IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER FEATURES: DESCRIPTION: • • • • The IDT octal buffer/line driver is built using an advanced dual metal CMOS technology. The FCT540T is similar in function to the FCT240T, except that the inputs and outputs are on opposite sides of the package. This pinout arrangement makes these devices especially useful as output ports for microprocessors and as backplane drivers, allowing ease of layout and greater board density. • • • • A and C grades Low input and output leakage ≤1µA (max.) CMOS power levels True TTL input and output compatibility: – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 64mA IOL) Meets or exceeds JEDEC standard 18 specifications Power off disable outputs permit "live insertion" Available in SOIC, SSOP, and QSOP packages FUNCTIONAL BLOCK DIAGRAM OE A OE B D0 O0 D1 O1 D2 O2 D3 O3 D4 O4 D5 O5 D6 O6 D7 O7 The IDT logo is a registered trademark of Integrated Device Technology, Inc. INDUSTRIAL TEMPERATURE RANGE JUNE 2006 1 © 2006 Integrated Device Technology, Inc. DSC-5588/5 IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE ABSOLUTE MAXIMUM RATINGS(1) PIN CONFIGURATION OEA 1 20 VCC D0 2 3 19 18 OEB O0 4 17 O1 D3 5 16 O2 D4 6 15 D5 7 14 O3 O4 D6 8 13 O5 9 12 O6 10 11 O7 D1 D2 D7 GND Symbol Description VTERM(2) Max Unit VTERM(3) Terminal Voltage with Respect to GND –0.5 to +7 V Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only. CAPACITANCE (TA = +25°C, F = 1.0MHz) Parameter(1) Symbol SOIC/ SSOP/ QSOP TOP VIEW Conditions Typ. Max. CIN Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF NOTE: 1. This parameter is measured at characterization but not tested. PIN DESCRIPTION Pin Names OEA, OEB Description 3-State Output Enable Inputs (Active LOW) Dx Inputs Ox Outputs FUNCTION TABLE(1) OEA L L H Inputs OEB L L H NOTE: 1. H = HIGH Voltage Level X = Don’t Care L = LOW Voltage Level Z = High Impedance 2 Unit D L H X Outputs H L Z IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5% Symbol Test Conditions(1) Parameter Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current(4) VCC = Max. VI = 2.7V — — ±1 µA IIL Input LOW Current(4) VCC = Max. VI = 0.5V — — ±1 µA IOZH High Impedance Output Current(4) VCC = Max. VI = 2.7V — — ±1 µA IOZL (3-State Output pins)(4) VI = 0.5V — — ±1 II Input HIGH Current(4) VCC = Max., VI = VCC (Max.) — — ±1 VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V VH Input Hysteresis — 200 — mV ICC Quiescent Power Supply Current — 0.01 1 mA Min. 2.4 2 — Typ.(2) 3.3 3 0.3 Max. — — 0.55 Unit V –60 –120 –225 mA — VCC = Max. VIN = GND or VCC µA OUTPUT DRIVE CHARACTERISTICS Symbol VOH Parameter Output HIGH Voltage VOL Output LOW Voltage IOS Short Circuit Current VCC = Min VIN = VIH or VIL VCC = Min VIN = VIH or VIL Test Conditions(1) IOH = –8mA IOH = –15mA IOL = 64mA VCC = Max., VO = GND(3) NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter is ±5µA at TA = –55°C. 3 V IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE POWER SUPPLY CHARACTERISTICS Test Conditions(1) Min. Typ.(2) Max. Unit — 0.5 2 mA VIN = VCC VIN = GND — 0.15 0.25 mA/ MHz VCC = Max. Outputs Open fi = 10MHz VIN = VCC VIN = GND — 1.5 3.5 mA 50% Duty Cycle OEA = OEB = GND One Bit Toggling VIN = 3.4V VIN = GND — 1.8 4.5 VCC = Max. Outputs Open fi = 2.5MHz VIN = VCC VIN = GND — 3 6(5) 50% Duty Cycle OEA = OEB = GND Four Bits Toggling VIN = 3.4V VIN = GND — 5 14(5) Symbol Parameter ΔICC Quiescent Power Supply Current TTL Inputs HIGH VCC = Max. VIN = 3.4V(3) ICCD Dynamic Power Supply Current(4) VCC = Max. Outputs Open OEA = OEB = GND One Input Toggling 50% Duty Cycle IC Total Power Supply Current(6) mA NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fiNi) ICC = Quiescent Current ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Output Frequency Ni = Number of Outputs at fO All currents are in milliamps and all frequencies are in megahertz. SWITCHING CHARACTERISTICS OVER OPERATING RANGE FCT540AT Symbol tPLH tPHL tPZH tPZL tPHZ tPLZ Parameter Condition(1) Min.(2) Propagation Delay Dx to Ox Output Enable Time CL = 50pF RL = 500Ω 1.5 Output Disable Time FCT540CT Max. Min.(2) Max. Unit 4.8 1.5 4.3 ns 1.5 6.2 1.5 5.8 ns 1.5 5.6 1.5 5.2 ns NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 4 IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE TEST CIRCUITS AND WAVEFORMS V CC SWITCH POSITION 7.0V 500W V OUT VIN Pulse Generator D.U.T . 50pF RT Test Switch Open Drain Disable Low Enable Low Closed All Other Tests Open 500W DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. CL Octal Link Test Circuits for All Outputs DATA INPUT tH tSU TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tSU 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE 1.5V tW 3V 1.5V 0V HIGH-LOW-HIGH PULSE 1.5V 3V 1.5V 0V tH Pulse Width Octal Link Octal Link Set-Up, Hold, and Release Times ENABLE SAME PHASE INPUT TRANSITION tPLH tPHL OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL 3V 1.5V 0V VOH 1.5V VOL DISABLE 3V CONTROL INPUT tPZL OUTPUT NORMALLY LOW 3V 1.5V 0V SWITCH CLOSED tPLZ 3.5V 1.5V tPZH OUTPUT NORMALLY HIGH SWITCH OPEN 1.5V 0V 3.5V 0.3V VOL tPHZ 0.3V VOH 1.5V 0V Octal Link 0V Octal Link Propagation Delay Enable and Disable Times NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. 5 IDT74FCT540AT/CT FAST CMOS OCTAL BUFFER/LINE DRIVER INDUSTRIAL TEMPERATURE RANGE ORDERING INFORMATION IDT XX Temperature Range FCT X X Device Type Package SO SOG PY PYG Q QG Small Outline IC SOIC - Green Shrink Small Outline Package SSOP - Green Quarter-size Small Outline Package QSOP - Green 540AT Fast CMOS Octal Buffer/Line Driver 540CT 74 CORPORATE HEADQUARTERS 6024 Silver Creek Valley Road San Jose, CA 95138 - 40°C to +85°C for SALES: 800-345-7015 or 408-284-8200 fax: 408-284-2775 www.idt.com 6 for Tech Support: [email protected]