HP ATF-541M4-BLK Low noise enhancement mode pseudomorphic hemt in a miniature leadless package Datasheet

Agilent ATF-541M4 Low Noise
Enhancement Mode
Pseudomorphic HEMT in a
Miniature Leadless Package
Data Sheet
Features
• High linearity performance
• Single Supply Enhancement Mode
Technology[1]
• Very low noise figure
Description
Agilent Technologies’s
ATF-541M4 is a high linearity,
low noise, single supply
E-PHEMT housed in a miniature
leadless package.
The ATF-541M4’s small size and
low profile makes it ideal for the
design of hybrid module and
other space-constraint devices.
The device can be used in applications such as TMA and front
end LNA for Cellular/PCS and
WCDMA base stations, LNA and
driver amplifiers for Wireless
Data and 802.11b WLAN.
In addition, the device’s superior
RF performance at higher
frequency makes it an ideal
candidate for high frequency
applications such as WLL,
802.11a WLAN, 5–6 GHz UNII
and HIPERLAN applications.
MiniPak 1.4 mm x 1.2 mm Package
Rx
• Excellent uniformity in product
specifications
• 800 micron gate width
• Miniature leadless package
1.4 mm x 1.2 mm x 0.7 mm
• Tape-and-Reel packaging option
available
Specifications
2 GHz; 3V, 60 mA (Typ.)
Pin Connections and
Package Marking
Source
Pin 3
Gate
Pin 2
Rx
• 35.8 dBm output 3rd order intercept
Drain
Pin 4
• 21.4 dBm output power at 1 dB gain
compression
• 0.5 dB noise figure
Source
Pin 1
Note:
Top View. Package marking provides orientation,
product identification and date code.
“R” = Device Type Code
“x” = Date code character. A different
character is assigned for each month and
year.
• 17.5 dB associated gain
Applications
• Low Noise Amplifier and Driver
Amplifier for Cellular/PCS and
WCDMA Base Stations
• LNA and Driver Amplifier for
WLAN, WLL/RLL and MMDS
applications
• General purpose discrete E-PHEMT
for ultra low noise applications in
the 450 MHz to 10 GHz frequency
range
Note:
1. Enhancement mode technology requires
positive Vgs, thereby eliminating the need for
the negative gate voltage associated with
conventional depletion mode devices.
ATF-541M4 Absolute Maximum Ratings [1]
Symbol
Parameter
Units
Absolute
Maximum
VDS
Drain-Source Voltage [2]
V
5
VGS
Gate-Source Voltage [2]
V
-5 to 1
VGD
Gate Drain Voltage [2]
V
-5 to 1
IDS
Drain Current [2]
mA
120
IGS
Gate Current [5]
mA
2
Pdiss
Total Power Dissipation [3]
mW
360
Pin max.
RF Input Power[5]
dBm
13
TCH
Channel Temperature
°C
150
TSTG
Storage Temperature
°C
-65 to 150
θjc
Thermal Resistance [4]
°C/W
212
120
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Assumes DC quiescent conditions.
3. Source lead temperature is 25°C. Derate
4.7 mW/°C for TL > 74°C.
4. Thermal resistance measured using
150°C Liquid Crystal Measurement method.
5. The device can handle +13 dBm RF Input
Power provided IGS is limited to 2 mA. IGS at
P1dB drive level is bias circuit dependent. See
applications section for additional information.
0.7V
100
0.6V
IDS (mA)
80
60
0.5V
40
20
0
0.4V
0.3V
0
1
2
3
4
VDS (V)
5
6
7
Figure 1. Typical I-V Curves.
(VGS = 0.1 V per step)
Product Consistency Distribution Charts [6, 7]
320
320
300
Cpk = 1.16
Stdev = 0.30
Cpk = 0.85
Stdev = 1.14
Cpk = 1.72
Stdev = 0.072
250
240
240
200
-3 Std
160
160
80
80
-3 Std
+3 Std
+3 Std
150
100
50
0
0
29
32
35
38
OIP3 (dBm)
Figure 2. OIP3 @ 2 GHz, 3 V, 60 mA.
LSL = 33.0, Nominal = 35.82
41
15
16
17
18
GAIN (dB)
19
Figure 3. Gain @ 2 GHz, 3 V, 60 mA.
LSL = 15.5, Nominal = 17.5, USL = 18.5
20
0
0.3
0.5
0.7
0.9
1.1
NF (dB)
Figure 4. NF @ 2 GHz, 3 V, 60 mA.
Nominal = 0.5, USL = 0.9
Notes:
6. Distribution data sample size is 500 samples taken from 6 different wafers. Future wafers allocated to this product may have nominal values anywhere
between the upper and lower limits.
7. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based on
production test equipment. Circuit losses have been de-embedded from actual measurements.
2
ATF-541M4 Electrical Specifications
TA = 25°C, RF parameters measured in a test circuit for a typical device
Symbol
Parameter and Test Condition
Units
Min.
Typ.
Max.
Vgs
Operational Gate Voltage
Vds = 3V, Ids = 60 mA
V
0.4
0.58
0.75
Vth
Threshold Voltage
Vds = 3V, Ids = 4 mA
V
0.18
0.36
0.52
Idss
Saturated Drain Current
Vds = 3V, Vgs = 0V
µA
—
0.28
5
Gm
Transconductance
Vds = 3V, gm = ∆Idss/∆Vgs;
∆Vgs = 0.75 – 0.7 = 0.05V
mmho
230
398
560
Igss
Gate Leakage Current
Vgd = Vgs = -3V
µA
—
—
200
NF
Noise
Figure [1]
f = 2 GHz
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
dB
dB
—
—
0.5
0.5
0.9
—
Gain
Gain [1]
f = 2 GHz
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
dB
dB
15.5
—
17.5
18.1
18.5
—
OIP3
Output 3rd Order
Intercept Point [1]
f = 2 GHz
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
dBm
dBm
33
—
35.8
35.9
—
—
P1dB
1dB Compressed
Output Power [1]
f = 2 GHz
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
dBm
dBm
—
—
21.4
22.1
—
—
Notes:
1. Measurements obtained using production test board described in Figure 5.
Input
50 Ohm
Transmission
Line Including
Gate Bias T
(0.3 dB loss)
Input
Matching Circuit
Γ_mag = 0.11
Γ_ang = 141°
(0.5 dB loss)
DUT
Output
Matching Circuit
Γ_mag = 0.314
Γ_ang = -167°
(0.5 dB loss)
50 Ohm
Transmission
Line Including
Drain Bias T
(0.3 dB loss)
Output
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Gain, P1dB, OIP3, and OIP3 measurements. This circuit represents a
trade-off between an optimal noise match, maximum OIP3 match and associated impedance matching circuit losses. Circuit losses have been deembedded from actual measurements.
Symbol
Parameter and Test Condition
Units
Min.
Typ.
Max.
Fmin
Minimum Noise Figure [2]
f = 900 GHz
f = 2 GHz
f = 3.9 GHz
f = 5.8 GHz
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
dB
dB
dB
dB
—
—
—
—
0.16
0.46
0.8
1.17
—
—
—
—
Ga
Associated Gain [2]
f = 900 GHz
f = 2 GHz
f = 3.9 GHz
f = 5.8 GHz
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
dB
dB
dB
dB
—
—
—
—
22.4
18.7
14.5
11.9
—
—
—
—
OIP3
Output 3rd Order
Intercept Point [3]
f = 900 GHz
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
dBm
dBm
dB
dB
—
—
—
—
35
35.1
36.6
37.6
—
—
—
—
Vds = 3V, Ids = 60 mA
Vds = 4V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
Vds = 3V, Ids = 60 mA
dBm
dBm
dB
dB
—
—
—
—
19.5
20.8
20.4
19.4
—
—
—
—
f = 3.9 GHz
f = 5.8 GHz
P1dB
1dB Compressed
Output Power [3]
f = 900 GHz
f = 3.9 GHz
f = 5.8 GHz
Notes:
2. Fmin and associated gain at minimum noise figure (Ga) values are based on a set of 16 noise figure measurements made at 16 different impedances
using an ATN NP5 test system. From these measurements a true Fmin and Ga is calculated. Refer to the noise parameter application section for more
information.
3. P1dB and OIP3 measurements made in an InterContinental Microwave (ICM) test fixture with double stub tuners and bias tees. The input was tuned for
minimum noise figure and the output was tuned for maximum OIP3.
3
ATF-541M4 Typical Performance Curves
0.60
40
0.26
0.24
0.22
0.45
dB/dBm
0.50
30
0.20
Fmin (dB)
Fmin (dB)
0.55
0.18
0.16
20
15
0.12
0.35
0
20
40
60
80
0.10
100
0
20
40
Ids (mA)
80
Fmin (dB)
30
25
20
15
30
2.0
25
1.5
20
1.0
60
40
80
100
Ids (mA)
Figure 9. Gain, OIP3 & P1dB vs. Ids Tuned
for Max OIP3 and Min NF at 900 MHz,
Vds = 3V[3].
Notes:
1. Fmin and associated gain at minimum noise
figure (Ga) values are based on a set of
16 noise figure measurements made at
16 different impedances using an ATN NP5
test system. From these measurements a true
Fmin and Ga is calculated. Refer to the noise
parameter application section for more
information.
60
80
100
40 mA
60 mA
80 mA
15
80 mA
60 mA
40 mA
10
0
40
20
Figure 8. Gain, OIP3 & P1dB vs. Ids Tuned
for Max OIP3 and Min NF at 2 GHz,
Vds = 3V[2].
2.5
0.5
20
0
Ids (mA)
Ga (dB)
Gain
OIP3
P1dB
0
10
100
Figure 7. Fmin vs. Ids at 900 MHz, Vds = 3V[1]
40
35
60
Ids (mA)
Figure 6. Fmin vs. Ids at 2 GHz, Vds = 3V[1]
dB/dBm
25
0.14
0.40
4
Gain
OIP3
P1dB
35
5
0
2
4
6
8
10
FREQUENCY (GHz)
Figure 10. Fmin vs. Frequency vs. Ids,
Vds = 3V[1].
2. Measurements obtained using production
test board described in Figure 5.
3. Input tuned for minimum NF and the output
tuned for maximum OIP3 using an
InterContinental Microwave (ICM) test
fixture, double stub tuners and bias tees.
12
0
2
4
6
8
10
FREQUENCY (GHz)
Figure 11. Ga vs. Frequency vs. Ids,
Vds = 3V[1].
12
ATF-541M4 Typical Performance Curves, continued
30
45
25°C
-40°C
85°C
1.5
15
10
NF (dB)
35
20
30
25
25°C
-40°C
85°C
20
5
0
0
1
2
3
4
5
6
7
10
0
1
2
3
25°C
-40°C
85°C
22
21
20
19
18
0
1
2
3
4
4
5
6
7
Figure 13. OIP3 vs. Freq. and Temperature
Tuned for Max OIP3 and Min NF at
Vds = 3V, Ids = 60 mA[1].
23
P1dB (dBm)
0.5
FREQUENCY (GHz)
Figure 12. Gain vs. Freq. and Temperature
Tuned for Max OIP3 and Min NF at
Vds = 3V, Ids = 60 mA[1].
5
6
7
FREQUENCY (GHz)
Figure 15. P1dB vs. Freq. and Temperature
Tuned for Max OIP3 and Min NF at
Vds = 3V, Ids = 60 mA[1].
ATF-541M4 Output Reflection Coefficient Parameters Tuned
for Maximum Output IP3[1]; VDS = 3V, IDS = 60 mA
Gamma[2]
Out_Mag.
(Degrees)
OIP3
P1dB
Freq
(GHz)
Gamma[2]
Out_Mag.
(Mag)
(dBm)
(dBm)
0.9
2.0
3.9
5.8
0.006
0.314
0.321
0.027
23
-167
134
89
35.04
35.82
36.60
37.62
19.47
21.36
20.37
19.38
Notes:
1. Input tuned for minimum NF and the output tuned for maximum OIP3
using an InterContinental Microwave (ICM) test fixture, double stub
tuners and bias tees.
2. Gamma out is the reflection coefficient of the matching circuit presented
to the output of the device.
5
1.0
15
FREQUENCY (GHz)
17
25°C
-40°C
85°C
40
OIP3 (dBm)
GAIN (dB)
25
2.0
0
0
1
2
3
4
5
6
FREQUENCY (GHz)
Figure 14. NF vs. Freq. and Temperature
Tuned for Max OIP3 and Min NF at
Vds = 3V, Ids = 60 mA[1].
7
ATF-541M4 Typical Scattering Parameters, VDS = 3V, IDS = 40 mA
Freq.
GHz
Mag.
S11
Ang.
dB
S21
Mag.
Ang.
Mag.
S12
Ang.
Mag.
S22
Ang.
MSG/MAG
dB
0.1
0.5
0.9
1.0
1.5
1.9
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
0.99
0.88
0.79
0.77
0.73
0.71
0.70
0.69
0.69
0.69
0.70
0.71
0.72
0.73
0.74
0.76
0.77
0.79
0.81
0.83
0.85
0.86
0.89
0.90
-16.4
-71.2
-107.2
-114.0
-137.2
-150.1
-155.1
-168.4
-178.1
166.9
155.0
139.7
129.2
119.3
110.0
100.3
90.5
82.1
72.4
62.2
52.3
42.7
33.1
24.5
27.62
25.51
22.76
22.07
19.26
17.48
16.94
15.19
13.68
11.30
9.44
8.02
6.67
5.54
4.51
3.61
2.80
2.01
1.21
0.37
-0.51
-1.70
-2.59
-3.81
24.03
18.85
13.74
12.69
9.18
7.48
7.03
5.75
4.83
3.67
2.96
2.52
2.16
1.89
1.68
1.52
1.38
1.26
1.15
1.04
0.94
0.82
0.74
0.65
169.5
135.7
115.0
110.9
96.1
87.7
86.4
78.3
71.1
58.3
46.6
34.5
23.9
13.6
3.6
-6.5
-16.9
-27.5
-37.6
-48.8
-59.4
-69.3
-78.2
-86.9
0.01
0.03
0.04
0.04
0.05
0.05
0.05
0.06
0.06
0.07
0.07
0.09
0.10
0.11
0.12
0.13
0.14
0.15
0.16
0.16
0.17
0.17
0.17
0.17
80.2
54.4
41.2
39.0
32.8
30.4
30.6
29.7
29.5
29.3
27.9
25.1
22.3
19.0
15.1
10.5
4.8
-1.7
-8.5
-15.9
-24.1
-31.6
-39.0
-45.9
0.58
0.46
0.34
0.32
0.23
0.19
0.16
0.13
0.11
0.11
0.11
0.12
0.13
0.14
0.16
0.19
0.22
0.27
0.32
0.37
0.44
0.50
0.57
0.62
-10.6
-45.3
-66.5
-71.0
-87.8
-97.9
-101.6
-113.1
-128.4
-152.9
-174.7
173.9
157.8
145.8
135.6
124.6
113.5
102.7
92.5
83.1
74.2
66.0
60.5
55.9
33.81
27.98
25.36
25.01
22.64
21.75
21.48
19.82
19.06
15.14
12.85
11.68
10.34
9.24
8.31
7.74
7.01
6.58
6.19
5.73
5.46
4.53
4.93
4.44
Typical Noise Parameters, VDS = 3V, IDS = 40 mA
Fmin
dB
Γopt
Mag.
Γopt
Ang.
Rn/50
0.5
0.9
1.0
1.9
2.0
2.4
3.0
3.9
5.0
5.8
6.0
7.0
8.0
9.0
10.0
0.10
0.12
0.17
0.40
0.41
0.51
0.55
0.64
0.95
1.07
1.10
1.30
1.45
1.57
1.69
0.45
0.41
0.29
0.23
0.22
0.24
0.29
0.34
0.35
0.34
0.40
0.42
0.48
0.55
0.59
8.3
11.3
23.8
89.2
89.9
112.1
140.2
165.4
-173.4
-160.3
-151.2
-139.3
-129.2
-118.0
-101.7
0.06
0.06
0.05
0.05
0.05
0.05
0.05
0.04
0.04
0.05
0.08
0.10
0.13
0.21
0.34
Ga
dB
26.17
22.19
21.81
18.72
18.24
17.16
15.91
14.26
12.74
11.72
10.32
9.77
9.46
8.64
8.15
40
35
MSG/MAG and |S21|2 (dB)
Freq
GHz
MSG
30
25
20
15
MAG
10
|S21|2
5
0
-5
-10
0
5
10
15
FREQUENCY (GHz)
Figure 16. MSG/MAG and |S21|2 vs.
Frequency at 3V, 40 mA.
Notes:
1. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these
measurements a true Fmin is calculated. Refer to the noise parameter application section for more information.
2. Refer to the applications section for additional information on the test fixture used for the measurement of the s and noise parameters.
6
20
ATF-541M4 Typical Scattering Parameters, VDS = 3V, IDS = 60 mA
Freq.
GHz
Mag.
S11
Ang.
dB
S21
Mag.
Ang.
Mag.
S12
Ang.
Mag.
S22
Ang.
MSG/MAG
dB
0.1
0.5
0.9
1.0
1.5
1.9
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
0.99
0.87
0.78
0.76
0.72
0.70
0.70
0.69
0.69
0.69
0.70
0.71
0.71
0.73
0.74
0.76
0.77
0.79
0.80
0.83
0.85
0.86
0.90
0.90
-17.6
-74.7
-110.7
-117.6
-140.1
-152.6
-157.5
-170.4
-179.9
165.7
153.8
138.8
128.6
118.6
109.2
99.9
89.7
81.5
71.8
61.7
52.2
42.1
33.2
24.3
28.36
26.04
23.13
22.42
19.54
17.73
17.19
15.45
13.91
11.53
9.66
8.25
6.89
5.76
4.72
3.80
3.03
2.23
1.45
0.58
-0.31
-1.41
-2.34
-3.53
26.18
20.03
14.34
13.22
9.49
7.70
7.24
5.92
4.96
3.77
3.04
2.58
2.21
1.94
1.72
1.55
1.42
1.29
1.18
1.07
0.96
0.85
0.76
0.67
168.9
133.9
113.5
109.4
95.1
86.9
85.7
77.9
70.8
58.3
46.8
34.8
24.4
14.3
4.4
-5.7
-16.0
-26.3
-36.3
-47.4
-58.1
-67.9
-76.8
-84.8
0.01
0.03
0.04
0.04
0.05
0.05
0.05
0.05
0.06
0.07
0.08
0.09
0.10
0.11
0.12
0.13
0.14
0.15
0.16
0.17
0.17
0.17
0.17
0.17
85.1
54.2
41.8
40.2
34.6
32.8
33.5
34.1
33.4
32.8
32.0
28.2
25.1
21.1
16.6
11.2
5.5
-1.1
-8.7
-15.6
-23.4
-31.6
-38.7
-45.8
0.54
0.41
0.30
0.28
0.20
0.17
0.14
0.12
0.10
0.10
0.09
0.11
0.12
0.14
0.17
0.19
0.23
0.27
0.32
0.38
0.44
0.49
0.57
0.62
-11.3
-48.1
-70.1
-74.9
-92.5
-103.3
-108.9
-122.4
-138.7
-164.1
174.9
162.9
149.1
138.7
129.5
119.3
108.8
98.6
89.2
80.3
71.7
64.3
58.8
54.7
34.18
28.25
25.54
25.19
22.78
21.88
21.61
20.73
19.17
15.26
13.21
11.80
10.30
9.42
8.46
7.86
7.21
6.73
6.11
5.98
5.54
4.75
5.73
4.51
Typical Noise Parameters, VDS = 3V, IDS = 60 mA
Fmin
dB
Γopt
Mag.
Γopt
Ang.
Rn/50
0.5
0.9
1.0
1.9
2.0
2.4
3.0
3.9
5.0
5.8
6.0
7.0
8.0
9.0
10.0
0.12
0.16
0.19
0.45
0.46
0.57
0.62
0.80
1.02
1.17
1.22
1.41
1.49
1.69
1.87
0.37
0.34
0.21
0.22
0.21
0.23
0.30
0.35
0.43
0.46
0.51
0.52
0.54
0.56
0.61
13.2
10.9
30.8
102.9
104.2
125.2
149.0
173.1
-168.3
-155.8
-146.4
-137.0
-129.5
-115.1
-99.8
0.05
0.06
0.04
0.05
0.05
0.05
0.04
0.04
0.05
0.06
0.09
0.11
0.15
0.25
0.40
Ga
dB
27.06
22.88
22.44
19.17
18.69
17.57
16.26
14.54
12.97
11.85
10.98
10.03
9.66
8.82
8.32
40
35
MSG/MAG and |S21|2 (dB)
Freq
GHz
MSG
30
25
20
15
MAG
10
5
|S21|
2
0
-5
-10
0
5
10
15
FREQUENCY (GHz)
Figure 17. MSG/MAG and |S21|2 vs.
Frequency at 3V, 60 mA.
Notes:
1. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these
measurements a true Fmin is calculated. Refer to the noise parameter application section for more information.
2. Refer to the applications section for additional information on the test fixture used for the measurement of the s and noise parameters.
7
20
ATF-541M4 Typical Scattering Parameters, VDS = 3V, IDS = 80 mA
Freq.
GHz
Mag.
S11
Ang.
dB
S21
Mag.
Ang.
Mag.
S12
Ang.
Mag.
S22
Ang.
MSG/MAG
dB
0.1
0.5
0.9
1.0
1.5
1.9
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
0.97
0.85
0.77
0.75
0.71
0.70
0.69
0.69
0.69
0.69
0.70
0.70
0.72
0.73
0.74
0.76
0.76
0.79
0.80
0.83
0.85
0.86
0.89
0.89
-17.9
-76.2
-112.1
-119.2
-142.2
-154.9
-159.5
-171.1
179.5
165.2
153.3
138.3
127.8
118.0
109.1
99.3
89.7
80.9
71.9
61.8
52.1
41.6
32.9
24.3
28.61
26.21
23.27
22.55
19.65
17.83
17.30
15.53
14.00
11.62
9.75
8.33
6.97
5.84
4.82
3.89
3.11
2.29
1.56
0.73
-0.18
-1.22
-2.18
-3.36
26.94
20.44
14.57
13.42
9.60
7.79
7.33
5.98
5.01
3.81
3.07
2.61
2.23
1.96
1.74
1.56
1.43
1.30
1.20
1.09
0.98
0.87
0.78
0.68
168.8
133.6
113.2
109.1
95.0
86.9
85.8
78.0
71.0
58.5
47.2
35.3
25.0
14.8
5.2
-4.9
-15.1
-25.2
-35.3
-46.6
-56.2
-67.1
-75.9
-83.6
0.01
0.03
0.04
0.04
0.04
0.05
0.05
0.05
0.06
0.06
0.07
0.09
0.10
0.11
0.12
0.13
0.14
0.15
0.16
0.17
0.17
0.17
0.17
0.17
79.8
54.7
43.1
41.5
36.3
34.8
35.8
36.0
35.8
35.0
33.7
29.6
26.6
22.3
17.8
12.1
6.1
-0.4
-7.8
-15.0
-23.3
-31.0
-39.1
-45.5
0.50
0.39
0.28
0.26
0.19
0.16
0.13
0.11
0.10
0.10
0.10
0.11
0.12
0.14
0.17
0.19
0.23
0.27
0.32
0.37
0.44
0.49
0.57
0.62
-11.6
-49.1
-71.5
-76.4
-94.6
-105.8
-112.9
-127.2
-144.2
-170.0
168.7
156.1
143.5
133.6
125.1
115.7
105.6
95.7
86.7
78.3
70.0
63.1
57.7
53.6
34.30
28.33
25.61
25.26
23.80
21.93
21.66
20.78
19.22
14.97
13.05
11.67
10.52
9.47
8.52
7.88
7.03
6.75
6.21
6.12
5.66
4.89
5.21
4.07
Typical Noise Parameters, VDS = 3V, IDS = 80 mA
Fmin
dB
Γopt
Mag.
Γopt
Ang.
Rn/50
0.5
0.9
1.0
1.9
2.0
2.4
3.0
3.9
5.0
5.8
6.0
7.0
8.0
9.0
10.0
0.21
0.25
0.28
0.53
0.56
0.64
0.72
0.81
1.03
1.33
1.40
1.59
1.79
2.01
2.20
0.23
0.20
0.11
0.21
0.20
0.26
0.32
0.38
0.41
0.42
0.46
0.47
0.53
0.59
0.63
24.4
17.8
60.8
121.1
124.5
142.6
159.7
179.2
-153.7
-152.5
-143.4
-139.1
-127.3
-113.4
-97.9
0.05
0.06
0.04
0.05
0.05
0.05
0.05
0.05
0.05
0.07
0.10
0.13
0.19
0.31
0.5
Ga
dB
27.83
23.58
23.43
19.57
19.13
18.05
16.60
14.81
13.21
12.20
11.35
10.24
9.84
9.00
8.46
40
35
MSG/MAG and |S21|2 (dB)
Freq
GHz
MSG
30
25
20
15
MAG
10
|S21|2
5
0
-5
-10
0
5
10
15
FREQUENCY (GHz)
Figure 18. MSG/MAG and |S21|2 vs.
Frequency at 3V, 80 mA.
Notes:
1. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these
measurements a true Fmin is calculated. Refer to the noise parameter application section for more information.
2. Refer to the applications section for additional information on the test fixture used for the measurement of the s and noise parameters.
8
20
ATF-541M4 Typical Scattering Parameters, VDS = 4V, IDS = 60 mA
Freq.
GHz
Mag.
S11
Ang.
dB
S21
Mag.
Ang.
Mag.
S12
Ang.
Mag.
S22
Ang.
MSG/MAG
dB
0.1
0.5
0.9
1.0
1.5
1.9
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
0.99
0.87
0.78
0.76
0.72
0.70
0.69
0.69
0.69
0.69
0.70
0.70
0.72
0.73
0.75
0.76
0.77
0.79
0.81
0.83
0.85
0.87
0.90
0.90
-17.5
-74.8
-110.7
-117.5
-141.4
-154.3
-159.0
-170.1
-179.6
165.9
153.9
138.8
128.6
118.8
109.5
99.9
90.1
81.5
71.6
62.2
51.9
42.1
32.7
24.2
28.39
26.07
23.18
22.47
19.60
17.79
17.25
15.50
13.98
11.60
9.72
8.31
6.96
5.82
4.80
3.89
3.07
2.27
1.47
0.68
-0.28
-1.39
-2.28
-3.52
26.27
20.12
14.42
13.29
9.55
7.75
7.29
5.96
5.00
3.80
3.06
2.60
2.23
1.95
1.74
1.56
1.42
1.30
1.19
1.08
0.97
0.85
0.77
0.67
168.9
133.9
113.6
109.4
95.1
86.9
85.6
77.7
70.6
57.9
46.4
34.4
23.9
13.5
3.6
-6.6
-17.1
-27.6
-37.8
-48.9
-59.6
-69.7
-78.7
-87.4
0.01
0.03
0.04
0.04
0.04
0.05
0.05
0.051
0.05
0.06
0.07
0.08
0.09
0.10
0.11
0.13
0.14
0.15
0.16
0.17
0.17
0.17
0.18
0.17
81.0
54.5
41.6
39.4
35.2
33.3
33.7
34.2
33.1
33.2
32.4
29.5
26.4
22.7
18.2
13.4
7.2
0.6
-6.5
-13.9
-21.7
-29.9
-37.8
-44.8
0.56
0.44
0.32
0.29
0.21
0.18
0.14
0.11
0.10
0.09
0.09
0.10
0.12
0.13
0.14
0.17
0.20
0.24
0.29
0.35
0.42
0.48
0.55
0.61
-10.7
-44.7
-64.3
-68.3
-82.7
-91.2
-93.8
-103.7
-117.7
-141.7
-166.9
-175.8
163.3
149.1
138.2
126.7
114.9
103.7
93.3
84.3
75.0
67.0
61.1
56.4
34.19
28.27
25.57
25.21
23.78
21.90
21.64
20.68
17.98
15.13
13.17
11.68
10.53
9.44
8.76
8.01
7.30
6.91
6.54
6.22
5.73
5.20
6.31
5.96
Typical Noise Parameters, VDS = 4V, IDS = 60 mA
Fmin
dB
Γopt
Mag.
Γopt
Ang.
Rn/50
0.5
0.9
1.0
1.9
2.0
2.4
3.0
3.9
5.0
5.8
6.0
7.0
8.0
9.0
10.0
0.13
0.16
0.20
0.45
0.47
0.57
0.63
0.73
1.05
1.21
1.23
1.43
1.61
1.80
2.01
0.36
0.35
0.22
0.22
0.20
0.24
0.29
0.35
0.37
0.38
0.41
0.45
0.51
0.57
0.61
14.2
13.3
33.7
101.6
102.7
126.0
148.9
172.3
-168.4
-155.9
-151.0
-139.9
-129.9
-114.8
-99.2
0.05
0.06
0.05
0.05
0.06
0.05
0.05
0.04
0.05
0.06
0.08
0.11
0.15
0.26
0.41
Ga
dB
27.18
22.95
22.51
19.14
18.66
17.61
16.26
14.58
13.04
12.01
11.05
10.11
9.76
8.95
8.44
40
35
MSG/MAG and |S21|2 (dB)
Freq
GHz
MSG
30
25
20
MAG
15
10
|S21|2
5
0
-5
-10
0
5
10
15
FREQUENCY (GHz)
Figure 19. MSG/MAG and |S21|2 vs.
Frequency at 4V, 60 mA.
Notes:
1. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these
measurements a true Fmin is calculated. Refer to the noise parameter application section for more information.
2. Refer to the applications section for additional information on the test fixture used for the measurement of the s and noise parameters.
9
20
S and Noise Parameter Measurements
The position of the reference
planes used for the measurement
of both S and Noise Parameter
measurements is shown in Figure
20. The reference plane can be
described as being at the center
of both the gate and drain pads.
S and noise parameters are
measured with a 50 ohm
microstrip test fixture made with
a 0.010" thickness aluminum
substrate. Both source leads are
connected directly to ground via
a 0.010" thickness metal rib
which provides a very low
inductance path to ground for
both source leads. The inductance associated with the addition of printed circuit board
plated through holes and source
bypass capacitors must be added
to the computer circuit simulation to properly model the effect
of grounding the source leads in
a typical amplifier design.
Reference
Plane
Source
Pin 3
Drain
Pin 4
Sx
Source
Pin 1
Gate
Pin 2
Microstrip
Transmission Lines
Figure 20.
Noise Parameter Applications
Information
The Fmin values are based on a
set of 16 noise figure measurements made at 16 different
impedances using an ATN NP5
test system. From these measurements, a true Fmin is calculated.
Fmin represents the true minimum noise figure of the device
when the device is presented
with an impedance matching
network that transforms the
10
source impedance, typically 50Ω,
to an impedance represented by
the reflection coefficient Γo. The
designer must design a matching
network that will present Γo to
the device with minimal associated circuit losses. The noise
figure of the completed amplifier
is equal to the noise figure of the
device plus the losses of the
matching network preceding the
device. The noise figure of the
device is equal to Fmin only
when the device is presented
with Γo. If the reflection coefficient of the matching network is
other than Γo, then the noise
figure of the device will be
greater than Fmin based on the
following equation.
NF = Fmin + 4 Rn
|Γs – Γo | 2
Zo (|1 + Γo| 2) (1 - |Γs| 2)
Where Rn/Zo is the normalized
noise resistance, Γo is the optimum reflection coefficient
required to produce Fmin and Γs
is the reflection coefficient of the
source impedance actually
presented to the device.
The losses of the matching
networks are non-zero and they
will also add to the noise figure
of the device creating a higher
amplifier noise figure. The losses
of the matching networks are
related to the Q of the components and associated printed
circuit board loss. Γo is typically
fairly low at higher frequencies
and increases as frequency is
lowered. Larger gate width
devices will typically have a
lower Γo as compared to narrower gate width devices. Typically for FETs , the higher Γo
usually infers that an impedance
much higher than 50Ω is required for the device to produce
Fmin. At VHF frequencies and
even lower L Band frequencies,
the required impedance can be in
the vicinity of several thousand
ohms. Matching to such a high
impedance requires very hi-Q
components in order to minimize
circuit losses. As an example at
900 MHz, when airwwound coils
(Q>100)are used for matching
networks, the loss can still be up
to 0.25 dB which will add directly to the noise figure of the
device. Using muiltilayer molded
inductors with Qs in the 30 to 50
range results in additional loss
over the airwound coil. Losses as
high as 0.5 dB or greater add to
the typical 0.15 dB Fmin of the
device creating an amplifier
noise figure of nearly 0.65 dB.
SMT Assembly
The package can be soldered
using either lead-bearing or leadfree alloys (higher peak temperatures). Reliable assembly of
surface mount components is a
complex process that involves
many material, process, and
equipment factors, including:
method of heating (e.g. IR or
vapor phase reflow, wave soldering, etc) circuit board material,
conductor thickness and pattern,
type of solder alloy, and the
thermal conductivity and thermal mass of components. Components with a low mass, such as
the Minipak 1412 package, will
reach solder reflow temperatures
faster than those with a greater
mass.
The recommended leaded solder
time-temperature profile is
shown in Figure 21. This profile
is representative of an IR reflow
type of surface mount assembly
process. After ramping up from
room temperature, the circuit
board with components attached
to it (held in place with solder
paste) passes through one or
more preheat zones. The preheat
zones increase the temperature
of the board and components to
prevent thermal shock and begin
evaporating solvents from the
solder paste. The reflow zone
briefly elevates the temperature
sufficiently to produce a reflow
of the solder.
The recommended lead-free
reflow profile is shown in Figure 22.
The rates of change of temperature for the ramp-up and cooldown zones are chosen to be low
enough to not cause deformation
of board or damage to components due to thermal shock. The
maximum temperature in the
reflow zone (Tmax) should not
exceed 235°C for leaded solder.
Electrostatic Sensitivity
FETs and RFICs are electrostatic
discharge (ESD) sensitive devices. Agilent devices are manufactured using a very robust and
reliable PHEMT process, however,
permanent damage may occur to
these devices if they are subjected to high-energy electrostatic
discharges. Electrostatic charges
as high as several thousand volts
(which readily accumulate on the
human body and on test equipment) can discharge without
detection and may result in
failure or degradation in performance and reliability.
These parameters are typical for
a surface mount assembly
process for the ATF-541M4. As a
general guideline, the circuit
board and components should
only be exposed to the minimum
temperatures and times the
necessary to achieve a uniform
reflow of solder.
Electronic devices may be
subjected to ESD damage in any
of the following areas:
250
TMAX
TEMPERATURE (°C)
200
150
Reflow
Zone
100
Preheat
Zone
Cool Down
Zone
50
0
0
60
120
180
240
•
•
•
•
Storage & handling
Inspection
Assembly & testing
In-circuit use
The ATF-541M4 is an ESD Class 1
device. Therefore, proper ESD
precautions are recommended
when handling, inspecting,
testing, and assembling these
devices to avoid damage.
Any user-accessible points in
wireless equipment (e.g. antenna
or battery terminals) provide an
opportunity for ESD damage.
For circuit applications in which
the ATF-541M4 is used as an
input or output stage with close
coupling to an external antenna,
the device should be protected
from high voltage spikes due to
human contact with the antenna.
A good practice, illustrated in
Figure 23, is to place a shunt
inductor or RF choke at the
antenna connection to protect
the receiver and transmitter
circuits. It is often advantageous
to integrate the RF choke into the
design of the diplexer or T/R
switch control circuitry.
300
TIME (seconds)
Figure 21. Leaded Solder Reflow Profile.
350
Peak Temperature
Min. 240°C
Max. 255°C
TEMPERATURE (°C)
300
250
221
150
100
Preheat 130 – 170°C
Min. 60s
Max. 150s
50
0
0
30
60
90
120
150
180
210
TIME (seconds)
Figure 22. Lead-free Solder Reflow Profile.
11
Figure 23. In-circuit ESD Protection.
Reflow Time
Min. 60s
Max. 90s
200
240
270
300
330
360
ATF-541M4 Applications
Information
Introduction
Agilent Technologies’s
ATF-541M4 is a low noise
enhancement mode PHEMT
designed for use in low cost
commercial applications in the
VHF through 6 GHz frequency
range. As opposed to a typical
depletion mode PHEMT where the
gate must be made negative with
respect to the source for proper
operation, an enhancement mode
PHEMT requires that the gate be
made more positive than the
source for normal operation.
Therefore a negative power
supply voltage is not required for
an enhancement mode device.
Biasing an enhancement mode
PHEMT is much like biasing the
typical bipolar junction transistor.
Instead of a 0.7V base to emitter
voltage, the ATF-541M4 enhancement mode PHEMT requires a
nominal 0.58V potential between
the gate and source for a nominal
drain current of 60 mA.
Matching Networks
The techniques for impedance
matching an enhancement mode
device are very similar to those for
matching a depletion mode device.
The only difference is in the
method of supplying gate bias. S
and Noise Parameters for various
bias conditions are listed in this
data sheet. The circuit shown in
Figure 1 shows a typical LNA
circuit normally used for 900 and
1900 MHz applications. (Consult
the Agilent Technologies web site
for application notes covering
specific designs and applications).
High pass impedance matching
networks consisting of L1/C1 and
L4/C4 provide the appropriate
match for noise figure, gain, S11
and S22. The high pass structure
also provides low frequency gain
reduction which can be beneficial
from the standpoint of improving
out-of-band rejection.
12
Capacitors C2 and C5 provide a
low impedance in-band RF
bypass for the matching networks. Resistors R3 and R4
provide a very important low
frequency termination for the
device. The resistive termination
improves low frequency stability.
Capacitors C3 and C6 provide
the RF bypass for resistors R3
and R4. Their value should be
chosen carefully as C3 and C6
also provide a termination for
low frequency mixing products.
These mixing products are as a
result of two or more in-band
signals mixing and producing
third order in-band distortion
products. The low frequency or
difference mixing products are
terminated by C3 and C6. For
best suppression of third order
distortion products based on the
CDMA 1.25 MHz signal spacing,
C3 and C6 should be 0.1 uF in
value. Smaller values of capacitance will not suppress the
generation of the 1.25 MHz
difference signal and as a result
will show up as poorer two tone
IP3 results.
C4
C1
INPUT
Q1
Zo
L1
L4
L2
R4
OUTPUT
Zo
L3
C2
C5
R3
R5
R1
C3
C6
R2
Whereas a depletion mode
PHEMT pulls maximum drain
current when Vgs = 0V, an enhancement mode PHEMT pulls
only a small amount of leakage
current when Vgs = 0V. Only when
Vgs is increased above Vto, the
device threshold voltage, will
drain current start to flow. At a
Vds of 3V and a nominal Vgs of
0.58V, the drain current Id will be
approximately 60 mA. The data
sheet suggests a minimum and
maximum Vgs over which the
desired amount of drain current
will be achieved. It is also important to note that if the gate
terminal is left open circuited,
the device will pull some amount
of drain current due to leakage
current creating a voltage differential between the gate and
source terminals.
Passive Biasing
Passive biasing of the ATF-541M4
is accomplished by the use of a
voltage divider consisting of R1
and R2 connected to the gate of
the device. The voltage for the
divider is derived from the drain
voltage. This provides a form of
voltage feedback (through the use
of R3) to help keep drain current
constant. Resistor R5 (approximately 10KΩ) is added to limit
the gate current of enhancement
mode devices such as the
ATF-541M4. This is especially
important when the device is
driven to P1dB or Psat.
Vdd
Figure 1. Typical ATF-541M4 LNA with Passive
Biasing.
Bias Networks
One of the major advantages of
the enhancement mode technology is that it allows the designer
to be able to dc ground the
source leads and then merely
apply a positive voltage on the
gate to set the desired amount of
quiescent drain current Id.
Resistor R3 is calculated based
on desired Vds , Ids and available
power supply voltage.
R3 =
VDD – Vds
Ids + IBB
(1)
p
VDD is the power supply voltage.
Vds is the device drain to source
voltage.
Ids is the desired drain current.
IBB is the current flowing
through the R1/R2 resistor
voltage divider network.
The value of resistors R1 and R2
are calculated with the following
formulas
R1 =
R2 =
Vgs
IBB
(2)
p
(Vds – Vgs) R1
Vgs
(3)
p
Example Circuit
VDD = 5 V
Vds = 3 V
Ids = 60 mA
Vgs = 0.58 V
Choose IBB to be at least 10X the
maximum expected gate leakage
current. IBB was chosen to be
2 mA for this example. Using
equations (1), (2), and (3) the
resistors are calculated as follows
R1 = 290Ω
R2 = 1210Ω
R3 = 32.3Ω
Active Bias
Active biasing provides a means
of keeping the quiescent bias
point constant over temperature
and constant over lot to lot
variations in device dc performance. The advantage of the
active biasing of an enhancement
mode PHEMT versus a depletion
mode PHEMT is that a negative
power source is not required. The
techniques of active biasing an
enhancement mode device are
very similar to those used to bias
a bipolar junction transistor.
C4
C1
Q1
Zo
L4
L2
R5
OUTPUT
Zo
L1
L3
C2
C5
R4
C3
R6
C7
C6
Q2
Vdd
R7
R3
R1
R2
Figure 2. Typical ATF-541M4 LNA with Active
Biasing.
13
VE = Vds + (Ids • R4)
(1)
VDD – VE
Ids
(2)
R3 =
p
VB = VE – VBE
(3)
R1
V
R1 + R2 DD
(4)
VDD = IBB (R1 + R2)
(5)
VB =
p
Rearranging equation (4)
provides the following formula
R2 =
R1 (VDD – VB)
VB
(4A)
p
and rearranging equation (5)
provides the follow formula
R1 =
IBB
An active bias scheme is shown
in Figure 2.
INPUT
R1 and R2 provide a constant
voltage source at the base of a
PNP transistor at Q2. The constant voltage at the base of Q2 is
raised by 0.7 volts at the emitter.
The constant emitter voltage plus
the regulated VDD supply are
present across resistor R3.
Constant voltage across R3
provides a constant current
supply for the drain current.
Resistors R1 and R2 are used to
set the desired Vds. The combined
series value of these resistors also
sets the amount of extra current
consumed by the bias network.
The equations that describe the
circuit’s operation are as follows.
(
VDD
V – VB
1 + DD
VB
9
)
(5A)
p
Example Circuit
VDD = 5 V
Vds = 3 V
Ids = 60 mA
R4 = 10Ω
VBE = 0.7 V
Equation (1) calculates the required voltage at the emitter of the
PNP transistor based on desired
Vds and Ids through resistor R4 to
be 3.6V. Equation (2) calculates the
value of resistor R3 which determines the drain current Ids. In the
example R3=23.3Ω. Equation (3)
calculates the voltage required at
the junction of resistors R1 and R2.
This voltage plus the step-up of the
base emitter junction determines
the regulated Vds. Equations (4)
and (5) are solved simultaneously
to determine the value of resistors
R1 and R2. In the example
R1=1450Ω and R2 =1050Ω. Resistor R7 is chosen to be 1 kΩ. This
resistor keeps a small amount of
current flowing through Q2 to help
maintain bias stability. R6 is
chosen to be 10 KΩ. This value of
resistance is high enough to limit
Q1 gate current in the presence of
high RF drive levels as experienced
when Q1 is driven to the P1dB gain
compression point. C7 provides a
low frequency bypass to keep noise
from Q2 effecting the operation of
Q1. C7 is typically 0.1 µF.
Maximum Suggested Gate Current
The maximum suggested gate
current for the ATF-541M4 is
2 mA. Incorporating resistor R5
in the passive bias network or
resistor R6 in the active bias
network safely limits gate current
to 500 µA at P1dB drive levels.
In order to minimize component
count in the passive biased
amplifier circuit, the 3 resistor
bias circuit consisting of R1, R2,
and R5 can be simplified if
desired. R5 can be removed if R1
is replaced with a 4.7KΩ resistor
and if R2 is replaced with a 27KΩ
resistor. This combination should
limit gate current to a safe level.
PCB Layout
A suggested PCB pad print for
the miniature, Minipak 1412
package used by the ATF-541M4
is shown in Figure 3.
0.4
0.016
This pad print provides allowance for package placement by
automated assembly equipment
without adding excessive
parasitics that could impair the
high frequency performance of
the ATF-541M4. The layout is
shown with a footprint of the
ATF-541M4 superimposed on the
PCB pads for reference.
0.3
0.012
0.5
0.020
1.1
0.043
0.3
0.012
0.4
0.016
0.5
0.020
For Further Information
The information presented here is
an introduction to the use of the
ATF-541M4 enhancement mode
PHEMT. More detailed application
circuit information is available
from Agilent Technologies. Consult
the web page or your local Agilent
Technologies sales representative.
Figure 3. PCB Pad Print for Minipak 1412.
Package (mm [inches ]).
ATF-541M4 Die Model
Advanced_Curtice2_Model
MESFETM1
NFET=yes
Rf=
PFET=no
Gscap=2
Vto=0.3
Cgs=1.732 pF
Beta=0.888
Cgd=0.255 pF
Lambda=72e-3
Gdcap=2
Alpha=13
Fc=0.65
Tau=
Rgd=0.25 Ohm
Tnom=16.85
Rd=1.0125 Ohm
Idstc=
Rg=1.7 Ohm
Ucrit=-0.72
Vgexp=1.91
Rs=0.3375 Ohm
Gamds=1e-4
Ld=
Vtotc=
Lg=0.188 nH
Betatce=
Ls=
Rgs=0.25 Ohm
Cds=0.273 pF
Rc=195 Ohm
Crf=0.1 F
Gsfwd=
Gsrev=
Gdfwd=
Gdrev=
R1=
R2=
Vbi=0.95
Vbr=
Vjr=
Is=
Ir=
Imax=
Xti=
Eg=
N=
Fnc=1 MHz
R=0.08
P=0.2
C=0.1
Taumdl=no
wVgfwd=
wBvgs=
wBvgd=
wBvds=
wldsmax=
wPmax=
AllParams=
ATF-541M4 Minipak Model
INSIDE Package
Var
Egn
GATE
Port
G
Num=1
VAR
VAR1
K=5
Z2=85
Z1=30
C
C1
C=0.28 pF
TLINP
TL3
Z=Z2 Ohm
L=23.6 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
TLINP
TL1
Z=Z2/2 Ohm
L=22 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
TLINP
TL2
Z=Z2/2 Ohm
L=20 0 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
L
L6
L=0.147 nH
R=0.001
L
L1
L=0.234 nH
R=0.001
GaAsFET
FET1
Mode1=MESFETM1
Mode=Nonlinear
C
C2
C=0.046 pF
SOURCE
Port
S1
Num=2
TLINP
TL9
Z=Z2 Ohm
L=11 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
L
L4
L=0.281 nH
R=0.001
MSub
MSUB
MSub2
H=25.0 mil
Er=9.6
Mur=1
Cond=1.0E+50
Hu=3.9e+034 mil
T=0.15 mil
TanD=0
Rough=0 mil
L
L7
L=0.234 nH
R=0.001
SOURCE
TLINP
TL7
Z=Z2/2 Ohm
L=5.2 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
TLINP
TL5
Z=Z2 Ohm
L=27.5 mil
K=K
A=0.000
F=1 GHz
TanD=0.001
Port
S2
Num=4
DRAIN
Port
D
Num=3
This model can be used as a design tool. It has been tested on ADS for various specifications. However, for
more precise and accurate design, please refer to the measured data in this data sheet. For future
improvements, Agilent reserves the right to change these models without prior notice.
14
Ordering Information
Part Number
No. of Devices
Container
ATF-541M4-TR1
3000
7” Reel
ATF-541M4-TR2
10000
13” Reel
ATF-541M4-BLK
100
antistatic bag
MiniPak Package Outline Drawing
Solder Pad Dimensions
1.44 (0.058)
1.40 (0.056)
3
4
Rx
1.20 (0.048)
1.16 (0.046)
2
1
1.12 (0.045)
1.08 (0.043)
0.82 (0.033)
0.78 (0.031)
0.32 (0.013)
0.28 (0.011)
0.00
Top view
0.00
-0.07 (-0.003)
-0.03 (-0.001)
0.70 (0.028)
0.58 (0.023)
Side view
Dimensions are in millimeteres (inches)
15
0.92 (0.037)
0.88 (0.035)
0.42 (0.017)
1.32 (0.053)
0.38 (0.015)
1.28 (0.051)
Bottom view
-0.07 (-0.003)
-0.03 (-0.001)
Device Orientation for Outline 4T, MiniPak 1412
REEL
TOP VIEW
END VIEW
4 mm
CARRIER
TAPE
Rx
Rx
Rx
Rx
8 mm
USER
FEED
DIRECTION
Note: Vx represents Package Marking Code.
Device orientation is indicated by package marking.
COVER TAPE
Tape Dimensions
P
P2
D
P0
E
F
W
C
B0
A0
D1
t1 (CARRIER TAPE THICKNESS)
Tt (COVER TAPE THICKNESS)
K0
5° MAX.
A0
DESCRIPTION
5° MAX.
B0
SYMBOL
SIZE (mm)
SIZE (INCHES)
CAVITY
LENGTH
WIDTH
DEPTH
PITCH
BOTTOM HOLE DIAMETER
A0
B0
K0
P
D1
1.40 ± 0.05
1.53 ± 0.05
0.80 ± 0.05
4.00 ± 0.10
0.80 ± 0.05
0.055 ± 0.002
0.064 ± 0.002
0.031 ± 0.002
0.157 ± 0.004
0.031 ± 0.002
PERFORATION
DIAMETER
PITCH
POSITION
D
P0
E
1.50 ± 0.10
4.00 ± 0.10
1.75 ± 0.10
0.060 ± 0.004
0.157 ± 0.004
0.069 ± 0.004
CARRIER TAPE
WIDTH
THICKNESS
W
t1
8.00 + 0.30 - 0.10
0.254 ± 0.02
0.315 + 0.012 - 0.004
0.010 ± 0.0008
COVER TAPE
WIDTH
TAPE THICKNESS
C
Tt
5.40 ± 0.10
0.062 ± 0.001
0.213 ± 0.004
0.0024 ± 0.00004
DISTANCE
CAVITY TO PERFORATION
(WIDTH DIRECTION)
F
3.50 ± 0.05
0.138 ± 0.002
CAVITY TO PERFORATION
(LENGTH DIRECTION)
P2
2.00 ± 0.05
0.079 ± 0.002
For product information and a complete list of Agilent
contacts and distributors, please go to our web site.
www.agilent.com/semiconductors
E-mail: [email protected]
Data subject to change.
Copyright © 2003 Agilent Technologies, Inc.
Obsoletes 5988-4025EN
July 30, 2003
5988-9005EN