ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 3.3-V/5-V HIGH-SPEED DIGITAL ISOLATORS FEATURES 1 • Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site • Extended Temperature Performance of –55°C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) • 4000-V(peak) Isolation – UL 1577, IEC 60747-5-2 (VDE 0884, Rev. 2) IEC 61010-1 – 50-kV/µs Transient Immunity Typical • 23 (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. • • • • • Signaling Rate 0 Mbps to 150 Mbps – Low Propagation Delay – Low Pulse Skew (Pulse-Width Distortion) Low-Power Sleep Mode High Electromagnetic Immunity Low Input Current Requirement Failsafe Output Drop-In Replacement for Most Opto and Magnetic Isolators APPLICATIONS • • • • Industrial Fieldbus – Modbus – Profibus – DeviceNet™ Data Buses – Smart Distributed Systems (SDS™) Computer Peripheral Interface Servo Control Interface Data Acquisition DESCRIPTION/ORDER INFORMATION The ISO721, ISO721M, ISO722, and ISO722M are digital isolators with a logic input and output buffer separated by a silicon oxide (SiO2) insulation barrier. This barrier provides galvanic isolation of up to 4000 V. Used in conjunction with isolated power supplies, these devices prevent noise currents on a data bus or other circuits from entering the local ground, and interfering with or damaging sensitive circuitry. A binary input signal is conditioned, translated to a balanced signal, then differentiated by the capacitive isolation barrier. Across the isolation barrier, a differential comparator receives the logic transition information, then sets or resets a flip-flop and the output circuit accordingly. A periodic update pulse is sent across the barrier to ensure the proper dc level of the output. If this dc-refresh pulse is not received for more than 4 µs, the input is assumed to be unpowered or not being actively driven, and the failsafe circuit drives the output to a logic high state. 1 2 3 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SDS is a trademark of Honeywell. DeviceNet is a trademark of Open Devicenet Vendors Association, Inc. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008, Texas Instruments Incorporated ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. FUNCTION DIAGRAM DC Channel Isolation Barrier + _ OSC + PWM Vref _ + POR BIAS Filter Pulse Width Demodulation Carrier Detect POR ISO722 Only IN Input + Filter + _ Vref _ Data MUX AC Detect 3-State Output Buffer EN OUT + AC Channel The symmetry of the dielectric and capacitor within the integrated circuitry provides for close capacitive matching, and allows fast transient voltage changes between the input and output grounds without corrupting the output. The small capacitance and resulting time constant provide for fast operation with signaling rates (2) from 0 Mbps (dc) to 100 Mbps for the ISO721/ISO722, and 0 Mbps to 150 Mbps with the ISO721M/ISO722M. These devices require two supply voltages of 3.3 V, 5 V, or any combination. All inputs are 5-V tolerant when supplied from a 3.3-V supply and all outputs are 4-mA CMOS. The ISO721 has TTL input thresholds and a noise-filter at the input that prevents transient pulses of up to 2 ns in duration from being passed to the output of the device. The ISO721M has CMOS VCC/2 input thresholds, but do not have the noise filter and the additional propagation delay. These features of the ISO721M also provide for reduced jitter operation. The ISO721M is characterized for operation over the ambient temperature range of –55°C to 125°C. (2) 2 The signaling rate of a line is the number of voltage transitions that are made per second expressed in the units bps (bits per second). 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SLLS882 – JUNE 2008 IN 2 VCC1 3 8 VCC2 Isolation VCC1 1 D PACKAGE ISO722, ISO722M (TOP VIEW) VCC1 1 7 GND2 IN 2 VCC1 3 6 OUT GND1 4 5 GND2 GND1 4 Isolation D PACKAGE ISO721, ISO721M (TOP VIEW) 8 VCC2 7 EN 6 OUT 5 GND2 AVAILABLE OPTIONS (1) PRODUCT (2) OUTPUT ENABLED INPUT THRESHOLDS NOISE FILTER PACKAGE ISO721 (3) ISO721M NO TTL YES SOIC-8 - - NO CMOS NO SOIC-8 721MEP ISO721MMDREP (reel) ISO722 (3) YES TTL YES SOIC-8 - - ISO722M (3) YES CMOS NO SOIC-8 - - (1) (2) (3) TOP-SIDE MARKING ORDERING NUMBER GREEN Pb Free Sb/Br Free For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. Product Preview REGULATORY INFORMATION VDE CSA UL Certified according to IEC 60747-5-2 Approved under CSA Component Acceptance Notice: CA-5A Recognized under 1577 Component Recognition Program (1) File Number: 40014131 File Number: 1698195 File Number: E181974 (1) Production tested ≥ 3000 VRMS for 1 second in accordance with UL 1577. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 3 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com ABSOLUTE MAXIMUM RATINGS (1) UNIT (2) VCC Supply voltage VI Voltage at IN, OUT, or EN terminal IO Output Current ESD Electrostatic discharge TJ Maximum junction temperature (1) (2) , VCC1, VCC2 –0.5 V to 6 V –0.5 V to 6 V ±15 mA Human-Body Model JEDEC Standard 22, Test Method A114-C.01 Charged-Device Model JEDEC Standard 22, Test Method C101 ±2 kV All pins ±1 kV 170°C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values except differential I/O bus voltages are with respect to network ground terminal and are peak voltage values. Vrms values are not listed in this publication. RECOMMENDED OPERATING CONDITIONS MIN VCC Supply voltage, VCC1, VCC2 IOH High-level output current IOL Low-level output current tui Input pulse width VIH High-level input voltage (IN, EN) VIL Low-level input voltage (IN, EN) VIH High-level input voltage (IN, EN) VIL Low-level input voltage (IN, EN) TJ Junction temperature H External magnetic field intensity per IEC 61000-4-8 and IEC 61000-4-9 certification TYP MAX 4.5 5.5 3 3.6 4 UNIT V mA -4 ISO72x 10 ISO72xM ns 6.67 ISO72x IOS72xM 2 VCC 0 0.8 0.7 VCC VCC 0 0.3 VCC See the Thermal Characteristics table V V 150 °C 1000 A/m SPECIFICATIONS UNIT 560 V After Input/Output Safety Test Subgroup 2/3 VPR = VIORM × 1.2, t = 10 s, Partial discharge < 5 pC 672 V Method a, VPR = VIORM × 1.6, Type and sample test with t = 10 s, Partial discharge < 5 pC 896 V Method b1, VPR = VIORM × 1.875, 100 % Production test with t = 1 s, Partial discharge < 5 pC 1050 V IEC 60747-5-2 INSULATION CHARACTERISTICS (1) over recommended operating conditions (unless otherwise noted) PARAMETER VIORM VPR TEST CONDITIONS Maximum working insulation voltage Input to output test voltage VIOTM Transient overvoltage t = 60 s 4000 V RS Insulation resistance VIO = 500 V at TS >109 Ω Pollution degree (1) 4 2 Climatic Classification 40/125/21 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 ELECTRICAL CHARACTERISTICS: VCC1 and VCC2 5 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS Quiescent ICC1 VCC1 supply current ICC2 VCC2 supply current VOH High-level output voltage VOL Low-level output voltage MIN VI = VCC or 0 V, No load 25 Mbps TYP MAX 0.5 1 2 4 Quiescent VI = VCC or 0 V, No load 8 12 25 Mbps VI = VCC or 0 V, No load 10 14 IOH = -4 mA, See Figure 1 VCC – 0.8 4.6 IOH = –20 µA, See Figure 1 VCC – 0.1 5 mA mA V IOL = 4 mA, See Figure 1 0.2 0.4 IOL = 20 µA, See Figure 1 0 0.1 VI(HYS) Input voltage hysteresis UNIT V 150 IIH High-level input current IN at 2 V IIL Low-level input current IN at 0.8 V IOZ High-impedance output current CI Input capacitance to ground IN at VCC, VI = 0.4 sin (4E6πt) CMTI Common-mode transient immunity VI = VCC or 0 V, See Figure 5 ISO722, ISO722M mV 10 µA –10 EN, IN at VCC µA 1 25 1 pF 50 kV/µs SWITCHING CHARACTERISTICS: VCC1 and VCC2 5 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS tPLH Propagation delay, low-to-high-level output tPHL Propagation delay , high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tPLH Propagation delay, low-to-high-level output tPHL Propagation delay, high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tsk(pp) (1) Part-to-part skew tr Output signal rise time tf Output signal fall time tpHZ Sleep-mode propagation delay, high-level-to-high-mpedance output tpZH Sleep-mode propagation delay, high-impedance-to-high-level output tpLZ Sleep-mode propagation delay, low-level-to-high-impedance output UNIT ISO72x 17 ns 0.5 EN at 0 V, See Figure 1 2 ISO721M 2 10 16 10 16 0.5 1 1 1 ns ns 8 ns 4 µs 8 ns 5 µs 3 µs See Figure 2 ISO722 ISO722M See Figure 3 tfs Failsafe output delay time from input power loss ISO72x See Figure 4 100 Mbps NRZ data input, See Figure 6 2 100 Mbps unrestricted bit run length data input, See Figure 6 3 150 Mbps NRZ data input, See Figure 6 1 ISO72xM 150 Mbps unrestricted bit run length data input, See Figure 6 (1) MAX 17 EN at 0 V, See Figure 1 Sleep-mode propagation delay, high-impedance-to-low-level output Peak-to-peak eye-pattern jitter TYP 3 tpZL tjit(PP) MIN ns 2 tsk(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 5 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com ELECTRICAL CHARACTERISTICS: VCC1 at 5 V, VCC2 at 3.3 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS Quiescent ICC1 VCC1 supply current ICC2 VCC2 supply current VOH High-level output voltage VOL Low-level output voltage MIN VI = VCC or 0 V, No load 25 Mbps TYP MAX 0.5 1 2 4 Quiescent VI = VCC or 0 V, No load 4 6.5 25 Mbps VI = VCC or 0 V, No load 5 7.5 IOH = –4 mA, See Figure 1 VCC – 0.4 3 IOH = –20 µA, See Figure 1 VCC – 0.1 3.3 mA mA V IOL = 4 mA, See Figure 1 0.2 0.4 IOL = 20 µA, See Figure 1 0 0.1 VI(HYS) Input voltage hysteresis UNIT V 150 IIH High-level input current IN at 2 V IIL Low-level input current IN at 0.8 V IOZ High-impedance output current CI Input capacitance to ground IN at VCC, VI = 0.4 sin (4E6πt) CMTI Common-mode transient immunity VI = VCC or 0 V, See Figure 5 ISO722, ISO722M mV 10 µA –10 EN, IN at VCC µA 1 1 pF 25 40 kV/µs MIN TYP SWITCHING CHARACTERISTICS: VCC1 at 5 V, VCC2 at 3.3 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS tPLH Propagation delay, low-to-high-level output tPHL Propagation delay , high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tPLH Propagation delay, low-to-high-level output tPHL Propagation delay, high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tsk(pp) (1) Part-to-part skew tr Output signal rise time tf Output signal fall time tpHZ Sleep-mode propagation delay, high-level-to-high-mpedance output tpZH Sleep-mode propagation delay, high-impedance-to-high-level output tpLZ Sleep-mode propagation delay, low-level-to-high-impedance output 19 EN at 0 V, See Figure 1 3 ISO721M 3 12 20 12 20 0.5 1 2 2 ISO722 ISO722M ns ns 11 ns 6 µs 13 ns 6 µs 3 µs See Figure 3 Failsafe output delay time from input power loss ISO72x See Figure 4 100 Mbps NRZ data input, See Figure 6 2 100 Mbps unrestricted bit run length data input, See Figure 6 3 150 Mbps NRZ data input, See Figure 6 1 ISO72xM 150 Mbps unrestricted bit run length data input, See Figure 6 6 ns See Figure 2 tfs (1) UNIT 0.5 EN at 0 V, See Figure 1 Sleep-mode propagation delay, high-impedance-to-low-level output Peak-to-peak eye-pattern jitter ISO72x 5 tpZL tjit(PP) MAX 19 ns 2 tsk(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. 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SLLS882 – JUNE 2008 ELECTRICAL CHARACTERISTICS: VCC1 at 3.3 V, VCC2 at 5 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS Quiescent ICC1 VCC1 supply current ICC2 VCC2 supply current VOH High-level output voltage VOL Low-level output voltage MIN VI = VCC or 0 V, No load 25 Mbps TYP MAX 0.3 0.5 1 2 Quiescent VI = VCC or 0 V, No load 8 12 25 Mbps VI = VCC or 0 V, No load 10 14 IOH = –4 mA, See Figure 1 VCC – 0.8 4.6 IOH = –20 µA, See Figure 1 VCC – 0.1 5 mA mA V IOL = 4 mA, See Figure 1 0.2 0.4 IOL = 20 µA, See Figure 1 0 0.1 VI(HYS) Input voltage hysteresis UNIT V 150 IIH High-level input current IN at 2 V IIL Low-level input current IN at 0.8 V IOZ High-impedance output current CI Input capacitance to ground IN at VCC, VI = 0.4 sin (4E6πt) CMTI Common-mode transient immunity VI = VCC or 0 V, See Figure 5 ISO722, ISO722M mV 10 µA –10 EN, IN at VCC µA 1 25 1 pF 40 kV/µs SWITCHING CHARACTERISTICS: VCC1 at 3.3 V, VCC2 at 5 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS tPLH Propagation delay, low-to-high-level output tPHL Propagation delay , high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tPLH Propagation delay, low-to-high-level output tPHL Propagation delay, high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tsk(pp) (1) Part-to-part skew tr Output signal rise time tf Output signal fall time tpHZ Sleep-mode propagation delay, high-level-to-high-mpedance output tpZH Sleep-mode propagation delay, high-impedance-to-high-level output tpLZ Sleep-mode propagation delay, low-level-to-high-impedance output ISO72x UNIT 17 ns 0.5 EN at 0 V, See Figure 1 3 ISO721M 3 12 21 12 21 0.5 1 0 5 1 1 ISO722 ISO722M ns ns 9 ns 5 µs 9 ns 5 µs 3 µs See Figure 3 tfs Failsafe output delay time from input power loss ISO72x See Figure 4 100 Mbps NRZ data input, See Figure 6 2 100 Mbps unrestricted bit run length data input, See Figure 6 3 150 Mbps NRZ data input, See Figure 6 1 ISO72xM 150 Mbps unrestricted bit run length data input, See Figure 6 (1) MAX See Figure 2 Sleep-mode propagation delay, high-impedance-to-low-level output Peak-to-peak eye-pattern jitter TYP 17 EN at 0 V, See Figure 1 tpZL tjit(PP) MIN ns 2 tsk(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 7 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com ELECTRICAL CHARACTERISTICS: VCC1 and VCC2 at 3.3 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS Quiescent ICC1 VCC1 supply current ICC2 VCC2 supply current VOH High-level output voltage VOL Low-level output voltage MIN VI = VCC or 0 V, No load 25 Mbps TYP MAX 0.3 0.5 1 2 Quiescent VI = VCC or 0 V, No load 4 6.5 25 Mbps VI = VCC or 0 V, No load 5 7.5 IOH = –4 mA, See Figure 1 VCC – 0.4 3 IOH = –20 µA, See Figure 1 VCC – 0.1 3.3 mA mA V IOL = 4 mA, See Figure 1 0.2 0.4 IOL = 20 µA, See Figure 1 0 0.1 VI(HYS) Input voltage hysteresis UNIT V 150 IIH High-level input current IN at 2 V IIL Low-level input current IN at 0.8 V IOZ High-impedance output ISO722, ISO722M current EN, IN at VCC CI Input capacitance to ground IN at VCC, VI = 0.4 sin (4E6πt) CMTI Common-mode transient immunity VI = VCC or 0 V, See Figure 5 mV 10 µA –10 µA 1 25 1 pF 40 kV/µs SWITCHING CHARACTERISTICS: VCC1 and VCC2 at 3.3 V OPERATION over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS tPLH Propagation delay, low-to-high-level output tPHL Propagation delay , high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tPLH Propagation delay, low-to-high-level output tPHL Propagation delay, high-to-low-level output tsk(p) Pulse skew |tPHL – tPLH| tsk(pp) (1) Part-to-part skew tr Output signal rise time tf Output signal fall time tpHZ Sleep-mode propagation delay, high-level-to-high-mpedance output tpZH Sleep-mode propagation delay, high-impedance-to-high-level output tpLZ Sleep-mode propagation delay, low-level-to-high-impedance output ISO72x 20 ns 0.5 EN at 0 V, See Figure 1 3 ISO721M 3 12 25 12 25 0.5 1 2 2 ISO722 ISO722M ns ns 13 ns 6 µs 13 ns 6 µs 3 µs See Figure 3 Failsafe output delay time from input power loss ISO72x See Figure 4 100 Mbps NRZ data input, See Figure 6 2 100 Mbps unrestricted bit run length data input, See Figure 6 3 150 Mbps NRZ data input, See Figure 6 1 ISO72xM 150 Mbps unrestricted bit run length data input, See Figure 6 8 UNIT See Figure 2 tfs (1) MAX 20 EN at 0 V, See Figure 1 Sleep-mode propagation delay, high-impedance-to-low-level output Peak-to-peak eye-pattern jitter TYP 5 tpZL tjit(PP) MIN ns 2 tsk(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 ISOLATION BARRIER PARAMETER MEASUREMENT INFORMATION IN Input Generator NOTE A + VI 50 W - VCC1 IO OUT VCC1/2 VI 0V EN tPHL VOH tPLH + ISO722 and ISO722M VCC1/2 CL Note B VO - 90% 50% VO 50% 10% VOL tf tr ISOLATION BARRIER Figure 1. Switching Characteristic Test Circuit and Voltage Waveforms IN 3V Input Generator NOTE A VO OUT VCC2 VI VCC2/2 0V EN RL = 1 kW ±1 % CL NOTE B + tPZH VOH 50% VO VI VCC2/2 50 W 0.5 V 0V tPHZ - Figure 2. ISO722 Sleep-Mode High-Level Output Test Circuit and Voltage Waveforms ISOLATION BARRIER VCC2 IN 0V Input Generator NOTE A RL = 1 kW ±1% OUT EN CL NOTE B + VI VCC2 VI VO VCC2/2 0V tPZL VO VCC2/2 tPLZ 50% VCC2 0.5 V VOL 50 W - A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50 Ω. B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 3. ISO722 Sleep-Mode Low-Level Output Test Circuit and Voltage Waveforms Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 9 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com PARAMETER MEASUREMENT INFORMATION (continued) VCC1 0V IN ISOLATION BARRIER VI VCC1 VI OUT VO ISO722 and ISO722M 0V tfs VOH 50% VO CL 15 pF ±20% EN 2.7 V VOL NOTE: VI transition time is 100 ns VCC1 IN VCC or 0V CI = 0.1 mF, GND1 ISOLATION BARRIER Figure 4. Failsafe Delay Time Test Circuit and Voltage Waveforms VCC2 OUT GND2 ±1% CL 15 pF ±20% VO VCM NOTE: Pass/Fail criteria is no change in VO. Figure 5. Common-Mode Transient Immunity Test Circuit and Voltage Waveform 10 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 PARAMETER MEASUREMENT INFORMATION (continued) Tektronix HFS9009 Tektronix 784D PATTERN GENERATOR VCC1 In p u t 0V O u tp u t VCC2/2 J itte r NOTE: Bit pattern run length is 216 – 1. Transition Time is 800 ps. NRZ data input has no more than five consecutive ones or zeros. Figure 6. Peak-to-Peak Eye-Pattern Jitter Test Circuit and Voltage Waveform Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 11 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com DEVICE INFORMATION PACKAGE CHARACTERISTICS PARAMETER TEST CONDITIONS L(101) Minimum air gap (Clearance) (1) L(102) Minimum external tracking (Creepage) CTI RIO MIN TYP MAX UNIT Shortest terminal to terminal distance through air 4.8 mm Shortest terminal to terminal distance across the package surface 4.3 mm Tracking resistance (comparative tracking index) DIN IEC 60112/VDE 0303 Part 1 ≥ 175 V Minimum internal gap (internal clearance) Distance through insulation 0.008 mm >1012 Ω Isolation resistance Input to output, VIO = 500 V, all pins on each side of the barrier tied together creating a two-terminal device, TA < 100 °C Input to output, VIO = 500 V, 100°C ≤ TA< TA max. >1011 Ω CIO Barrier capacitance Input-to-output VI = 0.4 sin (4E6πt) 1 pF CI Input capacitance to ground VI = 0.4 sin (4E6πt) 1 pF (1) Creepage and clearance requirements are applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed circuit board do not reduce this distance. Creepage and clearance on a printed circuit board become equal according to the measurement techniques shown in the Isolation Glossary. Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications. IEC 60664-1 RATINGS TABLE PARAMETER TEST CONDITIONS Basic isolation group Installation classification SPECIFICATION Material group IIIa Rated mains voltage ≤150 VRMS I-IV Rated mains voltage ≤300 VRMS I-III DEVICE I/O SCHEMATIC Equivalent Input and Output Schematic Diagrams Input Enable Output VCC2 VCC2 VCC1 VCC2 VCC1 1 MW 8W OUT 500 W 500 W EN IN 13 W 1 MW 12 VCC1 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 IEC SAFETY LIMITING VALUES Safety limiting intends to prevent potential damage to the isolation barrier upon failure of input or output circuitry. A failure of the IO can allow low resistance to ground or the supply, and without current limiting, dissipate sufficient power to overheat the die and damage the isolation barrier, potentially leading to secondary system failures. PARAMETER TEST CONDITIONS IS Safety input, output, or supply current TS Maximum case temperature MIN TYP MAX θJA = 263°C/W, VI = 5.5 V, TJ = 170°C, TA = 25°C 100 θJA = 263°C/W, VI = 3.6 V, TJ = 170°C, TA = 25°C 153 150 UNIT mA °C The safety-limiting constraint is the absolute maximum junction temperature specified in the absolute maximum ratings table. The power dissipation and junction-to-air thermal impedance of the device installed in the application hardware determines the junction temperature. The junction-to-air thermal resistance in the Thermal Characteristics table is that of a device installed in the JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages and is conservative. The power is the recommended maximum input voltage times the current. The junction temperature is then the ambient temperature plus the power times the junction-to-air thermal resistance. THERMAL CHARACTERISTICS (over recommended operating conditions unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Low-K Thermal Resistance (1) 263 °C/W High-K Thermal Resistance (1) θJA Junction-to-Air 125 °C/W θJB Junction-to-Board Thermal Resistance 44 °C/W θJC Junction-to-Case Thermal Resistance 75 °C/W VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF, Input a 100 Mbps 50% duty cycle square wave 159 VCC1 = VCC2 = 5.5 V, TJ = 150°C, ISO72xM CL = 15 pF, Input a 150 Mbps 50% duty cycle square wave 195 ISO72x PD (1) Device Power Dissipation mW Tested in accordance with the Low-K or High-K thermal metric definition of EIA/JESD51-3 for leaded surface mount packages. 200 Safety Limiting Current − mA 175 VCC1, VCC2 = 3.6 V 150 125 100 75 VCC1, VCC2 = 5.5 V 50 25 0 0 50 100 150 200 o Case Temperature − C Figure 7. θJC THERMAL DERATING CURVE per IEC 60747-5-2 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 13 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com FUNCTION TABLE ISO721 (1) (1) VCC1 VCC2 PU PU PD PU INPUT (IN) OUTPUT (OUT) H H L L Open H X H PU = powered up (VCC ≥ 3 V); PD = powered down (VCC ≤ 2.5 V), X = irrelevant, H = high Level; L = low level ISO722 (1) VCC1 (1) 14 VCC2 INPUT (IN) ISO722/ISO722M OUTPUT ENABLE (EN) OUTPUT (OUT) H L or Open H L L or Open L X H Z PU PU Open L or Open H PD PU X L or Open H PD PU X H Z PU = powered up (VCC ≥ 3 V); PD = powered down (VCC ≤ 2.5 V), X = irrelevant, H = high Level; L = low level Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 TYPICAL CHARACTERISTICS RMS SUPPLY CURRENT vs SIGNALING RATE RMS SUPPLY CURRENT vs SIGNALING RATE 15 10 VCC1 = 3.3 V, VCC2 = 3.3 V, o TA = 25 C, CL = 15 pF 8 VCC1 = 5 V, VCC2 = 5 V, o TA = 25 C, CL = 15 pF 14 13 ICC − Supply Current − (mARMS) ICC − Supply Current − (mARMS) 9 7 6 ICC2 5 4 3 ICC1 2 12 11 10 ICC2 9 8 7 ICC1 6 5 4 3 2 1 1 0 0 0 25 50 75 100 0 25 Signaling Rate (Mbps) 100 Figure 9. PROPAGATION DELAY vs FREE-AIR TEMPERATURE PROPAGATION DELAY vs FREE-AIR TEMPERATURE 20 25 16 tPLH 15 tPHL ISO72xM 10 VCC1 = 3.3 V, VCC2 = 3.3 V, CL = 15 pF, Air Flow at 7 cf/m 5 -10 5 20 35 50 65 80 95 Propagation Delay − ns 20 -25 ISO72x tPHL tPHL ISO72x 0 -40 tPLH 18 tPLH Propagation Delay − ns 75 Figure 8. 30 14 tPLH 12 tPHL 10 8 ISO72xM 6 VCC1 = 5 V, VCC2 = 5 V, CL = 15 pF, Air Flow at 7 cf/m 4 2 0 -40 110 125 -25 -10 TA − Free-Air Temperature − oC 20 35 50 65 80 95 110 125 Figure 10. Figure 11. ISO72x INPUT THRESHOLD VOLTAGE vs FREE-AIR TEMPERATURE ISO72xM INPUT THRESHOLD VOLTAGE vs FREE-AIR TEMPERATURE 2.5 5-V (VIT+) 2.4 1.3 3.3-V (VIT+) 1.25 1.2 Air Flow at 7 cf/m 1.15 5-V (VIT- ) 1.1 VIT − Input Voltage Threshold − V 1.35 5-V (VIT+) 2.3 2.2 5-V (VIT-) 2.1 2 Air Flow at 7 cf/m 1.9 1.8 3.3-V (VIT+) 1.7 1.6 1.05 3.3-V (VIT- ) 1 -40 5 TA − Free-Air Temperature − oC 1.4 VIT − Input Voltage Threshold − V 50 Signaling Rate (Mbps) -25 -10 5 20 35 50 3.3-V (VIT-) 1.5 65 80 95 110 125 1.4 -40 -25 TA − Free-Air Temperature − oC -10 5 20 35 50 65 80 95 110 125 TA − Free-Air Temperature − oC Figure 12. Figure 13. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 15 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com TYPICAL CHARACTERISTICS (continued) HIGH-LEVEL OUTPUT CURRENT vs HIGH-LEVEL OUTPUT VOLTAGE 2.92 -80 2.9 -70 IOH − High-Level Output Current − mA VCC1 Failsafe Voltage − V VCC1 FAILSAFE THRESHOLD VOLTAGE vs FREE-AIR TEMPERATURE Vfs+ 2.88 VCC = 5 V or 3.3 V, CL = 15 pF, Air Flow at 7 cf/m 2.86 2.84 2.82 Vfs- 2.8 2.78 -40 o TA = 25 C VCC = 5 V -60 -50 -40 VCC = 3.3 V -30 -20 -10 0 -25 -10 5 20 35 50 80 65 95 0 110 125 1 2 3 4 5 6 VOH − High-Level Output Voltage − V TA − Free-Air Temperature − oC Figure 14. Figure 15. LOW-LEVEL OUTPUT CURRENT vs LOW-LEVEL OUTPUT VOLTAGE 70 o IOL − Low-Level Output Current − mA TA = 25 C 60 VCC = 5 V 50 40 30 VCC = 3.3 V 20 10 0 0 1 2 3 4 5 VOL − Low-Level Output Voltage − V Figure 16. 16 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 APPLICATION INFORMATION MANUFACTURER CROSS-REFERENCE DATA The ISO72xx isolators have the same functional pinout as most other vendors, and they are often pin-for-pin drop-in replacements. The notable differences in the products are propagation delay, signaling rate, power consumption, and transient protection rating. Table 1 is used as a guide for replacing other isolators with the ISO72x family of single channel isolators. GND1 4 IN 2 VCC1 3 6 OUT 5 GND2 8 VCC2 7 GND2 6 OUT 5 GND2 GND1 4 VI 2 VDD1 3 GND1 4 VDD1 1 VI 2 * 3 GND1 4 IL710 8 VDD2 7 NC VDD1 1 VI 2 6 VO 5 GND2 NC 3 GND1 4 8 VDD2 7 VOE Isolation VCC1 1 7 EN 8 VDD2 7 GND2 6 VO 5 GND2 Isolation 8 VCC2 HCPL-xxxx ADuM1100 VDD1 1 Isolation IN 2 VCC1 3 ISO721 or ISO721M Isolation VCC1 1 Isolation ISO722 or ISO722M 6 VO 5 GND2 Figure 17. Pin Cross Reference Table 1. CROSS REFERENCE PIN 7 ISOLATOR PIN 1 PIN 2 PIN 3 PIN 4 PIN 5 PIN 6 ISO721 OR ISO721M ISO721 (1) (2) VCC1 IN VCC1 GND1 GND2 OUT GND2 ADuM1100 (1) (2) VDD1 VI VDD1 GND1 GND2 VO GND2 VDD2 HCPL-xxxx VDD1 VI *Leave Open (3) GND1 GND2 VO NC (4) VDD2 IL710 VDD1 VI NC (5) GND1 GND2 VO VOE VDD2 (1) (2) (3) (4) (5) ISO722 OR ISO722M PIN 8 EN VCC2 The ISO72xx pin 1 and pin 3 are internally connected together. Either or both may be used as VCC1. The ISO721 and ISO721M pin 5 and pin 7 are internally connected together. Either or both may be used as GND2. Pin 3 of the HCPL devices must be left open. This is not a problem when substituting an ISO72xx device since the extra VCC1 on pin 3 may be left an open circuit as well. An HCPL device PIN 7 must be left floating (open) or grounded when an ISO722 or ISO722M device is to be used as a drop-in replacement. If pin 7 of the ISO722 or ISO722M device is placed in a high logic state, the output of the device is disabled Pin 3 of the IL710 must not be tied to ground on the circuit board since this shorts the ISO72xx's VCC1 to ground. The IL710 pin 3 may only be tied to VCC or left open to drop in an ISO72xx. VCC1 VCC2 0.1mF INPUT 20 mm max . from Vcc1 ISO721 or ISO721M 1 8 20 mm max. from Vcc2 2 IN 7 6 3 OUT 4 5 GND1 0.1mF OUTPUT GND2 Figure 18. Basic Application Circuit Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 17 ISO721M-EP SLLS882 – JUNE 2008....................................................................................................................................................................................................... www.ti.com ISOLATION GLOSSARY Creepage Distance — The shortest path between two conductive input-to-output leads measured along the surface of the insulation. The shortest distance path is found around the end of the package body. Clearance — The shortest distance between two conductive input-to-output leads measured through air (line of sight). Input-to-Output Barrier Capacitance -- The total capacitance between all input terminals connected together, and all output terminals connected together. Input-to-Output Barrier Resistance -- The total resistance between all input terminals connected together, and all output terminals connected together. Primary Circuit -- An internal circuit directly connected to an external supply mains or other equivalent source that supplies the primary circuit electric power. Secondary Circuit -- A circuit with no direct connection to primary power, and derives its power from a separate isolated source. Comparative Tracking Index (CTI) -- CTI is an index used for electrical insulating materials. It is defined as the numerical value of the voltage that causes failure by tracking during standard testing. Tracking is the process that produces a partially conducting path of localized deterioration on or through the surface of an insulating material as a result of the action of electric discharges on or close to an insulation surface -- the higher CTI value of the insulating material, the smaller the minimum creepage distance. Generally, insulation breakdown occurs either through the material, over its surface, or both. Surface failure may arise from flashover or from the progressive degradation of the insulation surface by small localized sparks. Such sparks are the result of the breaking of a surface film of conducting contaminant on the insulation. The resulting break in the leakage current produces an overvoltage at the site of the discontinuity, and an electric spark is generated. These sparks often cause carbonization on insulation material and lead to a carbon track between points of different potential. This process is known as tracking. 18 Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP ISO721M-EP www.ti.com....................................................................................................................................................................................................... SLLS882 – JUNE 2008 Insulation: Operational insulation -- Insulation needed for the correct operation of the equipment. Basic insulation -- Insulation to provide basic protection against electric shock. Supplementary insulation -- Independent insulation applied in addition to basic insulation in order to ensure protection against electric shock in the event of a failure of the basic insulation. Double insulation -- Insulation comprising both basic and supplementary insulation. Reinforced insulation -- A single insulation system which provides a degree of protection against electric shock equivalent to double insulation. Pollution Degree: Pollution Degree 1 -- No pollution, or only dry, nonconductive pollution occurs. The pollution has no influence. Pollution Degree 2 -- Normally, only nonconductive pollution occurs. However, a temporary conductivity caused by condensation must be expected. Pollution Degree 3 -- Conductive pollution occurs or dry nonconductive pollution occurs, which becomes conductive due to condensation that is to be expected. Pollution Degree 4 – Continuous conductivity occurs due to conductive dust, rain, or other wet conditions. Installation Category: Overvoltage Category -- This section is directed at insulation co-ordination by identifying the transient overvoltages that may occur, and by assigning four different levels as indicated in IEC 60664. 1. Signal Level -- Special equipment or parts of equipment. 2. Local Level -- Portable equipment etc. 3. Distribution Level -- Fixed installation 4. Primary Supply Level -- Overhead lines, cable systems Each category should be subject to smaller transients than the category above. Submit Documentation Feedback Copyright © 2008, Texas Instruments Incorporated Product Folder Link(s): ISO721M-EP 19 PACKAGE OPTION ADDENDUM www.ti.com 23-Jan-2010 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Eco Plan (2) Qty ISO721MMDREP ACTIVE SOIC D 8 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM ISO721MMDREPG4 ACTIVE SOIC D 8 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM V62/08627-01XE ACTIVE SOIC D 8 2500 Green (RoHS & no Sb/Br) CU NIPDAU Level-1-260C-UNLIM Lead/Ball Finish MSL Peak Temp (3) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. 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