Infineon IHW40T60 Igbt in trenchstop technology with soft, fast recovery anti-parallel emitter controlled he diode Datasheet

TRENCHSTOP™ Series
IHW40T60
q
Low Loss DuoPack : IGBT in TRENCHSTOP™ technology with soft, fast recovery
anti-parallel Emitter Controlled HE diode
C
Features:

Very low VCE(sat) 1.5V (typ.)

Maximum junction temperature 175°C

Short circuit withstand time 5s

TRENCHSTOP™ and fieldstop technology for 600V applications offers :
- very tight parameter distribution
- high ruggedness, temperature stable behavior
- low VCE(sat) and positive temperature coefficient

Low EMI

Low gate charge

Qualified according to JEDEC1 for target applications

Pb-free lead plating; RoHS compliant

Complete product spectrum and PSpice models : http://www.infineon.com/igbt/
G
E
PG-TO247-3
Applications:

Inductive Cooking

Soft & Hard Switching Applications
Type
IHW40T60
VCE
IC
VCE(sat),Tj=25°C
Tj,max
Marking
Package
600V
40A
1.55V
175C
H40T60B
PG-TO247-3
Maximum Ratings
Parameter
Symbol
Value
Collector-emitter voltage, Tj ≥ 25C
VCE
600
IC
80
Unit
V
DC collector current, limited by Tjmax
TC = 25C
40
TC = 100C
Pulsed collector current, tp limited by Tjmax
ICpuls
120
Turn off safe operating area, VCE = 600V, Tj = 175C, tp = 1µs
-
120
IF
60
A
Diode forward current, limited by Tjmax
TC = 25C
30
TC = 100C
Diode pulsed current, tp limited by Tjmax
IFpuls
90
Gate-emitter voltage
VGE
20
25
Transient Gate-emitter voltage (tp < 10 µs, D<0.01)
V
2)
Short circuit withstand time
tSC
5
s
Power dissipation TC = 25C
Ptot
303
W
Operating junction temperature
Tj
-40...+175
Storage temperature
Tstg
-55...+150
Soldering temperature, 1.6mm (0.063 in.) from case for 10s
-
VGE = 15V, VCC  400V, Tj  150C
1
2)
C
260
J-STD-020 and JESD-022
Allowed number of short circuits: <1000; time between short circuits: >1s.
IFAG IPC TD VLS
1
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
Thermal Resistance
Parameter
Symbol
Conditions
Max. Value
Unit
RthJC
0.49
K/W
RthJCD
1.05
Characteristic
IGBT thermal resistance,
junction – case
Diode thermal resistance,
junction – case
Thermal resistance,
RthJA
40
junction – ambient
Electrical Characteristic, at Tj = 25 C, unless otherwise specified
Parameter
Symbol
Conditions
Value
min.
Typ.
max.
600
-
-
T j =2 5 C
-
1.55
2.05
T j =1 7 5 C
-
1.90
-
T j =2 5 C
-
1.65
2.05
T j =1 7 5 C
-
1.60
-
4.1
4.9
5.7
Unit
Static Characteristic
Collector-emitter breakdown voltage
V ( B R ) C E S V G E = 0V , I C = 0 .5m A
Collector-emitter saturation voltage
VCE(sat)
Diode forward voltage
VF
V
V G E = 15 V , I C = 40 A
V G E = 0V , I F = 3 0 A
Gate-emitter threshold voltage
VGE(th)
I C = 0. 58m A ,
VCE=VGE
Zero gate voltage collector current
ICES
V C E = 60 0 V ,
V G E = 0V
µA
T j =2 5 C
-
-
40
T j =1 7 5 C
-
-
3000
Gate-emitter leakage current
IGES
V C E = 0V , V G E =2 0 V
-
-
100
nA
Transconductance
gfs
V C E = 20 V , I C = 40 A
-
22
-
S
Integrated gate resistor
RGint
Ω
-
Dynamic Characteristic
Input capacitance
Ciss
V C E = 25 V ,
-
2423
-
Output capacitance
Coss
V G E = 0V ,
-
113
-
Reverse transfer capacitance
Crss
f= 1 MH z
-
72
-
Gate charge
QGate
V C C = 48 0 V, I C =4 0 A
-
215
-
nC
-
13
-
nH
pF
V G E = 15 V
Internal emitter inductance
LE
measured 5mm (0.197 in.) from case
IFAG IPC TD VLS
2
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
Switching Characteristic, Inductive Load, at Tj=25 C
Parameter
Symbol
Conditions
Value
min.
Typ.
max.
-
-
-
-
-
-
-
186
-
-
66.3
-
-
-
-
-
0.92
-
-
0.92
-
Unit
IGBT Characteristic
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Ets
T j=25 C,
VCC=400V,IC=40A,
VGE=0/15V,rG=5.6
L =40nH, C=30pF
L , C f rom Fig. E
Energy losses include
“tail” and diode reverse
recovery.
ns
mJ
Anti-Parallel Diode Characteristic
Diode reverse recovery time
trr
T j =2 5 C ,
-
143
-
ns
Diode reverse recovery charge
Qrr
V R = 4 00 V , I F = 3 0 A,
-
0.92
-
µC
Diode peak reverse recovery current
Irrm
d i F / d t =9 1 0 A/ s
-
16.3
-
A
Diode peak rate of fall of reverse
recovery current during t b
d i r r /d t
-
603
-
A/s
Switching Characteristic, Inductive Load, at Tj=175 C
Parameter
Symbol
Conditions
Value
min.
Typ.
max.
-
-
-
-
-
-
-
196
-
-
76.5
-
-
-
-
-
1.4
-
-
1.4
-
Unit
IGBT Characteristic
Turn-on delay time
td(on)
Rise time
tr
Turn-off delay time
td(off)
Fall time
tf
Turn-on energy
Eon
Turn-off energy
Eoff
Total switching energy
Ets
T j=175 C,
VCC=400V,IC=40A,
VGE=0/15V,rG=5.6
L =40nH, C=30pF
L , C f rom Fig. E
Energy losses include
“tail” and diode reverse
recovery.
ns
mJ
Anti-Parallel Diode Characteristic
Diode reverse recovery time
trr
T j =1 7 5 C
-
225
-
ns
Diode reverse recovery charge
Qrr
V R = 4 00 V , I F = 3 0 A,
-
2.39
-
µC
Diode peak reverse recovery current
Irrm
d i F / d t =9 1 0 A/ s
-
22.3
-
A
Diode peak rate of fall of reverse
recovery current during t b
d i r r /d t
-
310
-
A/s
IFAG IPC TD VLS
3
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
140A
100A
120A
IC, COLLECTOR CURRENT
IC, COLLECTOR CURRENT
tp=1µs
100A
TC=80°C
80A
TC=110°C
60A
40A
Ic
20A
2µs
10A
10µs
50µs
DC
1A
1ms
10ms
0A
10Hz
100Hz
1kHz
10kHz
100kHz
1V
f, SWITCHING FREQUENCY
Figure 1. Collector current as a function of
switching frequency for triangular
current (Eon = 0, hard turn-off)
(Tj  175C, D = 0.5, VCE = 400V,
VGE = 0/15V, rG = 5.6)
10V
100V
1000V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 2. Safe operating area
(D = 0, TC = 25C, Tj 175C;
VGE=0/15V)
350W
300W
IC, COLLECTOR CURRENT
Ptot, POWER DISSIPATION
60A
250W
200W
150W
100W
40A
20A
50W
0W
25°C
50°C
75°C
100°C
125°C
0A
25°C
150°C
TC, CASE TEMPERATURE
Figure 3. Power dissipation as a function of
case temperature
(Tj  175C)
IFAG IPC TD VLS
4
75°C
125°C
TC, CASE TEMPERATURE
Figure 4. Collector current as a function of
case temperature
(VGE  15V, Tj  175C)
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
100A
VGE=20V
15V
IC, COLLECTOR CURRENT
IC, COLLECTOR CURRENT
100A
80A
13V
11V
60A
9V
7V
40A
80A
60A
0V
3V
VCE(sat), COLLECTOR-EMITTER SATURATION VOLTAGE
80A
60A
40A
TJ =175°C
25°C
0A
0V
2V
4V
6V
8V
10V
VGE, GATE-EMITTER VOLTAGE
Figure 7. Typical transfer characteristic
(VCE=20V)
IFAG IPC TD VLS
1V
2V
3V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 6. Typical output characteristic
(Tj = 175°C)
100A
20A
7V
40A
0A
2V
11V
9V
0A
1V
15V
13V
20A
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 5. Typical output characteristic
(Tj = 25°C)
IC, COLLECTOR CURRENT
VGE=20V
20A
0V
IHW40T60
q
2.5V
IC=80A
2.0V
IC=40A
1.5V
IC=20A
1.0V
0.5V
0.0V
0°C
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 8. Typical collector-emitter
saturation voltage as a function of
junction temperature
(VGE = 15V)
5
Rev. 2.1 10.12.2013
IHW40T60
q
TRENCHSTOP™ Series
100ns
td(off)
tf
t, SWITCHING TIMES
t, SWITCHING TIMES
td(off)
100ns
tf
10ns
10ns
0A
20A
40A

60A
IC, COLLECTOR CURRENT
Figure 9. Typical switching times as a
function of collector current
(inductive load, TJ=175°C,
VCE = 400V, VGE = 0/15V, rG = 5.6Ω,
Dynamic test circuit in Figure E)

RG, GATE RESISTOR
Figure 10. Typical switching times as a
function of gate resistor
(inductive load, TJ = 175°C,
VCE= 400V, VGE = 0/15V, IC = 40A,
Dynamic test circuit in Figure E)
VGE(th), GATE-EMITTER THRESHOLD VOLTAGE
6V
t, SWITCHING TIMES
td(off)
100ns
tf
10ns
25°C
50°C
75°C
100°C
125°C
150°C
5V
typ.
min.
4V
3V
25°C
TJ, JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature
(inductive load, VCE = 400V,
VGE = 0/15V, IC = 40A, rG=5.6Ω,
Dynamic test circuit in Figure E)
IFAG IPC TD VLS
max.
50°C
75°C
100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature
(IC = 0.8mA)
6
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
E, SWITCHING ENERGY LOSSES
E, SWITCHING ENERGY LOSSES
2.5mJ
Eoff
2.0mJ
1.5mJ
1.0mJ
0.5mJ
IHW40T60
q
2.0mJ
Eoff
1.5mJ
1.0mJ
0.5mJ
0.0mJ
0.0mJ
0A
10A
20A
30A
40A
50A
60A

70A
IC, COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, rG = 5.6Ω,
Dynamic test circuit in Figure E)


RG, GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, IC = 40A,
Dynamic test circuit in Figure E)
1.2mJ
E, SWITCHING ENERGY LOSSES
E, SWITCHING ENERGY LOSSES
1.4mJ
Eoff
1.0mJ
0.8mJ
0.6mJ
0.4mJ
0.2mJ
0.0mJ
25°C
50°C
75°C
Eoff
1.0mJ
0.5mJ
0.0mJ
300V
100°C 125°C 150°C
TJ, JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE = 400V,
VGE = 0/15V, IC = 40A, rG = 5.6Ω,
Dynamic test circuit in Figure E)
IFAG IPC TD VLS
1.5mJ
350V
400V
450V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ = 175°C,
VGE = 0/15V, IC = 40A, rG = 5.6Ω,
Dynamic test circuit in Figure E)
7
Rev. 2.1 10.12.2013
IHW40T60
q
TRENCHSTOP™ Series
1nF
120V
c, CAPACITANCE
VGE, GATE-EMITTER VOLTAGE
Ciss
12V
480V
9V
6V
Coss
100pF
3V
Crss
0V
0nC 30nC 60nC 90nC 120nC150nC180nC210nC
QGE, GATE CHARGE
Figure 17. Typical gate charge
(IC=40 A)
0V
10V
20V
30V
40V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 18. Typical capacitance as a function
of collector-emitter voltage
(VGE=0V, f = 1 MHz)
tSC, SHORT CIRCUIT WITHSTAND TIME
12µs
10µs
8µs
6µs
4µs
2µs
0µs
10V
11V
12V
13V
14V
VGE, GATE-EMITTETR VOLTAGE
Figure 19. Short circuit withstand time as a
function of gate-emitter voltage
(VCE=400V, start at TJ=25°C,
TJmax<150°C)
IFAG IPC TD VLS
8
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
0
D=0.5
0.2
-1
10 K/W
0.1
0.05
0.02
0.01
single pulse
-2
10 K/W
R,(K/W)
0.093
0.119
0.0828
0.0386
0.0221
R1
, (s)
8.74*10-2
1.07*10-2
7.49*10-4
8.85*10-5
7.39*10-6
R2
C 1 =  1 /R 1
C 2 =  2 /R 2
ZthJC, TRANSIENT THERMAL IMPEDANCE
ZthJC, TRANSIENT THERMAL IMPEDANCE
10 K/W
D=0.5
0.2
0.1
-1
10 K/W
0.02 R 1
10µs
100µs
1ms
C 1 =  1 /R 1
C 2 =  2 /R 2
single pulse
tP, PULSE WIDTH
Figure 21. Diode transient thermal
impedance as a function of pulse
width
(D=tP/T)
TJ=175°C
200ns
150ns
100ns
TJ=25°C
50ns
800A/µs
2.0µC
1.5µC
1.0µC
T J =25°C
0.5µC
0.0µC
700A/µs
900A/µs 1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 22. Typical reverse recovery time as
a function of diode current slope
(VR=400V, IF=30A,
Dynamic test circuit in Figure E)
IFAG IPC TD VLS
Qrr, REVERSE RECOVERY CHARGE
T J =175°C
250ns
trr, REVERSE RECOVERY TIME
R2
10 K/W
100ns 1µs 10µs 100µs 1ms 10ms100ms
10ms 100ms
tP, PULSE WIDTH
Figure 20. IGBT transient thermal
impedance
(D = tp / T)
0ns
700A/µs
, (s)
1.26*10-1
9.7*10-3
1.4*10-3
1.51*10-4
0.01
-2
1µs
R,(K/W)
0.151
0.223
0.05 0.273
0.111
9
800A/µs
900A/µs
1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 23. Typical reverse recovery charge
as a function of diode current
slope
(VR = 400V, IF = 30A,
Dynamic test circuit in Figure E)
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
T J=25°C
20A
T J =25°C
15A
10A
5A
dirr/dt, DIODE PEAK RATE OF FALL
OF REVERSE RECOVERY CURRENT
Irr, REVERSE RECOVERY CURRENT
T J =175°C
800A/µs
900A/µs
1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 24. Typical reverse recovery current
as a function of diode current
slope
(VR = 400V, IF = 30A,
Dynamic test circuit in Figure E)
T J=175°C
-300A/µs
-150A/µs
800A/µs
900A/µs
1000A/µs
diF/dt, DIODE CURRENT SLOPE
Figure 25. Typical diode peak rate of fall of
reverse recovery current as a
function of diode current slope
(VR=400V, IF=30A,
Dynamic test circuit in Figure E)
TJ=25°C
70A
175°C
60A
VF, FORWARD VOLTAGE
IF, FORWARD CURRENT
-450A/µs
0A/µs
700A/µs
0A
700A/µs
-600A/µs
50A
40A
30A
20A
2.0V
I F =60A
1.5V
30A
15A
1.0V
0.5V
10A
0.0V
0°C
0A
0V
1V
2V
VF, FORWARD VOLTAGE
Figure 26. Typical diode forward current as
a function of forward voltage
IFAG IPC TD VLS
10
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 27. Typical diode forward voltage as a
function of junction temperature
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IFAG IPC TD VLS
11
IHW40T60
q
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
i,v
tr r =tS +tF
diF /dt
Qr r =QS +QF
tr r
IF
tS
QS
Ir r m
tF
QF
10% Ir r m
dir r /dt
90% Ir r m
t
VR
Figure C. Definition of diodes
switching characteristics
1
2
r1
r2
n
rn
Tj (t)
p(t)
r1
r2
rn
Figure A. Definition of switching times
TC
Figure D. Thermal equivalent
circuit
Figure B. Definition of switching losses
IFAG IPC TD VLS
12
Rev. 2.1 10.12.2013
TRENCHSTOP™ Series
IHW40T60
q
Published by
Infineon Technologies AG
81726 Munich, Germany
© 2013 Infineon Technologies AG
All Rights Reserved.
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For further information on technology, delivery terms and conditions and prices, please contact the nearest
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Due to technical requirements, components may contain dangerous substances. For information on the
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The Infineon Technologies component described in this Data Sheet may be used in life-support devices or
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IFAG IPC TD VLS
13
Rev. 2.1 10.12.2013
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