C2012X6S1H475K125AC TDK Item Description : C2012X6S1H475KT**** DC Bias Characteristic 20 Application & Main Feature 0 Cap. Change/% Commercial Grade ( General (Up to 50V) ) Series C2012 [EIA CC0805] -20 -40 -60 -80 -100 0 10 20 30 40 50 60 DC Bias/V 2.00mm 1.25mm 1.25mm 0.20mm 0.50mm +/-0.2mm +/-0.2mm +/-0.2mm Min. Min. Temperature Characteristic Temperature Characteristics 20 10 100 0 10 1 0.1 0.01 Rated Voltage 0.001 0.001 0.1 -30 -40 -50 -60 -70 1 10 100 -80 1000 -60 -40 |Z| Capacitance Tolerance ESR 20 40 60 80 100 120 TCBias(1/2Rated) Ripple Temperature Rise Characteristics 25 Temperature Rise/degC 100 Dissipation Factor 7.5% Max. 10 AEC-Q200 Not Applicable 20 15 10 5 0 1 0.001 0 Temp.Chara. Cap. vs. Freq. Characteristic K (+/-10%) -20 Temperature/degC Frequency/MHz 4.7uF 106Mohm Min. -20 -90 0.01 Capacitance Insulation Resistance -10 -80 1H (50Vdc) Cap./uF Characterization Sheet ( Multilayer Ceramic Chip Capacitors ) X6S (-55 to 105 degC +/-22%) |Z|, ESR vs. Freq. Characteristics 1000 Cap. Change/% L W T B G |Z|, ESR/ohm Dimensions 0.01 0.1 1 10 100 1000 0 1 2 100kHz All specifications are subject to change without notice. 3 4 5 Current/Arms Frequency/MHz 500kHz 1MHz January 3, 2016