PD - 94008 IRFP250N HEXFET® Power MOSFET l l l l l l l Advanced Process Technology Dynamic dv/dt Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated Ease of Paralleling Simple Drive Requirements D VDSS = 200V RDS(on) = 0.075Ω G ID = 30A S Description Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-247 package is preferred for commercial-industrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole. TO-247AC Absolute Maximum Ratings Parameter ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 srew Max. Units 30 21 120 214 1.4 ± 20 315 30 21 8.6 -55 to +175 A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθCS RθJA www.irf.com Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. Max. Units ––– 0.24 ––– 0.7 ––– 40 °C/W 1 10/09/00 IRFP250N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 200 ––– ––– 2.0 17 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.26 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 14 43 41 33 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 4.5 LS Internal Source Inductance ––– 7.5 Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– 2159 315 83 V(BR)DSS ∆V(BR)DSS/∆TJ IGSS Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.075 Ω VGS = 10V, ID = 18A 4.0 V VDS = VGS, ID = 250µA ––– S VDS = 50V, ID = 18A 25 VDS = 200V, VGS = 0V µA 250 VDS = 160V, VGS = 0V, TJ = 150°C 100 VGS = 20V nA -100 VGS = -20V 123 ID = 18A 21 nC VDS = 160V 57 VGS = 10V, See Fig. 6 and 13 ––– VDD = 100V ––– ID = 18A ns ––– RG = 3.9Ω ––– RD = 5.5Ω, See Fig. 10 D Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact S ––– VGS = 0V ––– pF VDS = 25V ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– 30 showing the A G integral reverse ––– ––– 120 S p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 18A, VGS = 0V ––– 186 279 ns TJ = 25°C, IF = 18A ––– 1.3 2.0 µC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. (See Fig. 11) Starting TJ = 25°C, L = 1.9mH ISD ≤ 18A, di/dt ≤ 374A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 300µs; duty cycle ≤ 2%. RG = 25Ω, IAS = 18A. (See Figure 12) 2 www.irf.com IRFP250N 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 100 I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) 1000 100 10 4.5V 1 0.1 20µs PULSE WIDTH TJ = 25 °C 0.01 0.1 1 10 10 4.5V 1 TJ = 175 ° C 10 TJ = 25 ° C 1 V DS = 50V 20µs PULSE WIDTH 8.0 9.0 10.0 VGS , Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics www.irf.com RDS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 100 7.0 10 100 Fig 2. Typical Output Characteristics 1000 6.0 1 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 5.0 20µs PULSE WIDTH TJ = 175°C 0.1 0.1 100 VDS , Drain-to-Source Voltage (V) 0.1 4.0 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 3.5 ID = 30A 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -60 -40 -20 0 VGS = 10V 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature( ° C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRFP250N 5000 VGS , Gate-to-Source Voltage (V) 4000 C, Capacitance(pF) 16 VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd Coss = Cds + Cgd 3000 Ciss 2000 Coss 1000 Crss 0 ID = 18A V DS= 160V V DS= 100V V DS= 40V 12 8 4 0 1 10 100 0 1000 20 40 60 80 100 QG , Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 ID , Drain Current (A) ISD , Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY RDS(on) 100 100 TJ = 175 ° C 10 TJ = 25 ° C 1 10us 100us 10 1ms 0.1 0.2 V GS = 0 V 0.4 0.6 0.8 1.0 1.2 1.4 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 TC = 25 °C TJ = 175 °C Single Pulse 1.6 1 1 10ms 10 100 1000 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRFP250N RD VDS 35 35 VGS 30 30 D.U.T. ID , Drain Current (A) ID , Drain Current (A) RG + V DD - 25 25 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 20 20 15 15 Fig 10a. Switching Time Test Circuit 10 10 VDS 90% 5 5 0 0 25 25 50 50 75 100 125 150 125 ° C) TC 75 , Case100 Temperature (150 TC , Case Temperature ( ° C) 175 175 10% VGS td(on) Fig 9. Maximum Drain Current Vs. Case Temperature tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response(Z thJC ) 1 D = 0.50 0.20 0.1 0.10 PDM 0.05 0.02 0.01 0.01 0.00001 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x ZthJC + TC 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 15V L VDS D R IV E R D .U .T RG + - VD D IA S 20V 0 .0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit V (B R )D S S tp A EAS , Single Pulse Avalanche Energy (mJ) IRFP250N 800 ID 7.3A 13A BOTTOM 18A TOP 600 400 200 0 25 50 75 100 125 150 175 Starting TJ , Junction Temperature ( ° C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF 10 V QGS D.U.T. QGD + V - DS VGS VG 3mA IG Charge Fig 13a. Basic Gate Charge Waveform 6 ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRFP250N Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • • • • RG Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test D= Period - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS www.irf.com 7 IRFP250N Package Outline TO-247AC Outline Dimensions are shown in millimeters (inches) -D - 3.65 (.1 43 ) 3.55 (.1 40 ) 1 5.90 (.6 2 6) 1 5.30 (.6 0 2) -B- 0.25 (.0 1 0) M 5 .3 0 (.20 9 ) 4 .7 0 (.18 5 ) 2 .5 0 (.08 9) 1 .5 0 (.05 9) 4 D B M -A5 .50 (.21 7) 2 0 .30 (.80 0) 1 9 .70 (.77 5) 2X 1 2 NOTES: 5.50 (.2 1 7) 4.50 (.1 7 7) 1 D IM E N S IO N IN G & TO LE R A N C IN G P E R A N S I Y 14.5M , 1982. 2 C O N TR O LLIN G D IM E N S IO N : IN C H . 3 C O N F O R M S TO JE D E C O U TLIN E T O -247-A C . 3 -C - 1 4.8 0 (.5 83 ) 1 4.2 0 (.5 59 ) 2 .40 (.09 4) 2 .00 (.07 9) 2X 5.45 (.2 1 5) 2X 4 .3 0 (.1 70 ) 3 .7 0 (.1 45 ) 0 .80 (.03 1) 3X 0 .40 (.01 6) 1 .4 0 (.0 56 ) 3 X 1 .0 0 (.0 39 ) 0 .2 5 (.0 10 ) M LE A D A S S IG N M E N TS 1 2 3 4 2.60 (.1 0 2) 2.20 (.0 8 7) C A S 3 .4 0 (.1 33 ) 3 .0 0 (.1 18 ) - G A TE D R A IN SOURCE D R A IN Part Marking Information TO-247AC E XAM P L E : TH IS IS A N IR F P E3 0 W ITH A SS E M B L Y LOT CODE 3A1Q A IN TER N A TIO N A L R E C T IF IE R LOGO P A R T N U M B ER IR F P E 3 0 3 A 1 Q 9 3 02 A S SE M B L Y LOT CODE D A TE C O D E (YYW W ) YY = YE A R W W W EE K IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111 IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936 Data and specifications subject to change without notice. 10/00 8 www.irf.com