Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM Document Title 1M x 16 bit Single Transistor RAM Revision History Revision No. History Draft Date Remark 0.0 Initial Draft Jun. 07 , 2005 Preliminary 0.1 2’nd Draft Add net die and pad coordinates Emerging Memory & Logic Solutions Inc. Aug. 22 , 2005 4F Korea Construction Financial Cooperative B/D, 301-1 Yeon-Dong, Jeju-Si, Jeju-Do, Rep.of Korea Tel : +82-64-740-1700 Fax : +82-64-740-1749~1750 / Homepage : www.emlsi.com Zip Code : 690-717 The attached datasheets are provided by EMLSI reserve the right to change the specifications and products. EMLSI will answer to your questions about device. If you have any questions, please contact the EMLSI office. 1 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM 1M x16 bit Single Transistor RAM GENERAL DESCRIPTION The EM7164SU16 is 16,777,216 bits of Single Transistor RAM which uses DRAM type memory cells, but this device has refresh-free operation and extreme low power consumption technology. Furthermore the interface is compatible to a low power Asynchronous type SRAM. The EM7164SU16 is organized as 1,048,576 Words x 16 bit. FEATURES - Organization :1M x16 - Power Supply Voltage : 2.7 ~ 3.3V - Separated I/O power(VccQ) & Core power(Vcc) - Three state outputs - Byte read/write control by UB/LB - Support Direct Deep Power Down control by ZZ and Auto TCSR for power saving PRODUCT FAMILY Part Number EM7164SU16W Operating Temp. -25oC to 85oC Power Supply 2.7V to 3.3V Speed (tRC) 70ns Power Dissipation Standby (ISB1, Max.) Operating (ICC2, Max.) 80uA FUNCTION BLOCK DIAGRAM /ZZ /CS /UB /LB /WE /OE CONTROL LOGIC A0~A19 ADDRESS DECODER DQ0~ DQ15 Self-Refresh CONTROL ROW SELECT COLUMN SELECT Memory Array 1M X 16 Din/Dout BUFFER I/O CIRCUIT 2 25mA Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM 1M x16 bit Single Transistor RAM GENERAL WAFER SPECIFICATIONS 1 60 - Process Technology : 0.13um CMOS Deep trench process - 3 Metal layers including local inter-connection - Wafer thickness : 725 +/- 25um - Minimum Pad Pitch : 100um - Wafer diameter : 8-inch PAD DESCRIPTION + 30 y x DEVICE CODE (EM716XSU16) 31 32 Name (0.0) 3 Function Name Function /CS Chip select inputs /LB Lower byte (DQ0~7) /OE Output enable input /UB Upper byte (DQ8~15) /WE Write enable input VCC Power supply /ZZ Low Power Control VCCQ I/O Power supply DQ0-15 Data In-out VSS(Q) Ground A0-19 NC Address inputs No connection Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM ABSOLUTE MAXIMUM RATINGS 1) Parameter Symbol Ratings Unit Voltage on Any Pin Relative to Vss VIN, VOUT -0.2 to VCCQ+0.3V V Voltage on Vcc supply relative to Vss VCC, VCCQ -0.22) to 3.6V V Power Dissipation Storage Temperature Operating Temperature PD 1.0 W TSTG -65 to 150 oC TA -25 to 85 oC 1. Stresses greater than those listed above “Absolute Maximum Ratings” may cause permanent damage to the device. Functional operation should be restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Undershoot at power-off : -1.0V in case of pulse width < 20ns FUNCTIONAL DESCRIPTION CS ZZ OE WE LB UB DQ0~7 DQ8~15 Mode Power H H X X X X High-Z High-Z Deselected Stand by X L X X X X High-Z High-Z Deselected Deep Power Down X H X X H H High-Z High-Z Deselected Stand by L H H H L X High-Z High-Z Output Disabled Active L H H H X L High-Z High-Z Output Disabled Active L H L H L H Data Out High-Z Lower Byte Read Active L H L H H L High-Z Data Out Upper Byte Read Active L H L H L L Data Out Data Out Word Read Active L H X L L H Data In High-Z Lower Byte Write Active L H X L H L High-Z Data In Upper Byte Write Active L H X L L L Data In Data In Word Write Active Note: X means don’t care. (Must be low or high state) 4 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM RECOMMENDED DC OPERATING CONDITIONS 1) Parameter Symbol Min Typ Max Unit VCC 2.7 3.0 3.3 V VCCQ 2.7 3.0 3.3 V VSS, VSSQ 0 0 0 V Input high voltage VIH 0.8 * VCCQ - VCCQ + 0.22) V Input low voltage VIL - 0.2 * VCCQ V Supply voltage Ground 1. 2. 3. 4. -0.23) TA= -25 to 85oC, otherwise specified Overshoot: VCC +1.0 V in case of pulse width < 20ns Undershoot: -1.0 V in case of pulse width < 20ns Overshoot and undershoot are sampled, not 100% tested. CAPACITANCE1) (f =1MHz, TA=25oC) Item Symbol Test Condition Min Max Unit Input capacitance CIN VIN=0V - 8 pF Input/Ouput capacitance CIO VIO=0V - 8 pF 1. Capacitance is sampled, not 100% tested DC AND OPERATING CHARACTERISTICS Parameter Symbol Test Conditions Min Typ Max Unit Input leakage current ILI VIN=VSS to VCCQ , VCC=VCCmax -1 - 1 uA Output leakage current ILO CS=VIH , /ZZ=VIH , OE=VIH or WE=VIL , VIO=VSS to VCCQ , VCC=VCCmax -1 - 1 uA ICC1 Cycle time=1µs, 100% duty, IIO=0mA, CS<0.2V, ZZ=VIH , VIN<0.2V or VIN>VCCQ-0.2V - - 3 mA ICC2 Cycle time = Min, IIO=0mA, 100% duty, CS=VIL, ZZ=VIH, VIN=VIL or VIH - - 25 mA Output low voltage VOL IOL = 0.5mA, VCC=VCCmin - - 0.2*VCCQ V Output high voltage VOH IOH = -0.5mA, VCC=VCCmin 0.8*VCCQ - - V Standby Current (CMOS) ISB1 - - 80 uA Average operating current CS,ZZ>VCCQ-0.2V, Other inputs = 0 ~ VCCQ (Typ. condition : VCC=3.0V @ 25oC) (Max. condition : VCC=3.3V @ 85oC) 1. Maximum Icc specifications are tested with VCC = VCCmax. 5 LL Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM AC OPERATING CONDITIONS Test Conditions (Test Load and Test Input/Output Reference) Dout Input Pulse Level : 0.2V to VCCQ-0.2V Input Rise and Fall Time : 5ns Input and Output reference Voltage : VCCQ/2 CL1) 1) Output Load (See right) : CL = 30pF 1. Including scope and Jig capacitance AC CHARACTERISTICS (Vcc = 2.7 to 3.3V, Gnd = 0V, TA = -25C to +85oC) Symbol Parameter List Read Write Speed Min Max Unit Read Cycle Time tRC 70 40k ns Address access time tAA - 70 ns Chip enable to data output tCO - 70 ns Output enable to valid output tOE - 25 ns UB, LB enable to data output tBA - 70 ns Chip enable to low-Z output tLZ 10 - ns UB, LB enable to low-Z output tBLZ 10 - ns Output enable to low-Z output tOLZ 5 - ns Chip disable to high-Z output tHZ 0 15 ns UB, LB disable to high-Z output tBHZ 0 15 ns Output disable to high-Z output tOHZ 0 15 ns Output hold from Address change tOH 5 - ns Write Cycle Time tWC 70 40k ns Chip enable to end of write tCW 60 - ns Address setup time tAS 0 - ns Address valid to end of write tAW 60 - ns UB, LB valid to end of write tBW 60 - ns Write pulse width tWP 50 - ns Write recovery time tWR 0 - ns Write to output high-Z tWHZ 0 15 ns Data to write time overlap tDW 20 - ns Data hold from write time tDH 0 - ns End write to output low-Z tOW 5 - ns 6 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM TIMING DIAGRAMS READ CYCLE (1) (Address controlled, CS=OE=VIL, ZZ=WE=VIH, UB or/and LB=VIL) tRC Address tAA tOH Data Out Previous Data Valid Data Valid READ CYCLE (2) (ZZ=WE=VIH) tRC Address tAA CS tOH tCO tHZ tBA LB, UB tBHZ tOE OE Data Out High-Z tOHZ tOLZ Data Vaild tBLZ tLZ NOTES (READ CYCLE) 1. tHZ , tBHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels. 2. Do not Access device with cycle timing shorter than tRC for continuous periods > 40us. 7 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM WRITE CYCLE (1) (WE controlled, ZZ=OE=VIH) tWC Address tAW tCW CS tBW LB, UB WE tAS Data In tWR tWP tDW High-Z tDH Data Valid tWHZ Data Out tOW Data Undefined WRITE CYCLE (2) (CS controlled, ZZ=OE=VIH) tWC Address tAS CS tWR tCW tAW LB, UB tBW WE tWP tDW Data In Data Out Data Valid High-Z 8 tDH Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM WRITE CYCLE (3) (UB, LB controlled, ZZ=OE=VIH) tWC Address tWR tCW CS tAW LB, UB tAS tBW tWP WE tDW Data In Data Out tDH Data Valid High-Z NOTES (WRITE CYCLE) 1. A write occurs during the overlap(tWP) of low CS, low WE and low UB or LB. A write begins at the last transition among low CS and low WE with asserting UB or LB low for single byte operation or simultaneously asserting UB and LB low for word operation. A write ends at the earliest transition among high CS and high WE. The tWP is measured from the beginning of write to the end of write. 2. tCW is measured from CS going low to end od write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. tWR applied in case a write ends as CS or WE going high. 5. Do not Access device with cycle timing shorter than tWC for continuous periods > 40us. 9 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM LOW POWER MODES ~ ~~ ~ Deep Power Down Mode Entry/Exit CS tZZCS tCSZZ tZZP ~ ~ ZZ Deep Power Down Entry tR Normal operation Deep Power Down Exit NOTES ( DEEP POWER DOWN ) During Deep Power Down mode, all referesh related activity are disabled. Parameter Description Min. Max. Units tZZCS ZZ low to CS low 0 - ns tCSZZ CS high to ZZ high 0 - ns tR Operation Recovery Time 200 - us tZZP ZZ pulse width 20 - ns Low Power Mode Characteristics Parameter Symbol Deep Power Down Current IZZ Test Conditions ZZ < 0.2V, Other inputs = 0 ~ VCCQ (Max. condition : VCC=3.3V @ 85oC) 10 Min Typ Max Unit - - 10 uA Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM TIMING WAVEFORM OF POWER UP 200us VCC(Min.) VCC CS Power Up Mode Normal Operation NOTE . ( POWER UP ) 1. After Vcc reaches Vcc(Min.) , wait 200us with CS high. Then you get into the normal operation. 11 Preliminary EM7164SU16W Series 1Mx16 Single Transistor RAM MEMORY FUNCTION GUIDE EM X XX X X X XX X X - XX XX 1. EMLSI Memory 11. Power 2. Device Type 10. Speed 3. Density 4. Option 9. Packages 5. Technology 8. Version 6. Operating Voltage 7. Organization 1. Memory Component 7. Organization 8 ---------------------- x8 bit 16 ---------------------- x16 bit 32 ---------------------- x32 bit 2. Device Type 6 ------------------------ Low Power SRAM 7 ------------------------ STRAM 8. Version Blank ----------------- Mother die A ----------------------- First version B ----------------------- Second version C ----------------------- Third version D ----------------------- Fourth version E ----------------------- Fifth version 3. Density 1 ------------------------- 1M 2 ------------------------- 2M 4 ------------------------- 4M 8 ------------------------- 8M 16 ----------------------- 16M 32 ----------------------- 32M 64 ----------------------- 64M 9. Package Blank ---------------------- Package W --------------------- Wafer 4. Function 0 ----------------------- Dual CS 1 ----------------------- Single CS 2 ----------------------- Multiplexed 3----------------------- Single CS with /ZZ 4----------------------- Single CS with /ZZ for Direct DPD mode 10. Speed 45 ---------------------- 45ns 55 ---------------------- 55ns 70 ---------------------- 70ns 85 ---------------------- 85ns 90 ---------------------- 90ns 10 --------------------- 100ns 12 --------------------- 120ns 5. Technology Blank ----------------- CMOS F ------------------------ Full CMOS S ------------------------ Single Transistor 11. Power LL ---------------------- Low Low Power LF ---------------------- Low Low Power(Pb-Free) L ---------------------- Low Power S ---------------------- Standard Power 6. Operating Voltage Blank ------------------- 5V V ------------------------- 3.3V U ------------------------- 3.0V S ------------------------- 2.5V R ------------------------- 2.0V P ------------------------- 1.8V O ------------------------- 1.5V 12