edge of ENC pin to sample the analog input. The falling edge of ENC is ignored and an internal falling edge is generated by a phase-locked loop. The input clock duty cycle can vary from 30% to 70% and the clock duty cycle stabilizer will maintain a constant 50% internal duty cycle. If the clock is turned off for a long period of time, the duty cycle stabilizer circuit will require one hundred clock cycles for the PLL to lock onto the input clock. To use the clock duty cycle stabilizer, the MODE pin must be connected to 1/3VDD or 2/3VDD using external resistors. Digital Output Buffers (CMOS Modes) Figure 11 shows an equivalent circuit for a single output buffer in CMOS Mode, Full-Rate or Demultiplexed. Each buffer is powered by OVDD and OGND, isolated from the ADC power and ground. The additional N-channel transistor in the output driver allows operation down to low voltages. The internal resistor in series with the output makes the output appear as 50Ω to external circuitry and eliminates the need for external damping resistors. As with all high speed/high resolution converters, the digital output loading can affect the performance. The digital outputs of the LTC2208-14 should drive a minimum capacitive load to avoid possible interaction between the digital outputs and sensitive input circuitry. The output should be buffered with a device such as a ALVCH16373 CMOS latch. For full speed operation the capacitive load should be kept under 10pF. A resistor in series with the 220814fb 22 LTC2208-14 APPLICATIONS INFORMATION output may be used but is not required since the ADC has a series resistor of 43Ω on-chip. Lower OVDD voltages will also help reduce interference from the digital outputs. LTC2208-14 OVDD VDD 0.5V TO 3.6V VDD 0.1μF OVDD DATA FROM LATCH PREDRIVER LOGIC 43Ω TYPICAL DATA OUTPUT resistor, even if the signal is not used (such as OF+/OF– or CLKOUT+/CLKOUT–). To minimize noise the PC board traces for each LVDS output pair should be routed close together. To minimize clock skew, all LVDS PC board traces should have about the same length. In Low Power LVDS Mode 1.75mA is steered between the differential outputs, resulting in ±175mV at the LVDS receiver’s 100Ω termination resistor. The output common mode voltage is 1.20V, the same as standard LVDS Mode. Data Format The LTC2208-14 parallel digital output can be selected for offset binary or 2’s complement format. The format is selected with the MODE pin. This pin has a four level logic input, centered at 0, 1/3VDD, 2/3VDD and VDD. An external resistor divider can be used to set the 1/3VDD and 2/3VDD logic levels. Table 2 shows the logic states for the MODE pin. OGND 220814 F11 Figure 11. Equivalent Circuit for a Digital Output Buffer Digital Output Buffers (LVDS Modes) Figure 12 shows an equivalent circuit for an LVDS output pair. A 3.5mA current is steered from OUT+ to OUT– or vice versa, which creates a ±350mV differential voltage across the 100Ω termination resistor at the LVDS receiver. A feedback loop regulates the common mode output voltage to 1.20V. For proper operation each LVDS output pair must be terminated with an external 100Ω termination Table 2. MODE Pin Function MODE OUTPUT FORMAT CLOCK DUTY CYCLE STABILIZER 0(GND) Offset Binary Off 1/3VDD Offset Binary On 2/3VDD 2’s Complement On VDD 2’s Complement Off OVDD 3.3V LTC2208-14 0.1μF 3.5mA VDD VDD OVDD 43Ω DATA FROM LATCH PREDRIVER LOGIC 10k 10k OVDD 100Ω LVDS RECEIVER 43Ω 1.20V + – OGND 220814 F12 Figure 12. Equivalent Output Buffer in LVDS Mode 220814fb 23 LTC2208-14 APPLICATIONS INFORMATION Overflow Bit An overflow output bit (OF) indicates when the converter is overranged or underranged. In CMOS mode, a logic high on the OFA pin indicates an overflow or underflow on the A data bus, while a logic high on the OFB pin indicates an overflow on the B data bus. In LVDS mode, a differential logic high on OF+/OF– pins indicates an overflow or underflow. LSB and all other bits. The LSB, OF and CLKOUT outputs are not affected. The output Randomizer function is active when the RAND pin is high. CLKOUT CLKOUT OF OF Output Clock D13 The ADC has a delayed version of the encode input available as a digital output, CLKOUT. The CLKOUT pin can be used to synchronize the converter data to the digital system. This is necessary when using a sinusoidal encode. In both CMOS modes, A bus data will be updated as CLKOUTA falls and CLKOUTB rises. In demultiplexed CMOS mode the B bus data will be updated as CLKOUTA falls and CLKOUTB rises. In Full Rate CMOS Mode, only the A data bus is active; data may be latched on the rising edge of CLKOUTA or the falling edge of CLKOUTB. In demultiplexed CMOS mode CLKOUTA and CLKOUTB will toggle at 1/2 the frequency of the encode signal. Both the A bus and the B bus may be latched on the rising edge of CLKOUTA or the falling edge of CLKOUTB. D13/D0 D12 D2 D12/D0 • • • D2/D0 D1 RAND = HIGH, RANDOMIZER ENABLED D1/D0 RAND D0 D0 220814 F13 Figure 13. Functional Equivalent of Digital Output Randomizer Digital Output Randomizer Interference from the ADC digital outputs is sometimes unavoidable. Interference from the digital outputs may be from capacitive or inductive coupling or coupling through the ground plane. Even a tiny coupling factor can result in discernible unwanted tones in the ADC output spectrum. By randomizing the digital output before it is transmitted off chip, these unwanted tones can be randomized, trading a slight increase in the noise floor for a large reduction in unwanted tone amplitude. The digital output is “Randomized” by applying an exclusive-OR logic operation between the LSB and all other data output bits. To decode, the reverse operation is applied; that is, an exclusive-OR operation is applied between the Output Driver Power Separate output power and ground pins allow the output drivers to be isolated from the analog circuitry. The power supply for the digital output buffers, OVDD, should be tied to the same power supply as for the logic being driven. For example, if the converter is driving a DSP powered by a 1.8V supply, then OVDD should be tied to that same 1.8V supply. In CMOS mode OVDD can be powered with any logic voltage up to the 3.6V. OGND can be powered with any voltage from ground up to 1V and must be less than OVDD. The logic outputs will swing between OGND and OVDD. In LVDS Mode, OVDD should be connected to a 3.3V supply and OGND should be connected to GND. 220814fb 24 LTC2208-14 APPLICATIONS INFORMATION Internal Dither PC BOARD FPGA The LTC2208-14 is a 14-bit ADC with a very linear transfer function; however, at low input levels even slight imperfections in the transfer function will result in unwanted tones. Small errors in the transfer function are usually a result of ADC element mismatches. An optional internal dither mode can be enabled to randomize the input location on the ADC transfer curve, resulting in improved SFDR for low signal levels. CLKOUT OF D13/D0 D13 D12/D0 As shown in Figure 15, the output of the sample-and-hold amplifier is summed with the output of a dither DAC. The dither DAC is driven by a long sequence pseudo-random number generator; the random number fed to the dither DAC is also subtracted from the ADC result. If the dither DAC is precisely calibrated to the ADC, very little of the dither signal will be seen at the output. The dither signal that does leak through will appear as white noise. The dither DAC is calibrated to result in less than 0.5dB elevation in the noise floor of the ADC, as compared to the noise floor with dither off. D12 • • • LTC2208-14 D2/D0 D2 D1/D0 D1 D0 D0 220814 F14 Figure 14. Derandomizing a Randomized Digital Output LTC2208-14 AIN+ ANALOG INPUT AIN– 14-BIT PIPELINED ADC CORE S/H AMP CLOCK/DUTY CYCLE CONTROL PRECISION DAC DIGITAL SUMMATION CLKOUT OF D13 • • • D0 OUTPUT DRIVERS MULTIBIT DEEP PSEUDO-RANDOM NUMBER GENERATOR 220814 F15 ENC + ENC – DITH DITHER ENABLE HIGH = DITHER ON LOW = DITHER OFF Figure 15. Functional Equivalent Block Diagram of Internal Dither Circuit 220814fb 25 LTC2208-14 APPLICATIONS INFORMATION Grounding and Bypassing The LTC2208-14 requires a printed circuit board with a clean unbroken ground plane; a multilayer board with an internal ground plane is recommended. The pinout of the LTC2208-14 has been optimized for a flowthrough layout so that the interaction between inputs and digital outputs is minimized. Layout for the printed circuit board should ensure that digital and analog signal lines are separated as much as possible. In particular, care should be taken not to run any digital track alongside an analog signal track or underneath the ADC. High quality ceramic bypass capacitors should be used at the VDD, VCM, and OVDD pins. Bypass capacitors must be located as close to the pins as possible. The traces connecting the pins and bypass capacitors must be kept short and should be made as wide as possible. The LTC2208-14 differential inputs should run parallel and close to each other. The input traces should be as short as possible to minimize capacitance and to minimize noise pickup. Heat Transfer Most of the heat generated by the LTC2208-14 is transferred from the die through the bottom-side exposed pad. For good electrical and thermal performance, the exposed pad must be soldered to a large grounded pad on the PC board. It is critical that the exposed pad and all ground pins are connected to a ground plane of sufficient area with as many vias as possible. 220814fb 26 LTC2208-14 PACKAGE DESCRIPTION UP Package 64-Lead Plastic QFN (9mm × 9mm) (Reference LTC DWG # 05-08-1705 Rev C) 0.70 p 0.05 7.15 p 0.05 7.50 REF 8.10 p 0.05 9.50 p 0.05 (4 SIDES) 7.15 p 0.05 PACKAGE OUTLINE 0.25 p 0.05 0.50 BSC RECOMMENDED SOLDER PAD PITCH AND DIMENSIONS APPLY SOLDER MASK TO AREAS THAT ARE NOT SOLDERED 9 .00 p 0.10 (4 SIDES) 0.75 p 0.05 R = 0.10 TYP R = 0.115 TYP 63 64 0.40 p 0.10 PIN 1 TOP MARK (SEE NOTE 5) 1 2 PIN 1 CHAMFER C = 0.35 7.15 p 0.10 7.50 REF (4-SIDES) 7.15 p 0.10 (UP64) QFN 0406 REV C 0.200 REF 0.00 – 0.05 NOTE: 1. DRAWING CONFORMS TO JEDEC PACKAGE OUTLINE MO-220 VARIATION WNJR-5 2. ALL DIMENSIONS ARE IN MILLIMETERS 3. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE, IF PRESENT 4. EXPOSED PAD SHALL BE SOLDER PLATED 5. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE 6. DRAWING NOT TO SCALE 0.25 p 0.05 0.50 BSC BOTTOM VIEW—EXPOSED PAD 220814fb Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 27 LTC2208-14 RELATED PARTS PART NUMBER DESCRIPTION COMMENTS LTC1747 12-Bit, 80MSPS ADC 72dB SNR, 87dB SFDR, 48-Pin TSSOP Package LTC1748 14-Bit, 80Msps ADC 76.3dB SNR, 90dB SFDR, 48-Pin TSSOP Package LTC1749 12-Bit, 80Msps Wideband ADC Up to 500MHz IF Undersampling, 87dB SFDR LTC1750 14-Bit, 80Msps Wideband ADC Up to 500MHz IF Undersampling, 90dB SFDR LT1993-2 High Speed Differential Op Amp 800MHz BW, 70dBc Distortion at 70MHz, 6dB Gain LTC2202 16-Bit, 10MSPS ADC 140mW, 81.6dB SNR, 100dB SFDR LTC2203 16-Bit, 25MSPS ADC 220mW, 81.6dB SNR, 100dB SFDR LTC2204 16-Bit, 40Msps ADC 480mW, 79.1dB SNR, 100dB SFDR LTC2205 16-Bit, 65Msps ADC 610mW, 79dB SNR, 100dB SFDR LTC2206 16-Bit, 80Msps ADC 725mW, 77.9dB SNR, 100dB SFDR LTC2207 16-Bit, 105Msps ADC 900mW, 77.9dB SNR, 100dB SFDR LTC2208 16-Bit, 130Msps ADC 1250mW, 77.7dB SNR, 100dB SFDR LTC2220 12-Bit, 170Msps ADC 890mW, 67.5dB SNR, 9mm × 9mm QFN Package LTC2220-1 12-Bit, 185Msps ADC 910mW, 67.5dB SNR, 9mm × 9mm QFN Package LTC2249 14-Bit, 65Msps ADC 230mW, 73dB SNR, 5mm × 5mm QFN Package LTC2250 10-Bit, 105Msps ADC 320mW, 61.6dB SNR, 5mm × 5mm QFN Package LTC2251 10-Bit, 125Msps ADC 395mW, 61.6dB SNR, 5mm × 5mm QFN Package LTC2252 12-Bit, 105Msps ADC 320mW, 70.2dB SNR, 5mm × 5mm QFN Package LTC2253 12-Bit, 125Msps ADC 395mW, 70.2dB SNR, 5mm × 5mm QFN Package LTC2254 14-Bit, 105Msps ADC 320mW, 72.5dB SNR, 5mm × 5mm QFN Package LTC2255 14-Bit, 125Msps ADC 395mW, 72.4dB SNR, 5mm × 5mm QFN Package LTC2299 Dual 14-Bit, 80Msps ADC 445mW, 73dB SNR, 9mm × 9mm QFN Package LT5512 DC-3GHz High Signal Level Downconverting Mixer DC to 3GHz, 21dBm IIP3, Integrated LO Buffer LT5514 Ultralow Distortion IF Amplifier/ADC Driver with Digitally Controlled Gain 450MHz 1dB BW, 47dB OIP3, Digital Gain Control 10.5dB to 33dB in 1.5dB/Step LT5522 600MHz to 2.7GHz High Linearity Downconverting Mixer 4.5V to 5.25V Supply, 25dBm IIP3 at 900MHz, NF = 12.5dB, 50Ω Single-Ended RF and LO Ports 220814fb 28 Linear Technology Corporation LT 0909 REV B • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com © LINEAR TECHNOLOGY CORPORATION 2006