a 0.5 n CMOS 1.8 V to 5.5 V 2:1 Mux/SPDT Switches ADG819/ADG820 FEATURES Low On Resistance 0.8 n Max at 125°C 0.25 n Max On Resistance Flatness 1.8 V to 5.5 V Single Supply 200 mA Current Carrying Capability Automotive Temperature Range: –40°C to +125°C Rail-to-Rail Operation 6-Lead SOT-23 Package, 8-Lead /SOIC Package, and 6-Bump MicroCSP (Micro Chip Scale Package) ADG819 Fast Switching Times Typical Power Consumption (<0.01 /W) TTL-/CMOS-Compatible Inputs Pin Compatible with the ADG719 (ADG819) FUNCTIONAL BLOCK DIAGRAM ADG819/ ADG820 S2 D S1 IN SWITCHES SHOWN FOR A LOGIC “1” INPUT APPLICATIONS Power Routing Battery-Powered Systems Communication Systems Data Acquisition Systems Cellular Phones Modems PCMCIA Cards Hard Drives Relay Replacement GENERAL DESCRIPTION PRODUCT HIGHLIGHTS The ADG819 and the ADG820 are monolithic, CMOS, SPDT (single-pole, double-throw) switches. These switches are designed on a submicron process that provides low power dissipation yet gives high switching speed, low On resistance, and low leakage currents. 2. 1.8 V to 5.5 V single-supply operation Low power consumption and an operating supply range of 1.8 V to 5.5 V make the ADG819 and ADG820 ideal for battery-pow ered, portable instruments. 1. Very low ON resistance, 0.5 Ω typical 3. High current carrying capability 4. Tiny 6-lead SOT-23 package, 8-lead µSOIC package, and 2 × 3 bump 1.14 mm × 2.18 mm MicroCSP package (ADG819 only) Each switch of the ADG819 and the ADG820 conducts equally well in both directions when on. The ADG819 exhibits break before-make switching action, thus preventing momentary shorting when switching channels. The ADG820 exhibits make-before break action. The ADG819 and the ADG820 are available in a 6-lead SOT-23 package and an 8-lead µSOIC package. The ADG819 is also available in a 2 × 3 bump 1.14 mm × 2.18 mm MicroCSP package. This chip occupies only a 1.14 mm × 2.18 mm area, making it the ideal candidate for space-constrained applications. REV. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2002 ADG819/ADG820–SPECIFICATIONS1 (V Parameter 25°C ANALOG SWITCH Analog Signal Range ON Resistance (RON) DD = 5 V ± 10%, GND = 0 V.) –40°C to –40°C to +85°C +125°C2 0 V to VDD 0.5 0.6 ON Resistance Match Between Channels (∆RON) ON Resistance Flatness (RFLAT(ON)) LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH 0.06 0.08 0.1 0.17 ± 0.01 ± 0.25 ± 0.01 ± 0.25 0.7 0.8 0.1 0.12 0.2 0.25 Test Conditions/Comments V Ω typ Ω max VS = 0 V to VDD, IS = 100 mA; Test Circuit 1 Ω typ Ω max Ω typ Ω max VS = 0 V to VDD, IS = 100 mA VS = 0 V to VDD, IS = 100 mA VDD = 5.5 V VS = 4.5 V/1 V, VD = 1 V/4.5 V; Test Circuit 2 VS = VD = 1 V, or VS = VD = 4.5 V; Test Circuit 3 ±3 ± 10 ±3 ± 25 nA typ nA max nA typ nA max 2.0 0.8 V min V max ± 0.1 µA typ µA max pF typ VIN = VINL or VINH ns typ ns max ns typ ns max ns typ ns min RL = 50 Ω, CL = 35 pF, VS = 3 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 3 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS1 = VS2 = 3 V; Test Circuit 5 RL = 50 Ω, CL = 35 pF, VS = 3 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 3 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 0 V; Test Circuit 6 VS = 2.5 V, RS = 0 Ω, CL = 1 nF; Test Circuit 7 RL = 50 Ω, CL = 5 pF, f = 100 kHz; Test Circuit 8 RL = 50 Ω, CL = 5 pF, f = 100 kHz; Test Circuit 10 RL = 50 Ω, CL = 5 pF; Test Circuit 9 f = 1 MHz f = 1 MHz 0.005 CIN, Digital Input Capacitance Unit 5 3 DYNAMIC CHARACTERISTICS ADG819 tON tOFF Break-Before-Make Time Delay, tBBM 35 45 10 16 5 50 55 18 21 1 ADG820 tON Make-Before-Break Time Delay, tMBB 10 18 26 40 15 Charge Injection 20 ns typ ns max ns typ ns max ns typ ns min pC typ Off Isolation –71 dB typ Channel-to-Channel Crosstalk –72 dB typ Bandwidth –3 dB CS (OFF) CD, CS (ON) 17 80 300 MHz typ pF typ pF typ tOFF 20 22 45 50 1 VDD = 5.5 V Digital Inputs = 0 V or 5.5 V POWER REQUIREMENTS IDD 0.001 1.0 2.0 µA typ µA max NOTES 1 Temperature range is as follows: –40°C to +125°C. 2 ON resistance parameters tested with I S = 10 mA. 3 Guaranteed by design, not subject to production test. Specifications subject to change without notice. –2– REV. 0 ADG819/ADG820 SPECIFICATIONS1(V DD = 2.7 V to 3.6 V, GND = 0 V.) Parameter 25°C ANALOG SWITCH Analog Signal Range ON Resistance (RON) –40°C to –40°C to +85°C +125°C2 0 V to VDD 0.7 1.4 ON Resistance Match Between Channels (∆RON) 1.5 1.6 0.13 0.13 LEAKAGE CURRENTS Source OFF Leakage IS (OFF) Channel ON Leakage ID, IS (ON) DIGITAL INPUTS Input High Voltage, VINH Input Low Voltage, VINL Input Current IINL or IINH V Ω typ Ω max VS = 0 V to VDD, IS = 100 mA; Test Circuit 1 0.25 ± 0.01 ± 0.25 ± 0.01 ± 0.25 VS = 0 V to VDD, IS = 100 mA VS = 0 V to VDD, IS = 100 mA VDD = 3.6 V VS = 3.3 V/1 V, VD = 1 V/3.3 V; Test Circuit 2 VS = VD = 1 V, or VS = VD = 3.3 V; Test Circuit 3 ±3 ± 10 ±3 ± 25 nA typ nA max nA typ nA max 2.0 0.8 V min V max ± 0.1 µA typ µA max pF typ VIN = VINL or VINH ns typ ns max ns typ ns max ns typ ns min RL = 50 Ω, CL = 35 pF, VS = 1.5 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 1.5 V; Test Circuit RL = 50 Ω, CL = 35 pF, VS1 = VS2 = 1.5 V; Test Circuit 5 RL = 50 Ω, CL = 35 pF, VS = 1.5 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 1.5 V; Test Circuit 4 RL = 50 Ω, CL = 35 pF, VS = 1.5 V; Test Circuit 6 VS = 1.5 V, RS = 0 Ω, CL = 1 nF; Test Circuit 7 RL = 50 Ω, CL = 5 pF, f = 100 kHz; Test Circuit 8 RL = 50 Ω, CL = 5 pF, f = 100 kHz; Test Circuit 10 RL = 50 Ω, CL = 5 pF; Test Circuit 9 f = 1 MHz f = 1 MHz 0.005 5 CIN, Digital Input Capacitance Test Conditions/Comments Ω typ Ω max Ω typ 0.06 ON Resistance Flatness (RFLAT(ON)) Unit 3 DYNAMIC CHARACTERISTICS ADG819 tON tOFF Break-Before-Make Time Delay, tBBM 40 60 10 16 40 65 70 18 21 1 ADG820 tON Make-Before-Break Time Delay, tMBB 20 35 30 45 10 Charge Injection 10 ns typ ns max ns typ ns max ns typ ns min pC typ Off Isolation –71 dB typ Channel-to-Channel Crosstalk –72 dB typ Bandwidth –3 dB CS (OFF) CD, CS (ON) 17 80 300 MHz typ pF typ pF typ tOFF 40 45 50 55 1 POWER REQUIREMENTS IDD VDD = 3.6 V Digital Inputs = 0 V or 3.6 V 0.001 1.0 2.0 NOTES 1 Temperature range is as follows: –40°C to +125°C. 2 ON resistance parameters tested with I S = 10 mA. 3 Guaranteed by design, not subject to production test. Specifications subject to change without notice. REV. 0 –3– µA typ µA max ADG819/ADG820 ABSOLUTE MAXIMUM RATINGS 1 MicroCSP Package !JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . . . TBD Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . 300°C IR Reflow, Peak Temperature (<20 sec) . . . . . . . . . . . 235°C (TA = 25°C, unless otherwise noted.) VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V Analog Inputs2 . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V or . . . . . . . . . . . . . . . . . . . . . . . 30 mA, Whichever Occurs First Digital Inputs2 . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V or . . . . . . . . . . . . . . . . . . . . . . . 30 mA, Whichever Occurs First Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . 400 mA . . . . . . . . . . . . . . . . (Pulsed at 1 ms, 10% Duty Cycle Max) Continuous Current, S or D . . . . . . . . . . . . . . . . . . . 200 mA Operating Temperature Range Industrial . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C Automotive . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +125°C Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . 150°C µSOIC Package !JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 206°C/W !JC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 44°C/W SOT-23 Package (4-Layer Board) !JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 119°C/W NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause perma nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time. 2 Overvoltages at IN, S, or D will be clamped by internal diodes. Current should be limited to the maximum ratings given. Table I. Truth Table for the ADG819/ADG820 IN Switch S1 Switch S2 0 1 ON OFF OFF ON PIN CONFIGURATIONS 8-Lead µSOIC (RM-8) 6-Lead SOT-23 (RJ-6) 2 X 3 MicroCSP TOP VIEW (BUMPS AT THE BOTTOM) NOT TO SCALE IN 1 VDD 2 ADG819/ ADG820 6 S2 D 1 5 D S1 2 TOP VIEW GND 3 (Not to Scale) 4 S1 8 S2 7 NC 1 6 TOP VIEW 6 IN (Not to Scale) 5 NC VDD 4 D VDD ADG819/ ADG820 GND 3 NC = NO CONNECT S2 IN 2 5 S1 GND 3 4 ADG819 ONLY ORDERING GUIDE Model Option Temperature Range Brand1 Package Description Package ADG819BRM ADG819BRT ADG819BCB ADG820BRM ADG820BRT –40°C to +125°C –40°C to +125°C –40°C to +85°C –40°C to +125°C –40°C to +125°C SNB SNB SNB SPB SPB µSOIC (MicroSmall Outline IC) SOT-23 (Plastic Surface-Mount) MicroCSP (Micro Chip Scale Package) µSOIC (MicroSmall Outline IC) SOT-23 (Plastic Surface-Mount) RM-8 RJ-62 CB-62 RM-8 RJ-62 NOTES 1 Branding on these packages is limited to three characters due to space constraints. 2 Contact factory for availability. –4– REV. 0 ADG819/ADG820 TERMINOLOGY VDD GND IDD S D IN RON ∆RON RFLAT(ON) IS (OFF) ID, IS (ON) VD (VS) VINL VINH IINL(IINH) CS (OFF) CD, CS (ON) tON tOFF tBBM tMBB Charge Injection Crosstalk OFF Isolation Bandwidth ON Response Insertion Loss Most Positive Power Supply Potential Ground (0 V) Reference Positive Supply Current Source Terminal. May be an input or output. Drain Terminal. May be an input or output. Logic Control Input Ohmic Resistance between D and S ON Resistance Match between Any Two Channels, i.e., RON max – RON min Flatness is defined as the difference between the maximum and minimum value of ON resistance as measured over the specified analog signal range. Source Leakage Current with the Switch OFF Channel Leakage Current with the Switch ON Analog Voltage on Terminals D, S Maximum Input Voltage for Logic “0” Minimum Input Voltage for Logic “1” Input Current of the Digital Input OFF Switch Source Capacitance ON Switch Capacitance Delay between applying the digital control input and the output switching ON. Delay between applying the digital control input and the output switching OFF. OFF time or ON time measured between the 90% points of both switches when switching from one address state to another. ON time measured between the 80% points of both switches when switching from one address state to another. A measure of the glitch impulse transferred from the digital input to the analog output during switching. A measure of unwanted signal coupled through from one channel to another as a result of parasitic capacitance. A measure of unwanted signal coupling through an OFF switch. Frequency at which the output is attenuated by –3 dB. Frequency Response of the ON Switch Loss due to the ON Resistance of the Switch CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG819/ ADG820 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. REV. 0 –5– WARNING! ESD SENSITIVE DEVICE ADG819/ADG820 –Typical Performance Characteristics 1.0 1.0 VDD = 3V TA = 25°C 0.9 VDD = 2.7V TA = +125°C 0.8 0.8 0.7 ON RESISTANCE – n ON RESISTANCE – n TA = +85°C VDD = 3V 0.6 0.5 VDD = 3.3V 0.4 VDD = 4.5V VDD = 5V 0.3 0.6 TA = +25°C 0.4 TA = –40°C VDD = 5.5V 0.2 0.2 0.1 0 0 1 2 3 4 0 0 5 0.5 1.0 1.5 2.5 3.0 TPC 4. ON Resistance vs. VD (VS) for Different Temperatures TPC 1. ON Resistance vs. VD (VS) 10 1.0 TA = 25°C 9 VDD = 1.8V VDD = 5V 8 0.8 ON RESISTANCE – n ON RESISTANCE – n 2.0 VD, VS – V VD, VS – V 7 6 5 4 3 TA = +125°C TA = +85°C 0.6 0.4 TA = +25°C TA = –40°C 2 0.2 1 0 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 0 0 1.8 1 2 VD, VS – V 3 4 5 VD, VS – V TPC 2. ON Resistance vs. VD (VS) TPC 5. ON Resistance vs. VD (VS) for Different Temperatures 50 10 VDD = 3V, 5V 40 VDD = 3V tON VDD = 5V 6 TIME – ns LEAKAGE CURRENTS – nA 8 4 ID, IS (ON) 30 20 2 –2 0 10 IS (OFF) 0 20 40 60 80 100 0 –40 120 TEMPERATURE – °C VDD = 3V, 5V tOFF –20 0 20 40 60 80 100 120 TEMPERATURE – °C TPC 3. Leakage Currents vs. Temperatures TPC 6. tON/tOFF Times vs. Temperature (ADG819) –6– REV. 0 ADG819/ADG820 250 1 VDD = 3V, 5V TA = 25°C TA = 25°C 0 150 ATTENUATION – dB CHARGE INJECTION – pC 200 100 VDD = 5V 50 VDD = 3V 0 –50 –1 –2 –3 –4 –100 –5 –150 –200 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 –6 0.2 5.0 1 FREQUENCY – MHz TPC 7. Charge Injection vs. Source Voltage TPC 10. ON Response vs. Frequency 0 1.8 VDD = 5V, 3V –10 TA = 25°C TA = 25°C LOGIC THRESHOLD VOLTAGE – V 1.6 ATTENUATION – dB –20 –30 –40 –50 –60 –70 –80 1 RISING 1.2 FALLING 1.0 0.8 0.6 0.4 0 2 FREQUENCY – MHz 1 2 3 4 5 TPC 11. Logic Threshold vs. Supply Voltage 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 0.1 0 VDD – V TPC 8. OFF Isolation vs. Frequency ATTENUATION – dB 1.4 0.2 –90 0.1 1 2 FREQUENCY – MHz TPC 9. Crosstalk vs. Frequency REV. 0 30 10 VS – V –7– 6 ADG819/ADG820 Test Circuits IDS V1 S VS IS (OFF) D D Test Circuit 1. ON Resistance S NC VD VS RON = V1 / IOS ID (ON) ID (OFF) S D NC = NO CONNECT VD Test Circuit 3. ON Leakage Test Circuit 2. OFF Leakage VDD 0.1/F VIN VDD 50% 90% VOUT VS RL 50n IN 50% 90% CL 35pF t OFF t ON GND Test Circuit 4. Switching Times VDD 0.1/F VDD VS1 VS2 S1 VIN D VOUT RL 50n S2 IN VOUT CL 35pF 90% 0V 50% 90% t BBM GND VIN 50% 0V t BBM Test Circuit 5. Break-Before-Make Time Delay, tBBM (ADG819 Only) VDD 0.1/F VIN VDD VS1 VD VS2 IN VIN RL2 300n RL1 300n CL2 35pF CL1 35pF VS1 VS2 0V 50% 50% 90% 80% VD 80% VD t MBB GND Test Circuit 6. Make-Before-Break Time Delay, tMBB (ADG820 Only) –8– REV. 0 ADG819/ADG820 VDD VOUT VOUT QINJ = CL X VDD RS VS SW OFF VOUT VIN CL 1nF IN SW OFF SW ON SW ON VIN GND SW OFF Test Circuit 7. Charge Injection VDD 0.1/F VDD NETWORK ANALYZER S IN 50n 50n VS VOUT D RL 50n GND VIN OFF ISOLATION = 20 LOG VOUT VS Test Circuit 8. OFF Isolation VDD 0.1/F VDD NETWORK ANALYZER S IN 50n VS VOUT D RL 50n GND VIN VOUT WITH SWITCH INSERTION LOSS = 20 LOG VOUT WITHOUT SWITCH Test Circuit 9. Bandwidth VDD 0.1/F NETWORK ANALYZER VDD S1 VOUT RL 50n 50n D R 50n S2 IN VS GND CHANNEL-TO-CHANNEL CROSSTALK = 20 LOG VOUT VS Test Circuit 10. Channel-to-Channel Crosstalk REV. 0 –9– VOUT SW OFF ADG819/ADG820 OUTLINE DIMENSIONS 6-Lead Plastic Surface-Mount Package (RJ-6) Dimensions shown in inches and (mm) 0.1220 (3.10) 0.1063 (2.70) 6 5 4 0.0709 (1.80) 0.0591 (1.50) 0.1181 (3.00) 0.0984 (2.50) 1 2 3 PIN 1 0.0374 (0.95) BSC 0.0748 (1.90) BSC 0.0512 (1.30) 0.0354 (0.90) 0.0571 (1.45) 0.0354 (0.90) 10° 0° 0.0197 (0.50) SEATING 0.0091 (0.23) 0.0098 (0.25) PLANE 0.0031 (0.08) 0.0059 (0.15) 0.0000 (0.00) COPLANARITY 0.0217 (0.55) 0.0138 (0.35) 8-Lead /SOIC Package (RM-8) Dimensions shown in inches and (mm) 0.1220 (3.10) 0.1142 (2.90) 8 5 0.1988 (5.05) 0.1870 (4.75) 0.1220 (3.10) 0.1142 (2.90) 1 4 PIN 1 0.0256 (0.65) BSC 0.1201 (3.05) 0.1118 (2.84) COPLANARITY 0.0059 (0.15) 0.0020 (0.05) 0.1201 (3.05) 0.1118 (2.84) 0.0429 (1.09) 0.0370 (0.94) 0.0181 (0.46) 0.0079 (0.20) SEATING PLANE 0.0110 (0.28) 0.0031 (0.08) 33° 27° 0.0280 (0.71) 0.0161 (0.41) 2 × 3 Array for MicroCSP (CB-6) Dimensions shown in millimeters and (inches) 0.44 (0.0173) 0.36 (0.0142) 0.28 (0.0110) 1.34 (0.0528) 1.14 (0.0449) 0.94 (0.0370) PIN 1 IDENTIFIER 0.67 (0.0264) 0.57 (0.0224) 0.47 (0.0185) SEATING PLANE 0.32 (0.0126) 0.32 (0.0126) NOM 0.50 (0.0197) BALL PITCH 2.38 (0.0937) 2.18 (0.0858) 1.98 (0.0780) 0.59 (0.0232) 0.24 (0.0094) 0.22 (0.0087) COPLANARITY 0.20 (0.0079) 0.50 (0.0860) CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN –10– REV. 0 –11– –12– PRINTED IN U.S.A. C02801–0–5/02(0)