AUIRFR4104 AUIRFU4104 AUTOMOTIVE GRADE Features Advanced Process Technology Low On-Resistance 175°C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified * HEXFET® Power MOSFET VDSS 40V RDS(on) max. ID (Silicon Limited) 119A ID (Package Limited) 42A D D Description Specifically designed for Automotive applications, this HEXFET® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this design are a 175°C junction operating temperature, fast switching speed and improved repetitive avalanche rating . These features combine to make this design an extremely efficient and reliable device for use in Automotive applications and a wide variety of other applications. Base part number Package Type AUIRFU4104 I-Pak AUIRFR4104 D-Pak 5.5m G S G D-Pak AUIRFR4104 G Gate I-Pak AUIRFU4104 D Drain Standard Pack Form Quantity Tube 75 Tube 75 Tape and Reel Left 3000 S D S Source Orderable Part Number AUIRFU4104 AUIRFR4104 AUIRFR4104TRL Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (TA) is 25°C, unless Symbol Parameter Max. ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 119 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 84 ID @ TC = 25°C IDM PD @TC = 25°C Continuous Drain Current, VGS @ 10V (Package Limited) Pulsed Drain Current Maximum Power Dissipation 42 480 140 VGS EAS EAS (Tested) IAR EAR TJ TSTG Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy (Thermally Limited) Single Pulse Avalanche Energy Tested Value Avalanche Current Repetitive Avalanche Energy Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case) Thermal Resistance Symbol RJC RJA RJA Parameter Junction-to-Case Junction-to-Ambient ( PCB Mount) Junction-to-Ambient Units A W 0.95 ± 20 145 310 See Fig.15,16, 12a, 12b W/°C V mJ A mJ -55 to + 175 °C 300 Typ. Max. Units ––– ––– ––– 1.05 50 110 °C/W HEXFET® is a registered trademark of Infineon. *Qualification standards can be found at www.infineon.com 1 2015-12-1 AUIRFR/U4104 Static @ TJ = 25°C (unless otherwise specified) V(BR)DSS V(BR)DSS/TJ RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Trans conductance IDSS Drain-to-Source Leakage Current IGSS Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Min. Typ. Max. Units Conditions 40 ––– ––– V VGS = 0V, ID = 250µA ––– 0.032 ––– V/°C Reference to 25°C, ID = 1mA ––– 4.3 5.5 m VGS = 10V, ID = 42A 2.0 ––– 4.0 V VDS = VGS, ID = 250µA 58 ––– ––– S VDS = 10V, ID = 42A ––– ––– 20 VDS = 40V, VGS = 0V µA ––– ––– 250 VDS = 40V,VGS = 0V,TJ =125°C ––– ––– 200 VGS = 20V nA ––– ––– -200 VGS = -20V Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Qg Qgs Qgd td(on) tr td(off) tf Total Gate Charge Gate-to-Source Charge Gate-to-Drain Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time ––– ––– ––– ––– ––– ––– ––– 59 19 24 17 69 37 36 89 ––– ––– ––– ––– ––– ––– LD Internal Drain Inductance ––– 4.5 ––– LS Internal Source Inductance ––– 7.5 ––– ––– ––– ––– ––– ––– ––– 2950 660 370 2130 590 850 ––– ––– ––– ––– ––– ––– Min. Typ. Max. Units ––– ––– 42 ––– ––– 480 ––– ––– ––– ––– 28 24 1.3 42 36 Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Coss Output Capacitance Output Capacitance Coss Effective Output Capacitance Coss eff. Diode Characteristics Parameter Continuous Source Current IS (Body Diode) Pulsed Source Current ISM (Body Diode) VSD Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge ton Forward Turn-On Time ID = 42A nC VDS = 32V VGS = 10V VDD = 20V ID = 42A ns RG = 6.8 VGS = 10V Between lead, 6mm (0.25in.) nH from package and center of die contact VGS = 0V VDS = 25V ƒ = 1.0MHz pF VGS = 0V, VDS = 1.0V ƒ = 1.0MHz VGS = 0V, VDS = 32V ƒ = 1.0MHz VGS = 0V, VDS = 0V to 32V Conditions MOSFET symbol showing the A integral reverse p-n junction diode. V TJ = 25°C,IS = 42A, VGS = 0V ns TJ = 25°C ,IF = 42A, VDD = 20V nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11) Limited by TJmax , starting TJ = 25°C, L = 0.16mH, RG = 25, IAS = 42A, VGS =10V. Part not recommended for use above this value. Pulse width 1.0ms; duty cycle 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. This value determined from sample failure population, starting TJ = 25°C, L = 0.16mH, RG = 25, IAS = 42A, VGS =10V. When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques refer to application note #AN-994 R is measured at TJ approximately 90°C. 2 2015-12-1 AUIRFR/U4104 1000 1000 VGS VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 10 4.5V 60µs PULSE WIDTH Tj = 25°C 1 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 4.5V 10 60µs PULSE WIDTH Tj = 175°C 1 0.1 0 1 10 100 100 0.1 0 VDS , Drain-to-Source Voltage (V) 100 100 Fig. 2 Typical Output Characteristics 120 1000 Gfs, Forward Transconductance (S) T J = 25°C ID, Drain-to-Source Current ) 10 VDS, Drain-to-Source Voltage (V) Fig. 1 Typical Output Characteristics T J = 175°C 100 10 VDS = 20V 60µs PULSE WIDTH 4 6 8 T J = 175°C 100 80 60 T J = 25°C 40 20 VDS = 10V 380µs PULSE WIDTH 0 1 10 VGS, Gate-to-Source Voltage (V) Fig. 3 Typical Transfer Characteristics 3 1 0 20 40 60 80 100 ID, Drain-to-Source Current (A) Fig. 4 Typical Forward Trans conductance Vs. Drain Current 2015-12-1 AUIRFR/U4104 5000 ID= 42A VGS, Gate-to-Source Voltage (V) 4000 C, Capacitance (pF) 20 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = C gd Coss = Cds + Cgd Ciss 3000 2000 Coss 1000 Crss 16 12 8 4 0 0 1 10 100 0 VDS, Drain-to-Source Voltage (V) 40 ID, Drain-to-Source Current (A) 10000 100.0 T J = 175°C 10.0 T J = 25°C 1.0 0.1 1.0 1.5 VSD , Source-toDrain Voltage (V) Fig. 7 Typical Source-to-Drain Diode Forward Voltage 100 1000 100 100µsec 10 1msec 1 2.0 10msec Tc = 25°C Tj = 175°C Single Pulse 0.1 0.5 80 OPERATION IN THIS AREA LIMITED BY R DS (on) VGS = 0V 0.0 60 Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage 1000.0 ISD, Reverse Drain Current (A) 20 QG Total Gate Charge (nC) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage 4 VDS = 32V VDS= 20V 0 1 10 100 1000 VDS , Drain-toSource Voltage (V) Fig 8. Maximum Safe Operating Area 2015-12-1 AUIRFR/U4104 120 2.0 RDS(on) , Drain-to-Source On Resistance (Normalized) LIMITED BY PACKAGE ID , Drain Current (A) 100 80 60 40 20 0 ID = 42A VGS = 10V 1.5 1.0 0.5 25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 T C , Case Temperature (°C) T J , Junction Temperature (°C) Fig 9. Maximum Drain Current Vs. Case Temperature Fig 10. Normalized On-Resistance Vs. Temperature Thermal Response ( Z thJC ) 10 1 D = 0.50 0.1 0.20 0.10 J 0.05 0.01 0.02 0.01 R1 R1 J 1 R2 R2 C 1 2 Ri (°C/W) i (sec) 0.5067 0.000414 0.5428 0.004081 C 2 Ci= iRi Ci= iRi Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 5 2015-12-1 AUIRFR/U4104 15V DRIVER L VDS D.U.T RG + V - DD IAS 20V A 0.01 tp Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp Fig 12c. Maximum Avalanche Energy vs. Drain Current I AS Fig 12b. Unclamped Inductive Waveforms 4.0 Id Vgs Vgs(th) Qgs1 Qgs2 Qgd Qgodr Fig 13a. Gate Charge Waveform VGS(th) Gate threshold Voltage (V) Vds ID = 250µA 3.0 2.0 1.0 -75 -50 -25 0 25 50 75 100 125 150 175 T J , Temperature ( °C ) Fig 14. Threshold Voltage Vs. Temperature Fig 13b. Gate Charge Test Circuit 6 2015-12-1 AUIRFR/U4104 1000 Avalanche Current (A) Duty Cycle = Single Pulse 100 Allowed avalanche Current vs avalanche pulsewidth, tav assuming Tj = 25°C due to avalanche losses. Note: In no case should Tj be allowed to exceed Tjmax 0.01 0.05 10 0.10 1 0.1 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 tav (sec) Fig 15. Typical Avalanche Current Vs. Pulse width Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.infineon.com) EAR , Avalanche Energy (mJ) 160 TOP Single Pulse BOTTOM 1% Duty Cycle ID = 42A 120 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long as Tjmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 80 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 40 0 25 50 75 100 125 150 175 Starting T J , Junction Temperature (°C) 25°C in Figure 15, 16). tav = Average time in avalanche. D = Duty cycle in avalanche = tav ·f ZthJC(D, tav) = Transient thermal resistance, see Figures 13) PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2T/ [1.3·BV·Zth] Fig 16. Maximum Avalanche Energy Vs. Temperature 7 EAS (AR) = PD (ave)·tav 2015-12-1 AUIRFR/U4104 Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs Fig 18a. Switching Time Test Circuit 8 Fig 18b. Switching Time Waveforms 2015-12-1 AUIRFR/U4104 D-Pak (TO-252AA) Package Outline (Dimensions are shown in millimeters (inches)) D-Pak (TO-252AA) Part Marking Information Part Number AUFR4104 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 9 2015-12-1 AUIRFR/U4104 I-Pak (TO-251AA) Package Outline (Dimensions are shown in millimeters (inches) I-Pak (TO-251AA) Part Marking Information Part Number AUFU4104 YWWA IR Logo XX Date Code Y= Year WW= Work Week XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 10 2015-12-1 AUIRFR/U4104 D-Pak (TO-252AA) Tape & Reel Information (Dimensions are shown in millimeters (inches)) TR TRR 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION TRL 16.3 ( .641 ) 15.7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 11 2015-12-1 AUIRFR/U4104 Qualification Information Qualification Level Moisture Sensitivity Level Machine Model ESD Human Body Model Charged Device Model RoHS Compliant Automotive (per AEC-Q101) Comments: This part number(s) passed Automotive qualification. Infineon’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. D-Pak MSL1 I-Pak Class M4 (+/- 425V)† AEC-Q101-002 Class H1C (+/-1750V)† AEC-Q101-001 Class C5 (+/-625V)† AEC-Q101-005 Yes † Highest passing voltage. Revision History Date 12/1/2015 Comments Updated datasheet with corporate template Corrected ordering table on page 1. Corrected typo RthJA (PCB Mount) from “40C/W” to “50C/W” on page 1. 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Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 12 2015-12-1