NB2304A 3.3 V Zero Delay Clock Buffer The NB2304A is a versatile, 3.3 V zero delay buffer designed to distribute high−speed clocks in PC, workstation, datacom, telecom and other high−performance applications. It is available in an 8 pin package. The part has an on−chip PLL which locks to an input clock presented on the REF pin. The PLL feedback is required to be driven to FBK pin, and can be obtained from one of the outputs. The input−to−output propagation delay is guaranteed to be less than 250 ps, and the output−to−output skew is guaranteed to be less than 200 ps. The NB2304A has two Banks of two outputs each. Multiple NB2304A devices can accept the same input clock and distribute it. In this case, the skew between the outputs of the two devices is guaranteed to be less than 500 ps. The NB2304A is available in two different configurations (Refer to NB2304A Configurations Table). The NB2304Ax1* is the base part, where the output frequencies equal the reference if there is no counter in the feedback path. The NB2304Ax1H is the high−drive version of the −1 and the rise and fall times on this device are much faster. The NB2304Ax2 allows the user to obtain REF, 1/2 X and 2X frequencies on each output Bank. The exact configuration and output frequencies depend on which output drives the feedback pin. Features http://onsemi.com MARKING DIAGRAM* 8 SOIC−8 D SUFFIX CASE 751 8 1 1 XXXX A L Y W G XXXX ALYW G = Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package *For additional marking information, refer to Application Note AND8002/D. • Zero Input − Output Propagation Delay, Adjustable by Capacitive • • • • • • • • • • • • Load on FBK Input Multiple Configurations − Refer to NB2304A Configurations Table Input Frequency Range: 15 MHz to 133 MHz Multiple Low−Skew Outputs Output−Output Skew < 200 ps Device−Device Skew < 500 ps Two Banks of Four Outputs Less than 200 ps Cycle−to−Cycle Jitter (−1, −1H, −5H) Available in Space Saving, 8 pin 150 mil SOIC Package 3.3 V Operation Advanced 0.35 m CMOS Technology Industrial Temperature Available These are Pb−Free Devices ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 9 of this data sheet. *x = C for Commercial; I for Industrial. © Semiconductor Components Industries, LLC, 2006 November, 2006 − Rev. 5 1 Publication Order Number: NB2304A/D NB2304A FBK CLKA1 PLL REF CLKA2 Extra Divider (−2) B2 CLKB1 CLKB2 Figure 1. Basic Block Diagram (see Figures 11 and 12 for device specific Block Diagrams) Table 1. CONFIGURATIONS (x = C for Commercial; I for Industrial) Device Feedback From Bank A Frequency Bank B Frequency NB2304Ax1 Bank A or Bank B Reference Reference NB2304Ax1H Bank A or Bank B Reference Reference NB2304Ax2 Bank A Reference Reference B2 NB2304Ax2 Bank B 2 X Reference Reference REF 1 CLKA1 2 8 FBK 7 VDD NB2304A Table 2. PIN DESCRIPTION CLKA2 3 6 CLKB2 GND 4 5 CLKB1 Figure 2. Pin Configuration Pin # Pin Name Description 1 REF (Note 1) Input reference frequency, 5 V tolerant input. 2 CLKA1 (Note 2) Buffered clock output, Bank A. 3 CLKA2 (Note 2) Buffered clock output, Bank A. 4 GND 5 CLKB1 (Note 2) Buffered clock output, Bank B. 6 CLKB2 (Note 2) Buffered clock output, Bank B. Ground. 7 VDD 3.3 V supply. 8 FBK PLL feedback input. 1. Weak pulldown. 2. Weak pulldown on all outputs. http://onsemi.com 2 NB2304A Table 3. MAXIMUM RATINGS Parameter Min Max Unit Supply Voltage to Ground Potential −0.5 +7.0 V DC Input Voltage (Except REF) −0.5 VDD + 0.5 V DC Input Voltage (REF) −0.5 7 V Storage Temperature −65 +150 °C Maximum Soldering Temperature (10 sec) 260 °C Junction Temperature 150 °C > 2000 V Static Discharge Voltage (per MIL−STD−883, Method 3015) Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. Table 4. OPERATING CONDITIONS FOR COMMERCIAL AND INDUSTRIAL TEMPERATURE DEVICES Parameter Description Min Max Unit 3.0 3.6 V 0 −40 70 85 °C VDD Supply Voltage TA Operating Temperature (Ambient Temperature) CL Load Capacitance, 15 MHz to 100 MHz 30 pF CL Load Capacitance, from 100 MHz to 133 MHz 15 pF CIN Input Capacitance (Note 3) 7 pF Commercial Industrial 3. Applies to both REF Clock and FBK. Table 5. ELECTRICAL CHARACTERISTICS FOR COMMERCIAL TEMPERATURE DEVICES Parameter Description Test Conditions Min Max Unit 0.8 V VIL Input LOW Voltage VIH Input HIGH Voltage IIL Input LOW Current VIN = 0 V 50.0 mA IIH Input HIGH Current VIN = VDD 100.0 mA VOL Output LOW Voltage IOL = 8 mA (−1, −2) IOL = 12 mA (−1H) 0.4 V VOH Output HIGH Voltage IOH = −8 mA (−1, −2) IOH = −12 mA (−1H) IDD Supply Current Unloaded outputs 100 MHz REF Select inputs at VDD or GND 45 Unloaded outputs, 66 MHz REF (−1, −2) 32 Unloaded outputs, 33 MHz REF (−1, −2) 18 2.0 http://onsemi.com 3 V 2.4 V mA NB2304A Table 6. SWITCHING CHARACTERISTICS FOR COMMERCIAL TEMPERATURE DEVICES Parameter t1 t3 Description Test Conditions Min Output Frequency 30 pF load (all devices) 15 pF load (−1, −2) Duty Cycle = (t2 / t1) * 100 (all devices) Measured at 1.4 V, FOUT = 66.66 MHz 30 pF load 40.0 Measured at 1.4 V, FOUT v 50 MHz 15 pF load 45.0 Output Rise Time (−1, −2) Typ Max Unit 133 133.3 MHz 50.0 60.0 % 50.0 55.0 15 15 ns Measured between 0.8 V and 2.0 V 30 pF load 2.20 Measured between 0.8 V and 2.0 V 15 pF load 1.50 Output Rise Time (−1H) Measured between 0.8 V and 2.0 V 30 pF load 1.50 Output Fall Time (−1, −2) Measured between 2.0 V and 0.8 V 30 pF load 2.20 Measured between 2.0 V and 0.8 V 15 pF load 1.50 Output Fall Time (−1H) Measured between 2.0 V and 0.8 V 30 pF load 1.25 Output−to−Output Skew on same Bank (−1, −2) All outputs equally loaded 200 Output−to−Output Skew (−1H) All outputs equally loaded 200 Output Bank A−to−Output Bank B Skew (−1) All outputs equally loaded 200 Output Bank A−to−Output Bank B Skew (−2) All outputs equally loaded 400 t6 Delay, REF Rising Edge to FBK Rising Edge Measured at VDD/2 0 ±250 ps t7 Device−to−Device Skew Measured at VDD/2 on the FBK pins of the device 0 500 ps t8 Output Slew Rate Measured between 0.8 V and 2.0 V using Test Circuit #2 tJ Cycle−to−Cycle Jitter (−1, −1H) Measured at 66.67 MHz, loaded outputs, 15 pF load 175 Measured at 66.67 MHz, loaded outputs, 30 pF load 200 Measured at 133.3 MHz, loaded outputs, 15 pF load 100 Measured at 66.67 MHz, loaded outputs, 30 pF load 400 Measured at 66.67 MHz, loaded outputs, 15 pF load 375 Stable power supply, valid clock presented on REF and FBK pins 1.0 t4 t5 Cycle−to−Cycle Jitter (−2) tLOCK PLL Lock Time http://onsemi.com 4 1 ns ps V/ns ps ps ms NB2304A Table 7. ELECTRICAL CHARACTERISTICS FOR INDUSTRIAL TEMPERATURE DEVICES Parameter Description Test Conditions Min Max Unit 0.8 V VIL Input LOW Voltage VIH Input HIGH Voltage IIL Input LOW Current VIN = 0 V 50.0 mA IIH Input HIGH Current VIN = VDD 100.0 mA VOL Output LOW Voltage IOL = 8 mA (−1, −2) IOL = 12 mA (−1H) 0.4 V VOH Output HIGH Voltage IOH = −8 mA (−1, −2) IOH = −12 mA (−1H) IDD Supply Current Unloaded outputs 100 MHz REF Select inputs at VDD or GND 45 Unloaded outputs, 66 MHz REF (−1, −2) 35 Unloaded outputs, 33 MHz REF (−1, −2) 20 2.0 http://onsemi.com 5 V 2.4 V mA NB2304A Table 8. SWITCHING CHARACTERISTICS FOR INDUSTRIAL TEMPERATURE DEVICES (All parameters are specified with loaded outputs) Parameter Description Test Conditions Min Typ Unit 100 133.3 MHz % t1 Output Frequency 30 pF load (all devices) 15 pF load (−1, −2) t1 Duty Cycle = (t2 / t1) * 100 (all devices) Measured at 1.4 V, FOUT v 66.66 MHz 30 pF load 40.0 50.0 60.0 Measured at 1.4 V, FOUT v 50 MHz 15 pF load 45.0 50.0 55.0 t3 Output Rise Time (−1, −2) 15 15 Max ns Measured between 0.8 V and 2.0 V 30 pF load 2.50 Measured between 0.8 V and 2.0 V 15 pF load 1.50 Output Rise Time (−1H) Measured between 0.8 V and 2.0 V 30 pF load 1.50 Output Fall Time (−1, −2) Measured between 2.0 V and 0.8 V 30 pF load 2.50 Measured between 2.0 V and 0.8 V 15 pF load 1.50 Output Fall Time (−1H) Measured between 2.0 V and 0.8 V 30 pF load 1.25 Output−to−Output Skew on same Bank (−1, −2) All outputs equally loaded 200 Output−to−Output Skew (−1H) All outputs equally loaded 200 Output Bank A−to−Output Bank B skew (−1) All outputs equally loaded 200 Output Bank A−to−Output Bank B skew (−2) All outputs equally loaded 400 t6 Delay, REF Rising Edge to FBK Rising Edge Measured at VDD/2 0 ±250 ps t7 Device−to−Device Skew Measured at VDD/2 on the FBK pins of the device 0 500 ps t8 Output Slew Rate Measured between 0.8 V and 2.0 V using Test Circuit #2 tJ Cycle−to−Cycle Jitter (−1, −1H) Measured at 66.67 MHz, loaded outputs, 15 pF load 180 Measured at 66.67 MHz, loaded outputs, 30 pF load 200 Measured at 133.3 MHz, loaded outputs, 15 pF load 100 Measured at 66.67 MHz, loaded outputs, 30 pF load 400 Measured at 66.67 MHz, loaded outputs, 15 pF load 380 Stable power supply, valid clock presented on REF and FBK pins 1.0 t4 t5 Cycle−to−Cycle Jitter (−2) tLOCK PLL Lock Time http://onsemi.com 6 1 ns ps V/ns ps ps ms NB2304A Zero Delay and Skew Control To close the feedback loop of the NB2304A, the FBK pin can be driven from any of the four available output pins. The output driving the FBK pin will be driving a total load of 7 pF plus any additional load that it drives. The relative loading of this output (with respect to the remaining outputs) can adjust the input output delay. This is shown in Figure 3. For applications requiring zero input−output delay, all outputs including the one providing feedback should be equally loaded. If input−output delay adjustments are required, use Figure 3 to calculate loading differences between the feedback output and remaining outputs. For zero output−output skew, be sure to load outputs equally. For applications requiring zero input−output delay, all outputs must be equally loaded. REF INPUT TO CLKA/CLKB DELAY (ps) 1500 1000 500 0 −500 −1000 −1500 −30 −25 −20 −15 −10 −5 0 5 10 15 20 25 30 OUTPUT LOAD DIFFERENCE: FBK LOAD − CLKA/CLKB LOAD (pF) Figure 3. REF Input to CLKA/CLKB Delay vs. Difference in Loading between FBK Pin and CLKA/CLKB Pins SWITCHING WAVEFORMS t1 t2 1.4 V 1.4 V 0.8 V 0.8 V OUTPUT t3 Figure 4. Duty Cycle Timing OUTPUT 0V t4 Figure 5. All Outputs Rise/Fall Time 1.4 V V DD 2 INPUT 1.4 V OUTPUT 3.3 V 2.0 V 2.0 V 1.4 V V DD 2 OUTPUT t6 t5 Figure 6. Output − Output Skew Figure 7. Input − Output Propagation Delay V DD 2 FBK_Device 1 V DD 2 FBK_Device 2 t7 Figure 8. Device − Device Skew http://onsemi.com 7 NB2304A TEST CIRCUITS VDD VDD 0.1 mF VDD OUTPUTS 0.1 mF CLOAD GND OUTPUTS 1 kW VDD 0.1 mF 1 kW 10 pF VDD 0.1 mF GND Figure 9. Test Circuit #1 GND GND Figure 10. Test Circuit #2 For parameter t8 (output slew rate) on −1H devices BLOCK DIAGRAMS FBK FBK CLKA1 CLKA1 CLKA2 REF CLKA2 REF PLL B2 PLL CLKB1 CLKB1 CLKB2 CLKB2 Figure 11. NB2304Ax1 and NB2304Ax1H Figure 12. NB2304Ax2 http://onsemi.com 8 NB2304A ORDERING INFORMATION Marking Operating Range Package Shipping† NB2304AC1DG 4C1 Commercial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AC1DR2G 4C1 Commercial SOIC−8 (Pb−Free) 2500 Tape & Reel NB2304AI1DG 4I1 Industrial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AI1DR2G 4I1 Industrial SOIC−8 (Pb−Free) 2500 Tape & Reel NB2304AC1HDG 4C1H Commercial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AC1HDR2G 4C1H Commercial SOIC−8 (Pb−Free) 2500 Tape & Reel NB2304AI1HDG 4I1H Industrial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AI1HDR2G 4I1H Industrial SOIC−8 (Pb−Free) 2500 Tape & Reel NB2304AC2DG 4C2 Commercial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AC2DR2G 4C2 Commercial SOIC−8 (Pb−Free) 2500 Tape & Reel NB2304AI2DG 4I2 Industrial SOIC−8 (Pb−Free) 98 Units / Rail NB2304AI2DR2G 4I2 Industrial SOIC−8 (Pb−Free) 2500 Tape & Reel Device Availability Now Now Now Now Now Now Now Now Now Now Now Now †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 9 NB2304A PACKAGE DIMENSIONS SOIC−8 NB CASE 751−07 ISSUE AG −X− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A AND B DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 (0.006) PER SIDE. 5. DIMENSION D DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.127 (0.005) TOTAL IN EXCESS OF THE D DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. 751−01 THRU 751−06 ARE OBSOLETE. NEW STANDARD IS 751−07. A 8 5 S B 1 0.25 (0.010) M Y M 4 −Y− K G C N DIM A B C D G H J K M N S X 45 _ SEATING PLANE −Z− H 0.10 (0.004) D 0.25 (0.010) M Z Y S X M J S MILLIMETERS MIN MAX 4.80 5.00 3.80 4.00 1.35 1.75 0.33 0.51 1.27 BSC 0.10 0.25 0.19 0.25 0.40 1.27 0_ 8_ 0.25 0.50 5.80 6.20 INCHES MIN MAX 0.189 0.197 0.150 0.157 0.053 0.069 0.013 0.020 0.050 BSC 0.004 0.010 0.007 0.010 0.016 0.050 0 _ 8 _ 0.010 0.020 0.228 0.244 SOLDERING FOOTPRINT* 1.52 0.060 7.0 0.275 4.0 0.155 0.6 0.024 1.270 0.050 SCALE 6:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. Licensed under US patent Nos 5,488,627, 6,646,463 and 5,631,920. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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