MCP2003B LIN Transceiver Features Description • The MCP2003B is Compliant with Local Interconnect Network (LIN) Bus Specifications 1.3, 2.0, 2.1, 2.2, SAE J2602, and ISO17987 • Supports Baud Rates up to 20 Kbaudwith LIN-Compatible Output Driver • 60V Load Dump Protected • Very High Electromagnetic Immunity (EMI) Meets Stringent Original Equipment Manufacturers (OEM) Requirements • Direct Capacitor Coupling Robustness without Transient Voltage Suppressor (TVS): - ±35V on LBUS (SAE J2962-1) - ±85V on LBUS (SAE J2962-1) • High Electrostatic Discharge (ESD) Immunity without TVS: - >25 kV on LBUS (SAE J2962-1) - >15 kV on VBB (IEC 61000-4-2) - >6 kV on LBUS (IEC 61000-4-2) • Very High Immunity to RF Disturbances Meets Stringent OEM Requirements • Wide Supply Voltage: 5.5V – 30.0V Continuous • Extended (E) Temperature Range: -40°C to +125°C • High (H) Temperature Range: -40°C to +150°C • Interfaces to PIC® MCU EUSART and Standard USARTs • LIN Bus Pin: - Internal pull-up resistor and diode - Protected against battery shorts - Protected against loss of ground - High current drive: >40 mA • Automatic Thermal Shutdown • Low-Power Mode: - Receiver monitoring bus and transmitter off: ( 5 µA) This device provides a bidirectional, half-duplex communication, physical interface to automotive and industrial LIN systems to meet the LIN Bus Specification Revision 2.2, SAE J2602, and ISO 17987. The device is both short-circuit and overtemperature protected by internal circuitry. The device has been specifically designed to operate in the automotive operating environment and will survive all specified transient conditions while meeting all of the stringent quiescent current requirements. Package Types MCP2003B SOIC RXD 1 8 VREN CS 2 7 VBB 6 LBUS 5 VSS WAKE 3 TXD 4 MCP2003B 2x3 DFN* RXD 1 8 VREN CS 2 7 VBB EP 9 WAKE 3 TXD 4 6 LBUS 5 VSS MCP2003B 3x3 DFN* RXD 1 CS 2 WAKE 3 TXD 4 8 VREN EP 9 7 VBB 6 LBUS 5 VSS * Includes Exposed Thermal Pad (EP); see Table 1-2. 2015-2016 Microchip Technology Inc. DS20005463C-page 1 MCP2003B MCP2003B Block Diagram DS20005463C-page 2 2015-2016 Microchip Technology Inc. MCP2003B 1.0 DEVICE OVERVIEW The MCP2003B devices provide a physical interface between a microcontroller and a LIN bus. These devices will translate the CMOS/TTL logic levels to LIN logic level, and vice versa. It is intended for automotive and industrial applications with serial bus speeds up to 20 Kbaud. LIN Bus Specification Revision 2.2 requires that the transceiver of all nodes in the system is connected via the LIN pin, referenced to ground and with a maximum external termination resistance load of 510 from LIN bus to battery supply. The 510 corresponds to 1 master and 15 slave nodes. The VREN pin can be used to drive the logic input of an external voltage regulator. This pin is high in all modes except for Power-Down mode. 1.1 1.1.1 External Protection REVERSE BATTERY PROTECTION An external reverse-battery-blocking diode should be used to provide polarity protection (see Example 1-1). 1.1.2 TRANSIENT VOLTAGE PROTECTION (LOAD DUMP) An external 60V transient suppressor (TVS) diode, between VBB and ground, with a 50 transient protection resistor (RTP) in series with the battery supply and the VBB pin serve to protect the device from power transients (see Example 1-1) and ESD events. While this protection is optional, it is considered good engineering practice. 1.2 1.2.1 Internal Protection ESD PROTECTION For component-level ESD ratings, please refer to the maximum operation specifications. 1.2.2 GROUND LOSS PROTECTION The LIN Bus specification states that the LIN pin must transition to the recessive state when ground is disconnected. Therefore, a loss of ground effectively forces the LIN line to a high-impedance level. 1.2.3 THERMAL PROTECTION The thermal protection circuit monitors the die temperature and is able to shut down the LIN transmitter. There are two causes for a thermal overload. A thermal shutdown can be triggered by either, or both, of the following thermal overload conditions. • LIN bus output overload • Increase in die temperature due to increase in environment temperature Driving the TXD and checking the RXD pin makes it possible to determine whether there is a bus contention (RX = low, TX = high) or a thermal overload condition (RX = high, TX = low). After a thermal overload event, the device will automatically recover once the die temperature has fallen below the recovery temperature threshold (see Figure 1-1). FIGURE 1-1: THERMAL SHUTDOWN STATE DIAGRAM Shorted LIN bus to VBB Operation Transmitter Mode Shutdown Temp < ShutdownTEMP 2015-2016 Microchip Technology Inc. DS20005463C-page 3 MCP2003B 1.3 Modes of Operation For an overview of all operational modes, refer to Table 1-1. 1.3.1 The device will go into Power-Down mode on the falling edge of CS, or return to Operation mode if all faults are resolved. POWER-DOWN MODE In Power-Down mode, everything is off except the wake-up section. The internal 30 k pull-up resistor switch is open, which enables the high ohmic pull-up resistor (900 k typical). This is the lowest power mode. The receiver is off, thus its output is open-drain. On CS going to a high level or a falling edge on WAKE, the device will enter Ready mode as soon as internal voltage stabilizes. Refer to Section 2.4 “AC Specifications” for further information. In addition, LIN bus activity will change the device from Power-Down mode to Ready mode; The MCP2003B wakes up on a rising edge on LBUS preceded by a low level lasting at least 70 µs typically. See Figure 1-2 about remote wake-up. If CS is held high as the device transitions from Power-Down to Ready mode, the device will transition to either Operation or Transmitter Off mode, depending on TXD input, as soon as internal voltages stabilize. 1.3.2 READY MODE Transitioning from POR into Ready mode is achieved when VBB > VBBUV_RISE. Upon entering Ready mode, VREN is enabled and the receiver detect circuit is powered-up. The transmitter remains disabled and the device is ready to receive data but not to transmit. Upon VBB supply pin power-on, the device will remain in Ready mode as long as CS is low. When CS transitions high, the device will either enter Operation mode if the TXD pin is held high, or the device will enter Transmitter Off mode if the TXD pin is held low. 1.3.3 OPERATION MODE In this mode, all internal modules are operational. Note that the part cannot transmit if the pull-up resistance is missing on RX pin. See Section 1.5.1.1 “RXD Monitoring” for details. The device will go into Power-Down mode on the falling edge of CS and the TXD pin is held high. The device will enter Transmitter Off mode in the event of a Fault condition such as thermal overload, bus contention or TXD timer expiration. The VBB to LBUS ~30 kΩ pull-up resistor (RSLAVE) is connected only in Operation mode. 1.3.4 TRANSMITTER OFF MODE Transmitter Off mode is reached whenever the transmitter is disabled due to a Fault condition. Fault conditions include thermal overload, bus contention, RXD monitoring and TXD timer expiration. DS20005463C-page 4 2015-2016 Microchip Technology Inc. MCP2003B FIGURE 1-2: OPERATIONAL MODES STATE DIAGRAM – MCP2003B POR VREN OFF RX OFF TX OFF RPU switch OFF Rising Edge on LBUS or CS = 1 or Falling Edge on WAKE pin V BAT > V BBUV_RISE Ready Mode VREN ON RX ON TX OFF RPU switch OFF TOFF Mode VREN ON RX ON TX OFF RPU switch OFF TXD = 1 And CS = 1 NO Fault, And RXD > 2.5V while LBUS recessive(1) Fault: Thermal or Timer Operation Mode VREN ON RX ON TX ON RPU switch ON Power-Down Mode VREN OFF RX OFF TX OFF RPU switch OFF Note 1: Achieved via pull-up resistor on RXD (See Example 1-1) TABLE 1-1: State OVERVIEW OF OPERATIONAL MODES Transmitter Receiver VREN Operation Comments POR OFF OFF OFF Check CS: if low, then proceed to Ready mode; If high, transition to either TOFF or Operation mode, depending on TXD. VBB > VBB(MIN) and Internal Supply stable. High ohmic pull-up resistor enabled (900 k typical). Ready OFF ON ON On CS high level, proceed to Operation or TOFF mode. Bus Off state. High ohmic pull-up resistor enabled (900 k typical). Operation ON ON ON On CS low level, proceed to Power-Down. On a fault condition, proceed to TOFF mode. Normal Operation mode. RXD has to be at a high level (>2.5V typical) while LBUS is recessive. Power-Down OFF Activity Detect OFF On CS high level, proceed to Ready mode then proceed to either Operation or TOFF mode. Falling edge on WAKE will put the device into Ready mode. Rising edge on LIN bus will put the device into Ready mode. Low-Power mode. High ohmic pull-up resistor enabled (900 k typical). Transmitter Off OFF ON ON On CS low level, proceed to Power-Down mode; On TXD high and no fault condition, proceed to Operation mode. High ohmic pull-up resistor enabled (900k typical). 2015-2016 Microchip Technology Inc. DS20005463C-page 5 MCP2003B 1.4 Typical Applications EXAMPLE 1-1: TYPICAL MCP2003B APPLICATION VBAT optional resistor and transient suppressor VBAT 50 60V (Note 1) 3.9 k VDD (2) 4.7 k 1.0 µF Voltage Reg VREN TXD TXD RXD RXD I/O Master Node Only VBAT VBB 1 k LIN Bus LBUS CS 33 k WAKE 220 pF Wake-up VSS Note 1: For applications with current requirements of less than 20 mA, the connection to VBAT can be deleted, and voltage to the regulator supplied directly from the VREN pin. 2: Required for transmission. 3: A Transient Voltage Suppressor on the LIN Bus is not required to sustain SAE J2962-1 ESD and Direct Capacitor Coupling tests. EXAMPLE 1-2: TYPICAL LIN NETWORK CONFIGURATION 40m + Return LIN bus VBB 1 k LIN bus MCP2003B LIN bus MCP2003B Slave 1 (MCU) LIN bus MCP2003B LIN bus MCP2003B Slave 2 (MCU) Slave n <23 (MCU) Master (MCU) DS20005463C-page 6 2015-2016 Microchip Technology Inc. MCP2003B 1.5 Pin Descriptions TABLE 1-2: PINOUT DESCRIPTIONS Pin Name 8-Lead SOIC 2x3 DFN 3x3 DFN 1 1 1 RXD Normal Operation Receive Data Output (OD), HV tolerant CS 2 2 2 Chip Select (TTL), HV tolerant WAKE 3 3 3 Wake-up, HV tolerant TXD 4 4 4 Transmit Data Input (TTL), HV tolerant VSS 5 5 5 Ground LBUS 6 6 6 LIN Bus (bidirectional) VBB 7 7 7 Battery Positive VREN 8 8 8 Voltage Regulator Enable Output EP — 9 9 Exposed Thermal Pad. Do not electrically connect or connect to Vss. Legend: TTL = TTL Input Buffer; OD = Open-Drain Output 1.5.1 RECEIVE DATA OUTPUT (RXD) The Receive Data Output pin is an open-drain (OD) output and follows the state of the LIN pin, except in Power-Down mode. 1.5.1.1 RXD Monitoring The RXD pin is internally monitored. It has to be at a high level (> 2.5V typical) while LBUS is recessive in Operation mode. Otherwise, an internal fault will be created and the device will transition to Transmitter Off mode. Note: 1.5.2 A voltage regulator sensing circuit is connected to RXD. This sensing circuit internally monitors the RXD pin when LBUS is recessive (RXD = 1). It will not allow the device to switch (or stay) in Operation Mode if the RXD pin is left open. The RXD pin must be connected to a valid supply through a pull-up resistor as RXD is an open drain pin. If CS = 1 when the VBB supply is turned on, the device will proceed to Operation mode, or TXOFF (refer to Figure 1-2), as soon as internal voltages stabilize. This pin may also be used as a local wake-up input (refer to Example 1-1). In this implementation, the microcontroller I/O controlling the CS should be converted to a high-impedance input allowing the internal pull-down resistor to keep CS low. An external switch, or other source, can then wake-up both the transceiver and the microcontroller (if powered). Refer to Section 1.3 “Modes of Operation”, for detailed operation of CS. Note: CHIP SELECT (CS) This is the Chip Select Input pin. An internal pull-down resistor will keep the CS pin low. This is done to ensure that no disruptive data will be present on the bus while the microcontroller is executing a Power-on Reset and an I/O initialization sequence. The pin must detect a high level to activate the transmitter. An internal LowPass filter, with a typical time constant of 10 µs, prevents unwanted wake-up (or transition to PowerDown mode) on glitches. If CS = 0 when the VBB supply is turned on, the device goes to Ready mode as soon as internal voltages stabilize, and stays there as long as the CS pin is held low (0). In Ready mode, the receiver is on and the LIN transmitter driver is off. 2015-2016 Microchip Technology Inc. 1.5.3 It is not recommended to tie CS high, as this can result in the device entering Operation mode before the microcontroller is initialized and may result in unintentional LIN traffic. The CS pin is internally pulled down to ground with 190 k when CS is less than VIL, and 2 M when CS is greater than VIH. The current on CS is limited to about 2 µA when CS is greater than VIH. WAKE-UP INPUT (WAKE) The WAKE pin has an internal 800 kΩ pull-up to VBB. A falling edge on the WAKE pin causes the device to wake from Power-Down mode. Upon waking, the MCP2003B will enter Ready mode. 1.5.4 TRANSMIT DATA INPUT (TXD) The Transmit Data Input pin has an internal pull-up. The LIN pin is low (dominant) when TXD is low, and high (recessive) when TXD is high. For extra bus security, TXD is internally forced to ‘1’ whenever the transmitter is disabled, regardless of external TXD voltage. DS20005463C-page 7 MCP2003B 1.5.4.1 TXD Dominant Timeout If TXD is driven low for longer than approximately 25 ms, the LBUS pin is switched to Recessive mode and the part enters TOFF Mode. This is to prevent the LIN node from permanently driving the LIN Bus dominant. The transmitter is reenabled on TXD rising edge. 1.5.5 GROUND (VSS) This is the Ground pin. 1.5.6 LIN BUS (LBUS) The bidirectional LIN Bus pin (LBUS) is controlled by the TXD input. LBUS has a current limited open collector output. To reduce EMI, the edges during the signal changes are slope controlled and include corner rounding control for both falling and rising edges. The internal LIN receiver observes the activities on the LIN bus, and matches the output signal RXD to follow the state of the LBUS pin. 1.5.6.1 Bus Dominant Timer The Bus Dominant Timer is an internal timer that deactivates the LBUS transmitter after approximately 25 ms of dominant state on the LBUS pin. The timer is reset on any recessive LBUS state. The LIN bus transmitter will be reenabled after a recessive state on the LBUS pin as long as CS is high. Disabling can be caused by the LIN bus being externally held dominant, or by TXD being driven low. 1.5.7 BATTERY (VBB) This is the Battery Positive Supply Voltage pin. 1.5.8 VOLTAGE REGULATOR ENABLE OUTPUT (VREN) This is the External Voltage Regulator Enable pin. Open-drain output is pulled high to VBB in all modes except Power-Down. 1.5.9 EXPOSED THERMAL PAD (EP) Do not electrically connect, or connect to VSS. DS20005463C-page 8 2015-2016 Microchip Technology Inc. MCP2003B 2.0 ELECTRICAL CHARACTERISTICS 2.1 Absolute Maximum Ratings† VIN DC Voltage on RXD, TXD, CS ...................................................................................................................-0.3 to +50V VIN DC Voltage on WAKE and VREN ..............................................................................................................-0.3 to +VBB VBB Battery Voltage, continuous, non-operating(1) ........................................................................................-0.3 to +50V VBB Battery Voltage, non-operating (LIN bus recessive)(2) ............................................................................-0.3 to +60V VBB Battery Voltage, transient ISO 7637 Test 1 ......................................................................................................-200V VBB Battery Voltage, transient ISO 7637 Test 2a ...................................................................................................+150V VBB Battery Voltage, transient ISO 7637 Test 3a ....................................................................................................-300V VBB Battery Voltage, transient ISO 7637 Test 3b ...................................................................................................+200V VLBUS Bus Voltage, continuous.......................................................................................................................-18 to +50V VLBUS Bus Voltage, transient(3) .......................................................................................................................-27 to +60V VLBUS Bus Voltage, Direct Capacitor Coupling without TVS (SAE J2962-1) ........................................... ±35V and ±85V ILBUS Bus Short-Circuit Current Limit....................................................................................................................200 mA ESD protection on LIN, without TVS (SAE J2962-1) ............................................................................................. ±25 kV ESD protection on LIN, VBB, WAKE (IEC 61000-4-2)(4) .......................................................................................... ±6 kV ESD protection on LIN, VBB, WAKE, CS (Human Body Model)(5) ........................................................................... ±8 kV ESD protection on all other pins (Human Body Model)(5) ........................................................................................ ±4 kV ESD protection on all pins (Charge Device Model)(6) .............................................................................................. ±2 kV ESD protection on all pins (Machine Model)(7) .......................................................................................................±400V Maximum Junction Temperature ........................................................................................................................... +150C Storage Temperature .................................................................................................................................. -65 to +150C † NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device, at those or any other conditions above those indicated in the operational listings of this specification, is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. Note 1: LIN 2.x compliant specification. 2: SAE J2602 compliant specification. 3: ISO 7637/1 load dump compliant (t < 500 ms). 4: According to IEC 61000-4-2, 330, 150 pF and Transceiver EMC Test Specifications [2] to [4]. For WAKE pin to meet the specification, series resistor must be in place (refer to Example 1-2). 5: According to AEC-Q100-002/JESD22-A114. 6: According to AEC-Q100-011B. 7: According to AEC-Q100-003/JESD22-A115. 2015-2016 Microchip Technology Inc. DS20005463C-page 9 MCP2003B 2.2 Nomenclature Used in This Document Some terms and names used in this data sheet deviate from those referred to in the LIN specifications. Equivalent values are shown in Table 2-1. TABLE 2-1: EQUIVALENT VALUES LIN specifications Name Term used in the following tables VBAT not used VSUP VBB Supply voltage at device pin IBUS_LIM ISC Current Limit of driver VBUSREC VIH(LBUS) Recessive state VBUSDOM VIL(LBUS) Dominant state 2.3 Definition ECU operating voltage DC Specifications DC Specifications Parameter Electrical Characteristics: Unless otherwise indicated, all limits are specified for VBB = 5.5V to 30.0V Extended (E): TA = -40°C to +125°C High (H): TA = -40°C to +150°C Sym. Min. Typ. Max. Units Conditions IBBQ — 65 150 µA Operating Mode, bus recessive — — 160 µA VBB > 18V — 60 120 µA Transmitter off, bus recessive — — 130 µA VBB > 18V — 6 15 µA — — 20 µA VBB > 18V — 14 20 µA LIN bus shorted to GND VLIN = 0V, VBB < 12V IBBNOGND -1 — 1 mA VBB = 12V, GND to VBB, VLIN = 0-27V VBB Undervoltage Threshold (switching from Operation mode to TOFF and VREN OFF) VBBUV_FALL 3.8 4 4.4 V VBB falling (Note 3) VBB Undervoltage Recovery Threshold (switching from POR to Ready mode) VBBUV_RISE 5.5 5.6 6.0 V VBB rising (Note 3) High-Level Input Voltage (TXD) VIH 2.0 — 30 V Low-Level Input Voltage (TXD) VIL -0.3 — 0.8 V High-Level Input Current (TXD) IIH -5 — — µA Power VBB Quiescent Operating Current VBB Transmitter-off Current VBB Power-Down Current VBB Current with VSS Floating IBBTO IBBPD Microcontroller Interface Note 1: 2: 3: Input voltage = 4.0V Internal current limited. 2.0 ms maximum recovery time (RLBUS = 0, TX = 0.4 VREG, VLBUS = VBB). Node has to sustain the current that can flow under this condition; bus must be operational under this condition. Characterized; not 100% tested. DS20005463C-page 10 2015-2016 Microchip Technology Inc. MCP2003B 2.3 DC Specifications (Continued) DC Specifications Parameter Electrical Characteristics: Unless otherwise indicated, all limits are specified for VBB = 5.5V to 30.0V Extended (E): TA = -40°C to +125°C High (H): TA = -40°C to +150°C Sym. Min. Typ. Max. Units IIL -12 — — µA High-Level Voltage (VREN) VHVREN -0.3 — VBB + 0.3 V High-Level Output Current (VREN) IHVREN -40 — -5 mA Low-Level Input Current (TXD) Conditions Input voltage = 0.5V Output voltage = VBB - 0.5V -120 — -20 High-Level Input Voltage (CS) VIH 2.0 — 30 V Output voltage = VBB - 2.0V Low-Level Input Voltage (CS) VIL -0.3 — 0.8 V High-Level Input Current (CS) IIH — — 10.0 µA Input voltage = 4.0V Low-Level Input Current (CS) IIL — — 7.0 µA Input voltage = 0.5V Low-Level Input Voltage (WAKE) VIL VBB - 4.0V — — V High-Level Input Current (WAKE) IIH -12 — — µA -15 — — µA Low-Level Input Current (WAKE) IIL -30 — — µA Through a current limiting resistor VBB > 18V -45 — — µA VBB > 18V VOL — — 0.4 V IIN = 2 mA VTH(RXD) — 2.5 — V RXD > VTH; LBUS recessive in Operating mode IOH -1 — -1 µA VLIN = VBB, VRXD = 5.5V High-Level Input Voltage VIH(LBUS) 0.6 VBB — — V Recessive state Low-Level Input Voltage VIL(LBUS) -8 — 0.4 VBB V Dominant state VHYS — — 0.175 VBB V VIH(LBUS) - VIL(LBUS) IOL(LBUS) 40 — 200 mA Output voltage = 0.2 VBB, VBB = 12V 16.5 — — mA Output voltage = 0.2 VBB, VBB = 18V — — 20 µA Low-Level Output Voltage (RXD) Input Threshold Level (RXD) High-Level Output Current (RXD) Bus Interface Input Hysteresis Low-Level Output Current High-Level Output Current IOH(LBUS) Short-Circuit Current Limit ISC 50 — 200 mA High-Level Output Voltage VOH(LBUS) 0.8 VBB — VBB V V_LOSUP — — 1.2 V IBUS_PAS_DO -1 -0.4 — mA Driver Dominant Voltage Input Leakage Current (at the receiver during dominant bus level) Note 1: 2: 3: M (Note 1) RLOAD = 500 Driver off, VBUS = 0V, VBB = 12V Internal current limited. 2.0 ms maximum recovery time (RLBUS = 0, TX = 0.4 VREG, VLBUS = VBB). Node has to sustain the current that can flow under this condition; bus must be operational under this condition. Characterized; not 100% tested. 2015-2016 Microchip Technology Inc. DS20005463C-page 11 MCP2003B 2.3 DC Specifications (Continued) DC Specifications Parameter Electrical Characteristics: Unless otherwise indicated, all limits are specified for VBB = 5.5V to 30.0V Extended (E): TA = -40°C to +125°C High (H): TA = -40°C to +150°C Sym. Min. Typ. Max. Units IBUS_PAS_REC — 12 20 µA Driver off, 8V < VBB < 18V 8V < VBUS < 18V VBUS VBB Leakage Current IBUS_NO_GND (disconnected from ground) -10 1.0 +10 µA GNDDEVICE = VBB, 0V < VBUS < 18V, VBB = 12V Leakage Current (disconnected from VBB) IBUS_NO_VBB — — 10 µA VBB = GND, 0 < VBUS < 18V, (Note 2) Receiver Center Voltage VBUS_CNT 0.525 VBB V VBUS_CNT = (VIL (LBUS) + VIH (LBUS))/2 Input Leakage Current (at the receiver during recessive bus level) 0.475 VBB 0.5 VBB Slave Termination RSLAVE 20 30 60 k Capacitance of Slave Node CSLAVE — — 100 pF Note 1: 2: 3: Conditions (Note 3) Internal current limited. 2.0 ms maximum recovery time (RLBUS = 0, TX = 0.4 VREG, VLBUS = VBB). Node has to sustain the current that can flow under this condition; bus must be operational under this condition. Characterized; not 100% tested. DS20005463C-page 12 2015-2016 Microchip Technology Inc. MCP2003B 2.4 AC Specifications AC Characteristics Electrical Characteristics: Unless otherwise indicated, all limits are specified for VBB = 5.5V to 27.0V Extended (E): TA = -40°C to +125°C High (H): TA = -40°C to +150°C Parameter Sym. Min. Typ. Max. Units Test Conditions Bus Interface – Constant Slope Time Parameters Slope Rising and Falling Edges Propagation Delay of Transmitter tSLOPE 3.5 — 22.5 µs 7.3V ≤ VBB ≤ 18V tTRANSPD — — 4.0 µs tTRANSPD = max (tTRANSPDR or tTRANSPDF) Propagation Delay of Receiver tRECPD — — 6.0 µs tRECPD = max (tRECPDR or tRECPDF) Symmetry of Propagation Delay of Receiver Rising Edge w.r.t. Falling Edge tRECSYM -2.0 — 2.0 µs tRECSYM = max (tRECPDF - tRECPDR) RRXD 2.4 to VCC, CRXD 20 pF tTRANSSYM -2.0 — 2.0 µs tTRANSSYM = max (tTRANSPDF - tTRANSPDR) Duty Cycle 1 @20.0 kbit/sec 0.396 — — — CBUS; RBUS conditions: 1 nF; 1 k | 6.8 nF; 660 | 10 nF; 500 THREC(MAX) = 0.744 × VBB, THDOM(MAX) = 0.581 × VBB, VBB =7.0V - 18V; tBIT = 50 µs D1 = tBUS_REC(MIN)/2 × tBIT) Duty Cycle 2 @20.0 kbit/sec — — 0.581 — CBUS; RBUS conditions: 1 nF; 1 k | 6.8 nF; 660 | 10 nF; 500 THREC(MAX) = 0.284 × VBB, THDOM(MAX) = 0.422 × VBB, VBB =7.6V - 18V; tBIT = 50 µs D2 = tBUS_REC(MAX)/2 × tBIT) Duty Cycle 3 @10.4 kbit/sec 0.417 — — — CBUS; RBUS conditions: 1 nF; 1 k | 6.8 nF; 660 | 10 nF; 500 THREC(MAX) = 0.778 × VBB, THDOM(MAX) = 0.616 × VBB, VBB =7.0V – 18V; tBIT = 96 µs D3 = tBUS_REC(MIN)/2 × tBIT) Duty Cycle 4 @10.4 kbit/sec — — 0.590 — CBUS; RBUS conditions: 1 nF; 1 k | 6.8 nF; 660 | 10 nF; 500 THREC(max) = 0.251 × VBB, THDOM(MAX) = 0.389 × VBB, VBB =7.6V – 18V; tBIT = 96 µs D4 = tBUS_REC(MAX)/2 × tBIT) tBDB 30 70 125 µs tBACTVE 10 60 110 µs WAKE to VREN on tWAKE — — 150 µs Chip Select to VREN on tCSOR — — 150 µs VREN floating Chip Select to VREN off tCSPD — — 200 µs VREN floating Symmetry of Propagation Delay of Transmitter Rising Edge w.r.t. Falling Edge Wake-up Timing Bus Activity Debounce time Bus Activity to VREN on 2015-2016 Microchip Technology Inc. DS20005463C-page 13 MCP2003B 2.5 Thermal Specifications Parameter Symbol Typ. Max. Units Recovery Temperature RECOVERY +160 — C Shutdown Temperature SHUTDOWN +180 — C tTHERM 1.5 5.0 ms Thermal Resistance, 2x3 8L-DFN JA 75 — C/W Thermal Resistance, 3x3 8L-DFN JA 56.7 — C/W Thermal Resistance, 8L-SOIC JA 149.5 — C/W Short-Circuit Recovery Time Test Conditions Thermal Package Resistances Note 1: The maximum power dissipation is a function of TJMAX, JA and ambient temperature TA. The maximum allowable power dissipation at an ambient temperature is PD = (TJMAX - TA)JA. If this dissipation is exceeded, the die temperature will rise above 150C and the device will go into thermal shutdown. DS20005463C-page 14 2015-2016 Microchip Technology Inc. MCP2003B 2.6 Typical Performance Curves Note: The graphs and tables provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. Note: Unless otherwise indicated, VBB = 5.5V to 18.0V, Extended (E): TA = -40°C to +125°C and High (H): TA = -40°C to +150°C. 150 Current (μA) 125 -45 -10 130 150 25 5.5 6 100 75 50 25 0 7 12 VBB (V) FIGURE 2-1: 15.0 Current (μA) 12.5 -45 130 18 27 30 27 30 Typical IBBQ. -10 150 25 10.0 7.5 5.0 2.5 0.0 5.5 6 7 12 VBB (V) FIGURE 2-2: 120 Current (μA) 100 -45 130 18 Typical IBBPD. -10 150 25 80 60 40 20 0 5.5 FIGURE 2-3: 6 7 12 VBB (V) 18 27 30 Typical IBBTO. 2015-2016 Microchip Technology Inc. DS20005463C-page 15 MCP2003B 2.7 Timing Diagrams and Specifications FIGURE 2-4: BUS TIMING DIAGRAM TXD 50% 50% LBUS .95VLBUS .50VBB 0.05VLBUS TTRANSPDR TTRANSPDF TRECPDF 0.0V TRECPDR RXD 50% 50% CS TO VREN TIMING DIAGRAM FIGURE 2-5: CS TCSOR VBB VREN OFF TCSPD FIGURE 2-6: REMOTE WAKE-UP LBUS 0.4VBB tBDB tBACTIVE VBB VREN DS20005463C-page 16 2015-2016 Microchip Technology Inc. MCP2003B 3.0 PACKAGING INFORMATION 3.1 Package Marking Information Examples: 8-Lead DFN (2x3) Device Code MCP2003B-E/MC ADP MCP2003BT-E/MC ADP MCP2003B-H/MC ADR MCP2003BT-H/MC ADR ADP 613 25 Examples: 8-Lead DFN (3x3) 8-Lead SOIC (150 mil) Device Code MCP2003B-E/MF DAEC MCP2003BT-E/MF DAEC MCP2003B-H/MF DAEE MCP2003BT-H/MF DAEE DAEC 1613 256 Examples: MCP2003B SN^^^1613 e3 256 NNN Legend: XX...X Y YY WW NNN e3 * Note: NNN Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘01’) Alphanumeric traceability code Pb-free JEDEC® designator for Matte Tin (Sn) This package is Pb-free. The Pb-free JEDEC designator ( e3 ) can be found on the outer packaging for this package. In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. 2015-2016 Microchip Technology Inc. DS20005463C-page 17 MCP2003B ' !""#$%& 2% & %! % * %% 133)))& &3 " ) * ' % * $ % % " % e D b N N L K E2 E EXPOSED PAD NOTE 1 NOTE 1 2 1 2 1 D2 BOTTOM VIEW TOP VIEW A A3 A1 NOTE 2 4% & 5&% 6!&( $ 55,, 6 6 67 8 9 % ./0 7 : % 9 % "$$ . 0% %* + ,2 7 5 % /0 7 ;"% , ,# " "5 % + < ,# " ";"% , . < . ( . + 5 + . = < < 0% %;"% 0% %5 % 0% % % ,# " " +/0 ' ! " #$ %! & '(!%&! %( % ")%% % " * & & # "% ( % " + * ) ! % " & "% ,-. /01 / & % # % ! ))%!%% ,21 $ & '! ! )%!%% '$$& % ! .. ) 0 +0 DS20005463C-page 18 2015-2016 Microchip Technology Inc. MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging 2015-2016 Microchip Technology Inc. DS20005463C-page 19 MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS20005463C-page 20 2015-2016 Microchip Technology Inc. MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging 2015-2016 Microchip Technology Inc. DS20005463C-page 21 MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS20005463C-page 22 2015-2016 Microchip Technology Inc. MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging 2015-2016 Microchip Technology Inc. DS20005463C-page 23 MCP2003B Note: For the most current package drawings, please see the Microchip Packaging Specification located at http://www.microchip.com/packaging DS20005463C-page 24 2015-2016 Microchip Technology Inc. MCP2003B ' (" ) *(++, !""#$%()-& 2% & %! % * %% 133)))& &3 2015-2016 Microchip Technology Inc. " ) * ' % * $ % % " % DS20005463C-page 25 MCP2003B NOTES: DS20005463C-page 26 2015-2016 Microchip Technology Inc. MCP2003B APPENDIX A: REVISION HISTORY Revision C (April 2016) The following is the list of modifications: • • • • • Updated MCP2003B Block Diagram. Updated Section 1.3.1, Power-Down Mode. Updated Figure 1-2. Updated Table 1-1. Added VBBUV_FALL, VBBUV_RISE and updated IBBPD. Revision B (December 2015) The following is the list of modifications: • Included Features and Electrical Characteristics for the SAE J2962-1. • Minor typographical changes. Revision A (November 2015) • Original release of this document. 2015-2016 Microchip Technology Inc. DS20005463C-page 27 MCP2003B NOTES: DS20005463C-page 28 2015-2016 Microchip Technology Inc. MCP2003B PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. X /XX Device Temperature Range Package Device: MCP2003B: LIN Transceiver MCP2003BT: LIN Transceiver (Tape and Reel) Temperature Range: E H Package: = -40°C to +125°C (Extended) = -40°C to +150°C (High) MC = 8-Lead Plastic Dual Flat, No Lead Package – 2x3x0.9 mm Body (DFN) MF = 8-Lead Plastic Dual Flat, No Lead Package – 3x3x0.9 mm Body (DFN) SN = 8-Lead Plastic Small Outline – Narrow 3.90 mm Body (SOIC) 2015-2016 Microchip Technology Inc. Examples: a) MCP2003B-E/MC: Extended Temperature, 8LD 2x3 DFN package b) MCP2003B-E/MF: Extended Temperature, 8LD 3x3 DFN package c) MCP2003B-E/SN: Extended Temperature, 8LD SOIC package d) MCP2003BT-H/MC: Tape and Reel, High Temperature, 8LD 2x3 DFN package e) MCP2003BT-H/MF: Tape and Reel, High Temperature, 8LD 3x3 DFN package f) MCP2003BT-H/SN: Tape and Reel, High Temperature, 8LD SOIC package DS20005463C-page 29 MCP2003B NOTES: DS20005463C-page 30 2015-2016 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights unless otherwise stated. Microchip received ISO/TS-16949:2009 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. QUALITY MANAGEMENT SYSTEM CERTIFIED BY DNV == ISO/TS 16949 == 2015-2016 Microchip Technology Inc. Trademarks The Microchip name and logo, the Microchip logo, AnyRate, dsPIC, FlashFlex, flexPWR, Heldo, JukeBlox, KeeLoq, KeeLoq logo, Kleer, LANCheck, LINK MD, MediaLB, MOST, MOST logo, MPLAB, OptoLyzer, PIC, PICSTART, PIC32 logo, RightTouch, SpyNIC, SST, SST Logo, SuperFlash and UNI/O are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. ClockWorks, The Embedded Control Solutions Company, ETHERSYNCH, Hyper Speed Control, HyperLight Load, IntelliMOS, mTouch, Precision Edge, and QUIET-WIRE are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Any Capacitor, AnyIn, AnyOut, BodyCom, chipKIT, chipKIT logo, CodeGuard, dsPICDEM, dsPICDEM.net, Dynamic Average Matching, DAM, ECAN, EtherGREEN, In-Circuit Serial Programming, ICSP, Inter-Chip Connectivity, JitterBlocker, KleerNet, KleerNet logo, MiWi, motorBench, MPASM, MPF, MPLAB Certified logo, MPLIB, MPLINK, MultiTRAK, NetDetach, Omniscient Code Generation, PICDEM, PICDEM.net, PICkit, PICtail, PureSilicon, RightTouch logo, REAL ICE, Ripple Blocker, Serial Quad I/O, SQI, SuperSwitcher, SuperSwitcher II, Total Endurance, TSHARC, USBCheck, VariSense, ViewSpan, WiperLock, Wireless DNA, and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. Silicon Storage Technology is a registered trademark of Microchip Technology Inc. in other countries. GestIC is a registered trademarks of Microchip Technology Germany II GmbH & Co. KG, a subsidiary of Microchip Technology Inc., in other countries. All other trademarks mentioned herein are property of their respective companies. © 2015-2016, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. 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