ON MC74HC157A Quad 2−input data selectors / multiplexer Datasheet

MC74HC157A
Quad 2−Input Data
Selectors / Multiplexers
High−Performance Silicon−Gate CMOS
The MC74HC157A is identical in pinout to the LS157. The device
inputs are compatible with standard CMOS outputs; with pullup
resistors, they are compatible with LSTTL outputs.
This device routes 2 nibbles (A or B) to a single port (Y) as
determined by the Select input. The data is presented at the outputs in
noninverted form. A high level on the Output Enable input sets all four
Y outputs to a low level.
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MARKING
DIAGRAMS
16
16
Features
•
•
•
•
•
•
•
•
PDIP−16
N SUFFIX
CASE 648
1
Output Drive Capability: 10 LSTTL Loads
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 2.0 to 6.0 V
Low Input Current: 1.0 mA
High Noise Immunity Characteristic of CMOS Devices
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 82 FETs or 20.5 Equivalent Gates
Pb−Free Packages are Available*
MC74HC157AN
AWLYYWWG
1
16
SOIC−16
D SUFFIX
CASE 751B
16
1
HC157AG
AWLYWW
1
16
16
1
TSSOP−16
DT SUFFIX
CASE 948F
HC
157A
ALYWG
G
1
16
16
1
SOEIAJ−16
F SUFFIX
CASE 966
74HC157A
ALYWG
1
A
= Assembly Location
L, WL
= Wafer Lot
Y, YY
= Year
W, WW = Work Week
G
= Pb−Free Package
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting Techniques
Reference Manual, SOLDERRM/D.
© Semiconductor Components Industries, LLC, 2005
June, 2005 − Rev. 9
1
Publication Order Number:
MC74HC157A/D
MC74HC157A
A0
SELECT
1
16
A0
2
15
B0
3
14
VCC
OUTPUT
ENABLE
A3
Y0
4
13
B3
A1
5
12
Y3
B1
6
11
A2
Y1
7
10
B2
GND
8
9
Y2
NIBBLE
A INPUTS
A1
A2
A3
B0
NIBBLE
B INPUTS
B1
B2
B3
SELECT
OUTPUT
ENABLE
Figure 1. Pin Assignment
2
5
11
4
14
7
9
3
12
6
Y0
Y1
Y2
DATA
OUTPUTS
Y3
10
13
PIN 16 = VCC
PIN 8 = GND
1
15
Figure 2. Logic Diagram
FUNCTION TABLE
Inputs
Output
Enable
Select
Outputs
Y0 − Y3
H
L
L
X
L
H
L
A0 −A3
B0 −B3
X = don’t care
A0 − A3, B0 − B3 = the levels of the
respective Data−Word Inputs.
ORDERING INFORMATION
Package
Shipping †
MC74HC157AN
PDIP−16
500 Units / Rail
MC74HC157ANG
PDIP−16
(Pb−Free)
500 Units / Rail
MC74HC157AD
SOIC−16
48 Units / Rail
MC74HC157ADG
SOIC−16
(Pb−Free)
48 Units / Rail
MC74HC157ADR2
SOIC−16
2500 Units / Reel
MC74HC157ADR2G
SOIC−16
(Pb−Free)
2500 Units / Reel
MC74HC157ADTR2
TSSOP−16*
2500 Units / Reel
MC74HC157ADTR2G
TSSOP−16*
2500 Units / Reel
MC74HC157AFEL
SOEIAJ−16
2000 Units / Reel
MC74HC157AFELG
SOEIAJ−16
(Pb−Free)
2000 Units / Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
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2
MC74HC157A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
– 0.5 to + 7.0
V
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
Vout
Iin
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 25
mA
ICC
DC Supply Current, VCC and GND Pins
± 50
mA
PD
Power Dissipation in Still Air,
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP, SOIC or TSSOP Package)
Plastic DIP†
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
_C
260
Maximum ratings are those values beyond which device damage can occur. Maximum ratings
applied to the device are individual stress limit values (not normal operating conditions) and are
not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
†Derating — Plastic DIP: – 10 mW/_C from 65_ to 125_C
SOIC Package: – 7 mW/_C from 65_ to 125_C
TSSOP Package: − 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
Min
DC Supply Voltage (Referenced to GND)
Max
Unit
2.0
6.0
V
0
VCC
V
– 55
+ 125
_C
0
0
0
1000
500
400
ns
DC Input Voltage, Output Voltage
(Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time
(Figure 1)
VCC = 2.0 V
VCC = 4.5 V
VCC = 6.0 V
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Test Conditions
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
VIH
Minimum High−Level Input
Voltage
Vout = VCC – 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
1.5
2.1
3.15
4.2
V
VIL
Maximum Low−Level Input
Voltage
Vout = 0.1 V
|Iout| v 20 mA
2.0
3.0
4.5
6.0
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
0.5
0.9
1.35
1.8
V
VOH
Minimum High−Level Output
Voltage
Vin = VIH
|Iout| v 20 mA
2.0
4.5
6.0
1.9
4.4
5.9
1.9
4.4
5.9
1.9
4.4
5.9
V
3.0
4.5
6.0
2.48
3.98
5.48
2.34
3.84
5.34
2.2
3.7
5.2
Vin = VIH
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
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3
MC74HC157A
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DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
Symbol
VOL
Parameter
Test Conditions
Vin = VIL
|Iout| v 20 mA
Maximum Low−Level Output
Voltage
|Iout| v 2.4 mA
|Iout| v 6.0 mA
|Iout| v 7.8 mA
Vin = VIL
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
2.0
4.5
6.0
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
V
3.0
4.5
6.0
0.26
0.26
0.26
0.33
0.33
0.33
0.4
0.4
0.4
Iin
Maximum Input Leakage Current
Vin = VCC or GND
6.0
± 0.1
± 1.0
± 1.0
mA
IOZ
Maximum Three−State Leakage
Current
Output in High−Impedance State
Vin = VIL or VIH
Vout = VCC or GND
6.0
± 0.5
± 5.0
± 10
mA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND
Iout = 0 mA
6.0
4.0
40
160
mA
NOTE: Information on typical parametric values can be found in Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book
(DL129/D).
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AC ELECTRICAL CHARACTERISTICS (CL = 50 pF, Input tr = tf = 6.0 ns)
Guaranteed Limit
Symbol
Parameter
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
tPLH,
tPHL
Maximum Propagation Delay, Input A or B to Output Y
(Figures 1 and 4)
2.0
3.0
4.5
6.0
105
65
21
18
130
85
26
22
160
115
32
27
ns
tPLH,
tPHL
Maximum Propagation Delay, Select to Output Y
(Figures 2 and 4)
2.0
3.0
4.5
6.0
110
70
22
19
140
90
28
24
165
115
33
28
ns
tPLH,
tPHL
Maximum Propagation Delay, Output Enable to Output Y
(Figures 3 and 4)
2.0
3.0
4.5
6.0
100
60
20
17
125
80
25
21
150
110
30
26
ns
tTLH,
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 4)
2.0
3.0
4.5
6.0
75
27
15
13
95
32
19
16
110
36
22
19
ns
−
10
10
10
pF
Cin
Maximum Input Capacitance
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High−Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
CPD
33
Power Dissipation Capacitance (Per Package)*
* Used to determine the no−load dynamic power consumption: PD = CPD VCC
ON Semiconductor High−Speed CMOS Data Book (DL129/D).
2f + I
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4
CC
pF
VCC . For load considerations, see Chapter 2 of the
MC74HC157A
PIN DESCRIPTIONS
INPUTS
A0, A1, A2, A3 (Pins 2, 5, 11, 14)
The data present on these pins is in its noninverted form. For
the Output Enable input at a high level, the outputs are at a
low level.
Nibble A inputs. The data present on these pins is
transferred to the outputs when the Select input is at a low
level and the Output Enable input is at a low level. The data
is presented to the outputs in noninverted form.
CONTROL INPUTS
Select (Pin 1)
Nibble select. This input determines the data word to be
transferred to the outputs. A low level on this input selects
the A inputs and a high level selects the B inputs.
B0, B1, B2, B3 (Pins 3, 6, 10, 13)
Nibble B inputs. The data present on these pins is
transferred to the outputs when the Select input is at a high
level and the Output Enable input is at a low level. The data
is presented to the outputs in noninverted form.
Output Enable (Pin 15)
Output Enable input. A low level on this input allows the
selected input data to be presented at the outputs. A high
level on this input sets all outputs to a low level.
OUTPUTS
Y0, Y1, Y2, Y3 (Pins 4, 7, 9, 12)
Data outputs. The selected input Nibble is presented at
these outputs when the Output Enable input is at a low level.
SWITCHING WAVEFORMS
tr
tf
90%
50%
10%
INPUT A OR B
90%
50%
10%
tPLH
90%
50%
10%
OUTPUT Y
tf
SELECT
GND
tPHL
tPLH
tr
VCC
tTLH
tTHL
Figure 3. HC157A
tPHL
90%
50%
10%
OUTPUT Y
tTLH
VCC
tTHL
Figure 4. Y versus Selected, Noninverted
tr
tf
VCC
90%
50%
10%
OUTPUT
ENABLE
GND
tPLH
tPHL
90%
50%
10%
OUTPUT Y
tTHL
tTLH
Figure 5. HC157A
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
C L*
*Includes all probe and jig capacitance
Figure 6. Test Circuit
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5
GND
MC74HC157A
EXPANDED LOGIC DIAGRAM
A0
B0
A1
NIBBLE
OUTPUTS
B1
A2
B2
A3
B3
OUTPUT ENABLE
SELECT
2
4
3
Y0
5
7
6
Y1
11
9 Y2
10
14
12 Y3
13
15
1
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6
DATA
OUTPUTS
MC74HC157A
PACKAGE DIMENSIONS
PDIP−16
N SUFFIX
CASE 648−08
ISSUE T
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEADS
WHEN FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE
MOLD FLASH.
5. ROUNDED CORNERS OPTIONAL.
−A−
16
9
1
8
B
F
C
L
DIM
A
B
C
D
F
G
H
J
K
L
M
S
S
−T−
SEATING
PLANE
K
H
D
M
J
G
16 PL
0.25 (0.010)
T A
M
M
INCHES
MIN
MAX
0.740 0.770
0.250 0.270
0.145 0.175
0.015 0.021
0.040
0.70
0.100 BSC
0.050 BSC
0.008 0.015
0.110 0.130
0.295 0.305
0_
10 _
0.020 0.040
MILLIMETERS
MIN
MAX
18.80 19.55
6.35
6.85
3.69
4.44
0.39
0.53
1.02
1.77
2.54 BSC
1.27 BSC
0.21
0.38
2.80
3.30
7.50
7.74
0_
10 _
0.51
1.01
SOIC−16
D SUFFIX
CASE 751B−05
ISSUE J
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
−A−
16
9
−B−
1
P
8 PL
0.25 (0.010)
8
M
B
S
G
R
K
F
X 45 _
C
−T−
SEATING
PLANE
J
M
D
16 PL
0.25 (0.010)
M
T B
S
A
S
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7
DIM
A
B
C
D
F
G
J
K
M
P
R
MILLIMETERS
MIN
MAX
9.80
10.00
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0_
7_
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.386
0.393
0.150
0.157
0.054
0.068
0.014
0.019
0.016
0.049
0.050 BSC
0.008
0.009
0.004
0.009
0_
7_
0.229
0.244
0.010
0.019
MC74HC157A
PACKAGE DIMENSIONS
TSSOP−16
DT SUFFIX
CASE 948F−01
ISSUE A
16X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
V
S
S
S
ÇÇÇ
ÉÉÉ
ÇÇÇ
ÉÉÉ
ÇÇÇ
K
K1
2X
L/2
16
9
J1
B
−U−
L
SECTION N−N
J
PIN 1
IDENT.
8
1
N
0.15 (0.006) T U
S
0.25 (0.010)
A
−V−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD
FLASH. PROTRUSIONS OR GATE BURRS.
MOLD FLASH OR GATE BURRS SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION SHALL
NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
M
N
F
DETAIL E
−W−
C
0.10 (0.004)
−T− SEATING
PLANE
H
D
DETAIL E
G
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8
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
4.90
5.10
4.30
4.50
−−−
1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.18
0.28
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0_
8_
INCHES
MIN
MAX
0.193 0.200
0.169 0.177
−−− 0.047
0.002 0.006
0.020 0.030
0.026 BSC
0.007
0.011
0.004 0.008
0.004 0.006
0.007 0.012
0.007 0.010
0.252 BSC
0_
8_
MC74HC157A
PACKAGE DIMENSIONS
SOEIAJ−16
F SUFFIX
CASE 966−01
ISSUE O
16
LE
9
Q1
M_
E HE
1
8
L
DETAIL P
Z
D
e
VIEW P
A
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
A1
b
0.13 (0.005)
c
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
MEASURED AT THE PARTING LINE. MOLD FLASH
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
0.10 (0.004)
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9
MILLIMETERS
MIN
MAX
−−−
2.05
0.05
0.20
0.35
0.50
0.18
0.27
9.90
10.50
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
−−−
0.78
INCHES
MIN
MAX
−−− 0.081
0.002
0.008
0.014
0.020
0.007
0.011
0.390
0.413
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 _
0_
0.028
0.035
−−− 0.031
MC74HC157A
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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MC74HC157A/D
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